TLE4117

TLE4117 INFINEON | Alldatasheet

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Technical content

Features

• Fixed output voltage regulator 1.8 V, 2.5 V, 3.3 V or 5 V  Adjustable Output down to 1.25 V  Low Drop typical 1 V  800 mA output current  Short circuit protected  Overtemperature protected /G01 New device Type Ordering Code Package /G01 TLE 4117 D V Q67006-A9477 P-TO252-3-1 /G01 TLE 4117 D V18 Q67006-A9479 P-TO252-3-1 /G01 TLE 4117 D V25 Q67006-A9474 P-TO252-3-11 /G01 TLE 4117 D V33 Q67006-A9461 P-TO252-3-11 /G01 TLE 4117 D V50 Q67006-A9478 P-TO252-3-1

Target Data Sheet Rev. 0.1 2 2000-05-26 TLE 4117 Figure 1 Block Diagram for Adjustable Output Voltage TLE 4117 D V AES02839 Control with Overtemperature Protection; Overcurrent Protection I Q Internal Reference Adjust

Target Data Sheet Rev. 0.1 3 2000-05-26 TLE 4117 Figure 2 Block Diagram for Fixed Output Voltage TLE 4117 D V18, 25, 33, 50 Functional Description The TLE 4117 is a 3 terminal positive adjustable or fixed voltage regulator. It is capable to supply 800 mA output current. The fixed voltage devices are available for 1.8 V, 2.5 V, 3.3 V and 5 V output voltage. The adjustable device requires 2 external resistors to define an output voltage between 1.25 V and 40 V. The TLE 4117 is packaged in surface mounted D-Pak package. The TLE 4117 voltage regulator family offers full overload protection, current limitation, thermal protection and save operation area protection (SOA). An output capacitor of 10 µF, ESR < 3Ω is necessary for stability of the regulator loop. The input capacitor is necessary for compensating line influences e.g. to filter glitches. Using a resistor of approx. 1Ω =in series with C I , the oscillating circuit consisting of input inductance and input capacitance can be damped. De-coupling of the adjust pin at variable voltage regulator can improve the ripple rejection ratios. AES02840 Control with Overtemperature Protection; Overcurrent Protection I Q Internal Reference GND

Target Data Sheet Rev. 0.1 4 2000-05-26 TLE 4117 Pin Configuration (top view) Figure 3 Pin Definitions and Functions TLE 4117 D V Pin No. Symbol Function 1A d j u s t ADJUST 2Q Output; the output voltage is defined by the external voltage divider between Q, Adjust and Ground. A 10 µF output capacitor with ESR < 3Ω is required. 3I Input AEP02821 Adjust Q I Q P-TO252-3-1

Target Data Sheet Rev. 0.1 5 2000-05-26 TLE 4117 Figure 4 Pin Definitions and Functions TLE 4117 D Vx Fixed Voltage Devices Pin No. Symbol Function 1G N D Ground 2Q Output; Output voltage is 1.8 V, 2.5 V, 3.3 V or 5 V. A 10 µF output capacitor with ESR < 3Ω is required. 3I Input AEP02817 GND Q I Q P-TO252-3-11

Target Data Sheet Rev. 0.1 6 2000-05-26 TLE 4117 Note: Stresses above those listed here may cause permanent damage to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. Absolute Maximum Ratings Tj= 0 to 125°C Parameter Symbol Limit Values Unit Test Conditions min. max. Voltage Regulator Input - Output Voltage Difference (variable device only) Voltage VI – 0.3 40 V – Input Voltage (fixed voltage version only) Voltage VI – 0.3 15 V – Output (fixed voltage version only) Voltage VQ – 0.3 40 V – Current IQ ––– Internally limited Ground (fixed voltage version only) Current IGND – 1.2 mA – Temperature Storage temperature Tstg – 50 150 °C –

Target Data Sheet Rev. 0.1 7 2000-05-26 TLE 4117 Note: In the operating range, the functions given in the circuit description are fulfilled. v Operating Range Parameter Symbol Limit Values Unit Remarks min. max. Input - Output voltage difference VI – VQ 1.25 40 V TLE 4117 D V Input - Voltage VI 3.1 40 V TLE 4117 D V18 Input - Voltage VI 3.8 40 V TLE 4117 D V25 Input - Voltage VI 4.5 40 V TLE 4117 D V33 Input - Voltage VI 6.3 40 V TLE 4117 D V50 Junction temperature Tj 01 2 5 °C – Thermal Resistance Junction ambient Rthja – 70 K/W TO-252 1) Junction case Rthjc – 4K / W – 1) Soldered in, min. footprint.

Target Data Sheet Rev. 0.1 8 2000-05-26 TLE 4117 Characteristics Adjustable Output Voltage Device TLE 4117 D V 0 °C < Tj< 125°C; C Q = 10 µF, IQ = 10 mA; unless otherwise specified. Parameter Symbol Limit Values Unit Measuring Conditions min. typ. max. Reference voltage VADJ 1.2 1.25 1.3 V VI – VQ = 2 V; IQ = 10 mA; Tj=2 5°C Adjust current IADJ – 100 – µA VI ≤=15 V Adjust current change ∆IADJ – 15 µA1 0 m A ≤ IQ ≤ 800 mA;

1.4 V ≤ VI – VQ ≤ 10 V

Line regulation ∆VQ – 0.3 1.0 % 1.5 V ≤ VI – VQ ≤=21 V IQ = 10 mA Load regulation ∆VQ – 0.3 1.0 % VI – VQ ==3V 10 mA ≤ IQ ≤ 800 mA Temperature Stability∆VQ – 1.0 – % 1) Long Term Stability∆VQ – 0.3 – % 1000 h; Tj = 125 °C 1) Quiescent current Iq – 12 m A VI – VQ ≤=21 V Output current IQ max 800 –– mA Tj = 25 °C; VI – VQ ≤=21 V Minimum Load Current IQ min –– 0m A Drop voltage VDr – 11 . 1 V IQ = 100 mA2) Drop voltage VDr – 1.05 1.15 V IQ = 500 mA2) Drop voltage VDr – 1.1 1.2 V IQ = 800 mA2) Power Supply Ripple Rejection PSRR 60 65 – dB fr = 120 Hz; Tj = 25 °C 1) Vr =1 VPP ; VI – VQ ==3V 1) Guaranteed by Design. 2) Measured when output voltage dropped 100 mV below nominal voltage.

Target Data Sheet Rev. 0.1 9 2000-05-26 TLE 4117 Characteristics 1.8 V Fixed Output Voltage Device TLE 4117 D V18 0 °C < Tj< 125°C; C Q = 10 µF, IQ = 10 mA; unless otherwise specified. Parameter Symbol Limit Values Unit Measuring Conditions min. typ. max. Output voltage VQ 1.76 1.8 1.84 V VI = 4 V, IQ = 10 mA, Tj=2 5°C Output voltage VQ 1.72 1.8 1.88 V 3.2 V ≤ VI ≤=10 V 0 ≤ IQ ≤ 800 mA Line regulation ∆VQ – 10 30 mV 3.2 V ≤ VI ≤ 15 V IQ = 0 mA Load regulation ∆VQ – 10 30 mV VI = 3.2 V 1 mA ≤ IQ ≤ 800 mA Temperature Stability ∆VQ – 0.5 – % 1) Long Term Stability ∆VQ – 0.3 – % 1000 h, Tj = 125 °C 1) Quiescent currentIq – 12m A VI < 21 V Output current IQ max 800 –– mA Tj = 25 °C Minimum Load Current IQ min –– 0m A Drop voltage VDr – 11 . 1 V IQ = 100 mA2) Drop voltage VDr – 1.05 1.15 V IQ = 500 mA2) Drop voltage VDr – 1.1 1.2 V IQ = 800 mA2) Power Supply Ripple Rejection PSRR 60 65 – dB fr = 120 Hz, Tj = 25 °C 1) Vr =0 . 5VPP , VI = 5.5 V 1) Guaranteed by Design. 2) Measured when output voltage dropped 100 mV below nominal voltage.

Target Data Sheet Rev. 0.1 10 2000-05-26 TLE 4117 Characteristics 2.5 V Fixed Output Voltage Device TLE 4117 D V25 0 °C < Tj< 125°C; C Q = 10 µF, IQ = 10 mA; unless otherwise specified. Parameter Symbol Limit Values Unit Measuring Conditions min. typ. max. Output voltage VQ 2.45 2.5 2.55 V VI = 4.5 V, IQ = 10 mA, Tj=2 5°C Output voltage VQ 2.4 2.5 2.6 V 3.9 V ≤ VI ≤=10 V 0 ≤ IQ ≤ 800 mA Line regulation ∆VQ – 10 30 mV 3.9 V ≤ VI ≤ 10 V IQ = 0 mA Load regulation ∆VQ – 10 30 mV VI = 3.9 V 1 mA ≤ IQ ≤ 800 mA Temperature Stability ∆VQ – 1.0 – % 1) Long Term Stability ∆VQ – 0.3 – % 1000 h, Tj = 125 °C 1) Quiescent currentIq – 12m A VI < 10 V Output current IQ max 800 –– mA Tj = 25 °C, VI < 23 V Minimum Load Current IQ min –– 0m A Drop voltage VDr – 11 . 1 V IQ = 100 mA2) Drop voltage VDr – 1.05 1.15 V IQ = 500 mA2) Drop voltage VDr – 1.1 1.2 V IQ = 800 mA2) Power Supply Ripple Rejection PSRR 60 65 – dB fr = 120 Hz, Tj = 25 °C 1) Vr =1 VPP , VI = 5.5 V 1) Guaranteed by Design. 2) Measured when output voltage dropped 100 mV below nominal voltage.

Target Data Sheet Rev. 0.1 11 2000-05-26 TLE 4117 Characteristics 3.3 V Fixed Output Voltage Device TLE 4117 D V33 0 °C < Tj< 125°C; C Q = 10 µF, IQ = 10 mA; unless otherwise specified. Parameter Symbol Limit Values Unit Measuring Conditions min. typ. max. Output voltage VQ 3.24 3.3 3.36 V VI = 5.3 V, IQ = 10 mA, Tj=2 5°C Output voltage VQ 3.16 3.3 3.44 V 4.75 V ≤ VI ≤=10 V 0 ≤ IQ ≤ 800 mA Line regulation ∆VQ – 10 30 mV 4.75 V ≤ VI ≤ 15 V IQ = 0 mA Load regulation ∆VQ – 10 30 mV VI = 4.75 V 1 mA ≤ IQ ≤ 800 mA Temperature Stability ∆VQ – 1.0 – % 1) Long Term Stability ∆VQ – 0.3 – % 1000 h, Tj = 125 °C 1) Quiescent currentIq – 12m A VI < 15 V Output current IQ max 800 –– mA Tj = 25 °C; VI < 24 V Minimum Load Current IQ min –– 0m A Drop voltage VDr – 11 . 1 V IQ = 100 mA2) Drop voltage VDr – 1.05 1.15 V IQ = 500 mA2) Drop voltage VDr – 1.1 1.2 V IQ = 800 mA2) Power Supply Ripple Rejection PSRR 60 65 – dB fr = 120 Hz, Tj = 25 °C 1) Vr =0 . 5VPP , VI = 5 V 1) Guaranteed by Design. 2) Measured when output voltage dropped 100 mV below nominal voltage.

Target Data Sheet Rev. 0.1 12 2000-05-26 TLE 4117 Note: The listed characteristics are ensured over the operating range of the integrated circuit. Typical characteristics specify mean values expected over the production spread. If not otherwise specified, typical characteristics apply at TA = 25°C and the given supply voltage. Characteristics 5 V Fixed Output Voltage Device TLE 4117 D V50 0 °C < Tj< 125°C; C Q = 10 µF, IQ = 10 mA; unless otherwise specified. Parameter Symbol Limit Values Unit Measuring Conditions min. typ. max. Output voltage VQ 4.9 5.0 5.1 V VI = 7 V, IQ = 10 mA, Tj=2 5°C Output voltage VQ 4.8 5.0 5.2 V 6.5 V ≤ VI ≤=10 V 0 ≤ IQ ≤ 800 mA Line regulation ∆VQ – 10 50 mV 6.5 V ≤ VI ≤ 15 V IQ = 0 mA Load regulation ∆VQ – 10 50 mV VI = 6.5 V 1 mA ≤ IQ ≤ 800 mA Temperature Stability ∆VQ – 1.0 – % 1) Long Term Stability ∆VQ – 0.3 – % 1000 h, Tj = 125 °C 1) Quiescent currentIq – 12m A VI < 15 V Output current IQ max 800 –– mA Tj = 25 °C; VI < 26 V Minimum Load Current IQ min –– 0m A Drop voltage VDr – 11 . 1 V IQ = 100 mA2) Drop voltage VDr – 1.05 1.15 V IQ = 500 mA2) Drop voltage VDr – 1.1 1.2 V IQ = 800 mA2) Power Supply Ripple Rejection PSRR 60 65 – dB fr = 120 Hz, Tj = 25 °C Vr =0 . 5VPP , VI = 5 V 1) Guaranteed by Design. 2) Measured when output voltage dropped 100 mV below nominal voltage.

Target Data Sheet Rev. 0.1 14 2000-05-26 TLE 4117 Figure 7 Appliation Circuit Variable Output Voltage TLE 4117 V Figure 8 Application Circuit Fixed Output Voltage TLE 4117 D V18, 25, 33, 50 V Q V REF 1 R 2 R 1 /Ge6/Gf6 IADJ+× R 2×= AES02837 C I1 C I2 VI I C Q1 10 µF VQQ Adjust R2 C ADJ TLE 4117 VREF = VQ - VADJ C Q2 AES02838 C I1 C I2 VI I C Q1 10 µF V QQ GND TLE 4117 Output Voltage 1.8 V, 2.5 V,

3.3 V or 5 V

Target Data Sheet Rev. 0.1 15 2000-05-26 TLE 4117 Package Outlines GPT09051 5.4±0.1 -0.106.5+0.15 A ±0.59.9 6.22-0.2 1±0.1 ±0.150.8 0.15 ±0.1 max per side 0.75 2.28 4.57 +0.08 -0.040.9 2.3-0.10 +0.05 B min0.51 ±0.11 +0.08 -0.040.5 0...0.15 BA0.25 M 0.1 All metal surfaces tin plated, except area of cut. P-TO252-3-1 (Plastic Transistor Single Outline) Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information”. Dimensions in mmSMD = Surface Mounted Device

Target Data Sheet Rev. 0.1 16 2000-05-26 TLE 4117 5.4±0.1 -0.056.5+0.15 A ±0.59.98 6.22-0.2 1±0.1 ±0.150.8 0.15 max. ±0.1per side 0.75 2.28 4.57 +0.08 -0.040.5 2.3-0.10 +0.05 B 0.51 min. +0.08 -0.040.5 0...0.15 BA0.25 M 0.1 All metal surfaces tin plated, except area of cut. (5) (4.24) -0.01 +0.200.9 B P-TO252-3-11 (Plastic Transistor Single Outline) GPT09277 Sorts of Packing Package outlines for tubes, trays etc. are contained in our Data Book “Package Information”. Dimensions in mmSMD = Surface Mounted Device

Target Data Sheet Rev. 0.1 17 2000-05-26 Edition 2000-05-26 Published by Infineon Technologies AG, St.-Martin-Strasse 53, D-81541 München, Germany © Infineon Technologies AG 2000. All Rights Reserved. Attention please! The information herein is given to describe certain components and shall not be consid- ered as warranted characteristics. Terms of delivery and rights to technical change reserved. We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding circuits, descrip- tions and charts stated herein. Infineon Technologies is an approved CECC manufacturer. Information For further information on technology, deliv- ery terms and conditions and prices please contact your nearest Infineon Technologies Office in Germany or our Infineon Technolo- gies Representatives worldwide (see ad- dress list). Warnings Due to technical requirements components may contain dangerous substances. For in- formation on the types in question please contact your nearest Infineon Technologies Office. Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the fail- ure of that life-support device or system, or to affect the safety or effectiveness of that de- vice or system. Life support devices or sys- tems are intended to be implanted in the hu- man body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. TLE 4117