74F20 FAIRCHILD | Alldatasheet

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© 1999 Fairchild Semiconductor Corporation DS009462 www.fairchildsemi.com April 1988 Revised July 1999 74F20 Dual 4-Input NAND Gate 74F20 Dual 4-Input NAND Gate General Description This device contains two independent gates, each of which performs the logic NAND function. Ordering Code: Devices also available in T ape and Reel. Specify by appending the suffix letter “X” to the ordering code. Logic Symbol IEEE/IEC Connection Diagram Unit Loading/Fan Out Order Number Package Number Package Description 74F20SC M14A 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 74F20SJ M14D 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 74F20PC N14A 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Pin Names Description U.L. Input IIH/IIL HIGH/LOW Output IOH /IOL An, Bn, Cn, Dn Inputs 1.0/1.0 20 µA/−0.6 mA O n Outputs 50/33.3 −1 mA/20 mA

www.fairchildsemi.com 2 74F20 Absolute Maximum Ratings(Note 1) Recommended Operating Conditions Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs. Storage Temperature −65°C to +150°C Ambient Temperature under Bias −55°C to +125°C Junction Temperature under Bias −55°C to +150°C VCC Pin Potential to Ground Pin −0.5V to +7.0V Input Voltage (Note 2) −0.5V to +7.0V Input Current (Note 2) −30 mA to +5.0 mA Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output −0.5V to VCC 3-STATE Output −0.5V to +5.5V Current Applied to Output in LOW State (Max) twice the rated I OL (mA) Free Air Ambient Temperature 0 °C to +70°C Supply Voltage +4.5V to +5.5V Symbol Parameter Min Typ Max Units VCC Conditions VIH Input HIGH Voltage 2.0 V Recognized as a HIGH Signal VIL Input LOW Voltage 0.8 V Recognized as a LOW Signal VCD Input Clamp Diode Voltage −1.2 V Min I IN = −18 mA VOH Output HIGH 10% V CC 2.5 V Min I OH = −1 mA Voltage 5% V CC 2.7 I OH = −1 mA VOL Output LOW 10% V CC 0.5 V Min I OL = 20 mA Voltage IIH Input HIGH 5.0 µAM a x V IN = 2.7V Current IBVI Input HIGH Current 7.0 µAM a x V IN = 7.0V Breakdown Test ICEX Output HIGH 50 µAM a x V OUT = VCCLeakage Current VID Input Leakage 4.75 V 0.0 IID = 1.9 µA Test All other pins grounded IOD Output Leakage 3.75 µA0 . 0 VIOD = 150 mV Circuit Current All other pins grounded IIL Input LOW Current −0.6 mA Max V IN = 0.5V IOS Output Short-Circuit Current −60 −150 mA Max V OUT = 0V ICCH Power Supply Current 0.9 1.4 mA Max V O = HIGH ICCL Power Supply Current 3.4 5.1 mA Max V O = LOW Symbol Parameter TA = +25°CT A = −55° to +125°CT A = 0°C to +70°C Units VCC = +5.0V V CC = +5.0V V CC = +5.0V C L = 50 pF C L = 50 pF C L = 50 pF Min Typ Max Min Max Min Max

3 www.fairchildsemi.com 74F20 Physical Dimensions inches (millimeters) unless otherwise noted 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D

www.fairchildsemi.com 4 74F20 Dual 4-Input NAND Gate Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com