2651A

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A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) The high power Model 2651A SourceMeter SMU Instrument is specifically designed to characterize and test high power electronics . This SMU instrument can help you improve productivity in applica - tions across the R&D, reliability, and production spectrums, including high brightness LEDs, power semiconductors, DC-DC converters, batteries, solar cells, and other high power materials, compo - nents, modules, and subassemblies T he Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters . It can be used as a:

• S emiconductor characterization instrument
• V o r I waveform generator
• V o r I pulse generator
• P recision power supply
• T rue current source
• D igital multimeter (DCV, DCI, ohms, and power with 6½-digit resolution)
• P recision electronic load +20A +50A –50A –10A +10A +5A –5A –20A +10V–10V +20V–20V 0V +40V–40V DC and Pulse Pulse only The Model 2651a can source or sink up to ±40V and ±50 a. Two Measurement Modes: Digitizing or Integrating Precisely characterize transient and steady-state behavior, including rapidly changing thermal effects, with the two measurement modes in the Model 2651A . Each mode is defined by its independent analog-to-digital (A/D) converters . T he Digitizing Measurement mode enables 1µs per point measurements . Its 18-bit A/D converters allow you to precisely measure transient characteristics . For more accurate measurements, use its Integrating Measurement mode, which is based on 22-bit A/D converters . 2651a 50A, High Power System SourceMeter® SMU Instrument
• so urce or sink: – 2 ,000W of pulsed power (±40V, ±50a) – 2 00W of DC power (±10V@±20a, ±20V@±10a, 40V@±5
• E asily connect two units (in series or parallel) to create solutions up to ±100a or ±80V
• 1 pa resolution enables precise measurement of very low leakage currents 1µs p er point (1MHz), 18-bit sampling, accurately characterizes transient behavior % to 100% pulse duty cycle for pulse width modulated (PWM) drive schemes and device- specific drive stimulus C ombines a precision power supply, current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller—all in one instrument In cludes TsP® Express I-V characterization software, la bVIEW® driver, and Keithley’s Test sc ript bu ilder software development environment aPP lI C aT I oNs
• P ower semiconductor, Hb lE D, and optical device characterization and testing
• so lar cell characterization and testing
• C haracterization of GaN, si C, and other compound materials and devices se miconductor junction temperature characterization
• H igh speed, high precision digitization
• E lectromigration studies
• H igh current, high power device testing High power System SourceMeter SMU instrument High power System SourceMeter SMU instrument

www.keithley.com 1.888.KEITHLEY (U.S. only) A Greater Measure of Confidence 2651a 50A, High Power System SourceMeter® SMU Instrument Two A/D converters are used with each measurement mode (one for current and the other for voltage), which run simultaneously for accurate source readback that does not sacrifice test throughput 0 25 50 75 1 00 125 150 175 200 Voltage (V) Current (A) Time (µs) Volts Current The dual digitizing a/ D converters sample at up to 1µs /point, enabling full simultaneous characterization of both current and voltage waveforms. High sp eed Pulsing The Model 2651A minimizes the unwanted effects of self heating during tests by accurately sourcing and measuring pulses as short as 100 µs . Additional control flexibility enables you to program the pulse width from 100 µs to D C and the duty cycle from 1% to 100% . A single unit can pulse up to 50A; combine two units to pulse up to 100A E xpansion Capabilities Through TSP-Link Technology technology, mul- tiple Model 2651As and selected Series 2600B SMU instruments can be combined to form a larger integrated system with up to 64 channels P recision timing and tight channel synchroniza - tion are guaranteed with built-in 500ns trigger controllers True SMU instrument-per-pin testing is assured with the fully isolated, independent channels of the SourceMeter SMU instruments 26xxB 2651A 2651A Up to 100A TSP-Link LXI or GPIB to PC Controller Keithley’s TsP and TsP -l ink Technologies enable true sM per-pin testing without the power and/or channel limitations of a mainframe-based system. Also, when two Model 2651As are connected in parallel with TSP-Link Technology, the current range is expanded from 50A to 100A When two units are connected in series, the voltage range is expanded from 40V to 80V Built-in intel- ligence simplifies testing by enabling the units to be addressed as a single instrument, thus creating an industry-best dynamic range (100A to 1pA) This c apability enables you to test a much wider range of power semiconductors and other devices . Vgs = 2.01 V Vgs = 2.25V Vgs = 2.50V Vgs = 2.75V Vgs = 3.00V Vgs = 3.25V Vgs = 3.51V Vds (V) Id (A) Precision measurements to 50 a (100a with two units) enable a more complete and accurate characterization. standard Capabilities of series 600b s Mu In struments Each Model 2651A includes all the features and capabilities provided in most Series 2600B SMU instruments, such as: A bility to be used as either a bench-top I-V characterization tool or as a building block component of multiple-channel I-V test systems T SP Express software to quickly and easily perform common I-V tests without programming or installing software A CS Basic Edition software for semiconductor component characterization (optional) . A CS Basic now features a Trace mode for generating a suite of characteristic curves .

• K eithley’s Test Script Processor (TSP®) T echnology, which enables creation of custom user test scripts to further automate testing, and also supports the creation of programming sequences that allow the instrument to operate asynchronously without direct PC control
• P arallel test execution and precision timing when multiple SMU instruments are connected together in a system L XI compliance
• 1 4 digital I/O lines for direct interaction with probe stations, component handlers, or other automation tools U SB port for extra data and test program s torage via USB memory device or dering Information 2651a H igh Power sy stem so urceMeter® sMu Instrument a ccessories s upplied 2651a- KIT-1 a: lo w Impedance Cable as sembly (1m) Cs- 1592-2: High Current Phoenix Connector (male) Cs- 1626-2: High Current Phoenix Connector (female) C 557-1: se nse li ne Cable as sembly (1m) 7709-308a: D igital I/o Connector Ca- 180-3a: TsP -li nk/Ethernet Cable Documentation CD so ftware Tools and Drivers CD 0.020 0.018 0.016 0.014 0.012 0.010 0.008 0.006 0.004 0.002 0.000 Vgs (V) Rds (ohms) Id = 10A Id = 20A Id = 30A Id = 40A Id = 50A 1µV measurement resolution and current sourcing up to 50a (100a with two units) enable low-level rd s measurements to support next-generation devices. aCCEssorI E s aVaIl ablE 2600-KIT S crew Terminal Connector Kit ACS-BASIC C omponent Charaterization Software 4299-6 R ack Mount Kit 8011 T est Socket Kit High power System SourceMeter SMU instrument High power System SourceMeter SMU instrument

A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) 2651a 50A, High Power System SourceMeter® SMU Instrument sp ecification Conditions This document contains specifications and supplemental information for the Model 2651A High Power System SourceMeter SMU instrument . Specifications are the standards against which the Model 2651A is tested . Upon leaving the factory, the Model 2651A meets these specifications . Supplemental and typical values are non-warranted, apply at 23°C, and are provided solely as useful information A ccuracy specifications are applicable for both normal and high-capacitance modes . S ource and measurement accuracies are specified at the Model 2651A terminals under these conditions: 3° ±5°C, <70 percent relative humidity A fter two-hour warm-up S peed normal (1 NPLC) A /D autozero enabled R emote sense operation or properly zeroed local operation C alibration period: One year Vo l TaG E aC Cu raC Y sPE CIfI CaT IoNs 1, 2 sourCE M Ea surE ran ge Programming r esolution acc uracy ±(% reading + volts) N oise (Vpp) (typical)

0.1 Hz to 10 Hz

C ac curacy 3 ±(% reading + volts) H igh-s peed aD C acc uracy 4 ±(% reading + volts) 100 .000 mV 5 µ V 0 .0 2% + 500 µV 1 00 µ V 1 µ V 0 .0 2% + 300 µV 0 .0 5% + 600 µV 1 .00000 V 5 µ V 0 .0 2% + 500 µV 5 00 µ V 1 µ V 0 .0 2% + 300 µV 0 .0 5% + 600 µV 0 .0000 V 5 µ V 0 .0 2% + 5 m V 1 mV 100 µ V 0 .0 2% + 3 m V 0 .0 5% + 8 m V 20 .0000 V 5 µ V 0 .0 2% + 5 m V 1 mV 100 µ V 0 .0 2% + 5 m V 0 .0 5% + 8 m V 40 .0000 V 5 µ V 0 .0 2% + 2 mV 2 mV 100 µ V 0 .0 2% + 2 mV 0 .0 5% + 5 mV Cur r E NT aC Cur aC Y sP ECIfI CaTIoNs 5 sourCE M Ea surE ran ge Programming r esolution acc uracy ±(% reading + amps) Noise (Ipp) (typical) 0.1Hz to 10Hz Default Display r esolution Integrating aD C ac curacy 3 ±(% reading + amps) High-s peed aD C acc uracy 4 ±(% reading + amps) 100 .000 n A 2 pA 0 1 % + 500 pA 50 pA 1 pA 0 . 08% + 500 pA 0 . 08% + 800 pA 1 .00000 µA 20 pA 0 1 % + 2 nA 25 0 pA 10 pA 0 . 08% + 2 nA 0 . 08% + 4 nA 10 .0000 µA 200 pA 0 1 % + 10 nA 5 00 pA 100 pA 0 . 08% + 8 nA 0 . 08% + 10 nA 100 .000 µA 2 nA 0 03% + nA 5 nA 1 nA 0 . 02% + 25 nA 0 . 05% + 60 nA 1 .00000 mA 20 nA 0 03% + 300 nA 10 nA 10 nA 0 . 02% + 200 nA 0 . 05% + 500 nA 0 .0000 mA 200 nA 0 03% + µ A 500 nA 100 nA 0 02% + µA 0 05% + µA 00 .000 mA 2 µ A 0 03% + µ A 1 µA 1 µA 0 . 02% + 20 µA 0 . 05% + 50 µA 1 .00000 A 200 µ A 0 08% + mA 3 µA 10 µA 0 . 05% + 3 mA 0 . 05% + 5 mA 5 .00000 A 200 µ A 0 08% + mA 3 µA 10 µA 0 . 05% + 3 mA 0 . 05% + 5 mA 10 .0000 A 500 µ A 0 15% + mA 5 µA 10 µA 0 12% + mA 0 12% + mA 20 .0000 A 500 µ A 0 15% + mA 5 µA 10 µA 0 08% + mA 0 08% + mA 50 .0000 A 6 2 mA 0 . 15% + 80 mA N /A 100 µA 0 . 05% + 50 mA 7 0 .05% + 90 mA 8 NoT E s 1 . A dd 50µV to source accuracy specifications per volt of HI lead drop . 2 . F or temperatures 0° to 18°C and 28° to 50°C, accuracy is degraded by ±(0 .1 5 × accuracy specification)/°C . High-capacitance mode accuracy is applicable at 23° ±5°C only . 3 . D erate accuracy specification for NPLC setting <1 by increasing error term . Add appropriate typical percent of range term for resistive loads using the table below . NPlC set ting 100mV ran ge 1V to 40V ra nges 100na ran ge 1µa to 100ma ra nges 1 a to 20a ra nges 01 0 08% 0 07% 0 % 0 05% 0 001 0 % 0 % 1 % 0 % 1 4 . 1 8-bit ADC . Average of 1000 samples taken at 1µs intervals . 5 . A t temperatures 0° to 18°C and 28° to 50°C; 100nA to 10µA accuracy is degraded by ±(0 .3 5 × accuracy specification)/°C . 100µA to 50A accuracy is degraded by ±(0 .1 5 × accuracy specification)/°C . High-capacitance mode accuracy is applicable at 23° ±5°C only . 6 . 5 0A range accessible only in pulse mode . 7 . 5 0A range accuracy measurements are taken at 0 .0 08 NPLC . 8 . A verage of 100 samples taken at 1µs intervals . Model 2651A specifications Model 2651A specifications

www.keithley.com 1.888.KEITHLEY (U.S. only) A Greater Measure of Confidence 2651a 50A, High Power System SourceMeter® SMU Instrument DC Po WEr sPE CIfI CaT IoNs MA XIMUM OU TPUT P OWER: 202W maximum . SOU RCE/ SI NK LI MITS 1: Voltage: ± 10 .1 V at ±20 .0 A, ±20 .2 V at ±10 .0 A, ±40 .4 V at ±5 .0 A 2 . F our-quadrant source or sink operation . Cu rrent: 5 .05 A at ±40V 2, ±10 .1 A at ±20V, ±20 .2 A at ±10V Four-quadrant source or sink operation . C AUTION: Carefully consider and configure the appropriate output-off state and source and compliance levels before connecting the Model 2651A to a device that can deliver energy . Failure to consider the output-off state and source and compliance levels may result in damage to the instru - ment or to the device under test . P uls E sP ECIfI CaT Io Ns MI NIMUM P ROGRAMMABLE P ULSE W IDTH 3: 100µs . Note: Minimum pulse width for settled source at a given I/V output and load can be longer than 100 µs . PU LSE W IDTH P ROGRAMMING R ESOLUTION: µ s . PU LSE W IDTH P ROGRAMMING A CCURAC y 3: ±5µs . PU LSE W IDTH jI TTER: 2µs (typical) . PU LSE RI SE TI ME (TyP ICAL) Current ra nge rload ri se Time (typical) 50 A 0 . 05 W 26 µ s

50 A 0

µ s µ s

20 A 0

µ s µ s

20 A 1

µ s

10 A 2

µ s

5 A 8

µ s +20A +30A +50A –50A –10A +10A +5A –5A –20A –30A +10V–10V +20V–20V 0V +40V–40V Pulse DC region r egion Maximums Ma ximum Pulse Width 3 Maximum Duty Cycle 4 1 5 A a t 40 V DC, no limit 100% 1 10 A at 20 V DC, no limit 100% 1 20 A at 10 V DC, no limit 100% 2 30 A at 10 V 1 ms 50% 3 20 A at 20 V 1 .5 ms 40% 4 10 A at 40 V 1 .5 ms 40% 5 50 A at 10 V 1 ms 35% 6 50 A at 20 V 330 µs 10% 7 50 A at 40 V 300 µs N oT E s 1 . F ull power source operation regardless of load to 30°C ambient . Above 30°C or power sink operation, refer to “Operating Boundaries” in the Model 2651A Reference manual for additional power derating information . 2 . Q uadrants 2 and 4 power envelope is trimmed at 36V and 4 .5 A . 3 . T imes measured from the start of pulse to the start off-time; see figure below . Pulse Level Bias Level Start ton Start toff 90% 10% ton toff 10% 4 . T hermally limited in sink mode (quadrants 2 and 4) and ambient temperatures above 30°C . See power equa - tions in the Model 2651A Reference Manual for more information . Model 2651A specifications Model 2651A specifications The Model 2651a supports GPIb, lX I, Digital I/o, a nd Keithley’s TsP -li nk Technology for multi-channel synchronization.

A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) 2651a 50A, High Power System SourceMeter® SMU Instrument aD DITI oNa l sourC E sP ECIfI CaT I oNs NO ISE (10 Hz to 20MHz): <100mV peak-peak (typical), <30mV RMS (typical), 10V range with a 20A limit . OV ERSHOOT Voltage: <±(0 .1 % + 10mV) (typical) . Step size = 10% to 90% of range, resistive load, maximum current limit/compliance . Cu rrent: <±(0 .1 % + 10mV) (typical) . Step Size = 10% to 90% of range, resistive load . See Current Source Output Settling Time specifications for additional test conditions . RA NGE C HANGE O VERSHOOT: Vo ltage: < 300mV + 0 % of larger range (for <20V ranges) (typical) . 400mV + 0 % of larger range (for ≥ 20V ranges) (typical) . O vershoot into a 100k W load, 20MHz bandwidth . Cu rrent: 5% of larger range + 360mV/R load (for >10µA r anges) (typical) . Iout × Rload = 1V . VO LTAGE S OURCE OU TPUT S ETTLING T IME: Time required to reach within 0 .1 % of final value after source level command is processed on a fixed range . 1 ran ge se ttling Time (typical)

1 V < 70 µ s

10 V <160

µ s

20 V <190

µ s

40 V <175

µ s CU RRENT S OURCE OU TPUT S ETTLING T IME: T ime required to reach within 0 .1 % of final value after source level command is processed on a fixed range . Values below for I out × Rload . Current ra nge rload se ttling time (typical) 20 A 0 . 5 W <195 µ s A W <540 µ s A W <560 µ s A W < 80 µ s 100 mA W < 80 µ s mA 100 W <210 µ s mA 1 kW <300 µ s 100 µ A 10 kW <500 µ s µ A 100 kW < 15 ms µ A 1 MW < 35 ms 100 nA 10 MW <110 ms TR ANSIENT R ESPONSE T IME: 0V and 20V Ranges : <70µs f or the output to recover to within 0 .1 % for a 10% to 90% step change in load . 0V Range: <110µs for the output to recover to within 0 .1 % for a 10% to 90% step change in l oad . GU ARD O FFSET V OLTAGE: <4mV, current <10mA . RE MOTE S ENSE O PERATING R ANGE 2: Maximum Voltage between HI and SENSE HI: 3V M aximum Voltage between LO and SENSE LO: 3V MA XIMUM I MPEDANCE P ER S OURCE L EAD: M aximum impedance limited by 3V drop by remote sense operating range . M aximum resistance = 3V/source current value (amperes) (maximum of 1 W per source lead) . V = L di/dt . VO LTAGE OU TPUT H EADROOM : Range: Maximum output voltage = 48 .5 V – (Total voltage drop across source leads) . A Range: Maximum output voltage = 24 .5 V – (Total voltage drop across source leads) . A Range: Maximum output voltage = 15 .9 V – (Total voltage drop across source leads) . OV ERTEMPERATURE P ROTECTION : I nternally sensed temperature overload puts unit in standby mode . LI MIT/C OMPLIANCE : Bipolar limit (compliance) set with single value . Vo ltage 3: Minimum value is 10mV; accuracy is the same as voltage source . Cu rrent 4: Minimum value is 10nA; accuracy is the same as current source . N oT E s 1 . W ith measure and compliance set to the maximum current for the specified voltage range . 2 . A dd 50µV to source accuracy specifications per volt of HI lead drop . 3 . F or sink mode operation (quadrants II and IV), add 0 .6 % of limit range to the corresponding voltage source accuracy specifications . For 100mV range add an additional 60mV of uncertainty . Specifications apply with sink mode enabled . 4 . F or sink mode operation (quadrants II and IV), add 0 .6 % of limit range to the corresponding current limit accuracy specifications . Specifications apply with sink mode enabled . Model 2651A specifications Model 2651A specifications aDDITIoNal M Ea surE MENT sP ECI fI CaT IoN s CoN T aC T C HECK 1 sp eed Maximum Measurement Time to Memory for 60Hz (50Hz) ac curacy (1 Year) 23° ±5°C ±(% reading + ohms) Fast 1 .1 m s (1 .2 m s) 5% + 15 W Medium 4 .1 m s (5 ms) 5% + W Slow 36 ms (42 ms) 5% + W N oT E s 1 . I ncludes measurement of SENSE HI to HI and SENSE LO to LO contact resistances . aDDITIoNa l METEr sPE CIfI CaT IoNs MA XIMUM L OAD I MPEDANCE: Normal Mode: 10nF (typical), 3 µH ( typical) . High-Capacitance Mode: 50µF ( typical), 3 µH ( typical) . C OMMON M ODE V OLTAGE: 25 0V DC . C OMMON M ODE I SOLATION: > 1GW, <4500pF ME ASURE I NPUT I MPEDANCE: >10GW. SE NSE H IGH I NPUT I MPEDANCE: >10GW. MA XIMUM S ENSE L EAD R ESISTANCE: 1kW for rated accuracy . OV ERRANGE : 101% of source range, 102% of measure range . HIGH-C aPaC ITaNC E MoDE 1,2 AC CURAC y S PECIFICATIONS 3: Accuracy specifications are applicable in both normal and high- capacitance modes . VO LTAGE SOU RCE O UTPUT SE TTLING TI ME: Time required to reach within 0 .1 % o f final value after source level command is processed on a fixed range . 4 Voltage so urce ran ge s ettling Time with Cload = 4.7µ f (typical)

1 V 75 µs

µs

0 V 200

µs

0 V 180

µs MO DE C HANGE D ELAy 100µA Current Range and Above: Delay into High-Capacitance Mode: 11ms . D elay out of High-Capacitance Mode : 11ms . 1µA and 10µA Current Ranges: Delay into High-Capacitance Mode: 250ms . D elay out of High-Capacitance Mode: 11ms . ME ASURE I NPUT I MPEDANCE: > 10GW in parallel with 25nF . VO LTAGE S OURCE R ANGE C HANGE O VERSHOOT: <400mV + 0 % of larger range (typical) . Overshoot into a 100k W load, 20MHz bandwidth . N oT E s 1 . H igh-capacitance mode specifications are for DC measurements only and use locked ranges . Autorange is dis- abled . 2 . 1 00nA range is not available in high-capacitance mode . 3 . A dd an additional 2nA to the source current accuracy and measure current accuracy offset for the 1µA range . 4 . W ith measure and compliance set to the maximum current for the specified voltage range .

www.keithley.com 1.888.KEITHLEY (U.S. only) A Greater Measure of Confidence 2651a 50A, High Power System SourceMeter® SMU Instrument MEa sur E MENT sPEED sPECIf ICaT IoNs 1, 2 MaX IM uM sW EEP oP Er aT IoN raT Es (operations per second ) for 60Hz (50Hz): a/ D Converter sp eed Trigger or igin Measure To Memory us ing us er sc ripts Measure To GPIb us ing us er sc ripts so urce Measure To Memory us ing us er sc ripts so urce Measure To GPIb us ing us er sc ripts so urce Measure To Memory us ing sw eep aP I so urce Measure To GPIb us ing sw eep aP I 0 .001 NPLC Internal 20000 (20000) 9800 (9800) 7000 (7000) 6200 (6200) 12000 (12000) 5900 (5900)

001 NPLC Digital I/O 8100 (8100) 7100 (7100) 5500 (5500) 5100 (5100) 11200 (11200) 5700 (5700)

NPLC Internal 4900 (4000) 3900 (3400) 3400 (3000) 3200 (2900) 4200 (3700) 4000 (3500) NPLC Digital I/O 3500 (3100) 3400 (3000) 3000 (2700) 2900 (2600) 4150 (3650) 3800 (3400) NPLC Internal 580 (480) 560 (470) 550 (465) 550 (460) 560 (470) 545 (460) NPLC Digital I/O 550 (460) 550 (460) 540 (450) 540 (450) 560 (470) 545 (460) NPLC Internal 59 (49) 59 (49) 59 (49) 59 (49) 59 (49) 59 (49) NPLC Digital I/O 58 (48) 58 (49) 59 (49) 59 (49) 59 (49) 59 (49) HS ADC Internal 38500 (38500) 18000 (18000) 10000 (10000) 9500 (9500) 14300 (14300) 6300 (6300) HS ADC Digital I/O 12500 (12500) 11500 (11500) 7500 (7500) 7000 (7000) 13200 (13200) 6000 (6000) HI GH sPEED aD C bu rsT MEa surE MENT raT Es 3 bu rst le ngth (readings) re adings per seco nd bu rsts per seco nd 100 1 ,000,000 400 500 1,000,000 1000 1,000,000 2500 1,000,000 5000 1,000,000 MaXI M u M sIN GlE MEa surE MENT raT Es ( operations per second) for 6 0Hz (50Hz) a/ D Converter sp eed Trigger or igin Measure To GPIb so urce Measure To GPIb so urce Measure Pass/fa il To GPIb 0 .001 NPLC Internal 1900 (1800) 1400 (1400) 1400 (1400) NPLC Internal 1450 (1400) 1200 (1100) 1100 (1100) NPLC Internal 450 (390) 425 (370) 425 (375) NPLC Internal 58 (48) 57 (48) 57 (48) MA XIMUM ME ASUREMENT RANGE CHANGE RATE: >4000 per second for >10µA (typical) . MA XIMUM SOURCE R A NGE CHANGE RATE: >325 per second for >10µA, typical . When chang - ing to or from a range ≥ 1A, maximum rate is >250 per second, typical . C OMMAND PROCESSING TIME: Maximum time required for the output to begin to change fol - lowing the receipt of the smua .s ource .le velv or smua .s ource .le veli command . < 1ms typical . N oT E s 1 . T ests performed with a Model 2651A on channel A using the following equipment: Computer hardware (Intel ® Software (Microsoft ® Windows ® XP, Microsoft Visual Studio ® 2010, VISA™ version 4 .1 ) . 2 . E xclude current measurement ranges less than 1mA . 3 . s mua .m easure .a dc has to be enabled and the smua .m easure .c ount set to the burst length . TrI GGE rI NG aND sY NCH roNI ZaTIoN sPE CIf ICaT IoNs TR IGGERING : T rigger In to Trigger Out: 0 .5µs (typical) . T rigger In to Source Change 1: 10µs (typical) . T rigger Timer Accuracy: ±2 µs (typical) . S ource Change 1 After LXI Trigger: 280 µs (typical) . S yNC HRONIzAT ION: Si ngle-Node Synchronized Source Change 1: <0 .5µs (typical) . M ulti-Node Synchronized Source Change 1: <0 .5µs (typical) . N oT E s 1 . F ixed source range with no polarity change . Model 2651A specifications Model 2651A specifications

A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) 2651a 50A, High Power System SourceMeter® SMU Instrument suP P lEM ENT a l INf orMaT IoN FRONT PANEL INTERFACE: Two-line vacuum fluorescent display (VFD) with keypad and navigation wheel . DISPLAy : Show error messages and user defined messages . D isplay source and limit settings . S how current and voltage measurements (6½-digit to 4½-digit) . V iew measurements stored in dedicated reading buffers . KEyP AD OP ERATIONS : C hange host interface settings . S ave and restore instrument setups . L oad and run factory and user defined test scripts that prompt for input and send results to the display . S tore measurements into dedicated reading buffers . P ROGRAMMING: Embedded Test Script Processor (TSP ®) scripting engine is accessible from any host interface . R esponds to individual instrument control commands . R esponds to high speed test scripts comprised of instrument control commands and Test Script Language (TSL) statements (for example, branching, looping, and math) . A ble to execute high speed test scripts stored in memory without host intervention . MI NIMUM US ER ME MORy AV AILABLE : 16MB (approximately 250,000 lines of TSP code) . TE ST SC RIPT BU ILDER: I ntegrated development environment for building, running, and managing TSP scripts . Includes an instrument console for communicating with any TSP enabled instrument in an interactive manner . Requires: VISA (NI-VISA included on CD), Microsoft ® .N ET Framework (included on CD), Keithley I/O L ayer (included on CD), Intel® Pentium III 800MHz or faster personal computer, Microsoft Windows ® 2000, XP, Vista ®, or 7 . T SP EX PRESS (embedded): Tool that allows users to quickly and easily perform common I-V tests without programming or installing software . To run TSP Express, you need: Java™ Platform, Standard Edition 6, Microsoft Internet Explorer ®, Mozilla ® Firefox®, or another Java-compatible web browser . SO FTWARE IN TERFACE: T SP Express (embedded), direct GPIB/VISA, read/write with Microsoft Visual Basic ®, Visual C/C++®, Visual C# ®, LabVIEW™, CEC TestPoint™ Data Acquisition Software Package, NI LabWindows™/CVI, etc . R EADING BUFFERS: Nonvolatile memory uses dedicated storage areas reserved for measurement data . Reading buffers are arrays of measurement elements . Each element can hold the following items: Measurement Measurement status Timestamp Source setting (at the time the measurement was taken) Range information Two reading buffers are reserved for each Model 2651A channel Reading buffers can be filled using the front panel STORE key and retrieved using the RECALL key or host interface . B uffer Size, with timestamp and source setting: >60,000 samples . B uffer Size, without timestamp and source setting: >140,000 samples . SyS TEM EXPANSION: The TSP-Link expansion interface allows TSP-enabled instruments to t rigger and communicate with each other . See figure below . To Additional Nodes Node 1 Node 2 To Host Computer Each Model 2651A has two TSP-Link connectors to make it easier to connect instruments together in sequence . O nce source-measure instruments are interconnected through the TSP-Link expansion interface, a computer can access all the resources of each source-measure instrument through the host interface of any Model 2651A A m aximum of 32 TSP-Link nodes can be interconnected . Each source-measure instrument consumes one TSP-Link node . T IMER: Free-running 47-bit counter with 1MHz clock input . Resets each time instrument power is turned on . If the instrument is not turned off, the timer is reset to zero every 4 years . T imestamp: TIMER value is automatically saved when each measurement is triggered . R esolution: 1µs . T imestamp Accuracy: ± 100ppm . Model 2651A specifications Model 2651A specifications GENEral DI GITAL I/O IN TERFACE: +5VDC 5.1kW 100W 600mA Solid State Fuse Read by firmware Written by firmware +5V Pin (on DIGITAL I/O connector) Digital I/O Pin (on DIGITAL I/O connector) GND Pin (on DIGITAL I/O connector) Rear Panel Connector: 25-pin female D . I nput/Output Pins: 14 open drain I/O bits . A bsolute Maximum Input Voltage: 5 .2 A bsolute Minimum Input Voltage: – 0 .2 M aximum Logic Low Input Voltage: 0 .7 V, +850µA m ax . M inimum Logic High Input Voltage: 2 .1V , +570µA . M aximum Source Current (flowing out of digital I/O bit): +960 µA . M aximum Sink Current At Maximum Logic Low Voltage (0.7): –5 mA . A bsolute Maximum Sink Current (flowing into digital I/O pin): –11mA . V Power Supply Pin: Limited to 250mA, solid-state fuse protected . O utput Enable Pin: Active high input pulled down internally to ground with a 10k W resistor; when the output enable input function has been activated, the Model 2651A channel will not turn on unless the output enable pin is driven to >2 .1 V (nominal current = 2 .1 V/10kW = 210µA ) . I EEE-488: IEEE-488 .1 c ompliant . Supports IEEE-488 .2 c ommon commands and status model topology . R S-232: Baud rates from 300bps to 115200bps . Programmable number of data bits, parity type, and flow control (RTS/CTS hardware or none) . When not programmed as the active host interface, the Model 2651A can use the RS-232 interface to control other instrumentation E THERNET : R J-45 connector, LXI, 10/100BT, Auto MDIX . L XI C OMPLIANCE : L XI Class C 1 .2 . T otal Output Trigger Response Time: 245 µs m inimum, 280 µs ( typical), (not specified) maximum . R eceive Lan[0-7] Event Delay: Unknown . G enerate Lan[0-7] Event Delay: Unknown . EX PANSION I NTERFACE : T he TSP-Link Technology expansion interface allows TSP-enabled instruments to trigger and communicate with each other . C able Type: Category 5e or higher LAN crossover cable . 3 meters maximum between each TSP-enabled instrument U SB: USB 2 .0 h ost controller . PO WER S UPPLy : 100V to 250V AC, 50Hz to 60Hz (autosensing), 550VA maximum . C OOLING: F orced air; side and top intake and rear exhaust . WA RRANT y: 1 year E MC: Conforms to European Union EMC Directive . SA FETy: U L listed to UL61010-1:2004 . Conforms to European Union Low Voltage Directive . DI MENSIONS: 8 9mm high × 435mm wide × 549mm deep (3 .5 i n . × 17 .1 i n . × 21 .6 i n .) . BE NCH CO NFIGURATION ( with handle and feet ): 104mm high × 483mm wide × 620mm deep (4 .1 i n . × 19 in . × 24 .4 i n .) . WE IGHT: 9 .9 8kg (22 lbs) . E NVIRONMENT : F or indoor use only . AL TITUDE : Maximum 2000 meters above sea level . OP ERATIN g : 0° to 50°C, 70% relative humidity up to 35°C . Derate 3% relative humidity/°C, 35° to 50°C . ST ORAGE: – 25° to 65°C .