N04L1630C2B AMI | Alldatasheet

Document overview

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Technical content

Features

  • Wide Power Supply Range 2.7 to 3.6 Volts
  • Very low standby current 1uA (Typical)
  • Very low operating current 2.0mA at 1µs (Typical)
  • Very low Page Mode operating current 0.8mA at 1µs (Typical)
  • Simple memory control Dual Chip Enables (CE1 and CE2) Byte control for independent byte operation Output Enable (OE ) for memory expansion
  • Very fast output enable access time 30ns OE Access Time 55ns Random Access Time 30ns Page Mode Access Time
  • Automatic power down to standby mode
  • TTL compatible three-state output driver
  • RoHS Compliant TSOP and BGA packages Product Family Part Number Package Type Operating Temperature Power Supply (Vcc) Speed Options Standby Current (ISB), Typical Operating Current (Icc), Typical N04L1630C2BB2 48-BGA Green -40oC to +85oC 2.7V - 3.6V 55ns 70ns 1µA 2 mA @ 1MHz N04L1630C2BT2 44-TSOP II Green

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Pin Configurations (4Mb) Pin Descriptions Pin Name Pin Function A0-A17 Address Inputs WE Write Enable Input CE1 Chip Enable 1 Input CE2 Chip Enable 2 Input OE Output Enable Input LB Lower Byte Enable Input UB Upper Byte Enable Input I/O0-I/O7 Lower Byte Data Input/Output I/O8-I/O15 Upper Byte Data Input/Output VCC Power VSS Ground NC Not Connected PIN ONE A CE1 I/O0 I/O1 I/O2 I/O3 VCC VSS I/O I/O5 I/O6 I/O7 WE A16 A15 A14 A13 A12 A OE UB LB I/O15 I/O14 I/O13 I/O12 VSS VCC I/O I/O10 I/O9 I/O8 CE2 A A10 A11 A17 TSOP II 123456 A LB OE A0 A 1 A2 CE2 B I/O8 UB A3 A 4 CE1 I/O0 C I/O9 I/O 10 A 5 A 6 I/O 1 I/O 2 D VSS I/O11 A 17 A7 I/O3 VCC E VCC I/O12 NC A16 I/O4 VSS F I/O14 I/O13 A14 A15 I/O5 I/O6 G I/O15 NC A12 A13 WE I/O7 H NC A8 A9 A10 A11 NC

48 Pin BGA (top)

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Functional Block Diagram Functional Description CE1 CE2 WE OE UB LB I/O0 - I/O15 1. When UB and LB are in select mode (low), I/O0 - I/O15 are affected as shown. When LB only is in the select mode only I/O0 - I/O7 are affected as shown. When UB is in the select mode only I/O8 - I/O15 are affected as shown. MODE POWER HXXXXX H i g h Z Standby2 2. When the device is in standby mode, control inputs (WE , OE, UB, and LB), address inputs and data input/outputs are internally isolated from any external influence and disabled from exerting any influence externally. Standby XLXXXX H i g h Z Standby2 Standby L H X X H H High Z Standby Standby LHL X3 3. When WE is invoked, the OE input is internally disabled and has no effect on the circuit. L1 L1 Data In Write3 Active LHHL L1 L1 Data Out Read Active LHHH L1 L1 High Z Active Active Capacitance1 1. These parameters are verified in device characterization and are not 100% tested Item Symbol Test Condition Min Max Unit Input Capacitance CIN VIN = 0V, f = 1 MHz, TA = 25oC 8p F I/O Capacitance CI/O VIN = 0V, f = 1 MHz, TA = 25oC 8p F Address Inputs A1 - A4 Address Inputs A0, A5 - A17 Word Address Decode Logic 16K Page x 16 word x 16 bit RAM Array Word Mux Input/ Output Mux and Buffers Page Address Decode Logic Control Logic CE1 CE2 WE OE UB LB I/O0 - I/O7 I/O8 - I/O15

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Absolute Maximum Ratings1 1. Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. Item Symbol Rating Unit Voltage on any pin relative to VSS VIN,OUT –0.3 to VCC+0.3 V Voltage on VCC Supply Relative to VSS VCC –0.3 to 4.5 V Power Dissipation PD 500 mW Storage Temperature TSTG –40 to 125 oC Operating Temperature TA -40 to +85 oC Soldering Temperature and Time TSOLDER 260oC, 10sec oC Operating Characteristics (Over Specified Temperature Range) Item Symbol Test Conditions Min. Typ1 1. Typical values are measured at Vcc=Vcc Typ., T A=25°C and not 100% tested. Max Unit Supply Voltage VCC 2.7 3.0 3.6 V Data Retention Voltage VDR Chip Disabled3 1.8 V Input High Voltage VIH 0.7Vcc VCC+0.3 V Input Low Voltage VIL –0.3 0.6 V Output High Voltage VOH IOH = -100uA V CC–0.2 V IOH = -1mA 2.4 V Output Low Voltage VOL IOL = 100uA 0.2 V IOL = 2.1mA 0.4 Input Leakage Current ILI VIN = 0 to VCC 0.5 µA Output Leakage Current ILO OE = VIH or Chip Disabled 0.5 µA Read/Write Operating Supply Current @ 1 µs Cycle Time2 2. This parameter is specified with the outp uts disabled to avoid external loading effects. The user must add current required to drive output capacitance expected in the actual system. ICC1 VCC=VCCMax, VIN=VIH or VIL Chip Enabled, IOUT = 0 2.5 3.0 mA Read/Write Operating Supply Current @ 70 ns Cycle Time2 ICC2 VCC=VCCMax, VIN=VIH or VIL Chip Enabled, IOUT = 0 10 15.0 mA Page Mode Operating Supply Current @ 70ns Cycle Time2 (Refer to Power Savings with Page Mode Operation) ICC3 VCC=VCCMax, VIN=VIH or VIL Chip Enabled, IOUT = 0 48 m A Maximum Standby Current3 3. This device assumes a standby mo de if the chip is disabled (CE1 high or CE2 low). In order to achieve low standby current all inputs must be within 0.2 volts of either VCC or VSS. ISB1 VIN = VCC or 0V Chip Disabled tA= 85oC, VCC = 3.6 V 11 0 . 0 µA Maximum Data Retention Current3 IDR Vcc = 1.8V, VIN = VCC or 0 Chip Disabled, tA= 85oC 5µ A

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Power Savings with Page Mode Operation (WE = VIH) Note: Page mode operation is a method of addressing the SRAM to save operating current. The internal organization of the SRAM is optimized to allow this unique operating mode to be used as a valuable power saving feature. The only thing that needs to be done is to address the SRAM in a manner that the internal page is left open and 16-bit words of data are read from the open page. By treating addresses A1-A4 as the least significant bits and addressing the 16 words within the open page, power is reduced to the page mode value which is considerably lower than standard operating currents for low power SRAMs. Page Address (A0, A5 - A17) LB , UB OE CE1 CE2 Word Address (A1 - A4) Open page Word 1 Word 2 Word 16...

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Timing Test Conditions Item Input Pulse Level 0.1VCC to 0.9 VCC Input Rise and Fall Time 5ns Input and Output Timing Reference Levels 0.5 VCC Output Load CL = 30pF Operating Temperature -40 to +85 oC Timing Item Symbol -55 -70 Units Min. Max. Min. Max. Read Cycle Time tRC 55 70 ns Address Access Time tAA 55 70 ns Page Mode Address Access Time tAAP 30 35 ns Chip Enable to Valid Output tCO 55 70 ns Output Enable to Valid Output tOE 30 35 ns Byte Select to Valid Output tBE 55 70 ns Chip Enable to Low-Z output tLZ 10 10 ns Output Enable to Low-Z Output tOLZ 55 n s Byte Select to Low-Z Output tBZ 10 10 ns Chip Disable to High-Z Output tHZ 0 20 0 20 ns Output Disable to High-Z Output tOHZ 0 20 0 20 ns Byte Select Disable to High-Z Output tBHZ 0 20 0 20 ns Output Hold from Address Change tOH 10 10 ns Write Cycle Time tWC 55 70 ns Chip Enable to End of Write tCW 45 50 ns Address Valid to End of Write tAW 45 50 ns Byte Select to End of Write tBW 45 50 ns Write Pulse Width tWP 40 40 ns Address Setup Time tAS 00 n s Write Recovery Time tWR 00 n s Write to High-Z Output tWHZ 20 20 ns Data to Write Time Overlap tDW 40 40 ns Data Hold from Write Time tDH 00 ns End Write to Low-Z Output tOW 55 n s

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Timing of Read Cycle (CE1 = OE = VIL, WE = CE2 = VIH) Timing Waveform of Read Cycle (WE=VIH) Address Data Out tRC tAA tOH Data ValidPrevious Data Valid Address LB, UB OE Data Valid tRC tAA tCO tHZ tOHZ tBHZ tOLZ tOE tLZ High-Z Data Out tBE tBLZ CE1 CE2

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Timing Waveform of Page Mode Read Cycle (WE = VIH) Page Address (A0, A5 - A17) LB, UB OE tAA tCO tHZ tOHZ tBHZ tOLZ tOE High-Z Data Out tBE tBLZ CE1 CE2 Word Address (A1 - A4) tAAP tRC

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Timing Waveform of Write Cycle (WE control) Timing Waveform of Write Cycle (CE1 Control) Address Data In CE1 CE2 LB, UB Data Valid tWC tAW tCW tWR tWHZ tDH High-Z WE Data Out High-Z tOW tAS tWP tDW tBW Address WE Data Valid tWC tAW tCW tWR tDH LB, UB Data In High-Z tAS tWP tLZ tDW tBW Data Out tWHZ CE1 (for CE2 Control, use inverted signal)

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. 44-Lead TSOP II Package (T44) Note: 1. All dimensions in inches (Millimeters) 18.41±0.13 10.16±0.13 SEE DETAIL B 1.10±0.15 11.76±0.20 0.45 0.30 0.80mm REF DETAIL B 0.80mm REF 0o-8o 0.20 0.00

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc. Ball Grid Array Package SIDE VIEWTOP VIEW BOTTOM VIEW E D A1 BALL PAD CORNER (3) 1.24±0.10 0.28±0.05 0.15 0.05 Z Z 1. 0.35±0.05 DIA. 1. DIMENSION IS MEASURED AT THE MAXIMUM SOLDER BALL DIAMETER. PARALLEL TO PRIMARY Z. 2. PRIMARY DATUM Z AND SEATING PLANE ARE DEFINED BY THE SPHERICAL CROWNS OF THE SOLDER BALLS. 3. A1 BALL PAD CORNER I.D. TO BE MARKED BY INK. 2. SEATING PLANE - Z SD SE e K TYP J TYP e A1 BALL PAD CORNER

(DOC# 14-02-042 ReI I ECN# 01-1374 The specifications of this device are subject to change without notice. For latest documentation see http://www.amis.com. N04L1630C2B Advance InformationAMI Semiconductor, Inc.

Ordering Information

© 2006 AMI Semiconductor, Inc. All rights reserved. AMI Semiconductor, Inc. ("AMIS") reserves the right to change or modify the information contained in this data sheet and the products described therein, without prior notice. AMIS does not convey any license under its patent rights nor the rights of others. Charts, drawings and schedules contained in this data sheet are provided for illustration pur- poses only and they vary depending upon specific applications. AMIS makes no warranty or guarantee regarding suitability of these products for any particular purpose, nor does AMIS assume any liability arising out of the application or use of any product or circuit described herein. AMIS does not authorize use of its products as critical components in any application in which the failure of the AMIS product may be expected to result in significant injury or death, including life support systems and critical medical instruments.

Revision History

Revision Date Change Description A April 2003 Initial Advanced Release B August 2004 Changed part number to -30 from -3W and Vcc range to 2.7 V - 3.6V C January 2005 Change IDR = 5 µA, ICC(typ) = 2.5mA. Modified page mode address A1-A4 configuration. D January 2005 General Update E March 22, 2005 Changed tWP and tDW to 40ns for -55 and -70, to 45ns for -85 F June 9, 2005 Added TSOP II Green Package Ordering Option G Dec. 2005 Added RoHS Compliant H July 2006 Added BGA package I September 2006 Converted to AMI Semiconductor N04L1630C2BX-XX I 55 = 55ns 70 = 70ns B2 = 48-ball BGA Green (RoHS Compliant) T2 = 44-pin TSOP II Green (RoHS Compliant) Performance Package Type