T3121S

T3121S KEYSIGHT | Alldatasheet

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T3100S Series NFC Test Systems Test systems for NFC, EMV and contactless device testing Technical Overview The Keysight Technologies T3100S Series includes: – T3111S NFC conformance test system – T3121S NFC R&D test system – T1141A NFC test set – T1142A automatic positioning robot

02 | Keysight | T3100S Series NFC Test Systems - Technical Overview The Keysight Technologies, Inc. T3100S Series NFC test systems are the essential tools for testing NFC and contactless payment devices. From chipsets to cards, terminals, and mobile devices, T3100S Series test systems cover all product development phases from R&D to pre-conformance and final certification. Each of the T3100S Series systems is built around the Keysight T1141A NFC Test Set. Capable of supporting Analog RF and Digital Protocol Testing, the T1141A combines the functions needed to test NFC devices: – Scripted card and terminal emulation – Arbitrary waveform generation – Powerful waveform, logic, protocol, and voltage analysis The Keysight T3121S NFC R&D Test System combines the T1141A with a PC-hosted virtual front panel application. The Keysight T3111S NFC Conformance Test System can be configured as a superset of the T3121S by adding a Test Manager software application, and hosting an expandable range of standards-based test suites covering: – EMV™ Level 1 PICC/Mobile and PCD Digital Protocol – NFC Forum Digital Protocol and Analog RF – NFC Forum LLCP and SNEP – ISO 14443 and 18092 NFC Digital Protocol and Analog RF – ISO 15693 and 18000-3 RFID HF Analog RF The T3111S Test System can be expanded with specialized EMV test accessories and software applications from FIME to cover EMV Level 1 PICC/Mobile and PCD analog RF testing (www.keysight.com/ find/FIME ). When combined with the T3111S, the optional Keysight T1142A Automatic Positioning Robot enables accurate and repeatable antenna positioning. The integrated T1141A NFC Test Set forms the core of the T3111S and T3121S systems. NFC pattern generator Logic, protocol analysis & sniffer RF and envelope analysis Personal computer Standards-based RF test suites Standards-based DP test suites Virtual front panel Virtual front panelTest manager Test manager Keysight RFID/HF test set Terminal emulator Card emulator RF, logic, digital analyzer Optional automatic positioning robot Reference pollers Reference listeners Device under test T3100S Test System components.

03 | Keysight | T3100S Series NFC Test Systems - Technical Overview Test Manager The Test Manager automates and controls test suite execution and report generation. The intuitive and powerful graphical user interface includes: – Technology manager to select and load standards-based test suites – Project manager to create, edit, save, and recall test campaigns with customized ICS, IXIT, device- under-test (DUT) information and test case selections – Sequencer to select and execute individual tests or test campaigns – Results analyzer to save and review test logs and statistics Powerful utilities allow test projects to be migrated forward as test suite software is modified to support test case standards updates. Test parameter defaults are set to support pre-conformance and conformance testing, with many parameters, including additional setting flexibility. By using the Test Manager Remote feature, users can access the T3111S system and execute test cases remotely. Results Analysis Comprehensive test reports and logs allow users to review and analyze results from automated testing sessions. Captured results can also be visualized with the Virtual Front Panel software application. Test Manager user interface Test manager sequencer

04 | Keysight | T3100S Series NFC Test Systems - Technical Overview Validated Test Suites Regular software updates ensure that test suites are maintained in alignment with evolving industry standards. Keysight is a member of the NFC Forum and has been recognized by EMVCo as a test tool provider. T3111S NFC Forum test suites have been validated by the NFC Forum. At the date of publishing, EMV Level 1 PICC/Mobile Digital Protocol and EMV Level 1 PCD Digital Protocol test suites have been validated for test spec versions 2.3.1a and 2.5. Virtual Front Panel Available with the T3121S and T3111S systems, the Virtual Front Panel software application provides a powerful and intui - tive graphical user interface for analog RF and digital protocol testing. The Virtual Front Panel can be used as an NFC device emulator or analyzer supporting NFC Forum and ISO standards. While working with the Virtual Panel, different operation modes can be selected. The analog RF Virtual Front Panel displays waveform and envelope traces captured by the T1141A test set. The digital protocol Virtual Front Panel displays logic-level traces and binary protocol decodes captured by the T1141A. In each operating mode, users are able to send message sequences to the device under test to stimulate responses for capture. The Virtual Front Panel enables hands-on interactive testing. The tool also allows users to display waveforms, logic traces, and protocol logs saved when running automated campaigns within the Test Manager. A sniffer function allows the recording of real terminal-card protocol communication exchanges. Curser and zooming functions enable users to perform detailed investigation of captured voltage and logic waveforms. In addition to providing an interactive graphical user interface, the Virtual Front Panel includes a programming API enabling integration with user-developed software and systems. R&D Virtual Front Panel software user interface Waveform type Envelope type Logical type Protocol type Virtual Front Panel display modes:

05 | Keysight | T3100S Series NFC Test Systems - Technical Overview Automatic Positioning Robot The T1142A Automatic Positioning Robot ensures exact antenna positioning when testing NFC and EMV device RF analog performance. Robot-mounted antennas are reliably and repeatability moved under test case control to each specified posi - tion. Users can select standards-based or customized antenna measurement positions. The robot: – Meets NFC Forum Analog RF test requirements – Includes laser-assisted sample detection and location – Has positioning accuracy better than ± 0.25 mm (typical) – Has a large operating volume, supporting device weights up to 10 kg – Has a user calibration kit available (sold separately) – Includes non-metallic construction with three-axis, independent movement TCI II Antenna Keysight offers a complete sets of test antennas portfolio, including those recommended by NFC Forum, ISO or EMVCO (through FIME) for Analog testing. For Digital tests, Keysight offers a combo design that enable hands-off digital testing. The main features of the Keysight TCI II antenna are: – Software utility to find sweet test point – Automatic switch Poll/Listen Mode – Selectable RL values for Listen Mode – Ready to operate with T1142A Auto- matic Positioning Robot Worldwide Technical Support Each T3100S system is configured with a Software and Technical Support Contract (STSC). Renewed annually, the STSC enables users to download and install regular software and firmware updates including system usability enhancements and test case standards updates. Enhanced technical support is provided by local and factory-based NFC test experts. T1142A Automatic Positioning Robot

06 | Keysight | T3100S Series NFC Test Systems - Technical Overview System Components T1141A NFC Test Set Control PC 1 – Desktop PC loaded with Windows 7 (64-bit) – Keyboard, mouse, and 19-inch widescreen LED/LCD monitor Keysight’s NFC universal test antenna – Test coil interface (TCI) NFC Forum reference interfaces – 3 poller – 3 listener ISO 10373-6 test interfaces including – PCD test assembly – Calibration coil – Reference PICC ISO 10373-7 test interfaces including – VCD antenna and sense coils – Calibration coil – Reference VICC T1142A Automatic Positioning Robot 1. PC, operating system, and monitor details subject to change without notice. PC images courtesy of Dell Inc.

07 | Keysight | T3100S Series NFC Test Systems - Technical Overview T1141A NFC Test Set Specifications Technical specifications RF generator specifications LP (TX/RX) front panel and MP rear panel BNC ports Frequency range 10 to 20 MHz Nominal output impedance 50 Ω Nominal level setting resolution < 0.04% Typical carrier frequency accuracy < 2 Hz from 11 to 20 MHz LP (TX/RX) front panel Nominal level range –5 to +25 dBm Typical absolute level accuracy ± 1.5 dB from 11 to 20 MHz and –1 to 25 dBm MP rear panel Nominal level range +6 to +35 dBm Typical absolute level accuracy ± 1.5 dB from 11 to 17 MHz and 8 to 36 dBm Load modulator specifications LM rear panel port Nominal output impedance 50 Ω Nominal level range 0 to 5 V rms RF analyzer specifications LP (TX/RX) front panel BNC port Frequency range 10 to 20 MHz Nominal input impedance 50 Ω Nominal level range 0 to 20 dBm Damage level 0 Vdc or 5 V peak Typical absolute level accuracy ± 1 dB at 13.56 MHz and 0 to 20 dBm RF analyzer specifications CC (RX) front panel and SC rear panel BNC ports Frequency range 10 to 20 MHz Nominal input impedance 50 Ω or 1 M Ω switchable Nominal level range 1 mV to 700 mV rms Damage level ± 2.5 V peak Typical absolute level accuracy ± 5% from 50 to 700 mV rms and 11 to 20 MHz Typical level measurement linearity ± 2% from 12 to 700 mV rms and 13.56 MHz Nominal residual reading for 0V input < 3.5 mV rms Nominal frequency measurement accuracy < 10 Hz DC voltmeter Nominal input impedance > 10 MΩ Nominal level range 0 to 10 Vdc Damage level 12 Vdc Typical absolute level accuracy ± 1.59% from 0 to 10 Vdc

08 | Keysight | T3100S Series NFC Test Systems - Technical Overview T1141A NFC Test Set Specifications (continued) Technical specifications (continued) Nominal performance with Keysight antennas ISO 10373-6 test assemblies Nominal output field range: 0.1 to 2 A/m with LP (TX/RX) front panel output 0.25 to 7.75 A/m with MP rear panel output Nominal output field resolution:

0.02 A/m with LP (TX/RX) front panel output

0.06 A/m with MP rear panel output

Keysight test coil interface Nominal output field range: 0.5 to- 3 A/m with LP (TX/RX) front panel output Nominal output field resolution:

0.05 A/m with LP (TX/RX) front panel output

Output and reception uncertainties Compliant with NFC Forum requirements for test tools 1 Processing parameters Maximum sampling rate 108.48 Msps ADC resolution 14 bits DAC resolution 16 bits Signaling parameters Standards supported EMVCo Level 1 NFC Forum Digital Protocol NFC Forum Analog RF NFC Forum LLCP NFC Forum SNEP ISO/IEC 14443 (Type A and Type B) ISO/IEC 18092 ISO/IEC 15693 ISO/IEC 18000-3 (Mode 1) Modulation supported ASK Load modulation BPSK Modulation index ASK 1 to 100% (adjustable) Bit rate 106 to 848 kbps General specifications Dimensions (W x H x D) 456 x 155 x 363 mm Weight 8.6 Kg Environmental and safety Supply voltage range 100 to 120 VAC and 200 to 240 VAC Supply frequency range 50 Hz (220 V range) and 60 Hz (110 V range) Operating temperature 10 to 35° C Storage temperature –20 to +60° C Humidity 20 to 80% Calibration 1 year T1141A NFC test set (front and rear panels) 1. Uncertainties requirements defined at NFC Analog RF Test Specifications.

09 | Keysight | T3100S Series NFC Test Systems - Technical Overview T1142A Automatic Positioning Robot Specifications General specifications Control interfaces Serial 1 x USB connection Power supply External power supply 24 V 100 to 240 V, 50 to 60 Hz Power consumption 80 W Dimensions (W x H x D) 1100 x 800 x 800 mm Storage ranges Temperature –20 to 80 ºC Humidity 20 to 90% non condensing Operation ranges Temperature 15 to 30 ºC Humidity 20 to 90% non condensing EMC IEC-61326 Electrical safety IEC 61010-1 Recommended calibration interval 1 year Performance features Speed X axis Y axis Z axis 44 mm/s 19 mm/s 19 mm/s Threads per mm X axis Y axis Z axis 800 Precision (positioning within the NFC Forum defined test volume) ±0.26 mm; ±0.15 mm typical Effective operation volume (W x H x D) 350 x 320 x 320 mm Free guard area 1 > 150 mm Maximum DUT dimensions allowed 645 x 320 x 645 mm Maximum DUT weight allowed 10 kg Warm up time N/A 1. Distance from reference antenna to any disturbing elements.

10 | Keysight | T3100S Series NFC Test Systems - Technical Overview

Ordering Information

Following tables described options for these available products: – T3111S NFC Conformance Test System is the Keysight platform for NFC and RFID HF conformance testing of contactless devices. – T3121S NFC R&D Test System is the Keysight platform for NFC and RFID HF R&D testing of contactless devices. – T1142A Automatic Positioning Robot T3111S hardware options Option Description T3111S-H01 NFC test set, PC, and Test Manager 2.0 license T3111S test antennas Option Description T3111S-SH1 ISO 10373-6 test assemblies T3111S-RH1 ISO 10373-7 test assemblies T3111S-CH1 NFC Forum reference test assemblies T3111S-CH3 Keysight TCI II NFC universal test antenna T3111S-CH4 Antenna Kit of NFC Forum Poller 0 and NFC Forum Listener T3111S sof tware options NFC Forum conformance test cases packages Option Description T3111S-C01 NFC Forum Analog RF test suite T3111S-C02 NFC Forum Digital Protocol test suite T3111S-C03 NFC Forum LLCP test suite T3111S-C04 NFC Forum SNEP test suite EMV™ Level 1 test suites Option Description T3111S-V01 EMV PICC and Mobile L1 Digital protocol test suite T3111S-V02 EMV PCD L1 Digital Protocol test suite ISO NFC conformance test cases packages Option Description T3111S-S01 ISO Analog RF test suites (ISO 14443 and 18092) T3111S-S02 ISO Digital Protocol test suites (ISO 14443 and 18092) ISO RFID HF conformance test cases packages Option Description T3111S-R01 RFID HF Analog RF test suites (ISO 15693 and 18000-3) R/D software options Option Description T3111S-D01 Analog RF Virtual Front Panel (NFC, ISO, and RFID HF) T3111S-D02 Digital Protocol Virtual Front Panel (NFC, ISO, and RFID HF)

11 | Keysight | T3100S Series NFC Test Systems - Technical Overview T3111S software options (continued) Calibration Option Description T3111S-1AC Accredited calibration certificate T3111S support options Option Description T3100SC NFC test system support T3121 hardware options Option Description T3121S-H01 NFC test set and virtual panel R/D software platform T3121 software options NFC R/D options Option Description T3121S-D01 NFC R/D RF tester T3121S-D02 NFC R/D protocol analyzer ISO RFID HF R/D options Option Description T3121S-D41 ISO RFID HF R/D RF tester T3121S-D42 ISO RFID HF R/D protocol analyzer NFC/ISO RFID HF protocol sniffer Option Description T3121S-D81 NFC/ISO RFID HF protocol sniffer T1142A options Option Description T1142A-F01 Automatic Positioning Robot with fixed head and three axis of movement T1142A-C01 Calibration kit for T1142A T1142A-C02 Holder kit for EMV test equipment

12 | Keysight | T3100S Series NFC Test Systems - Technical Overview This information is subject to change without notice. © Keysight Technologies, 2014 - 2016 Published in USA, April 13, 2016 5992-0188EN www.keysight.com Other Keysight Test Systems Keysight test systems portfolio offers a broad range of wireless technologies testing solutions, including: – Bluetooth ® – LTE – UMTS – GSM, GPRS, EDGE Bluetooth and Bluetooth logos are trademarks owned by Bluetooth SIG, Inc., USA and licensed to Keysight Technologies, Inc.. EMV is a trademark owned by EMVCo LLC. www.keysight.com/find/systems myKeysight www.keysight.com/find/mykeysight A personalized view into the information most relevant to you. Three-Year Warranty www.keysight.com/find/ThreeYearWarranty Keysight’s committed to superior product quality and lower total cost of ownership. Keysight is the only test and measurement company with three-year warranty standard on all instruments, worldwide. And, we provide a one-year warranty on many accessories, calibration devices, systems and custom products. Keysight Assurance Plans www.keysight.com/find/AssurancePlans Up to ten years of protection and no budgetary surprises to ensure your instruments are operating to specification, so you can rely on accurate measurements. From Hewlett-Packard through Agilent to Keysight For more than 75 years, we‘ve been helping you unlock measurement insights. Our unique combination of hardware, software and people can help you reach your next breakthrough. Unlocking measurement insights since 1939.

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