STP9NK60ZD VBSEMI | Alldatasheet

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Technical content

N-Channel 650V (D-S) Power MOSFET

FEATURES

  • Low figure-of-merit (FOM) Ron x Qg
  • Low input capacitance (Ciss)
  • Reduced switching and conduction losses
  • Ultra low gate charge (Qg)
  • Avalanche energy rated (UIS)

APPLICATIONS

  • Server and telecom power supplies
  • Switch mode power supplies (SMPS)
  • Power factor correction power supplies (PFC)
  • Lighting - High-intensity discharge (HI - Fluorescent ballast lighting
  • Industrial Notes a. Repetitive rating; puls e width limited by maximum junction temperature. b. V DD = 50 V, starting TJ = 25 °C, L = 28.2 mH, Rg = 25 Ω, IAS = 4.5 A. c. 1.6 mm from case. d. I SD ≤ ID, dI/dt = 100 A/μs, starting TJ = 25 °C. PRODUCT SUMMARY VDS (V) at TJ max. 650 RDS(on) max. at 25 °C (Ω)V GS = 10 V 0. Qg max. (nC) 43 Qgs (nC) 5 Qgd (nC) 22 Configuration Single N-Channel MOSFET G D S ABSOLUTE MAXIMUM RATINGS (TC = 25 °C, unless otherwise noted) PARAMETER SYMBOL LIMIT UNIT Drain-Source Voltage VDS 650 V Gate-Source Voltage VGS ± 30 Continuous Drain Current (TJ = 150 °C) VGS at 10 V TC = 25 °C ID ATC = 100 °C Pulsed Drain Current a IDM Linear Derating Factor 3.2 W/°C Single Pulse Avalanche Energy b EAS mJ Maximum Power Dissipation PD /34 W Operating Junction and Storage Temperature Range TJ, Tstg -55 to +150 °C Drain-Source Voltage Slope TJ = 125 °C dV/dt V/nsReverse Diode dV/dt d 4.1 Soldering Recommendations (Peak Temperature) c for 10 s 300 °C T O-220AB Top View GD S G D S TO-220 FULLPAK Top View D2PAK (TO-263) G D S 106 8.0 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

a. C oss(er) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 % to 80 % VDSS. b. C oss(tr) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 % to 80 % VDSS. THERMAL RESISTANCE RATINGS PARAMETER SYMBOL TYP. MAX. UNIT Maximum Junction-to-Ambient RthJA -6 0 °C/WMaximum Junction-to-Case (Drain) RthJC -0 .8 SPECIFICATIONS (TJ = 25 °C, unless otherwise noted) PARAMETER SYMBOL TEST CONDITIONS MIN. TYP. MAX. UNIT Static Drain-Source Breakdown Voltage VDS VGS = 0 V, ID = 250 μA 650 - - V VDS Temperature Coefficient ΔVDS/TJ Reference to 25 °C, ID = 1 mA -0 .75 - V/°C Gate-Source Threshold Voltage (N) VGS(th) VDS = VGS, ID = 250 μA 2 - 4 V Gate-Source Leakage IGSS VGS = ± 20 V - - ± 100 nA VGS = ± 30 V - - ± 1 μA Zero Gate Voltage Drain Current IDSS VDS = 650 V, VGS = 0 V - - 1 μA VDS = 520 V, VGS = 0 V, TJ = 125 °C - - 10 Drain-Source On-State Resistance RDS(on) VGS = 10 V ID = 8 A - Ω Forward Transconductance gfs VDS = 30 V, ID = 8 A - 16 - S Dynamic Input Capacitance Ciss VGS = 0 V, VDS = 100 V, f = 1 MHz - - pF Output Capacitance Coss - - Reverse Transfer Capacitance Crss - - Effective Output Capacitance, Energy Related a Co(er) VDS = 0 V to 520 V, VGS = 0 V -6 3- Effective Output Capacitance, Time Related b Co(tr) - 213 - Total Gate Charge Qg VGS = 10 V ID = 8 A, VDS = 520 V -4 3 nC Gate-Source Charge Qgs - Gate-Drain Charge Qgd -2 2- Turn-On Delay Time td(on) VDD = 520 V, ID = 8 A, VGS = 10 V, Rg = 9.1 Ω -1 3 nsRise Time tr -1 1 Turn-Off Delay Time td(off) -8 1 Fall Time tf -2 5 Gate Input Resistance Rg f = 1 MHz, open drain - 3.5 - Ω Drain-Source Body Diode Characteristics Continuous Source-Drain Diode Current IS MOSFET symbol showing the integral reverse p - n junction diode -- 1 5 A Pulsed Dio de Forward Current ISM -- 4 0 Diode Forward Voltage VSD TJ = 25 °C, IS = 8 A, VGS = 0 V - - 1.5 V Reverse Recovery Time trr TJ = 25 °C, IF = IS = 8 A, dI/dt = 100 A/μs, VR = 400 V - 345 - ns Reverse Recovery Charge Qrr -4 . 5- μ C Reverse Recovery Current IRRM -3 5-A S D G 0.84 1200 230 100 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

TYPICAL CHARACTERISTICS (25 °C, unless otherwise noted) Fig. 1 - Typical Output Characteristics Fig. 2 - Typ ical Output Characteristics Fig. 3 - Typical Transfer Characteristics Fig. 4 - Normalized On-Resistance vs. Temperature Fig. 5 - Typical Capacitance vs. Drain-to-Source Voltage Fig. 6 - Typical Gate Charge vs. Gate-to-Source Voltage VDS, Drain-to-Source Voltage (V) ID, Drain-to-Source Current (A) 0 5 10 15 20 25 30 TOP 15 V 14 V 13 V 12 V 11 V 10 V 9 V 8 V 7 V 6 V BOTTOM 5 V TJ = 25 °C VDS, Drain-to-Source Voltage (V) ID, Drain-to-Source Current (A) 0 5 10 15 20 25 30 TJ = 150 °C 5 V TOP 15 V 14 V 13 V 12 V 11 V 10 V 9 V 8 V 7 V BOTTOM 6 V VGS, Gate-to-Source Voltage (V) ID, Drain-to-Source Current (A) 0 5 10 15 20 25 TJ = 25 °C TJ = 150 °C VDS = 30.8 V TJ, Junction Temperature (°C) RDS(on), Drain-to-Source - 60 - 40 - 20 0 20 40 60 80 100 120 140 160 On Resistance (Normalized) 0.5 1.5 2.5 VGS = 10 V ID = 8 A VDS, Drain-to-Source Voltage (V) Capacitance (pF) 1000 500 0 200 400 2 000 1500 100 300 500 600 Ciss Coss Crss VGS = 0 V, f = 1 MHz Ciss = Cgs + Cgd, Cds Shorted Crss = Cgd Coss = Cds + Cgd ġ ġ Qg, Total Gate Charge (nC) VGS, Gate-to-Source Voltage (V) 0 20 40 60 80 VDS = 520 V VDS = 325 V VDS = 130 V 100 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

Fig. 7 - Typical Source-Drain Diode Forward Voltage Fig. 8 - Max imum Safe Operating Area Fig. 9 - Maximum Drain Current vs. Case Temperature Fig. 10 - Temperature vs. Drain-to-Source Voltage Fig. 11 - Normalized Thermal Transient Impedance, Junction-to-Case VSD, Source-Drain Voltage (V) ISD, Reverse Drain Current (A) 0.1 100 TJ = 150 °C TJ = 25 °C VGS = 0 V ID, Drain Current (A) 100 1000 0.01 0.1 1 10 100 1000 VDS - Drain -to-Source Voltage (V) * VGS > minimum VGS at which RDS(on) i s specified Limited by RDS(on)* 1 ms 10 ms 100 μs Operation in this Area Limited by RDS(on) TC = 25 °C TJ = 150 °C Single Pulse BVDSS Limited IDM = Limited TJ, Case Temperature (°C) ID, Drain Current (A) 25 50 75 100 125 150 TJ, Junction Temperature (°C) VDS, Drain-to-Source - 60 0 160 Breakdown Voltage (V) - 40 - 20 20 40 60 80 100 120 140 600 625 650 675 700 725 750 775 800 0.01 0.1 0.0001 0.001 0.01 0.1 1 Normalized Effective Transient Thermal Impedance Pulse Time (s) Duty Cycle = 0.5 0.2 0.1 0.05 0.02 Single Pulse E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

Fig. 12 - Switching Time Test Circuit Fig. 13 - Switching T ime Waveforms Fig. 14 - Unclamped Inductive Test Circuit Fig. 15 - Unclamped Inductive Waveforms Fig. 16 - Basic Gate Charge Waveform Fig. 17 - Gate Charge Test Circuit Pulse width ≤ 1 µs Duty factor ≤ 0.1 % RD VGS RG D.U.T. 10 V VDS VDD VDS 90 % 10 % VGS td(on) tr td(off) tf RG IAS 0.01 Ωtp D.U.T L VDS - VDD 10 V Vary tp to obtain required IAS IAS VDS VDD VDS tp QGS QGD QG VG Charge 10 V D.U.T. 3 mA VGS VDS IG ID 0.3 µF 0.2 µF 50 kΩ 12 V Current regulator Current sampling resistors Same type as D.U.T. E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

Fig. 18 - For N-Channel P.W. Period dI/dt Diode recovery dV/dt Ripple ≤ 5 % Body diode forward drop Re-applied voltage Reverse recovery current Body diode forward current VGS = 10 Va ISD Driver gate drive D.U.T. lSD waveform D.U.T. VDS waveform Inductor current D = P.W. Period Peak Diode Recovery dV/dt Test Circuit VDD  dV/dt controlled by Rg  Driver same type as D.U.T.  ISD controlled by duty factor “D”  D.U.T. - device under test D.U.T. Circuit layout considerations  Low stray inductance  Ground plane  Low leakage inductance current transformer Rg Note a. VGS = 5 V for logic level devices VDD E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

  • M = 1.32 mm to 1.62 mm (dim ension including protrusion) Heatsink hole for HVM 321 L L(1) D H(1) Q Ø P A F J(1) b(1) e(1) e E b C MILLIMETERS INCHES A 4.25 4.65 0.167 0.183 b 0.69 1.01 0.027 0.040 b(1) 1.20 1 .73 0.047 0.068 c 0.36 0.61 0.014 0.024 D 14.85 15.49 0.585 0.610 E 10.04 10.51 0.395 0.414 e 2.41 2.67 0.095 0.105 e(1) 4.88 5.28 0.192 0.208 F 1.14 1.40 0.045 0.055 H(1) 6.09 6.48 0.240 0.255 J(1) 2.41 2.92 0.095 0.115 L 13.35 14.02 0.526 0.552 L(1) 3.32 3.82 0.131 0.150 Ø P 3.54 3.94 0.139 0.155 Q 2.60 3.00 0.102 0.118 ECN: X12-0208-Rev. N, 08-Oct-12 DWG: 5471 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

TO-220 FULLPAK (HIGH VOLTAGE) Notes 1. To be used only for process drawing. 2. These dimensions apply to all TO-220, FULLPAK leadframe versions 3 leads. 3. All critical dimensions should C meet C pk > 1.33. 4. All dimensions include bur rs and plating thickness. 5. No chipping or package damage. E b n L e Ø P D c u V A MILLIMETERS INCHES A 4.570 4.830 0.180 0.190 A1 2.570 2.830 0.101 0.111 A2 2.510 2.850 0.099 0.112 b 0.622 0.890 0.024 0.035 b2 1.229 1.400 0.048 0.055 b3 1.229 1.400 0.048 0.055 c 0.440 0.629 0.017 0.025 D 8.650 9.800 0.341 0.386 d1 15.88 16.120 0.622 0.635 d3 12.3 00 12.920 0.484 0.509 E 10.360 10.630 0.408 0.419 e 2.54 BSC 0.100 BSC L 13.200 13.730 0.520 0.541 L1 3.100 3.500 0.122 0.138 n 6.050 6.150 0.238 0.242 Ø P 3.050 3.450 0.120 0.136 u 2.400 2.500 0.094 0.098 v 0.400 0.500 0.016 0.020 ECN: X09-0126-Rev. B, 26-Oct-09 DWG: 5972 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

TO-263AB (HIGH VOLTAGE) Notes 1. Dimensioning and tolerancing per ASME Y14.5M-1994. 2. Dimensions are shown in millimeters (inches). outmost extremes of the plastic body at datum A. 4. T hermal PAD contour optional within dimension E, L1, D1 and E1. 5. Dimension b1 and c1 apply to base metal only. 6. Datum A and B to be determined at datum plane H. 7. Outline conforms to JEDEC outline to TO-263AB. 1 3 D B B E H BA Detail A A A c A 2 x e 2 x b2 2 x b

0.010 A BMM

± 0.004 BM Base metal Plating b1, b3 (b, b2) c1(c) Section B - B and C - C Scale: none Lead tip (Datum A)

2 C C

E B H Seating plane Gauge plane 0° to 8° Detail “A” Rotated 90° CW scale 8:1 L3 A1L4L MILLIMETERS INCHES MILLIMETERS INCHES - 0.270 - ECN: S-82110-Rev. A, 15-Sep-08 DWG: 5970 E-mail:China@VBsemi TEL:86-755-83251052 www.VBsemi.tw STP9NK60ZD A ll data sheet.ocm

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