LDBK65063-L15

LDBK65063-L15 LIGITEK | Alldatasheet

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DOC. NO : QW0905-LDBK65063/L15 REV. : A DATE : 13 - Oct. - 2009 LDBK65063/L15 DATA SHEET LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Lead-Free Parts Pb RECTANGLE TYPE LED LAMPS

Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Package Dimensions LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LDBK65063/L15Page 1/5 2.7 1.0MIN 25.0MIN 0.45MAX 2.0TYP + - 0.35TYP R1.38 1.0MAX 0.40TYP 4.0 1.5

Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Page2/5 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only UNIT mA mA μA mW IF Parameter Symbol Ir PD IFP 120 100 DBK Ratings Absolute Maximum Ratings at Ta=25 ℃ Reverse Current @5V Peak Forward Current Duty 1/10@10KHz Forward Current Power Dissipation V ESD Topr Tstg -20 ~ +80 -30 ~ +100 500 Dominant Typical Electrical & Optical Characteristics (Ta=25 ℃) Operating Temperature Electrostatic Discharge( * ) Storage Temperature 120 1004.03.565 Typ. Min.Max. Typ. D 30470 Lens MATERIAL Blue InGaN/GaN Emitted Water Clear Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. LDBK65063/L15 PART NO Forward voltage @20mA(V)COLOR wave length λ nm Spectral halfwidth △λnm Viewing angle 2θ 1/2 (deg) Luminous intensity @ mA(mcd) PART NO. LDBK65063/L15

3.0 2.5 Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 1000100 2.0 1.5 1.0 0.5 0.0 1015.02.0 Forward Voltage(V) Forward Current(mA) Forward Current(mA) Relative Intensity Normalize @20mA 3.01.2 Fig.3 Forward Voltage vs. Temperature 2.0 1.0 1.5 1.1 0.9 1.0 2.5 Fig.4 Relative Intensity vs. Temperature 408010060 0.0 20406080100-20 -400 0.8 -40-200 Ambient Temperature(℃) Ambient Temperature(℃) Forward Voltage@20mA Normalize @25℃ Relative Intensity@20mA Normalize @25℃ 0.5 0.5 550500400 0.0 450 Wavelength (nm) Relative Intensity@20mA 1.0 0 1 4.03.01.0 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Typical Electro-Optical Characteristics Curve Fig.5 Relative Intensity vs. Wavelength PART NO. LDBK65063/L15

60 Seconds Max

Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) 120° Note:1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. Preheat 0° 0 25° 2°/sec max Time(sec) 100 150 260°C3sec Max 260° Temp(°C) 5°/sec max Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/5PART NO. LDBK65063/L15

The purpose of this test is the resistance of the device under tropical for hours. 1.Ta=65℃±5℃ 2.RH=90%~95% 3.t=240hrs ±2hrs High Temperature High Humidity Test MIL-STD-202:103B JIS C 7021: B-11 The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. This test intended to see soldering well performed or not. 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1secSolderability Test (10min) (10min) 2.total 10 cycles 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. Solder Resistance Test Thermal Shock Test MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1

Description

The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) 1.Ta=-40℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Low Temperature Storage Test 1.Ta=105℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) High Temperature Storage Test Reliability Test: Test Condition Operating Life Test Test Item MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 Reference Standard PART NO. LDBK65063/L15