M8212 INTEL | Alldatasheet
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Technical content
Figure 1. Logic Diagram www.chipdocs.com Be sure to visit ChipDocs web site for more information.
OO SSsSSsSSSSSSSsssSSsSSSSSSSSSsssssesee ABSOLUTE MAXIMUM RATINGS* “Notice: Stresses above those listed under “Abso- lute Maximum Ratings” may cause permanent dam- Case Temperature Under Bias(1). -55°C to + 125°C age to the device. This is a stress rating only and _ other cor ve in the opera- D.C. CHARACTERISTICS Tcl!) = —55°C to + 125°C, Yoo = +5V 410% [vate | Testconons | | min | typ | max | IF Input Load Current mA Ve = 0.45V STB, DSp, CR, Dty—-Dlg Inputs Input Load Current —0.75 mA Ve = 0.45V MD Input Input Load Current mA Ve = 0.45V DS, Input Input Leakage Current Vr = Voc STB, DS, GR, Dl}—Dlg Inputs Input Leakage Current pA Vr = Voc MD Input Input Leakage Current 40 BA Vr = Voc DS, Input Input Forward VotageCiamp | | | -12 | ov | ic=-sma | input “Low” Voltage a ee Input “High” Voltage peof fT fv fo Output “Low” Voltage | | os Tv Tig = 10ma Output “High” Voltage [as [40 [|v | tov = -0.5ma | tos__| Short Circuit Outpurcurrent | as | | =78 | ma_| Veo = 5.0v Output Leakage Current pA Vo = 0.45 to Voc High Impedance State Power SupplyGurent | | 90 | ws | ma |_| CAPACITANCE F = 1 MHz, Vas = 2.5V, Voc = +5V, Tol!) = 25°C poms | om Le DSMD input Capacitance | opr | 15 pF _| Cin DS, CLR, STB, Dl;-Dlg 10 pF Input Capacitance 00;-DOg Output Capacitance 15 pF NOTE: 1. Case temperatures are “instant on”. CONDITIONS OF TEST Input Pulse Amplitude = 2.5V Input Rise and Fall Times: 5 ns between 1V and 2V Measurements made at 1.5V 6-8 www.chipdocs.com Be sure to visit ChipDocs web site for more information.
a A.C. CHARACTERISTICS Tol) = —55°C to + 126°C, Vog = +5V 10% Pe Ta | | Teme fom | rommee [tow | Pusowan | 40 | | sms [| [to | DataToOutputDeley |__| 90 | ns | (Noto) [we | WiteEnabieToOutputDelay | | 50 | ns | (Notea) [ter | DataSouptime [| 20 | | ms | rw | Datatiowtime +t | | ~ | | [ta | Reset ToOuiputdeay || 58 | ns | Wowm | lis | Settoouputdewy | | a5 [| ms | mow | [te | OutputEnabieDisabietime | | 50 | ns_| (Note2)0, = S0pF_| [tc _| GearToOutputdelay | | 88 | ons | Notes) NOTE: 1. Case temperatures are “instant on”. NOTE 2: [test [cx | ms | Pe | too, we: th ts. tc| 30 pF| 300n | 6000 | [te ENABLET [30pF| 10 Ka] 1 ka | fe ENABLE | 30 | soon [ o0n| Ite. DisABLET | 5 pF! soon | 6000] fe oisaaue |_| SF] 10Ka] 1 Ka A.C. TESTING LOAD CIRCUIT Vee fn, . 271014-3 6-9 ‘www.chipdocs.com Be sure to visit ChipDocs web site for more information.
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Input Current vs. Input Voltge ouat tow" Veliage eT | a tHe TT Ty i- BP) len f | eT HH . A Ppt f- esse] | | | | Bees sane LA 7eaenen Data to Output Delay Write Enable to Output Delay n vs. Temperature ia Temperature tert ttl, fae | (pee) jee i H-H hia TEMPERATURE ( C1 TEMPERATURE ( Ci (271014-5 6-11 ‘www.chipdocs.com Be sure to visit ChipDocs web site for more information.