LH3130-PF LIGITEK | Alldatasheet

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DOC. NO : QW0905- REV. : DATE : - 200622 - Dec. A LH3130-PF ROUND TYPE LED LAMPS LH3130-PF DATA SHEET Pb Lead-Free Parts LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only

-30° Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Package Dimensions 75%100% -60° Directivity Radiation PART NO. LH3130-PF 60° 30° 7.65 25.0MIN 1.0MIN2.54TYP + - □0.5 TYP 1.5MAX LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 4.75 Page 1/5

℃Topr -40 ~ +85 Operating Temperature Typical Electrical & Optical Characteristics (Ta=25 ℃) Max. Forward voltage @20mA(V) 2.6 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. Red Emitted LH3130-PF GaP PART NO MATERIAL Red Diffused 6971.7 COLOR Lens Peak wave length λPnm Min. Storage Temperature Tstg -40 ~ +100 6.54.5 46 Viewing angle 2θ 1/2 (deg) Luminous intensity @ mA(mcd) Typ. Min. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Ratings Peak Forward Current Duty 1/10@10KHz Reverse Current @5V Power Dissipation Forward Current Parameter Ir PD IFP IF Symbol Absolute Maximum Ratings at Ta=25 ℃ μA10 40 mW 60 mA mA H UNIT Page 2/5 Spectral halfwidth Δλnm LH3130-PFPART NO.

Relative Intensity@20mA 600 0.0 0.5 Wavelength (nm) 700800900 Ambient Temperature(℃) Fig.5 Relative Intensity vs. Wavelength Fig.3 Forward Voltage vs. Temperature Forward Voltage@20mA Normalize @25℃ 1.0 -20-40 0.8 1.0 0.9 1.1 1.2 0.5 Relative Intensity@20mA Normalize @25℃ -20 Ambient Temperature(℃) 806040200-40 100 0.0 806002040100 Fig.4 Relative Intensity vs. Temperature 2.5 1.5 1.0 2.0 3.0 Fig.1 Forward current vs. Forward Voltage Typical Electro-Optical Characteristics Curve 100 Forward Current(mA) 0.1 1.0 1.0 1000 H CHIP Relative Intensity Normalize @20mA Forward Voltage(V) 0.0 1.5 1.0 0.5 2.0 2.5 Forward Current(mA) 101001000 Fig.2 Relative Intensity vs. Forward Current 3.0 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 1000 3/5PageLH3130-PFPART NO.

2.Wave Soldering Profile Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 150 Time(sec) 260°C3sec Max 260° Temp(°C) 2°/sec max 10050Preheat 120° 25° 00° Note:1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. 5°/sec max Dip Soldering Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body)

60 Seconds Max

LH3130-PFPART NO.

MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 MIL-STD-883:1008 JIS C 7021: B-10 JIS C 7021: B-12 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202:103B JIS C 7021: B-11 MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Test Item Operating Life Test Reliability Test: 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) Test Condition High Temperature Storage Test Low Temperature Storage Test Thermal Shock Test Solder Resistance Test High Temperature High Humidity Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. (10min) (10min) 2.total 10 cycles 1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs ±2hrs 1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. The purpose of this test is the resistance of the device under tropical for hours. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.

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