ZXMHC6A07T8 ZETEX | Alldatasheet
Document overview
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Technical content
N-Channel V(BR)DSS = 60V; RDS(ON) = 0.300 ;I D= 1.8A P-Channel V(BR)DSS = -60V; RDS(ON) = 0.425 ;I D= -1.5A
DESCRIPTION
This new generation of trench MOSFETs from Zetex utilizes a unique structure that combines the benefits of low on-resistance with fast switching speed. This makes them ideal for high efficiency, low voltage, power management applications.
FEATURES
- Low On - Resistance
- Fast switching speed
- Low threshold
- Low gate drive
- SM8 package
APPLICATIONS
- Motor drive DEVICE MARKING
- ZXMH C6A07 ZXMHC6A07T8 ISSUE 1 - JULY 2004 COMPLEMENTARY 60V ENHANCEMENT MODE MOSFET H-BRIDGE DEVICE REEL SIZE TAPE WIDTH QUANTITY PER REEL ZXMHC6A07T8TA 7 ’‘ 12mm 1000 units ZXMHC6A07T8TC 13’‘ 12mm 4000 units
ORDERING INFORMATION
D,1 D2 D,3 D4 S2 S3 S1 S4 G1 G4 PINOUT DIAGRAM SM8 Top View
PARAMETER SYMBOL V ALUE UNIT Junction to Ambient (a)(d) RθJA 96 °C/W Junction to Ambient (b)(d) RθJA 73 °C/W THERMAL RESISTANCE Notes (a) For a device surface mounted on 50mm x 50mm FR4 PCB with high coverage of single sided 2oz copper, in still air conditions. (b) For a device surface mounted on FR4 PCB measured 1.6mm at t ≤ 10sec. (c) Repetitive rating - 50mm x 50mm x 1.6mm FR4 PCB, D = 0.2, pulse width 300/H9262S pulse width limited by maximum junction temperature. Refer to Transient Thermal Impedance graph. (d) For device with one active die. PARAMETER S YMBOL N-Channel P-C hannel UNIT Drain-Source Voltage V DSS 60 -60 V Gate-Source Voltage V GS /H1100620 /H1100620 V Continuous Drain Current@V GS=10V; T A=25 /H11034C (b)(d) @VGS=10V; T A=70 /H11034C (b)(d) @VGS=10V; T A=25 /H11034C (a)(d) ID 1.8 1.4 1.6 -1.5 -1.2 -1.3 A A Pulsed Drain Current (c) IDM 8.7 -7.5 A Continuous Source Current (Body Diode) (b) IS 2.3 -2.1 A Pulsed Source Current (Body Diode) (c) ISM 8.7 -7.5 A Power Dissipation at T A=25°C (a)(d) Linear Derating Factor PD 1.3 10.4 W mW/°C Power Dissipation at T A=25°C (b)(d) Linear Derating Factor PD 1.7 13.6 W mW/°C Operating and Storage Temperature Range T j:Tstg -55 to +150 °C ABSOLUTE MAXIMUM RATINGS
3 SEMICONDUCTORS
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS STATIC Drain-Source Breakdown Voltage V (BR)DSS 60 V I D=250µA, V GS=0V Zero Gate Voltage Drain Current I DSS 1µ A V DS=60V, V GS=0V Gate-Body Leakage I GSS 100 nA V GS=±20V, V DS=0V Gate-Source Threshold Voltage V GS(th) 1 3.0 V I D=250µA, V DS=V GS Static Drain-Source On-State Resistance (1) RDS(on) 0.300 0.450 Ω Ω VGS=10V, I D=1.8A VGS=4.5V, I D=1.3A Forward Transconductance (1)(3) gfs 2.3 S V DS=15V,I D=1.8A DYNAMIC (3) Input Capacitance C iss 166 pF VDS=40V, V GS=0V, f=1MHzOutput Capacitance C oss 19.5 pF Reverse Transfer Capacitance C rss 8.7 pF SWITCHING (2) (3) Turn-On Delay Time t d(on) 1.8 ns VDD =30V, I D=1.8A RG≅6.0 Ω,V GS=10V Rise Time t r 1.4 ns Turn-Off Delay Time t d(off) 4.9 ns Fall Time t f 2.0 ns Gate Charge Q g 1.65 nC V DS=30V,V GS=5V, ID=1.8A Total Gate Charge Q g 3.2 nC VDS=30V,V GS=10V, ID=1.8AGate-Source Charge Q gs 0.67 nC Gate-Drain Charge Q gd 0.82 nC SOURCE-DRAIN DIODE Diode Forward Voltage (1) VSD 0.85 0.95 V T J=25°C, I S=0.45A, VGS=0V Reverse Recovery Time (3) trr 20.5 ns T J=25°C, I F=1.8A, di/dt= 100A/µs Reverse Recovery Charge (3) Qrr 21.3 nC N-CHANNEL ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated) NOTES (1) Measured under pulsed conditions. Width ≤300µs. Duty cycle ≤ 2% . (2) Switching characteristics are independent of operating junction temperature. (3) For design aid only, not subject to production testing.
5 SEMICONDUCTORS
PARAMETER SYMBOL MIN. TYP. MAX. UNIT CONDITIONS STATIC Drain-Source Breakdown Voltage V (BR)DSS -60 V I D=-250µA, V GS=0V Zero Gate Voltage Drain Current I DSS -1 /H9262AV DS=-60V, V GS=0V Gate-Body Leakage I GSS 100 nA V GS=±20V, V DS=0V Gate-Source Threshold Voltage V GS(th) -1.0 V I D=-250µA, V DS=V GS Static Drain-Source On-State Resistance (1) RDS(on) 0.425 0.630 Ω Ω VGS=-10V, I D=-0.9A VGS=-4.5V, I D=-0.8A Forward Transconductance (1)(3) gfs 1.8 S V DS=-15V,I D=-0.9A DYNAMIC (3) Input Capacitance C iss 233 pF VDS=-30 V, V GS=0V, f=1MHzOutput Capacitance C oss 17.4 pF Reverse Transfer Capacitance C rss 9.6 pF SWITCHING (2) (3) Turn-On Delay Time t d(on) 1.6 ns VDD =-30V, I D=-1A RG≅6.0 Ω,V GS=-10V Rise Time t r 2.3 ns Turn-Off Delay Time t d(off) 13 ns Fall Time t f 5.8 ns Gate Charge Q g 2.4 nC V DS=-30V,V GS=-5V, ID=-0.9A Total Gate Charge Q g 5.1 nC VDS=-30V,V GS=-10V, ID=-0.9AGate-Source Charge Q gs 0.7 nC Gate-Drain Charge Q gd 0.7 nC SOURCE-DRAIN DIODE Diode Forward Voltage (1) VSD -0.85 -0.95 V T J=25°C, I S=-0.8A, VGS=0V Reverse Recovery Time (3) trr 22.6 ns T J=25°C, I F=-0.9A, di/dt= 100A/µs Reverse Recovery Charge (3) Qrr 23.2 nC P-CHANNEL ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated) NOTES (1) Measured under pulsed conditions. Width ≤300µs. Duty cycle ≤ 2% . (2) Switching characteristics are independent of operating junction temperature. (3) For design aid only, not subject to production testing.
N-CHANNEL TYPICAL CHARACTERISTICS
7 SEMICONDUCTORS
N-CHANNEL TYPICAL CHARACTERISTICS
P-CHANNEL TYPICAL CHARACTERISTICS
9 SEMICONDUCTORS
P-CHANNEL TYPICAL CHARACTERISTICS
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