L8UG12243-PF LIGITEK | Alldatasheet
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DOC. NO : QW0905- REV. : DATE : - 201122 - Nov. L8UG12243-PF A DATA SHEET SUPER BRIGHT ROUND TYPE LED LAMPS L8UG12243-PF Lead-Free Parts Pb LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only 發行 DCC 立碁電子
25.0MIN Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. -60° 50%100%75% Directivity Radiation -30° 60° 75%025%25%50%100% 30° 1.0MIN 2.54TYP □0.5 TYP 1.5MAX Package Dimensions PART NO. L8UG12243-PF 5.3 1.0 4.03.0 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page1/5
℃-40 ~ +85 Operating Temperature Topr Dominant wave length λDnm Viewing angle 2θ 1/2 (deg) 574 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. AlGaInP L8UG12243-PF Water Clear Green Emitted Lens Typ. 15001.7202.6900 Min.Min.Max. Typical Electrical & Optical Characteristics (Ta=25 ℃) MATERIALPART NO COLOR Storage Temperature Tstg Luminous intensity @20mA(mcd) Forward voltage @20mA(V) Spectral halfwidth △λnm -40 ~ +100 ℃ Absolute Maximum Ratings at Ta=25 ℃ Reverse Current @5V Electrostatic Discharge( * ) ESD Ir Power Dissipation Peak Forward Current Duty 1/10@10KHz PD IFP Parameter Forward Current IF Symbol μA10 2000V mW mA Ratings 8UG mA UNIT LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only L8UG12243-PFPART NO. Page 2/5
Relative Intensity @20mA Normalize @25℃ Relative Intensity Normalize @20mA LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Typical Electro-Optical Characteristics Curve Relative Intensity @20mA 500 Wavelength (nm) 550600650 0.5 Forward Voltage@20mA Normaliz @25℃ Fig.5 Relative Intensity vs. Wavelength 1.0 Ambient Temperature(℃) 0.8 -20060 204080 1.0 0.9 1.1 Fig.3 Forward Voltage vs. Temperature 1.2 Forward Current(mA) Forward Voltage(V) 00.5 Fig.1 Forward current vs. Forward Voltage 8UG CHIP L8UG12243-PFPART NO. 0.5 Ambient Temperature(℃) -200204080 2.0 1.0 1.5 Fig.4 Relative Intensity vs. Temperature 2.5 Forward Current(mA) 1.010100 1000 1.0 Fig.2 Relative Intensity vs. Forward Current 2.0 Page 3/5
Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 2°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to body) 120° Note:1.Wave solder should not be made more than one time. 2.You can just only select one of the soldering conditions as above. Preheat 0° 0 25° 2°/sec max Time(sec) 100 150 260°C3sec Max 260° Temp(°C) 5°/sec max Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One time only) Distance:2mm Min(From solder joint to body) 2.Wave Soldering Profile LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only L8UG12243-PFPART NO. Page 4/5
1.Ta=65 ℃±5℃ 2.RH=90%~95% 3.t=240hrs ±2hrs This test intended to see soldering well performed or not. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. The purpose of this test is the resistance of the device under tropical for hours. 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1secSolderability Test Thermal Shock Test (10min) (10min) 2.total 10 cycles 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. Solder Resistance Test High Temperature High Humidity Test MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202:103B JIS C 7021: B-11 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
Description
1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) Low Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) High Temperature Storage Test Reliability Test: Test Condition Operating Life Test Test Item L8UG12243-PFPART NO. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 JIS C 7021: B-12 MIL-STD-883:1008 JIS C 7021: B-10 Reference Standard 5/5Page