LHRF2340-1-PF LIGITEK | Alldatasheet
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DOC. NO : QW0905- REV. : A DATE : 29 - Sep. - 2009 LHRF2340-1-PF DATA SHEET LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Lead-Free Parts Pb SUPER BRIGHT ROUND TYPE LED LAMPS 發行 DCC 立碁電子
Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 60°-60° -30° 30° PART NO. Package Dimensions LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only LHRF2340-1-PF Page 1/5 25.0MIN □0.5 TYP 1.0MIN 2.54TYP + - 1.5MAX 3.0 5.0
2θ 1/2 (deg) Page LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only ℃-40 ~ +85 Operating Temperature Topr Luminous intensity @20mA(mcd) Spectral halfwidth △λnm Peak wave length λPnm Forward voltage @ mA(V) Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. Red Diffused COLOR LHRF2340-1-PF PART NO Emitted AlGaInP Red MATERIAL Lens 63020 Typ.Max.Min.Min. 3001.5 2.4 450 Typical Electrical & Optical Characteristics (Ta=25 ℃) Tstg Storage Temperature -40 ~ +100 ℃ HRF PD IFP Reverse Current @5V Power Dissipation Forward Current Peak Forward Current Duty 1/10@10KHz 10Ir μA mW 30IF mA mA Symbol Absolute Maximum Ratings at Ta=25 ℃ Parameter PART NO. LHRF2340-1-PF Ratings UNIT
Relative Intensity@20mA 600 Wavelength (nm) 550 700650 0.5 0.5 Relative Intensity@20mA Normalize@25℃ Forward Voltage@20mA Normalize @25℃ Ambient Temperature(℃) Fig.5 Relative Intensity vs. Wavelength 1.0 Ambient Temperature(℃) 0.8 -0-20-4060 402080100 -40-20-060 4080100 Fig.4 Relative Intensity vs. Temperature 2.5 1.0 0.9 1.1 1.5 1.0 2.0 Fig.3 Forward Voltage vs. Temperature 1.2 3.0 100 Relative Intensity Normalize @20mA Forward Current(mA) Forward Current(mA)Forward Voltage(V) 1.51.0 0.1 2.52.03.01.010 1.0 0.5 1.0 1.5 2.0 1001000 Fig.2 Relative Intensity vs. Forward CurrentFig.1 Forward current vs. Forward Voltage 1000 3.5 2.5 Typical Electro-Optical Characteristics Curve LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 3.0 HRF CHIP Page3/5 PART NO. LHRF2340-1-PF
Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) 5°/sec max Note:1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above.
60 Seconds Max
25° 0° 0 120° 2°/sec max 50 100 260° Temp(°C) 260°C3sec Max 150 Time(sec) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile LHRF2340-1-PFPART NO. Page 4/5
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Low Temperature Storage Test This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. Solder Resistance Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1secSolderability Test This test intended to see soldering well performed or not. 1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs ±2hrs (10min) (10min) 2.total 10 cycles Thermal Shock Test High Temperature High Humidity Test The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. The purpose of this test is the resistance of the device under tropical for hours. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202:103B JIS C 7021: B-11 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Test ConditionTest Item 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) 1.Ta=105℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) High Temperature Storage Test Operating Life Test The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. LHRF2340-1-PF Reliability Test: PART NO. Description Reference Standard JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 5/5Page