OPL800 OPTEK | Alldatasheet
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Product Bulletin OPL800B of ° September 1996 =). SSS High Reliability Photologic® Hermetic Sensors Type OPL800B Fo ey NE ge bis 60 (1.73) 202 (5.13) 9 2015.00 gn See pee. ee oy O45 (1-14) “er (4.75) i 208 (5.31) \\ GY 8 «100 (2.54) » Eee Soe eg 1 (1.22) Coes D a —) yaas ae" ee a eee = eo | lie. Bie ~— 1{%4- ioe eee ale —— -_— \\s 04s (1.17) Pon aes i) ol ee « i ‘036 (0-31) bo ee ed | 2 28 (0.48) - NG ps) ee DIMENSIONS ARE IN INCHES (WILLIMETERS) Features Absolute Maximum Ratings (Ta = 25° C unless otherwise noted) © Direct TTLSTTL interface Lead Soldering Temperature [1/16 (1.6 mm) inch from case for 5 sec. with soldering 1 « Hermetic, lensed TO-18 package Lo) 240° cl) Inradiance 0.0... eee eee eee eee eee e ener eeeees SmWiem'’ Description Notes: oa. a (1) RMA flux is recommended. Duration can be extended to 10 sec. max. when wave soldering, The OPL800B is a high reliability (2) Derate linearly 2.5mW/ C above 25°C. optoelectronic microcircuit that (3) Light measurements are made with A = 935 nm. incorporates a photodiode, linear amplifier, and Schmitt trigger on a single | Schematic silicon chip. The device features TTL/STTL compatible logic level output Totem-Pole Output Buffer which can drive up to 8 TTL loads without additional interface circuitry. The (2) Veo Photologic® chip is mounted on a standard TO-18 header which is hermetically sealed in a lensed metal (Y can. These devices are mechanically C) and spectrally matched to the OP235TX/ NN TXV and 236TX/TXV infrared emitting [> I>o K diodes. All parts are processed to x Optek’s 100 percent screening program Q& (f @)out patterned after Method 5004 of i NN MIL-STD-883 and the quality conformance testing in Method 5005 for Class B devices. Typical screening and (3)@NnD lot acceoptance tests are provided on page 13-4. Light On - Output High Typical characteristic curves are shown. on the commercial OPL800 data sheet. ee Optek Technology, Inc. 1215 W. Crosby Road Carrollton, Texas 75006 (972) 323-2200 Fax (972) 323-2396 13-52
Group A Inspection-Electrical Tests (Performed on each inspection lot after all devices have been subject to the 100% processing requirements.) _ [Method] Conditions | Min | Max | ad ee Ee = 1.0 mWicm? | 52 ee |encreucumacuren | sor | Voc = 4.5 V, Ee = 1.0 mWicm?, | -20 | -100 | ma a3 Output = GND | 1 i } | toon [Supply Current, High |9008 | Voc = 5.5 V, Ee = 1.0 mWicm? —_ 15.0 | mA | toc. [Supply Current, Low 3005 |Voc = 5.5 V, Ee=0 : 15.0 mA | Vo Low Level Output Voltage 3007 |Vcc = 4.5 V, lo. = 12.8 MA, Ee =0 “040 ) vi | Vox High Level Output Voltage 3008 lvoe = 4.5 V, lox = -800 nA, | 24 v | | Ee = 1.0 mWicm* | i | | Ee = 1.0 mWiem? | | | Voc = 5.0 V, Ru = 8 TTL loads / 100 | ns | | tem [Propagation Delay, Low-High | 3003 | Veo =5.0V,RL=8TTLloads i (100 | us [tm ___[Prepesaton Dey. ightow | 2000 |vee=80 VR =8 TLoes [fioo | os | Optek reserves the right to make changes at any time in order to improve design and to supply the best product possible. Optek Technology, Inc. 1215 W. Crosby Road —_ Carrollton, Texas 75006 (972)323-2200 Fax (972)323-2396 13-53