S29WS064R

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Technical content

Datasheet sections

• 1.1 Simultaneous Read/Wr ite Operations with
• 4.1 Special Handling Instructions for FBGA Package
• 4.2 Connection Diagrams and Physical Dimensions
• 4.3 MCP Look-Ahead Ballout for Future Designs
• 5.1 Valid Combinations
• 6.1 Memory Map
• 7.1 Device Operation Table
• 7.2 VersatileIO™ (V
• 7.3 Asynchronous Read
• 7.4 Page Read Mode
• 7.5 Synchronous (Burst) Read Mode and
• 7.6 Autoselect
• 7.7 Program/Erase Operations
• 7.8 Simultaneous Read/Write
• 7.9 Writing Commands/Command Sequences
• 7.10 Handshaking
• 7.11 Hardware Reset
• 7.12 Software Reset
• 8.1 Lock Register
• 8.2 Dynamic Protection Bits
• 8.3 Hardware Data Protection Me thods
• 9.1 Standby Mode
• 9.2 Automatic Sleep Mode
• 9.3 Hardware RESET# Input Operat ion
• 9.4 Output Disable (OE#)
• 10.1 Factory Secured Silicon Sector
• 10.2 Customer Secured Silicon Sector
• 10.3 Secured Silicon Sector Entry/Exit
• 11.1 Absolute Maximum Ratings
• 11.2 Operating Ranges
• 11.3 Test Conditions
• 11.4 Key to Switching Waveforms
• 11.6 DC Characteristics
• 11.7 AC Characteristics
• 12.1 Common Flash Memory Interf ace

"Spansion, Inc." and "Cypress Semiconductor Corp." have merged together to deliver high-performance, high-quality solutions at the heart of today's most advanced embedded systems, from automotive, industrial and networking platforms to highly interactive consumer and mobile devices. The new company "Cypress Semiconductor Corp." will continue to offer "Spansion, Inc." products to new and existing customers. Continuity of Specifications There is no change to this document as a result of offering the device as a Cypress product. Any changes that have been made are the result of normal document improvements and are noted in the document history page, where supported. Future revisions will occur when appropriate, and changes will be noted in a document history page. Continuity of Ordering Part Numbers Cypress continues to support existing part numbers. To order these products, please use only the Ordering Part Numbers listed in this document. For More Information Please contact your local sales office for additional information about Cypress products and solutions.

Cypress Semiconductor Corporation • 198 Champion Court • San Jose , CA 95134-1709 • 408-943-2600 Document Number: 002-00755 Rev. *F Revised October 08, 2015 S29WS064R 64 Mbit (4M x 16-bit), 1.8 V MirrorBit® Flash ADVANCE Distinctive Characteristics  Single 1.8-Volt read, program and erase (1.70V - 1.95V)  65 nm MirrorBit process technology  VersatileIO™ Feature – Device generates data output voltages and tolerates data input voltages as determined by the voltage on the VIO pin – 1.8 V compatible I/O signals  Simultaneous Read/Write operation – Data can be continuously read from one bank while executing erase/program functions in other bank – Zero latency between read and write operations  Burst length – Continuous linear burst – 8-word/16-word linear burst with wrap around  Asynchronous Page Mode – 8-word page – Page access time of 20 ns  32-word write buffer reduces overall programming time for multiple- word updates  Sector Architecture – Four 8-kword sectors in upper most address range – One hundred twenty seven 32-kwords sectors – Four banks – Top or Bottom boot sector configuration  Secured Silicon Sector region – 256 words accessible through a command sequence, 128 words for the Factory Secured Silicon Sector and 128 words for the Customer Secured Silicon Sector  Command set compatible with JEDEC (42.4) standard  Dynamic Protection Bit (DYB) – A command sector protection method to lock combinations of individual sectors to prevent program or erase operations within that sector – Sectors can be locked and unlocked in-system at V CC level  Hardware Sector Protection – All sectors locked when ACC input is VIL –L o w VCC write inhibit  Handshaking feature – Provides host system with minimum possible latency by monitoring RDY  Supports Common Flash Memory Interface (CFI)  Cycling Endurance: 100,000 cycles per sector (typical)  Data retention: 10 years (typical)  Data# Polling and toggle bits – Provides a software method of detecting program and erase operation completion  Suspend and Resume commands for Program and Erase operations  Synchronous or Asynchronous program operation, independent of burst control register settings  ACC input pin to reduce factory programming time  Offered Packages – 84-ball FBGA (8 mm x 11.6 mm)

Document Number: 002-00755 Rev. *F Page 3 of 81 S29WS064R ADVANCE Performance Characteristics Read Access Times Speed Option (MHz) 108 Max. Synch. Latency, ns (tIACC) 80 Max. Synch. Burst Access, ns (tBACC) 7.6 Max. Asynch. Access Time, ns (tACC) 80 Max. Asynch. Page Access Time, ns (tPACC)2 0 Max CE# Access Time, ns (tCE) 80 Max OE# Access Time, ns (tOE) 13.5 Current Consumption (typical values) Continuous Burst Read @ 108 MHz 32 mA Simultaneous Operation @ 108 MHz 71 mA Program/Erase 30 mA Standby Mode (asynchronous) 20 µA Typical Program and Erase Times Single Word Programming 170 µs Effective Write Buffer Programming (VCC) Per Word 14.1 µs Effective Write Buffer Programming (VACC) Per Word 9.0 µs Sector Erase (8 kword Sector) 350 ms Sector Erase (32 kword Sector) 800 ms

Document Number: 002-00755 Rev. *F Page 5 of 81 S29WS064R ADVANCE 1. General Description The Spansion S29WS064R is a 64 Megabit 1.8 Volt-only MirrorBit Flash memory organized as 4,194,304 words of 16 bits each. This burst mode Flash device is capable of performing simultaneous read and write operat ions with zero latency on two separate banks using separate data and addre ss pins. This device can operate up to 108 MHz and uses a single V CC of 1.7V to 1.95V to read, program, and erase the memory array, making it ideal for today's demanding applications requiring higher density, better performance and lowered power consumption. A 9.0-volt ACC may be used for faster program performance if desired. This device can also be programmed in standard EPROM programmers. The device operates within the tem perature range of -25°C to +85°C, and is offered in a Very Th in FBGA package. The device is also available in the temperature range of -40°C to +85°C. Please refer to the Spec ification Supplement wit h Publication Number S29WS064R_SP for specification differences for devices offered in the -45°C to +85°C temperature range.

1.1 Simultaneous Read/Write Op erations with Zero Latency

The Simultaneous Read/Write architecture pr ovides simultaneous operation by dividing the memory space into four banks. The device allows a host system to program or erase in one bank, then im mediately and simultaneously r ead from another bank, with zero latency. This releases the system from waiting for the completion of program or erase operations. The devices are structured as shown in the following tables: The VersatileIO™ (V IO) control allows the host system to set the voltage levels that the device generates at its data outputs and the voltages tolerated at its data inputs to the same voltage level that is asserted on the VIO pin. The device uses Chip Enable (CE#), Write Enable (WE#), Address Valid (AVD#) and Output Enable (OE#) to control asynchronous read and write operations. For burst operations, the device additionally requires Ready (RDY) and Clock (CLK). This implementation allows easy interface with minimal glue logic to microprocessors/micro controllers for high performance read operations. The devices offer complete compatibility with the JEDEC 42. 4 single-power-supply Flash comm and set standard. Commands are written to the command register using standard microprocessor wr ite timings. Reading data out of the device are similar to read ing from other Flash or EPROM devices. The host system can detect whether a program or erase operation is complete by usi ng the device status bit DQ7 (Data# Polling) and DQ6/DQ2 (toggle bits). After a program or erase cycle has been completed, the devic e automatically returns to reading array data. Device Structure (Top Boot) S29WS064R Bank Sector Size Sector Count 0 32 kwords 32 1 32 kwords 32 2 32 kwords 32 32 kwords 31 8 kwords 4 Device Structure (Bottom Boot) S29WS064R Bank Sector Size Sector Count 8 kwords 4 32 kwords 31 1 32 kwords 32 2 32 kwords 32 3 32 kwords 32

Document Number: 002-00755 Rev. *F Page 6 of 81 S29WS064R ADVANCE The sector erase architecture allows memo ry sectors to be erased and reprogrammed wi thout affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The device also offers two types of data protection at the sect or level. When ACC is at V IL, the entire flash memory array is protected. Dynamic Sector Protection provides in-system, command-enabled protection of any combination of sectors using a single power supply at VCC. The device offers two power-saving featur es. When addresses have been stable for a spec ified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both modes. Device programming occurs by executing the program command sequence. This initiates the Embedded Program algorithm - an internal algorithm that automatically times the program pulse widths and verifies proper cell margin. Additionally, Write Buffe r Programming is available on this device. This feature provid es superior programming performance by grouping locations being programmed. Device erasure occurs by executing t he erase command sequence. Th is initiates the Embedded Er ase algorithm - an internal algorithm that automatically preprograms the array (if it is no t already fully programmed) before executing the erase operation . During erase, the device automatically times the erase pulse widths and verifies proper cell margin. The Program Suspend/Program Resume feature enables the user to put program on hold to read data from any sector that is not selected for programming. If a read is needed from the Dynamic Protection area, or the CFI area after a program suspend, then the user must use the proper command sequence to enter and exit this regi on. The program suspend/resume functionality is also available when programming in erase suspend (1 level depth only). The Erase Suspend/Erase Resume feature enables the user to put erase on hold to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. If a read is needed from the Dynamic Protection area, or the CFI area after an erase suspend, then the user must use the proper command sequence to enter and exit this region. The hardware RESET# pin terminates any operat ion in progress and resets the internal state machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read boot-up firmware from the Flash memory device. The host system can detect whether a memory array program or erase operat ion is complete by using the device status bit DQ7 (Data# Polling), DQ6/DQ2 (toggle bits), DQ5 (exceeded timing limit), and DQ1 (write to buffer abort). After a program or erase cycle has been completed, the device automatically returns to reading array data. The sector erase architecture allows memo ry sectors to be erased and reprogrammed wi thout affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Spansion Inc. Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection. 2. Input/Output Descrip tions and Logic Symbol Table 2.1 identifies the input and output package connections provided on the device. Table 2.1 Input/Output Descriptions Symbol Type Description A21-A0 Input Address Inputs. DQ15-DQ0 I/O Data input/output. CE# Input Chip Enable. Asynchronous relative to CLK for Burst Mode. OE# Input Output Enable. Asynchronous relative to CLK for Burst Mode. WE# Input Write Enable. V CC Supply Device Power Supply. VIO Supply Versatile IO Input VSS Supply Ground.

Document Number: 002-00755 Rev. *F Page 7 of 81 S29WS064R ADVANCE RDY Output Ready. Indicates when valid burst data is ready to be read. CLK Input Clock Input. In burst mode, after the initial word is output, subsequent active edges of CLK increment the internal address counter. AVD# Input Address Valid. Indicates to device that the valid address is present on the address inputs. When low during asynchronous mode, indicates valid address; when low during burst mode, causes starting address to be latched at the next active clock edge. When high, device ignores address inputs. RESET# Input Hardware Reset. Low = device resets and returns to reading array data. ACC Input Acceleration Input. At VHH, accelerates programming. At VIL, disables all program and erase functions. Should be at VIH for all other conditions. DNU Do Not Use A device internal signal may be connected to the package connector. The connection may be used by Spansion for test or other purposes and is not intended for connection to any host system signal. Any DNU signal related function will be inactive when the signal is at VIL. The signal has an internal pull- down resistor and may be left unconnected in the host system or may be tied to VSS. Do not use these connections for PCB signal routing channels. Do not connect any host system signal to these connections. NC Not Connected No device internal signal is connected to the package connector nor is there any future plan to use the connector for a signal. The connection may safely be used for routing space for a signal on a Printed Circuit Board (PCB) RFU Reserved for Future Use No device internal signal is currently connected to the package connector but there is potential future use for the connector for a signal. It is recommended to not use RFU connectors for PCB routing channels so that the PCB may take advantage of future enhanced features in compatible footprint devices. Table 2.1 Input/Output Descriptions Symbol Type Description

Document Number: 002-00755 Rev. *F Page 8 of 81 S29WS064R ADVANCE 3. Block Diagrams Figure 3.1 S29WS064R Block Diagram Notes: 1. A max indicates the highest order address bit. Amax equals A21 for S29WS064R. Input/Output Buffers X- Decoder Y-Decoder Chip Enable Output Enable Logic Erase Voltage Generator PGM Voltage Generator TimerVCC Detector State Control Command Register VCC VSS WE# RESET# ACC CE# OE# DQ1 5–DQ0 Data Latch Y-Gating Cell Matrix Address Latch Ama x–A0 RDY Buffer RDY Burst State Control Burst Address Counter AVD# CLK VIO

Document Number: 002-00755 Rev. *F Page 9 of 81 S29WS064R ADVANCE Figure 3.2 Block Diagram of Simultaneous Operation Circuit Notes: 1. A max indicates the highest order address bit. Amax equals A21 for WS064R. 2. n = 3 VCC VSS Bank Address RESET# WE# CE# AVD# DQ15–DQ0 CLK STATE CONTROL COMMAND REGISTER Bank 1 X-Decoder Y -Decoder Latches and Control Logic Bank 0 X-Decoder Y -Decoder Latches and Control Logic DQ15–DQ0 DQ15–DQ0 DQ15–DQ0 DQ15–DQ0 DQ15– DQ0 Bank n-1 Y -Decoder X-Decoder Latches and Control Logic Bank n Y -Decoder X-Decoder Latches and Control Logic OE# OE# OE# OE# Status Control Amax–A0 Amax–A0 Amax–A0 Amax–A0 Amax–A0 Bank Address Bank Address Bank Address RDY VIO ACC

Document Number: 002-00755 Rev. *F Page 10 of 81 S29WS064R ADVANCE 4. Physical Dimensions/Connection Diagrams This section shows the I/O designations and package specifications.

4.1 Special Handling Instru ctions for FBGA Package

Special handling is required for Flash Memory products in FBGA packages. Flash memory devices in FBGA packages may be damaged if exposed to ultrasonic cl eaning methods. The package and/or data integrity may be compromised if the package body is exposed to temperatures above 150°C for prolonged periods of time.

4.2 Connection Diagrams and Physical Dimensions

Figure 4.1 84-ball Fine-Pitch Ball Grid Array 329 1 0 547 681 DNUDNU B D E F G H J K L M A C VSSAVD# RFU RFUCLK RFU VCC RFU A7RFU RFU ACCRFU A8 WE# A11 A6A3 A15 RESET#RFU A19 RFU A12 A5A2 A21 RDYA18 A9 A20 A13 A4A1 RFU A17 A10 A14 VSSA0 A16 RFUDQ1 DQ6 RFU OE#CE# RFU DQ3DQ9 DQ13 DQ4 DQ15 DQ0RFU VSSVCCDQ10 DQ12 RFU DQ7 DQ8RFU RFU DQ11DQ2 DQ5 RFU DQ14 RFURFU RFU VCCVSS RFU RFU VIO DNUDNU Legend Do Not Use Reserved for Future Use Power Ground RFU RFU RFU

Document Number: 002-00755 Rev. *F Page 11 of 81 S29WS064R ADVANCE VBH084—84-ball Fine-Pitch Ball Grid Array (FBGA) 11.6 x 8 mm Package Note: 1. BSC is an ANSI standard for Basic Space Centering.

4.3 MCP Look-Ahead Ballout for Future Designs

Refer to the Design-In Scalable Wireless Solutions with Spansion Products application note, available on the web or through a Spansion sales office. 3339 \\ 16-038.25b NOTES: 1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-1994. 2. ALL DIMENSIONS ARE IN MILLIMETERS. 3. BALL POSITION DESIGNATION PER JESD 95-1, SPP-010 (EXCEP T AS NOTED). 4. e REPRESENTS THE SOLDER BALL GRID PITCH. 5. SYMBOL "MD" IS THE BALL ROW MATRIX SIZE IN THE "D" DIRECTION. SYMBOL "ME" IS THE BALL COLUMN MATRIX SIZE IN THE "E" DIRECTION. N IS THE TOTAL NUMBER OF SOLDER BALLS.

6 DIMENSION "b" IS MEASURED AT THE MAXIMUM BALL

DIAMETER IN A PLANE PARALLEL TO DATUM C.

7 SD AND SE ARE MEASURED WITH RESPECT TO DATUMS

A AND B AND DEFINE THE POSITION OF THE CENTER SOLDER BALL IN THE OUTER ROW. WHEN THERE IS AN ODD NUMBER OF SOLDER BALLS IN ? THE OUTER ROW PARALLEL TO THE D OR E DIMENSION, RESPECTIVEL Y , SD OR SE = 0.000. WHEN THERE IS AN EVEN NUMBER OF SOLDER BALLS IN THE OUTER ROW, SD OR SE = e/2 8. NOT USED. 9. "+" INDICATES THE THEORETICAL CENTER OF DEPOPULATED BALLS.

10 A1 CORNER TO BE IDENTIFIED BY CHAMFER, LASER OR INK

MARK, METALLIZED MARK INDENTATION OR OTHER MEANS. PACKAGE VBH 084 JEDEC N/A 11.60 mm x 8.00 mm NOM PACKAGE SYMBOL MIN NOM MAX NOTE A --- --- 1.00 OVERALL THICKNESS A1 0.18 --- --- BALL HEIGHT A2 0.62 --- 0.76 BODY THICKNESS D 11.60 BSC. BODY SIZE E 8.00 BSC. BODY SIZE D1 8.80 BSC. BALL FOOTPRINT E1 7.20 BSC. BALL FOOTPRINT MD 12 ROW MATRIX SIZE D DIRECTION ME 10 ROW MATRIX SIZE E DIRECTION N 84 TOTAL BALL COUNT φb 0.33 --- 0.43 BALL DIAMETER e 0.80 BSC. BALL PITCH SD / SE 0.40 BSC. SOLDER BALL PLACEMENT ? (A2-A9, B10-L10, DEPOPULATED SOLDER BALLS M2-M9, B1-L1) BOTTOM VIEW TOP VIEW SIDE VIEW A1 CORNER A2A ML J K e C0.05 (2X) (2X) C0.05 E D BACEDFHG e SE BCA C Mφ 0.15 φ 0.08 M 0.10 C C0.08 NXφb SD A B C SEATING PLANE A1 CORNER INDEX MARK

Document Number: 002-00755 Rev. *F Page 12 of 81 S29WS064R ADVANCE 5. Ordering Information The order number is formed by a valid combinations of the following:

5.1 Valid Combinations

Valid Combinations list configurations plan ned to be supported in volume for this devic e. Consult your local sales office to co nfirm availability of specific valid combinations and to check on newly released combinations. Notes: 1. Type 0 is standard. Specify other options as required. 2. If a choice exists, Spansion recommends Top Boot. 3. BGA package marking omits leading “S29” and packing type designator from ordering part number. 4. Industrial Temperature Range (-40°C to +85°C) is also availabl e. For device specification differences, please refer to the Specification Supplement with Publication Number S29WS064R_SP . S29WS 064 R AB BH W 00 0 Packing Type 0 = Tray (standard; (Note 1)) 3 = 13-inch Tape and Reel Model Number 00 = Top Boot (Note 2) 01 = Bottom Boot Temperature Range W = Wireless (–25°C to +85°C) Package Type & Material Set BH = Very Thin Fine-Pitch BGA, Low Halogen Lead (Pb)-free Package Speed Option (Burst Frequency) 0P = 66 MHz 0S = 83 MHz AB = 108 MHz Process Technology R = 65 nm MirrorBit Technology Flash Density 064= 64 Mb Product Family S29WS =1.8 Volt-Only Simultaneous Read/Write, Burst Mode Flash Memory S29WS-R Valid Combinations (1), (3) Package Type (3) Base Ordering Part Number Speed Option Package Type and Material Temperature Range Model Number(s) Packing Type S29WS064R 0P , 0S, AB BH W 00, 01 0, 3 11.6 mm x 8 mm 84-ball

Document Number: 002-00755 Rev. *F Page 13 of 81 S29WS064R ADVANCE 6. Product Overview The S29WS064R is a 64 Megabit, 1.8 volt-only, simultaneous read/write burst mode Flash device optimized for today's designs that demand a large storage array, rich functionality, and low power c onsumption. This device is organized in 4 Mwords of 16 bits ea ch and is capable of continuous, synchronous (bur st) read. This product also offers singl e word programming or a 32-word buffer fo r programming with program and erase suspend functionality. Additional features include:  Advanced Sector Protection methods for protecting sectors as required  256 words of Secured Silicon area for storing customer and factory secured information. The Secured Silicon Sector is One Time Programmable.

6.1 Memory Map

The S29WS064R device consists of 4 banks organized as shown in Table 6.1 and Table 6.2. Table 6.1 S29WS064R Sector and Memory Address Map (Top Boot) (Sheet 1 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word) 0 32 kwords SA000 0h 7FFFh SA001 8000h FFFFh SA002 10000h 17FFFh SA003 18000h 1FFFFh SA004 20000h 27FFFh SA005 28000h 2FFFFh SA006 30000h 37FFFh SA007 38000h 3FFFFh SA008 40000h 47FFFh SA009 48000h 4FFFFh SA010 50000h 57FFFh SA011 58000h 5FFFFh SA012 60000h 67FFFh SA013 68000h 6FFFFh SA014 70000h 77FFFh SA015 78000h 7FFFFh SA016 80000h 87FFFh SA017 88000h 8FFFFh SA018 90000h 97FFFh SA019 98000h 9FFFFh SA020 A0000h A7FFFh SA021 A8000h AFFFFh SA022 B0000h B7FFFh SA023 B8000h BFFFFh SA024 C0000h C7FFFh SA025 C8000h CFFFFh SA026 D0000h D7FFFh SA027 D8000h DFFFFh SA028 E0000h E7FFFh SA029 E8000h EFFFFh SA030 F0000h F7FFFh SA031 F8000h FFFFFh

Document Number: 002-00755 Rev. *F Page 14 of 81 S29WS064R ADVANCE 1 32 kwords SA032 100000h 107FFFh SA033 108000h 10FFFFh SA034 110000h 117FFFh SA035 118000h 11FFFFh SA036 120000h 127FFFh SA037 128000h 12FFFFh SA038 130000h 137FFFh SA039 138000h 13FFFFh SA040 140000h 147FFFh SA041 148000h 14FFFFh SA042 150000h 157FFFh SA043 158000h 15FFFFh SA044 160000h 167FFFh SA045 168000h 16FFFFh SA046 170000h 177FFFh SA047 178000h 17FFFFh SA048 180000h 187FFFh SA049 188000h 18FFFFh SA050 190000h 197FFFh SA051 198000h 19FFFFh SA052 1A0000h 1A7FFFh SA053 1A8000h 1AFFFFh SA054 1B0000h 1B7FFFh SA055 1B8000h 1BFFFFh SA056 1C0000h 1C7FFFh SA057 1C8000h 1CFFFFh SA058 1D0000h 1D7FFFh SA059 1D8000h 1DFFFFh SA060 1E0000h 1E7FFFh SA061 1E8000h 1EFFFFh SA062 1F0000h 1F7FFFh SA063 1F8000h 1FFFFFh Table 6.1 S29WS064R Sector and Memory Address Map (Top Boot) (Sheet 2 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

Document Number: 002-00755 Rev. *F Page 15 of 81 S29WS064R ADVANCE 2 32 kwords SA064 200000h 207FFFh SA065 208000h 20FFFFh SA066 210000h 217FFFh SA067 218000h 21FFFFh SA068 220000h 227FFFh SA069 228000h 22FFFFh SA070 230000h 237FFFh SA071 238000h 23FFFFh SA072 240000h 247FFFh SA073 248000h 24FFFFh SA074 250000h 257FFFh SA075 258000h 25FFFFh SA076 260000h 267FFFh SA077 268000h 26FFFFh SA078 270000h 277FFFh SA079 278000h 27FFFFh SA080 280000h 287FFFh SA081 288000h 28FFFFh SA082 290000h 297FFFh SA083 298000h 29FFFFh SA084 2A0000h 2A7FFFh SA085 2A8000h 2AFFFFh SA086 2B0000h 2B7FFFh SA087 2B8000h 2BFFFFh SA088 2C0000h 2C7FFFh SA089 2C8000h 2CFFFFh SA090 2D0000h 2D7FFFh SA091 2D8000h 2DFFFFh SA092 2E0000h 2E7FFFh SA093 2E8000h 2EFFFFh SA094 2F0000h 2F7FFFh SA095 2F8000h 2FFFFFh Table 6.1 S29WS064R Sector and Memory Address Map (Top Boot) (Sheet 3 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

Document Number: 002-00755 Rev. *F Page 16 of 81 S29WS064R ADVANCE 32 kwords SA096 300000h 307FFFh SA097 308000h 30FFFFh SA098 310000h 317FFFh SA099 318000h 31FFFFh SA100 320000h 327FFFh SA101 328000h 32FFFFh SA102 330000h 337FFFh SA103 338000h 33FFFFh SA104 340000h 347FFFh SA105 348000h 34FFFFh SA106 350000h 357FFFh SA107 358000h 35FFFFh SA108 360000h 367FFFh SA109 368000h 36FFFFh SA110 370000h 377FFFh SA111 378000h 37FFFFh SA112 380000h 387FFFh SA113 388000h 38FFFFh SA114 390000h 397FFFh SA115 398000h 39FFFFh SA116 3A0000h 3A7FFFh SA117 3A8000h 3AFFFFh SA118 3B0000h 3B7FFFh SA119 3B8000h 3BFFFFh SA120 3C0000h 3C7FFFh SA121 3C8000h 3CFFFFh SA122 3D0000h 3D7FFFh SA123 3D8000h 3DFFFFh SA124 3E0000h 3E7FFFh SA125 3E8000h 3EFFFFh SA126 3F0000h 3F7FFFh 8 kwords SA127 3F8000h 3F9FFFh SA128 3FA000h 3FBFFFh SA129 3FC000h 3FDFFFh SA130 3FE000h 3FFFFFh Table 6.1 S29WS064R Sector and Memory Address Map (Top Boot) (Sheet 4 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

Document Number: 002-00755 Rev. *F Page 17 of 81 S29WS064R ADVANCE Table 6.2 S29WS064R Sector and Memory Address Map (Bottom Boot) (Sheet 1 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word) 8 kwords SA000 0h 1FFFh SA001 2000h 3FFFh SA002 4000h 5FFFh SA003 6000h 7FFFh 32 kwords SA004 8000h FFFFh SA005 10000h 17FFFh SA006 18000h 1FFFFh SA007 20000h 27FFFh SA008 28000h 2FFFFh SA009 30000h 37FFFh SA010 38000h 3FFFFh SA011 40000h 47FFFh SA012 48000h 4FFFFh SA013 50000h 57FFFh SA014 58000h 5FFFFh SA015 60000h 67FFFh SA016 68000h 6FFFFh SA017 70000h 77FFFh SA018 78000h 7FFFFh SA019 80000h 87FFFh SA020 88000h 8FFFFh SA021 90000h 97FFFh SA022 98000h 9FFFFh SA023 A0000h A7FFFh SA024 A8000h AFFFFh SA025 B0000h B7FFFh SA026 B8000h BFFFFh SA027 C0000h C7FFFh SA028 C8000h CFFFFh SA029 D0000h D7FFFh SA030 D8000h DFFFFh SA031 E0000h E7FFFh SA032 E8000h EFFFFh SA033 F0000h F7FFFh SA034 F8000h FFFFFh

Document Number: 002-00755 Rev. *F Page 18 of 81 S29WS064R ADVANCE 1 32 kwords SA035 100000h 107FFFh SA036 108000h 10FFFFh SA037 110000h 117FFFh SA038 118000h 11FFFFh SA039 120000h 127FFFh SA040 128000h 12FFFFh SA041 130000h 137FFFh SA042 138000h 13FFFFh SA043 140000h 147FFFh SA044 148000h 14FFFFh SA045 150000h 157FFFh SA046 158000h 15FFFFh SA047 160000h 167FFFh SA048 168000h 16FFFFh SA049 170000h 177FFFh SA050 178000h 17FFFFh SA051 180000h 187FFFh SA052 188000h 18FFFFh SA053 190000h 197FFFh SA054 198000h 19FFFFh SA055 1A0000h 1A7FFFh SA056 1A8000h 1AFFFFh SA057 1B0000h 1B7FFFh SA058 1B8000h 1BFFFFh SA059 1C0000h 1C7FFFh SA060 1C8000h 1CFFFFh SA061 1D0000h 1D7FFFh SA062 1D8000h 1DFFFFh SA063 1E0000h 1E7FFFh SA064 1E8000h 1EFFFFh SA065 1F0000h 1F7FFFh SA066 1F8000h 1FFFFFh Table 6.2 S29WS064R Sector and Memory Address Map (Bottom Boot) (Sheet 2 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

Document Number: 002-00755 Rev. *F Page 19 of 81 S29WS064R ADVANCE 2 32 kwords SA067 200000h 207FFFh SA068 208000h 20FFFFh SA069 210000h 217FFFh SA070 218000h 21FFFFh SA071 220000h 227FFFh SA072 228000h 22FFFFh SA073 230000h 237FFFh SA074 238000h 23FFFFh SA075 240000h 247FFFh SA076 248000h 24FFFFh SA077 250000h 257FFFh SA078 258000h 25FFFFh SA079 260000h 267FFFh SA080 268000h 26FFFFh SA081 270000h 277FFFh SA082 278000h 27FFFFh SA083 280000h 287FFFh SA084 288000h 28FFFFh SA085 290000h 297FFFh SA086 298000h 29FFFFh SA087 2A0000h 2A7FFFh SA088 2A8000h 2AFFFFh SA089 2B0000h 2B7FFFh SA090 2B8000h 2BFFFFh SA091 2C0000h 2C7FFFh SA092 2C8000h 2CFFFFh SA093 2D0000h 2D7FFFh SA094 2D8000h 2DFFFFh SA095 2E0000h 2E7FFFh SA096 2E8000h 2EFFFFh SA097 2F0000h 2F7FFFh SA098 2F8000h 2FFFFFh Table 6.2 S29WS064R Sector and Memory Address Map (Bottom Boot) (Sheet 3 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

Document Number: 002-00755 Rev. *F Page 20 of 81 S29WS064R ADVANCE 7. Device Operations This section describes the read, program, erase, simultaneous re ad/write operations, handshaking, and reset features of the Fla sh devices. Operations are initiated by writ ing specific commands or a sequence with specif ic address and data pa tterns into the command registers (see Table 12.1 on page 74 and Table 12.2 on page 75). The command register itself does not occupy any addressable memory location; rather, it is composed of latches that store the commands, along with the address and data information needed to execute the command. The contents of the regist er serve as input to the internal state machine and the state machine outputs dictate the function of the device. Writing incorrect address and data values or writing them in an improper sequence may place the device in an unknown state, in which case the system must write the reset command to return the device to the reading array data mode. 3 32 kwords SA099 300000h 307FFFh SA100 308000h 30FFFFh SA101 310000h 317FFFh SA102 318000h 31FFFFh SA103 320000h 327FFFh SA104 328000h 32FFFFh SA105 330000h 337FFFh SA106 338000h 33FFFFh SA107 340000h 347FFFh SA108 348000h 34FFFFh SA109 350000h 357FFFh SA110 358000h 35FFFFh SA111 360000h 367FFFh SA112 368000h 36FFFFh SA113 370000h 377FFFh SA114 378000h 37FFFFh SA115 380000h 387FFFh SA116 388000h 38FFFFh SA117 390000h 397FFFh SA118 398000h 39FFFFh SA119 3A0000h 3A7FFFh SA120 3A8000h 3AFFFFh SA121 3B0000h 3B7FFFh SA122 3B8000h 3BFFFFh SA123 3C0000h 3C7FFFh SA124 3C8000h 3CFFFFh SA125 3D0000h 3D7FFFh SA126 3D8000h 3DFFFFh SA127 3E0000h 3E7FFFh SA128 3E8000h 3EFFFFh SA129 3F0000h 3F7FFFh SA130 3F8000h 3FFFFFh Table 6.2 S29WS064R Sector and Memory Address Map (Bottom Boot) (Sheet 4 of 4) Bank Sector Size Sector Address Start (Word) Address End (Word)

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7.1 Device Operation Table

The device must be setup appropriately for each operation. Table 7.1 describes the required state of each control pin for any particular operation. Legend L = Logic 0, H = Logic 1, X = can be either VIL or VIH., = rising edge, = high to low.

7.2 VersatileIO™ (V IO) Control

The VersatileIO (VIO) control allows the host system to set the voltage leve ls that the device generates at its data outputs and the voltages tolerated at its data inputs to the same voltage level that is asserted on the VIO pin.

7.3 Asynchronous Read

All memories require access time to output array data. In an asynchronous read operation, data is read from one memory location at a time. Addresses are presented to the device in random order, and the propagation delay through the device causes the data on its outputs to arrive asynchronously with the address on its inputs. The device defaults to reading array data asynchronously after device power-up or hardware reset. To read data from the memory array, the system must first assert a valid address on A max-A0, while driving AVD# and CE# to V IL. WE# must remain at VIH. The OE# signal must be driven to VIL. CLK may remain at VIL or VIH. The rising edge of AVD# will latch the address, preventing changes to the address lines from affecting the address being accessed. However, AVD# may remain low throughout the read access if the address will remain stable. Data is output on DQ15-DQ0 pins after the access time (t ACC) has elapsed following the falling edge of AVD#, or the last time the address lines changed while AVD# was low. Table 7.1 Device Bus Operations Operation CE# OE# WE# CLK AVD# Addresses Data RDY RESET# Asynchronous Operations Asynchronous Read - Addresses Latched L H H X Addr In High-Z H H Asynchronous Read AVD# Steady State L L H X L Addr In Output Valid HH Asynchronous Read - Data on bus L L H X H X Output Valid HH Asynchronous Write (AVD# Latched Addresses) L H L X Addr In X H H Asynchronous Write (WE# Latched Data) L H X H X Input Valid HH Non-Operations Standby (CE#) H X X X X X High-Z High-Z H Hardware Reset X X X X X X High-Z High-Z Synchronous Operations Latch Starting Burst Address by CLK L H H L Addr In Output Invalid XH Advance Burst read to next address L L H H X Output Valid HH Terminate current Burst read cycle H X X X X X High-Z High-Z H Terminate current Burst read cycle through RESET# X X X X X X High-Z High-Z L Terminate current Burst read cycle and start new Burst read cycle L H H L Addr In Output Invalid XH

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7.4 Page Read Mode

The device is capable of fast p age mode read. This mode provides faster read access speed for random locations within a page. The random or initial page access is t ACC or tCE and subsequent page read accesses (as long as the locations specified by the microprocessor fall within that page) is equivalent to tPACC. When CE# is de-asserted (= VIH), the reassertion of CE# for subsequent access has access time of tACC or tCE. Here again, CE# selects the device and OE# is the output control and should be used to gate data to the output inputs if the device is select ed. Fast page mode accesses are obtained by keeping A max - A3 constant and changing A2 - A0 to select the specific word within that page. Address bits A max - A3 select an 8-word page, and address bits A2 - A0 se lect a specific word within that page. This is an asynchronous operation with the microprocessor supplying the specific word location. See Table 7.2 for details on selecting specific words. The de-assertion and re-assertion of AVD# creates a new t ACC. It does not matter if AVD# is lo w or toggles once. However, the address input must always be valid and stable if AVD# is low during the page read. The user must keep AVD# low during and between page reads on address A(2:0).

7.5 Synchronous (Burst) Read Mode and Configuration Register

When a series of adjacent addresses needs to be read from the device (in order from lowest to highest address), the synchronous (or burst read) mode can be used to significantly reduce the overall time needed for the device to output array data. After an initial access time required for the data from the first address location, subsequent data is output synchronized to a clock input provided by the system. The device offers both continuous and linear methods of burst read operation, which are discussed in Section 7.5.1, Continuous Burst Read Mode on page 27 and Section 7.5.2, 8-, 16-Word Linear Burst Read with Wrap Around on page 27. Since the device defaults to asynchronous read mode after power-u p or a hardware reset, the configuration register must be set to enable the burst read mode. Other Configuration Register settings include the number of wait states to insert before the initial word (tIACC) of each burst access, the burst mode in which to operate, and when RDY indicates data is ready to be read. Prior to entering the burst mode, the system should first determine the configuration register settings (and read the current register settings if desired via the Read Configuration Register comm and sequence), and then write the c onfiguration register command sequence. See Section 7.5.3, Configuration Register on page 27, and Table 12.1, Memory Array Commands on page 74 for further details. Table 7.2 Word Select Word A2 A1 A0 Word 0 0 0 0 Word 1 0 0 1 Word 2 0 1 0 Word 3 0 1 1 Word 4 1 0 0 Word 5 1 0 1 Word 6 1 1 0 Word 7 1 1 1

Document Number: 002-00755 Rev. *F Page 23 of 81 S29WS064R ADVANCE Figure 7.1 Synchronous/Asynchronous State Diagram The device outputs the initial word subject to the following operational conditions:  tIACC specification: the time from the rising edge of the first clock cycle after addresses are latched to valid data on the device outputs.  configuration register setting CR13-CR11: the total number of clock cycles (wait states) that occur before valid data appears on the device outputs. The effect is that tIACC is lengthened. The device outputs subsequent words tBACC after the active edge of each successive clock cycle, which also increments the internal address counter. The device outputs burst data at this rate subject to the following operational conditions:  starting address: whether the address is divisible by eight (where A[2:0] is 000). A divisible-by-eight address incurs the least number of additional wait states that occur after the initial word.  boundary crossing: There is a boundary at every 128 words due to the internal architecture of the device. One additional wait state must be inserted when crossing this boundary if the memory bus is operating at a high clock frequency. Please refer to the tables below.  clock frequency: the speed at which the device is expected to burst data. Higher speeds require additional wait states after the initial word for proper operation. In all cases, with or without latency, the RDY output indicates when the next data is available to be read. Table 7.3 to Table 7.8 reflect wait states required for S29WS064R devices. Refer to Table 7.11, Configuration Register on page 27 (CR13 - CR11) and timing diagrams for more details. Power-up/ Hardware Reset Asynchronous Read Mode Only Synchronous Read Mode Only Set Burst Mode Configuration Register Command for Synchronous Mode (CR15 = 0) Set Burst Mode Configuration Register Command for Asynchronous Mode (CR15 = 1)

Document Number: 002-00755 Rev. *F Page 24 of 81 S29WS064R ADVANCE Table 7.3 Address Latency for 8 or More Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 8 or more wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

1 D 1D 2D 3D 4D 5D 6D 7 1 w s D 8

2 D 2D 3D 4D 5D 6D 7 1 w s 1 w s D 8

3 D3 D4 D5 D6 D7 1 ws 1 ws 1 ws D8

4 D4 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8

5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8

6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8

7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8

Table 7.4 Address Latency for 7 Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 7 wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

1 D 1D 2D 3D 4D 5D 6D 7D 8D 9

2 D 2D 3D 4D 5D 6D 7 1 w s D 8D 9

3 D3 D4 D5 D6 D7 1 ws 1 ws D8 D9

4 D4 D5 D6 D7 1 ws 1 ws 1 ws D8 D9

5 D5 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9

6 D6 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9

7 D7 1 ws 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9

Table 7.5 Address Latency for 6 Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 6 wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

2 D 2D 3D 4D 5D 6D 7D 8D 9 D 1 0

3 D3 D4 D5 D6 D7 1 ws D8 D9 D10

4 D4 D5 D6 D7 1 ws 1 ws D8 D9 D10

5 D5 D6 D7 1 ws 1 ws 1 ws D8 D9 D10

6 D6 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10

7 D7 1 ws 1 ws 1 ws 1 ws 1 ws D8 D9 D10

Document Number: 002-00755 Rev. *F Page 25 of 81 S29WS064R ADVANCE Table 7.6 Address Latency for 5 Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 5 wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

3 D 3D 4D 5D 6D 7D 8D 9 D 1 0 D 1 1

4 D4 D5 D6 D7 1 ws D8 D9 D10 D11

5 D5 D6 D7 1 ws 1 ws D8 D9 D10 D11

6 D6 D7 1 ws 1 ws 1 ws D8 D9 D10 D11

7 D7 1 ws 1 ws 1 ws 1 ws D8 D9 D10 D11

Table 7.7 Address Latency for 4 Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 4 wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

4 D 4D 5D 6D 7D 8D 9 D 1 0 D 1 1 D 1 2

5 D5 D6 D7 1 ws D8 D9 D10 D11 D12

6 D6 D7 1 ws 1 ws D8 D9 D10 D11 D12

7 D7 1 ws 1 ws 1 ws D8 D9 D10 D11 D12

Table 7.8 Address Latency for 3 Wait States Word Initial Wait Subsequent Clock Cycles After Initial Wait States 3 wait states D0 D1 D2 D3 D4 D5 D6 D7 D8

5 D 5D 6D 7D 8D 9 D 1 0 D 1 1 D 1 2 D 1 3

6 D6 D7 1 ws D8 D9 D10 D11 D12 D13

7 D7 1 ws 1 ws D8 D9 D10 D11 D12 D13

Document Number: 002-00755 Rev. *F Page 26 of 81 S29WS064R ADVANCE Figure 7.2 Synchronous Read Table 7.9 128 Word Boundary Crossing Latency - Additional Wait States Initial Wait States Boundary Crossing Latency 0 ws 91 w s 10 to 13 2 ws Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Write Set Configuration Register Command and Settings: Address 555h, Data D0h Address X00h, Data CR Load Initial Address Address = RA Read Initial Data RD = DQ[15:0] Read Next Data RD = DQ[15:0] Wait X Clocks: Additional Latency Due to Starting Address, Clock Frequency, and Boundary Crossing End of Data? Yes Crossing Boundary? No Yes Completed Delay X Clocks Unlock Cycle 1 Unlock Cycle 2 RA = Read Address RD = Read Data Command Cycle CR = Configuration Register Bits CR15-CR0 Note: Setup Configuration Register parameters No Refer to the Latency tables.

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7.5.1 Continuous Bu rst Read Mode

In the continuous burst read mode, the device outputs sequential burst data from the starting address given and then wrap around to address 000000h when it reaches the highest addressable memory location. The burst read mode continues until the system drives CE# high, or RESET= VIL. Continuous burst mode can also be aborted by asserting AVD# low and providing a new address to the device. If the address being read crosses a 128-word line boundary (as mentioned above) and the subsequent word line is not being programmed or erased, additional latency cycles are required as reflected by the configuration register table (Table 7.11). If the address crosses a bank boundary while the subsequent bank is programming or erasing, the device provides read status information and the clock is ignored. Upon completion of status read or program or erase operation, the host can restart a burst read operation using a new address and AVD# pulse. 7.5.2 8-, 16-Word Linear Bu rst Read with Wrap Around In a linear burst read operation, a fixed number of words (8, 16 words) are read from consecutive addresses that are determined by the group within which the starting address falls. The groups are sized according to the number of words read in a single burst sequence for a given mode (see Table 7.10). For example, if the st arting address in the 8-word mode is 3Ch, the addr ess range to be read would be 38-3Fh, and the burst sequence would be 3C-3D-3E-3F-38-39-3A-3Bh. Thus, the device outputs all words in that burst address group until all word are read, regardless of where the starting address occurs in the address group, and then terminates the burst read. In a similar fashion, the 16-word Linear Wrap mode begins its burst sequence on the starting address provided to the device, th en wraps back to the first address in the selected address group. Note: in this mode the address pointer does not cross the boundary that occurs every 128 words; thus, no additional wait states are inserted due to boundary crossing.

7.5.3 Configuration Register

The configuration register sets various operational parameters associated with burst mode. Upon power-up or hardware reset, the device defaults to the asynchronous read mode, and the configuration regist er settings are in their default state. The host sys tem should determine the proper settings for the entire configuration register, and then execute the Set Configuration Register command sequence, before attempting burst operations. The configuration r egister is not reset after de-a sserting CE#. The Configuration Register can also be read using a command sequence (see Table 12.1, Memory Array Commands on page 74). The following list describes the register settings. Table 7.10 Burst Address Groups Mode Group Size Group Address Ranges 8-word 8 words 0-7h, 8-Fh, 10-17h, 18-1Fh... 16-word 16 words 0-Fh, 10-1Fh, 20-2Fh, 30-3Fh... Table 7.11 Configuration Register CR Bit Function Settings (Binary) CR15 Set Device Read Mode 0 = Synchronous Read (Burst Mode) Enabled 1 = Asynchronous Read Mode (default) Enabled CR14 Reserved 0 = Default CR13 CR12 CR11 Programmable Wait State 001 = Data is valid on the 3rd active CLK edge after AVD# transition to VIH 010 = Data is valid on the 4th active CLK edge after AVD# transition to VIH 011 = Data is valid on the 5th active CLK edge after AVD# transition to VIH 100 = Data is valid on the 6th active CLK edge after AVD# transition to VIH 101 = Data is valid on the 7th active CLK edge after AVD# transition to VIH (default) 110 = Data is valid on the 8th active CLK edge after AVD# transition to VIH 111 = Data is valid on the 9th active CLK edge after AVD# transition to VIH

Document Number: 002-00755 Rev. *F Page 28 of 81 S29WS064R ADVANCE Notes: 1. Refer to Table 7.3 to Table 7.8 for wait states requirements. 2. Refer to Section 11.7.2, Synchronous/Burst Read on page 57 timing diagrams 3. Configuration Register is in the default state upon power-up or hardware reset. The configuration register can be read with a four-cycle command sequence. See Table 12.1, Memory Array Commands on page 74 for sequence details. A software reset command is required after reading or setting the configuration register to set the devic e into the correct state.

7.6 Autoselect

The Autoselect is used for manufacturer ID, Device identification, and sector protection information. This mode is primarily intended for programming equipment to autom atically match a device with its corresponding programming algorithm. The Autoselect codes can also be accessed in-system. When verifying sector protection, the sector address must appear on the appropriate highest order address bits (see Table 7.12). The remaining address bits are don't care. The most significant four bits of the address during the third write cycle selects the bank from which the Autoselect codes are read by the host. All other banks can be accessed normally for data read without exiting the Autoselect mode.  To access the Autoselect codes, the host system must issue the Autoselect command.  The Autoselect command sequence may be written to an address within a bank that is either in the read or erase-suspend- read mode.  The Autoselect command may not be written while the device is actively programming or erasing. Autoselect does not support simultaneous operations or burst mode.  The system must write the reset command to return to the read mode (or erase-suspend read mode if the bank was previously in Erase Suspend). See Table 12.1, Memory Array Commands on page 74 for command sequence details. CR10 RDY Polarity 0 = RDY signal active low 1 = RDY signal active high (default) CR9 Reserved 1 = Default CR8 RDY 0 = RDY active one clock cycle before data 1 = RDY active with data (default) When CR13-CR11 are set to 000, RDY is active with data regardless of CR8 setting. CR7 Reserved 1 = Default CR6 Reserved 1 = Default CR5 Reserved 0 = Default CR4 Reserved 0 = Default CR3 Reserved 1 = Default CR2 CR1 CR0 Burst Length 000 = Continuous (default) 010 = 8-Word Linear Burst 011 = 16-Word Linear Burst (All other bit settings are reserved) Table 7.12 Autoselect Addresses Description Address Read Data Manufacturer ID (BA) + 00h 0001h Device ID, Word 1 (BA) + 01h 007Eh Device ID, Word 2 (BA) + 0Eh Top Boot: 004Fh Bottom Boot: 0057h Device ID, Word 3 (BA) + 0Fh 0000h Table 7.11 Configuration Register CR Bit Function Settings (Binary)

Document Number: 002-00755 Rev. *F Page 29 of 81 S29WS064R ADVANCE Software Functions and Sample Code Notes: 1. Any offset within the device works. 2. BA = Bank Address. T he bank address is required. 3. base = base address. The following is a C source code example of using the autose lect function to read the manufacturer ID. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com ) for general information on Spansion Flash memory software development guidelines. /* Here is an example of Autoselect mode (getting manufacturer ID) */ /* Define UINT16 example: typedef unsigned short UINT16; */ UINT16 manuf_id; /* Auto Select Entry */ *( (UINT16 *)bank_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)bank_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)bank_addr + 0x555 ) = 0x0090; /* write autoselect command */ /* multiple reads can be performed after entry */ manuf_id = *( (UINT16 *)bank_addr + 0x000 ); /* read manuf. id */ /* Autoselect exit */ *( (UINT16 *)base_addr + 0x000 ) = 0x00F0; /* exit autoselect (write reset command) */ Indicator Bits (BA) + 07h DQ15-DQ8 = Reserved DQ7 (Factory Lock Bit): 1 = Locked, 0 = Not Locked DQ6 (Customer Lock Bit): 1 = Locked, 0 = Not Locked DQ5 - DQ0 = Reserved Sector Protect Verify (SA) + 02h 0001h = Locked, 0000h = Unlocked Table 7.13 Autoselect Entry (LLD Function = lld_AutoselectEntryCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write BAxAAAh BAx555h 00AAh Unlock Cycle 2 Write BAx555h BAx2AAh 0055h Autoselect Command Write BAxAAAh BAx555h 0090h Table 7.14 Autoselect Exit (LLD Function = lld_AutoselectExitCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write base + XXXh base + XXXh 00F0h Table 7.12 Autoselect Addresses Description Address Read Data

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7.7 Program/Erase Operations

These devices are capable of several modes of programming and or erase operations which are described in detail in the following sections. However, prior to any programmi ng and or erase operation, devices must be setup appropriately as outlined in the configuration register (Table 7.11). For any synchronous program and or eras e operations, including writ ing command sequences, the system must drive AVD# and CE# to VIL, and OE# to VIH when providing an address to the device, and drive WE# and CE# to V IL, and OE# to VIH when writing commands or programming data. During asynchronous write operations, addre sses are latched on the risi ng edge of AVD# while data is latched on the first risin g edge of WE#. If AVD# is kept at VIL, addresses and data are latched on the first rising edge of WE#. Note the following:  When the Embedded Program algorithm is complete, the device returns to the read mode.  The system can determine the status of the program operation by using DQ7 or DQ6. Refer to Section 7.7.8, Write Operation Status on page 41 for information on these status bits.  A “0” cannot be programmed back to a “1.” Attempting to do so causes the device to set DQ5 = 1 (halting any further operation and requiring a reset command). A succeeding read shows that the data is still “0.” Only erase operations can convert a “0” to a “1.”  Any commands written to the device during the Embedded Program Algorithm are ignored except the Program Suspend command.  Secured Silicon Sector, Autoselect, and CFI functions are unavailable when a program operation is in progress.  A hardware reset immediately terminates the program operation and the program command sequence should be reinitiated once the device has returned to the read mode, to ensure data integrity.  Programming is allowed in any sequence and across sector boundaries for single word programming operation.

7.7.1 Single Word Programming

Single word programming mode is the simplest method of programming. In this mode, four Flash command write cycles are used to program an individual Flash address. The data for this programming operation coul d be 8- or 16-bits wide. While this method is supported by all Spansion devices, in general it is not recomme nded for devices that support Write Buffer Programming. See Table 12.1, Memory Array Commands on page 74 for the required bus cycles and Figure 7.3 for the flowchart. When the Embedded Program algorithm is complete, the device then returns to the read mode and addresses are no longer latched. The system can determine the status of the program operation by using DQ7 or DQ6. Refer to Section 7.7.8, Write Operation Status on page 41 for information on these status bits.  During programming, any command (except the Suspend Program command) is ignored.  The Secured Silicon Sector, Autoselect, and CFI functions are unavailable when a program operation is in progress.  A hardware reset immediately terminates the program operation. The program command sequence should be reinitiated once the device has returned to the read mode, to ensure data integrity.

Document Number: 002-00755 Rev. *F Page 31 of 81 S29WS064R ADVANCE Figure 7.3 Single Word Program Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Write Program Command: Address 555h, Data A0h Program Data to Address: PA, PD Unlock Cycle 1 Unlock Cycle 2 Setup Command Program Address (PA), Program Data (PD) FAIL. Issue reset command to return to read array mode. Perform Polling Algorithm (see Write Operation Status flowchart) Yes Yes No No Polling Status = Busy? Polling Status = Done? Error condition (Exceeded Timing Limits) PASS. Device is in read mode.

Document Number: 002-00755 Rev. *F Page 32 of 81 S29WS064R ADVANCE Software Functions and Sample Code Note: 1. Base = Base Address The following is a C source code example of using the single word program function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program Command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x00A0; /* write program setup command */ *( (UINT16 *)pa ) = data; /* write data to be programmed */ /* Poll for program completion */

7.7.2 Write Buffer Programming

Write Buffer Programming allows the system to write a maximum of 32 words in one programming operation. This results in a faster effective word programming time than t he standard “word” programming algorithms . The Write Buffer Programming command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycl e containing th e Write Buffer L oad command written at the Sector Address in which programming occurs. At this point, the system writes the number of “word locations minus 1” that are loaded into the page buffer at the Sector Address in which programming occurs. This tells the device how many write buffer addresses are loaded with data and therefore when to expect t he “Program Buffer to Fl ash” confirm command. The number of locations to program cannot exceed the size of the write buffer or the operation aborts. (Number loaded = the number of locations to program minus 1. For example, if the system programs 6 address locations, then 05h should be written to the device.) The system then writes the starting address/data combination. This starting address is the first address/data pair to be programmed, and selects the “write-buffer-page” address. All subsequent address/data pairs must fall within the elected-write-buffer-page. The “write-buffer-page” is selected by using the addresses AMAX - A5. The “write-buffer-page” addresses must be the same for all address/data pairs loaded into the write buffer. (This means Write Buffer Programming cannot be performed across multiple “write buffer-pages.” This also means that Write Buffer Programming cannot be performed across multiple sectors. If the system attempts to load programming data outside of the selected “write buffer-page”, the operation ABORTs.) After writing the Starting Address/Data pair, the system then writes the remaining address/data pairs into the write buffer. Note that if a Write Buffer address location is loaded multiple times, the “address/data pair” counter is decremented for every data load operation. Also, the last data loaded at a location before the “Program Buffer to Flash” confirm command is programmed into the device. It is the so ftware's responsibility to comprehend ramifications of loading a write-buffer lo cation more than once. The counter decrements for each data load operation, NOT for each unique write-buffer-address location. Once the specified number of write buffer locations have been loaded, the system must then write the “Program Buffer to Flash” command at the Sector Address. Any other address/data write combinations abort the Write Buffer Programming opera tion. The device goes “busy.” The Data# polling techniques should be used while monitoring the last address location loaded into the write buffer. This eliminates the need to store an address in memory because the system can load the last address location, issue the program confirm command at the last loaded address location, and then data# poll at that same addres s. DQ7, DQ6, DQ5, DQ2, and DQ1 should be monitored to determine the device status during Write Buffer Programming. Table 7.15 Single Word Program (LLD Function = lld_ProgramCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write BAxAAAh BAx555h 00AAh Unlock Cycle 2 Write BAx554h BAx2AAh 0055h Program Setup Write BAxAAAh BAx555h 00A0h Program Write Word Address Word Address Data Word

Document Number: 002-00755 Rev. *F Page 33 of 81 S29WS064R ADVANCE The write-buffer “embedded” programming operation can be suspended using the standard suspend/resume commands. Upon successful completion of the Write Buffer Programming operation, the device returns to READ mode. The Write Buffer Programming Sequence is ABORTED under any of the following conditions:  Load a value that is greater than the page buffer size during the “Number of Locations to Program” step.  Write to an address in a sector different than the one specified during the Write-Buffer-Load command.  Write an Address/Data pair to a different write-buffer-page than the one selected by the “Starting Address” during the “write buffer data loading” stage of the operation.  Write data other than the “Confirm Command” after the specified number of “data load” cycles. The ABORT condition is indicated by DQ1 = 1, DQ7 = DATA# (for the “last address location loaded”), DQ6 = TOGGLE, DQ5 = 0. This indicates that the Write Buffer Programming Operat ion was ABORTED. Note that the Secured Silicon sector, autoselect, and CFI functions are unavailable when a program operation is in progress. Write buffer programming is allowed in any sequence of memory (or address) locations. These flash devices are capable of handling multiple write buffer programming operations on the same write buffer address range without intervening erases. Use of the write buffer is strongly recommended for programmin g when multiple words are to be programmed. Write buffer programming is approximately eight times faster than programming one word at a time. Software Functions and Sample Code Notes: 1. Base = Base Address. 2. Last = Last cycle of write buffer program operation; depending on number of words written, the total number of cycles may be from 6 to 37. 3. For maximum efficiency, it is recommended that the write buffe r be loaded with the highest number of words (N words) possible. Table 7.16 Write Buffer Program (LLD Functions Used = lld_WriteToBufferCmd, lld_ProgramBufferToFlashCmd) Cycle Description Operation Byte Address Word Address Data

1 Unlock Write Base + AAAh Base + 555h 00AAh

2 Unlock Write Base + 554h Base + 2AAh 0055h

3 Write Buffer Load

Command Write Program Address 0025h

4 Write Word Count Write Program Address Word Count (N-1)h

Number of words (N) loaded into the write buffer can be from 1 to 32 words. 5 to 36 Load Buffer Word N Write Program Address, Word N Word N Last Write Buffer to Flash Write Sector Address 0029h

Document Number: 002-00755 Rev. *F Page 34 of 81 S29WS064R ADVANCE The following is a C source code example of using the write buffer program function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Write Buffer Programming Command */ /* NOTES: Write buffer programming limited to 16 words. */ /* All addresses to be written to the flash in */ /* one operation must be within the same flash */ /* page. A flash page begins at addresses */ /* evenly divisible by 0x20. */ UINT16 *src = source_of_data; /* address of source data */ UINT16 *dst = destination_of_data; /* flash destination address */ UINT16 wc = words_to_program -1; /* word count (minus 1) */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)sector_address ) = 0x0025; /* write write buffer load command */ *( (UINT16 *)sector_address ) = wc; /* write word count (minus 1) */ loop: *dst = *src; /* ALL dst MUST BE SAME PAGE */ /* write source data to destination */ dst++; /* increment destination pointer */ src++; /* increment source pointer */ if (wc == 0) goto confirm /* done when word count equals zero */ wc--; /* decrement word count */ goto loop; /* do it again */ confirm: *( (UINT16 *)sector_address ) = 0x0029; /* write confirm command */ /* poll for completion */ /* Example: Write Buffer Abort Reset */ *( (UINT16 *)addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)addr + 0x555 ) = 0x00F0; /* write buffer abort reset */

Document Number: 002-00755 Rev. *F Page 35 of 81 S29WS064R ADVANCE Figure 7.4 Write Buffer Programming Operation

7.7.3 Sector Erase

The sector erase function erases one sector in the memory array. (See Table 12.1, Memory Array Commands on page 74; and Figure 7.5, Sector Erase Operation on page 37 .) The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatica lly programs and verifies the entire memory for an all zero data pattern prior to electrical erase. After a successful sector erase, all locations within t he erased sector contain FFFFh. The system is not required to pro vide any controls or timings during these operations. Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Issue Write Buffer Load Command: Address 555h, Data 25h Load Word Count to Program Program Data to Address: SA = wc Unlock Cycle 1 Unlock Cycle 2 wc = number of words – 1 Ye s Ye s Ye s Ye s No No No No wc = 0? Write Buffer Abort? Polling Status = Done? Error? FAIL. Issue reset command to return to read array mode. PASS. Device is in read mode. Confirm command: SA = 0x29h Perform Polling Algorithm (see Write Operation Status flowchart) Write Next Word, Decrement wc: PA data , wc = wc – 1 RESET. Issue Write Buffer Abort Reset Command

Document Number: 002-00755 Rev. *F Page 36 of 81 S29WS064R ADVANCE When the Embedded Erase algorithm is complete, the bank returns to reading array data and addresses are no longer latched. Note that while the Embedded Erase ope ration is in progress, the sys tem can read data from the non- erasing banks. The system can determine the status of the erase operation by r eading DQ7 or DQ6/DQ2 in the erasing bank. Refer to Section 7.7.8, Write Operation Status on page 41 for information on these status bits. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the sector erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Figure 7.5, Sector Erase Operation on page 37 illustrates the algorithm for the erase operation. Refer to Section 11.7.6, Erase and Programming Performance on page 73 for parameters and timing diagrams. Software Functions and Sample Code The following is a C source code example of us ing the sector erase function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Sector Erase Command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x0080; /* write setup command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write additional unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write additional unlock cycle 2 */ *( (UINT16 *)sector_address ) = 0x0030; /* write sector erase command */ Table 7.17 Sector Erase (LLD Function = lld_SectorEraseCmd) Cycle Description Operation Byte Address Word Address Data

3 Setup Command Write Base + AAAh Base + 555h 0080h

4 Unlock Write Base + AAAh Base + 555h 00AAh

5 Unlock Write Base + 554h Base + 2AAh 0055h

6 Sector Erase Command Write Sector Address Sector Address 0030h

Document Number: 002-00755 Rev. *F Page 37 of 81 S29WS064R ADVANCE Figure 7.5 Sector Erase Operation Note: 1. See Table 12.1 for erase command sequence.

7.7.4 Chip Erase Command Sequence

Chip erase is a six-bus cycle operation as indicated by Table 12.1, Memory Array Commands on page 74. These commands invoke the Embedded Erase algorithm, which does not require the system to preprogram prio r to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. After a successful chip erase, all locations of the chip contain FFFFh. The system is not required to provide any controls or timings during these operations. Table 12.1, Memory Array Commands on page 74 in the Appendix shows the address and data requirements for the chip erase command sequence. When the Embedded Erase algorithm is complete, that bank return s to the read mode and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7 or DQ6/DQ2. Refer to Section 7.7.8, Write Operation Status on page 41 for information on these status bits. Any commands written during the chip erase operation are ignored. However, note that a hardware reset immediately terminates the erase operation. If that occurs, the chip erase command sequence should be reinitiated once that bank has returned to reading array data, to ensure data integrity. Write Unlock Cycles: Address 555h, Data AAh Address 2AAh, Data 55h Write Sector Erase Cycles: Address 555h, Data 80h Address 555h, Data AAh Address 2AAh, Data 55h Sector Address, Data 30h FAIL. Write reset command to return to reading array. PASS. Device returns to reading array. Perform Write Operation Status Algorithm Unlock Cycle 1 Unlock Cycle 2 Ye s Ye s No No Done? DQ5 = 1? Command Cycle 1 Command Cycle 2 Command Cycle 3 Specify sector for erasure Error condition (Exceeded Timing Limits) Status may be obtained by reading DQ7, DQ6 and/or DQ2.

Document Number: 002-00755 Rev. *F Page 38 of 81 S29WS064R ADVANCE Software Functions and Sample Code The following is a C source code example of using the chip erase function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Chip Erase Command */ /* Note: Cannot be suspended */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x0080; /* write setup command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write additional unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write additional unlock cycle 2 */ *( (UINT16 *)base_addr + 0x000 ) = 0x0010; /* write chip erase command */

7.7.5 Erase Suspend/Erase Resume Commands

The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. The bank address is required when writing this command. This command is valid only during the sector erase operation. The Erase Suspend command is ignored if written during the chip erase operation. When the Erase Suspend command is writ ten during the sector erase operation, the device requires a maximum of t ESL (erase suspend latency) to suspend the erase operation. Additionally, when an Erase Suspend command is written during an active erase operation, status information is unavailable during the transition from the sector erase operation to the erase suspended state. After the erase operation has been suspended, the bank enters the erase-suspend-read mode. The system can read data from or program data to any sector no t selected for erasure. (The de vice “erase suspends” the sector selected for erasure.) Reading at any address within the erase su spended sector produces status information on DQ7-DQ0. The system can use DQ7, or DQ6, and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. Refer to Table 7.24, Write Operation Status on page 45 for information on these status bits. After an erase-suspended program operation is complete, the bank returns to the erase-suspend- read mode. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. In t he erase-suspend-read mode, the system can also issu e the Autoselect command sequence. Refer to Section 7.7.2, Write Buffer Programming on page 32 and Section 7.6, Autoselect on page 28 for details. To resume the sector erase operation, the system must writ e the Erase Resume command. Th e bank address of the erase- suspended bank is required when writing this command. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the chip has resumed erasing. Table 7.18 Chip Erase (LLD Function = lld_ChipEraseCmd) Cycle Description Operation Byte Address Word Address Data

6 Chip Erase Command Write Base + AAAh Base + 555h 0010h

Document Number: 002-00755 Rev. *F Page 39 of 81 S29WS064R ADVANCE Software Functions and Sample Code The following is a C source code example of using the erase suspend function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Erase suspend command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x00B0; /* write suspend command */ The following is a C source code example of using the erase resume function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Erase resume command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x0030; /* write resume command */ /* The flash needs adequate time in the resume state */

7.7.6 Program Suspend/Pr ogram Resume Commands

The Program Suspend command allows the system to interrupt an embedded programming operation or a “Write to Buffer” programming operation so that data can r ead from any non suspended sector. When t he Program Suspend command is written during a programming process, the device halts the programming operation within tPSL (program suspend latency) and updates the status bits. Addresses are “don't-cares” when writing the Program Suspend command. After the programming operation has been su spended, the system can read array data from any non-suspended sector. The Program Suspend command may also be issued during a programmi ng operation while an erase is suspended. In this case, data may be read from any addresses not in Er ase Suspend or Program Suspend. If a read is needed from the Secured Silicon Sector area, then user must use the proper command sequences to enter and exit this region. The system may also write the Autoselect command sequence w hen the device is in Program Suspend mode. The device allows reading Autoselect codes in the suspended sectors, since the codes are not stored in the memory array. When the device exits the Autoselect mode, the device revert s to Program Suspend mode, and is r eady for another valid operation. See Section 7.6, Autoselect on page 28 for more information. After the Program Resume command is written, the device revert s to programming. The system c an determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. See Section 7.7.8, Write Operation Status on page 41 for more information. The system must write the Pr ogram Resume command (address bits are “don't care”) to exit the Program Suspend mode and continue the programming operation. Furt her writes of the Program Resume command are ignored. Another Program Suspend command can be written after the device has resumed programming. Table 7.19 Erase Suspend (LLD Function = lld_EraseSuspendCmd) Cycle Description Byte Address Word Address Data

1 Write Bank Address Bank Address 00B0h

Table 7.20 Erase Resume (LLD Function = lld_EraseResumeCmd) Cycle Description Byte Address Word Address Data

1 Write Bank Address Bank Address 0030h

Document Number: 002-00755 Rev. *F Page 40 of 81 S29WS064R ADVANCE Software Functions and Sample Code The following is a C source code example of us ing the program suspend function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program suspend command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x00B0; /* write suspend command */ The following is a C source code example of us ing the program resume function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Program resume command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x0030; /* write resume command */

7.7.7 Accelerated Program/Chip Erase

Accelerated single word programming, write buffer programming, sector erase, and chip erase operations are enabled through the ACC function. This method is faster than the standard chip program and erase command sequences. The accelerated chip program and erase functions must not be used more than 10 times per sector. In addition, accelerated chip program and erase should be performed at room temperature (25°C ±10°C). If the system asserts VHH on this input, the device uses the higher voltage on the input to reduce the time required for program and erase operations. Removing V HH from the ACC input, upon completion of the embedded program or erase operation, returns the device to normal operation.  Sectors must be unlocked prior to raising ACC to VHH.  The ACC pin must not be at VHH for operations other than accelerated programming and accelerated chip erase, or device damage may result.  The ACC pin must not be left floating or unconnected; inconsistent behavior of the device may result.  ACC locks all sectors if set to VIL; ACC should be set to VIH for all other conditions. Table 7.21 Program Suspend (LLD Function = lld_ProgramSuspendCmd) Cycle Description Byte Address Word Address Data Table 7.22 Program Resume (LLD Function = lld_ProgramResumeCmd) Cycle Description Byte Address Word Address Data

Document Number: 002-00755 Rev. *F Page 41 of 81 S29WS064R ADVANCE

7.7.8 Write Operation Status

The device provides several bits to determine the status of a program or erase oper ation. The following subsections describe th e function of DQ1, DQ2, DQ5, DQ6, and DQ7. DQ7: Data# Polling The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Program or Erase algorithm is in progress or completed, or whether a bank is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the command sequence. Note that the Data# Polling is valid only for the last word being programmed in the write-buffer-page during Write Buffer Programming. Reading Data# Polling status on any word other than the last word to be programmed in the write-buffer-page returns false status information. During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address to read valid status information on DQ7. If a program address falls within a prot ected sector, Data# polling on DQ7 is active for approximately t PSP, then that bank returns to the read mode. During the Embedded Erase Algorithm, Data# polling produces a “0” on DQ7. When the Embedded Erase algorithm is complete, or if the bank enters the Erase Suspend mode, Data# Polling produces a “1” on DQ7. The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. After an erase command sequence is written, if the sector select ed for erasing is protected, Data# Polling on DQ7 is active for approximately tASP, then the bank returns to the read mode. If the selected sector is not protected, the Embedded Erase algorithm erases the sector. Just prior to the completion of an Embedded Program or Er ase operation, DQ7 may change asynchronously with DQ6-DQ0 while Output Enable (OE#) is asserted low. Th at is, the device may change from providing status information to valid data on DQ7. Depending on when the system samples the DQ7 output, it may read the status or valid data. Even if the device has completed the program or erase operation and DQ7 has valid data, the data outputs on DQ6-DQ0 may be still invalid. Valid data on DQ7-DQ0 appears on successive read cycles. See the following for more information: Table 7.24, Write Operation Status on page 45, shows the outputs for Data# Polling on DQ7. Figure 7.6, Write Operation Status Flowchart on page 42 shows the Data# Polling algorithm; and Figure 11.18, Data# Polling Timings (During Embedded Algorithm) on page 67 shows the Data# Polling timing diagram.

Document Number: 002-00755 Rev. *F Page 42 of 81 S29WS064R ADVANCE Figure 7.6 Write Operation Status Flowchart Notes: 1. DQ6 is toggling if Read2 DQ6 does not equal Read3 DQ6. 2. DQ2 is toggling if Read2 DQ2 does not equal Read3 DQ2. 3. May be due to an attempt to program a 0 to 1. Use the RESET command to exit operation. 4. Write buffer error if DQ1 of last read =1. 5. Invalid state, use RESET command to exit operation. 6. Valid data is the data that is intended to be programmed or all 1's for an erase operation. 7. Data polling algorithm valid for all operations except advanced sector protection. START Read 1 DQ7=valid data? YES NO Read 1 DQ5=1? YES NO Write Buffer Programming? YES NO Device BUSY , Re-Poll Read3 DQ1=1? YES NO Read 2 Read 3 Read 2 Read 3 Read 2 Read 3 Read3 DQ1=1 AND DQ7 ? Valid Data? YES NO (Note 4) Write Buffer Operation Failed DQ6 toggling? YES NO TIMEOUT (Note 1) (Note 3) Programming Operation? DQ6 toggling? YES NO YES NO DQ2 toggling? YES NO Erase Operation Complete Device in Erase/Suspend Mode Program Operation Failed DEVICE ERROR Erase Operation Complete Read3= valid data? YES NO Device BUSY , Re-Poll Device BUSY , Re-Poll Device BUSY , Re-Poll (Note 1) (Note 2) (Note 6) (Note 5)

Document Number: 002-00755 Rev. *F Page 43 of 81 S29WS064R ADVANCE DQ6: Toggle Bit I. Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address in the same bank, and is valid after the rising edg e of the final WE# pulse in the command sequence (prior to the program or erase operation). During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. When the operation is complete, DQ6 stops toggling. After an erase command sequence is written, if the sector selected for erasing is protected, DQ6 toggles for approximately tASP [all sectors protected toggle time], then returns to reading array data. The system can use DQ6 and DQ2 together to determine whether a sector is acti vely erasing or is erase-suspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Eras e Suspend mode, DQ6 stops t oggling. However, the syst em must also use DQ2 to determine which sectors are erasing or erase suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling under Section 7.7.8, Write Operation Status on page 41. If a program address falls within a protec ted sector, DQ6 toggles for approximately t PAP after the program command sequence is written, then returns to reading array data. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program Algorithm is complete. See the following for additional information: Figure 7.6, Write Operation Status Flowchart on page 42 ; Figure 11.19, Toggle Bit Timings (During Embedded Algorithm) on page 68, and Table 7.23, DQ6 and DQ2 Indications on page 43 and Table 7.24, Write Operation Status on page 45. Toggle Bit I on DQ6 requires either OE# or CE# to be de-asserted and reasserted to show the change in state. DQ2: Toggle Bit II The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedde d Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. DQ2 toggles when the system reads at addresses with in the sector that has been selected for erasure. But DQ2 cannot distinguish whether th e sector is actively erasing or is eras e-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sector is selected for erasure. Thus, both status bits are required for sector and mode information. Refer to Table 7.23 to compare outputs for DQ2 and DQ6. See the following for additional information: Figure 7.6, Write Operation Status Flowchart on page 42, the DQ6: Toggle Bit I section under Table 7.23 DQ6 and DQ2 Indications If device is and the system reads then DQ6 and DQ2 programming, at any address, toggles, does not toggle. actively erasing, at an address within a sector selected for erasure, toggles, also toggles. at an address within sectors not selected for erasure, toggles, does not toggle. erase suspended, at an address within a sector selected for erasure, does not toggle, toggles. at an address within sectors not selected for erasure, returns array data, returns array data. The system can read from any sector not selected for erasure. programming in erase suspend at any address, toggles, is not applicable.

Document Number: 002-00755 Rev. *F Page 44 of 81 S29WS064R ADVANCE Reading Toggle Bits DQ6/DQ2 Whenever the system initially begins reading toggle bit status, it must read DQ7-DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system ca n read array data on DQ7-DQ0 on the following read cycle. However, if after the initia l two read cycles, the system determines that the toggle bit is stil l toggling, the system also should note whether the value of DQ5 is high (see the section on DQ5). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erases operation. If it is still toggling, the device did not complete the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone hi gh. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alte rnatively, it may choose to perform other system tasks. In t his case, the system must start at the beginning of the algorithm w hen it returns to determine the status of the operation. Refer t o Figure 7.6 on page 42 for more details. Note:  When verifying the status of a write operation (embedded program/erase) of a memory bank, DQ6 and DQ2 toggle between high and low states in a series of consecutive and contiguous status read cycles. In order for this toggling behavior to be properly observed, the consecutive status bit reads must not be interleaved with read accesses to other memory banks. If it is not possible to temporarily prevent reads to other memory banks, then it is recommended to use the DQ7 status bit as the alternative method of determining the active or inactive status of the write operation.  Data polling provides erroneous results during erase suspend operation using DQ2 or DQ6 for any address changes after CE# assertion or without AVD# pulsing low. The user is required to pulse AVD# following an address change or assert CE# after address is stable during status polling. See Figure 11.21 through Figure 11.24. DQ5: Exceeded Timing Limits DQ5 indicates whether the program or erase time has exceeded a specified inter nal pulse count limit. Under these conditions DQ5 produces a “1,” indicating that the program or erase cycle was not successfully completed. The device may output a “1” on DQ5 i f the system tries to program a “1” to a locati on that was previously prog rammed to “0.” Only an erase operation can change a “0” back to a “1.” Under this condition, the device halts the operation, and when the timing limit has been exceeded, DQ5 produces a “1.” Under both these conditions, the system must write the reset command to return to the read mode (or to the erase-suspend-read mode if a bank was previously in the erase-suspend-program mode). DQ1: Write to Buffer Abort DQ1 indicates whether a Write to Buffer operation was aborted. Under these conditions DQ1 produces a “1”. The system must issue the Write to Buffer Abort Reset command sequence to return the device to reading array data. See Section 7.7.2, Write Buffer Programming on page 32 for more details.

Document Number: 002-00755 Rev. *F Page 45 of 81 S29WS064R ADVANCE Notes: 1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. Refer to subsection DQ5: Exceeded Timing Limits under 7.7.8, Write Operation Status on page 41 for more information. 2. DQ7 and DQ2 require a valid address when reading status info rmation. Refer to the appropriate subsection for further details. 3. Data are invalid for addresses in a Program Suspended sector. 4. DQ1 indicates the Write to Buffer ABORT status during Write Buffer Programming operations. 5. The data-bar polling algorithm should be used for Write Buffer Programming operations. Note that DQ7# during Write Buffer Programming indicates the data-bar for DQ7 data for the LAST LOADED WRITE-BUFFER ADDRESS location. For any address changes after CE# assertion, re-assertion of CE# might be required after the addresses become stable for data p olling during the erase suspend operation using DQ2/DQ6.

7.8 Simultaneous Read/Write

The simultaneous read/write feature allows the host system to read data fr om one bank of memory while programming or erasing another bank of memory. An erase operation may also be suspended to read from or program another location within the same bank (except the sector being erased). Figure 11.28, Back-to-Back Read/Write Cycle Timings on page 72 , shows how read and write cycles may be initiated for simultaneous operati on with zero latency. Refer to the table in Section 11.6.1, CMOS Compatible on page 56 for read-while-program and read-while-erase current specifications.

7.9 Writing Commands/Command Sequences

When the device is configured for Asynchronous read, only Asynch ronous write operations are allowed, and CLK is ignored. When in the Synchronous read mode configuration, the device is able to perform both Asynchronous and Synchronous write operations. CLK and AVD# induced address latches are supported in the Sy nchronous programming mode. Du ring a synchronous write operation, to write a command or command sequence (which in cludes programming data to the device and erasing sectors of memory), the system must drive AVD# and CE# to VIL, and OE# to VIH when providing an address to the device, and drive WE# and CE# to VIL, and OE# to V IH when writing commands or data. During an asynch ronous write operation, the system must drive CE# and WE# to VIL and OE# to VIH when providing an address, command, and data. Addresses are latched on the last falling edge of WE# or CE#, while data is latched on the 1st rising edge of WE# or CE#. An erase operation can erase one sector, or the entire device. Table 6.1 and Table 6.2 indicate the address space that each sector occupies. The device address space is divided into f our banks. For top boot devices, Banks 0 thr ough 2 contain only 64 kword sectors, whi le Bank 3 contains 8 kword boot se ctors in addition to 64 kword sectors. For bo ttom boot devices, Bank 0 contains 8 kword boot sectors in addition to 64 kword sectors, wh ile Banks 1 through 3 contain only 64 kword sectors. A “bank address” is the set of address bits required to uniquely select a bank. Similarly, a “sector address” is the address bits required to uniquely select a sector. ICC2 in Section 11.6, DC Characteristics on page 56 represents the active current specification for the write mode. Section 11.7, AC Characteristics on page 57 contains timing specification tables and timing diagrams for write operations. Table 7.24 Write Operation Status Status DQ7 (Note 2) DQ6 DQ5 (Note 1) DQ2 (Note 2) DQ1 (Note 4) Standard Mode Embedded Program Algorithm DQ7# Toggle 0 No toggle 0 Embedded Erase Algorithm 0 Toggle 0 Toggle N/A Program Suspend Mode (Note 3) Reading within Program Suspended Sector INVALID (Not Allowed) INVALID (Not Allowed) INVALID (Not Allowed) INVALID (Not Allowed) INVALID (Not Allowed) Reading within Non-Program Suspended Sector Data Data Data Data Data Erase Suspend Mode (Note ) Erase-Suspend- Read Erase Suspended Sector 1 No toggle 0 Toggle N/A Non-Erase Suspended Sector Data Data Data Data Data Erase-Suspend-Program DQ7# Toggle 0 N/A N/A Write to Buffer (Note 5) BUSY State DQ7# Toggle 0 N/A 0 Exceeded Timing Limits DQ7# Toggle 1 N/A 0 ABORT State DQ7# Toggle 0 N/A 1

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7.10 Handshaking

The handshaking feature allows the host system to detect when data is ready to be read by simply monitoring the RDY (Ready) pin, which is a dedicated output and controlled by CE#. When the device is configured to operate in synchronous mode, and OE# is low (active), the initia l word of burst data becomes available after either the falling or rising edge of the RDY pin (depending on the setting for bit 10 in the Configuration Register). It is recommended that the host system set CR13-CR11 in the Configuration Register to the appropriate number of wait states to ensure optimal burst mode operation (see Table 7.11, Configuration Register on page 27). Bit 8 in the Configuration Register allows the host to specify whether RDY is active at the same time that data is ready, or one cycle before data is ready.

7.11 Hardware Reset

The RESET# input provides a hardware meth od of resetting the device to reading array data. When RESET# is driven low for at least a period of t RP, the device immediately terminates any operation in prog ress, tristates all outputs, resets the configuration register, and ignores all read/wri te commands for t he duration of the R ESET# pulse. The device also resets the internal state machine to reading array data. To ensure data integrity the operation that was interrupted should be reinitiated once the device is ready to accept another command sequence. When RESET# is held at VSS, the device draws CMOS standby current (ICC4). If RESET# is held at VIL, but not at VSS, the standby current is greater. RESET# may be tied to the system reset ci rcuitry which enables the system to read t he boot-up firmware from the Flash memory upon a system reset. See Figure 11.5, VCC Power-up Diagram on page 55 and Figure 11.13, Reset Timings on page 62 for timing diagrams.

7.12 Software Reset

Software reset is part of the command set (see Table 12.1) that also returns the device to array read mode and must be used for the following conditions:  to exit Autoselect mode  when DQ5 goes high during write status operation that indicates program or erase cycle was not successfully completed  exit sector lock/unlock operation  to return to erase-suspend-read mode if the device was previously in Erase Suspend mode  after any aborted operations  exiting Read Configuration Register Mode

Document Number: 002-00755 Rev. *F Page 47 of 81 S29WS064R ADVANCE Software Functions and Sample Code Note: 1. Base = Base Address. The following is a C source code example of using the reset function. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: Reset (software reset of Flash state machine) */ *( (UINT16 *)base_addr + 0x000 ) = 0x00F0; The following are additional points to consider when using the reset command:  This command resets the banks to the read and address bits are ignored.  Reset commands are ignored once erasure has begun until the operation is complete.  Once programming begins, the device ignores reset commands until the operation is complete.  The reset command may be written between the cycles in a program command sequence before programming begins (prior to the third cycle). This resets the bank to which the system was writing to the read mode.  If the program command sequence is written to a bank that is in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode.  The reset command may be also written during an Autoselect command sequence.  If a bank has entered the Autoselect mode while in the Erase Suspend mode, writing the reset command returns that bank to the erase-suspend-read mode.  If DQ1 goes high during a Write Buffer Programming operation, the system must write the “Write to Buffer Abort Reset” command sequence to RESET the device to reading array data. The standard RESET command does not work during this condition. Table 7.25 Reset (LLD Function = lld_ResetCmd) Cycle Operation Byte Address Word Address Data Reset Command Write Base + xxxh Base + xxxh 00F0h

Document Number: 002-00755 Rev. *F Page 48 of 81 S29WS064R ADVANCE 8. Advanced Sector Pr otection/Unprotection The Advanced Sector Protection/Unprotection feature disables or enables programming or erase operations in any or all sectors and can be implemented through software and/or hardware methods, which are independent of each other. This section describes the various methods of protecting data stored in the memory array. An overview of these methods in shown in Figure 8.1. Figure 8.1 Advanced Sector Protection/Unprotection

8.1 Lock Register

The Lock Register consists of one bit. This bit is non-volatile and read-only. DQ15-DQ1 are reserved and are undefined. Note: 1. When the device lock register is programmed, all DYBs revert to the power-on default state. Table 8.1 Lock Register Device DQ15-01 DQ0 S29WS064R Undefined Secured Silicon Sector Protection Bit Hardware Methods Software Methods ACC = VIL (All sectors locked) Memory Array Sector 0 Sector 1 Sector 2 Sector N-2 Sector N-1 Sector N1 DYB 0 DYB 1 DYB 2 DYB N-2 DYB N-1 DYB N Dynamic Protection Bit (DYB)2 2. 0 = Sector Protected, 1 = Sector Unprotected. 1. N = Highest Address Sector.

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8.2 Dynamic Protection Bits

Dynamic Protection Bits ar e volatile and unique for each sector and can be indivi dually modified. By issuing the DYB Set or Cle ar command sequences, the DYBs are set (programmed to “0”) or cleared (erased to “1”), thus placing each sector in the protected or unprotected state respectively. T hese states are the so-called Dy namic Locked or Unlocked states due to the fact that they can switch back and forth between the protected and unprotected stat es. This feature allows software to easily protect sectors agai nst inadvertent changes yet does not prevent the easy removal of protection when changes are needed. Notes 1. The DYBs can be set (programmed to “0”) or cleared (erased to “1”) as often as needed. 2. When the parts are first shipped, upon power up or reset, t he DYBs are set (erased to “1”) by default, putting the sectors in the unprotected state. 3. The DYB Set or Clear commands for the dynamic sectors signify protected or unprotected state of the sectors respectively.

8.3 Hardware Data Protection Methods

The device offers one type of data protection at the sector level:  When ACC is at VIL, all sectors are locked. There are additional methods by which intended or accidental eras ure of any sectors can be prev ented via hardware means. The following subsections describe these methods:

8.3.1 ACC Method

If the system asserts VIL on the ACC input pin, all program and erase functions are disabled and hence all sectors are protected.

8.3.2 Low VCC Write Inhibit

When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets to reading array data. Subsequent writes are ignored until V CC is greater than V LKO. The system must provide the proper signals to the control inputs to prevent unintentional writes when VCC is greater than VLKO.

8.3.3 Write Pulse “Glitch Protection”

Noise pulses of less than 3 ns (typical) on OE#, CE# or WE# do not initiate a write cycle.

8.3.4 Power-Up Write Inhibit

If WE# = CE# = RESET# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to the read mode on power-up. 9. Power Conservation Modes

9.1 Standby Mode

When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE # and RESET# inputs are both held at V CC ± 0.2 V. The device requires standard access time (t CE) for read access, before it is ready to read data. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. I CC3 in Section 11.6, DC Characteristics on page 56 represents the standby current specification

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9.2 Automatic Sleep Mode

The automatic sleep mode minimize s Flash device energy consumpt ion while in asynchronous mode. The device automatically enables this mode when addresses remain stable for tACC + 20 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. While in sync hronous mode, the automatic sleep mode is disabled. Note that a new burst operation is required to provide new data. ICC6 in DC Characteristics (CMOS Compatible) represents the automatic sleep mode current specification.

9.3 Hardware RESET# Input Operation

The RESET# input provides a hardware meth od of resetting the device to reading array data. When RESET# is driven low for at least a period of t RP, the device immediately terminates any operation in prog ress, tristates all outputs, resets the configuration register, and ignores all read/wri te commands for t he duration of the R ESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept anot her command sequence to ensure data integrity. When RESET# is held at VSS ± 0.2V, the device draws CMOS standby current (ICC4). If RESET# is held at VIL but not within VSS ± 0.2V, the standby current is greater. RESET# may be tied to the system reset circuitry and thus, a system reset would also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.

9.4 Output Disable (OE#)

When the OE# input is at VIH, output from the device is disabled. The outputs are placed in the high impedance state. 10. Secured Silicon Sector Flash Memory Region The Secured Silicon Sector provides an extra Flash memory region that enables permanent part identification through an Electronic Serial Number (ESN). The Secured Silicon Sector is 256 words in length that consists of 128 words for factory data and 128 word s for customer-secured areas. All Secured Silicon reads outside of the 256-word address range returns invalid data. The Factory Indicator Bit, DQ7, (at Autoselect address 03h) is used to indicate whether or not the Factory Secured Silicon Sector is locked when shipped from the factory. The Customer Indicator Bit (DQ6) is used to indicate whether or not the Customer Secured Silicon Sector is locked when shipped from the factory. Please note the following general conditions:  While Secured Silicon Sector access is enabled, simultaneous operations are allowed except for Bank 0.  On power-up, or following a hardware reset, the device reverts to sending commands to the normal address space.  Reads can be performed in the Asynchronous or Synchronous mode.  Burst mode reads within Secured Silicon Sector wrap from address FFh back to address 00h.  Reads outside of sector 0 return memory array data.  Continuous burst read past the maximum address is undefined.  Sector 0 is remapped from memory array to Secured Silicon Sector array.  Once the Secured Silicon Sector Entry Command is issued, the Secured Silicon Sector Exit command must be issued to exit Secured Silicon Sector Mode.  The Secured Silicon Sector is not accessible when the device is executing an Embedded Program or Embedded Erase algorithm.

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10.1 Factory Secured Silicon Sector

The Factory Secured Silicon Sector is always protected when sh ipped from the factory and has the Factory Indicator Bit (DQ7) permanently set to a “1”. This prevents cloning of a factory locked part and ensures the security of the ESN and customer code once the product is shipped to the field. The Factory Secured Silicon Sector is unprogrammed by default. The device is available pre programmed with one of the following:  A random, 8 Word secure ESN only within the Factory Secured Silicon Sector.  Customer code within the Customer Secured Silicon Sector through the Spansion programming service.  Both a random, secure ESN and customer code through the Spansion programming service. Customers may opt to have their code programmed throug h the Spansion programming se rvices. Spansion programs the customer's code, with or without the random ESN. The devices are then shipped from the Spansion factory with the Factory Secured Silicon Sector and Customer Secured Silicon Sector permanently locked. Contact your local representative for details on using Spansion programming services.

10.2 Customer Secured Silicon Sector

The Customer Secured Silicon Sector is typically shipped unprotected (DQ6 set to “0”), allowing customers to utilize that sector in any manner they choose. If the security feature is not required, the Customer Secured Silicon Sector can be treated as an additional Flash memory space. Please note the following:  Once the Customer Secured Silicon Sector area is protected, the Customer Indicator Bit is permanently set to “1.”  The Customer Secured Silicon Sector can be read any number of times, but can be programmed and locked only once. The Customer Secured Silicon Sector lock must be used with caution as once locked, there is no procedure available for unlocking the Customer Secured Silicon Sector area and none of the bits in the Customer Secured Silicon Sector memory space can be modified in any way.  The accelerated programming (ACC) function is not available when programming the Customer Secured Silicon Sector, but reading in Banks 1 through 3 is available.  Once the Customer Secured Silicon Sector is locked and verified, the system must write the Exit Secured Silicon Sector Region command sequence which returns the device to the memory array at sector 0.

10.3 Secured Silicon Sector En try/Exit Command Sequences

The system can access the Secured Silicon Sector region by issuing the three-cycle Enter Secured Silicon Sector command sequence. The device continues to access the Secured Sili con Sector region unti l the system issues the four-cycle Exit Secured Silicon Sector command sequence. See Table 12.1, Memory Array Commands on page 74 for address and data requirements for both command sequences. The Secured Silicon Sector Entry Command allows the following commands to be executed:  Read customer and factory Secured Silicon areas  Program the customer Secured Silicon Sector After the system has written the Enter Secured Silicon Sector command sequence, it may read the Secured Silicon Sector by using the addresses normally occupied by sector SA0 within the memory array. This mode of operation continues until the system issues the Exit Secured Silicon Sector command sequence, or until power is removed from the device. Table 10.1 Secured Silicon Sector Addresses Sector Sector Size Address Range Customer 128 words 000080h-0000FFh Factory 128 words 000000h-00007Fh

Document Number: 002-00755 Rev. *F Page 52 of 81 S29WS064R ADVANCE Software Functions and Sample Code The following is a C source code example of using the Secured Si licon Sector Entry, Program, an d Exit commands. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com ) for general information on Spansion Flash memory software development guidelines. Note: 1. Base = Base Address. /* Example: SecSi Sector Entry Command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x0088; /* write Secsi Sector Entry Cmd */ Note: 1. Base = Base Address. /* Example: SecSi Sector Program Command */ *( (UINT16 *)base_addr + 0x000 ) = 0x00A0; /* write program setup command */ *( (UINT16 *)pa ) = data; /* write data to be programmed */ Note: 1. Base = Base Address. /* Example: SecSi Sector Exit Command */ *( (UINT16 *)base_addr + 0x555 ) = 0x00AA; /* write unlock cycle 1 */ *( (UINT16 *)base_addr + 0x2AA ) = 0x0055; /* write unlock cycle 2 */ *( (UINT16 *)base_addr + 0x555 ) = 0x0090; /* write SecSi Sector Exit cycle 3 */ *( (UINT16 *)base_addr + 0x000 ) = 0x0000; /* write SecSi Sector Exit cycle 4 */ Table 10.2 Secured Silicon Sector Entry (LLD Function = lld_SecSiSectorEntryCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Entry Cycle Write Base + AAAh Base + 555h 0088h Table 10.3 Secured Silicon Sector Program (LLD Function = lld_ProgramCmd) Cycle Operation Byte Address Word Address Data Program Setup Write XXXh XXXh 00A0h Program Write Word Address Word Address Data Word Table 10.4 Secured Silicon Sector Exit (LLD Function = lld_SecSiSectorExitCmd) Cycle Operation Byte Address Word Address Data Unlock Cycle 1 Write Base + AAAh Base + 555h 00AAh Unlock Cycle 2 Write Base + 554h Base + 2AAh 0055h Exit Cycle Write Base + AAAh Base + 555h 0090h

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11.1 Absolute Maximum Ratings

voltage on pin ACC is +9.5V, which may overshoot to 10.5V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one seco nd. 4. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. Figure 11.1 Maximum Negative Overshoot Waveform Figure 11.2 Maximum Positive Overshoot Waveform

11.2 Operating Ranges

1. Operating ranges define those limits between which the functionality of the device is guaranteed. 2. Industrial Temperature Range (-40°C to +85°C) is also availabl e. For device specification differences, please refer to the Specification Supplement with Publication Number S29WS064R_SP . Description Rating Storage Temperature, Plastic Packages –65°C to +150°C Ambient Temperature with Power Applied –65°C to +125°C Voltage with Respect to Ground: All Inputs and I/Os except as noted below (Note 1) –0.5V to VCC + 0.5V VCC (Note 1) –0.5V to +2.5V VIO –0.5V to +2.5V ACC (Note 2) –0.5V to +9.5V Output Short Circuit Current (Note 3) 100 mA Specifications Range Ambient Temperature (TA), Wireless (W) Device –25°C to +85°C Ambient Temperature (TA), during Accelerated Program/Erase +20°C to +40°C Supply Voltages VCC +1.70V to +1.95V VIO +1.70V to +1.95V 20 ns 20 ns +0.8 V –0.5 V 20 ns –2.0 V 20 ns 20 ns VCC +2.0 V VCC +0.5 V 20 ns1.0 V

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11.3 Test Conditions

Figure 11.3 Test Setup

11.4 Key to Switching Waveforms

Figure 11.4 Input Waveforms and Measurement Levels Table 11.1 Test Specifications Test Condition All Speed Options Unit Output Load Capacitance, CL (including jig capacitance) 30 pF Input Rise and Fall Times 3.0 @ 66 MHz 2.5 @ 83 MHz 1.85 @ 108 MHz ns Input Pulse Levels 0.0-V IO V Input timing measurement reference levels V IO/2 V Output timing measurement reference levels V IO/2 V Waveform Inputs Outputs Steady Changing from H to L Changing from L to H Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High-Z) Device Under Test CL VIO 0.0 V OutputMeasurement LevelInput VIO/2 V IO/2ll Inputs and Outputs

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11.5 V CC Power Up

1. RESET# must be high after V CC and VIO are higher than VCC minimum. 2. V CC  VIO – 200 mV during power-up. 3. V CC and VIO ramp rate could be non-linear. 4. V CC and VIO are recommended to be ramped up simultaneously. 5. All V CC signals must be ramped simultaneously to ensure correct power-up. 6. V CC ramp rate is > 1V/ 100 µs and for VCC ramp rate of < 1 V /100 µs a hardware reset is required. Figure 11.5 VCC Power-up Diagram Table 11.2 VCC Power-up Parameter Description Test Setup Speed Unit tVCS VCC Setup Time Min 300 µs tVIOS VIO Setup Time Min 300 µs tRH Time between RESET# (high) and CE# (low) Min 200 ns tRP RESET# Pulse Width Min 50 ns tRPH RESET# Low to CE# Low Min 10 µs VCC VIO RESET# tVCS tVIOS tRH CE# VCC min VIO min VIH tRP tRPH

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11.6 DC Characteristics

11.6.1 CMOS Compatible

1. Maximum I CC specifications are tested with VCC = VCCmax. 2. CE# must be set high when measuring the RDY pin. 3. The I CC current listed is typically less than 3.5 mA/MHz, with OE# at VIH. 4. I CC active while Embedded Erase or Embedded Program is in progress. 5. Device enters automatic sleep mode when addresses are stable for t ACC + 20 ns. Typical sleep mode current is equal to ICC3. 6. V IH = VCC ± 0.2V and VIL > –0.1V. 7. Total current during accelerated programming is the sum of V ACC and VCC currents. Parameter Description Test Conditions (Note 1) Min Typ Max Unit ILI Input Load Current V IN = VSS to VCC, VCC = VCCmax ±1 µA ILO Output Leakage Current (1) VOUT = VSS to VCC, VCC = VCCmax ±1 µA ICCB VCC Active burst Read Current CE# = VIL, OE# = VIH, WE# = VIH, burst length = 8

66 MHz 31 34 mA

83 MHz 35 38 mA

108 MHz 39 44 mA

CE# = VIL, OE# = VIH, WE# = VIH, burst length = 16

66 MHz 24 26 mA

83 MHz 28 30 mA

108 MHz 32 36 mA

CE# = VIL, OE# = VIH, WE# = VIH, burst length = Continuous Read Current (3) CE# = VIL, OE# = VIH, WE# = VIH

10 MHz 40 80 mA

5 MHz 20 40 mA

1 MHz 10 20 mA

(4) CE# = VIL, OE# = VIH, ACC = VIH ACC 1 5 µA VCC 30 40 mA ICC3 VCC Standby Current (5) (6) CE# = RESET# = VCC ± 0.2V ACC 1 5 µA VCC 40 70 µA ICC4 VCC Reset Current (6) RESET# = VIL, CLK = VIL 150 250 µA ICC5 VCC Active Current (Read While Write) (6) CE# = VIL, OE# = VIH, ACC = VIH Asynchronous

5 MHz 50 60 mA

66 MHz 61 66 mA

83 MHz 65 70 mA

108 MHz 71 76 mA

ICC6 VCC Sleep Current (6) CE# = VIL, OE# = VIH 40 70 µA ICC7 VCC Page Mode Read Current OE# = V IH, CE# = VIL 10 15 mA IACC Accelerated Program Current (7) CE# = VIL, OE# = VIH, ACC = 9.5V ACC 6 20 mA VCC 14 20 mA VIL Input Low Voltage V CC = 1.8V –0.5 0.4 V VIH Input High Voltage V CC = 1.8V V CC – 0.4 V CC + 0.4 V VOL Output Low Voltage I OL = 100 µA, VCC = VCC min 0.1 V VOH Output High Voltage I OH = –100 µA, VCC = VCC min VIO – 0.1 V VHH Voltage for Accelerated Program 8.5 9.5 V VLKO Low VCC Lock-out Voltage 1.0 1.1 V

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11.7 AC Characteristics

11.7.1 CLK Characterization

Note: 1. Not 100% tested. Figure 11.6 CLK Characterization

11.7.2 Synchronous/Burst Read

Notes: 1. Addresses are latched on the first rising edge of CLK. Table 11.3 CLK Characterization Parameter Description 66 MHz 83 MHz 108 MHz Unit fCLK CLK Frequency Max 66 83 108 MHz tCLK CLK Period Min 15.1 12.0 9.26 ns tCH CLK High Time Min 0.4 t CLK 0.4 tCLK 0.4 tCLK ns tCL CLK Low Time tCR CLK Rise Time Max 3 2.5 1.85 ns tCF CLK Fall Time Table 11.4 Synchronous/Burst Read Parameter Description 66 MHz 83 MHz 108 MHz Unit JEDEC Standard tIACC Latency Max 80 ns tBACC Burst Access Time Valid Clock to Output Delay Max 11.2 9 7.6 ns tACS Address Setup Time to CLK (Note 1) Min 4 4 ns tACH Address Hold Time from CLK (Note 1) Min 6 6 ns tBDH Data Hold Time from Next Clock Cycle Min 3 2 ns tCR Chip Enable to RDY Valid Max 11.2 9 7.6 ns tOE Output Enable to RDY Low Max 11.2 ns tCEZ Chip Enable to High-Z (Note 2) Max 10 ns tOEZ Output Enable to High-Z (Note 2) Max 10 ns tCES CE# Setup Time to CLK Min 4 4 ns tRDYS RDY Setup Time to CLK Min 4 3.5 1.66 ns tRACC Ready Access Time from CLK Max 11.2 9 7.6 ns tAVDS AVD# Low to CLK Min 4 ns tAVDP AVD# Pulse Min 7 ns tAVDH AVD# Hold Min 3 ns fCLK Minimum clock frequency Min 1 1 1 MHz tCLK tCLtCH tCR tCFCLK

Document Number: 002-00755 Rev. *F Page 58 of 81 S29WS064R ADVANCE 2. Not 100% tested. Figure 11.7 CLK Synchronous Burst Mode Read Notes: 1. Figure shows total number of wait states set to five cycles. The total number of wait states can be programmed from two cycles to seven cycles. Table 11.5 Synchronous Wait State Requirements Wait State Frequency Setting (MHz) 3 27 4 40 5 54 6 66 7 80 8 95 9 108 Da Da + 1 Da + n OE# Data (n) Addresses Aa AVD# RDY (n) CLK CE# tCES tACS tAVDS tAVDP tACH tOE tRACC tOEZ tCEZ tIACC tBDH 5 cycles for initial access shown. 18.5 ns typ. (54 MHz) High-Z High-Z High-Z 1 2 34 56 7 tRDYS tBACC Da + 3Da + 2 Da Da + 1 Da + n Data (n + 1) RDY (n + 1) High-Z High-Z High-Z Da + 2Da + 2 Da Da + 1 Da + n Data (n + 2) RDY (n + 2) High-Z High-Z High-Z Da + 1Da + 1 Da Da Da + n Data (n + 3) RDY (n + 3) High-Z High-Z High-Z DaDa tCR tAVDH

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11.7.3 AC Characteristics-Asynchronous Read

Notes: 1. Not 100% tested. Figure 11.10 Asynchronous Mode Read Notes: RA = Read Address, RD = Read Data. Table 11.6 AC Characteristics-Asynchronous Read Parameter Description 66 MHz 83 MHz 108 MHz Unit JEDEC Standard tCE Access Time from CE# Low Max 80 ns tACC Asynchronous Access Time Max 80 ns tAVDP AVD# Low Time Min 8 ns tAAVDS Address Setup Time to Rising Edge of AVD# Min 4 ns tAAVDH Address Hold Time from Rising Edge of AVD# Min 6 ns tOE Output Enable to Output Valid Max 18 ns tOEH Output Enable Hold Time Read Min 0 ns Toggle and Data# Polling Min 10 ns tOEZ Output Enable to High-Z (Note 1) Max 10 ns tCAS CE# Setup Time to AVD# Min 0 ns tPACC Page Access Time Max 20 ns tOH Output Hold Time From Addresses, CE# or OE#, whichever occurs first Min 0 ns tCR Chip Enable to RDY Valid Max 10 ns tCEZ CE# disable to Output High-Z Max 10 ns tWEA WE# Disable to AVD# Min 9.6 ns tCE WE# Addresses CE# OE# Valid RD tACC tOEH tOE Data tOEZ tAAVDH tAVDP tAAVDS AVD# RA tCAS tWEA

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11.7.4 Hardware Reset (RESET#)

Note: Not 100% tested. Figure 11.13 Reset Timings Parameter Description All Speed Options UnitJEDEC Std. tRP RESET# Pulse Width Min 50 ns tRH Reset High Time Before Read (See Note) Min 200 ns tRPH RESET# Low to CE# Low Min 10 µs RESET# tRP tRPH CE#, OE# tRH

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11.7.5 Erase/Program Timing

Notes: 1. Not 100% tested. 2. Asynchronous read mode allows Asynchronous program operation onl y. Synchronous read mode allows both Asynchronous and Synchronous program operation. 3. In asynchronous program operation timing, addresses are latched on the rising edge of AVD# or WE#. In synchronous program ope ration timing, addresses are latched on the rising edge of CLK. 4. See Section 11.7.6, Erase and Programming Performance on page 73 for more information. 5. Does not include the preprogramming time. Parameter Description 66 MHz 83 MHz 108 MHz UnitJEDEC Standard tAVAV tWC Write Cycle Time (1) Min 60 ns tAVWL tAS Address Setup Time (2) (3) Synchronous Min 4n s Asynchronous 4 ns tWLAX tAH Address Hold Time (2) (3) Synchronous Min 3.5 ns Asynchronous 3.5 tAVDP AVD# Low Time Min 6 ns tDVWH tDS Data Setup Time Min 20 ns tWHDX tDH Data Hold Time Min 0 ns tGHWL tGHWL Read Recovery Time Before Write Min 0 ns tCAS CE# Setup Time to AVD# Min 0 ns tWHEH tCH CE# Hold Time Min 0 ns tWLWH tWP Write Pulse Width Min 25 ns tWHWL tWPH Write Pulse Width High Min 20 ns tSR/W Latency Between Read and Write Operations Min 0 ns tCR Chip Enable to RDY Valid Max 10 ns tCEZ CE# disable to Output High-Z Max 10 ns tVID VACC Rise and Fall Time Min 500 ns tVIDS VACC Setup Time (During Accelerated Programming) Min 1 µs tELWL tCS CE# Setup Time to WE# Min 4 ns tAVSC AVD# Setup Time to CLK Min 5 ns tAVHC AVD# Hold Time to CLK Min 5 ns tCSW Clock Setup Time to WE# Min 5 ns tWEP Noise Pulse Margin on WE# Max 3 ns tESL Erase Suspend Latency Max 30 µs tPSL Program Suspend Latency Max 30 µs tASP Toggle Time During Erase within a Protected Sector Typ 20 µs tPSP Toggle Time During Programming Within a Protected Sector Typ 20 µs

Document Number: 002-00755 Rev. *F Page 64 of 81 S29WS064R ADVANCE Figure 11.14 Chip/Sector Erase Operation Timings Note: 1. Addresses latched by rising edge of AVD#. OE# CE# Data Addresses AVD# WE# CLK VCC tAS tWP tAH tWC tWPH SA tVCS tCS tDH tCH In Progress VA Complete VA Erase Command Sequence (last two cycles) Read Status Data tDS 10h for chip erase 555h for chip erase VIH VIL tAVDP 55h 2AAh 30h

Document Number: 002-00755 Rev. *F Page 65 of 81 S29WS064R ADVANCE Figure 11.15 Program Operation Timing Using AVD# Notes: 1. PA = Program Address, PD = Program Data, VA = Valid Address for reading status bits. 2. “In progress” and “complete” refer to status of program operation. 3. A21–A14 are don’t care during command sequence unlock cycles. 4. CLK can be either V IL or VIH. 5. The Asynchronous programming operation is independent of the Set Device Read Mode bit in the Configuration Register. 6. Addresses latched by rising edge of AVD#. OE# CE# Data Addresses AVD# WE# CLK VCC 555h PD tAS tAH tWC tWPH PA tVCS tWP tDH tCH In Progress VA Complete VA Program Command Sequence (last two cycles) Read Status Data tDS VIH VIL tAVDP A0h tCS tCAS

Document Number: 002-00755 Rev. *F Page 66 of 81 S29WS064R ADVANCE Figure 11.16 Asynchronous Program Operation (AVD# Tied to CE#) Notes: 1. VA = Valid Read Address, WD = Write Data. 2. Addresses and data latched by rising edge of WE#. CLK CE# WE# OE# Amax-A0 tCS DQ15-DQ0 WD tDS RDY VA WD tCH tWP tWPH tWC tDH VA tAH High-Z High-Z AVD# tCR tCEZ VIL or VIH tAS

Document Number: 002-00755 Rev. *F Page 70 of 81 S29WS064R ADVANCE Figure 11.26 Latency with Boundary Crossing Notes: 1. RDY(1) active with data (CR8 = 1 in the Configuration Register). 2. RDY(2) active one clock cycle before data (CR8 = 0 in the Configuration Register). 3. Cxx indicates the clock that triggers Dxx on the outputs; for example, C60 triggers D60. 4. Figure shows the device not crossing a bank in the process of performing an erase or program. CLK Address (hex) C124 C125 C126 C127 C127 C128 C129 C130 C131 D124 D125 D126 D127 D128 D129 D130 (stays high)AVD# RDY(1) Data OE#, CE# (stays low) Address boundary occurs every 128 words, beginning at address 00007Fh: (0000FFh, 00017Fh, etc.) Address 000000h is also a boundary crossing. 7C 7D 7E 7F 7F 80 81 82 83 latency RDY(2) latency tRACC tRACC tRACCtRACC

Document Number: 002-00755 Rev. *F Page 71 of 81 S29WS064R ADVANCE Figure 11.27 Latency with Boundary Crossing into Program/Erase Bank Notes: 1. RDY(1) active with data (CR8 = 1 in the Configuration Register). 2. RDY(2) active one clock cycle before data (CR8 = 0 in the Configuration Register). 3. Cxx indicates the clock that triggers Dxx on the outputs; for example, C60 triggers D60. 4. Figure shows the device crossing a bank in t he process of performing an erase or program. CLK Address (hex) C124 C125 C126 C127 C127 D124 D125 D126 D127 Read Status (stays high)AVD# RDY(1) Data OE#, CE# (stays low) Address boundary occurs every 128 words, beginning at address 00007Fh: (0000FFh, 00017Fh, etc.) Address 000000h is also a boundary crossing. 7C 7D 7E 7F 7F latency RDY(2) latency tRACC tRACC tRACC tRACC

Document Number: 002-00755 Rev. *F Page 72 of 81 S29WS064R ADVANCE Figure 11.28 Back-to-Back Read/Write Cycle Timings Note: Breakpoints in waveforms indicate that system may alternately read array data from the “non-busy bank” while checking the status of the program or erase operation in the “busy” bank. The system should read status twice to ensure valid information. OE# CE# WE# tOEH Data Addresses AVD# PD/30h AAh RAPA/SA tDS tDH tOE tAS tAH tACC tOEH tWP tGHWL tOEZ tWrite Cycle tSR/W Last Cycle in Program or Sector Erase Command Sequence Read status (at least two cycles) in same bank and/or array data from other bank Begin another write or program command sequence RD RA 555h RD tWPH tWrite Cycle tRead Cycle tRead Cycle

Document Number: 002-00755 Rev. *F Page 73 of 81 S29WS064R ADVANCE

11.7.6 Erase and Programming Performance

Note: 1. Typical program and erase times assume the following conditions: 25°C, 1.8V V CC, 10,000 cycles; checkerboard data pattern. 2. Under worst case conditions of -25°C, V CC = 1.70V, 100,000 cycles. 3. Typical chip programming time is considerably less than the maxi mum chip programming time listed, and is based on utilizing the Write Buffer. 4. In the pre-programming step of the Embedded Erase algorithm, all words are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Section 12., Appendix on page 74 for further information on command definitions. 6. Word programming specification is based upon a single wo rd programming operation not utilizing the write buffer.

11.7.7 BGA Ball Capacitance

Notes: 1. Sampled, not 100% tested. 2. Test conditions T A = 25°C; f = 1.0 MHz. Parameter Typ (Note 1) Max (Note 2) Unit Comments Sector Erase Time 32 kword 0.8 3.5 s Excludes 00h programming prior to erasure (Note 4) 8 kword 0.35 2 Chip Erase Time VCC 103 453 ACC 103 453 Single Word Programming Time (Note 6) VCC 170 800 µs Effective 32-Word Buffer Programming Time VCC 14.1 94 ACC 9 60 Total 32-Word Buffer Programming Time VCC 450 3000 ACC 288 1920 Chip Programming Time (Note 3) VCC 59 78.6 s Excludes system level overhead (Note 5)ACC 38 52 Parameter Symbol Parameter Description Test Setup Typ. Max Unit CIN Input Capacitance V IN = 0 5.3 6.3 pF COUT Output Capacitance V OUT = 0 5.8 6.8 pF CIN2 Control Pin Capacitance V IN = 0 6.3 7.3 pF

Document Number: 002-00755 Rev. *F Page 74 of 81 S29WS064R ADVANCE 12. Appendix Legend: X = Don’t care. RA = Read Address. RD = Read Data. PA = Program Address. Addresses latch on the rising edge of the AVD# pulse or active edge of CLK, whichever occurs first. PD = Program Data. Data latches on the rising edge of WE# or CE# pulse, whichever occurs first. SA = Sector Address: WS064R = A21–A13. BA = Bank Address: WS064R = A21–A20. CR = Configuration Register data bits D15–D0. WBL = Write Buffer Location. Address must be within the same write buffer page as PA. WC = Word Count. Number of write buffer locations to load minus 1. Notes: 1. See Table 7.1 on page 21 for description of bus operations. 2. All values are in hexadecimal. 3. Shaded cells indicate read cycles. 4. Address and data bits not specified in table, legend, or notes are don’t cares (each hex digit implies 4 bits of data). 5. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. The system must write the reset command to return the device to reading array data. 6. No unlock or command cycles required when bank is reading array data. 7. Reset command is required to return to reading array data (or to the erase-suspend-read mode if previously in Erase Suspend) when a bank is in the autoselect mode, or if DQ5 goes high (while the bank is providing status information) or performing sector lock/unlock. 8. The system must provide the bank address. See See Autoselect on page 28. for more information. 9. Data in cycle 5 is 004F for Top Boot devices and 0057 for Bottom Boot devices. 10. See Table 7.12 on page 28 for indicator bit values. 11. Total number of cycles in the command sequence is determined by the number of words written to the write buffer. 12. Command sequence resets device for next command after write-to-buffer operation. 13. System may read and program in non-erasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation, and requires the bank address. Table 12.1 Memory Array Commands Command Sequence (Notes) Cycles Bus Cycles (1), (2), (3), (4), (5) First Second Third Fourth Fifth Sixth Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Asynchronous Read (6) 1 RA RD Reset (7) 1X X X F 0 Auto- select(8) Manufacturer ID 4 555 AA 2AA 55 [BA]555 90 [BA]X00 0001 Device ID (9) 6 555 AA 2AA 55 [BA]555 90 [BA]X01 007E BA+X0E Data BA+X0F 0000 Indicator Bits (10) 4 555 AA 2AA 55 [BA]555 90 [BA]X07 Data Program 4 555 AA 2AA 55 555 A0 PA PD Write to Buffer (11) 6 555 AA 2AA 55 PA 25 PA WC PA PD WBL PD Program Buffer to Flash 1 SA 29 Write to Buffer Abort Reset (12) 3 555 AA 2AA 55 555 F0 Chip Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 Sector Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30 Erase/Program Suspend (13) 1B A B 0 Erase/Program Resume (14) 1B A 3 0 Set Configuration Register (17) 4 555 AA 2AA 55 555 D0 X00 CR Read Configuration Register 4 555 AA 2AA 55 555 C6 X00 CR CFI Query (15) 15 5 9 8 Secured Silicon Sector Entry 3 555 AA 2AA 55 555 88 Program (16) 4X X A 0P A P D Read (16) 1 RA Data Exit (16) 4 555 AA 2AA 55 555 90 XXX 00

Document Number: 002-00755 Rev. *F Page 75 of 81 S29WS064R ADVANCE 14. Erase Resume command is valid only during the Erase Suspend mode, and requires the bank address. 15. Command is valid when device is ready to read array data or when device is in autoselect mode. 16. Requires Entry command sequence prior to execution. Secured Silicon Sector Exit Reset command is required to exit this mode; device may otherwise be placed in an unknown state. 17. Requires reset command to configure the Configuration Register. Legend: X = Don’t care. RA = Address of the memory location to be read. SA = Sector Address. BA = Bank Address. RD(0) = DQ0 protection indicator bit. If protected, DQ0 = 0. If unprotected, DQ0 = 1. Notes: 1. All values are in hexadecimal. 2. Shaded cells indicate read cycles. 3. Address and data bits not specified in table, legend, or notes are don’t cares (each hex digit implies 4 bits of data). 4. Writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. The system must write the reset command to return the device to reading array data. 5. Entry commands are required to enter a specific mode to enable instructions only available within that mode. 6. Exit command must be issued to reset the device into read mode; device may otherwise be placed in an unknown state.

12.1 Common Flash Memory Interface

The Common Flash Interface (CFI) specific ation outlines device and host system software interrogation handshake, which allows specific vendor-specified soft-ware algorithms to be used for en tire families of devices. Software support can then be device- independent, JEDEC ID-independent, and forward- and back-ward-compatible for the specified flash device families. Flash vendors can standardize their existing interfaces for long-term compatibility. This device enters the CFI Query mode when the system writes the CFI Query command, 98h, to address 55h any time the device is ready to read array data. The system can read CFI information at the addresses given in Table 12.3 through Table 12.6 within that bank. All reads outside of the CFI address range, within the ba nk, returns non-valid data. Reads from other banks are allowed, writes are not. To terminate reading CFI data, the system must write the reset command. The following is a C source code example of using the CFI Entry and Exit functions. Refer to the Spansion Low Level Driver User's Guide (available on www.spansion.com) for general information on Spansion Flash memory software development guidelines. /* Example: CFI Entry command */ *( (UINT16 *)bank_addr + 0x55 ) = 0x0098; /* write CFI entry command */ /* Example: CFI Exit command */ *( (UINT16 *)bank_addr + 0x000 ) = 0x00F0; /* write CFI exit command */ Table 12.2 Sector Protection Commands Command Sequence (Notes) Cycles Bus Cycles (1), (2), (3), (4) First Second Third Fourth Fifth Sixth Seventh Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Addr Data Lock Register Bits Command Set Entry (5) 3 555 AA 2AA 55 555 40 Program 2 XX A0 00 data Read 1 00 data Command Set Exit (6) 2X X 9 0 X X 0 0 Volatile Sector Protection (DYB) Command Set Entry (5) 3 555 AA 2AA 55 [BA]555 E0 DYB Set 2 XX A0 SA 00 DYB Clear 2 XX A0 SA 01 DYB Status Read 1 SA RD(0) Command Set Exit (6) 2X X 9 0 X X 0 0

Document Number: 002-00755 Rev. *F Page 76 of 81 S29WS064R ADVANCE For further information, please refer to the CFI Specification (see JEDEC publications JEP137-A and JESD68.01and CFI Publication 100). Please contact your sales office for copies of these documents. Table 12.3 ID/CFI Data Addresses Data Description Device Identification (SA) + 00h 0001h Spansion Manufacturer ID (SA) + 01h 007Eh Device ID, Word 1 Extended ID address code. Indicates an extended two byte device ID is located at byte address 1Ch and 1Eh. (SA) + 02h 0001h (Locked) / 0000h (Unlocked) Sector Protect Verify (SA) + 03h 0000h Reserved (SA) + 04h 00FFh Reserved (SA) + 05h 00FFh Reserved (SA) + 06h 0010h ID Version (SA) + 07h 00BFh Indicator Bits DQ15 - DQ8 = Reserved DQ7 (Factory Lock Bit): 1 = Locked; 0 = Not Locked DQ6 (Customer Lock Bit): 1 = Locked; 0 = Not locked DQ5 - DQ0 = Reserved (SA) + 08h 00FFh Reserved (SA) + 09h 00FFh Reserved (SA) + 0Ah 00FFh Reserved (SA) + 0Bh 00FFh Reserved (SA) + 0Ch 00F2h Lower Software Bits Bit 0 - Status Register Support 1 = Status Register Supported 0 = Status register not Supported Bit 1 - DQ Polling Support 1 = DQ bits polling supported 0 = DQ bits polling not supported Bit 3-2 - Command Set Support 11 = Reserved 10 = Reserved 01 = Reduced Command Set 00 = Old Command Set Bit 4-F - 00Fh - Reserved (SA) + 0Dh 00FFh Upper Software Bits Reserved (SA) + 0Eh 004Fh (Top) / 0057h (Bottom) High Order Device ID, Word 2 (SA) + 0Fh 0000h Low Order Device ID, Word 3 Table 12.4 CFI Query Identification String Addresses Data Description 10h 11h 12h 0051h 0052h 0059h Query Unique ASCII string “QRY” 13h 14h 0002h 0000h Primary OEM Command Set 15h 16h 0040h 0000h Address for Primary Extended Table 17h 18h 0000h 0000h Alternate OEM Command Set (00h = none exists) 19h 1Ah 0000h 0000h Address for Alternate OEM Extended Table (00h = none exists)

Document Number: 002-00755 Rev. *F Page 77 of 81 S29WS064R ADVANCE Table 12.5 System Interface String Addresses Data Description 1Bh 0017h VCC Min. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Ch 0019h VCC Max. (write/erase) D7–D4: volt, D3–D0: 100 millivolt 1Dh 0000h V PP Min. voltage (00h = no VPP pin present). Refer to 4Dh 1Eh 0000h V PP Max. voltage (00h = no VPP pin present). Refer to 4Eh 1Fh 0008h Typical timeout per single byte/word write 2 N µs 20h 0009h Typical timeout for Min. size buffer write 2 N µs (00h = not supported) 21h 000Ah Typical timeout per individual block erase 2 N ms 22h 0011h Typical timeout for full chip erase 2 N ms (00h = not supported) 23h 0003h Max. timeout for byte/word write 2 N times typical 24h 0003h Max. timeout for buffer write 2 N times typical 25h 0003h Max. timeout per individual block erase 2 N times typical 26h 0003h Max. timeout for full chip erase 2 N times typical (00h = not supported) Table 12.6 Device Geometry Definition Addresses Data Description 27h 0017h Device Size = 2 N byte 28h 29h 0001h 0000h Flash Device Interface description 2Ah 2Bh 0006h 0000h Max. number of bytes in multi-byte write = 2 N (00h = not supported) 2Ch 0002h Number of Erase Block Regions within device Top Boot Bottom Boot 2Dh 2Eh 2Fh 30h 007Eh 0000h 0000h 0001h 0003h 0000h 0040h 0000h Erase Block Region 1 Information (refer to the CFI specification or CFI publication 100) 31h 32h 33h 34h 0003h 0000h 0040h 0000h 007Eh 0000h 0000h 0001h Erase Block Region 2 Information 35h 36h 37h 38h 00FFh 00FFh 00FFh 00FFh Erase Block Region 3 Information 39h 3Ah 3Bh 3Ch 00FFh 00FFh 00FFh 00FFh Erase Block Region 4 Information

Document Number: 002-00755 Rev. *F Page 78 of 81 S29WS064R ADVANCE Table 12.7 Primary Vendor-Specific Extended Query Addresses Data Description 40h 0050h Query-unique ASCII string “PRI”41h 0052h 42h 0049h 43h 0031h Major version number, ASCII 44h 0034h Minor version number, ASCII 45h 0020h Address Sensitive Unlock (Bits 1-0) 0 = Required, 1 = Not Required, Silicon Revision Number (Bits 7-2) 46h 0002h Erase Suspend 0 = Not Supported, 1 = To Read Only, 2 = To Read and Write 47h 0001h Sector Protect 0 = Not Supported, X = Number of sectors in per group 48h 0000h Sector Temporary Unprotect 00 = Not Supported, 01 = Supported 49h 0008h Sector Protect/Unprotect sche me 08 = Advanced Sector Protection 4Ah 0020h Simultaneous Operation 00 = Not Supported, X = Number of Sectors in all banks except boot bank 4Bh 0001h Burst Mode Type 00 = Not Supported, 01 = Supported 4Ch 0001h Page Mode 00 = Not Supported, 01 = Supported 4Dh 0085h ACC (Acceleration) Supply Minimum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV 4Eh 0095h ACC (Acceleration) Supply Maximum 00h = Not Supported, D7-D4: Volt, D3-D0: 100 mV 4Fh 0003h (top boot) Top/Bottom Boot Sector Flag 01h = Top/Middle Boot Device, 02h = Bottom Boot Device, 03h = Top Boot Device 0002h (bottom boot) 50h 0001h Program Suspend. 00h = not supported 51h 0000h Unlock Bypass 00 = Not Supported, 01 = Supported 52h 0008h Secured Silicon Sector (Customer OTP Area) Size 2 N bytes 53h 000Eh Hardware Reset Low Time-out during an embedded algorithm to read more mode Maximum 2 N ns 54h 000Eh Hardware Reset Low Time-out during an embedded algorithm to read more mode Maximum 2N ns 55h 0005h Erase Suspend Time-out Maximum 2 N ns 56h 0005h Program Suspend Time-out Maximum 2 N ns 57h 0004h Bank Organization: X = Number of banks 58h 0020h (top boot) Bank 0 Region Information. X = Number of sectors in banks 0023h (bottom boot) 59h 0020h Bank 1 Region Information. X = Number of sectors in banks 5Ah 0020h Bank 2 Region Information. X = Number of sectors in banks 5Bh 0023h (top boot) Bank 3 Region Information. X = Number of sectors in banks 0020h (bottom boot)

Document Number: 002-00755 Rev. *F Page 79 of 81 S29WS064R ADVANCE 13. Revision History Spansion Publication Number: S29WS064R Document History Page Section Description Revision 01 (April 9, 2010) Initial release. Revision 02 (August 6, 2010) Global Removed 54 MHz speed option. Distinctive Characteristics Add page mode feature. Product Overview Corrected typo in table: S29WS064R Sector and Memory Address Map (Bottom Boot). DC Characteristics: CMOS Compatible Changed values for I CCB, ICC2, and ICC5. AC Characteristics: Erase and Programming Performance Changed Typ and Max values for Single Word Programming Time. Changed Typ values for buffer and chip programming times. Synchronous/Burst Read Updated t OE description. AC Characteristics-Asynchronous Read Updated t OE value. Revision 03 (September 30, 2010) DC Characteristics CMOS Compatible table: Changed typical values for I CC3 and ICC6. Revision 04 (December 9, 2010) Global Added references to Industr ial Specification Supplement. Revision 05 (July 22, 2011) Factory Secured Silicon Sector Erase and Programming Performance Added sentence to indicate that sector is unprogrammed by default. Corrected note 2 for worst case condition temperature. Revision 06 (May 29, 2012) Appendix Memory Array Commands table: In the legend, corrected “SA = A21 - A14” to “SA = A21 - A13” Document Title: S29WS064R 64 Mbit (4M x 16-bit), 1.8 V MirrorBit® Flash Document Number: 002-00755 Rev. ECN No. Orig. of Change Submission Date Description of Change ** -- WIOB 04/09/2010 Initial release *A -- WIOB 08/06/2010 Global: Removed 54 MHz speed option. Distinctive Characteristics: Add page mode feature. Product Overview: Corrected typo in table: S29WS064R Sector and Memory Address Map (Bottom Boot). DC Characteristics: CMOS Compatible: Changed values for I CCB, ICC2, and ICC5. AC Characteristics: Erase and Programming Performance: Changed Typ and Max values for Single Word Programming Time. Changed Typ values for buffer and chip programming times. Synchronous/Burst Read: Updated tOE description. AC Characteristics-Asynchronous Read: Updated tOE value. *B -- WIOB 09/18/2010 DC Characteristics: CMOS Compatible table - Changed typical values for ICC3 and ICC6.

Document Number: 002-00755 Rev. *F Page 80 of 81 S29WS064R ADVANCE *C -- WIOB 12/09/2010 Global: Added references to Industrial Specification Supplement. *D -- WIOB 07/22/2011 Factory Secured Silicon Sector Erase and Programming Performance: Added sentence to indicate that sector is unprogrammed by default. Corrected note 2 for worst case condition temperature. *E -- WIOB 05/29/2012 Appendix: Memory Array Commands table: In the legend, corrected “SA = A21 - A14” to “SA = A21 - A13” *F 4952008 WIOB 10/08/2015 Updated to Cypress template. Document Title: S29WS064R 64 Mbit (4M x 16-bit), 1.8 V MirrorBit® Flash Document Number: 002-00755 Rev. ECN No. Orig. of Change Submission Date Description of Change

Document Number: 002-00755 Rev. *F Revised October 08, 2015 Page 81 of 81 Cypress®, Spansion®, MirrorBit®, MirrorBit® Eclipse™, ORNAND™, HyperBus™, HyperFlash™, and combinations thereof, are trademarks and registered trademarks of Cypress Semic onductor Corp. All products and company names mentioned in this document may be the trademarks of their respective holders. © Cypress Semiconductor Corporation, 2010-2015. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subj ect to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to t he materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ prod uct in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. S29WS064R ADVANCE Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products PSoC® Solutions psoc.cypress.com/solutions PSoC 1 | PSoC 3 | PSoC 4 | PSoC 5LP Cypress Developer Community Community | Forums | Blogs | Video | Training Technical Support cypress.com/go/support