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www.sii-ic.com BATTERY MONITORING IC FOR 1-CELL PACK © Seiko Instruments Inc., 2015 Rev.1.0_01 Seiko Instruments Inc. 1 The S-8259A Series is an IC including high-accuracy voltage detection circuits and delay circuits. The S-8259A Series is suitable for monitoring overcharge and overdischarge for 1-cell lithium-ion / lithium polymer rechargeable battery packs. Features
- High-accuracy voltage detection circuit Overcharge detection voltage 3.5 V to 4.6 V (5 mV step) Accuracy ±20 mV Overcharge release voltage 3.1 V to 4.6 V *1 Accuracy ±50 mV Overdischarge detection voltage 2.0 V to 3.4 V (10 mV step) Accuracy ±50 mV Overdischarge release voltage 2.0 V to 3.4 V *2 Accuracy ±100 mV
- Detection delay times are generated only by an internal circuit (external capacitors are unnecessary).
- Wide operation temperature range: Ta = −40°C to +85°C
- Low current consumption During operation: 1.5 μA typ., 3.0 μA max. (Ta = +25°C) During overdischarge: 2.0 μA max. (Ta = +25°C)
- Lead-free (Sn 100%), halogen-free *1. Overcharge release voltage = Overcharge detection voltage − Overcharge hysteresis voltage (Overcharge hysteresis voltage can be selected from a range of 0 V to 0.4 V in 50 mV step.) *2. Overdischarge release voltage = Overdischarge detection voltage + Overdischarge hysteresis voltage (Overdischarge hysteresis voltage can be selected from a range of 0.1 V to 0.7 V in 100 mV step.) Applications
- Lithium-ion rechargeable battery pack
- Lithium polymer rechargeable battery pack Package
- SOT-23-6
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 2 Block Diagram VM VSS VDD CO DO Overcharge detection comparator Overdischarge detection comparator Control logic Delay circuit Oscillator Figure 1
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 3 Product Name Structure 1. Product name S-8259A xx - M6T1 U Package abbreviation and IC packing specifications*1 M6T1: SOT-23-6, Tape Serial code*2 Sequentially set from AA to ZZ Environmental code U: Lead-free (Sn 100%), halogen-free *1. Refer to the tape drawing. *2. Refer to "3. Product name list". 2. Package Table 1 Package Drawing Codes Package Name Dimension Tape Reel SOT-23-6 MP006-A-P-SD MP006-A-C-SD MP006-A-R-SD 3. Product name list Table 2 Product Name Overcharge Detection Voltage [VCU] Overcharge Release Voltage [VCL] Overdischarge Detection Voltage [VDL] Overdischarge Release Voltage [VDU] Overcharge Detection Delay Time [tCU] Overcharge Release Delay Time [tCL] Overdischarge Detection Delay Time [tDL] Remark 1. Please contact our sales office for the products with de tection voltage value other than those specified above. 2. The delay times can be changed within the range listed in Table 3. For details, please contact our sales office. Table 3 Delay Time Symbol Selection Range Remark Overcharge detection delay time t CU 128 ms 256 ms 512 ms 1.0 s 2.0 s 4.0 s Select a value from the left. Overcharge release delay time t CL 32 ms 64 ms 128 ms 1.0 s 2.0 s 4.0 s Select a value from the left. overdischarge detection delay time t DL 32 ms 64 ms 128 ms 256 ms − − Select a value from the left.
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 4 Pin Configuration 1. SOT-23-6 13 2 546 Top view Figure 2 Table 4 Pin No. Symbol Description
1 DO Output pin for overdischarge detection
(CMOS output)
2 VM Negative power supply input pin for CO pin
3 CO Output pin for overcharge detection
(CMOS output)
4 NC*1 No connection
5 VDD Input pin for positive power supply
6 VSS Input pin for negative power supply
*1. The NC pin is electrically open. The NC pin can be connected to VDD pin or VSS pin.
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 5 Absolute Maximum Ratings Table 5 (Ta = +25°C unless otherwise specified) Item Symbol Applied Pin Absolute Maximum Rating Unit Input voltage between VDD pin and VSS pin V DS VDD VSS − 0.3 to VSS + 6 V VM pin input voltage VVM VM V DD − 28 to VDD + 0.3 V DO pin output voltage VDO DO V SS − 0.3 to VDD + 0.3 V CO pin output voltage VCO CO V VM − 0.3 to VDD + 0.3 V Power dissipation PD − 650*1 mW Operation ambient temperature Topr − −40 to +85 °C Storage temperature Tstg − −55 to +125 °C *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm × 76.2 mm × t1.6 mm (2) Board name: JEDEC STANDARD51-7 Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. 0 50 100 150 400 200 700 300 100 500 600 Power Dissipation (PD) [mW] Ambient Temperature (Ta) [°C] Figure 3 Power Dissipation of Package (When Mounted on Board)
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 6 Electrical Characteristics 1. Ta = +25°C Table 6 (Ta = +25°C unless otherwise specified) Item Symbol Condition Min. Typ. Max. Unit Test Circuit Detection Voltage Overcharge detection voltage VCU − V CU − 0.020 V CU V CU + 0.020 V 1 Ta = −10°C ~ +60°C*1 VCU − 0.025 V CU V CU + 0.025 V 1 Overcharge release voltage VCL VCL ≠ VCU V CL − 0.050 V CL V CL + 0.050 V 1 VCL = VCU V CL − 0.025 V CL V CL + 0.020 V 1 Overdischarge detection voltage VDL − V DL − 0.050 V DL V DL + 0.050 V 2 Overdischarge release voltage VDU V DL ≠ VDU V DU − 0.100 V DU V DU + 0.100 V 2 Input Voltage Operation voltage between VDD pin and VSS pin VDSOP − 1.5 − 6.0 V − Input Current Current consumption during operation IOPE V DD = 3.4 V, VVM = 0 V − 1.5 3.0 μA 3 Current consumption during overdischarge IOPED V DD = 1.5 V, VVM = 0 V − − 2.0 μA 3 Output Resistance CO pin resistance "H" 1 RCOH1 − 5 10 20 k Ω 4 CO pin resistance "L" RCOL − 5 10 20 k Ω 4 DO pin resistance "H" RDOH − 5 10 20 k Ω 4 DO pin resistance "L" RDOL − 5 10 20 k Ω 4 CO pin resistance "H" 2 RCOH2 − 1 4 − MΩ 4 Delay Time Overcharge detection delay time tCU − t CU × 0.7 tCU tCU × 1.3 − 5 Overcharge release delay time tCL − tCL × 0.7 tCL tCL × 1.3 − 5 Overdischarge detection delay time tDL − tDL × 0.7 tDL tDL × 1.3 − 5 *1. Since products are not screened at high and low temperature, the specif ication for this temperatur e range is guaranteed by design, not tested in production.
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 7 2. Ta = −40°C to +85°C*1 Table 7 (Ta = −40°C to +85°C*1 unless otherwise specified) Item Symbol Condition Min. Typ. Max. Unit Test Circuit Detection Voltage Overcharge detection voltage VCU − VCU − 0.045 V CU V CU + 0.030 V 1 Overcharge release voltage VCL VCL ≠ VCU VCL − 0.080 V CL V CL + 0.060 V 1 VCL = VCU VCL − 0.050 V CL V CL + 0.030 V 1 Overdischarge detection voltage VDL − VDL − 0.080 V DL V DL + 0.060 V 2 Overdischarge release voltage VDU V DL ≠ VDU VDU − 0.130 V DU V DU + 0.110 V 2 Input Voltage Operation voltage between VDD pin and VSS pin VDSOP − 1.5 − 6.0 V − Input Current Current consumption during operation IOPE V DD = 3.4 V, VVM = 0 V − 1.5 4.0 μA 3 Current consumption during overdischarge IOPED V DD = VVM = 1.5 V − − 3.0 μA 3 Output Resistance CO pin resistance "H" 1 RCOH1 − 2.5 10 30 k Ω 4 CO pin resistance "L" RCOL − 2.5 10 30 k Ω 4 DO pin resistance "H" RDOH − 2.5 10 30 k Ω 4 DO pin resistance "L" RDOL − 2.5 10 30 kΩ 4 CO pin resistance "H" 2 RCOH2 − 0.5 4 − MΩ 4 Delay Time Overcharge detection delay time tCU − tCU × 0.5 tCU tCU × 2.5 − 5 Overcharge release delay time tCL − tCL × 0.5 tCL tCL × 2.5 − 5 Overdischarge detection delay time tDL − tDL × 0.5 tDL tDL × 2.5 − 5 *1. Since products are not screened at high and low temperature, the specif ication for this temperatur e range is guaranteed by design, not tested in production.
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 8 Test Circuits Caution Unless otherwise specified, the output voltage levels "H" and "L" at CO pin (V CO) are judged by V VM + 1.0 V, and the output voltage levels "H" and "L" at DO pin (V DO) are judged by V SS + 1.0 V. Judge the CO pin level with respect to VVM and the DO pin level with respect to VSS. 1. Overcharge detection voltage, overcharge release voltage (Test circuit 1) Overcharge detection voltage (VCU) is defined as the voltage V1 at which V CO goes from "H" to "L" when the voltage V1 is gradually increased from the starting conditi on of V1 = 3.4 V. Over charge release voltage (V CL) is defined as the voltage V1 at which V CO goes from "L" to "H" when the voltage V1 is then gradually decreased. Overcharge hysteresis voltage (VHC) is defined as the difference between VCU and VCL. 2. Overdischarge detection voltage, overdischarge release voltage (Test circuit 2) Overdischarge detection voltage (VDL) is defined as the voltage V1 at which V DO goes from "H" to "L" when the voltage V1 is gradually decreased from the starting condition of V1 = 3.4 V. Overdischarge release voltage (V DU) is defined as the voltage V1 at which V DO goes from "L" to "H" when the voltage V1 is then gradually increased. Overdischarge hysteresis voltage (VHD) is defined as the difference between VDU and VDL. 3. Current consumption during operation (Test circuit 3) The current consumption during operation (I OPE) is the current that flows through VDD pin (I DD) under the set condition of V1 = 3.4 V. 4. Current consumption during overdischarge (Test circuit 3) The current consumption during overdischarge (IOPED) is IDD under the set condition of V1 = 1.5 V. 5. CO pin resistance "H" 1 (Test circuit 4) The CO pin resistance "H" 1 (RCOH1) is the resistance between VDD pin and CO pin under the set conditions of V1 = 3.4 V, V3 = 3.0 V. 6. CO pin resistance "L" (Test circuit 4) The CO pin resistance "L" (RCOL) is the resistance between VM pin and CO pin under the set conditions of V1 = 4.7 V, V3 = 0.4 V. 7. DO pin resistance "H" (Test circuit 4) The DO pin resistance "H" (RDOH) is the resistance between VDD pin and DO pin under the set conditions of V1 = 3.4 V, V4 = 3.0 V. 8. DO pin resistance "L" (Test circuit 4) The DO pin resistance "L" (RDOL) is the resistance between VSS pin and DO pin under the set conditions of V1 = 1.8 V, V4 = 0.4 V. 9. CO pin resistance "H" 2 (Test circuit 4) The CO pin resistance "H" 2 (RCOH2) is the resistance between VDD pin and CO pin under the set conditions of V1 = 4.7 V, V3 = 0 V.
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 9 10. Overcharge detection delay time (Test circuit 5) The overcharge detection delay time (tCU) is the time needed for VCO to go to "L" just after the voltage V1 increases and exceeds VCU under the set condition of V1 = 3.4 V. 11. Overcharge release delay time (Test circuit 5) The overcharge release delay time (tCL) is the time needed for VCO to go to "H" just after the voltage V1 decreases and falls below VCL under the set condition of V1 = 4.7 V. 12. Overdischarge detection delay time (Test circuit 5) The overdischarge detection delay time (tDL) is the time needed for VDO to go to "L" after the voltage V1 decreases and falls below VDL under the set condition of V1 = 3.4 V.
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 11 Operation Remark Refer to " Connection Example". 1. Normal status The S-8259A Series monitors the voltage of the battery connected between VDD pin and VSS pin to control charging and discharging. When the battery voltage is in the range from overdischarge detection voltage (V DL) to overcharge detection voltage (VCU), CO pin and DO pin both output the VDD pin level. This condition is called the normal status. 2. Overcharge status When the battery voltage becomes higher than V CU during charging in the normal status and the condition continues for the overcharge detection delay time (t CU) or longer, CO pin outputs the VM pi n level. This condition is called the overcharge status. When the battery voltage falls below the overcharge release voltage (V CL) and the condition continues for the overcharge release delay time (tCL) or longer, the S-8259A Series releases the overcharge status. 3. Overdischarge status When the battery voltage falls below V DL during discharging in the normal status and the condition continues for the overdischarge detection delay time (t DL) or longer, DO pin outputs the VSS pin level. This condition is called the overdischarge status. When the battery voltage exceeds the overdischarge release voltage (V DU), the S-8259A Series releases the overdischarge status.
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 12 Timing Chart 1. Overcharge detection, overdischarge detection VCU VDU VDL VCL Battery voltage VVM CO pin voltage VDD DO pin voltage VSS Status*1 VDD Overdischarge detection delay time (tDL) Overcharge detection delay time (tCU) Overcharge release delay time (tCL) *1. (1): Normal status (2): Overcharge status (3): Overdischarge status Figure 9
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 13 Connection Example Battery C1 VSS VM VDD S-8259A Series DO CO Figure 10 Table 8 Constants for External Components Symbol Part Purpose Min. Typ. Max. Remark R1 Resistor ESD protection, For power fluctuation 150 Ω 330 Ω 1 k Ω − C1 Capacitor For power fluctuation 0.068 μF 0.1 μF1 . 0 μF − Caution 1. The above constants may be changed without notice. 2. It has not been confirmed whether the operation is normal or not in circuits other than the above example of connection. In addition, the example of connection shown above and the constant do not guarantee proper operation. Perform thorough evaluation using the actual application to set the constant.
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 14 Precautions
- The application conditions for the input voltage, output voltage, and load current should not exceed the package power dissipation.
- Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit.
- SII claims no responsibility for any and all disputes arising out of or in connection with any infringement by products including this IC of patents owned by a third party.
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 15 Characteristics (Typical Data) 1. Current consumption 1. 1 IOPE vs. Ta 4.0 IOPE [A] 40 85 75 50 25 025 Ta [C] 0.0 3.0 2.0 1.0 2. Detection voltage 2. 1 VCU vs. Ta 2. 2 VCL vs. Ta 4.31 VCU [V] 40 85 75 50 25 025 Ta [C] 4.23 4.27 4.29 4.25 4.24 VCL [V] 40 85 75 50 25 025 Ta [C] 4.09 4.21 4.15 4.12 4.18 2. 3 VDL vs. Ta 2. 4 VDU vs. Ta 2.38 2.34 VDL [V] 40 85 75 50 25 025 Ta [C] 2.22 2.30 2.26 2.80 VDU [V] 40 85 75 50 25 025 Ta [C] 2.40 2.70 2.60 2.50
BATTERY MONITORING IC FOR 1-CELL PACK S-8259A Series Rev.1.0_01 Seiko Instruments Inc. 16 3. Delay time 3. 1 tCU vs. Ta 3. 2 tCL vs. Ta 2.6 tCU [s] 40 85 75 50 25 025 Ta [C] 0.2 2.2 1.8 1.4 1.0 0.6 tCL [ms] 40 85 75 50 25 025 Ta [C] 3. 3 tDL vs. Ta 320 tDL [ms] 40 85 75 50 25 025 Ta [C] 256 192 128 4. Output resistance 4. 1 RCOH1 vs. VCO 4. 2 RCOL vs. VCO RCOH1 [k] VCO [V] 4 3 2 1 RCOL [k] VCO [V] 4 3 2 1 4. 3 RDOH vs. VDO 4. 4 RDOL vs. VDO RDOH [k] VDO [V] 4 3 2 1 RDOL [k] VDO [V] 4 3 2 1
BATTERY MONITORING IC FOR 1-CELL PACK Rev.1.0_01 S-8259A Series Seiko Instruments Inc. 17 Marking Specifications 1. SOT-23-6 123 465 Top view (1) (2) (3) (4) (1) to (3): Product code (refer to Product name vs. Product code) (4): Lot number Product name vs. Product code Product Name Product Code (1) (2) (3) S-8259AAA-M6T1U H 5 A S-8259AAB-M6T1U H 5 B S-8259AAC-M6T1U H 5 C S-8259AAD-M6T1U H 5 D S-8259AAE-M6T1U H 5 E
/X32/X2E/X39/XB1/X30/X2E/X32 /X30/X2E/X31/X35 /X31/X2E/X39/XB1/X30/X2E/X32 /X31 /X32 /X33 /X34/X36 /X35 /X30/X2E/X33/X35/XB1/X30/X2E/X31/X35 /X30/X2E/X39/X35 /X20/X2B/X30/X2E/X31 /X20/X2D/X30/X2E/X30/X35/X30/X2E/X39/X35 /X4E/X6F/X2E /X54/X49/X54/X4C/X45 /X53/X43/X41/X4C/X45 /X55/X4E/X49/X54 /X6D/X6D /X53/X65/X69/X6B/X6F/X20/X49/X6E/X73/X74/X72/X75/X6D/X65/X6E/X74/X73/X20/X49/X6E/X63/X2E /X4E/X6F/X2E/X20/X4D/X50/X30/X30/X36/X2D/X41/X2D/X50/X2D/X53/X44/X2D/X32/X2E/X30 /X4D/X50/X30/X30/X36/X2D/X41/X2D/X50/X2D/X53/X44/X2D/X32/X2E/X30 /X53/X4F/X54/X32/X33/X36/X2D/X41/X2D/X50/X4B/X47/X20/X44/X69/X6D/X65/X6E/X73/X69/X6F/X6E/X73
/X4E/X6F/X2E /X54/X49/X54/X4C/X45 /X53/X43/X41/X4C/X45 /X55/X4E/X49/X54/X6D/X6D /X31/X32/X33 /X34/X35/X36 /XF8/X31/X2E/X35 /X2B/X30/X2E/X31 /X2D/X30 /X32/X2E/X30/XB1/X30/X2E/X30/X35 /XF8/X31/X2E/X30 /X2B/X30/X2E/X32 /X2D/X30 /X34/X2E/X30/XB1/X30/X2E/X31 /X31/X2E/X34/XB1/X30/X2E/X32 /X30/X2E/X32/X35/XB1/X30/X2E/X31 /X33/X2E/X32/XB1/X30/X2E/X32 /X53/X65/X69/X6B/X6F/X20/X49/X6E/X73/X74/X72/X75/X6D/X65/X6E/X74/X73/X20/X49/X6E/X63/X2E /X4E/X6F/X2E/X20/X4D/X50/X30/X30/X36/X2D/X41/X2D/X43/X2D/X53/X44/X2D/X33/X2E/X31 /X4D/X50/X30/X30/X36/X2D/X41/X2D/X43/X2D/X53/X44/X2D/X33/X2E/X31 /X53/X4F/X54/X32/X33/X36/X2D/X41/X2D/X43/X61/X72/X72/X69/X65/X72/X20/X54/X61/X70/X65 /X46/X65/X65/X64/X20/X64/X69/X72/X65/X63/X74/X69/X6F/X6E /X34/X2E/X30/XB1/X30/X2E/X31/X28/X31/X30/X20/X70/X69/X74/X63/X68/X65/X73/X3A/X34/X30/X2E/X30/XB1/X30/X2E/X32/X29
/X4E/X6F/X2E /X54/X49/X54/X4C/X45 /X53/X43/X41/X4C/X45 /X55/X4E/X49/X54 /X6D/X6D /X31/X32/X2E/X35/X6D/X61/X78/X2E /X39/X2E/X30/XB1/X30/X2E/X33 /XF8/X31/X33/XB1/X30/X2E/X32 /X28/X36/X30/XB0/X29 /X28/X36/X30/XB0/X29 /X51/X54/X59/X33/X2C/X30/X30/X30 /X53/X65/X69/X6B/X6F/X20/X49/X6E/X73/X74/X72/X75/X6D/X65/X6E/X74/X73/X20/X49/X6E/X63/X2E /X45/X6E/X6C/X61/X72/X67/X65/X64/X20/X64/X72/X61/X77/X69/X6E/X67/X20/X69/X6E/X20/X74/X68/X65/X20/X63/X65/X6E/X74/X72/X61/X6C/X20/X70/X61/X72/X74 /X4E/X6F/X2E/X20/X4D/X50/X30/X30/X36/X2D/X41/X2D/X52/X2D/X53/X44/X2D/X32/X2E/X31 /X4D/X50/X30/X30/X36/X2D/X41/X2D/X52/X2D/X53/X44/X2D/X32/X2E/X31 /X53/X4F/X54/X32/X33/X36/X2D/X41/X2D/X52/X65/X65/X6C
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