L12URF13433S

L12URF13433S LIGITEK | Alldatasheet

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LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only DATA SHEET DOC. NO : QW0905-L12URF13433S/S11-PF REV. : A DATE : 01 - Sep. - 2006 SUPER BRIGHT OVAL TYPE LED LAMPS

LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. L12URF13433S/S11-PF Package Dimensions Directivity Radiation Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. 12.05±0.5 1.0MIN 25.0MIN 4.31 2.54TYP □0.5 TYP 1.5MAX 7.4 5.0 + - Hoeizontal Axis 62° Radiation Angle(0.5):H 62 Degree/V 32 Degree 25%50%75%100% -60° -30° 100%75%50%25%0 Vertical Axis 32° 30° 60°

Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Ratings mA mA URF(S) UNIT mW V μA 120 2000 -40 ~ +85 -40 ~ +100 Symbol IFP IF Forward Current Peak Forward Current Duty 1/10@10KHz Parameter PD ESD Ir Power Dissipation Reverse Current @5V Electrostatic Discharge( * ) Topr Tstg Storage Temperature Operating Temperature Min. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/5 Absolute Maximum Ratings at Ta=25 ℃ Min. Typ. 27005000 Max. 625201.72.6 Dominant wave length λDnm Luminous intensity @20mA(mcd) Viewing angle 2θ 1/2 (deg) Forward voltage @20mA(V) Spectral halfwidth △λnm LensEmitted COLOR Water Clear Red PART NO L12URF13433S/S11-PF MATERIAL AlGaInP Typical Electrical & Optical Characteristics (Ta=25 ℃) Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. PART NO. L12URF13433S/S11-PF Vertical Axis 32° Horizontal Axis 62°

Fig.3 Forward Voltage vs. Temperature Fig.5 Relative Intensity vs. Wavelength Ambient Temperature(℃) Relative Intensity@20mA Wavelength (nm) Forward Voltage@20mA Normalize @25℃ Fig.4 Luminous Intensity vs. Temperature Ambient Temperature(℃) Luminous Intensity@20mA Normalize @25℃ Typical Electro-Optical Characteristics Curve Forward Voltage(V) Fig.1 Forward current vs. Forward Voltage Forward Current(mA) Forward Current(mA) Luminous Intensity Normalize @20mA LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 100 150 050100150 0.0 1.0 2.0 3.0 -40-200204060 0.51.01.52.0 80100 0.94 -20-4040 20080100 60 0.8 0.0 0.2 0.4 0.6 1.0 1.2 URFS CHIP Page 3/5 Fig.2 Luminous Intensity vs. Forward Current 5.0 4.0 6.0 2.53.0 0.96 0.98 1.00 1.02 1.04 1.06 550600650700 0.5 1.0 PART NO. L12URF13433S/S11-PF

60 Seconds Max

Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One Time) Distance:2mm Min(From solder joint to body) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/5

0 Preheat

25° 2°/sec max 10050 150 Time(sec) Temp(°C) 120° 260° 5°/sec max 260°C3sec Max PART NO. L12URF13433S/S11-PF

This test intended to see soldering well performed or not. The purpose of this test is the resistance of the device under tropical for hours. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec High Temperature High Humidity Test Thermal Shock Test Solder Resistance Test The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. (10min) (10min) 2.total 10 cycles 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. 1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs ±2hrs MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202:103B JIS C 7021: B-11 This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) High Temperature Storage Test Low Temperature Storage Test The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. 1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Reliability Test: Test ItemTest Condition Description MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 Reference Standard LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. L12URF13433S/S11-PF