PNA-X

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Industry’s Most Advanced RF Test Solution Reach for unrivaled excellence All of the PNA-X’s powerful measurement applications can be used for on-wafer devices. –Conversion gain/loss – True-differential stimulus – Nonlinear waveform and X-parameter* characterization – Antenna test Build your optimal test system by selecting the frequency range for your speci ic device-test needs without paying for functionality you don’t need. 10 MHz to 13.5 GHz 10 MHz to 26.5 GHz 10 MHz to 43.5 GHz

10 MHz to 50 GHz

10 MHz to 67 GHzN5247A

PNA-X with mm-wave modules 10 MHz to 1.05 THz 10 MHz to 8.5 GHzN5249A Choose the leader in network analysis The PNA-X Series of microwave network analyzers are the culmination of Key sight Technologies, Inc. 40-year legacy of technical leadership and innovatio n in radio frequency (RF) network analysis. More than just a vector network analyze r, the PNA-X is the world’s most integrated and lexible microwave test engine for meas uring active devices like ampliiers, mixers, and frequency converters. The combination of two internal signal sources, a signal combiner, S-parameter and noise receivers, pulse modulators and generators, and a lexible set of switches and RF access points provide a powerful hardware core for a broad range of linear and nonlin- ear measurements, all with a single set of connections to your device-under-test (DUT). When you’re characterizing active devices, the right mix of speed and per formance gives you an edge. In R&D, the PNA family provides a level of measurement integri ty that helps you transform deeper understanding into better designs. On th e production line, our PNAs deliver the throughput and repeatability you need to transfor m great designs into competitive products. Every Keysight VNA is the ultimate expr ession of our expertise in linear and nonlinear device characterization. Choos e a PNA --and reach for unrivaled excellence in your measurements and your designs. World´s widest range of measurement applications PNA-X applications bring speed, accuracy, and ease-of-use to common RF measurements, in coaxial, ixtured, and on-wafer environments. Applic ations include: –S-parameters (CW and pulsed) –Noise igure –Gain compression – Intermodulation and harmonic distortion Network analysis technology down to the nanoscale The PNA-X is also compatible with these Keysight measurement solutions: – Physical layer test system (PLTS) software to calibrate, measure, and analyze linear passive interconnects, such as cables, connectors, backplane s, and printed circuit boards. – Materials test equipment and accessories to help determine how your materials interact with electromagnetic ields, by calculating permittivity an d permeability. – Award-winning scanning microwave microscope to create a powerful and unique combination for topography measurements of calibrated capacitance a nd dopant densities at nanoscale dimensions. The right frequency for your application 02 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

With its highly integrated and versatile hardware and re-conigurable measurement paths, the PNA-X replaces racks and stacks of equipment – with a single instrument. One PNA-X can take the place of the following test gear: –Network analyzer – Spectrum analyzer – Two signal sources –Noise igure meter/analyzer –Power meters –Switch matrix –Digital voltmeter Beneits of a PNA-X-based solution – Simpler test systems for... ...lower hardware and software costs ...quicker development time and faster time to manufacturing ...less downtime and lower maintenance costs ...smaller size and lower power consumption – Faster test times for... . ..improved throughput – Higher accuracy for... ...better yields and better speciications – Flexible hardware for... ...greater adaptability to future test requirements With a single set of connections to an ampliier or frequency converter, the PNA-X can measure CW and pulsed S-parameters, intermodulation distortion, gain and phase compression versus frequency, noise igure, and more. 03 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Results – PNA-X Case Studies Challenges This customer manufacturers over 4600 RF components, with typically 100 0 devices in the manufacturing process at any given time. Devices included ilters, mul tipliers, ampliiers, and switches, from 10 MHz to 60 GHz. They needed to simplify the test system for one particular multiport device, so they set out to develop an opera tor- independent automated test system (ATS). Key challenges included: – Complicated and expensive test systems with multiple racks of equipment and miles of test cables – Multiple cable swaps and recalibrations required with extensive operator intervention and downtime –Signiicant retesting of devices and high system downtime Results The PNA-X’s ability to incorporate more active measurements into a singl e instrument than any other product on the market provided: – Faster test times: Reduced test times from four hours per temperature to 24 minutes when compared to the prior ATS, resulting in a test-time reduction of 95% – Reduced equipment count: Replaced nine racks of equipment with three, 12-port PNA-X network analyzers – Increased operator productivity: Enabled operators to monitor four test stations simultaneously and eliminated the need for single-operator test stat ions – Reduced re-testing and cable swaps Case Study 1 Aerospace/defense component supplier reduces test time by 95% Challenges This aerospace company was conducting a speciic panel-level test and want ed to modernize its test systems and improve its test productivity and throughpu t. Its legacy satellite payload test systems utilized a large amount of rack an d stack equipment accompanied by a big test overhead. The company was required to exert a great deal of time and effort to program and maintain the test systems. Results Initially the aerospace company purchased four PNA-Xs (26.5 and 50 GHz mod - els). They were so impressed with the throughput and test productivity results , that they purchased eight more analyzers. In one test case, the level of improve - ment exceeded expectations—taking a 20-minute gain-transfer test t o just under a minute. Replacing their test system with the PNA-X effectively modern ized and simpliied their test system which enabled: – Faster test times: Complete test suite cut measurement times from three hours to three minutes – Reduced equipment count: Replaced a two-rack payload test system with a single four-port PNA-X – Smaller test system: Reduced the amount of equipment space and power consumption Case Study 2 Satellite designer and manufacturer reduces test time from three hours to three minutes Test Engineering Manager 04 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

The manufacturer was developing a new broadband wireless network system a nd needed a faster test system. Its existing test system consisted of two sourc es, a spectrum analyzer, and power meters. Using this system, they estimated t heir new product would take 30 minutes to test; however their speed goal was 15 minutes. In addition to needing a faster test solution, the company also needed better n oise igure and distortion measurements, and it required single-connection me asure- ments on both up and down converters. Results Replacing their existing multi-instrument test system with a single four -port

50 GHz PNA-X enabled the company to realize:

– Faster test times: Complete test suite cut test throughput from an estimated 30 minutes to under ten minutes – Less downtime and reduced maintenance costs: Reducing the equipment count reduced the setup time, as well as the headaches associated with multiple equipment faults, and resulted in lowered annual calibration cost s – Cost savings on equipment: The cost of a four-port PNA-X was substantially less expensive than the legacy multi-instrument test system. Case Study 3 Wireless networking systems manufacturer reduces throughput from 30 to 10 minutes Challenges The company needed to upgrade its legacy test systems, which consisted of lar ge switch matrices with network analyzers. They required technicians to ke ep connect- ing and disconnecting the device-under-test (DUT) to multiple instrumen ts to make a range of different measurements. This approach was slow, costly, prone t o inac- curacy, and required a good deal of user intervention and additional hardwa re. The company sought a solution that was easy to set up and use, decreased test time and cost, minimized measurement inaccuracy, and offered a smaller footpri nt Results The company decided to purchase PNA-Xs rather than simply upgrade to newer, code-compatible, drop-in instruments offered by the provider of its lega cy test equipment. This decision was made despite the fact that it meant signiican t rewrite of legacy software. The company saved time over their existing test soluti ons and realized: – Easy setup and use: Technicians were able to easily connect to a DUT and measure all different parameters in one pass—without additional hard ware – Faster and more accurate tests: Using just one instrument technicians were able to conduct their required tests in signiicantly less time and improve accurac y – Smaller test system: A single four-port PNA-X reduced their initial capital expense, equipment count, loor space, and power consumption, which resulte d in lower overall test costs Case Study 4 Global security company speeds test and improves measurement accuracy Test Engineering Manager 05 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Intuitive, Speed-Driven Features Flexible user interface: hard keys, soft keys, pull- down menus, right-click shortcuts, and touch screen Up to 10 markers per trace State-of-the-art calibration capabilities On-line help 200 measurement channels and unlimited traces Conigurable test set available on all models Linear, log, power, CW, phase, and segment sweeps Equation editor and time-domain analysis Quick access for ECal and other USB devices 06 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Hardware for Exceptional Flexibility Second GPIB interface for controlling signal sources, power meters or other instruments Pulse I/O connec- tor for controlling external modulators or synchronizing internal pulse generators Flexible triggers for measurement control and for synchronizing external sources or other instruments Power I/O connector provides analog inputs and outputs for PAE and other measurements Test set I/O for controlling external multiport and millimeter-wave test sets Direct IF access for remote mix- ing in antenna ranges RF jumpers for adding signal- conditioning hardware or other test instruments LAN and device- side USB interfaces provide alternatives to GPIB for remote programming Removeable hard drive for secure environments 07 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

C Test port 1 Test port 3 A Rear panel Source 1 OUT 1 OUT 2 Pulse modulator Pulse modulator Source 2 OUT 1 OUT 2 +28 V Signal combiner J9 J10 J11 J8 J7 Flexible Architecture 1. Each test port includes test and reference couplers and receivers, source a nd receiver attenuators, and a bias tee, for maximum accuracy and lexibility . 2. The built-in signal combiner greatly simpliies the setup for intermodulati on distortion and X-parameter measurements. 3. Internal pulse modulators enable integrated pulsed-RF testing over the f ull frequency range of the instrument, eliminating expensive and bulky external modulat ors. 08 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

D Rear panel Test port 2 B Noise receiver 8.5/ 13.5/26.5 43.5/50 GHz To receivers LO J2 J1 J4 J3 3 Pulse generators 4. Switchable rear-panel jumpers provide the lexibility to add signal- conditioning hardware or route additional test equipment to the DUT without moving test cables. 5. Setting up pulse timing for the pulse modulators and internal IF gates is easy using the built-in pulse generators. 6. Internal low-noise receivers, along with advanced calibration an d measurement algorithms, provide the industry’s most accurate noise igure measurement s. 09 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Pulsed-RF measurement challenges – Pulse generators and modulators required for pulsed-RF measurements add complexity in test setups –For narrow pulses: – Maximum IF bandwidth of analyzer is often too small for wideband detection – Narrowband detection is slow, and measurements are noisy for low-duty-cycle pulses PNA-X pulsed-RF measurements provide: – A simple user interface for full control of two internal pulse modulators (Option 021 and 022), and four internal independent pulse generators (Option 025) –Point-in-pulse measurements with 20 ns minimum pulse width, and pulse proil e measurements with 10 ns minimum resolution (Option 008) – Improved measurement speed and accuracy for narrowband detection using hardware ilters and patented spectral-nulling and software IF-gati ng techniques – Measurements using wideband detection with pulse widths as narrow as 100 ns – Pulse I/O connector on rear panel for synchronization with external equipment and DUT – Accurate active-component characterization using unique application measurement classes for gain compression, swept-frequency/power IMD, and noise igure Pulsed-RF measurement application automatically optimizes inter nal hardware coniguration for speciied pulse conditions to dramatical ly simplify test setups. Alternately, users can choose to manually set up th e hardware for unique test requirements. Pulse proile measurement using narrowband detection technique all ows 30 measurement points within 300 ns pulse, with 10 ns timing resolution. Providing the irst one-box pulsed-RF test system, the PNA-X sets a new standard for simplicity, speed, and accuracy. By the 1990s, the HP 8510 was the industry- standard for pulsed-RF vector network analyzers. The PNA Series replaced the pulsed 8510 with a bench-top solution. Innovative

Applications

Simple, fast and accurate pulsed-RF measurements (Options 008, 021, 022, 025) 10 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X’s narrowband detection method used for narrow pulse widths (< 267 ns) employs special hardware and patented software-gating techniques to improve system dynamic range for low-duty-cycle measurements by 40 dB compared to PNA-based pulsed-RF systems. Using receiver leveling improves the pulsed-RF power accuracy from +/- 1 dB to less than 0.05 dB. Above measurements compare the results with and without receiver leveling in GCA measurements. Inaccurate stimulus causes large erro rs in power-dependent measurements such as input and output power at the compression point versus frequency. The PNA-X accurately characterizes active devices under pulsed oper ation with a single set of connections to the DUT—pulsed S-parameters, pulse proile (input and output power in the time domain), gain compression versus frequency, and swept-frequency IMD are measured in this exampl e. Tips from the experts – Compared to sweep averaging, point averaging typically provides faster results when averaging is needed to lower noise and improve accuracy of measurements using wide- band detection. – During source power calibrations, power sensors read the average power, while the analyzer sets the peak power of the pulsed stimulus. To compensate for the difference between the peak and average power, use the power offset feature with the value of 10 log (duty cycle). – The minimum pulse width for point-in-pulse measurements using wideband detection is determined by the number of samples required for the IF bandwidth (IFBW). For example, the minimum pulse width is 100 ns with 15 MHz IFBW, 300 ns with 5 MHz IFBW, and 1.44 μs with 1 MHz IFBW. When working at the minimum pulse width for a particular IFBW, it is important to precisely set the measurement delay (with 10 ns resolution) to align the pulse modulation and the data acquisition period. – In pulse mode, it is important to use receiver leveling to maintain power-level accuracy for power-dependent measurements, such as output power, compression, and intermodulation distortion. Freq (GHz) dB Output power @ compression Input power @ compression R1 receiver leveling Gain @ linear input power Gain @ compression Open loop 11 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Options 028, 029) Noise igure measurement challenges with traditional, Y-factor approach – Multiple instruments and multiple connections required to fully characterize DUT –Measurement accuracy degrades in-ixture, on-wafer, and automated-test environments, where noise source cannot be connected directly to DUT – Measurements are slow, often leading to fewer measured data points and misleading results due to under-sampling PNA-X noise igure solution provides: –Ampliier and frequency converter measurements with the highest accuracy in the industry, using advanced error-correction methods –Fast measurements: typically 4 to 10 times faster than Keysight’s NFA Seri es noise igure analyzers – Ultra-fast noise-parameter measurements when used with Maury Microwave automated tuners, giving 200 to 300 times speed improvements On-wafer automated-test environment Noise source AUT Wafer probes For Y-factor measurements, any electrical network connected betwe en the noise source and the DUT, such as cables, switch matrices, and wafer probes, causes signiicant accuracy degradation. For this 401 point measurement of an unmatched transistor, the PNA-X exhibits much less ripple compared to the Y-factor method. The NFA default of 11 trace points would give under-sampled and therefore misleading results of the ampliier’s performance. Test Engineering Manager 12 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Noise-parameter measurements in minutes rather than days Noise igure measurement methods Y-factor: The most prevalent method for measuring noise igure is the Y-factor tech - nique. It relies on a noise source connected to the input of the device under test (DUT) . When the noise source is turned off, it presents a room temperature (cold) source termination. When the noise source is turned on, it creates excess noise, equiv alent to a hot source termination. Under these two conditions, noise power is measur ed at the output of the DUT, and the scalar gain and noise igure of the ampliier is calculated . The Y-factor method is used by Keysight’s NFA Series and by spectrum analyze rs with preampliiers and a noise igure personality option. Cold Source: An alternate method for measuring noise igure is the cold source or direct noise technique. With this method, only one noise power measurement i s made at the output of the DUT, with the input of the ampliier terminated with a room temperature source impedance. The cold source technique requires an independent measurem ent of the ampliier’s gain. This technique is well suited for vector network analy zers (VNAs) because VNAs can measure gain (S21) extremely accurately by utilizing vect or error correction. The other advantage of the cold source method is that both S-para meter and noise igure measurements can be made with a single connection to the DUT. SourceNoise parameters vs. frequency Frequency: 0.80 to 8.00 GHz Setting up and making noise-parameter measurements is simple and fast u sing a PNA-X and a Maury Microwave automated tuner. Maury’s latest software dramatically i mproves both the speed and ac- curacy of noise-parameter measurements, making them a practical opt ion for all RF engineers. Noise receiver DUT Noise receiver DUT 13 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Option 028, 029) (continued) PNA-X’s unique source-corrected noise igure solution –Uses modiied cold-source method, eliminating need for noise source when measuring DUT – Corrects for imperfect system source match by using vector correction to remove mismatch errors plus an ECal module used as an impedance tuner to remove noise-parameter-induced errors –Maintains high measurement accuracy in ixtured, on-wafer, or automated -test environments – Accurately measures differential devices using vector deembedding of baluns or hybrids DUT Measure differential devices by deembedding baluns or hybrids. At each test frequency, four or more noise measurements are made with known, non-50-ohm source impedances. From these measurements, 50-ohm noise igure is accurately calculated. DUT Test port 1 Test port 2 A B To receivers LO Source 2 Output 1 Source 2 Output 2 Pulse generators +28 V Noise receivers

10 MHz to

3 GHz

26.5 GHz

Block diagram of a two-port N5242A PNA-X with Options 200, 219, 224, and Nois e Figure Option 029. A standard ECal module is used as an impedance tuner to help remove the effects o f imperfect system source match. N5244/45/47A models include a built-in impedance tuner. 14 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

–Noise igure measurements are best done in a screen room to eliminate spurious interference from mobile phones, wireless LAN, handheld transceivers, etc. – Batteries are sometimes used instead of mains-based power supplies to eliminate conducted interference from sensitive LNA measurements – Overall measurement accuracy can be estimated by using Keysight’s Monte-Carlo-based noise igure uncertainty calculator Keysight’s PNA-X noise igure uncertainty calculator (www.keysight.com/ind/nfcalc) includes the effects of mismatch and noise-parameter-induced errors caused by imperfect system source match. Noise igure measurement uncertainty example in an automated test environment (ATE). The PNA-X’s source- corrected technique is considerably more accurate than the Y-factor method. 15 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Option 086) Gain compression measurement challenges –Characterizing ampliier or frequency converter compression over its op erating frequency range requires measurements at many frequency and power points, s o setting up the measurements, calibration, and data manipulation takes a lo t of time and effort – A variety of errors degrade measurement accuracy, such as mismatch between the test port and the power sensor and DUT during absolute power measurements, and using linear S-parameter error correction in nonlinear compression m easurements PNA-X gain compression application (GCA) provides: – Fast and convenient measurements with SMART Sweep –Highly accurate results using a guided calibration that provides power and m ismatch correction – Complete device characterization with two-dimensional (2D) sweeps, with the choice of sweeping power per frequency, or sweeping frequency per power – Flexibility with a variety of compression methods—compression from linear gain, maximum gain, X/Y compression, compression from back-off, or compressio n from saturation Pin Frequency Gain Compression point Pin Frequency Gain Compression point Iteration point A network analyzer is commonly used for gain compression measure - ments by performing power sweeps at multiple CW frequencies. The PNA-X’s GCA makes it easy to characterize compression over the DUT’s operating frequency range with extreme speed and accuracy, and a simple setup. Instead of a linear power sweep with many points, GCA’s SMART Sweep uses an adaptive algorithm to ind the desired compression point at each frequency with just a few power measurements, thus signiicantly reduc ing test times. Complete device response to 2D sweeps—gain versus frequency and power—can be extracted for device modeling. Using only power correction, incident power at compression point exhibits large ripple due to DUT mismatch Measurement ripple is reduced with GCA by using power and mismatch correction 16 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Pin Freq. Gain Compression Pin Freq. Gain Compression Available compression methods – Use the safe mode in SMART Sweep to increment the input power irst with coarse and then with ine steps to prevent over driving the DUT – When the DUT’s hysteresis or thermal effects are in doubt, it is recommended to sweep frequency per power rather than power per frequency, or to add dwell time to lower the effects from previous measurements –Compression analysis capability extracts the DUT response over the power range at a speciied frequency point on any of the compression traces – Use the CompAI1 and CompAI2 internal voltmeter readings that are synchronized to the compression point to measure power-added eficiency (PAE) at compression for each frequency Measured background data in SMART Sweep with Safe Mode Off (above) and On (below)— more iterations are used as the gain becomes closer to the 1 dB compression point with Safe Mode On, which minimizes excess drive power. Compression from linear gain The linear gain is measured using the speciied linear (input) power level. The com - pression point is calculated as the linear gain minus the speciied compression level. Compression from max gain The highest gain value that is found at each frequency is used as the max gain. The com - pression point is calculated as the max gain minus the speciied compression level. Compression from back off The gains at two input powers that are dif - ferent with the speciied back off level are compared. The compression point is found as the highest input power with the gain differ - ence of the speciied compression level. X/Y compression The output powers at two input powers that are different with the speciied delta X are compared. The compression point is found as the highest input power with the output power difference of the speciied delta Y. Compression from saturation The compression point is found at the highest output power minus the value speciied as “From Max Pout”. Input power Gain Linear gain Specified compression level Compression point Input power Gain Specified compression level Compression point Max gain Input power Gain Back off level Specified compression level Compression point Input power Output power Delta X Compression point Delta Y Input power Output power From Max Pout Highest output power 17 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

distortion (IMD) measurements with simple setup (Option 087) IMD measurement challenges – Two signal generators, a spectrum analyzer, and an external combiner are most commonly used, requiring manual setup of all instruments and accessories – Test times are slow when swept-frequency or swept-power IMD is measured – Instruments and test setups often cause signiicant measurement errors due to source-generated harmonics, cross-modulation, and phase noise, plus receiver compression and noise loor PNA-X with IMD application provides: – Fast swept IMD measurements of ampliiers and frequency con - verters, using internal combiner and two internal sources The PNA-X with IMD application replaces two signal generators and a spectrum analyzer in the system rack, simplifying the system coniguration and increasing test throughput. IMD application measures third order IMD and IP3 at 201 frequency (or power) points in a matter of seconds, compared to several minutes using signal generators and a spectrum analyzer. Frequency-offset mode is commonly available in VNA’s, but conventional IF ilter responses exhibit high side lobes. The IM Spectrum mode employs an optimized digital IF ilter and pro - vides true spectrum measurement capability in the PNA-X. Two internal sources with high output power, wide ALC range, -60 dBc harmon ics, and a high- isolation combiner, make the PNA-X an ideal instrument to drive the DUT for t wo-tone IMD measurements. Wide dynamic-range receivers with high compressio n points enable accurate measurements of low-power IMD products while the higher power main tone s are present. DUT Test port 1 Test port 2 A B To receivers LO Source 2 Output 1 Source 2 Output 2 Rear panel Source 1 OUT 1 OUT 2 Pulse modulator Source 2 OUT 1 OUT 2 Pulse modulator J9 J10 J11 J8 J7 J2 J1 Swept-frequency IMD Swept-power IMD Frequency offset mode IM Spectrum –Quick and easy measurements with simpliied hardware setup and intuitive us er interface –Guided calibration that simpliies the calibration procedure and provid es high measurement accuracy – Spectrum analyzer mode for troubleshooting or making spurious measurements, eliminating the need for a separate spectrum analyzer – Very clean internal sources and wide receiver dynamic range, minimizing the measurement errors caused by other instruments 18 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

– Calibrate at all measurement frequencies or at center frequencies only, trading off productivity and accuracy – Let the PNA-X control external signal generators to greatly simplify swept IMD measurements of mixers and converters – Use the Marker to IM Spectrum feature to show the spectrum at a speciied point on the swept IMD trace – Use point averaging with IM Spectrum, especially when using a wide resolution bandwidth, to reduce the noise deviation of the noise loor with minimum speed impact Calibrating all frequencies is recommended for wide tone spacing. Although the calibration takes longer with “all frequencies” , measurement speed is not affected. The IM Spectrum in the lower window shows the spectrum correspond- ing to the Swept IMD marker at the center of the trace in the upper window. Point averaging is applied to the IM Spectrum to reduce the noise deviation. IMD and IP3 versus LO power yields maximum IP3 with lowest possible LO drive power. This helps specify the mixer setup to achieve maximum eficiency while minimizing power consumption. Sweep fc Sweep Delta F Power Sweep CW LO Power Sweep Segments Center Frequency Swept Fixed Fixed Fixed Fixed Swept (as deined by segment table) Tone Spacing Fixed Swept Fixed Fixed Fixed Fixed Tone Powers Fixed Fixed Swept (coupled or uncoupled) Fixed Fixed Fixed Diagram Cal all frequencies Cal center frequencies Delta F f1 f2 fc Delta F f1 f2 fc Delta F f1 f2 fc Delta F f1 f2 Delta F f1 f2 fc Delta F f1 f2 fc f1LO f2fc Delta F f1 f2 fc Delta F f1 f2 fc 19 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Options 082, 083, 084) Mixer and converter measurement challenges – Traditional approach with spectrum analyzer and external signal sources is cumbersome, slow, and does not pro- vide phase or group delay information – Conventional VNAs require an external signal source, which degrades sweep speed – Conventional VNAs provide phase or group delay data relative to a “golden” device – Attenuators are often used to minimize ripple due to input and output mismatch, at the expense of dynamic range and calibration stability Option 083’s Scalar Mixer/Converter plus Phase (SMC+Phase) makes mixer and converter mea- surements simple to set up since reference and calibration mixers are not required. Calibration is easy to perform using three broadband standards: a power meter as a magnitude standard, a comb generator as a phase standard, and an S-parame- ter calibration kit (mechanical or ECal module). The Vector Mixer/Converter technique provides measurements of match, conversion loss/gain, delay, phase difference between multiple paths or devices, and phase shifts within a device. Keysight’s patented Vector Mixer/ Converter calibration method uses open, short, and load standards to create a characterized-mixer through standard. SMC+Phase LO IF IF+ RF IF = RF-LO OPEN SHORT LOAD Calibration mixer/filter pair - - - - PNA-X frequency converter applications provide: – Simple setup using internal second signal source as a local oscillator (LO) signal – Typical measurement time improvement of 100x compared to spectrum analyzer- based approach –High measurement accuracy using two patented techniques: – Scalar Mixer/Converter (SMC) provides match and most accurate conversion loss/gain measurements by combining two-port and power-meter calibr ations (Option 082), and with Option 083, calibrated absolute group delay measur e- ments without a reference or calibration mixer – Vector Mixer/Converter (VMC) provides measurements of match, conversion loss/gain, delay, phase difference between multiple paths or devices, and phase shifts within a device, using a vector-calibrated through mixer (Option 083) – Input and output mismatch correction reduces ripple and eliminates the need for attenuators – Embedded-LO feature (Option 084) extends SMC and VMC measurements to converters with embedded LOs without access to internal time bases VMC 20 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

With two internal signal sources, the PNA-X provides fast measurement s of both ixed and swept IF responses. Time-domain gating can remove ripple by removing unwanted, time-del ayed responses due to spurious signals. DUT Both SMC and VMC can be used to measure converters with embedded LOs, without need for access to internal time bases. Swept LO Fixed IF Fixed LO Swept IF Tips from the experts – Narrowing the IF bandwidth helps eliminate spikes on the measurement trace that result from LO feed through and other spurious signals from the DUT – To prevent source-unleveled errors when measuring devices with high-level spurious outputs (such as uniltered mixers), it is often helpful to increase the amount of source attenua- tion to provide better isolation between the DUT and the PNA-X – When making VMC measurements on multistage converters, it is best to create a single “meta-LO” signal that can be used to drive the reference and calibration mixers –When measuring uniltered mixers, time-domain gating can be a useful tool to reduce ripple by removing undesired, time-delayed responses due to spurious signals SMC’s match correction greatly reduces mismatch errors in conversion loss/gain measurements, eliminating the need for attenuators at the ends of the test cables. VMC’s match correction greatly reduces mismatch errors in group delay measurements, eliminating the need for attenuators at the ends of the test cables. 21 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

component characterization (Option 090) Spectrum analysis challenges for component testing – Measuring spurious performance is time consuming, especially when searching for low-level spurs over a broad frequency range –Long measurement times may force insuficient test coverage – Characterizing spurs over operating range of the DUT is tedious to accomplish or requires external control software PNA-X spectrum analyzer (SA) option provides: – Fast spurious searches over broad frequency ranges – A multi-channel SA with internal swept-signal generators for eficient spurious analysis of mixers and converters –In-ixture spectrum measurements using VNA calibration and de-embedding techniques – Fast band- and noise-power measurements – SA capability to the PNA-X’s single-connection, multiple- measurement suite Spectrum analyzer option adds fast spur search capability to the PNA-X, r eplacing a standalone spectrum analyzer and switch matrix in component-chara cterization test systems. Above plot shows -84 dBm spurious measurements in the presence of a +10 dBm signal, with (from top to bottom) approximate S/N (at RBW) of 80 dB (300 kHz), 90 dB (30 kHz), 100 dB (3 kHz), and 110 dB (300 Hz) Sweep time versus span with 12 GHz center frequency for -80 dBm and -90 dBm noise loor. The receiver attenuator is set to avoid compression with a +10 dB m signal. 10-2 10-1 100 101 102 Sweep Time (s) -80 dBm Noise Floor ( dBm) 103 -90 dBm Noise Floor ( dBm)

1 GHz 10 GHz 20 GHz 1 GHz 10 GHz 20 GHz

22 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

– Choose different levels of software-image rejection to trade-off measurement speed with thoroughness, based on the spectral density of the measurement – For harmonics measurements, add a separate SA channel for each harmonic with a narrow frequency span and RBW to optimize speed and sensitivity, and with enough receiver attenuation to avoid internally-generated harmonics – To help identify spurious signals that might be interfering with a measurement, use the Marker-to-SA feature to easily create a spectrum display with the same stimulus conditions at the marker position in SMC, swept-IMD, or standard channels –When using de-embedding to measure in-ixture or on-wafer devices, use the power-compensation feature to overcome the loss of the ixture or probes, thereby delivering a known stimulus power to the DUTVNA calibration and ixture de-embedding remove cable and ixture effec ts and correct receiver response errors, providing calibrated in-ixtur e spectrum analysis. Unlock true performance with VNA calibration Having spectrum analyzers on all ports of a mixer or converter provides unparalleled insight into the performance of the device. With a single set of connections, the spurious content emanat - ing from all ports is readily apparent during operation with ixed or swept stimuli. Measured spurs can include LO, RF, and IF feedthrough, harmonics, intermodulation products, and other higher-order mixing products. Conversion loss and match versus frequency is easily seen in a companion SMC channel (bottom). Output spectrum on IF port Output spectrum on RF port Input spectrum on RF port Output spectrum on LO port Measurement plane Device plane Coaxial interface Coaxial interface Measurement plane Test fixture LO RF IF 1 2 3 4 Providing multi-channel spectrum analysis Pout at measurement plane Pout at device plane No error correction 23 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Option 090) Spectrum analysis challenges for component testing – Measuring spurious performance is time consuming, especially when searching for low-level spurs over a broad frequency range –Long measurement times may force insuficient test coverage – Characterizing spurs over operating range of the DUT is tedious to accomplish or requires external control software PNA-X spectrum analyzer (SA) option provides: –Fast spurious searches over broad frequency ranges –A multi-channel SA with internal swept-signal generators for eficient s purious analysis of mixers and converters –In-ixture spectrum measurements using VNA calibration and de-embedding techniques –Fast band- and noise-power measurements –SA capability to the PNA-X’s single-connection, multiple-measureme nt suite Spectrum analyzer option adds fast spur search capa- bility to the PNA-X, replacing a standalone spectrum analyzer and switch matrix in component-characterization test systems. 24 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Option 088) Ampliier load-pull measurement challenges –Ampliier gain, output power, and power eficiency are commonly measured unde r different output-load conditions to determine the optimum large-si gnal match – Traditional approach uses mechanical tuners which can handle high power, but are slow and cannot supply highly relective loads PNA-X with source-phase control provides –Control of second source to electronically tune relection coeficient at o utput of ampliier –Fast tuning speed and full relection – Match correction for accurate amplitude and phase control –Measurements of ampliier output power, match, gain, and PAE under different load conditions Example of load circles generated by keeping the magnitude of ΓL constant while sweeping phase Generate arbitrary output- load impedances by control - ling the magnitude and phase of the signal coming out of port 3 while the DUT is driven from port 1 Tips from the experts – Measurement setups can use receiver (R3, C...) or wave (a3, b3…) terminology – Use the equation editor to calculate the power delivered to the load (forward power - reverse power) as sqrt(pow(mag(b3_3),2) - pow(mag(a3_3),2)) – Use mechanical tuners and external software for hybrid load-pull systems that can handle high output power and achieve full relection – When using external signal sources, connect instru- ments to a common 10 MHz frequency reference 25 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

modulators, and differential mixers (Option 089) I/Q and differential converter measurement challenges – Requires signals with 90° or 180° phase difference –Traditional approach uses hybrid couplers and/or baluns which are: – Inherently band-limited, requiring multiple components for broadband measurements –Limited to ixed phase offsets, preventing phase sweeps to determine opti mum alignment – Lossy and inaccurate (+/- 3° to 12° typically) –Dificult to use with on-wafer setups PNA-X differential and I/Q devices application – Provides accurate phase control of internal and external sources, eliminating the need for hybrid couplers and baluns –Tunes receivers to all user-speciied output frequencies needed to fully ch aracterize the DUT – Sweeps frequency to measure operating bandwidth or sweeps phase and power at a ixed frequency to measure quadrature or differential imbalance – Includes match-corrected power measurements for highest accuracy The I/Q inputs of this modulator can be directly driven with the internal sources of the PNA-X, eliminating the need for a 90° hybrid coupler Tips from the experts – Two additional external sources can be used to create differential I/Q drive signals. The external sources must be routed through the PNA-X test set to measurement receivers in order to achieve the desired phase offsets. – For I/Q modulators, DC power supplies or source-measurement units (SMUs) can be routed through the bias tees to the I/Q inputs of the DUT. Voltage sweeps can then be performed to help ind the optimum I/Q- voltage offsets for the greatest amount of LO suppression. –Measure harmonics and total-harmonic distortion (THD) of different ial ampliiers by establishing a true-differential drive and tuning the PNA-X receivers to all desired harmonics – Measure compression of differential mixers using power sweeps 26 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Option 460) Differential ampliier measurement challenges – Conventional two-port VNAs with baluns do not provide common-mode, differential to common-mode, and common to differential-mode responses – Baluns are inherently band-limited devices, which forces multiple test setups for broad frequency coverage – Phase errors of baluns provide inac- curate differential responses – Modern four-port VNAs provide mixed-mode S-parameter measure- ments with single-ended stimulus, but differential ampliiers may respond differently when in compression during real operating environments PNA-X integrated true-mode stimulus application (iTMSA) provides: – Mixed-mode S-parameters of differential ampliiers driven by true differential and common-mode signals – Mismatch correction at the DUT input to minimize phase errors between two sources – Input-only drive mode that prevents damage on ampliiers caused by stimulus on the output port –In-ixture arbitrary phase offset and phase-offset sweeps to optimize input matching network for maximum ampliier gain 2 1 4 3 Differential (180 out-of-phase) Common (in-phase) Using the PNA-X’s two internal sources, iTMSA drives the differential ampliier under real world conditions, providing accurate mixed-mode S- parameters in all operating environments. Mixed-mode S-parameters. Without mismatch correction, the delivered signals to the DUT will not be truly differential due to relection from the DUT input and the subsequent re-relection from the sources. The relected signals overlay the original signals, causing phase and amplitude imbalance. This effect can be corrected with mismatch correction. iTMSA compensates for mismatch errors by measuring the raw matches of the VNA and DUT, and precisely adjusting the amplitude and phase of the two signals at the reference plane to achieve ideal true-mode signals. Phase error Amplitude error DUT mismatch Source mismatch Phase after mismatch correction Phase without mismatch correction Frequency (Hz) Phase Error (Deg) 27 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Phase-offset sweeps change the phase- offset value as if it were added in the ixture, enabling input-matching circuit validation. Power or Gain Phase Offset (degrees from perfect differential) +10 -10 Actual Sdd21: Peaked at -5 degree phase offset Ideal Sdd21: peaked at 0 degree phase offset Differential input power -5 0 Various stimulus and sweep settings are available in the Balanced DUT Top ology dialog, allowing you to select the right coniguration for all of your balan ced devices. Tips from the experts – Input-only true-mode drive assumes a perfect match between the DUT output and the VNA’s test ports, which is a good assumption when the DUT’s reverse isolation is high. When the reverse isolation is low, adding attenuator s on the output port improves the system match and reduces mismatch errors. – When comparing the test results between single-ended and true-mode drive conditions with the same effective delivered differential power, th e individual port powers with true-differential drive must be set 6 dB lower than the port powers used with single-ended drive. Single-ended drive 0 dBm port power = -3 dBm differential power + -3 dBm common-mode power True differential drive -3 dBm port power = –6 dBm port 1 single-ended power + –6 dBm port 3 single- ended power In-ixture phase-offset sweeps reveal the optimal phase offset to achi eve the highest ampliier gain, which is essential to the design of the input matching circuit. 28 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Powerful, fast and accurate automatic ixture removal (AFR) (Option 007) Powerful AFR features can handle a variety of measurement needs – Single ended and differential devices –Left and right side of ixture can be asymmetrical –Thru lengths can be speciied or determined from open or short measurements – Band-pass time-domain mode for band-limited devices – Extrapolation to match DUT frequency range –Power correction compensates for ixture loss versus frequency –De-embed iles can be saved in a variety of formats for later use in PNA, ADS, and PLTS AFR is the fastest way to de-embed a ixture from the measurement Measurement Challenge: Many of today’s devices do not have coaxial connectors and are put in ixtures in order to mea - sure them in a coaxial environ- ment. Accurately removing the effects of the ixture is required to get a good measurement of the device under test (DUT). A ive-step wizard guides you through the process to characterize your ixture and remove it from your measurement. DUT and Fixture Thru Standard Open or Short Standard Coax input Coax input Coax input Coax input Coax input Coax input Right-half fixtureRight-half ixture Right-half ixture Left-half fixtureLeft-half fixture Left-half ixture Fixture A DUT Fixture B Fixture A Fixture B Fixture A Fixture B Yesterday without AFR Complicated modeling in EM simulation software or multiple calibration s tan- dards fabricated on board were needed to characterize and remove a ixture. Today with AFR First calibrate in coax with the reference planes at the inputs to your ixture. Then measure one or more standards designed as a replica of the ixture’s 2-port thru, or ixture half terminated with an open or short. Or, even faster: just measure the actual ixture itself before the DUT is instal led for the open standard. AFR automatically characterizes and removes yo ur ix- ture from the measurement. 29 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

AFR accuracy is comparable to on-board TRL calibration, but much easier to accomplish. Measurement example In the plots below, the green trace is a measurement of a Beatty Standard DUT before AFR ixture removal. The red trace is the DUT with AFR open-standard ixture removal. The blue trace is the DUT with AFR thru-standard ixture removal. The effects of ixture mismatch and length are removed from the DUT measurements. Good correlation is shown between the AFR open- and thru-standard ixture characterizations. A relative comparison of various ixture error-correction methods Fixture A DUT Fixture B Beatty Standard DUT S11 and S21 in frequency domain 30 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X’s unique hardware architecture provides: – Two- and four-port solutions for measurements on a wide variety of single-ended and balanced millimeter-wave devices – True-mode differential measurements at millimeter-wave frequencies using two internal sources – Fully integrated solution for millimeter-wave pulse measurements using built-in pulse modulators, pulse generators, and receiver gates – Accurate leveled power at millimeter-wave frequencies with advanced source-power calibration methods –Direct connection of terahertz modules driven by a 50 GHz PNA-X –Single-sweep network analysis from 10 MHz to 110 GHz with full power-level c ontrol, using the 67 GHz PNA-X and millimeter-wave extension modules Two- and four-port conigurations Four-port system architecture Four-port single-sweep

10 MHz to 110 GHz

The N5262A millimeter-wave test-set control- ler connects four millimeter-wave test modules to the PNA-X. For two-port measurements, the N5261A millimeter-wave test-set controller is available. Block diagram of a 4-port millimeter- wave system with coherent source control of OML modules using the N5262A millimeter-wave test-set controller. PNA-X-based 110 GHz systems come in two- and four-port versions, with power-level con - trol, true-differential stimulus, and the ability to measure frequency converters with SMC. These systems are table-top replacements for 8510XF systems, with superior performance. Direct connection of VDI modules to a 50 GHz PNA-X enables S-parameter measurements to 1.05 THz. T est port 3 C T est port 1 T est port 4 T est port 2 A D B LO Pulse generator s Source 1 OU T 1 OU T 2 Source 2 OU T 1 OU T 2 ALC Module Power IF Multiplexer R A B C D IF outputs R A B C D IF inputs ALC M1 M2 M3 M4 ALC LO M1 M2 M3 M4 R1 T1 R2 R3 R4 T2 T3 T4 RF RF T est Set Interface Terahertz measurements 31 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

The PNA-X’s internal pulse modula- tors create pulsed-RF signals for the millimeter-wave modules, making it easy to set up and perform pulsed millimeter-wave measurements. Scalar mixer measurements A two-module system can be used to provide fundamental RF and LO signals to a millimeter-wave mixer for conversion loss measurements. Gain compression Using calibrated source-power sweeps, the PNA-X provides the most accurate millimeter-wave gain-compression measurements in the industry. True-mode differential measurements at millimeter-wave frequencies –Highest measurement accuracy in the industry using advanced error- correction methods – Integrated phase sweeps with power control Pulse proile at 77 GHz using the internal pulsed source and IF gates of the PNA-X. Two-module system. Example gain compression measurement of a 75 to 110 GHz packaged PHEMT transistor ampliier. True differential measurement of a balanced LNA using a PNA-X, the N5262A millimeter-wave test-set controller, and four millimeter-wave test modules. RF Input 77 to 81 GHz DUT fundamental mixer LO Input 78 to 82 GHz IF Output

1 GHz

–Use a four-port N5262A test-set controller to conigure two different two- port waveguide-band setups. – If you do not have a millimeter-wave power sensor, you can still create a power- calibration table using the PNA-X’s internal reference receiver, fo r accurate relative source-power changes of the millimeter test modules. – For applications that don’t require a test-set controller, Keysight’s downloadable macro makes it easy to conigure direct-connection millimeter-wave set ups. 32 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

(Options 510, 514, 518, and 520) High-power design challenges – Active devices are commonly driven into nonlinear regions, often by design to increase power eficiency, information capacity, and output power – Under large-signal drive conditions, active devices distort time-domain waveforms, generating harmonics, intermodulation distortion, and spectral reg rowth – Current circuit simulation tools that rely on S-parameters and limited nonlinear behavioral models are no longer suficient to fully analyze and predict non linear behavior of devices and systems – Fewer design iterations are required to meet current time-to-market demands S-parameters in a nonlinear world In the past, when designing systems with high-power ampliiers (HPAs), des igners measured ampliier S-parameters using a vector network analyzer, loade d the results into an RF simulator, added other measured or modeled circuit elements, and t hen ran a simulation to predict system performance such as gain and power-eficie ncy under vari- ous loads. Since S-parameters assume that all elements in the system are linear, this a pproach does not work well when attempting to simulate performance when the ampliier i s in compression or saturation, as real-world HPAs often are. The errors are par ticularly ap- parent when simulating the combined performance of two cascaded devices t hat exhibit nonlinear behavior. While engineers may live with this inaccuracy, it in variably results in extensive and costly empirical-based iterations of the design, addin g substantial time and cost to the design and veriication process. 33 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Keysight’s award-winning NVNA goes beyond S-parameters to: –Eficiently and accurately analyze and design active devices and system s under real-world operating conditions, to reduce design cycles by as much as 50% – Gain valuable insight into device behavior with full nonlinear component characterization (Option 510) –Display calibrated time-domain waveforms of incident, relected, a nd trans- mitted waves of the DUT in coaxial, in-ixture, or on-wafer environments – Show the amplitude and phase of all harmonic and distortion spectral products to design optimal matching circuits –Create user-deined displays such as dynamic load lines – Measure with full traceability to the National Institute of Science and Technology (NIST) – Provide fast and powerful measurements of DUT nonlinear behavior using X-parameters (Option 514) – Extend linear S-parameters into nonlinear operating regions for accurate predictions of cascaded nonlinear device behavior using measuremen t-based data – Easily import the NVNA’s X-parameters into Keysight’s Advanced Design System (ADS) to quickly and accurately simulate and design nonlinear com- ponents, modules and systems – Measure memory effects such as self heating and signal-dependent bias changes (Option 518) – Capture complete load-dependent nonlinear component behavior with X-parameters and external impedance tuners (Option 520) Breakthrough technology accurately characterizes nonlinear behaviors Testing today’s high-power devices demands an alternate solution— one that quickly and accurately measures and displays the device’s nonlinear behavior unde r large signal conditions, and provides an accurate behavioral model that can be u sed for linear and nonlinear circuit simulations. The Keysight nonlinear vec tor network ana- lyzer (NVNA) and X-parameters provide that solution. Measure complete linear and nonlinear component behavior with the Keysight NVNA, and then accurately perform simulations and optimiza tions with Keysight’s Advanced Design System. Keysight’s NVNA software options and accessories convert a Keysight 4-port PNA-X network analyzer into a high-performance nonlinear vector network analyzer. 34 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Challenges of antenna and radar cross-section (RCS) measurements – Many data points must be collected, resulting in long test times –In far-ield and RCS measurements, signals can be close to the noise loor of the test receiver, resulting in noisy measurements – Large installed-software base exists for 8530A antenna receivers , which have been discontinued and are no longer supported PNA-X-based antenna solutions provide: –Flexibility in system design: choose a standard PNA-X or an N5264A low-cost dedicated measurement receiver based on PNA-X hardware –Fast measurements: 400,000 data points per second simultaneously on ive receivers, yielding three to ive times improvement in test times compared to the 8530A – Large data collections with 500 million-point circular FIFO data buffer – Excellent measurement sensitivity via selectable IF bandwidths and point- averaging mode – Built-in 8530A code emulation for easy migration AUT Scanner controller LAN PNA-X network analyzer Source 2 out B/R2 A/R2 Delta elevation Delta Azimuth Sum R1/R2 PNA-X conigured for radar cross-section measurements. PNA-X conigured for near-ield measurements. 35 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

10 MHz

N5264A Opt. 108 7.606 MHz LO out (Opt. 108) Router hub LO in Trigger in/out PNA-X measurement receiver conigured for far-ield measurements (PNA-X Option 020 with IF inputs can also be used). Why should I migrate my 8530A system to the new PNA-X measurement receiver? – 8530A is no longer supported, so maintaining existing systems is getting harder and harder – PNA-X measurement receiver… – Offers built-in 8530A code emulation for full reuse of existing measurement software – Is fully compatible with your existing 8530A system components – Features 80 times improvement in data acquisition time – Contains an optional built-in high-output-power source (Option 108) that can be used as an LO for remote mixers or frequency converters What is the best choice for an antenna receiver? Application N5264A measurement receiver N524xA PNA-X Comments Near-ield No (requires external source) Yes Achieve faster measurement throughput with internal source Can use VNA for general-purpose component test Compact range Yes Yes Choice depends on the size of the antenna range Far-ield Yes No (higher cost) Distributed approach increases measurement sensitivity by strategic placement of system components Pulsed RF No Yes PNA-X offers built-in pulse generators and modu - lators that simplify the system coniguration 36 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

10 MHz in

Keysight N5181A Keysight N5264A How do I get a common 10 MHz reference signal to my source and PNA-X when it’s too far to use BNC cables? – Use low-cost GPS-based satellite receivers to obtain high-accuracy

10 MHz reference signals

– Place a GPS receiver near the transmit source, and one near the PNA-X – This approach works for arbitrary distances, from 100’s of meters to many kilometers How can I control external sources? 1. Connect PNA-X to source via LAN or GPIB 2. Use External Device Coniguration feature 3. Under Properties section: – Type name of external source, change Device Type to Source, and choose appropriate driver –Under Device Properties, choose between two trigger modes: Software CW (trigger cables not needed, but slow), or Hardware List (fast, but requires TTL triggers) – When the distance between the PNA-X and source is too far to use BNC trigger cables (> 40 meters), then a Keysight E5818A trigger box with LAN hub offers a good alternative Innovative (continued) 37 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

Frequency range 10 MHz to 8.5 GHz 10 MHz to 13.5 GHz 10 MHz to 26.5 GHz 10 MHz to 43.5 GHz

10 MHz to 67 GHz

(at 20 GHz) 121 to 130 dB depending on coniguration 124 to 141 dB with direct receiver access (typical) 121 to 125 dB depending on coniguration 133 to 137 dB with direct receiver access (typical) 122 to 129 dB depending on coniguration 136 to 140 dB with direct receiver access (typical) Maximum output power at test port (at 20 GHz) +13 dBm (Option 200, 400) +10 dBm (Option 219, 419) +15 dBm (Option 224) +10 dBm (Option 423) +13 dBm (Option 200, 400) +10 dBm (Option 219, 419) +10 dBm (Option 224, 423) +11 dBm (Option 200, 400) +8 dBm (Option 219, 419) +7 dBm (Option 224, 423) Maximum power sweep range 38 dB Corrected speciications1 (2-port cal, 3.5 mm) Dir 44 to 48 dB SM 31 to 40 dB LM 44 to 48 dB Rel trk +/-0.003 to 0.006 dB Trans trk +/-0.015 to 0.104 dB (2-port cal, 2.4 mm) Dir 36 to 42 dB SM 31 to 41 dB LM 35 to 42 dB Rel trk +/-0.001 to 0.027 dB Trans trk +/-0.020 to 0.182 dB (2-port cal, 1.85 mm) Dir 34 to 41 dB SM 34 to 44 dB LM 33 to 41 Rel trk 0.01 to 0.33 Trans trk 0.061 to 0.17 dB Trace noise 0.002 dB rms (1 kHz BW) Harmonics

10 MHz to 2 GHz

2 GHz -51 dBc typical -60 dBc typical Speciication and Feature Comparison Outstanding Performance 1. Dir = directivity; SM = source match; LM = load match; Rel trk= relection track ing; Trans trk = transmission tracking 38 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Coniguration Information Description Additional information Test set Option 200 2-ports, single source Option 224 2-ports, add internal 2nd source, combiner and mechanical switches Requires Options 200, one of 219 or H85, and 080 Option 400 4-ports, dual source Option 080 recommended Option 423 4-ports, add internal combiner and mechanical switches Requires Options 400, one of 419 or H85, and 080 Power coniguration Option 219 2-ports, extended power range and bias-tees Option 419 4-ports, extended power range and bias-tees Option H85 1 High power conigurable (for 2- or 4-port) Measurement applications Option 007 Automatic ixture removal Windows 7 OS required (upgrade ki t N8983A) and N52xxAU-007 Option 010 Time-domain measurements Option 028 2 Noise igure measurements using standard receivers Requires Option 082 or 083 for measuring frequency converters Option 029 2 Fully-corrected noise igure measure - ments Requires Option 080 and for N5241/42A, one of Options 219, 224, 419, 423 or H85. Fo r N5244/45/47A, requires Option 224 or 423. On N5247A, noise receivers wor k up to 50 GHz only. For measuring frequency converters, requires Option 082 or 083. Option 080 Frequency offset Option 082 3 Scalar-calibrated converter measurements Requires Option 080 Option 083 3 Vector- and scalar-calibrated converter measurements Requires Option 080 Option 084 Embedded LO measurements Requires at least one of Options 02 8, 029, 082, 083, 086, or 087 Option 086 Gain compression application Recommend Options 219, 41 9 or H85 and for measuring frequency converters, requires Option 082 or 083 Option 087 Intermodulation distortion application Requires Options 224 or 423 and for measuring frequency converters, requ ires Option 082 or 083 Option 088 Source phase control Option 089 Differential and I/Q devices Requires Option 080 and 400, 40 1, 410, 417, or 419 Option 460 Integrated true-mode stimulus application Requires O ption 400 Option 551 4 N-port capabilities Nonlinear vector network analysis Option 510 Nonlinear component characterization Requires Options 419 and 080, or 400, H85 and 080 Option 514 Nonlinear X-parameters Requires Options 423 and 510 Option 518 Nonlinear pulse envelope domain Requires Options 021 and 0 25 and either one of 510 or 514 Option 520 Arbitrary load-impedance X-parameters Requires Opt ion 514 Required NVNA accessories – U9391C 10 MHz to 26.5 GHz or U9391F 10 MHz to 50 GHz or U9391G 10 MHz to 67 GHz comb generato r (two required for nonlinear measurements) – Keysight power meter and sensor or USB power sensor – Keysight calibration kit, mechanical or ECal – Keysight signal generator, MXG or PSG used for X-parameter extraction ( internal 10 MHz reference output can be used for 10 MHz tone spacing applicat ions) 1. Order special model N524xAS instead of N524xA and add items N524xA-200 an d N524xAS-H85 for 2-port, extended power range, high power conigurati on, or items N524xA-400 and N524xAS-H85 for 4-port, extended power range, h igh power coniguration. Order N524xA-xxx items for other standard opt ions. Option H85 includes the extended power range of Options 219 and 419, and ther efore, they cannot be ordered together. 2. For source-corrected measurements, Options 028 and 029 on N5241/4 2/49A units require an ECal module for use as an impedance tuner. N5244/45/ 47A units include a built-in tuner. For calibration, Options 029 requires e ither a 346-series noise source (Keysight 346C recommended) or a power me ter, while Option 028 requires a power meter. All options require a power meter for meas uring mixers and converters. 3. Option 082 is a subset of Option 083; therefore, they cannot be ordered tog ether. 4. When conigured as a multiport analyzer using Option 551 and a multiport tes t set, the combiner feature of Option 224 or 423 is temporarily disabled. Whe n conigured as a standalone analyzer, the combiner feature is enabled. Wh en ordering a test set, select an option to specify the appropriate interco nnect jumper cable set between the analyzer and the test set. Available options 39 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

PNA-X Coniguration Information Description Additional information Pulse, antenna, mm-wave Option 008 Pulsed-RF measurements Requires Option 025 Option 020 Add IF inputs for antenna and mm-wave Option 021 Add pulse modulator to internal 1st source Option 022 Add pulse modulator to internal 2nd source Requires Option 224 or 400 Option 025 Add four internal pulse generators Option 118 Fast CW sweep Accessories Option 1CM Rack mount kit for use without handles Option 1CP Rack mount kit for use with handles Calibration software Option 8971 Perpetual license for built-in performance test software for Keysight inclusive calibration Option 898 1 Perpetual license for built-in performance test software for standards compliant calibration Calibration documentation Option 1A7 ISO 17025 compliant calibration Option UK6 Commercial calibration certiicate with test data Option A6J ANSI Z540 compliant calibration Additional Information Download the latest PNA-X application notes: Bookmark this page to download the latest PNA-X application notes to gain in-depth measurement knowledge. Get answers online from factory experts: Discuss calibration, applications, product, and programming topics at Keysight’s online network analyzer discussion forum. Get answers to your toughest measurement and design challenges and browse prior discussion topics. Available options (continued) 1. Additional hardware required. Please refer to the analyzer’s Servic e Guide for required service test equipment. www.keysight.com/ind/pnaxapps www.keysight.com/ind/na_forum 40 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure

*X-parameters is a trademark and registered trademark of Keysight Technologies in the US, EU, JP, and elsewhere. The X-parameter format and underlying equations are open and documented. For more information, visit; http://www.keysight.com/find/eesof-x-parameters-info myKeysight www.keysight.com/find/mykeysight A personalized view into the information most relevant to you. www.lxistandard.org LAN eXtensions for Instruments puts the power of Ethernet and the Web inside your test systems. Keysight is a founding member of the LXI consortium. Three-Year Warranty www.keysight.com/find/ThreeYearWarranty Keysight’s commitment to superior product quality and lower total cost of ownership. The only test and measurement company with three-year warranty standard on all instruments, worldwide. Keysight Assurance Plans www.keysight.com/find/AssurancePlans Up to five years of protection and no budgetary surprises to ensure your instruments are operating to specification so you can rely on accurate measurements. www.keysight.com/go/quality Keysight Technologies, Inc. DEKRA Certified ISO 9001:2008 Quality Management System Keysight Channel Partners www.keysight.com/find/channelpartners Get the best of both worlds: Keysight’s measurement expertise and product breadth, combined with channel partner convenience. www.keysight.com/find/pna www.keysight.com/find/pnaxapps www.keysight.com/find/na_forum 41 | Keysight | PNA-X Series Microwave Network Analyzers - Brochure This information is subject to change without notice. © Keysight Technologies, 2010 - 2015 Published in USA, May 7, 2015 5990-4592EN www.keysight.com Protect your software investment: Keysight protects your 8753, 8720 and 8510 software investment by providing migration tools to reduce your code-conversion effort. www.keysight.com/find/nadisco For more information on Keysight Technologies’ products, applications or services, please contact your local Keysight office. The complete list is available at: www.keysight.com/find/contactus Americas Canada (877) 894 4414 Brazil 55 11 3351 7010 Mexico 001 800 254 2440 United States (800) 829 4444 Asia Paciic Australia 1 800 629 485 China 800 810 0189 Hong Kong 800 938 693 India 1 800 11 2626 Japan 0120 (421) 345 Korea 080 769 0800 Malaysia 1 800 888 848 Singapore 1 800 375 8100 Taiwan 0800 047 866 Other AP Countries (65) 6375 8100 Europe & Middle East Austria 0800 001122 Belgium 0800 58580 Finland 0800 523252 France 0805 980333 Germany 0800 6270999 Ireland 1800 832700 Israel 1 809 343051 Italy 800 599100 Luxembourg +32 800 58580 Netherlands 0800 0233200 Russia 8800 5009286 Spain 800 000154 Sweden 0200 882255 Switzerland 0800 805353 Opt. 1 (DE) Opt. 2 (FR) Opt. 3 (IT) United Kingdom 0800 0260637 For other unlisted countries: www.keysight.com/find/contactus (BP-04-23-15) Gain deeper conidence Whether you’re testing active or passive devices, the right mix of speed an d performance gives you an edge. In R&D, our vector network analyzers provide a level of measure ment integrity that helps you transform deeper understanding into better de signs. On the production line, our cost-effective VNAs provide the throughput and repea tability you need to transform parts into competitive components. In the ield, our handheld a nalyzers deliver high-quality measurements wherever you need to go. Every Keysigh t VNA is the ultimate expression of our expertise in linear and nonlinear device chara cterization. On the bench, in a rack or in the ield, we can help you gain deeper conidence.