M2732A INTEL | Alldatasheet
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ABSOLUTE MAXIMUM RATINGS* All Input or Output Voltages with These are stress ratings only. Operation beyond the Vpp Supply Voltage with Respect to rt el aace okay ane Condions” D.C. AND A.C. OPERATING CONDITIONS DURING READ READ OPERATION D.C. CHARACTERISTICS Cd ce oc eed [in| ipputuoadcurent [| to ak | v= sev [to | OutputLeakage Curent [ [| to | a | Vour= sv [ cc: | Voc Gurent(stanabyy [|| 38 | ma | CE = Vn OE = Vi | [icc | VooGurentiacive, {| [ns [ma | CE=CE=M | [Vu | tnputlowVottage | -or | [os | vy | [nc utah votago | 20 [| vee [vf [ Yo. | Ouputtowvorage | || oases |v | i= 2tma | [vou | Outpurtighvorage [24 [| vf ton t400na NOTE: 1. Typical values are for Tc = 25°C and nominal supply voltages. A.C. CHARACTERISTICS Leen wrest lum condone | forme] ream tie on [tcc [AddresstoOurputdely | [aso] || 50] ns | CE = OF = vu [ice [CE toOuputdeey || aso] | aso] ns [OF= Canal ab ic Delay a id a a ic Float * fees] "| IT | CE or OE Whichever Occurred First
a CAPACITANCE (1), (2) A.C. TEST CONDITIONS [Symbol] Parameter [Typ] Max] Unit Conattions| Resistor and C, = 100 pF le Ps Wnputs ee. eeeeeeeee see e ee ee /0.8V and 2V [Cour [oupsrGapacitance| | 12 | oF [Vour = ov} Outputs 2200000000 osv and 2v A.C. TESTING, OUTPUT WAVEFORM A.C. TESTING LOAD CIRCUIT ow “ = = K wave * “ : oe 271007-5 tear ‘AC. Testing: Inputs are driven at 2.4V for a Logic "1" and 0.45 T* mer fora Loge "0" Timing Measurements ere mado at 2.0V for a ac {ogc “1” and 08V fora Loge "0" qe woe snore CG; Includes Jig Capacitance A.C. WAVEFORMS aponesses ( anoneeean ze or b= toe!) tac!) ton 271007-3 NOTES: 1. Typical values are for Tc = 25°C and nominal supply voltages. 2. This parameter is only sampled and is not 100% tested. 3. OE may be delayed up to tacc-toe after the falling edge of TE without impact on taco. - 4, This parameter is only sampled and is not 100% tested. Output Float is defined as the point where data is no longer driven. 5. Case temperatures are “instant on”. 7-10
Table 1. Mode Selection active whan data is desired from a paricular memo. control and should be used for device selection. _ultraviolet light erasure. active low, TTL program pulse is applied to the CE. ance state, independent of the OE input. grammed with a DC signal applied to the CE input. to the simplicity of the programming requirements. connection. The two line control function allows for: _input programs the paralleled M2732As.
Program Inhibit Angstroms (A). It should be noted that sunlight and certain types of fluorescent lamps have wavelengths Programming of multiple M2732As in parallel with _in the 3000-4000A range. Data shows that constant different data is also easily accomplished. Except for exposure to room level fluorescent lighting could CE, all like inputs (including OE) of the parallel erase the typical M2792A in approximately 3 years, M2732As may be common. A_TTL level progam while it would take approximately 1 week to cause pulse applied to a M2732A's CE input with OE/V, erasure when exposed to direct sunlight. If the at 21V will program that M2732A. A high level lod M2732A is to be exposed to these types of lighting input inhibits the other M2732As from being pro- conditions for extended periods of time, opaque fa- grammed. bels should be placed over the M2732A window to prevent unintentional erasure. Program Verify The recommended erasure procedure for the M2732A is exposure to shortwave ultraviolet light A verify should be performed on the programmed which has a wavelength of 2637 Angstroms (A). The bits to determine that they were corectty pro- _ integrated dose (i.e., UV intensity x exposure time) grammed. The verify is accomplished with OE/Vpp _for erasure should be a minimum of 15W-sec/cm?. and CE at Vi_. Data should be verified toy after the The erasure time with this dosage is approximately falling edge of CE. 15 to 20 minutes using an ultraviolet lamp with 12000 uW/cm2 power rating. The M2732A should be placed within 1 inch of the lamp tubes during era- ERASURE CHARACTERISTICS sure. Some lamps have a filter on their tubes which should be removed before erasure. The erasure characteristics of the M2732A are such that erasure begins to occur when exposed to light with wavelengths shorter than approximately 4000 PROGRAMMING D.C. PROGRAMMING CHARACTERISTICS(1) To = 25°C +5°C; Voc = SV +5%; Vpp = 21V +0.5V Test Conditions Input Curent (All inputs) [0 Toa [vin = Ynorvin | Output Low Voltage During Verity [ons Tv Tin =2tma | ; Output High Voltage During Verity [eat [Iv [low = -400 us [loc | Voc Supply Current [es |"s [mal input Low Love (Ang) ort [es [v> | Inputhigh Level (Atinputs Except OE/Ven)| 20 | [vect i] v [| [lee __[ Ver Supply Curent a ee NOTE: 4. When programming the M2732A, a 0.1 F capacitor is required across OE/Vpp and ground to suppress spurious voltage transients which may damage the device. 7-12
A.C. PROGRAMMING CHARACTERISTICS To = 25°C £5°C; Voc = 5V +5%; Vpp = 21V +0.5V ae Toa] Tetconatone | est Conditions’ [emt | rere ae ee Tae] [us| AddressSeuptime | 2 [TT ws | [ toes | OESouptime | Ts PO [ tos | dataSouptine fT Ps PO [tun | AddressHolgtime | Ps PO [ tocn | oEHoTime | 2? Ts PO [tow | Data Hold Time ee | [tor | Chip Enable to Output Float Delay fo | [wo fons fo | tov | Datavaidiromoe | | Tt | s | CE OE= | [tow | CEPutse width During Programming | 45 so | 65 | ms | | [ tear | OE Pulse Rise Time During Programming | so_[ | | ns | Livan] VepRecoverytime | oe Ts PO *A.C. TEST CONDITIONS : PROGRAMMING WAVEFORMS PROGRAM: PROGRAM, ot we 271007-4 notes: 1. All times shown in () are minimum and in ys unless otherwise specified. 2. The input timing reference level is 1V for a Vi, and 2V for a Vi. . 7-13