BF1100WR_15 JMNIC | Alldatasheet
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Technical content
Product specification File under Discrete Semiconductors, SC07
1995 Apr 25
1995 Apr 25 2
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR
FEATURES
- Specially designed for use at 9 to 12 V supply voltage
- Short channel transistor with high forward transfer admittance to input capacitance ratio
- Low noise gain controlled amplifier up to 1 GHz
- Superior cross-modulation performance during AGC.
APPLICATIONS
- VHF and UHF applications such as television tuners and professional communications equipment.
DESCRIPTION
Enhancement type field-effect transistor in a plastic microminiature SOT343R package. The transistor consists of an amplifier MOS-FET with source and substrate interconnected and an internal bias circuit to ensure good cross-modulation performance during AGC. CAUTION The device is supplied in an antistatic package. The gate-source input must be protected against static discharge during transport or handling. PINNING PIN SYMBOL DESCRIPTION 1 s, b source 2 d drain 2 gate 2 4g 1 gate 1 Fig.1 Simplified outline (SOT343R) and symbol. Marking code: MF. handbook, halfpage MAM192 s,b d Top view QUICK REFERENCE DATA SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT VDS drain-source voltage −− 14 V ID drain current −− 30 mA Ptot total power dissipation −− 280 mW Tj operating junction temperature −− 150 °C yfs forward transfer admittance 24 28 33 mS C ig1-s input capacitance at gate 1 − 2.2 2.6 pF C rs reverse transfer capacitance f = 1 MHz − 25 35 fF F noise figure f = 800 MHz − 2 − dB
1995 Apr 25 3
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR LIMITING VALUES In accordance with the Absolute Maximum Rating System (IEC 134). Note 1. Device mounted on a printed-circuit board. SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT VDS drain-source voltage − 14 V ID drain current − 30 mA IG1 gate 1 current −± 10 mA IG2 gate 2 current −± 10 mA Ptot total power dissipation see Fig.2; up to Tamb =5 0°C; note 1 − 280 mW Tstg storage temperature −65 +150 °C Tj operating junction temperature − +150 °C Fig.2 Power derating curve. handbook, halfpage 0 50 100 200 300 MLD180 150 200 100 Ptot (mW) T ( C)amb o Fig.3 Forward transfer admittance as a function of junction temperature; typical values. 50 0 50 150 MLD156 100 Y fs (mS) T ( C)j o
1995 Apr 25 4
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR THERMAL CHARACTERISTICS Notes 1. Device mounted on a printed-circuit board. 2. T s is the temperature at the soldering point of the source lead. STATIC CHARACTERISTICS Tj=2 5°C; unless otherwise specified. Notes 1. R G1 connects gate 1 to VGG = 9 V; see Fig.26. 2. R G1 connects gate 1 to VGG = 12 V; see Fig.26. SYMBOL PARAMETER CONDITIONS VALUE UNIT R th j-a thermal resistance from junction to ambient note 1 350 K/W R th j-s thermal resistance from junction to soldering point Ts =9 1°C; note 2 210 K/W SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT V(BR)G1-SS gate 1-source breakdown voltage VG2-S =V DS = 0; IG1-S = 1 mA 13.2 20 V V(BR)G2-SS gate 2-source breakdown voltage VG1-S =V DS = 0; IG2-S = 1 mA 13.2 20 V V(F)S-G1 forward source-gate 1 voltage V G2-S =V DS = 0; IS-G1 = 10 mA 0.5 1.5 V V(F)S-G2 forward source-gate 2 voltage V G1-S =V DS = 0; IS-G2 = 10 mA 0.5 1.5 V VG1-S(th) gate 1-source threshold voltage VG2-S =4V ; VDS =9V ; ID =2 0µA 0.3 1 V VG2-S =4V ; VDS =1 2V ; ID =2 0µA 0.3 1 V VG2-S(th) gate 2-source threshold voltage VG1-S =4V ; VDS =9V ; ID =2 0µA 0.3 1.2 V VG1-S =4V ; VDS =1 2V ; ID =2 0µA 0.3 1.2 V IDSX drain-source current V G2-S =4V ; VDS =9V ; R G1 = 180 kΩ ; note 1 81 3 m A VG2-S =4V ; VDS =1 2V ; R G1 = 250 kΩ ; note 2 81 3 m A IG1-SS gate 1 cut-off current V G2-S =V DS = 0; VG1-S =1 2V − 50 nA IG2-SS gate 2 cut-off current V G1-S =V DS = 0; VG2-S =1 2V − 50 nA
1995 Apr 25 5
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR DYNAMIC CHARACTERISTICS Common source; Tamb =2 5°C; VG2-S = 4 V; ID = 10 mA; unless otherwise specified. SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT yfs forward transfer admittance pulsed; Tj=2 5°C VDS = 9 V 24 28 33 mS VDS = 12 V 24 28 33 mS C ig1-s input capacitance at gate 1 f = 1 MHz VDS =9V − 2.2 2.6 pF VDS =1 2V − 2.2 2.6 pF C ig2-s input capacitance at gate 2 f = 1 MHz VDS =9V − 1.6 − pF VDS =1 2V − 1.4 − pF C os drain-source capacitance f = 1 MHz VDS =9V − 1.4 1.8 pF VDS =1 2V − 1.1 1.5 pF C rs reverse transfer capacitance f = 1 MHz VDS =9V − 25 35 fF VDS =1 2V − 25 35 fF F noise figure f = 800 MHz; G S =G Sopt; BS =B Sopt VDS =9V − 2 2.8 dB VDS =1 2V − 2 2.8 dB Fig.4 Gain reduction as a function of the AGC voltage; typical values. f = 50 MHz. Tj=2 5°C. handbook, halfpage0 01234 V (V)AGC gain reduction (dB) MLD157 (1) RG = 250 kΩ to VGG =1 2V . (2) RG = 180 kΩ to VGG =9V . fw = 50 MHz; funw = 60 MHz; Tamb =2 5°C. Fig.5 Unwanted voltage for 1% cross-modulation as a function of gain reduction; typical values; see Fig.26. handbook, halfpage 100 110 120 (1) (2) 10 20 30 40 50 Vunw (dBµV) gain reduction (dB) MLD158
1995 Apr 25 6
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.6 Output characteristics; typical values. VG2-S =4V . Tj=2 5°C. handbook, halfpage 41 6 MLD159 81 2 ID (mA) V (V)DS 1.3 V 1.2 V 1.1 V 1.0 V 0.9 V V = 1.4 VG1 S Fig.7 Transfer characteristics; typical values. VDS = 9 to 12 V. Tj=2 5°C. handbook, halfpage 0.4 2.0 MLD160 0.8 1.2 1.6 ID (mA) V (V)G1 S V = 4 V2.5 V 2 V 1.5 V 1 V G2 S 3 V Fig.8 Gate 1 current as a function of gate 1 voltage; typical values. VDS = 9 to 12 V. Tj=2 5°C. handbook, halfpage 0123 250 200 150 100 MLD161 IG1 (µA) V (V)G1 S 3 V 2.5 V 2 V 3.5 V V = 4 VG2 S Fig.9 Forward transfer admittance as a function of drain current; typical values. VDS = 9 to 12 V. Tj=2 5°C. handbook, halfpage 10 20 30 MLD162 yfs (mS) I (mA)D 3 V 2.5 V 2 V V = 4 VG2 S 3.5 V
1995 Apr 25 7
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.10 Drain current as a function of gate 1 current; typical values. VDS = 9 to 12 V. VG2-S =4V . Tj=2 5°C. handbook, halfpage 02 0 4 0 8 0 60 MLD163 I (µA)G1 ID (mA) Fig.11 Drain current as a function of gate 1 supply voltage (= VGG ) and drain supply voltage; typical values; see Fig.26. VG2-S =4V . R G1 connected to VGG . Tj=2 5°C. handbook, halfpage 48 1 6 MLD164 V = V (V)GG DS ID (mA) R = 100 kΩG1 147 kΩ 180 kΩ 205 kΩ 249 kΩ 301 kΩ 402 kΩ 511 kΩ Fig.12 Drain current as a function of gate 1 voltage (= VGG ); typical values; see Fig.26. VDS = 9 V; VG2-S =4V . R G1 = 180 kΩ (connected to VGG ); Tj=2 5°C. handbook, halfpage 02 4 1 0 86 MLD165 V (V)GG ID (mA) VDS = 12 V; VG2-S =4V . R G1 = 250 kΩ (connected to VGG ); Tj=2 5°C. Fig.13 Drain current as a function of gate 1 voltage (= VGG ); typical values; see Fig.26. handbook, halfpage 048 1 2 MLD166 V (V)GG ID (mA)
1995 Apr 25 8
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.14 Gate 1 current as a function of gate 2 voltage; typical values. VDS =9V . R G1 = 180 kΩ (connected to VGG ); Tj=2 5°C. handbook, halfpage 0246 MLD167 IG1 (µA) V (V)G2 S 8 V 7 V 6 V 5 V 4 V V = 9 VGG Fig.15 Gate 1 current as a function of gate 2 voltage; typical values. VDS =1 2V . R G1 = 250 kΩ (connected to VGG ); Tj=2 5°C. handbook, halfpage 0246 MLD168 IG1 (µA) V (V)G2 S 11 V 10 V 9 V 8 V 7 V V = 12 VGG Fig.16 Drain current as a function of the gate 2 voltage; typical values; see Fig.26. VDS =9V . R G1 = 180 kΩ (connected to VGG ); Tj=2 5°C. handbook, halfpage 0246 MLD169 ID (mA) 8 V 7 V 6 V 5 V 4 V V = 9 VGG V (V)G2 S VDS =1 2V . R G1 = 250 kΩ (connected to VGG ); Tj=2 5°C. Fig.17 Drain current as a function of the gate 2 voltage; typical values; see Fig.26. handbook, halfpage 0246 MLD170 ID (mA) 11 V 10 V 9 V 8 V 7 V V = 12 VGG V (V)G2 S
1995 Apr 25 9
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.18 Input admittance as a function of frequency; typical values. VDS = 9 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. handbook, halfpage 103 MLD181 10210 10 1 10 2 yis (mS) f (MHz) bis gis VDS = 9 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. Fig.19 Reverse transfer admittance and phase as a function of frequency; typical values. 103 MLD182 10210 10 3 10 2 yrs 10 3 rs (µS) f (MHz) rs yrs (deg) ϕ ϕ Fig.20 Forward transfer admittance and phase as a function of frequency; typical values. VDS = 9 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. 103 MLD183 10210 10 2 yfs (mS) yfs f (MHz) fs fs (deg) ϕ ϕ Fig.21 Output admittance as a function of frequency; typical values. VDS = 9 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. handbook, halfpage 103 MLD184 10210 10 1 10 2 yos (mS) f (MHz) bos gos
1995 Apr 25 10
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.22 Input admittance as a function of frequency; typical values. VDS = 12 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. handbook, halfpage 103 MLD185 10210 10 1 10 2 yis (mS) f (MHz) bis gis VDS = 12 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. Fig.23 Reverse transfer admittance and phase as a function of frequency; typical values. 103 MLD186 10210 10 3 10 2 yrs 10 3 rs (µS) f (MHz) rs yrs (deg) ϕ ϕ Fig.24 Forward transfer admittance and phase as a function of frequency; typical values. VDS = 12 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. 103 MLD187 10210 10 2 yfs (mS) yfs f (MHz) fs fs (deg) ϕ ϕ Fig.25 Output admittance as a function of frequency; typical values. VDS = 12 V; VG2 =4V . ID = 10 mA; Tamb =2 5°C. handbook, halfpage 103 MLD188 10210 10 1 10 2 yos (mS) f (MHz) bos gos
1995 Apr 25 11
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Fig.26 Cross-modulation test circuit. handbook, full pagewidth DUT VAGC 4.7 nF 10 kΩ MGC420 4.7 nF 450 nH C3 12 pF R L 50 Ω≈ VGG V DS R GEN V I 4.7 nF R GΩ Ω For VGG =V DS = 9 V, RG= 180 kΩ . For VGG =V DS = 12 V, RG= 250 kΩ .
1995 Apr 25 12
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR Table 1 Scattering parameters: VDS = 9 V; VG2-S = 4 V; ID =1 0m A Table 2 Noise data: VDS = 9 V; VG2-S = 4 V; ID =1 0m A Table 3 Scattering parameters: VDS = 12 V; VG2-S = 4 V; ID =1 0m A Table 4 Noise data: VDS = 12 V; VG2-S = 4 V; ID =1 0m A f (MHz) s11 s21 s12 s22 MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) f (MHz) Fmin (dB) Γopt rn (ratio) (deg) 800 2.00 0.67 43.9 0.89 f (MHz) s11 s21 s12 s22 MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) MAGNITUDE (ratio) ANGLE (deg) f (MHz) Fmin (dB) Γopt rn (ratio) (deg) 800 2.00 0.66 43.3 0.97
1995 Apr 25 13
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR PACKAGE OUTLINE Fig.27 SOT343R. Dimensions in mm. 0.3 0.1 0.25 0.10 0.2 0.1 max 1.00 max MSB367 1.4 1.2 2.2 1.8 B A 1.35 1.15 0.4 0.2 BM0.2AM0.2 2.2 2.0 0.7 0.5
1995 Apr 25 14
Philips Semiconductors Product specification Dual-gate MOS-FET BF1100WR DEFINITIONS LIFE SUPPORT APPLICATIONS These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be expected to result in personal injury. Philips customers using or selling these products for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such improper use or sale. Data Sheet Status Objective specification This data sheet contains target or goal specifications for product development. Preliminary specification This data sheet contains preliminary data; supplementary data may be published later. Product specification This data sheet contains final product specifications. Limiting values Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.