LFI2060-HV48-O-PF LIGITEK | Alldatasheet
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- 2010 A 05 - Mar. DOC. NO : QW0905- REV : DATE : DATA SHEET LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only HIGH VOLTAGE LED LAMPS LFI2060/HV48-O-PF 發行 DCC 立碁電子
Direct connect it to telephone circuits Applications: 8. LED emitting color is orange, lens of LED is red. 7. Luminous intensity at +48V is 4.5mcd MIN and 12.0mcd TYP. Features: LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Package Dimensions PART NO. LFI2060/HV48-O-PF Page 1/5 2. A wide range of operating voltage:+3V~+48V 3. LED will blink 64 times before going stedy when power on. 4. Duty cycle 50% 5. Blink 64 times spend 25~60 seconds. 6. Input current is around 7.5mA@Voltage=48V Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. 1. Built-in IC chip manufactured by CMOS technology 11.0±2 3.0 4.0 4.2 5.2 2.54TYP + - Pyrocondensation Cannula 29.6MIN
503.0 Min. Max. LFI2060/HV48-O-PF 2/5 PART NO. Absolute Maximum Ratings at Ta=25 ℃ Ratings 0.4 Parameter FV Vr Reverse Voltage Forward Voltage Symbol -0 ~ +85 -20 ~ +85 Topr Tstg Operating Temperature Storage Temperature Typical Electrical & Optical Characteristics (Ta=25 ℃) Typ.Max. Min.Min. Pulse rate(Hz) volt=48v Peak wave length λPnm Spectral halfwidth △λnm COLOR Emitted PART NO MATERIAL Lens Note : The luminous intensity data did not including ±15% testing tolerance. 4.51.6 2.545635 12OrangeLFI2060/HV48-O-PF GaAsP/GaP Red Diffused Page LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only UNIT V V Operating voltage Luminous intensity volt=48V (mcd)
Fig.3 Forward Voltage vs. Temperature Fig.5 Relative Intensity vs. Wavelength Ambient Temperature(℃) Relative Intensity@20mA Wavelength (nm) Forward Voltage@20mA Normalize @25℃ Fig.4 Relative Intensity vs. Temperature Ambient Temperature(℃) Relative Intensity@20mA Normalize @25℃ Typical Electro-Optical Characteristics Curve Forward Voltage(V) Fig.1 Forward current vs. Forward Voltage Forward Current(mA) Forward Current(mA) Fig.2 Relative Intensity vs. Forward Current Relative Intensity Normalize @20mA LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 1.0 0.1 1.0 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 550 600 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20-40 402008 0 1 0 0 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 650 700 750 E - I CHIP Page3/5LFI2060/HV48-O-PF PART NO.
60 Seconds Max
Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/5
0 Preheat
25° 2°/sec max 10050 150 Time(sec) Temp(°C) 120° 260° 5°/sec max 260°C3sec Max Note: 1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. LFI2060/HV48-O-PF PART NO.
1.Ta=65 ℃±5℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. The purpose of this test is the resistance of the device under tropical for hours. This test intended to see soldering well performed or not.Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec Solder Resistance Test Thermal Shock Test High Temperature High Humidity Test (10min) (10min) 2.total 10 cycles 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202:103B JIS C 7021: B-11 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, + 72hrs) Low Temperature Storage Test High Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, + 72hrs) 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, + 72hrs) Reliability Test: Operating Life Test Test ConditionTest Item Description MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 Reference Standard LFI2060/HV48-O-PF PART NO.