S801

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www.sii-ic.com ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) © Seiko Instruments Inc., 2000-2015 Rev.4.1_00 Seiko Instruments Inc. 1 The S-801 Series is a series of high-precision voltage detectors with a built-in delay time generator of fixed time developed using CMOS process. The detection volt age is fixed internally, with an accuracy of ±2.0 %. Internal oscillator and counter timer can delay the release signal without external parts. Three delay times 50 ms, 100 ms, and 200 ms are available. Two output forms, Nch open-drain and CMOS output, are available.  Features

• Ultra-low current consumption 1.3 μA typ. (at VDD=3.5 V)
• High-precision detection voltage ±2.0 %
• Hysteresis characteristics 60 mV typ.
• Detection voltage 2.2 V to 6.0 V (0.1 V step)
• Three delay times A type 50 ms typ. B type 100 ms typ. C type 200 ms typ.
• ON/OFF switching function of delay time (DS pin)
• Operating voltage range 0.95 V to 10.0 V
• Output forms Nch open- drain output (Active Low) CMOS output (Active Low)
• Lead-free, Sn 100%, halogen-free *1. Refer to “ Product Name Structure” for details.  Applications
• Power monitor for portable equipment such as not ebook computers, digital still cameras, PDA, and cellular phones.
• Constant voltage power monitor for cameras, video equipment and communication devices.
• Power monitor for microcomputers and reset for CPUs.  Packages
• SOT-23-5
• SNT-4A

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 3  Product Name Structure The detection voltage, delay time, output form and packages for S-801 Series can be selected at the user's request. Refer to the “ 1. Product name ” for the construction of the product name, “ 2. Packages ” regarding the package drawings and “3. Product Name List” for the full product names. 1. Product Name 1-1. SOT-23-5 S-801xx x x MC - xxx T2 x Environmental code U: Lead-free (Sn 100%), halogen-free G: Lead-free (for details, please contact our sales office) IC direction in tape specifications*1 Product code*2 Package code Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) *1. Refer to the taping specifications at the end this book. *2. Refer to the Table 2 in the “3. Product name list”.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 4 Seiko Instruments Inc. 1-2. SNT-4A S-801xx x x PF - xxx TF U IC direction in tape specifications*1 Product code*2 Package code Output form N: Nch open-drain output (Active low) L: CMOS output (Active low) Delay time A: 50 ms typ. B: 100 ms typ. C: 200 ms typ. Detection voltage value 22 to 60 (e.g. When the detection voltage is 2.2 V, it is expressed as 22.) Environmental code U: Lead-free (Sn 100%), halogen-free *1. Refer to the taping specifications at the end this book. *2. Refer to the Table 2 in the “3. Product name list”. 2. Packages Package name Drawing code Package Tape Reel Land SOT-23-5 MP005-A-P-SD MP005- A-C-SD MP005-A-R-SD — SNT-4A PF004-A-P-SD PF004-A-C-SD PF004-A-R-SD PF004-A-L-SD

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 5 3. Product Name List 3-1. SOT-23-5 Table 1 (1/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 2.2 V ±2.0% 50 ms typ. S-80122ANMC- JCHT2x S-80122ALMC-JAHT2x 100 ms typ. S-80122BNMC-JG HT2x S-80122BLMC-JEHT2x 200 ms typ. S-80122CNMC-JKHT2x S-80122CLMC-JIHT2x 2.3 V ±2.0% 50 ms typ. S-80123ANMC- JCIT2x S-80123ALMC-JAIT2x 100 ms typ. S-80123BNMC-JGIT2x S-80123BLMC-JEIT2x 200 ms typ. S-80123CNMC-JKIT2x S-80123CLMC-JIIT2x 2.4 V ±2.0% 50 ms typ. S-80124ANMC- JCJT2x S-80124ALMC-JAJT2x 100 ms typ. S-80124BNMC-JG JT2x S-80124BLMC-JEJT2x 200 ms typ. S-80124CNMC-JKJT2x S-80124CLMC-JIJT2x 2.5 V ±2.0% 50 ms typ. S-80125ANMC-JCKT2x S-80125ALMC-JAKT2x 100 ms typ. S-80125BNMC-JGKT2x S-80125BLMC-JEKT2x 200 ms typ. S-80125CNMC-JKKT2x S-80125CLMC-JIKT2x 2.6 V ±2.0% 50 ms typ. S-80126ANMC- JCLT2x S-80126ALMC-JALT2x 100 ms typ. S-80126BNMC-JG LT2x S-80126BLMC-JELT2x 200 ms typ. S-80126CNMC-JKLT2x S-80126CLMC-JILT2x 2.7 V ±2.0% 50 ms typ. S-80127ANMC-JCMT2x S-80127ALMC-JAMT2x 100 ms typ. S-80127BNMC-JGMT2x S-80127BLMC-JEMT2x 200 ms typ. S-80127CNMC-JKMT2x S-80127CLMC-JIMT2x 2.8 V ±2.0% 50 ms typ. S-80128ANMC- JCNT2x S-80128ALMC-JANT2x 100 ms typ. S-80128BNMC-JG NT2x S-80128BLMC-JENT2x 200 ms typ. S-80128CNMC-JKNT2x S-80128CLMC-JINT2x 2.9 V ±2.0% 50 ms typ. S-80129ANMC- JCOT2x S-80129ALMC-JAOT2x 100 ms typ. S-80129BNMC-J GOT2x S-80129BLMC-JEOT2x 200 ms typ. S-80129CNMC-JKOT2x S-80129CLMC-JIOT2x 3.0 V ±2.0% 50 ms typ. S-80130ANMC-JCPT2x S-80130ALMC-JAPT2x 100 ms typ. S-80130BNMC-JGPT2x S-80130BLMC-JEPT2x 200 ms typ. S-80130CNMC-JKPT2x S-80130CLMC-JIPT2x 3.1 V ±2.0% 50 ms typ. S-80131ANMC- JCQT2x S-80131ALMC-JAQT2x 100 ms typ. S-80131BNMC-J GQT2x S-80131BLMC-JEQT2x 200 ms typ. S-80131CNMC-JKQT2x S-80131CLMC-JIQT2x 3.2 V ±2.0% 50 ms typ. S-80132ANMC- JCRT2x S-80132ALMC-JART2x 100 ms typ. S-80132BNMC-JG RT2x S-80132BLMC-JERT2x 200 ms typ. S-80132CNMC-JKRT2x S-80132CLMC-JIRT2x 3.3 V ±2.0% 50 ms typ. S-80133ANMC-JCST2x S-80133ALMC-JAST2x 100 ms typ. S-80133BNMC-JGST2x S-80133BLMC-JEST2x 200 ms typ. S-80133CNMC-JKST2x S-80133CLMC-JIST2x 3.4 V ±2.0% 50 ms typ. S-80134ANMC-JCTT2x S-80134ALMC-JATT2x 100 ms typ. S-80134BNMC-JGTT2x S-80134BLMC-JETT2x 200 ms typ. S-80134CNMC-JKTT2x S-80134CLMC-JITT2x

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 6 Seiko Instruments Inc. Table 1 (2/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 3.5 V ±2.0% 50 ms typ. S-80135ANMC- JCUT2x S-80135ALMC-JAUT2x 100 ms typ. S-80135BNMC-JG UT2x S-80135BLMC-JEUT2x 200 ms typ. S-80135CNMC-JKUT2x S-80135CLMC-JIUT2x 3.6 V ±2.0% 50 ms typ. S-80136ANMC-JCVT2x S-80136ALMC-JAVT2x 100 ms typ. S-80136BNMC-JGVT2x S-80136BLMC-JEVT2x 200 ms typ. S-80136CNMC-JKVT2x S-80136CLMC-JIVT2x 3.7 V ±2.0% 50 ms typ. S-80137ANMC-JCWT2x S-80137ALMC-JAWT2x 100 ms typ. S-80137BNMC-JGWT2x S-80137BLMC-JEWT2x 200 ms typ. S-80137CNMC-JKWT2x S-80137CLMC-JIWT2x 3.8 V ±2.0% 50 ms typ. S-80138ANMC-JCXT2x S-80138ALMC-JAXT2x 100 ms typ. S-80138BNMC-JGXT2x S-80138BLMC-JEXT2x 200 ms typ. S-80138CNMC-JKXT2x S-80138CLMC-JIXT2x 3.9 V ±2.0% 50 ms typ. S-80139ANMC-JCYT2x S-80139ALMC-JAYT2x 100 ms typ. S-80139BNMC-JGYT2x S-80139BLMC-JEYT2x 200 ms typ. S-80139CNMC-JKYT2x S-80139CLMC-JIYT2x 4.0 V ±2.0% 50 ms typ. S-80140ANMC-JCZT2x S-80140ALMC-JAZT2x 100 ms typ. S-80140BNMC-JGZT2x S-80140BLMC-JEZT2x 200 ms typ. S-80140CNMC-JKZT2x S-80140CLMC-JIZT2x 4.1 V ±2.0% 50 ms typ. S-80141ANMC- JC2T2x S-80141ALMC-JA2T2x 100 ms typ. S-80141BNMC-JG 2T2x S-80141BLMC-JE2T2x 200 ms typ. S-80141CNMC-JK2T2x S-80141CLMC-JI2T2x 4.2 V ±2.0% 50 ms typ. S-80142ANMC- JC3T2x S-80142ALMC-JA3T2x 100 ms typ. S-80142BNMC-JG 3T2x S-80142BLMC-JE3T2x 200 ms typ. S-80142CNMC-JK3T2x S-80142CLMC-JI3T2x 4.3 V ±2.0% 50 ms typ. S-80143ANMC- JC4T2x S-80143ALMC-JA4T2x 100 ms typ. S-80143BNMC-JG 4T2x S-80143BLMC-JE4T2x 200 ms typ. S-80143CNMC-JK4T2x S-80143CLMC-JI4T2x 4.4 V ±2.0% 50 ms typ. S-80144ANMC- JC5T2x S-80144ALMC-JA5T2x 100 ms typ. S-80144BNMC-JG 5T2x S-80144BLMC-JE5T2x 200 ms typ. S-80144CNMC-JK5T2x S-80144CLMC-JI5T2x 4.5 V ±2.0% 50 ms typ. S-80145ANMC- JC6T2x S-80145ALMC-JA6T2x 100 ms typ. S-80145BNMC-JG 6T2x S-80145BLMC-JE6T2x 200 ms typ. S-80145CNMC-JK6T2x S-80145CLMC-JI6T2x 4.6 V ±2.0% 50 ms typ. S-80146ANMC- JC7T2x S-80146ALMC-JA7T2x 100 ms typ. S-80146BNMC-JG 7T2x S-80146BLMC-JE7T2x 200 ms typ. S-80146CNMC-JK7T2x S-80146CLMC-JI7T2x 4.7 V ±2.0% 50 ms typ. S-80147ANMC- JC8T2x S-80147ALMC-JA8T2x 100 ms typ. S-80147BNMC-JG 8T2x S-80147BLMC-JE8T2x 200 ms typ. S-80147CNMC-JK8T2x S-80147CLMC-JI8T2x 4.8 V ±2.0% 50 ms typ. S-80148ANMC- JC9T2x S-80148ALMC-JA9T2x 100 ms typ. S-80148BNMC-JG 9T2x S-80148BLMC-JE9T2x 200 ms typ. S-80148CNMC-JK9T2x S-80148CLMC-JI9T2x 4.9 V ±2.0% 50 ms typ. S-80149ANMC-JDAT2x S-80149ALMC-JBAT2x 100 ms typ. S-80149BNMC-JHAT2x S-80149BLMC-JFAT2x 200 ms typ. S-80149CNMC-JLAT2x S-80149CLMC-JJAT2x

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 7 Table 1 (3/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 5.0 V ±2.0% 50 ms typ. S-80150ANMC-JDBT2x S-80150ALMC-JBBT2x 100 ms typ. S-80150BNMC-JHBT2x S-80150BLMC-JFBT2x 200 ms typ. S-80150CNMC-JLBT2x S-80150CLMC-JJBT2x 5.1 V ±2.0% 50 ms typ. S-80151ANMC- JDCT2x S-80151ALMC-JBCT2x 100 ms typ. S-80151BNMC-JHCT2x S-80151BLMC-JFCT2x 200 ms typ. S-80151CNMC-JLCT2x S-80151CLMC-JJCT2x 5.2 V ±2.0% 50 ms typ. S-80152ANMC- JDDT2x S-80152ALMC-JBDT2x 100 ms typ. S-80152BNMC-JHDT2x S-80152BLMC-JFDT2x 200 ms typ. S-80152CNMC-JLDT2x S-80152CLMC-JJDT2x 5.3 V ±2.0% 50 ms typ. S-80153ANMC-JDET2x S-80153ALMC-JBET2x 100 ms typ. S-80153BNMC-JHET2x S-80153BLMC-JFET2x 200 ms typ. S-80153CNMC-JLET2x S-80153CLMC-JJET2x 5.4 V ±2.0% 50 ms typ. S-80154ANMC-JDFT2x S-80154ALMC-JBFT2x 100 ms typ. S-80154BNMC-JHFT2x S-80154BLMC-JFFT2x 200 ms typ. S-80154CNMC-JLFT2x S-80154CLMC-JJFT2x 5.5 V ±2.0% 50 ms typ. S-80155ANMC- JDGT2x S-80155ALMC-JBGT2x 100 ms typ. S-80155BNMC-JHGT2x S-80155BLMC-JFGT2x 200 ms typ. S-80155CNMC-JLGT2x S-80155CLMC-JJGT2x 5.6 V ±2.0% 50 ms typ. S-80156ANMC- JDHT2x S-80156ALMC-JBHT2x 100 ms typ. S-80156BNMC-JHHT2x S-80156BLMC-JFHT2x 200 ms typ. S-80156CNMC-JLHT2x S-80156CLMC-JJHT2x 5.7 V ±2.0% 50 ms typ. S-80157ANMC- JDIT2x S-80157ALMC-JBIT2x 100 ms typ. S-80157BNMC-JHIT2x S-80157BLMC-JFIT2x 200 ms typ. S-80157CNMC-JLIT2x S-80157CLMC-JJIT2x 5.8 V ±2.0% 50 ms typ. S-80158ANMC- JDJT2x S-80158ALMC-JBJT2x 100 ms typ. S-80158BNMC-JH JT2x S-80158BLMC-JFJT2x 200 ms typ. S-80158CNMC-JLJT2x S-80158CLMC-JJJT2x 5.9 V ±2.0% 50 ms typ. S-80159ANMC-JDKT2x S-80159ALMC-JBKT2x 100 ms typ. S-80159BNMC-JHKT2x S-80159BLMC-JFKT2x 200 ms typ. S-80159CNMC-JLKT2x S-80159CLMC-JJKT2x 6.0 V ±2.0% 50 ms typ. S-80160ANMC- JDLT2x S-80160ALMC-JBLT2x 100 ms typ. S-80160BNMC-JHLT2x S-80160BLMC-JFLT2x 200 ms typ. S-80160CNMC-JLLT2x S-80160CLMC-JJLT2x Remark 1. x: G or U 2. Please select products of environmental code = U for Sn 100%, halogen-free products.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 8 Seiko Instruments Inc. 3-2. SNT-4A Table 2 (1/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 2.2 V ±2.0% 50 ms typ. S-80122ANPF- JCHTFU S-80122ALPF-JAHTFU 100 ms typ. S-80122BNPF-JGHTFU S-80122BLPF-JEHTFU 200 ms typ. S-80122CNPF-JKHTFU S-80122CLPF-JIHTFU 2.3 V ±2.0% 50 ms typ. S-80123ANPF-JC ITFU S-80123ALPF-JAITFU 100 ms typ. S-80123BNPF-JG ITFU S-80123BLPF-JEITFU 200 ms typ. S-80123CNPF-JK ITFU S-80123CLPF-JIITFU 2.4 V ±2.0% 50 ms typ. S-80124ANPF- JCJTFU S-80124ALPF-JAJTFU 100 ms typ. S-80124BNPF-JGJTFU S-80124BLPF-JEJTFU 200 ms typ. S-80124CNPF-JK JTFU S-80124CLPF-JIJTFU 2.5 V ±2.0% 50 ms typ. S-80125ANPF-JCKTFU S-80125ALPF-JAKTFU 100 ms typ. S-80125BNPF-JGKTFU S-80125BLPF-JEKTFU 200 ms typ. S-80125CNPF-J KKTFU S-80125CLPF-JIKTFU 2.6 V ±2.0% 50 ms typ. S-80126ANPF-JCLTFU S-80126ALPF-JALTFU 100 ms typ. S-80126BNPF-JGLTFU S-80126BLPF-JELTFU 200 ms typ. S-80126CNPF-JKLTFU S-80126CLPF-JILTFU 2.7 V ±2.0% 50 ms typ. S-80127ANPF-JCMTFU S-80127ALPF-JAMTFU 100 ms typ. S-80127BNPF-JGMTFU S-80127BLPF-JEMTFU 200 ms typ. S-80127CNPF-JKMTFU S-80127CLPF-JIMTFU 2.8 V ±2.0% 50 ms typ. S-80128ANPF- JCNTFU S-80128ALPF-JANTFU 100 ms typ. S-80128BNPF-JGNTFU S-80128BLPF-JENTFU 200 ms typ. S-80128CNPF-JKNTFU S-80128CLPF-JINTFU 2.9 V ±2.0% 50 ms typ. S-80129ANPF-JCOTFU S-80129ALPF-JAOTFU 100 ms typ. S-80129BNPF-JGOTFU S-80129BLPF-JEOTFU 200 ms typ. S-80129CNPF-JKOTFU S-80129CLPF-JIOTFU 3.0 V ±2.0% 50 ms typ. S-80130ANPF-JCPTFU S-80130ALPF-JAPTFU 100 ms typ. S-80130BNPF-JGPTFU S-80130BLPF-JEPTFU 200 ms typ. S-80130CNPF-J KPTFU S-80130CLPF-JIPTFU 3.1 V ±2.0% 50 ms typ. S-80131ANPF-JCQTFU S-80131ALPF-JAQTFU 100 ms typ. S-80131BNPF-JGQTFU S-80131BLPF-JEQTFU 200 ms typ. S-80131CNPF-JKQTFU S-80131CLPF-JIQTFU 3.2 V ±2.0% 50 ms typ. S-80132ANPF- JCRTFU S-80132ALPF-JARTFU 100 ms typ. S-80132BNPF-JGRTFU S-80132BLPF-JERTFU 200 ms typ. S-80132CNPF-JKRTFU S-80132CLPF-JIRTFU 3.3 V ±2.0% 50 ms typ. S-80133ANPF-JCSTFU S-80133ALPF-JASTFU 100 ms typ. S-80133BNPF-JGSTFU S-80133BLPF-JESTFU 200 ms typ. S-80133CNPF-J KSTFU S-80133CLPF-JISTFU 3.4 V ±2.0% 50 ms typ. S-80134ANPF-JCTTFU S-80134ALPF-JATTFU 100 ms typ. S-80134BNPF-JGTTFU S-80134BLPF-JETTFU 200 ms typ. S-80134CNPF-JKTTFU S-80134CLPF-JITTFU 3.5 V ±2.0% 50 ms typ. S-80135ANPF- JCUTFU S-80135ALPF-JAUTFU 100 ms typ. S-80135BNPF-JGUTFU S-80135BLPF-JEUTFU 200 ms typ. S-80135CNPF-JKUTFU S-80135CLPF-JIUTFU 3.6 V ±2.0% 50 ms typ. S-80136ANPF-JCVTFU S-80136ALPF-JAVTFU 100 ms typ. S-80136BNPF-JGVTFU S-80136BLPF-JEVTFU 200 ms typ. S-80136CNPF-J KVTFU S-80136CLPF-JIVTFU 3.7 V ±2.0% 50 ms typ. S-80137ANPF-JCWTFU S-80137ALPF-JAWTFU 100 ms typ. S-80137BNPF-JGWTFU S-80137BLPF-JEWTFU 200 ms typ. S-80137CNPF-JKWTFU S-80137CLPF-JIWTFU

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 9 Table 2 (2/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 3.8 V ±2.0% 50 ms typ. S-80138ANPF-JCXTFU S-80138ALPF-JAXTFU 100 ms typ. S-80138BNPF-JGXTFU S-80138BLPF-JEXTFU 200 ms typ. S-80138CNPF-J KXTFU S-80138CLPF-JIXTFU 3.9 V ±2.0% 50 ms typ. S-80139ANPF-JCYTFU S-80139ALPF-JAYTFU 100 ms typ. S-80139BNPF-JGYTFU S-80139BLPF-JEYTFU 200 ms typ. S-80139CNPF-J KYTFU S-80139CLPF-JIYTFU 4.0 V ±2.0% 50 ms typ. S-80140ANPF-JCZTFU S-80140ALPF-JAZTFU 100 ms typ. S-80140BNPF-JGZTFU S-80140BLPF-JEZTFU 200 ms typ. S-80140CNPF-JKZTFU S-80140CLPF-JIZTFU 4.1 V ±2.0% 50 ms typ. S-80141ANPF-JC2TFU S-80141ALPF-JA2TFU 100 ms typ. S-80141BNPF-JG2TFU S-80141BLPF-JE2TFU 200 ms typ. S-80141CNPF-JK2TFU S-80141CLPF-JI2TFU 4.2 V ±2.0% 50 ms typ. S-80142ANPF-JC3TFU S-80142ALPF-JA3TFU 100 ms typ. S-80142BNPF-JG3TFU S-80142BLPF-JE3TFU 200 ms typ. S-80142CNPF-JK3TFU S-80142CLPF-JI3TFU 4.3 V ±2.0% 50 ms typ. S-80143ANPF-JC4TFU S-80143ALPF-JA4TFU 100 ms typ. S-80143BNPF-JG4TFU S-80143BLPF-JE4TFU 200 ms typ. S-80143CNPF-JK4TFU S-80143CLPF-JI4TFU 4.4 V ±2.0% 50 ms typ. S-80144ANPF-JC5TFU S-80144ALPF-JA5TFU 100 ms typ. S-80144BNPF-JG5TFU S-80144BLPF-JE5TFU 200 ms typ. S-80144CNPF-JK5TFU S-80144CLPF-JI5TFU 4.5 V ±2.0% 50 ms typ. S-80145ANPF-JC6TFU S-80145ALPF-JA6TFU 100 ms typ. S-80145BNPF-JG6TFU S-80145BLPF-JE6TFU 200 ms typ. S-80145CNPF-JK6TFU S-80145CLPF-JI6TFU 4.6 V ±2.0% 50 ms typ. S-80146ANPF-JC7TFU S-80146ALPF-JA7TFU 100 ms typ. S-80146BNPF-JG7TFU S-80146BLPF-JE7TFU 200 ms typ. S-80146CNPF-JK7TFU S-80146CLPF-JI7TFU 4.7 V ±2.0% 50 ms typ. S-80147ANPF-JC8TFU S-80147ALPF-JA8TFU 100 ms typ. S-80147BNPF-JG8TFU S-80147BLPF-JE8TFU 200 ms typ. S-80147CNPF-JK8TFU S-80147CLPF-JI8TFU 4.8 V ±2.0% 50 ms typ. S-80148ANPF-JC9TFU S-80148ALPF-JA9TFU 100 ms typ. S-80148BNPF-JG9TFU S-80148BLPF-JE9TFU 200 ms typ. S-80148CNPF-JK9TFU S-80148CLPF-JI9TFU 4.9 V ±2.0% 50 ms typ. S-80149ANPF-JDATFU S-80149ALPF-JBATFU 100 ms typ. S-80149BNPF-JHATFU S-80149BLPF-JFATFU 200 ms typ. S-80149CNPF-JLATFU S-80149CLPF-JJATFU 5.0 V ±2.0% 50 ms typ. S-80150ANPF-JDBTFU S-80150ALPF-JBBTFU 100 ms typ. S-80150BNPF-JHBTFU S-80150BLPF-JFBTFU 200 ms typ. S-80150CNPF-JLBTFU S-80150CLPF-JJBTFU 5.1 V ±2.0% 50 ms typ. S-80151ANPF- JDCTFU S-80151ALPF-JBCTFU 100 ms typ. S-80151BNPF-JHCTFU S-80151BLPF-JFCTFU 200 ms typ. S-80151CNPF-JLCTFU S-80151CLPF-JJCTFU 5.2 V ±2.0% 50 ms typ. S-80152ANPF- JDDTFU S-80152ALPF-JBDTFU 100 ms typ. S-80152BNPF-JHDTFU S-80152BLPF-JFDTFU 200 ms typ. S-80152CNPF-JLDTFU S-80152CLPF-JJDTFU 5.3 V ±2.0% 50 ms typ. S-80153ANPF-JDETFU S-80153ALPF-JBETFU 100 ms typ. S-80153BNPF-JHETFU S-80153BLPF-JFETFU 200 ms typ. S-80153CNPF-JLETFU S-80153CLPF-JJETFU

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 10 Seiko Instruments Inc. Table 2 (3/3) Detection voltage range Delay time Nch open- drain output products CMOS output products 5.4 V ±2.0% 50 ms typ. S-80154ANPF-JDFTFU S-80154ALPF-JBFTFU 100 ms typ. S-80154BNPF-JHFTFU S-80154BLPF-JFFTFU 200 ms typ. S-80154CNPF-JLFTFU S-80154CLPF-JJFTFU 5.5 V ±2.0% 50 ms typ. S-80155ANPF-JDGTFU S-80155ALPF-JBGTFU 100 ms typ. S-80155BNPF-JHGTFU S-80155BLPF-JFUTFU 200 ms typ. S-80155CNPF-JLGTFU S-80155CLPF-JJGTFU 5.6 V ±2.0% 50 ms typ. S-80156ANPF- JDHTFU S-80156ALPF-JBHTFU 100 ms typ. S-80156BNPF-JHHTFU S-80156BLPF-JFHTFU 200 ms typ. S-80156CNPF-JLHTFU S-80156CLPF-JJHTFU 5.7 V ±2.0% 50 ms typ. S-80157ANPF-JD ITFU S-80157ALPF-JBITFU 100 ms typ. S-80157BNPF-JHITFU S-80157BLPF-JFITFU 200 ms typ. S-80157CNPF-JLITFU S-80157CLPF-JJITFU 5.8 V ±2.0% 50 ms typ. S-80158ANPF- JDJTFU S-80158ALPF-JBJTFU 100 ms typ. S-80158BNPF-JHJTFU S-80158BLPF-JFJTFU 200 ms typ. S-80158CNPF-JLJTFU S-80158CLPF-JJJTFU 5.9 V ±2.0% 50 ms typ. S-80159ANPF-JDKTFU S-80159ALPF-JBKTFU 100 ms typ. S-80159BNPF-JHKTFU S-80159BLPF-JFKTFU 200 ms typ. S-80159CNPF-JLKTFU S-80159CLPF-JJKTFU 6.0 V ±2.0% 50 ms typ. S-80160ANPF-JDLTFU S-80160ALPF-JBLTFU 100 ms typ. S-80160BNPF-JHLTFU S-80160BLPF-JFLTFU 200 ms typ. S-80160CNPF-JLLTFU S-80160CLPF-JJLTFU

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 11  Pin Configurations SOT-23-5 Top view 5 4 3 2 1 Table 3 Pin No. Pin name Pin description

1 DS *1 ON/OFF switch for delay time

2 VSS GND pin

3 NC *2 No connection

4 OUT Voltage detection output pin

5 VDD Voltage input pin

*1. Refer to “2. Delay Circuit” in “ Operation” for operation. *2. The NC pin is electrically open. The NC pin can be connected to VDD or VSS. Figure 3 SNT-4A Top view 1 4 2 3 Table 4 Pin No. Pin name Pin description

1 VSS GND pin

2 DS *1 ON/OFF switch for delay time

3 VDD Voltage input pin

*1. Refer to “2. Delay Circuit” in “ Operation” for operation. Figure 4

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 12 Seiko Instruments Inc.  Absolute Maximum Ratings Table 5 (Ta=25°C unless otherwise specified) Item Symbol Absolute maximum ratings Unit Power supply voltage VDD−VSS 12 V Output voltage Nch open-drain output products V OUT VSS−0.3 to VSS+12 CMOS output products VSS−0.3 to VDD+0.3 Output current I OUT 50 mA Power dissipation SOT-23-5 P D 250 (When not mounted on board) mW 600 *1 SNT-4A 140 (When not mounted on board) 300 *1 Operating ambient temperature T opr −40 to +85 °C Storage temperature T stg −40 to +125 *1. When mounted on board [Mounted board] (1) Board size: 114.3 mm × 76.2 mm × t1.6 mm (2) Board name: JEDEC STANDARD51-7 Caution The absolute maximum ratings are rated values exceeding which the product could suffer physical damage. These values must therefore not be exceeded under any conditions. 0 50 100 150 600 400 Power Dissipation (PD) [mW] Ambient Temperature (Ta) [°C] 200 100 300 500 700 SNT-4A SOT-23-5 Figure 5 Power Dissipation of Package (When Mounted on Board)

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 13  Electrical Characteristics Table 6 (Ta=25 °C Unless otherwise specified) Item Symbol Condition Min. Typ. Max. Unit Test circuit Detection voltage*1 −VDET — −VDET(S) ×0.98 −VDET(S) −VDET(S) ×1.02 V 1 Hysteresis width V HYS — 30 60 100 mV Current consumption ISS VDD=3.5 V S-80122 to 26 — 1.3 3.3 μA VDD=4.5 V S-80127 to 39 — 1.5 3.5 VDD=6.5 V S-80140 to 60 — 1.8 4.0 Operating voltage V DD — 0.95 — 10.0 V Output current I OUT Output transistor, Nch, VOUT=0.5 V VDD=1.2 V S-80122 to 60 0.75 1.5 — mA 2 VDD=2.4 V S-80127 to 60 3.0 6.0 — Only for CMOS output products, Output transistor, Pch, V DD–VOUT=0.5 V VDD=4.8 V S-80122 to 39 1.0 2.0 — VDD=6.0 V S-80140 to 54 1.25 2.5 — VDD=8.4 V S-80155 to 60 1.5 3.0 — Leakage current I LEAK Only for Nch open-drain output products, Output transistor, Nch, VDD=10.0 V, VOUT=10.0 V — — 0.1 μA Detection voltage temperature coefficient DET DET VTa V −•Δ Ta=−40 °C to +85 °C — ±120 ±360 ppm/ °C 1 Delay time 1 t D1 VDD=−VDET+1 V, DS pin Low S-801xxAx 32.5 50 72.5 ms S-801xxBx 65 100 145 S-801xxCx 130 200 290 Delay time 2 t D2 VDD=−VDET+1 V, DS pin High 110 220 330 μs 3 Input voltage V SH DS pin, VDD=6.0 V 1.0 — — V 4 V SL DS pin, VDD=6.0 V — — 0.3 *1. −VDET: Actual detection voltage value, −VDET(S): Specified detection voltage value (The center value of the detection voltage range in Table 1 to 2.) *2. Temperature change ratio for the detection voltage [mV/°C] is calculated using the following equation. [] () [] [] 1000Cppm/ VTa∆ V∆V Typ.VCmV/ Ta∆ DET DET DET(S) DET ÷°− −×−=°− 3*2**1 *1. Temperature change ratio of the detection voltage *2. Specified detection voltage value *3. Detection voltage temperature coefficient

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 15  Operation 1. Basic Operation: CMOS Output (Active Low) 1-1. When the power supply voltage (VDD) is higher than the release voltage (+VDET), the Nch transistor is OFF and the Pch transistor is ON to provide VDD (high) at the output. Since the Nch transistor N1 in Figure 10 is OFF, the comparator input voltage is CBA DDCB RRR V)RR(

• + . 1-2. When the VDD goes below +VDET, the output provides the VDD level, as long as VDD remains above the detection voltage (–VDET). When the VDD falls below –VDET (point A in Figure 11), the Nch transistor becomes ON, the Pch transistor becomes OFF, and the VSS level appears at the output. At this time the Nch transistor N1 in Figure 10 becomes ON, the comparator input voltage is changed to BA DDB RR VR
• . 1-3. When the VDD falls below the minimum operating voltage, the output becomes undefined, or goes to VDD when the output is pulled up to VDD. 1-4. The VSS level appears when VDD rises above the minimum operating voltage. The VSS level still appears even when VDD surpasses the –VDET, as long as it does not exceed the release voltage +VDET. 1-5. When VDD rises above +VDET (point B in Figure 11), the Nch transistor becomes OFF and the Pch transistor becomes ON to provide VDD at the output. The VDD at the OUT pin is delayed for tD due to the delay circuit. DS RC RB Pch NchVREF VDD RA VSS OUT Delay circuit *1. Paracitic diode Figure 10 Operation 1

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 16 Seiko Instruments Inc. A B VDD tD VSS Minimum operating voltage Output from OUT pin VDD VSS (1) (2) (3) (5)(4) Hysterisis width (VHYS) Release voltage (+VDET) Detection voltage ( −VDET) Figure 11 Operation 2 2. Delay Circuit 2-1. Delay Time The delay circuit delays the output signal from the time at which the power voltage (VDD) exceeds the release voltage (+VDET) when VDD is turned on. The output signal is not delayed when the VDD goes below the detection voltage (–VDET). (Refer to Figure 11.) The delay time (tD) is a fixed value that is determined by a built-in oscillation circuit and counter. 2-2. DS Pin (ON/OFF Switch Pin for Delay Time) The DS pin should be connected to Low or High. When the DS pin is High, the output delay time becomes short since the output signal is taken from the middle of counter circuit (Refer to Figure 16). 3. Other Characteristics 3-1. Temperature Characteristics of Detection Voltage The shaded area in Figure 12 shows the temperature characteristics of the detection voltage. –40 25 +0.792 mV/°C 2.200

85 Ta [°C]

–0.792 mV/°C –VDET [V] Figure 12 Temperature Characteristics of Detection Voltage (Example for S-80122xxxx)

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 17 3-2. Temperature Characteristics of Release Voltage The temperature coefficient Ta VDET Δ +Δ of the release voltage is calculated by the temperature coefficient Ta VDET Δ −Δ for the detection voltage as follows: Ta V V V Ta V DET DET DETDET Δ −Δ×− +=Δ The temperature coefficients for the release voltage and the detection voltage have the same sign consequently. 3-3. Temperature Characteristics of Hysteresis Voltage The temperature characteristics for the hysteresis voltage is expressed as Ta V Ta V DETDET Δ −Δ−Δ +Δ and is calculated as follows: Ta V V V Ta V Ta V DET DET HYSDETDET Δ −Δ×−=Δ −Δ−Δ  Standard Circuit DS VDD OUT VSS R*1 100 kΩ *1. R is unnecessary for CMOS output products. Figure 13 Caution The above connection diagram and constant will not guarantees successful operation. Perform through using the actual application to set the constant.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 18 Seiko Instruments Inc.  Technical Terms 1. Detection Voltage (–VDET), Release Voltage (+VDET) The detection voltage (–VDET) is a voltage at which the output turns to low. The detection voltage varies slightly among products of the same specificati on. The variation of detection voltage between the specified minimum (–VDET) Min. and the maximum (–VDET) Max. is called the detection voltage range (Refer to Figure 14). This means that some S-80122ANs have 2.156 V for –VDET and some have 2.244 V. The release voltage (+VDET) is a voltage at which the output turns to high. The release voltage varies slightly among products of the same specification. The variation of release voltages between the specified minimum (+VDET) Min. and the maximum ( +VDET) Max. is called the release voltage range (Refer to Figure 15). This means that some S-80122ANs have 2.186 V for +VDET and some have 2.344 V. Detection voltage Detection voltage range VDD (−VDET) Min. (−VDET) Max. OUT Delay time Release voltage Release voltage range VDD (+VDET) Min. (+VDET) Max. OUT Figure 14 Detection Voltage Figure 15 Release Voltage Remark Although the detection voltage and release voltage overlap in the range of 2.186 V to 2.244 V, +VDET is always larger than –VDET.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 19 2. Hysteresis Width (VHYS) Hysteresis width is the voltage difference bet ween the detection voltage and the release voltage (The voltage at point B−The voltage at point A=VHYS in Figure 11). The existence of the hysteresis width prevents malfunction caused by noise on input signal. 3. Delay Time (tD) Delay time is a time internally measured from the instant at which input voltage to the VDD pin exceeds the release voltage ( +VDET) to the point at which the output of the OUT pin inverts. The delay time is fixed in each series distinguished by A, B and C. S-801xxAx series: typ. 50 ms S-801xxBx series: typ. 100 ms S-801xxCx series: typ. 200 ms The output of the OUT pin can be inverted in a short delay time (t D2) by setting the DS pin High (Refer to Figure 16). tD2 tD1 VDD at DS=”H” OUT V +VDET Figure 16 4. Through-type Current The through-type current refers to the current that flows instantaneously at the time of detection and release of a voltage detector. The through-type current flows at a frequency of 20 kHz during release delay time since the internal logic circuit operates.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 20 Seiko Instruments Inc. 5. Oscillation In applications where a resistor is connected to the voltage detector input ( Figure 17 ), taking a CMOS active low products for example, the through-type current which is generated when the output goes from low to high (release) causes a voltage drop equal to [through-type current] × [input resistance] across the resistor. When the input voltage drops below the detection voltage (–VDET) as a result, the output voltage goes to low level. In this state, the through- type current stops and its resultant voltage drop disappears, and the output goes from low to high. The through-type current is again generated, a voltage drop appears, and repeating the process finally induces oscillation. OUT VSS VDD RB RA VIN S-801 Figure 17 Example for Bad Implementation of Input Voltage Divider  Precautions

• In the S-801 series products, the through-type current flows at a frequency of 20 kHz approximately during the delay time since the internal oscillator circuit and counter timer operate at voltage release. High impedance in the input may cause oscillation by the through-type current. When the input impedance is high, insert a capacitor between VDD pin and VSS pin to prevent oscillation.
• Do not apply an electrostatic discharge to this IC that exceeds the performance ratings of the built-in electrostatic protection circuit.
• In CMOS output products of the S-801 Series, the through-type current flows at detection and release. If the impedance is high, oscillation may occur due to the voltage drop by the through-type current during releasing.
• When designing for mass production using an application circuit described herein, the product deviation and temperature characteristics should be taken into consideration. SII shall not bear any responsibility for the patents on the circuits described herein.
• SII claims no responsibility for any and all disputes arising out of or in connection with any infringement of the products including this IC upon patents owned a third party.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 21  Typical Characteristics (Typical Data) 1. Detection Voltage (VDET) - Temperature (Ta) S-80122AL S-80160AL 2.1 2.2 2.3 2.4 −40 −20 0 20 40 60 80 100 Ta [°C] VDET [V] VDET (+) VDET (−) 5.8 6.0 6.2 6.4 −40 −20 0 20 40 60 80 100 Ta [°C)] VDET [V] VDET (+) VDET (−) 2. Hysteresis Voltage Width (VHYS) - Temperature (Ta) S-80122AL S-80160AL 100 −40 −20 0 20 40 60 80 100 Ta [°C] VHYS [mV] 100 −40 −20 0 20 40 60 80 100 Ta [°C] VHYS [mV] 3. Current Consumption (ISS) - Input Voltage (VDD) (a) S-80122AL (b) S-80129AL 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 VDD [V] ISS [μA] Ta=25°C 2.9 μA 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 VDD [V] ISS [μA] Ta=25°C 3.3 μA (c) S-80130AL (d) S-80160AL 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 VDD [V] ISS [μA] Ta=25°C 5.0 μA 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 VDD [V] ISS [μA] Ta=25°C 20 μA

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 22 Seiko Instruments Inc. 4. Current Consumption (ISS) - Temperature (Ta) (a) S-80122AL (b) S-80129AL 0.0 1.0 2.0 3.0 4.0 5.0 −40 −20 0 20 40 60 80 100 Ta [°C] ISS [μA] VDD=3.5 V 0.0 1.0 2.0 3.0 4.0 5.0 −40 −20 0 20 40 60 80 100 Ta [°C] ISS [μA] VDD=4.5 V (c) S-80130AL (d) S-80160AL 0.0 1.0 2.0 3.0 4.0 5.0 −40 −20 0 20 40 60 80 100 Ta [°C] ISS [μA] VDD=4.5 V 0.0 1.0 2.0 3.0 4.0 5.0 −40 −20 0 20 40 60 80 100 Ta [°C] ISS [μA] VDD=6.5 V 5. Nch Transistor Output Current (IOUT) -VOUT 6. Pch Transistor Output Current (IOUT) - (VDD-VOUT) S-80160AL S-80122AL 0 2 4 6 8 10 VOUT [V] IOUT [mA] Ta=25°C 2 V 2.4 V 4 V 5.5 V VDD=1 V, 1.2 V 0246 8 1 0 VDD-VOUT [V] IOUT [mA] Ta=25°C VDD=4 V 4.8 V 6 V 6.5 V 10 V 8 V 7. Nch Transistor Output Current (IOUT) - Input Voltage (VDD) 8. Pch transistor Output Current (IOUT) - Input Voltage (VDD) S-80160AL S-80122AL 0 2 4 6 8 10 VDD [V] IOUT [mA] VDS=0.5 V Ta= −40°C 85°C 25°C 0 2 4 6 8 10 VDD [V] IOUT [mA] VDS=0.5 V Ta= −40°C 85°C 25°C

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 23 9. Minimum Operating Voltage - Input Voltage (VDD) S-80122AN 0.1 0.2 0.3 0.4 0.5 0.6 0 0.5 1 1.5 VDD [V] VOUT [V] Pull-up, VDD:100 kΩ 85°C 25°C Ta= −40°C 10. Threshold Voltage of DS Pin - Temperature (Ta) 11. Threshold Voltage of DS Pin - Input Voltage (VDD) S-80122AL S-8 0122AL 0.2 0.4 0.6 0.8 −40 −20 0 20 40 60 80 100 Ta [°C] Threshold [V] VDD=6.0 V 0.2 0.4 0.6 0.8 0 2 4 6 8 10 VDD [V] Threshold [V] Ta= −40°C 25°C 85°C 12. Delay Time 1 - Temperature (Ta) S-80122CL S-80160CL 100 150 200 250 300 −40 −20 0 20 40 60 80 100 Ta [°C] Delay time [ms] VDD=3.2 V 100 150 200 250 300 −40 −20 0 20 40 60 80 100 Ta [°C] Delay time [ms] VDD=7.0 V 13. Delay Time 1 - Input Voltage (VDD) S-80122CL 100 150 200 250 300 2 4 6 8 10 VDD [V] Delay time [ms] Ta=25°C

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 24 Seiko Instruments Inc. 14. Delay Time 2 - Temperature (Ta) S-80122AL S-80160AL 100 150 200 250 300 350 400 −40 −20 0 20 40 60 80 100 Ta [°C] Delay time [μs] VDD=3.2 V 100 150 200 250 300 350 400 −40 −20 0 20 40 60 80 100 Ta [°C] Delay time [μs] VDD=7.0 V 15. Delay Time 2 - Input Voltage (VDD) S-80122AN 100 150 200 250 300 350 400 2 4 6 8 10 VDD [V] Delay time [μs] Ta=25°C VDD×90 % VSS VIH VIL tD VIH=10 V, VIL=0.95 V INPUT VOLTAGE OUTPUT VOLTAGE VDD OUT VSS DS*1 VDD S-801 Series V V R*2 100 kΩ *1. Set to VDD or VSS. *2. R is not necessary for CMOS output products. Figure 18 Measurment Condition for Delay Time Fi gure 19 Measurment Circuit for Delay Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) Rev.4.1_00 S-801 Series Seiko Instruments Inc. 25 16. Response Time - Load Capacitor (COUT) S-80122AL S-80122AN 0.001 0.01 0.1 COUT [μF] Response time [ms] Ta=25°C tPLH (Delay time2) tPHL 0.001 0.01 0.1 100 COUT [μF] Response time [ms] Ta=25°C tPLH (Delay time2) tPHL S-80160AL S-80160AN 0.001 0.01 0.1 COUT [μF] Response time [ms] Ta=25°C tPLH (Delay time2) tPHL 0.001 0.01 0.1 100 COUT [μF] Response time [ms] Ta=25°C tPLH (Delay time2) tPHL VDD × 90 % VDD × 10 % VIH INPUT VOLTAGE OUTPUT VOLTAGE VIL VDD tPHL tPLH VIH=10 V, VIL=0.95 V 1 μs 1 μs VDD OUT DS VSS VDD S-801 Series V R*1 100 kΩ V *1. R is not necessary for CMOS output products. Figure 20 Measurment Condition for Response Time Figure 21 Measurment Circuit for Response Time Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant.

ULTRA-SMALL PACKAGE HIGH-PRECISION VOLTAGE DETECTOR WITH DELAY CIRCUIT (INTERNAL DELAY TIME SETTING) S-801 Series Rev.4.1_00 26 Seiko Instruments Inc.  Application Circuit Examples Microcomputer Reset Circuits If the power supply voltage to a microcomputer fa lls below the specified level, an unspecified operation may be performed or the contents of the memory register may be lost. When power supply voltage returns to normal, the microcomputer needs to be initialized before normal operations can be done. Reset circuits protect microcomputers in the event of current being momentarily switched off or lowered. Reset circuits shown in Figures 22 to 23 can be easily constructed with the help of the S-801 series that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay circuit. VSS VDD Microcomputer 801xxAL VSS (Nch open-drain output products only.) VDD1 VDD2 Microcomputer 801xxAN Figure 22 Ret Circuit (S-801xxAL) Fi gure 23 Reset Circuit (S-801xxAN) Caution The above connection diagram will not guarantees successful operation. Perform through using the actual application to set the constant.

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