SFH203FA

SFH203FA AMSCO | Alldatasheet

Document overview

• Manufacturer or author: Provided By alldatasheet.com(free datasheet download site)
• PDF pages: 15

Technical content

1 | Version 1.6 | 2022-08-11 www.osram-os.com SFH 203 FA Datasheet Published by ams-OSRAM AG Tobelbader Strasse 30, 8141 Premstaetten, Austria Phone +43 3136 500-0 ams-osram.com © All rights reserved

2 | Version 1.6 | 2022-08-11 Radial T1 3/4 SFH 203 FA Silicon PIN Photodiode

Applications

• Access Control & Security - Appliances & Tools

Features

• Package: black epoxy - ESD: 2 kV acc. to ANSI/ESDA/JEDEC JS-001 (HBM, Class 2) - Wavelength range (S 10%) 750 nm to 1100 nm - Short switching time (typ. 5 ns) - 5 mm LED plastic package

3 | Version 1.6 | 2022-08-11

Ordering Information

Type Photocurrent 1) Photocurrent Ordering Code typ. Ee = 1 mW/cm²; λ = 870 nm; VR = 5 V Ee = 1 mW/cm²; λ = 870 nm; VR = 5 V IP IP SFH 203 FA AN23 ≥ 34 µA 50 µA Q62702P0443 SFH 203 FA ≥ 34 µA 50 µA Q62702P0956 Q62702P0443: Ammopack AN23 (see Appnote “Tape and reel information — Radial components”)

4 | Version 1.6 | 2022-08-11 Maximum Ratings TA = 25 °C Parameter Symbol Values Operating Temperature Top min. max. -40 °C 100 °C Storage temperature Tstg min. max. -40 °C 100 °C Reverse voltage VR max. 20 V Reverse voltage t ≤ 2 min; TA = 25 °C VR max. 50 V Total power dissipation Ptot max. 150 mW ESD withstand voltage acc. to ANSI/ESDA/JEDEC JS-001 (HBM, Class 2) VESD max. 2 kV

5 | Version 1.6 | 2022-08-11 Characteristics TA = 25 °C Parameter Symbol Values Wavelength of max sensitivity λS max typ. 900 nm Spectral range of sensitivity λ10% typ. 750 ... 1100 nm Radiant sensitive area A typ. 1.00 mm² Dimensions of active chip area L x W typ. 1 x 1 mm x mm Half angle φ typ. 20 ° Dark current VR = 20 V IR typ. max. 1 nA 5 nA Spectral sensitivity of the chip λ = 850 nm Sλ typ. 0.62 A / W Quantum yield of the chip λ = 850 nm η typ. 0.90 Electrons / Photon Open-circuit voltage Ee = 0.5 mW/cm²; λ = 870 nm VO min. typ. 300 mV 370 mV Short-circuit current Ee = 0.5 mW/cm²; λ = 870 nm ISC typ. 25 µA Rise time VR = 20 V; RL = 50 Ω; λ = 850 nm tr typ. 0.005 µs Fall time VR = 20 V; RL = 50 Ω; λ = 850 nm tf typ. 0.005 µs Forward voltage IF = 100 mA; E = 0 VF typ. 1.3 V Capacitance VR = 0 V; f = 1 MHz; E = 0 C0 typ. 11 pF Temperature coefficient of voltage TCV typ. -2.6 mV / K Temperature coefficient of short-circuit current λ = 870 nm TCI typ. 0.1 % / K Noise equivalent power VR = 20 V; λ = 870 nm NEP typ. 0.029 pW / Hz1/2 Detection limit VR = 20 V; λ = 870 nm D* typ. 3.5e12 cm x Hz1/2 / W

6 | Version 1.6 | 2022-08-11 Relative Spectral Sensitivity 2), 3) Srel = f (λ) λ OHF01773 relS 400 600 800 1000 1200 100 nm Directional Characteristics 2), 3) Srel = f (φ)

7 | Version 1.6 | 2022-08-11 Photocurrent/Open-Circuit Voltage 2), 3) IP (VR = 5 V) / VO = f (Ee) 0.005 0.05 0.5 1 0.5 400 600 800 1000 Dark Current 2), 3) IR = f (VR); E = 0 Capacitance 2), 3) C = f (VR); f = 1MHz; E = 0; TA = 25°C

8 | Version 1.6 | 2022-08-11 Dark Current 2) IR = f (TA); E = 0; VR = 20 V

9 | Version 1.6 | 2022-08-11 Dimensional Drawing 4) Further Information: Approximate Weight: 310.0 mg Package marking: Cathode

10 | Version 1.6 | 2022-08-11 Recommended Solder Pad 4) Pad 1: anode

11 | Version 1.6 | 2022-08-11 TTW Soldering IEC-61760-1 TTW 00 s OHA04645 100 150 200 250 300 t T 235 ˚C - 260 ˚C First wave 20 40 60 80 100 120 140 160 180 200 220 240 Second wave 10 s max., max. contact time 5 s per wave Preheating 100 ˚C 120 ˚C 130 ˚C Typical Cooling ca. 3.5 K/s typical ca. 2 K/s ca. 5 K/s Continuous line: typical process Dotted line: process limits < 150 K Notes Subcomponents of this device contain, in addition to other substances, metal filled materials including silver. Metal filled materials can be affected by environments that contain traces of aggressive substances. There- fore, we recommend that customers minimize device exposure to aggressive substances during storage, production, and use. Devices that showed visible discoloration when tested using the described tests above did show no performance deviations within failure limits during the stated test duration. Respective failure limits are described in the IEC60810. Packing information is available on the internet (online product catalog). For further application related information please visit www.osram-os.com/appnotes

12 | Version 1.6 | 2022-08-11 Disclaimer Attention please! The information describes the type of component and shall not be considered as assured characteristics. Terms of delivery and rights to change design reserved. Due to technical requirements components may contain dangerous substances. For information on the types in question please contact our Sales Organization. If printed or downloaded, please find the latest version on our website. Packing Please use the recycling operators known to you. We can also help you – get in touch with your nearest sales office. By agreement we will take packing material back, if it is sorted. You must bear the costs of transport. For packing material that is returned to us unsorted or which we are not obliged to accept, we shall have to invoice you for any costs incurred. Product and functional safety devices/applications or medical devices/applications Our components are not developed, constructed or tested for the application as safety relevant component or for the application in medical devices. Our products are not qualified at module and system level for such application. In case buyer – or customer supplied by buyer – considers using our components in product safety devices/ applications or medical devices/applications, buyer and/or customer has to inform our local sales partner immediately and we and buyer and /or customer will analyze and coordinate the customer-specific request between us and buyer and/or customer.

13 | Version 1.6 | 2022-08-11 Glossary 1) Photocurrent: The photocurrent values are measured (by irradiating the devices with a homogenous light source and applying a voltage to the device) with a tolerance of ±11 %. 2) Typical Values: Due to the special conditions of the manufacturing processes of semiconductor devic- es, the typical data or calculated correlations of technical parameters can only reflect statistical figures. These do not necessarily correspond to the actual parameters of each single product, which could dif- fer from the typical data and calculated correlations or the typical characteristic line. If requested, e.g. because of technical improvements, these typ. data will be changed without any further notice. 3) Testing temperature: TA = 25°C (unless otherwise specified) 4) Tolerance of Measure: Unless otherwise noted in drawing, tolerances are specified with ±0.1 and dimensions are specified in mm.

14 | Version 1.6 | 2022-08-11

Revision History

1.4 2019-07-11 Electro - Optical Characteristics (Diagrams) 1.6 2022-08-11 Applications New Layout

15 | Version 1.6 | 2022-08-11 Published by ams-OSRAM AG Tobelbader Strasse 30, 8141 Premstaetten, Austria Phone +43 3136 500-0 ams-osram.com © All rights reserved