TC1784 INFINEON | Alldatasheet

Document overview

  • Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
  • PDF pages: 123

Technical content

V 1.1.1 2014-05 Microcontrollers 32-Bit Microcontroller TC1784 32-Bit Single-Chip Microcontroller

81726 Munich, Germany

© 2014 Infineon Technologies AG All Rights Reserved. Legal Disclaimer The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. Information For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). Warnings Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.

V 1.1.1 2014-05 Microcontrollers 32-Bit Microcontroller TC1784 32-Bit Single-Chip Microcontroller

Data Sheet I-1 V 1.1.1, 2014-05 TC1784 Table of Contents

Data Sheet I-2 V 1.1.1, 2014-05 TC1784

Data Sheet 3 V 1.1.1, 2014-05

Data Sheet 4 V 1.1.1, 2014-05

Data Sheet 1 V 1.1.1, 2014-05

1 Summary of Features

The SAK-TC1784F-320F180EL / SAK-TC1784F-320F180EP has the following features:

  • High-performance 32-bit super-scalar TriCore V1.3.1 CPU with 4-stage pipeline – Superior real-time performance – Strong bit handling – Fully integrated DSP capabilities – Single precision Floating Point Unit (FPU) – 180 MHz operation at full temperature range
  • 32-bit Peripheral Control Processor with single cycle instruction (PCP2) – 16 Kbyte Parameter Memory (PRAM) – 32 Kbyte Code Memory (CMEM) – 180 MHz operation at full temperature range
  • Multiple on-chip memories – 2.5 Mbyte Program Flash Me mory (PFLASH) with ECC – 64 Kbyte Data Flash Memory (DFL ASH) usable for EEPROM emulation – 128 Kbyte Data Memory (LDRAM) – Instruction Cache: up to 16 Kbyte (ICACHE, configurable) – 40 Kbyte Code Scratchpad Memory (SPRAM) – Data Cache: up to 4 Kbyt e (DCACHE, configurable) – 8 Kbyte Overlay Memory (OVRAM) – 16 Kbyte BootROM (BROM)
  • 16-Channel DMA Controller
  • Sophisticated interru pt system with 2 × 255 hardware priority arbitration levels serviced by CPU or PCP2
  • High performing on-chip bus structure – 64-bit Local Memory Buses between CPU, Flash and Data Memory – 32-bit System Peripheral Bus (SPB) for on-chip peripheral and functional units – One bus bridge (LFI Bridge)
  • Versatile On-chip Peripheral Units – Two Asynchronous/Synchronous Serial Channels (ASC) with baud rate generator, parity, framing and overrun error detection – Three High-Speed Synchronous Serial Channels (SSC) with programmable data length and shift direction – One serial Micro Second Bus interface (MSC) for serial port expansion to external power devices – One High-Speed Micro Link interface (MLI) for serial inter-processor communication – One External Bus Interface (EBU) with 32-bit demultiplexed / 16-bit multiplexed external bus interface Scalable external bus timing up to 75 MHz

Data Sheet 2 V 1.1.1, 2014-05 – One MultiCAN Module with 3 CAN nodes and 128 free assignable message objects for high efficiency data handling via FIFO buffering and gateway data transfer (one CAN node supports TTCAN functionality) – One FlexRay TM module with 2 channels (E-Ray). – One General Purpose Timer Array Module (GPTA) with additional Local Timer Cell Array (LTCA2) providing a powerful set of digital signal filtering and timer functionality to realize autonomous and complex Input/Output management

  • 32 analog input lines for ADC – 2 independent kernels (ADC0 and ADC1) – Analog supply voltage range from 3.3 V to 5 V (single supply)
  • 4 different FADC input channels – channels with impedance control and overlaid with ADC1 inputs – Extreme fast conversion, 21 cycles of fFADC clock – 10-bit A/D conversion (higher resolution can be achieved by averaging of consecutive conversions in digital data reduction filter)
  • 91 digital general purpose I/O lines (GPIO), 4 input lines
  • Digital I/O ports with 3.3 V capability
  • On-chip debug support for OCDS Level 1 (CPU, PCP, DMA, On Chip Bus)
  • Dedicated Emulation Device chip available (TC1784ED) – multi-core debugging, real time tracing, and calibration – four/five wire JTAG (IEEE 1149.1) or two wire DAP (Device Access Port) interface
  • Power Management System
  • Clock Generation Unit with PLL

Data Sheet 3 V 1.1.1, 2014-05

Ordering Information

The ordering code for Infineon microcontro llers provides an exact reference to the required product. This ordering code identifies:

  • The derivative itself, i.e. its function set, the temperature range, and the supply voltage
  • The package and the type of delivery. For the available ordering codes for the TC1784 please refer to the “Product Catalog Microcontrollers”, which summarizes all available microcontroller variants. This document describes the de rivatives of the device.The Table 1 enumerates these derivatives and summarizes the differences. Table 1 TC1784 Derivative Synopsis Derivative Ambient Temperature Range SAK-TC1784F-320F180EL T A = -40oC to +125oC SAK-TC1784F-320F180EP T A = -40oC to +125oC

System Overview of the TC1784 Data Sheet 4 V 1.1.1, 2014-05

2 System Overview of the TC1784

The TC1784 combines three powerful technologies within one silicon die, achieving new levels of power, speed, and economy for embedded applications:

  • Reduced Instruction Set Computing (RISC) processor architecture
  • Digital Signal Processing (DSP) operations and addressing modes
  • On-chip memories and peripherals DSP operations and addressing modes prov ide the computational power necessary to efficiently analyze complex real-world signals. The RISC load/store architecture provides high computational bandwidth with low system cost. On-chip memory and peripherals are designed to support even the most demanding high-bandwidth real-time embedded control-systems tasks. Additional high-level features of the TC1784 include:
  • Efficient memory organization: instru ction and data scratch memories, caches
  • Serial communication interfaces – flexible synchronous and asynchronous modes
  • Peripheral Control Processor – standalon e data operations and interrupt servicing
  • DMA Controller – DMA operations and interrupt servicing
  • General-purpose timers
  • High-performance on-chip buses
  • On-chip debugging and emulation facilities
  • Flexible interconnections to external components
  • Flexible power-management The TC1784 is a high-performance microcontroller with TriCore CPU, program and data memories, buses, bus arbitration, an interrupt controller, a peripheral control processor and a DMA controller and several on-chip peripherals. The TC1784 is designed to meet the needs of the most demanding embedded control systems applications where the competing issues of price/performance, real-time responsiveness, computational power, data bandwidth, and power consumption are key design elements. The TC1784 offers several versatile on-chip per ipheral units such as serial controllers, timer units, and Analog-to-Digital converte rs. Within the TC1784, all these peripheral units are connected to the TriCore CPU/system via the Flexible Peripheral Interconnect (FPI) Bus and the Local Memory Bus (LMB). Several I/O lines on the TC1784 ports are reserved for these peripheral units to communicate with the external world.

System Overview of the TC1784TC1784 Block Diagram Data Sheet 5 V 1.1.1, 2014-05

2.1 TC1784 Block Diagram

Figure 1 shows the block diagram of the TC1784. Figure 1 TC1784F Block Diagram Figure 1 shows the block diagram of th e SAK-TC1784F-320F180EL / SAK-TC1784F- 320F180EP. E-Ray (2 Channels) EBU OCDS L1 Debug Interface/JTAG MLI0 MemCheck FADC TriCore CPU PMI Interrupt System FPI-Bus Interface

16 KB PRAM

32 KB CMEM

(SPB) SSC0 SBCU Bridge SM IF DMI LDRAM DCACHE CPS BCU PMU GPTA 0 Multi CAN (3 Nodes,

128 MO)

(LVDS) SSC1 STM SCU Ports Ext. Request Unit LTCA2 2,5 MB PFlash

128 KB DFlash

8 KB OVRAM

16 KB BROM

M M/ S 3.3V Ext. FADC Supply

24 KB SPRAM

16 KB ICACHE

(Configurable)

124 KB LDRAM

4 KB DCACHE

(Configurable) FPU PLL E-RAY PLL Abbreviations : ICACHE: Instruction Cache DCACHE Data Cache SPRAM: Scratch-Pad RAM LDRAM: Local Data RAM OVRAM: Overlay RAM BROM: Boot ROM PFlash: Program Flash DFlash: Data Flash PRAM: Parameter RAM in PCP PCODE: Code RAM in PCP V1.1 DMA 16 channels (3 .3V max ) (5 V max ) SSC2 5V (3.3V supported as well) Ext. ADC Supply Local Memory Bus (LMB)

PinningTC1784 Pin Configuration Data Sheet 3-6 V 1.1.1, 2014-05

3 Pinning

Figure 3-1 is showing the TC1784 Logic Symbol. Figure 3-1 TC1784 Logic Symbol

3.1 TC1784 Pin Configuration

This chapter shows the pin configuration of package variant PG-LFBGA-292-6. Digital Circuitry Power Supply AN[35:0]Analog Inputs VDDM VSSM VDDMF VSSMF VDDAF VAREF1 VAGND0 VFAREF VFAGND VDDFL 3 Analog Power Supply TC1784_LogSym_292 VDDOSC3 Oscillator VDDOSC VSSOSC TC1784 Port 0 Port 1 Port 2 Port 3 Port 4 Port 5 Port 6 XTAL2 XTAL1 Port 8 Port 9 GPTA , EBU GPTA , EBU GPTA , SCU, CAN VSS VDDP VDD TRST TCK / DAP0 TDI / BRKIN TDO / DAP2 / BRKOUT TMS / DAP1 OCDS / JTAG Control TESTMODE ESR0 PORST General Control ESR1 Alternate Functions GPTA, SCU. E-RAY, MSC0 GPTA, SSC0/1, MLI0, MSC0 GPTA, ASC0/1, SSC0/1, SCU, CAN, MSC0 GPTA , SCU, CAN GPTA, MLI0, E-RAY, SSC2 GPTA , MSC0 GPTA, SSC1, ADC0, OCDS Port 7 Port 10 GPTA, SSC2 15VSSP VAREF0 VDDPF 3 VDDPF

PinningTC1784 Pin Configuration Data Sheet 3-7 V 1.1.1, 2014-05 Figure 3-2 TC1784 Pinning for PG-LFBGA-292-6 Package 1 2 3 4 5 6 7 8 91 0 1 1 1 21 3 1 41 5 1 61 71 8 1 9 2 0 C P10.10 VDDP Top-View VDDP P3.6 C MODE TCK F G VSSP VDDP P9.0 P5.3 VDD VSS VSS VSS VSS VDD P1.6 P1.7 TRST TDO G N VDDMF VDDAF VFAREF VFAGND VDD VSS VSS VSS VSS VDD P8.13 P8.12 P8.11 P8.4 N P AN35 VSSAF VSSMF AN34 AN33 VDD VSS VSS VSS VSS VDD P8.10 P8.9 P8.8 P8.7 P R AN32 AN31 AN30 AN29 VDD P7.2 P8.6 P8.5 R V AN23 AN22 VDD P7.15 V 1 2 3 4 5 6 7 8 91 0 1 1 1 21 3 1 41 5 1 61 71 8 1 9 2 0

PinningTC1784 Pin Configuration Data Sheet 3-8 V 1.1.1, 2014-05 Table 3-1 Pin Definitions an d Functions (PG-LFBGA-292-6) Pin Symbol Ctrl. Type Function Port 0 E12 P0.0 I/O0 A1/ PU Port 0 General Purpose I/O Line 0 IN0 I GPTA0 Input 0 IN0 I LTCA2 Input 0 HWCFG0 I Hardware Configuration Input 0 OUT0 O1 GPTA0 Output 0 OUT56 O2 GPTA0 Output 56 OUT0 O3 LTCA2 Output 0 D12 P0.1 I/O0 A1/ PU Port 0 General Purpose I/O Line 1 IN1 I GPTA0 Input 1 IN1 I LTCA2 Input 1 SDI1 I MSC0 Serial Data Input 1 HWCFG1 I Hardware Configuration Input 1 OUT1 O1 GPTA0 Output 1 OUT57 O2 GPTA0 Output 57 OUT1 O3 LTCA2 Output 1 D11 P0.2 I/O0 A1/ PU Port 0 General Purpose I/O Line 2 IN2 I GPTA0 Input 2 IN2 I LTCA2 Input 2 HWCFG2 I Hardware Configuration Input 2 OUT2 O1 GPTA0 Output 2 OUT58 O2 GPTA0 Output 58 OUT2 O3 LTCA2 Output 2 E11 P0.3 I/O0 A1+/ PU Port 0 General Purpose I/O Line 3 IN3 I GPTA0 Input 3 IN3 I LTCA2 Input 3 HWCFG3 I Hardware Configuration Input 3 OUT3 O1 GPTA0 Output 3 OUT59 O2 GPTA0 Output 59 OUT3 O3 LTCA2 Output 3

PinningTC1784 Pin Configuration Data Sheet 3-9 V 1.1.1, 2014-05 E9 P0.4 I/O0 A1/ PU Port 0 General Purpose I/O Line 4 IN4 I GPTA0 Input 4 IN4 I LTCA2 Input 4 HWCFG4 I Hardware Configuration Input 4 OUT4 O1 GPTA0 Output 4 OUT60 O2 GPTA0 Output 60 OUT4 O3 LTCA2 Output 4 E8 P0.5 I/O0 A1/ PU Port 0 General Purpose I/O Line 5 IN5 I GPTA0 Input 5 IN5 I LTCA2 Input 5 HWCFG5 I Hardware Configuration Input 5 OUT5 O1 GPTA0 Output 5 OUT61 O2 GPTA0 Output 61 OUT5 O3 LTCA2 Output 5 D8 P0.6 I/O0 A1/ PU Port 0 General Purpose I/O Line 6 IN6 I GPTA0 Input 6 IN6 I LTCA2 Input 6 HWCFG6 I Hardware Configuration Input 6 REQ2 I External Request Input 2 OUT6 O1 GPTA0 Output 6 OUT62 O2 GPTA0 Output 62 OUT6 O3 LTCA2 Output 6 E7 P0.7 I/O0 A1/ PU Port 0 General Purpose I/O Line 7 IN7 I GPTA0 Input 7 IN7 I LTCA2 Input 7 HWCFG7 I Hardware Configuration Input 7 REQ3 I External Request Input 3 OUT7 O1 GPTA0 Output 7 OUT63 O2 GPTA0 Output 63 OUT7 O3 LTCA2 Output 7 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-10 V 1.1.1, 2014-05 A14 P0.8 I/O0 A1/ PU Port 0 General Purpose I/O Line 8 IN8 I GPTA0 Input 8 IN8 I LTCA2 Input 8 RXDA0 I E-Ray Channel A Receive Data Input 0 OUT8 O1 GPTA0 Output 8 OUT64 O2 GPTA0 Output 64 OUT8 O3 LTCA2 Output 8 B14 P0.9 I/O0 A1/ PU Port 0 General Purpose I/O Line 9 IN9 I GPTA0 Input 9 IN9 I LTCA2 Input 9 RXDB0 I E-Ray Channel B Receive Data Input 0 OUT9 O1 GPTA0 Output 9 OUT65 O2 GPTA0 Output 65 OUT9 O3 LTCA2 Output 9 A13 P0.10 I/O0 A2/ PU Port 0 General Purpose I/O Line 10 IN10 I GPTA0 Input 10 OUT10 O1 GPTA0 Output 10 TXDA0 O2 E-Ray Channel A transmit Data Output OUT10 O3 LTCA2 Output 10 B13 P0.11 I/O0 A2/ PU Port 0 General Purpose I/O Line 11 IN11 I GPTA0 Input 11 OUT11 O1 GPTA0 Output 11 TXDB0 O2 E-Ray Channel B transmit Data Output OUT11 O3 LTCA2 Output 11 A12 P0.12 I/O0 A2/ PU Port 0 General Purpose I/O Line 12 IN12 I GPTA0 Input 12 OUT12 O1 GPTA0 Output 12 TXENA O2 E-Ray Channel A transmit Data Output enable OUT12 O3 LTCA2 Output 12 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-11 V 1.1.1, 2014-05 B12 P0.13 I/O0 A2/ PU Port 0 General Purpose I/O Line 13 IN13 I GPTA0 Input 13 OUT13 O1 GPTA0 Output 13 TXENB O2 E-Ray Channel B transmit Data Output enable OUT13 O3 LTCA2 Output 13 D7 P0.14 I/O0 A1+/ PU Port 0 General Purpose I/O Line 14 IN14 I GPTA0 Input 14 REQ4 I External Request Input 4 OUT14 O1 GPTA0 Output 14 FCLP0C O2 MSC0 Clock Output Positive C OUT14 O3 LTCA2 Output 14 B7 P0.15 I/O0 A1+/ PU Port 0 General Purpose I/O Line 15 IN15 I GPTA0 Input 15 REQ5 I External Request Input 5 OUT15 O1 GPTA0 Output 15 SOP0C O2 MSC0 Serial Data Output Positive C OUT15 O3 LTCA2 Output 15 Port 1 F17 P1.0 I/O0 A2/ PU Port 1 General Purpose I/O Line 0 IN16 I GPTA0 Input 16 BRKIN I Break Input OUT16 O1 GPTA0 Output 16 OUT72 O2 GPTA0 Output 72 OUT16 O3 LTCA2 Output 16 BRKOUT O Break Output (controlled by OCDS module) E17 P1.1 I/O0 A1/ PU Port 1 General Purpose I/O Line 1 IN17 I GPTA0 Input 17 OUT17 O1 GPTA0 Output 17 OUT73 O2 GPTA0 Output 73 OUT17 O3 LTCA2 Output 17 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-12 V 1.1.1, 2014-05 M16 P1.2 I/O0 A1/ PU Port 1 General Purpose I/O Line 2 IN18 I GPTA0 Input 18 OUT18 O1 GPTA0 Output 18 OUT74 O2 GPTA0 Output 74 OUT18 O3 LTCA2 Output 18 K16 P1.3 I/O0 A1/ PU Port 1 General Purpose I/O Line 3 IN19 I GPTA0 Input 19 IN19 I LTCA2 Input 19 OUT19 O1 GPTA0 Output 19 OUT75 O2 GPTA0 Output 75 OUT19 O3 LTCA2 Output 19 J16 P1.4 I/O0 A1/ PU Port 1 General Purpose I/O Line 4 IN20 I GPTA0 Input 20 IN20 I LTCA2 Input 20 EMGSTOP I Emergency Stop Input OUT20 O1 GPTA0 Output 20 OUT76 O2 GPTA0 Output 76 OUT20 O3 LTCA2 Output 20 H16 P1.5 I/O0 A1/ PU Port 1 General Purpose I/O Line 35 IN21 I GPTA0 Input 21 IN21 I LTCA2 Input 21 OUT21 O1 GPTA0 Output 21 OUT77 O2 GPTA0 Output 77 OUT21 O3 LTCA2 Output 21 G16 P1.6 I/O0 A1/ PU Port 1 General Purpose I/O Line 6 IN22 I GPTA0 Input 22 IN22 I LTCA2 Input 22 OUT22 O1 GPTA0 Output 22 OUT78 O2 GPTA0 Output 78 OUT22 O3 LTCA2 Output 22 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-13 V 1.1.1, 2014-05 G17 P1.7 I/O0 A1/ PU Port 1 General Purpose I/O Line 7 IN23 I GPTA0 Input 23 IN23 I LTCA2 Input 23 OUT23 O1 GPTA0 Output 23 OUT79 O2 GPTA0 Output 79 OUT23 O3 LTCA2 Output 23 L17 P1.8 I/O0 A1+/ PU Port 1 General Purpose I/O Line 8 IN24 I GPTA0 Input 24 IN48 I GPTA0 Input 48 MTSR1B I SSC1 Slave Receive Input B (Slave Mode) OUT24 O1 GPTA0 Output 24 OUT48 O2 GPTA0 Output 48 MTSR1B O3 SSC1 Master Transmit Output B (Master Mode) L19 P1.9 I/O0 A1+/ PU Port 1 General Purpose I/O Line 9 IN25 I GPTA0 Input 25 IN49 I GPTA0 Input 49 MRST1B I SSC1 Master Receive Input B (Master Mode) OUT25 O1 GPTA0 Output 25 OUT49 O2 GPTA0 Output 49 MRST1B O3 SSC1 Slave Transmit Output B (Slave Mode) L16 P1.10 I/O0 A1+/ PU Port 1 General Purpose I/O Line 10 IN26 I GPTA0 Input 26 IN50 I GPTA0 Input 50 OUT26 O1 GPTA0 Output 26 OUT50 O2 GPTA0 Output 50 SLSO17 O3 SSC1 Slave Select Output 7 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-14 V 1.1.1, 2014-05 L20 P1.11 I/O0 A1+/ PU Port 1 General Purpose I/O Line 11 IN27 I GPTA0 Input 27 IN51 I GPTA0 Input 51 SCLK1B I SSC1 Clock Input B OUT27 O1 GPTA0 Output 27 OUT51 O2 GPTA0 Output 51 SCLK1B O3 SSC1 Clock Output B T10 P1.12 I/O0 A1/ PU Port 1 General Purpose I/O Line 12 IN16 I LTCA2 Input 16 AD0EMUX0 O1 ADC0 External Multiplexer Control Output 0 AD0EMUX0 O2 ADC0 External Multiplexer Control Output 0 OUT16 O3 LTCA2 Output 16 U10 P1.13 I/O0 A1/ PU Port 1 General Purpose I/O Line 13 IN17 I LTCA2 Input 17 AD0EMUX1 O1 ADC0 External Multiplexer Control Output 1 AD0EMUX1 O2 ADC0 External Multiplexer Control Output 1 OUT17 O3 LTCA2 Output 17 U9 P1.14 I/O0 A1/ PU Port 1 General Purpose I/O Line 14 IN18 I LTCA2 Input 18 AD0EMUX2 O1 ADC0 External Multiplexer Control Output 2 AD0EMUX2 O2 ADC0 External Multiplexer Control Output 2 OUT18 O3 LTCA2 Output 18 F16 P1.15 I/O0 A2/ PU Port 1 General Purpose I/O Line 15 BRKIN I OCDS Break Input Reserved O1 - Reserved O2 - Reserved O3 - BRKOUT O OCDS Break Output Port 2 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-15 V 1.1.1, 2014-05 Y11 P2.0 I/O0 A2/ PU Port 2 General Purpose I/O Line 0 IN32 I GPTA0 Input 32 OUT32 O1 GPTA0 Output 32 TCLK0 O2 MLI0 Transmitter Clock Output 0 OUT28 O3 LTCA2 Output 28 W11 P2.1 I/O0 A2/ PU Port 2 General Purpose I/O Line 1 IN33 I GPTA0 Input 33 TREADY0A I MLI0 Transmitter Ready Input A OUT33 O1 GPTA0 Output 33 SLSO03 O2 SSC0 Slave Select Output Line 3 SLSO13 O3 SSC1 Slave Select Output Line 3 U11 P2.2 I/O0 A2/ PU Port 2 General Purpose I/O Line 2 IN34 I GPTA0 Input 34 OUT34 O1 GPTA0 Output 34 TVALID0 O2 MLI0 Transmitter Valid Output OUT29 O3 LTCA2 Output 29 T11 P2.3 I/O0 A2/ PU Port 2 General Purpose I/O Line 3 IN35 I GPTA0 Input 35 OUT35 O1 GPTA0 Output 35 TDATA0 O2 MLI0 Transmitter Data Output OUT30 O3 LTCA2 Output 30 Y12 P2.4 I/O0 A2/ PU Port 2 General Purpose I/O Line 4 IN36 I GPTA0 Input 36 RCLK0A I MLI Receiver Clock Input A OUT36 O1 GPTA0 Output 36 OUT36 O2 GPTA0 Output 36 OUT31 O3 LTCA2 Output 31 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-16 V 1.1.1, 2014-05 W12 P2.5 I/O0 A2/ PU Port 2 General Purpose I/O Line 5 IN37 I GPTA0 Input 37 OUT37 O1 GPTA0 Output 37 RREADY0A O2 MLI0 Receiver Ready Output A OUT110 O3 LTCA2 Output 110 U12 P2.6 I/O0 A2/ PU Port 2 General Purpose I/O Line 6 IN38 I GPTA0 Input 38 RVALID0A I MLI Receiver Valid Input A OUT38 O1 GPTA0 Output 38 OUT38 O2 GPTA0 Output 38 OUT111 O3 LTCA2 Output 111 T12 P2.7 I/O0 A2/ PU Port 2 General Purpose I/O Line 7 IN39 I GPTA0 Input 39 RDATA0A I MLI Receiver Data Input A OUT39 O1 GPTA0 Output 39 OUT39 O2 GPTA0 Output 39 Reserved O3 - E10 P2.8 I/O0 A2/ PU Port 2 General Purpose I/O Line 8 SLSO04 O1 SSC0 Slave Select Output 4 SLSO14 O2 SSC1 Slave Select Output 4 EN00 O3 MSC0 Enable Output 0 D10 P2.9 I/O0 A2/ PU Port 2 General Purpose I/O Line 9 SLSO05 O1 SSC0 Slave Select Output 5 SLSO15 O2 SSC1 Slave Select Output 5 EN01 O3 MSC0 Enable Output 1 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-17 V 1.1.1, 2014-05 B8 P2.10 I/O0 A1+/ PU Port 2 General Purpose I/O Line 10 MRST1A I SSC1 Master Receive Input A IN10 I LTCA2 Input 10 MRST1A O1 SSC1 Slave Transmit Output OUT0 O2 LTCA2 Output 0 Reserved O3 - A8 P2.11 I/O0 A1+/ PU Port 2 General Purpose I/O Line 11 SCLK1A I SSC1 Clock Input A IN11 I LTCA2 Input 11 SCLK1A O1 SSC1 Clock Output A OUT1 O2 LTCA2 Output 1 FCLP0B O3 MSC0 Clock Output Positive B A7 P2.12 I/O0 A1+/ PU Port 2 General Purpose I/O Line 12 MTSR1A I SSC1 Slave Receive Input A IN12 I LTCA2 Input 12 MTSR1A O1 SSC1 Master Transmit Output A OUT2 O2 LTCA2 Output 2 SOP0B O3 MSC0 Serial Data Output Positive B D9 P2.13 I/O0 A1/ PU Port 2 General Purpose I/O Line 13 SLSI11 I SSC1 Slave Select Input 1 SDI0 I MSC0 Serial Data Input 0 IN13 I LTCA2 Input 13 OUT3 O1 LTCA2 Output 3 Reserved O2 - Reserved O3 - Port 3 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-18 V 1.1.1, 2014-05 D15 P3.0 I/O0 A1+/ PU Port 3 General Purpose I/O Line 0 RXD0A I ASC0 Receiver Input A (Async. & Sync. Mode) RXD0A O1 ASC0 Clock Output (Sync. Mode) RXD0A O2 ASC0 Clock Output (Sync. Mode) OUT84 O3 GPTA0 Output 84 D16 P3.1 I/O0 A1+/ PU Port 3 General Purpose I/O Line 1 TXD0 O1 ASC0 Transmit TXD0 O2 ASC0 Transmit OUT85 O3 GPTA0 Output 85 A18 P3.2 I/O0 A1+/ PU Port 3 General Purpose I/O Line 2 SCLK0 I SSC0 Clock Input (Slave Mode) SCLK0 O1 SSC0 Clock Output (Master Mode) SCLK0 O2 SSC0 Clock Input (Master Mode) OUT86 O3 GPTA0 Output 86 B18 P3.3 I/O0 A1+/ PU Port 3 General Purpose I/O Line 3 MRST0 I SSC0 Master Receive Input (Master Mode) MRST0 O1 SSC0 Slave Transmit Output (Slave Mode) MRST0 O2 SSC0 Slave Transmit Output (Slave Mode) OUT87 O3 GPTA0 Output 87 A17 P3.4 I/O0 A2/ PU Port 3 General Purpose I/O Line 4 MTSR0 I SSC0 Slave Receive Input (Slave Mode) MTSR0 O1 SSC0 Master Transmit Output (Master Mode) MTSR0 O2 SSC0 Master Transmit Output (Master Mode) OUT88 O3 GPTA0 Output 88 D19 P3.5 I/O0 A1+/ PU Port 3 General Purpose I/O Line 5 SLSO00 O1 SSC0 Slave Select Output 0 SLSO10 O2 SSC1 Slave Select Output 0 SLSOANDO0 O3 SSC0 AND SSC1 Slave Select Output 0 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-19 V 1.1.1, 2014-05 C20 P3.6 I/O0 A1+/ PU Port 3 General Purpose I/O Line 6 SLSO01 O1 SSC0 Slave Select Output 1 SLSO11 O2 SSC1 Slave Select Output 1 SLSOANDO1 O3 SSC0 AND SSC1 Slave Select Output 1 B17 P3.7 I/O0 A2/ PU Port 3 General Purpose I/O Line 7 SLSI0 I SSC0 Slave Select Input 1 SLSO02 O1 SSC0 Slave Select Output 2 SLSO12 O2 SSC1 Slave Select Output 2 OUT89 O3 GPTA0 Output 89 A19 P3.8 I/O0 A2/ PU Port 3 General Purpose I/O Line 8 SLSO06 O1 SSC0 Slave Select Output 6 TXD1 O2 ASC1 Transmit Output OUT90 O3 GPTA0 Output 90 E14 P3.9 I/O0 A1/ PU Port 3 General Purpose I/O Line 9 RXD1A I ASC1 Receiver Input A RXD1A O1 ASC1 Receiver Output A (Synchronous Mode) RXD1A O2 ASC1 Receiver Output A (Synchronous Mode) OUT91 O3 GPTA0 Output 91 E15 P3.10 I/O0 A1/ PU Port 3 General Purpose I/O Line 10 REQ0 I External Request Input 0 Reserved O1 - Reserved O2 - OUT92 O3 GPTA0 Output 92 E13 P3.11 I/O0 A1/ PU Port 3 General Purpose I/O Line 11 REQ1 I External Request Input 1 Reserved O1 - Reserved O2 - OUT93 O3 GPTA0 Output 93 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-20 V 1.1.1, 2014-05 B15 P3.12 I/O0 A1/ PU Port 3 General Purpose I/O Line 12 RXDCAN0 I CAN Node 0 Receiver Input RXD0B I ASC0 Receiver Input B RXD0B O1 ASC0 Receiver Output B (Synchronous Mode) RXD0B O2 ASC0 Receiver Output B (Synchronous Mode) OUT94 O3 GPTA0 Output 94 A15 P3.13 I/O0 A2/ PU Port 3 General Purpose I/O Line 13 TXDCAN0 O1 CAN Node 0 Transmitter Output TXD0 O2 ASC0 Transmit Output OUT95 O3 GPTA0 Output 95 B16 P3.14 I/O0 A1/ PU Port 3 General Purpose I/O Line 14 RXDCAN1 I CAN Node 1 Receiver Input RXD1B I ASC1 Receiver Input B SDI2 I MSC0 Serial Data Input 2 RXD1B O1 ASC1 Receiver Output B (Synchronous Mode) RXD1B O2 ASC1 Receiver Output B (Synchronous Mode) OUT96 O3 GPTA0 Output 96 A16 P3.15 I/O0 A2/ PU Port 3 General Purpose I/O Line 15 TXDCAN1 O1 CAN Node 1 Transmitter Output TXD1 O2 ASC1 Transmit Output OUT97 O3 GPTA0 Output 97 Port 4 T13 P4.0 I/O0 A1+/ PU Port 4 General Purpose I/O Line 0 IN28 I GPTA0 Input 28 IN52 I GPTA0 Input 52 RXDCAN2 I CAN Node 2 Receiver Input OUT28 O1 GPTA0 Output 28 OUT28 O1 GPTA0 Output 28 OUT52 O2 GPTA0 Output 52 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-21 V 1.1.1, 2014-05 U13 P4.1 I/O0 A1+/ PU Port 4 General Purpose I/O Line 1 IN29 I GPTA0 Input 29 IN53 I GPTA0 Input 53 OUT29 O1 GPTA0 Output 29 OUT53 O2 GPTA0 Output 53 TXDCAN2 O3 CAN Node 2 Transmitter Output W13 P4.2 I/O0 A2/ PU Port 4 General Purpose I/O Line 2 IN30 I GPTA0 Input 30 IN54 I GPTA0 Input 54 OUT30 O1 GPTA0 Output 30 OUT54 O2 GPTA0 Output 54 EXTCLK1 O3 External Clock 1 Output Y13 P4.3 I/O0 A2/ PU Port 4 General Purpose I/O Line 3 IN31 I GPTA0 Input 31 IN55 I GPTA0 Input 55 OUT31 O1 GPTA0 Output 31 OUT55 O2 GPTA0 Output 55 EXTCLK0 O3 External Clock 0 Output Port 5 D1 P5.0 I/O0 A1+/ PU Port 5 General Purpose I/O Line 0 IN40 I GPTA0 Input 40 IN26 I LTCA2 Input 26 OUT40 O1 GPTA0 Output 40 OUT8 O2 LTCA2 Output 8 SLSO20 O3 SSC2 Slave Select Output 0 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-22 V 1.1.1, 2014-05 E2 P5.1 I/O0 A1+/ PU Port 5 General Purpose I/O Line 1 IN41 I GPTA0 Input 41 IN27 I LTCA2 Input 27 OUT41 O1 GPTA0 Output 41 OUT9 O2 LTCA2 Output 9 SLSO21 O3 SSC2 Slave Select Output 1 F4 P5.2 I/O0 A1+/ PU Port 5 General Purpose I/O Line 2 IN42 I GPTA0 Input 42 IN28 I LTCA2 Input 28 OUT42 O1 GPTA0 Output 42 OUT10 O2 LTCA2 Output 10 SLSO22 O3 SSC2 Slave Select Output 2 G5 P5.3 I/O0 A1+/ PU Port 5 General Purpose I/O Line 3 IN43 I GPTA0 Input 43 OUT43 O1 GPTA0 Output 43 OUT11 O2 LTCA2 Output 11 SLSO23 O3 SSC2 Slave Select Output 3 H5 P5.4 I/O0 A1+/ PU Port 5 General Purpose I/O Line 4 IN44 I GPTA0 Input 44 IN29 I LTCA2 Input 29 SLSI2A I SSC2 Slave Select Input A OUT44 O1 GPTA0 Output 44 OUT12 O2 LTCA2 Output 12 SLSO24 O3 SSC2 Slave Select Output 4 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-23 V 1.1.1, 2014-05 E1 P5.5 I/O0 A1+/ PU Port 5 General Purpose I/O Line 5 IN45 I GPTA0 Input 45 IN30 I LTCA2 Input 30 MRST2A I SSC2 Master Receive Input (Master Mode) OUT45 O1 GPTA0 Output 45 OUT13 O2 LTCA2 Output 13 MRST2 O3 SSC2 Slave Transmit Output (Slave Mode) F1 P5.6 I/O0 A1+/ PU Port 5 General Purpose I/O Line 6 IN46 I GPTA0 Input 46 IN31 I LTCA2 Input 31 MTSR2A I SSC2 Slave Receive Input (Slave Mode) OUT46 O1 GPTA0 Output 46 OUT14 O2 LTCA2 Output 14 MTSR2 O3 SSC2 Master Transmit Output (Master Mode) F2 P5.7 I/O0 A1+/ PU Port 5 General Purpose I/O Line 7 IN47 I GPTA0 Input 47 SCLK2A I SSC0 Clock Input (Slave Mode) OUT47 O1 GPTA0 Output 47 OUT15 O2 LTCA2 Output 15 SCLK2 O3 SSC0 Clock Output (Master Mode) H2 P5.8 I/O0 A2/ PU Port 5 General Purpose I/O Line 8 RDATA0B I MLI0 Receiver Data Input B Reserved O1 - TXDA1 O2 E-Ray Channel A transmit Data Output OUT89 O3 LTCA2 Output 89 J2 P5.9 I/O0 A2/ PU Port 5 General Purpose I/O Line 9 RVALID0B I MLI0 Receiver Data Valid Input B Reserved O1 - TXDB1 O2 E-Ray Channel B transmit Data Output OUT90 O3 LTCA2 Output 90 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-24 V 1.1.1, 2014-05 J1 P5.10 I/O0 A2/ PU Port 5 General Purpose I/O Line 10 RREADY0B O1 MLI0 Receiver Ready Input B TXENA O2 E-Ray Channel A transmit Data Output enable OUT91 O3 LTCA2 Output 91 K2 P5.11 I/O0 A2/ PU Port 5 General Purpose I/O Line 11 RCLK0B I MLI0 Receiver Clock Input B Reserved O1 - TXENB O2 E-Ray Channel B transmit Data Output enable OUT92 O3 LTCA2 Output 92 K1 P5.12 I/O0 A1+/ PU Port 5 General Purpose I/O Line 12 TDATA0 O1 MLI0 Transmitter Data Output SLSO07 O2 SSC0 Slave Select Output 7 OUT93 O3 LTCA2 Output 93 L2 P5.13 I/O0 A1+/ PU Port 5 General Purpose I/O Line 13 TVALID0B O1 MLI0 Transmitter Valid Input B SLSO16 O2 SSC1 Slave Select Output 6 Reserved O3 - L1 P5.14 I/O0 A1+/ PU Port 5 General Purpose I/O Line 14 TREADY0B I MLI0 Transmitter Ready Input B RXDA1 I E-Ray Channel A Receive Data Input 1 Reserved O1 - Reserved O2 - OUT94 O3 LTCA2 Output 94 H1 P5.15 I/O0 A1+/ PU Port 5 General Purpose I/O Line 15 RXDB1 I E-Ray Channel B Receive Data Input 1 TCLK0 O1 MLI0 Transmitter Clock Output Reserved O2 - OUT95 O3 LTCA2 Output 95 Port 6 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-25 V 1.1.1, 2014-05 A10 P6.0 I/O0 F/ PU Port 6 General Purpose I/O Line 0 IN14 I LTCA2 Input 14 FCLN0 O1 MSC0 Clock Output Negative OUT80 O2 GPTA0 Output 80 OUT4 O3 LTCA2 Output 4 B10 P6.1 I/O0 F/ PU Port 6 General Purpose I/O Line 1 IN15 I LTCA2 Input 15 FCLP0A O1 MSC0 Clock Output Positive A OUT81 O2 GPTA0 Output 81 OUT5 O3 LTCA2 Output 5 A9 P6.2 I/O0 F/ PU Port 6 General Purpose I/O Line 2 IN24 I LTCA2 Input 24 SON0 O1 MSC0 Serial Data Output Negative OUT82 O2 GPTA0 Output 82 OUT6 O3 LTCA2 Output 6 B9 P6.3 I/O0 F/ PU Port 6 General Purpose I/O Line 3 IN25 I LTCA2 Input 25 SOP0A O1 MSC0 Serial Data Output Positive A OUT83 O2 GPTA0 Output 83 OUT7 O3 LTCA2 Output 7 Port 7 U16 P7.0 I/O0 A2/ PU Port 7 General Purpose I/O Line 0 AD0 I/O EBU Address/Data Bus Line 0 OUT32 O1 GPTA0 Output 32 Reserved O2 - Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-26 V 1.1.1, 2014-05 Y14 P7.1 I/O0 A2/ PU Port 7 General Purpose I/O Line 1 AD1 I/O EBU Address/Data Bus Line 1 OUT33 O1 GPTA0 Output 33 Reserved O2 - Reserved O3 - R17 P7.2 I/O0 A2/ PU Port 7 General Purpose I/O Line 2 AD2 I/O EBU Address/Data Bus Line 2 OUT34 O1 GPTA0 Output 34 Reserved O2 - Reserved O3 - U14 P7.3 I/O0 A2/ PU Port 7 General Purpose I/O Line 3 AD3 I/O EBU Address/Data Bus Line 3 OUT35 O1 GPTA0 Output 35 Reserved O2 - Reserved O3 - T14 P7.4 I/O0 A2/ PU Port 7 General Purpose I/O Line 4 AD4 I/O EBU Address/Data Bus Line 4 OUT36 O1 GPTA0 Output 36 Reserved O2 - Reserved O3 - Y15 P7.5 I/O0 A2/ PU Port 7 General Purpose I/O Line 5 AD5 I/O EBU Address/Data Bus Line 5 OUT37 O1 GPTA0 Output 37 Reserved O2 - Reserved O3 - W14 P7.6 I/O0 A2/ PU Port 7 General Purpose I/O Line 6 AD6 I/O EBU Address/Data Bus Line 6 OUT38 O1 GPTA0 Output 38 Reserved O2 - Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-27 V 1.1.1, 2014-05 T15 P7.7 I/O0 A2/ PU Port 7 General Purpose I/O Line 7 AD7 I/O EBU Address/Data Bus Line 7 OUT39 O1 GPTA0 Output 39 Reserved O2 - Reserved O3 - U15 P7.8 I/O0 A2/ PU Port 7 General Purpose I/O Line 8 AD8 I/O EBU Address/Data Bus Line 8 OUT40 O1 GPTA0 Output 40 Reserved O2 - Reserved O3 - W15 P7.9 I/O0 A2/ PU Port 7 General Purpose I/O Line 9 AD9 I/O EBU Address/Data Bus Line 9 OUT41 O1 GPTA0 Output 41 Reserved O2 - Reserved O3 - Y17 P7.10 I/O0 A2/ PU Port 7 General Purpose I/O Line 10 AD10 I/O EBU Address/Data Bus Line 10 OUT42 O1 GPTA0 Output 42 Reserved O2 - Reserved O3 - W17 P7.11 I/O0 A2/ PU Port 7 General Purpose I/O Line 11 AD11 I/O EBU Address/Data Bus Line 11 OUT43 O1 GPTA0 Output 43 Reserved O2 - Reserved O3 - Y18 P7.12 I/O0 A2/ PU Port 7 General Purpose I/O Line 12 AD12 I/O EBU Address/Data Bus Line 12 OUT44 O1 GPTA0 Output 44 Reserved O2 - Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-28 V 1.1.1, 2014-05 W18 P7.13 I/O0 A2/ PU Port 7 General Purpose I/O Line 13 AD13 I/O EBU Address/Data Bus Line 13 OUT45 O1 GPTA0 Output 45 Reserved O2 - Reserved O3 - Y19 P7.14 I/O0 A2/ PU Port 7 General Purpose I/O Line 14 AD14 I/O EBU Address/Data Bus Line 14 OUT46 O1 GPTA0 Output 46 Reserved O2 - Reserved O3 - V20 P7.15 I/O0 A2/ PU Port 7 General Purpose I/O Line 15 AD15 I/O EBU Address/Data Bus Line 15 OUT47 O1 GPTA0 Output 47 Reserved O2 - Reserved O3 - Port 8 U19 P8.0 I/O0 A2/ PU Port 8 General Purpose I/O Line 0 Reserved O1 - OUT48 O2 GPTA0 Output 48 OUT95 O3 LTCA2 Output 95 A16 O EBU Address Bus Line Output 16 U20 P8.1 I/O0 A2/ PU Port 8 General Purpose I/O Line 1 Reserved O1 - OUT49 O2 GPTA0 Output 49 OUT96 O3 LTCA2 Output 96 A17 O EBU Address Bus Line Output 17 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-29 V 1.1.1, 2014-05 T19 P8.2 I/O0 A2/ PU Port 8 General Purpose I/O Line 2 Reserved O1 - OUT50 O2 GPTA0 Output 50 OUT97 O3 LTCA2 Output 97 A18 O EBU Address Bus Line Output 18 T20 P8.3 I/O0 A2/ PU Port 8 General Purpose I/O Line 3 Reserved O1 - OUT51 O2 GPTA0 Output 51 OUT98 O3 LTCA2 Output 98 A19 O EBU Address Bus Line Output 19 N20 P8.4 I/O0 A2/ PU Port 8 General Purpose I/O Line 4 Reserved O1 - OUT52 O2 GPTA0 Output 52 OUT99 O3 LTCA2 Output 99 A20 O EBU Address Bus Line Output 20 R20 P8.5 I/O0 A2/ PU Port 8 General Purpose I/O Line 5 Reserved O1 - OUT53 O2 GPTA0 Output 53 OUT100 O3 LTCA2 Output 100 CS0 O EBU Chip Select Output 0 R19 P8.6 I/O0 A2/ PU Port 8 General Purpose I/O Line 6 Reserved O1 - OUT54 O2 GPTA0 Output 54 OUT101 O3 LTCA2 Output 101 CS1 O EBU Chip Select Output 1 P20 P8.7 I/O0 A2/ PU Port 8 General Purpose I/O Line 7 Reserved O1 - OUT55 O2 GPTA0 Output 55 OUT102 O3 LTCA2 Output 102 CS2 O EBU Chip Select Output 2 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-30 V 1.1.1, 2014-05 P19 P8.8 I/O0 A2/ PU Port 8 General Purpose I/O Line 8 Reserved O1 - OUT56 O2 GPTA0 Output 56 OUT103 O3 LTCA2 Output 103 CS3 O EBU Chip Select Output 3 P17 P8.9 I/O0 A2/ PU Port 8 General Purpose I/O Line 9 Reserved O1 - OUT57 O2 GPTA0 Output 57 OUT104 O3 LTCA2 Output 104 BC0 O EBU Byte Control Line Output 0 P16 P8.10 I/O0 A2/ PU Port 8 General Purpose I/O Line 10 Reserved O1 - OUT58 O2 GPTA0 Output 58 OUT105 O3 LTCA2 Output 105 BC1 O EBU Byte Control Line Output 1 N19 P8.11 I/O0 A2/ PU Port 8 General Purpose I/O Line 11 Reserved O1 - OUT59 O2 GPTA0 Output 59 OUT106 O3 LTCA2 Output 106 RD O EBU Read Control Line N17 P8.12 I/O0 A2/ PU Port 8 General Purpose I/O Line 12 Reserved O1 - OUT60 O2 GPTA0 Output 60 OUT107 O3 LTCA2 Output 107 RD/WR O EBU Write Control Line N16 P8.13 I/O0 A2/ PU Port 8 General Purpose I/O Line 13 Reserved O1 - OUT61 O2 GPTA0 Output 61 OUT108 O3 LTCA2 Output 108 ADV O EBU Address Valid Line Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-31 V 1.1.1, 2014-05 M17 P8.14 I/O0 A1/ PU Port 8 General Purpose I/O Line 14 WAIT I EBU Wait Line Reserved O1 - OUT62 O2 GPTA0 Output 62 OUT109 O3 LTCA2 Output 109 Port 9 G4 P9.0 I/O0 A1/ PU Port 9 General Purpose I/O Line 0 RXDCAN2 I CAN Node 2 Receiver Input Reserved O1 - OUT80 O2 GPTA0 Output 80 OUT80 O3 LTCA2 Output 80 H4 P9.1 I/O0 A2/ PU Port 9 General Purpose I/O Line 1 Reserved I - TXDCAN2 O1 CAN Node 2 Transmitter Output OUT81 O2 GPTA0 Output 81 OUT81 O3 LTCA2 Output 81 J5 P9.2 I/O0 A1/ PU Port 9 General Purpose I/O Line 2 Reserved I - Reserved O1 - OUT82 O2 GPTA0 Output 82 OUT82 O3 LTCA2 Output 82 J4 P9.3 I/O0 A1/ PU Port 9 General Purpose I/O Line 3 Reserved I - Reserved O1 - OUT83 O2 GPTA0 Output 83 OUT83 O3 LTCA2 Output 83 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-32 V 1.1.1, 2014-05 K4 P9.4 I/O0 A1/ PU Port 9 General Purpose I/O Line 4 Reserved I - Reserved O1 - OUT84 O2 GPTA0 Output 84 OUT84 O3 LTCA2 Output 84 K5 P9.5 I/O0 A1/ PU Port 9 General Purpose I/O Line 5 Reserved I - Reserved O1 - OUT85 O2 GPTA0 Output 85 OUT85 O3 LTCA2 Output 85 L4 P9.6 I/O0 A1/ PU Port 9 General Purpose I/O Line 6 Reserved I - Reserved O1 - OUT86 O2 GPTA0 Output 86 OUT86 O3 LTCA2 Output 86 L5 P9.7 I/O0 A1/ PU Port 9 General Purpose I/O Line 7 Reserved I - Reserved O1 - OUT87 O2 GPTA0 Output 87 OUT87 O3 LTCA2 Output 87 Port 10 D6 P10.0 I/O0 A1+/ PU Port 10 General Purpose I/O Line 0 MRST2B I SSC2 Master Receive Input (Master Mode) MRST2 O1 SSC2 Master Transmit Input (Slave Mode) EVTO0 O2 MCDS Event Output 0 Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-33 V 1.1.1, 2014-05 E6 P10.1 I/O0 A1+/ PU Port 10 General Purpose I/O Line 1 Reserved I - MTSR2 O1 SSC0 Slave Receive Input (Slave Mode) EVTO1 O2 MCDS Event Output 1 Reserved O3 - D5 P10.2 I/O0 A1+/ PU Port 10 General Purpose I/O Line 2 SCLK2B I SSC0 Clock Input (Slave Mode) SCLK2 O1 SSC0 Clock Output (Master Mode) EVTO2 O2 MCDS Event Output 2 Reserved O3 - B5 P10.3 I/O0 A1+/ PU Port 10 General Purpose I/O Line 3 SLSI2B I SSC2 Slave Select Input B SLSO20 O1 SSC2 Slave Select Output 0 EVTO3 O2 MCDS Event Output 3 Reserved O3 LTCA2 Output 83 A5 P10.4 I/O0 A1+/ PU Port 10 General Purpose I/O Line 4 Reserved I - SLSO21 O1 SSC2 Slave Select Output 1 Reserved O2 GPTA0 Output 84 Reserved O3 - B4 P10.5 I/O0 A1+/ PU Port 10 General Purpose I/O Line 5 Reserved I - SLSO22 O1 SSC2 Slave Select Output 0 Reserved O2 GPTA0 Output 85 Reserved O3 - A4 P10.6 I/O0 A1+/ PU Port 10 General Purpose I/O Line 6 Reserved I - SLSO23 O1 SSC2 Slave Select Output 3 SLSOAND03 O2 SSC0 AND SSC2 Slave Select Output 3 Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-34 V 1.1.1, 2014-05 B3 P10.7 I/O0 A1+/ PU Port 10 General Purpose I/O Line 7 Reserved I - SLSO24 O1 SSC2 Slave Select Output 4 SLSOAND04 O2 SSC1 AND SSC2 Slave Select Output 4 Reserved O3 - A3 P10.8 I/O0 A1/ PU Port 10 General Purpose I/O Line 8 Reserved I - Reserved O1 - Reserved O2 - Reserved O3 - A2 P10.9 I/O0 A1/ PU Port 10 General Purpose I/O Line 9 Reserved I - Reserved O1 - Reserved O2 - Reserved O3 - C1 P10.10 I/O0 A1/ PU Port 10 General Purpose I/O Line 10 RXDCAN2 I CAN Node 2 Receiver Input Reserved O1 - Reserved O2 - Reserved O3 - D2 P10.11 I/O0 A1/ PU Port 10 General Purpose I/O Line 11 Reserved I - Reserved O1 - Reserved O2 - Reserved O3 - E4 P10.12 I/O0 A1/ PU Port 10 General Purpose I/O Line 12 Reserved I - Reserved O1 - Reserved O2 - Reserved O3 - Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-35 V 1.1.1, 2014-05 F5 P10.13 I/O0 A1/ PU Port 10 General Purpose I/O Line 13 Reserved I - Reserved O1 - Reserved O2 - Reserved O3 - Analog Input Port Y9 AN0 I D Analog Input 0 W9 AN1 I D Analog Input 1 T9 AN2 I D Analog Input 2 U8 AN3 I D Analog Input 3 Y8 AN4 I D Analog Input 4 W8 AN5 I D Analog Input 5 T8 AN6 I D Analog Input 6 T2 AN7 I D Analog Input 7 U7 AN8 I D Analog Input 8 Y6 AN9 I D Analog Input 9 Y5 AN10 I D Analog Input 10 Y4 AN11 I D Analog Input 11 Y3 AN12 I D Analog Input 12 Y2 AN13 I D Analog Input 13 W2 AN14 I D Analog Input 14 U5 AN15 I D Analog Input 15 W3 AN16 I D Analog Input 16 W5 AN17 I D Analog Input 17 W4 AN18 I D Analog Input 18 W6 AN19 I D Analog Input 19 W1 AN20 I D Analog Input 20 U4 AN21 I D Analog Input 21 V2 AN22 I D Analog Input 22 V1 AN23 I D Analog Input 23 Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-36 V 1.1.1, 2014-05 T5 AN24 I D Analog Input 24 T4 AN25 I D Analog Input 25 U2 AN26 I D Analog Input 26 U1 AN27 I D Analog Input 27 T1 AN28 I D Analog Input 28 R5 AN29 I D Analog Input 29 R4 AN30 I D Analog Input 30 R2 AN31 I D Analog Input 31 R1 AN32 I D Analog Input 32 P5 AN33 I D Analog Input 33 P4 AN34 I D Analog Input 34 P1 AN35 I D Analog Input 35 Y7 VDDM -- ADC Analog Part Power Supply (3.3V - 5V) W7 VSSM -- ADC Analog Part Ground U6 VAREF0 -- ADC0 Reference Voltage T7 VAREF1 -- ADC1 Reference Voltage T6 VAGND0 -- ADC Reference Ground N1 VDDMF -- FADC Analog Part Power Supply (3.3V) N2 VDDAF -- FADC Analog Part Logic Power Supply (1.3V) P2 VSSMF -- FADC Analog Part Ground P2 VSSAF -- FADC Analog Part Ground N4 VFAREF -- FADC Reference Voltage N5 VFAGND -- FADC Reference Ground Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-37 V 1.1.1, 2014-05 G8, G13, H7, H14, N7, N14, P8, P13, R16, T17, V19, W20 VDD -- Digital Core Power Supply (1.3V) B1, B6, B11, B20, C2, C19, G2, M2, M19, W10, W16 VDDP -- Port Power Supply (3.3V) M4, VDDE(SB) -- Emulation Stand-by SRAM Power Supply (1.3V) (Emulation device only) Note: This pin is N.C. in a productive device. Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-38 V 1.1.1, 2014-05 A6, A11, A20, B2, B19, D4, D17, E5, E16, G1, M1, M20, Y10, Y16 VSSP -- Digital Ground G9, G10, G11, G12 VSS -- Digital Ground H9, H10, H11, H12 VSS -- Digital Ground J7, J8, J10, J11, J13, J14 VSS -- Digital Ground K7, K8, K9, K10, K11, K12, K13, K14 VSS -- Digital Ground Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-39 V 1.1.1, 2014-05 L7, L8, L9, L10, L11, L12, L13, L14 VSS -- Digital Ground M7, M8, M10, M11, M13, M14 VSS -- Digital Ground N9, N10, N11, N12 VSS -- Digital Ground (cont´d) P9, P10, P11, P12 VSS -- Digital Ground (cont´d) T16, U17, W19, Y20 VSS -- Digital Ground (cont´d) K19 VDDOSC -- Main Oscillator and PLL Power Supply (1.3V) H20 VDDOSC3 -- Main Oscillator Power Supply (3.3V) K17 VDDPF -- Flexray Oscillator and PLL Power Supply (1.3V) J17 VDDPF3 -- Flexray Oscillator Power Supply (3.3V) K20 VSSOSC -- Main Oscillator and PLL Ground D13, D14 VDDFL3 -- Power Supply for Flash (3.3V) J20 XTAL1 I Oscillator/PLL/Clock Generator Input J19 XTAL2 O Oscillator/PLL/Clock Generator Output Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-40 V 1.1.1, 2014-05 Legend for Table 3-1 Column “Ctrl.”: I = Input (for GPIO port lines with IOCR bit field selection PCx = 0XXXB) O = Output O0 = Output with IOCR bit field selection PCx = 1X00B O1 = Output with IOCR bit field selection PCx = 1X01B (ALT1) O2 = Output with IOCR bit field selection PCx = 1X10B(ALT2) O3 = Output with IOCR bit field selection PCx = 1X11(ALT3) Column “Type”: H19 TDI I A2/ PU JTAG Serial Data Input BRKIN I OCDS Break Input (Alternate Input) BRKOUT O OCDS Break Output (Alternate Output) H17 TMS I A2/ PD JTAG State Machine Control Input DAP1 I/O Device Access Port Line 1 G20 TDO I/O A2/ PU JTAG Serial Data Output DAP2 I/O Device Access Port Line 2 BRKIN I OCDS Break Input (Alternate Input) BRKOUT O OCDS Break Output (Alternate Output) G19 TRST IA 1 / PD JTAG Reset Input F20 TCK I A1/ PD JTAG Clock Input DAP0 I Device Access Port Line 0 F19 TESTMODE IP U Test Mode Select Input E19 ESR1 I/O A2/ PD External System Request Reset Input 1 E20 PORST IP D Power On Reset Input D20 ESR0 I/O A2 External System Request Reset Input 0 Default configuration during and after reset is open-drain driver. The driver drives low during power-on reset. A1, N.C. - - Not connected. These pins are reserved for future extension and shall not be connected externally Table 3-1 Pin Definitions and Functions (PG-LFBGA-292-6) (cont’d) Pin Symbol Ctrl. Type Function

PinningTC1784 Pin Configuration Data Sheet 3-41 V 1.1.1, 2014-05 A1 = Pad class A1 (LVTTL) A1+ = Pad class A1+ (LVTTL) A2 = Pad class A2 (LVTTL) F = Pad class F (LVDS/CMOS) D = Pad class D (ADC) I = Pad class I (LVTTL) PU = with pull-up device connected during reset (PORST = 0) PD = with pull-down device connected during reset (PORST = 0) TR = tri-state during reset (PORST = 0)

Data Sheet 42 V 1.1.1, 2014-05

4 Identification Registers

The Identification Registers uniquely identify the whole device. Table 2 SAK-TC1784F-320F180EL Identification Registers Short Name Value Address Stepping CBS_JDPID 0000 6350 H F000 0408H BA CBS_JTAGID 1018 E083 H F000 0464H BA SCU_CHIPID 0500 9610 H F000 0640H BA SCU_MANID 0000 1820 H F000 0644H BA SCU_RTID 0000 0000 H F000 0648H BA Table 3 SAK-TC1784F-320F180EP Identification Registers Short Name Value Address Stepping CBS_JDPID 0000 6350 H F000 0408H BA CBS_JTAGID 1018 E083 H F000 0464H BA SCU_CHIPID 8500 9610 H F000 0640H BA SCU_MANID 0000 1820 H F000 0644H BA SCU_RTID 0000 0000 H F000 0648H BA

Data Sheet 43 V 1.1.1, 2014-05

Electrical ParametersGeneral Parameters Data Sheet 44 V 1.1.1, 2014-05

5 Electrical Parameters

This specification provides all electrical parameters of the TC1784.

5.1 General Parameters

5.1.1 Parameter Interpretation

The parameters listed in this section partly represent the characteristics of the TC1784 and partly its requirements on the system. To aid interpreting the parameters easily when evaluating them for a design, they are marked with an two-letter abbreviation in column “Symbol”:

  • CC Such parameters indicate Controller Characteristics which are a distinctive feature of the TC1784 and must be regarded for a system design.
  • SR Such parameters indicate System Requirements which must provided by the microcontroller system in which the TC1784 designed in.

Electrical ParametersGeneral Parameters Data Sheet 45 V 1.1.1, 2014-05

5.1.2 Pad Driver and Pad Classes Summary

This section gives an overview on the different pad driver classes and its basic characteristics. More details (mainly DC parameters) are defined in the Section 5.2.1. Table 4 Pad Driver and Pad Classes Overview Class Power Supply Type Sub Class Speed Grade 1) These values show typical application configurations for the pad. Complete and detailed pad parameters are available in the individual pad parameter table on the following pages. Load Leakage 150oC 1) Termination A 3.3 V LVTTL I/O, LVTTL outputs (e.g. GPIO)

6 MHz 100 pF 500 nA No

(e.g. serial I/Os) MHz 50 pF 1 μAS e r i e s termination recommended (e.g. serial I/Os) MHz 50 pF 3 μAS e r i e s termination recommended F 3.3 V LVDS – 50 MHz –– P a r a l l e l termination, 100 Ω ± 10% 2) In applications where the LVDS pins are not used (d isabled), these pins must be either left unconnected, or properly terminated with the differential parallel termination of 100 Ω ±1 0 % . CMOS – 6 MHz 50 pF – DE 5V A D C – – – – I 3.3 V LVTTL (input only) –– – –

Electrical ParametersGeneral Parameters Data Sheet 46 V 1.1.1, 2014-05

5.1.3 Absolute Maximum Ratings

Stresses above the values listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any ot her conditions above those indicated in the operational sections of this specificat ion is not implied. Exposure to absolute maximum rating conditions may affect device reliability. Table 5 Absolute Maximu m Rating Parameters Parameter Symbol Values Unit Note / Test Con dition Min. Typ. Max. Storage temperature TST SR -65 – 150 °C– Voltage at 1.3 V power supply pins with respect to VSS VDD SR – – 2.0 V – Voltage at 3.3 V power supply pins with respect to VSS VDDP SR ––4 . 3 3 V– Voltage at 5 V power supply pins with respect to VSS VDDM SR – – 7.0 V – Voltage on any Class A input pin and dedicated input pins with respect to VSS VIN SR -0.7 – VDDP + 0.5 or max. 4.33 V Whatever is lower Voltage on any Class D analog input pin with respect to VAGND0 VAIN VAREFx SR -0.6 – 7.0 V – Voltage on any shared Class D analog input pin with respect to VSSAF, if the FADC is switched through to the pin. VAINF SR -0.6 – 7.0 V – Input current on any pin during overload condition IIN -10 – +10 mA – Absolute maximum sum of all input circuit currents for one port group during overload condition1) 1) The port groups are defined in Table 10. IIN -25 – +25 mA – Absolute maximum sum of all input circuit currents during overload condition ΣIIN -200 – 200 mA –

Electrical ParametersGeneral Parameters Data Sheet 47 V 1.1.1, 2014-05

5.1.4 Pin Reliability in Overload

When receiving signals from higher voltage devices, low-voltage devices experience overload currents and voltages that go beyond their own IO power supplies specification. Table 6 defines overload conditions that will not cause any negative reliability impact if all the following conditions are met:

  • full operation life-time (24000 h) is not exceeded
  • Operating Conditions are met for – pad supply levels ( VDDP or VDDM) – temperature If a pin current is out of the Operating Conditions but within the overload parameters, then the parameters functionality of this pin as stated in the Operating Conditions can no longer be guaranteed. Operat ion is still possible in mo st cases but with relaxed parameters. Note: An overload condition on one or more pins does not require a reset. Note: FADC input pins count as analog pin as they are overlayed with an ADC pins. Table 6 Overload Parameters Parameter Symbol Values Unit Note / Test Con dition Min. Typ. Max. Input current on any digital pin during overload condition except LVDS pins IIN -5 – +5 mA – Input current on LVDS pins IINLVDS -3 – +3 mA – Absolute sum of all input circuit currents for one port group during overload condition 1) The port groups are defined in Table 10. IING -20 – +20 mA – Input current on analog pins IINANA -3 – +3 mA – Absolute sum of all analog input currents for analog inputs of a single ADC during overload condition IINSAS -15 – +15 mA – Absolute sum of all input circuit currents during overload condition ΣIINS -100 – 100 mA –

Electrical ParametersGeneral Parameters Data Sheet 48 V 1.1.1, 2014-05 Note: A series resistor at the pin to limit the current to the maximum permitted overload current is sufficient to handle failure situations like short to battery without having any negative reliability impact on the operational life-time. Table 7 PN-Junction Characteris itics for positive Overload Pad Type I IN =3m A I IN =5m A A1 / A1+ / F UIN = VDDP +0 . 6V UIN = VDDP +0 . 7V A2 UIN = VDDP +0 . 5V UIN = VDDP +0 . 6V LVDS UIN = VDDP +0 . 7V - D UIN = VDDM +0 . 6V - Table 8 PN-Junction Characterisitics for negative Overload Pad Type I IN =- 3m A I IN =- 5m A A1 / A1+ / F UIN = VSS -0 . 6V UIN = VSS -0 . 7V A2 UIN = VSS -0 . 5V UIN = VSS -0 . 6V LVDS UIN = VSS -0 . 7V - D UIN = VSSM -0 . 6V -

Electrical ParametersGeneral Parameters Data Sheet 49 V 1.1.1, 2014-05

5.1.5 Operating Conditions

The following operating conditions must not be exceeded in order to ensure correct operation and reliability of t he TC1784. All parameters specif ied in the following tables refer to these operating conditions, unless otherwise noticed. Digital supply voltages applied to the TC178 4 must be static regulated voltages which allow a typical voltage swing of ± 5 %. All parameters specified in the following tables ( Table 11 and following) refer to these operating conditions ( Table 9), unless otherwise noticed in the Note / Test Condition column. The Extended Range Operating Conditions did not increase area of validity of the parameters defined in table 9 and later. Table 9 Operating Conditions Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Overload coupling factor for analog inputs, negative KOVAN CC −− 0.0001 IOV≤ 0m A ; IOV≥ -2 mA; analog pad= 5.0 V Overload coupling factor for analog inputs, positive KOVAP CC −− 0.0000 IOV≤ 3m A ; IOV≥ 0m A ; analog pad= 5.0 V CPU Frequency fCPU SR −− 180 MHz FPI bus frequency fFPI SR −− 90 MHz LMB frequency fLMB CC −− 180 MHz PCP Frequency fPCP SR −− 180 MHz Inactive device pin current IID SR -1 − 1 mA All power supply voltagesVDDx = Short circuit current of digital outputs1) ISC SR -5 − 5m A Absolute sum of short circuit currents of the device ΣISC_D CC −− 100 mA

Electrical ParametersGeneral Parameters Data Sheet 50 V 1.1.1, 2014-05 Absolute sum of short circuit currents per pin group ΣISC_PG CC −− 20 mA Ambient Temperature TA SR -40 − 125 °C Junction temperature TJ SR -40 − 150 °C Core Supply Voltage VDD SR 1.235 1.3 1.365 2) V Flash supply voltage 3.3V VDDFL3 SR 3.13 3.3 3.47 4) V ADC analog supply voltage VDDM SR 3.13 3.3 5.5 3) V Oscillator core supply voltage VDDOSC SR 1.235 1.3 1.365 2) V Oscillator 3.3V supply voltage VDDOSC3 SR 3.05 3.3 3.47 4) V E-Ray PLL core supply voltage VDDPF SR 1.235 1.3 1.365 2) V E-Ray PLL 3.3V supply voltage VDDPF3 SR 3.05 3.3 3.47 4) V Digital supply voltage for IO pads VDDP SR 3.13 3.3 3.47 4) V VDDP voltage to ensure defined pad states5) VDDPPA CC 0.65 −− V Digital ground voltage VSS SR 0 −− V Analog ground voltage for VDDM VSSM SR -0.1 0 0.1 V Analog core supply VDDAF SR 1.235 1.3 1.365 2) V FADC / ADC analog supply voltage VDDMF SR 3.13 3.3 3.47 4) V Analog ground voltage for VDDMF VSSAF SR -0.1 0 0.1 V 1) Applicable for digital outputs. Table 9 Operating Conditions Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersGeneral Parameters Data Sheet 51 V 1.1.1, 2014-05 Extended Range Operating Conditions The following extended operating conditions are defined:

  • 1 . 3 V + 5 % < VDD / VDDPF / VDDOSC / VDDAF <1 . 3 V+ 7.5% (overvoltage condition): – limited to 10000 hour duration cumulative in lifetime, due to the reliability reduction of the chip caused by the overvoltage stress.
  • 1.3V + 7.5% < VDD / VDDOSC / VDDAF <1 . 3 V+ 10% (overvoltage condition): – limited to 1000 hour duration cumulative in lifetime, due to the reliability reduction of the chip caused by the overvoltage stress.
  • VDDP / VDDOSC3 / VDDFL3 / VDDMF<3 . 3V ± 10% –3 . 3 V + 5 % <VDDP / VDDOSC3 / VDDFL3 / VDDMF<3 . 3 V+ 10% (overvoltage condition): limited to 1000 hour duration cumulative in lifetime, due to the reliability reduction of the chip caused by the overvoltage stress. – 3.3V - 10% < VDDP / VDDOSC3 / VDDFL3 / VDDMF<3 . 3V − 5% (undervoltage condition): -reduces GPIO pads performance 2) Voltage overshoot to 1.7V is permissible at Power-Up and PORST low, provided the pulse duration is less than 100 μs and the cumulated sum of the pulses does not exceed 1 h. 3) Voltage overshoot to 6.5V is permissible at Power-Up and PORST low, provided the pulse duration is less than 100 μs and the cumulated sum of the pulses does not exceed 1 h. 4) Voltage overshoot to 4.0V is permissible at Power-Up and PORST low, provided the pulse duration is less than 100 μs and the cumulated sum of the pulses does not exceed 1 h. 5) This parameter is valid under the assumption the PORST signal is constantly at low level during the power- up/power-down of VDDP. Table 10 Pin Groups for Overload / Short-Circuit Current Sum Parameter Group Pins 1 P5.[7:2], P5.15 2 P5.[9:8] 3 P5.[11:10] 4 P5.[14:12] 5 P1.[14:12], P2.0 6 P2.[4:1] 7 P2.[7:5] 8 P4.[2:0]

Electrical ParametersGeneral Parameters Data Sheet 52 V 1.1.1, 2014-05 9P 4 . 3 10 P1.2, P1.8 11 P1.[10:9] 12 P1.3, P1.11 13 P1.[7:4] 14 P1.[1:0], P1.15 19 P0.[11:10] 20 P6.[3:0] 21 P2.[13:8] Table 10 Pin Groups for Overload / Short-Circuit Current Sum Parameter Group Pins

Electrical ParametersDC Parameters Data Sheet 53 V 1.1.1, 2014-05

5.2 DC Parameters

5.2.1 Input/Output Pins

Table 11 Standard_Pads Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Pin capacitance (digital inputs/outputs) CIO CC −− 10 pF TA=2 5° C ; f=1M H z Pull-down current | IPDL| CC −− 150 μA Vi≥ 0.6 x VDDP V 10 −−μ A Vi≥ 0.36 x VDDP V Pull-Up current | IPUH| CC 10 −−μ A Vi≤ 0.6 x VDDP V −− 100 μA Vi≤ 0.36 x VDDP V Spike filter always blocked pulse duration tSF1 CC −− 10 ns only PORST pin Spike filter pass-through pulse duration tSF2 CC 100 −− ns only PORST pin Table 12 Standard_Pads Class_A1 Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input Hysteresis for A1 pads 1) HYSA1 CC 0.1 x VDDP −− V Input Leakage Current Class A1 IOZA1 CC -500 − 500 nA Vi≥ 0V ; Vi≤ VDDP V Ratio Vil/Vih, A1 pads VILA1 / VIHA1 CC 0.6 −− On-Resistance of the class A1 pad, weak driver RDSONW CC − 450 600 Ohm IOH>- 0 . 5m A ; P_MOS − 210 340 Ohm IOL<0 . 5m A ; N_MOS

Electrical ParametersDC Parameters Data Sheet 54 V 1.1.1, 2014-05 On-Resistance of the class A1 pad, medium driver RDSONM CC −− 155 Ohm IOH>- 2m A ; P_MOS −− 110 Ohm IOL<2m A ; N_MOS Fall time, pad type A1 tFA1 CC −− 150 ns CL= 20 pF; pin out driver= weak −− 50 ns CL= 50 pF; pin out driver= medium −− 140 ns CL= 150 pF; pin out driver= medium −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Table 12 Standard_Pads Class_A1 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 55 V 1.1.1, 2014-05 Rise time, pad type A1 tRA1 CC −− 150 ns CL= 20 pF; pin out driver= weak −− 50 ns CL= 50 pF; pin out driver= medium −− 140 ns CL= 150 pF; pin out driver= medium −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Input high voltage class A1 pads VIHA1 SR 0.6 x VDDP − min(V DDP+ 0.3,3.6 V Input low voltage class A1 pads VILA1 SR -0.3 − 0.36 x VDDP V Table 12 Standard_Pads Class_A1 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 56 V 1.1.1, 2014-05 Output voltage high class A1 pads VOHA1 CC VDDP - 0.4 −− V IOH≥ -1.4 mA; pin out driver= medium 2.4 −− V IOH≥ -2 mA; pin out driver= medium VDDP - 0.4 −− V IOH≥ -400 μA; pin out driver= weak 2.4 −− V IOH≥ -500 μA; pin out driver= weak Output voltage low class A1 pads VOLA1 CC −− 0.4 V IOL≤ 2 mA; pin out driver= medium −− 0.4 V IOL≤ 500 μA; pin out driver= weak 1) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. Table 13 Standard_Pads Class_A1+ Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input Hysteresis for A1+ pads 1) HYSA1 + CC 0.1 x VDDP −− V Input Leakage Current Class A1+ IOZA1+ CC -1000 − 1000 nA On-Resistance of the class A1+ pad, weak driver RDSONW CC − 450 600 Ohm IOH>- 0 . 5m A ; P_MOS − 210 340 Ohm IOL<0 . 5m A ; N_MOS Table 12 Standard_Pads Class_A1 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 57 V 1.1.1, 2014-05 On-Resistance of the class A1+ pad, medium driver RDSONM CC −− 155 Ohm IOH>- 2m A ; P_MOS −− 110 Ohm IOL<2m A ; N_MOS On-Resistance of the class A1+ pad, strong driver RDSON1+ CC −− 100 Ohm IOH>- 2m A ; P_MOS −− 80 Ohm IOL<2m A ; N_MOS Fall time, pad type A1+ tFA1+ CC −− 150 ns CL= 20 pF; pin out driver= weak −− 28 ns CL=5 0p F ; edge= slow ; pin out driver= strong −− 16 ns CL=5 0p F ; edge= soft ; pin out driver= strong −− 50 ns CL= 50 pF; pin out driver= medium −− 140 ns CL= 150 pF; pin out driver= medium −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Table 13 Standard_Pads Class_A1+ (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 58 V 1.1.1, 2014-05 Rise time, pad type A1+ tRA1+ CC −− 150 ns CL= 20 pF; pin out driver= weak −− 28 ns CL=5 0p F ; edge= slow ; pin out driver= strong −− 16 ns CL=5 0p F ; edge= soft ; pin out driver= strong −− 50 ns CL= 50 pF; pin out driver= medium −− 140 ns CL= 150 pF; pin out driver= medium −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Input high voltage, Class A1+ pads VIHA1+ SR 0.6 x VDDP − min(V DDP+ 0.3,3.6 V Input low voltage Class A1+ pads VILA1+ SR -0.3 − 0.36 x VDDP V Ratio Vil/Vih, A1+ pads VILA1+ / VIHA1+ CC 0.6 −− Table 13 Standard_Pads Class_A1+ (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 59 V 1.1.1, 2014-05 Output voltage high class A1+ pads VOHA1+ CC VDDP - 0.4 −− V IOH≥ -1.4 mA; pin out driver= medium VDDP - 0.4 −− V IOH≥ -1.4 mA; pin out driver= strong 2.4 −− V IOH≥ -2 mA; pin out driver= medium 2.4 −− V IOH≥ -2 mA; pin out driver= strong VDDP - 0.4 −− V IOH≥ -400 μA; pin out driver= weak 2.4 −− V IOH≥ -500 μA; pin out driver= weak Output voltage low class A1+ pads VOLA1+ CC −− 0.4 V IOL≤ 2 mA; pin out driver= medium −− 0.4 V IOL≤ 2 mA; pin out driver= strong −− 0.4 V IOL≤ 500 μA; pin out driver= weak 1) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. Table 13 Standard_Pads Class_A1+ (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 60 V 1.1.1, 2014-05 Table 14 Standard_Pads Class_A2 Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input Hysteresis for A2 pads 1) HYSA2 CC 0.1 x VDDP −− V Input Leakage current Class A2 IOZA2 CC -6000 − 6000 nA Vi< VDDP / 2 - 1V ; Vi> VDDP / 2 + 1 V; Vi≥ 0V ; Vi≤ VDDP V -3000 − 3000 nA Vi> VDDP / 2 - 1V ; Vi< VDDP / 2 + 1 V Ratio Vil/Vih, A2 pads VILA2 / VIHA2 CC 0.6 −− On-Resistance of the class A2 pad, weak driver RDSONW CC − 450 600 Ohm IOH>- 0 . 5m A ; P_MOS − 210 340 Ohm IOL<0 . 5m A ; N_MOS On-Resistance of the class A2 pad, medium driver RDSONM CC −− 155 Ohm IOH>- 2m A ; P_MOS −− 110 Ohm IOL<2m A ; N_MOS On-Resistance of the class A2 pad, strong driver RDSON2 CC −− 28 Ohm IOH>- 2m A ; P_MOS −− 22 Ohm IOL<2m A ; N_MOS

Electrical ParametersDC Parameters Data Sheet 61 V 1.1.1, 2014-05 Fall time, pad type A2 tFA2 CC −− 150 ns CL= 20 pF; pin out driver= weak −− 7n s CL=5 0p F ; edge= medium ; pin out driver= strong −− 10 ns CL=5 0p F ; edge= medium- minus ; pin out driver= strong −− 3.7 ns CL=5 0p F ; edge= sharp ; pin out driver= strong −− 5n s CL=5 0p F ; edge= sharp- minus ; pin out driver= strong −− 16 ns CL=5 0p F ; edge= soft ; pin out driver= strong −− 50 ns CL= 50 pF; pin out driver= medium −− 7.5 ns CL=1 0 0p F ; edge= sharp ; pin out driver= strong −− 140 ns CL= 150 pF; pin out driver= medium Table 14 Standard_Pads Class_A2 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 62 V 1.1.1, 2014-05 −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Table 14 Standard_Pads Class_A2 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 63 V 1.1.1, 2014-05 Rise time, pad type A2 tRA2 CC −− 150 ns CL= 20 pF; pin out driver= weak −− 7.0 ns CL=5 0p F ; edge= medium ; pin out driver= strong −− 10 ns CL=5 0p F ; edge= medium- minus ; pin out driver= strong −− 3.7 ns CL=5 0p F ; edge= sharp ; pin out driver= strong −− 5n s CL=5 0p F ; edge= sharp- minus ; pin out driver= strong −− 16 ns CL=5 0p F ; edge= soft ; pin out driver= strong −− 50 ns CL= 50 pF; pin out driver= medium −− 7.5 ns CL=1 0 0p F ; edge= sharp ; pin out driver= strong −− 140 ns CL= 150 pF; pin out driver= medium Table 14 Standard_Pads Class_A2 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 64 V 1.1.1, 2014-05 −− 550 ns CL= 150 pF; pin out driver= weak −− 18000 ns CL= 20000 pF; pin out driver= medium −− 65000 ns CL= 20000 pF; pin out driver= weak Input high voltage, class A2 pads VIHA2 SR 0.6 x VDDP − min(V DDP + 0.3, 3.6) V Input low voltage Class A2 pads VILA2 SR -0.3 − 0.36 x VDDP V Output voltage high class A2 pads VOHA2 CC VDDP - 0.4 −− V IOH≥ -1.4 mA; pin out driver= medium VDDP - 0.4 −− V IOH≥ -1.4 mA; pin out driver= strong 2.4 −− V IOH≥ -2 mA; pin out driver= medium 2.4 −− V IOH≥ -2 mA; pin out driver= strong VDDP - 0.4 −− V IOH≥ -400 μA; pin out driver= weak 2.4 −− V IOH≥ -500 μA; pin out driver= weak Table 14 Standard_Pads Class_A2 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 65 V 1.1.1, 2014-05 Output voltage low class A2 pads VOLA2 CC −− 0.4 V IOL≤ 2 mA; pin out driver= medium −− 0.4 V IOL≤ 2 mA; pin out driver= strong −− 0.4 V IOL≤ 500 μA; pin out driver= weak 1) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. Table 15 Standard_Pads Class_F Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input Hysteresis F1) HYSF CC 0.05 x VDDP −− V Input Leakage Current Class F IOZF CC -6000 − 6000 nA Vi< VDDP / 2 - 1V ; Vi> VDDP / 2 + 1 V; Vi≥ 0V ; Vi≤ VDDP V -3000 − 3000 nA Vi> VDDP / 2 - 1V ; Vi< VDDP / 2 + 1 V Ratio Vil/ Vih, F pads VILF / VIHF CC 0.6 −− On-Resistance of the class F pad, medium driver RDSONM CC −− 170 Ohm IOH>- 2m A ; P_MOS −− 145 Ohm IOL<2m A ; N_MOS Fall time, pad type F, CMOS mode tFF CC −− 60 ns CL=5 0p F Rise time, pad type F, CMOS mode tRF CC −− 60 ns CL=5 0p F Table 14 Standard_Pads Class_A2 (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 66 V 1.1.1, 2014-05 Input high voltage, pad class F, CMOS mode VIHF SR 0.6 x VDDP − min(V DDP+ 0.3, 3.6) V Input low voltage, Class F pads, CMOS mode VILF SR -0.3 − 0.36 x VDDP V Output high voltage, class F pads, CMOS mode VOHF CC VDDP- 0.4 −− V IOH≥ -1.4 mA 2.4 −− V IOH≥ -2 mA Output low voltage, class F pads, CMOS mode VOLF CC −− 0.4 V IOL≤ 2m A 1) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. Table 16 Standard_Pads Class_I Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input Hysteresis Class I1) 1) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. HYSI CC 0.1 x VDDP −− V Input Leakage Current IOZI CC -1000 − 1000 nA Ratio between low and high input threshold VILI / VIHI CC 0.6 −− Input high voltage, class I pins VIHI SR 0.6 x VDDP − min(V DDP+ 0.3, 3.6) V Input low voltage, Class I pads VILI SR -0.3 − 0.36 x VDDP V Table 15 Standard_Pads Class_F (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 67 V 1.1.1, 2014-05 Table 17 LVDS_Pa ds Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Output impedance, pad class F, LVDS mode RO CC 40 − 140 Ohm Fall time, pad type LVDS tFL CC −− 2 ns termination 100 Ω ±1% ; differential capacitance = 10 pF; input capacitance = 20 pF Rise time, pad type LVDS tRL CC −− 2 ns termination 100 Ω ±1% ; differential capacitance = 10 pF; input capacitance = 20 pF Pad set-up time tSET_LVD S CC −− 13 μs termination 100 Ω ±1% Output Differential Voltage VOD CC 150 − 400 mV termination 100 Ω ±1% Output voltage high, pad class F, LVDS mode VOH CC −− 1525 mV termination 100 Ω ±1% Output voltage low, pad class F, LVDS mode VOL CC 875 −− mV termination 100 Ω ±1% Output Offset Voltage VOS CC 1075 − 1325 mV termination 100 Ω ±1%

Electrical ParametersDC Parameters Data Sheet 68 V 1.1.1, 2014-05

5.2.2 Analog to Digital Converters (ADCx)

ADC parameter are valid for VDDM = 4.75 V to 5.25 V. Table 18 ADC Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Switched capacitance at the analog voltage inputs1) CAINSW CC − 92 0 p F Total capacitance of an analog input CAINTOT CC − 20 30 pF Switched capacitance at the positive reference voltage input2)3) CAREFSW CC − 15 30 pF Total capacitance of the voltage reference inputs2) CAREFTO T CC − 20 40 pF Differential Non-Linearity Error4)5)6)7) EADNL CC -3 − 3 LSB ADC resolution= 12- bit 8) 9) Gain Error4)6)5)7) EAGAIN CC -3.5 − 3.5 LSB ADC resolution= 12- bit 8) 9) Integral Non- Linearity 4)6)5)7) EAINL CC -3 − 3 LSB ADC resolution= 12- bit 8) 9) Offset Error4)6)5)7) EAOFF CC -4 − 4 LSB ADC resolution= 12- bit 8) 9) Converter clock fADC SC 4 − 90 MHz fADC= fFPI Internal ADC clock fADCI CC 1 − 18 MHz Charge consumption per conversion QCONV CC 70 85 10) 100 pC charge needs to be provided via VAREFx

Electrical ParametersDC Parameters Data Sheet 69 V 1.1.1, 2014-05 Input leakage at analog inputs11) IOZ1 CC -100 − 500 nA Vi≤ VDDM V; Vi≥ 0.97 x VDDM V; overlayed= No -100 − 600 nA Vi≥ 0.97 x VDDM V; Vi≤ VDDM V; overlayed= Yes -500 − 100 nA Vi≤ 0.03 x VDDM V; Vi≥ 0V ; overlayed= No -600 − 100 nA Vi≤ 0.03 x VDDM V; Vi≥ 0V ; overlayed= Yes -100 − 200 nA Vi> 0.03 x VDDM V; Vi< 0.97 x VDDM V; overlayed= No -100 − 300 nA Vi< 0.97 x VDDM V; Vi> 0.03 x VDDM V; overlayed= Yes Input leakage current at Varef0 IOZ2 CC -1 − 1 μA VAREF0≤ VDDM V Input leakage current at Varef1 -1 − 1 μA VAREF1≤ VDDM V Input leakage current at Vagnd0 IOZ3 CC -2 − 2 μA VAGND0≤ VDDM V ON resistance of the transmission gates in the analog voltage path RAIN CC − 900 1500 Ohm Table 18 ADC Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 70 V 1.1.1, 2014-05 ON resistance for the ADC test (pull down for AIN7) RAIN7T CC 180 550 900 Ohm Resistance of the reference voltage input path RAREF CC − 500 1000 Ohm Sample time tS CC 2 − 257 T ADCI Calibration time after bit ADC_GLOBCFG.SUCAL is set tCAL CC −− 4352 cycle s Total Unadjusted Error6)5)12) TUE CC -4 − 413) LSB ADC resolution= 12- bit Analog reference ground2) VAGND0 SR VSSM - 0.05 − VAREFx - 1 V Analog input voltage VAIN SR VAGND0 − VAREFx V Analog reference voltage2) VAREFx SR VAGND0 + 1 − VDDM + 0.0514) 15) V Analog reference voltage range6)5)2) VAREFx - VAGND0 SR VDDM/2 − VDDM + 0.05 V 1) The sampling capacity of the conversion C-network is pre-charged to VAREFx/2 before the sampling moment. Because of the parasitic elements the voltage measured at AINx can deviate from VAREFx/2. 2) Applies to AINx, when used as auxiliary reference input. 3) This represents an equivalent switched capacitance. This capacitance is not switched to the reference voltage at once. Instead smaller capacitances are successively switched to the reference voltage. 4) The sum of DNL/INL/GAIN/OFF errors does not exceed the related TUE total unadjusted error. 5) If a reduced analog reference voltage between 1V and VDDM / 2 is used, then there are additional decrease in the ADC speed and accuracy. 6) If the analog reference voltage range is below VDDM but still in the defined range of VDDM / 2 and VDDM is used, then the ADC converter errors increase. If the reference voltage is reduced by the factor k (k<1), TUE,DNL,INL,Gain, and Offset errors increase also by the factor 1/k. 7) If the analog reference voltage is > VDDM, then the ADC converter errors increase. 8) For 10-bit conversions the error value must be multiplied with a factor 0.25. 9) For 8-bit conversions the error value must be multiplied with a factor 0.0625. 10) For a conversion time of 1 µs a rms value of 85µA result for IAREFx. Table 18 ADC Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 71 V 1.1.1, 2014-05 The power-up calibration of the ADC requires a maximum number of 4352 fADCI cycles. Figure 2 ADCx Input Circuits 11) The leakage current definition is a continuos function, as shown in figure ADCx Analoge Input Leakage. The numerical values defined determine the characteristic points of the given continuous linear approximation - they do not define step function. 12) Measured without noise. 13) For 10-bit conversion the TUE is ±2LSB; for 8-bit conversion the TUE is ±1LSB 14) A running conversion may become inexact in case of violating the normal conditions (voltage overshoot). 15) If the reference voltage VAREFx increase or the VDDM decrease, so that VAREF = (VDDM + 0.05V to VDDM + 0.07V), then the accuracy of the ADC decrease by 4LSB12. Table 19 Conversion Time (Operating Conditions apply) Parameter Symbol Values Unit Note Conversion time with post-calibration tC CC 2 × TADC +( 4+S T C+n ) × TADCI μs n = 8, 10, 12 for n - bit conversion TADC =1/ fFPI TADCI =1/ fADCIConversion time without post-calibration 2 × TADC +( 2+S T C+n ) × TADCI Reference Voltage Input Circuitry Analog Input Circuitry Analog_InpRefDiag REXT =VAIN CEXT RAIN, On CAINTOT - CAINSW CAINSW ANx VAREF RAREF, On CAREFTOT - CAREFSW CAREFSW VAGNDx VAREFx RAIN7TVAGNDx

Electrical ParametersDC Parameters Data Sheet 72 V 1.1.1, 2014-05 Figure 3 ADCx Analog Inputs Leakage VIN[VDDM%]200nA 500nA 3% 100%97% Ioz1 100nA -500nA -100nA VIN[VDDM%]300nA 600nA 3% 100%97% Ioz1 100nA -600nA -100nA Single ADC Input Overlayed ADC/FADC Input

Electrical ParametersDC Parameters Data Sheet 73 V 1.1.1, 2014-05

5.2.3 Fast Analog to Digital Converter (FADC)

Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input current at VFAREF IFAREF CC −− 120 μA Input leakage current at VFAREF1) IFOZ2 CC -500 − 500 nA VFAREF≤ VDDMF V; VFAREF≥ 0V Input leakage current at VFAGND IFOZ3 CC -500 − 500 nA DNL error EFDNL CC -1 − 1L S B VIN mode= differential; Gain = 1 or 2 -2 − 2L S B VIN mode= differential; Gain = 4 or 82) -1 − 1L S B VIN mode= single ended; Gain = 1 or 2 -2 − 2L S B VIN mode= single ended; Gain = 4 or 82) GRADient error EFGRAD CC -5 − 5% VIN mode= differential ; Gain≤ 4 -5 − 5% VIN mode= single ended ; Gain≤ 4 -6 − 6% VIN mode= differential ; Gain= 8 -6 − 6% VIN mode= single ended ; Gain= 8

Electrical ParametersDC Parameters Data Sheet 74 V 1.1.1, 2014-05 INL error EFINL CC -4 − 4L S B VIN mode= differential -4 − 4L S B VIN mode= single ended Offset error EFOFF CC -90 − 90 mV VIN mode= differential ; Calibration= No -90 − 90 mV VIN mode= single ended ; Calibration= No -20 − 20 mV VIN mode= differential ; Calibration= Ye s 3)4) -20 − 20 mV VIN mode= single ended ; Calibration= Ye s 3)4) Error of commen mode voltage VFAREF/2 EFREF CC -60 − 60 mV Channel amplifier cutoff frequency fCOFF CC 2 −− MHz Converter clock fFADC SC 1 − 90 MHz fFADC= fFPI Conversion time tC CC −− 21 1 / fFADC For 10-bit conversion Input resistance of the analog voltage path (Rn, Rp) RFAIN CC 100 − 200 kOh m Settling time of a channel amplifier after changing ENN or ENP tSET CC −− 5 μs Analog input voltage range VAINF SR VFAGND − VDDMF V Table 20 FADC Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 75 V 1.1.1, 2014-05 The calibration procedure should run after each power-up, when all power supply voltages and the reference voltage have stabilized. Analog reference ground VFAGND SR VSSAF - 0.05 − VSSAF + 0.05 V Analog reference voltage VFAREF SR 3.0 − 3.635) V 1) This value applies in power-down mode. 2) No missing codes. 3) Calibration should be preformed at each power-up. In case of a continous operation, it should be performed minimium once per week. 4) The offser error voltage drifts over the whole temperature range maximum +-3LSB. 5) Voltage overshoot to 4V is permissible, pr ovided the pulse duration is less than 100 μs and the cumulated sum of the pulses does not exceed 1 h. 6) A running conversion may become inexact in case of violating the nomal operating conditions (voltage overshoots). Table 20 FADC Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 76 V 1.1.1, 2014-05 Figure 4 FADC Input Circuits FADC_InpRefDiag RN FAINxN FAINxP VFAGND FADC Analog Input Stage RP VFAREF /2 VFAREF FADC Reference Voltage Input Circuitry VFAGND VFAREF IFAREF

Electrical ParametersDC Parameters Data Sheet 77 V 1.1.1, 2014-05

5.2.4 Oscillator Pins

Note: It is strongly recomm ended to measure the oscill ation allowance (negative resistance) in the final target system (layout) to determine the optimal parameters for the oscillator operation. Please refer to the limits specified by the crystal or ceramic resonator supplier. Table 21 OSC_XTAL Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Input current at XTAL1 IIX1 CC -25 − 25 μA VIN<VDDOSC3 ; VIN>0 V Input frequency fOSC SR 4 − 40 MHz Direct Input Mode selected 8 − 25 MHz External Crystal Mode selected Oscillator start-up time1) 1) tOSCS is defined from the moment when VDDOSC3 = 3.13V until the oscillations reach an amplitude at XTAL1 of 0.3 * VDDOSC3. The external oscillator circuitry must be opti mized by the customer and checked for negative resistance as recommended and specified by crystral suppliers. tOSCS CC −− 10 ms Input high voltage at XTAL12) 2) If the XTAL1 pin is driven by a crystal, reac hing a minimum amplitude (peak-to-peak) of 0.4 * VDDOSC3 is necessary. VIHX SR 0.7 x VDDOS − VDDOS C3 + 0.5 V Input low voltage at XTAL1 VILX SR -0.5 − 0.3 x VDDOS V Input Hysteresis for XTAL1 pad 3) 3) Hysteresis is implemented to avoid metastable states and switching due to internal ground bounce. It can´t be guaranteed that it suppresses switching due to external system noise. HYSAX CC −− 200 mV

Electrical ParametersDC Parameters Data Sheet 78 V 1.1.1, 2014-05

5.2.5 Temperature Sensor

The following formula calculates the temperature measured by the DTS in [oC] from the RESULT bit field of the DTSSTAT register. (1) Table 22 DTS Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Measurement time tM CC −− 100 μs Temperature sensor range TSR SR -40 − 150 °C Sensor Accuracy (calibrated) TTSA CC -6 − 6° C Start-up time after resets inactive tTSST SR −− 20 μs Tj DTSSTAT RESULT 596–

Electrical ParametersDC Parameters Data Sheet 79 V 1.1.1, 2014-05

5.2.6 Power Supply Current

The total power supply current defined below consists of leakage and switching component. Application relevant values are typically lower than those given in the following two tables and depend on the customer 's system operating conditions (e.g. thermal connection or used application configurations). The operating conditions for the parameters in the following table are: VDD=1.365 V, VDDP=3.47 V, VDDM=5.1 V, fLMB=180, TJ=150 oC The realisic power pattern defines the following conditions:

  • TJ=150 oC
  • fLMB = fPCP = fCPU =1 8 0M H z
  • fFPI =9 0M H z
  • VDD = VDDOSC = VDDAF =1 . 3 2 6V
  • VDDP = VDDOSC3 = VDDFL3 = VDDMF =3 . 3 6 6V
  • VDDM =5 . 1V The max power pattern defines the following conditions: TJ=150 oC
  • fLMB = fPCP = fCPU =1 8 0M H z
  • fFPI =9 0M H z
  • VDD = VDDOSC = VDDAF =1 . 3 6 5V
  • VDDP = VDDOSC3 = VDDFL3 = VDDMF =3 . 4 7V
  • VDDM =5 . 5V Table 23 Power Supply Parameters Parameter Symbol Values Unit Note / Test Condition Min. Typ. Max. Core active mode supply current 1)2) IDD CC −− 5853) mA power pattern= max −− 4334) mA power pattern= realistic IDD current at PORST Low IDD_PORS T CC −− 300 mA −− 291 mA VDD=1.326 V Analog core supply current IDDAF CC −− 23 mA Oscillator core supply current IDDOSC CC −− 2m A E-Ray PLL core supply current IDDPF CC −− 2m A

Electrical ParametersDC Parameters Data Sheet 80 V 1.1.1, 2014-05 IDDP current at PORST Low IDDP_POR ST CC −− 2.5 mA IDDP current no pad activity, LVDS off 5) IDDP CC −− IDDP_P ORST + mA including flash read current −− IDDP_P ORST + mA including flash programming current 6) −− IDDP_P ORST + 20 7) mA including flash erase current Flash memory current IDDFL3 CC −− 56 mA flash read current −− 21 mA flash programming current 6) −− 56 mA flash erase current 6) Oscillator power supply current, 3.3V IDDOSC3 CC −− 11.5 mA E-Ray PLL supply current, 3.3V IDDPF3 CC −− 3.5 mA FADC analog supply current, 3.3V IDDMF CC −− 15 mA Current Consumption of LVDS Pad Pairs ILVDS CC −− 24 mA for all LVDS pads in total ADC 5V power supply current IDDM CC −− 2m A Maximum power dissipation PD CC −− 1277 mW power pattern= max −− 1042 mW power pattern= realistic 1) Infineon Power Loop: CPU and PCP running, all peripher als active. The power consumption of each customer application will most probably be lower than this value, but must be evaluated seperately. 2) This current includes the E-Ray module power consumption, including the PCP operation component. Table 23 Power Supply Parameters (cont’d) Parameter Symbol Values Unit Note / Test Condition Min. Typ. Max.

Electrical ParametersDC Parameters Data Sheet 81 V 1.1.1, 2014-05 5.2.6.1 Calculating the 1.3 V Current Consumption The current consumption of the 1.3 V rail compose out of two parts:

  • Static current consumption
  • Dynamic current consumption The static current consumption is related to the device temperature TJ and the dynamic current consumption depends of the configured clocking frequencies and the software application executed. These two parts needs to be added in order to get the rail current consumption. (2) (3) Function 2 defines the typical static curren t consumption and Function 3 defines the maximum static current consumption. Both functions are valid for V DD =1 . 3 2 6V . For the dynamic current consumption using the application pattern and fLMB =2* fFPI the function 4 applies: (4) 3) The IDD decreases typically by 79mA if the fCPU decreases by 50MHz, at constant TJ 4) The IDD decreases typically by 38mA if the fCPU decreases by 50MHz, at constant TJ 5) For operations including the D-Flash the required cu rrents are always lower than the currents for non D-Flash operation. 6) Relevant for the power supply dimensi oning, not for thermal considerations. 7) In case of erase of Program Flash PF, internal flash array loading effects may generate transient current spikes of up to 15 mA for maximum 5 ms per flash module. I0 2 20897 mA I0 10 68 mA IDym 07 7 mA

Electrical ParametersDC Parameters Data Sheet 82 V 1.1.1, 2014-05 and this finally results in (5) IDD I0 IDYM+=

Electrical ParametersAC Parameters Data Sheet 83 V 1.1.1, 2014-05

5.3 AC Parameters

That means, keeping the pads constantly at maximum strength.

5.3.1 Testing Waveforms

Figure 5 Rise/Fall Time Parameters Figure 6 Testing Waveform, Output Delay Figure 7 Testing Waveform, Output High Impedance 10% 90% 10% 90% VSS VDDP tR rise_fall tF mct 04881_a.vsd VDDE / 2 Test Points VDDE / 2 VSS VDDP MCT04880_new VLoad + 0.1 V VOH - 0.1 VTiming Reference PointsVLoad - 0.1 V VOL - 0.1 V

Electrical ParametersAC Parameters Data Sheet 84 V 1.1.1, 2014-05

5.3.2 Power Sequencing

Figure 8 5 V / 3.3 V / 1.3 V Power-Up/Down Sequence The following list of rules applies to the power-up/down sequence:

  • All ground pins VSS must be externally connected to one single star point in the system. Regarding the DC current component, all ground pins are internally directly connected.
  • At any moment in time to avoid increased latch-up risk, each power supply must be higher then any lower_power_supply - 0.5 V, or: – The latch-up risk is minimized if the I/O currents are limited to: – 20 mA for one pin group – AND 100 mA for the completed device I/Os – AND additionally before power-up / after power-down: 1 mA for one pin in inactive mode (0 V on all power supplies)
  • During power-up and power-down, the volt age difference between the power supply pins of the same voltage (3.3 V, 1.3 V, an d 5 V) with different names (for example VDDP, VDDFL3 ...), that are internally connected via diodes, must be lower than 100 mV. On the other hand, all power supply pins with the same name (for example all VDDP), 1.3V 3.3V t V t -12% -12% PORST 0.5V0.5V 0.5V VDDP VAREF power down power fail 3.63V 2.97V 1.17V 1.43V 4.5V 5.5V

Electrical ParametersAC Parameters Data Sheet 85 V 1.1.1, 2014-05 are internally directly connected. It is recommended that the power pins of the same voltage are driven by a single power supply. 1. The PORST signal may be deactivated after all VDD5, VDD3.3, VDD1.3, and VAREF power- supplies and the oscillator have reac hed stable operation, within the normal operating conditions. 2. At normal power down the PORST signal should be activated within the normal operating range, and then the power supp lies may be switched off. Care must be taken that all Flash write or delete sequences have been completed. 3. At power fail the PORST signal must be activated at latest when any 3.3 V or 1.3 V power supply voltage falls 12% below the no minal level. If, under these conditions, the PORST is activated during a Flash write, only the memory row that was the target of the write at the moment of the power loss will contain unreliable content. In order to ensure clean power-down behavior, the PORST signal should be activated as close as possible to the normal operating voltage range. 4. In case of a power-loss at any power-supply, all power supplies must be powered- down, conforming at the same time to the rules number 2 and 4. 5. Although not necessary, it is additionally recommended that all power supplies are powered-up/down together in a controlled way, as tight to each other as possible. 6. Additionally, regarding the ADC reference voltage VAREF: – VAREF must power-up at the same time or later then VDDM, and – VAREF must power-down either earlier or at latest to satisfy the condition VAREF < VDDM + 0.5 V. This is required in order to prevent discharge of VAREF filter capacitance through the ESD diodes through the VDDM power supply. In case of discharging the reference capacitance through the ESD diodes, the current must be lower than 5 mA.

Electrical ParametersAC Parameters Data Sheet 86 V 1.1.1, 2014-05

5.3.3 Power, Pad and Reset Timing

Table 24 Reset Timings Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Application Reset Boot Time1)2) 1) The duration of the boot time is defined between the ri sing edge of the internal application reset and the clock cycle when the first user instruction has entered the CPU pipeline and its processing starts. 2) The given time includes the time of the internal reset extension for a configured value of SCU_RSTCNTCON.RELSA = 0x05BE. tB CC 150 − 665 μs fCPU =1 8 0M H z Power on Reset Boot Time3)4) 3) The duration of the boot time is defined between the rising edge of the PORST and the clock cycle when the first user instruction has entered the CPU pipeline and its processing starts. tBP CC −− 2.5 ms HWCFG pins hold time from ESR0 rising edge tHDH SR 16 / fFPI −− ns HWCFG pins setup time to ESR0 rising edge tHDS CC 0 −− ns Ports inactive after ESR0 reset active tPI CC −− 8 / fFPI ns Ports inactive after PORST reset active5) tPIP CC −− 150 ns Minimum PORST active time after power supplies are stable at operating levels tPOA CC 10 −− ms TESTMODE /T R S T hold time from PORST rising edge tPOH SR 100 −− ns PORST rise time tPOR SR −− 50 ms TESTMODE /T R S T setup time to PORST rising edge tPOS SR 0 −− ns Application Reset inactive after PORST deassertion tPOR_APP SR −− 40 6) μs

Electrical ParametersAC Parameters Data Sheet 87 V 1.1.1, 2014-05 Figure 9 Power, Pad and Reset Timing 4) The given time includes the internal reset extension time for the System and Application Reset which is visible through ESR0. 5) This parameter includes the delay of the analog spike filter in the PORST pad. 6) Application Reset is assumed not to be extended from external, otherwise the time extends by the time the Application Reset is extended. reset_beh2 As programmed VDDP Pads Pad-state undefined VDD VDDPPA VDDPPA thd tPOA tPOA TRST TESTMODE ESR 0 PORST tPOH HWCFG tHDH tPIP tPI Tri -state or pull device active thd tPOH tHDH t PIP tPIt PIP tPI tPI tHDH tPI VDDP -12% VDD -12%

Electrical ParametersAC Parameters Data Sheet 88 V 1.1.1, 2014-05

5.3.4 Phase Locked Loop (PLL)

Phase Locked Loop Operation When PLL operation is enabled and configured, the PLL clock fVCO (and with it the LMB- Bus clock fLMB) is constantly adjusted to the sele cted frequency. The PLL is constantly adjusting its output frequency to correspond to the input frequency (from crystal or clock source), resulting in an accumulated jitter t hat is limited. This means that the relative deviation for periods of more than one clock cycle is lower than for a single clock cycle. This is especially important for bus cycles using wait states and for the operation of timers, serial interfaces, etc. For all slower operations and longer periods (e.g. pulse train generation or measurement, lower baudrates, etc.) the deviation caused by the PLL jitter is negligible. Two formulas are defined for the (absolute) approximate maximum value of jitter Dm in [ns] dependent on the K2 - factor, the LMB clock frequency fLMB in [MHz], and the number m of consecutive fLMB clock periods. (6) (7) With rising number m of clock cycles the maximum jitter increases linearly up to a value of m that is defined by the K2-factor of the PLL. Beyond this value of m the maximum Table 25 PLL_SysClk Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Accumulated Jitter DP CC -7 − 7n s PLL base frequency fPLLBASE CC 50 200 320 MHz VCO input frequency fREF CC 8 − 16 MHz VCO frequency range fVCO CC 400 − 720 MHz PLL lock-in time tL CC 14 − 200 μsN > 3 2 14 − 400 μsN ≤ 32 for K2 100 ≤() and m fLMB MHz[]() 2⁄≤() Dmn s[] 740 ⎛⎞×= else Dmn s[] 740 K2 fLMB MHz[]×

Electrical ParametersAC Parameters Data Sheet 89 V 1.1.1, 2014-05 accumulated jitter remains at a constant valu e. Further, a lower LMB-Bus clock frequency fLMB results in a higher absolute maximum jitter value. Note: The specified PLL jitter values are va lid if the capacitive load per pin does not exceed CL = 20 pF with the maximum driver and sharp edge. Note: The maximum peak-to-peak noise on the pad supply voltage, measured between VDDOSC3 and VSSOSC, is limited to a peak-to-peak voltage of VPP = 100 mV for noise frequencies below 300 KHz and VPP = 40 mV for noise frequencies above 300 KHz. The maximum peak-to peak noise on the pad supply voltage, measured between VDDOSC and VSSOSC, is limited to a peak-to-peak voltage of VPP = 100 mV for noise frequencies below 300 KHz and VPP = 40 mV for noise frequencies above 300 KHz. These conditions can be achieved by appr opriate blocking of the supply voltage as near as possible to the supply pins and using PCB supply and ground planes. Oscillator Watchdog (OSC_WDT) The expected input frequency is selected via the bit field SCU_OSCCON.OSCVAL. The OSC_WDT checks for too low frequencies and for too high frequencies. The frequency that is monitored is fOSCREF which is derived for fOSC. (8) The divider value SCU_OSCCON.OSCVAL has to be selected in a way that fOSCREF is 2.5 MHz. Note: fOSCREF has to be within the range of 2 MHz to 3 MHz and should be as close as possible to 2.5 MHz. The monitored frequency is too low if it is below 1.25 MHz and too high if it is above 7.5 MHz. This leads to the following two conditions:

  • T o o l o w : fOSC <1 . 2 5M H z× (SCU_OSCCON.OSCVAL+1)
  • Too high: fOSC >7 . 5M H z× (SCU_OSCCON.OSCVAL+1) Note: The accuracy is 30% for these boundaries. f OSCREF f OSC

Electrical ParametersAC Parameters Data Sheet 90 V 1.1.1, 2014-05

5.3.5 ERAY Phase Locked Loop (ERAY_PLL)

Note: The specified PLL jitter values are va lid if the capacitive load per pin does not exceed CL = 20 pF with the maximum driver and sharp edge. Note: The maximum peak-to-peak noise on the pad supply voltage, measured between VDDPF3 and VSSOSC, is limited to a peak-to-peak voltage of VPP = 100 mV for noise frequencies below 300 KHz and VPP = 40 mV for noise frequencies above 300 KHz. These conditions can be achieved by appr opriate blocking of the supply voltage as near as possible to the supply pins and using PCB supply and ground planes. Table 26 PLL_ERAY Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Accumulated jitter at SYSCLK pin DPP CC -0.8 − 0.8 ns Accumulated_Jitter DP CC -0.5 − 0.5 ns PLL Base Frequency of the ERAY PLL fPLLBASE_ ERAY CC 50 250 360 MHz VCO input frequency of the ERAY PLL fREF CC 20 − 40 MHz VCO frequency range of the ERAY PLL fVCO_ERA Y CC 450 − 500 MHz PLL lock-in time tL CC 5.6 − 200 μs

Electrical ParametersAC Parameters Data Sheet 91 V 1.1.1, 2014-05

5.3.6 JTAG Interface Timing

The following parameters are applicable for communication through the JTAG debug interface. The JTAG module is fully compliant with IEEE1149.1-2000. Note: These parameters are not subject to production test but verified by design and/or characterization. Table 27 JTAG Interface Timing Parameters (Operating Conditions apply) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. TCK clock period t1 SR 25 – – ns – TCK high time t2 SR 10 – – ns – TCK low time t3 SR 10 – – ns – TCK clock rise time t4 S R ––4n s – TCK clock fall time t5 S R ––4n s – TDI/TMS setup to TCK rising edge t6 S R 6––n s – TDI/TMS hold after TCK rising edge t7 S R 6––n s – TDO valid after TCK falling edge1) (propagation delay) 1) The falling edge on TCK is used to generate the TDO timing. t8 C C ––1 3 n s C L =5 0p F t8 C C 3––n s C L =2 0p F TDO hold after TCK falling edge1) t18 C C 2––n s TDO high imped. to valid from TCK falling edge1)2) 2) The setup time for TDO is given implicitly by the TCK cycle time. t9 C C ––1 4 n s C L =5 0p F TDO valid to high imped. from TCK falling edge1) t10 CC – – 13.5 ns C L =5 0p F

Electrical ParametersAC Parameters Data Sheet 92 V 1.1.1, 2014-05 Figure 10 Test Clock Timing (TCK) Figure 11 JTAG Timing MC_JTAG _TCK

0.9 VDDP

0.5 VDDP

0.1 VDDP

MC_JTAG t18

Electrical ParametersAC Parameters Data Sheet 93 V 1.1.1, 2014-05

5.3.7 DAP Interface Timing

The following parameters are applicable for communication through the DAP debug interface. Note: These parameters are not subject to production test but verified by design and/or characterization. Figure 12 Test Clock Timing (DAP0) Table 28 DAP Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. DAP0 clock period1) 1) See the DAP chapter for clock rate restrictions in the Active:IDLE protocol state. tTCK SR 12.5 −− ns DAP0 high time t12 SR 4 −− ns DAP0 low time1) t13 SR 4 −− ns DAP0 clock rise time t14 SR −− 2n s DAP0 clock fall time t15 SR −− 2n s DAP1 setup to DAP0 rising edge t16 SR 6.0 −− ns DAP1 hold after DAP0 rising edge t17 SR 6.0 −− ns DAP1 valid per DAP0 clock period2) 2) The Host has to find a suitable sampling point by analyzing the sync telegram response. t19 CC 8 −− ns CL=2 0p F ; f=8 0M H z 10 −− ns CL=5 0p F ; f=4 0M H z MC_DAP0

Electrical ParametersAC Parameters Data Sheet 95 V 1.1.1, 2014-05

5.3.8 Peripheral Timings

Note: Peripheral timing parameters are not subject to production test. They are verified by design/characterization.

5.3.8.1 Micro Link Interface (MLI) Timing

Figure 15 MLI Interface Timing Note: The generation of RREADYx is in the input clock domain of the receiver. The reception of TREADYx is asynchronous to TCLKx. t27 t25 t26 t16 t17 t15t15 MLI_Tmg_2.vsd TDATAx TVALIDx TCLKx RDATAx RVALIDx RCLKx TREADYx RREADYx t10 t13 t11 t12 t14 t20 t27 MLI Transmitter Timing MLI Receiver Timing t23 t21 t22 t24

Electrical ParametersAC Parameters Data Sheet 96 V 1.1.1, 2014-05 The MLI parameters are vaild for CL = 50 pF and strong driver medium edge. Table 29 MLI Receiver Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. RCLK clock period t20 SR 1 / fFPI −− ns RCLK high time1)2) 1) The following formula is valid: t21 + t22 = t20. 2) Min and Max values for this parameter can be derived from the typ. value by considering the other receiver timing parameters. t21 SR − 0.5 x t20 − ns RCLK low time1)2) t22 SR − 0.5 x t20 − ns RCLK rise time3) 3) The RCLK max. input rise/fall times are best case parameters for fSYS = 90 MHz. For reduction of EMI, slower input signal rise/fall times can be used for longer RCLK clock periods. t23 SR −− 4n s RCLK fall time3) t24 SR −− 4n s RDATA/RVALID setup time before RCLK falling edge t25 SR 4.2 −− ns RDATA/RVALID hold time after RCLK falling edge t26 CC 2.2 −− ns RREADY output delay time t27 CC 0 − 16 ns Table 30 MLI Transmitter Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. TCLK clock period t10 CC 2 x 1 / fFPI −− ns TCLK high time1)2) t11 CC 0.45 x t10 0.5 x t10 0.55 x t10 ns TCLK low time1)2) t12 CC 0.45 x t10 0.5 x t10 0.55 x t10 ns TCLK rise time t13 CC −− 0.3 x t10 ns

Electrical ParametersAC Parameters Data Sheet 97 V 1.1.1, 2014-05

5.3.8.2 Micro Second Channel (MSC) Interface Timing

The MSC parameters are vaild for CL =5 0p F . TCLK fall time t14 CC −− 0.3 x t10 ns TDATA/TVALID output delay time t15 CC -3 − 4.4 ns TREADY setup time before TCLK rising edge t16 SR 18 −− ns TREADY hold time after TCLK rising edge t17 SR -2 −− ns 1) The following formula is valid: t11 + t12 = t10. 2) The min./max. TCLK low/high times t11/t12 include the PLL jitter of fSYS. Fractional divider settings must be regarded additionally to t11 / t12. 3) For high-speed MLI interface, strong driver sharp or medium edge selection (class A2 pad) is recommended for TCLK. Table 31 MSC Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. FCLP clock period1)2) t40 CC 2 x TMSC −− ns SOP4)/ENx outputs delay from FCLP4) rising edge t45 CC -2 − 5 ns ENx with strong driver and sharp (minus ) edge -2 − 10 ns ENx with strong driver and medium (minus) edge 0 − 21 ns ENx with strong driver and soft edge Table 30 MLI Transmitter (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersAC Parameters Data Sheet 98 V 1.1.1, 2014-05 Figure 16 MSC Interface Timing Note: The data at SOP should be sampled with the falling edge of FCLP in the target device. SDI bit time t46 CC 8 x TMSC −− ns SDI rise time t48 SR −− 200 ns SDI fall time t49 SR −− 200 ns 1) FCLP signal rise/fall times are only defined by the pad rise/fall times. 2) FCLP signal high and low can be minimum 1xT MSC 3) TMSC = TSYS = 1 / fSYS. 4) SOP / FCLP either propagated by LVDS or by CMOS strong driver and non soft edge. Table 31 MSC Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. MSC_Tmg_1.vsd t45 t45 t40

Electrical ParametersAC Parameters Data Sheet 99 V 1.1.1, 2014-05

5.3.8.3 SSC Master/Slave Mode Timing

The SSC parameters are vaild for CL = 50 pF and strong driver medium edge. Table 32 SSC Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. SCLK clock period1)2)3) 1) SCLK signal rise/fall times are the same as the rise/fall times of the pad. 2) SCLK signal high and low times can be minimum 1xTSSC. 3) TSSCmin = TSYS = 1/fSYS. t50 CC 2 x 1 / fFPI −− ns MTSR/SLSOx delay form SCLK rising edge t51 CC 0 − 8n s MRST setup to SCLK latching edge3) t52 SR 16.5 −− ns MRST hold from SCLK latching edge3) t53 SR 0 −− ns SCLK input clock period1)3) t54 SR 4 x 1 / fFPI −− ns SCLK input clock duty cycle t55_t54 SR 45 − 55 % MTSR setup to SCLK latching edge3)4) 4) Fractional divider switched off, SSC internal baud rate generation used. t56 SR 1 / fFPI −− ns MTSR hold from SCLK latching edge t57 SR 1 / fFPI + 5 −− ns SLSI setup to first SCLK latching edge t58 SR 1 / fFPI + 5 −− ns SLSI hold from last SCLK latching edge 5) 5) For CON.PH=1 slave select must not be removed before the following shifting edge. This mean, that what ever is configured (shifting / latching first), SLSI must not be de-actived before the last trailing edge from the pair of shifting / latching edges. t59 SR 7 −− ns MRST delay from SCLK shift edge t60 CC 0 − 16.5 ns SLSI to valid data on MRST t61 CC −− 16.5 ns

Electrical ParametersAC Parameters Data Sheet 101 V 1.1.1, 2014-05

5.3.8.4 ERAY Interface Timing

The timings of this section are valid for the strong driver and either sharp edge or medium edge settings of the output drivers with CL = 25 pF. Table 33 ERAY Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Time span from last BSS to FES without the influence of quartz tolerancies (d10Bit_TX) 1) This includes the PLL_ERAY accumulated jitter. t60 CC 997.75 − 1002.2 ns TxD data valid from fsample flip flop txd_reg TxDA, TxDB (dTxAsym)2)3) 2) Refers to delays caused by the asymmetries of the output drivers of the digital logic and the GPIO pad drivers. Quarz tolerance and PLL_ERAY accumulated jitter are not included. 3) E-Ray TxD output drivers have an asymmetry of rising and falling edges of | tFA2 - tRA2| ≤ 1 ns. t61-t62 CC −− 1.5 ns Asymmetrical delay of rising and falling edge (TxDA, TxDB) Time span between last BSS and FES without influence of quartz tolerancies (d10Bit_RX) 1)4)5) 4) Limits of 966ns and 1046.1ns correspond to (30%, 70%) * VDDP FlexRay standard input thresholds. For input thresholds of this product, a correction of - 0.5 ns and +0.1 ns has to be applied. 5) Valid for output slopes of the bus driver of dRxSlope ≤ 5ns, 20% * VDDP to 80% * VDDP, according to the FlexRay Electrical Physical Layer Specification V2.1B. For A2 pads, the rise and fall times of the incoming signal have to satisfy the following inequality: -1.6ns ≤ tFA2 - tRA2 ≤ 1.3ns. t63 SR 966 − 1046.1 ns RxD capture by fsample (RxDA/RxDB sampling flip-flop) (dRxAsym) t64-t65 CC −− 3.0 ns Asymmetrical delay of rising and falling edge (RxDA, RxDB) TxD data delay from sampling flip-flop dTxdly CC −− 10.0 ns Px_PDR.PDy = 000B −− 15.0 ns Px_PDR.PDy = 001B RxD capture delay by sampling flip-flop dRxdly CC −− 10.0 ns

Electrical ParametersAC Parameters Data Sheet 102 V 1.1.1, 2014-05 Figure 19 ERAY Timing TXD t60

0.7 VDD

0.3 VDD

(Byte Start Sequence) Last CRC Byte FES (Frame End Sequence) ERAY_TIMING RXD t63 (Byte Start Sequence) Last CRC Byte FES (Frame End Sequence)

0.9 VDD

0.1 VDD

Electrical ParametersAC Parameters Data Sheet 103 V 1.1.1, 2014-05

5.3.8.5 EBU Timings

VSS = 0 V;VDD = 1.3 V ± 5%; VDDEBU = 2.5 V ± 5% and 3.3 V ± 5%, Class A2 pins; CL = 35 pF for address/data; CL = 40pF for the control lines. For each timing, the accumulated PLL jitter of the programed duration in number of clock periods must be added separately. Operating conditions apply and CL = 35 pF. Table 34 EBU Common Asynchronous Timings Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Pulse wdih deviation from the ideal programmed width due to B pad asymmetry, rise delay - fall delay ta CC -0.8 − 0.8 ns edge= medium -0.8 − 0.8 ns edge= sharp AD(31:0) output delay to ADV# rising edge, multiplexed read / write t13 CC -5.5 − 2n s AD(31:0) output delay to ADV# rising edge, multiplexed read / write t14 CC -5.5 − 2n s Table 35 EBU Asynchronous Read Timings Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. A(23:0) output delay to RD rising edge, deviation from the ideal programmed value t0 CC -2.5 − 2.5 ns A(23:0) output delay to RD rising edge, deviation from the ideal programmed value t1 CC -2.5 − 2.5 ns

Electrical ParametersAC Parameters Data Sheet 104 V 1.1.1, 2014-05 CS rising edge to RD rising edge, deviation from the ideal programmed value t2 CC -2 − 2.5 ns ADV rising edge to RD rising edge, deviation from the ideal programmed value t3 CC -1.5 − 4.5 ns BC rising edge to RD rising edge, deviation from the ideal programmed value t4 CC -2.5 − 2.5 ns WAIT input setup to RD rising edge, deviation from the ideal programmed value t5 SR 12 −− ns WAIT input hold to RD rising edge, deviation from the ideal programmed value t6 SR 0 −− ns Data input setup to RD rising edge, deviation from the ideal programmed value t7 SR 12 −− ns Data input hold to RD rising edge, deviation from the ideal programmed value t8 SR 0 −− ns MR / W output delay to RD# rising edge, deviation from the ideal programmed value t9 CC -2.5 − 1.5 ns Table 35 EBU Asynchronous Read Timings (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersAC Parameters Data Sheet 105 V 1.1.1, 2014-05 Figure 20 Multiplexed Read Access new_MuxRD_Async_10.vsd CS[3:0] CSCOMB ADV RD MR/W AD[31:0] Data In BC[3:0] WAIT A[23:0] Valid Address Next Addr. Address Out ta ta ta ta t4 t5 t6 ta t13 t14 t7 t8 EBU STATE Address Phase Address Hold Phase (opt.) Command Phase Recovery Phase (opt.) New Addr. Phase ADDRC AHOLDC RDWAIT RDRECOVC ADDRC EBU_CLK Cycles Control Bitfield: t1t0 pv + pv + pv + pv + pv + t3 pv + pv + pv + pv + pv + pv + pv + pv = programmed value, TEBU_CLK * sum (correponding bitfield values) Command Delay Phase CMDDELAY 0...7

Electrical ParametersAC Parameters Data Sheet 106 V 1.1.1, 2014-05 Figure 21 Demultiplexed Read Access new_DemuxRD_Async_10.vsd CS[3:0] CSCOMB ADV RD MR/W AD[31:0] Data In BC[3:0] WAIT A[23:0] Valid Address Next Addr. ta ta ta ta t5 t6 ta t7 t8 EBU STATE Address Phase Address Hold Phase (opt.) Command Phase Recovery Phase (opt.) ADDRC AHOLDC RDWAIT RDRECOVC ADDRC EBU_CLK Cycles Control Bitfield: t1t0 pv + pv + pv + t3pv +pv + pv + pv + pv + pv + pv + pv = programmed value, TEBU_CLK * sum (correponding bitfield values) New Addr. Phase

Electrical ParametersAC Parameters Data Sheet 107 V 1.1.1, 2014-05 Table 36 EBU Asynchnronous Write Timings Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. A(23:0) output delay to WR rising edge, deviation from the ideal programmed value t30 CC -2.5 − 2.5 ns A(23:0) output delay to WR rising edge, deviation from the ideal programmed value t31 CC -2.5 − 2.5 ns CS rising edge to WR rising edge, deviation from the ideal programmed value t32 CC -2 − 2n s ADV rising edge to WR rising edge, deviation from the ideal programmed value t33 CC -2.5 − 2n s BC rising edge to WR rising edge, deviation from the ideal programmed value t34 CC -2.5 − 2n s WAIT input setup to WR rising edge, deviation from the ideal programmed value t35 SR 12 −− ns WAIT input hold to WR rising edge, deviation from the ideal programmed value t36 SR 0 −− ns Data output delay to WR rising edge, deviation from the ideal programmed value t37 CC -5.5 − 2n s

Electrical ParametersAC Parameters Data Sheet 108 V 1.1.1, 2014-05 Data output delay to WR rising edge, deviation from the ideal programmed value t38 CC -5.5 − 2n s MR / W output delay to WR rising edge, deviation from the ideal programmed value t39 CC -2.5 − 1.5 ns Table 36 EBU Asynchnronous Write Timings (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersAC Parameters Data Sheet 109 V 1.1.1, 2014-05 Figure 22 Multiplexed Write Access new_MuxWR_Async_10.vsd CS[3:0] CSCOMB ADV AD[31:0] Data Out BC[3:0] WAIT A[23:0] Valid Address Next Addr. EBU STATE Address Phase Address Hold Phase (opt.) Command Phase Recovery Phase (opt.) New Addr. Phase ADDRC AHOLDC RDWAIT RDRECOVC ADDRC EBU_CLK Cycles Control Bitfield: t30 t31 ta t32 ta t33 ta ta ta t34 pv + t37 t38 t39 t35 t36 Data Hold Phase pv + pv + pv + pv + pv + pv + pv + pv + pv + pv = programmed value, TEBU_CLK * sum (correponding bitfield values) DATAC 0...15 pv + pv + Address Out t13 t14 pv + RD/WR MR/W

Electrical ParametersAC Parameters Data Sheet 110 V 1.1.1, 2014-05 Figure 23 Demultiplexed Write Access new_DemuxWR_Async_10.vsd CS[3:0] CSCOMB ADV AD[31:0] Data Out BC[3:0] WAIT A[23:0] Valid Address NextAddr. EBU STATE Address Phase Address Hold Phase (opt.) Command Phase Recovery Phase (opt.) New Addr. Phase ADDRC AHOLDC RDWAIT RDRECOVC ADDRC EBU_CLK Cycles Control Bitfield: t30 t31 ta t32 ta t33 ta ta ta t34 t37 t38 t39 t35 t36 Data Hold Phase pv + pv + pv + pv + pv + pv + pv + pv + pv + pv = programmed value, T EBU_CLK * sum (correponding bitfield values) DATAC 0...15 pv + pv + MR/W RD/WR pv +

Electrical ParametersPackage and Reliability Data Sheet 111 V 1.1.1, 2014-05

5.4 Package and Reliability

5.4.1 Package Parameters

Table 37 Thermal Characteristics of the Package Device Package R ΘJCT 1) The top and bottom thermal resistances between the case and the ambient ( RTCAT, RTCAB) are to be combined with the thermal resistances between the junction and the case given above (RTJCT, RTJCB), in order to calculate the total thermal resistance between the junction and the ambient (RTJA). The thermal resistances between the case and the ambient ( RTCAT, RTCAB) depend on the external system (PCB, case) characteristics, and are under user responsibility. The junction temperature can be calculated using the following equation: TJ = TA + RTJA × PD, where the RTJA is the total thermal resistance between the junction an d the ambient. This total junction ambient resistance RTJA can be obtained from the upper four partial thermal resistances. Thermal resistances as measured by the ’cold plate method’ (MIL SPEC-883 Method 1012.1). RΘJCB 1) RΘJLead Unit Note TC1784 PG-LFBGA-292- 6,8 4,8 17,0 K/W

Electrical ParametersPackage and Reliability Data Sheet 112 V 1.1.1, 2014-05

5.4.2 Package Outline

Figure 24 Package Outlines PG-LFBGA-292-6 You can find all of our packages, sorts of packing and others in our Infineon Internet Page “Products”: http://www.infineon.com/products.

5.4.3 Flash Memory Parameters

The data retention time of the TC1784’s Flash memory depends on the number of times the Flash memory has been erased and programmed. Table 38 FLASH32 Parameters Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max. Data Flash Erase Time per Sector tERD CC −− 31) s Program Flash Erase Time per 256 KByte Sector tERP CC −− 5s CODE STANDOFF ABCDEFGHJK INDEX MARKING (LASERED ) INDEX MARKING 0.1 C LM PN S E A T I NG P L A NE 0.8 RTUVWY COPLANARITY 292 x 0.15

0.08 M C

0.15 M C A B

C AB17 ±0 .1 17 ±0 .1

0.33 MIN

  1. 7 MAX 0. 5±0 .0 5 19 x 0.8 = 15. 2 0.8 19 x 0 .8 = 1 5. 2

Electrical ParametersPackage and Reliability Data Sheet 113 V 1.1.1, 2014-05 Program time data flash per page2) tPRD CC −− 5.3 ms without reprogramming −− 15.9 ms with two reprogramming cycles Program time program flash per page3) tPRP CC −− 5.3 ms without reprogramming −− 10.6 ms with one reprogramming cycle Data Flash Endurance NE CC 60000 −− cycle s Min. data retention time 5 years Erase suspend delay tFL_ErSusp CC −− 15 ms Wait time after margin change tFL_Margin Del CC 10 −−μ s Program Flash Retention Time, Physical Sector5)6) tRET CC 20 −− year s Max. 1000 erase/program cycles Program Flash Retention Time, Logical Sector5)6) tRETL CC 20 −− year s Max. 100 erase/program cycles UCB Retention Time5)6) tRTU CC 20 −− year s Max. 4 erase/program cycles per UCB Wake-Up time tWU CC −− 270 μs DFlash wait state configuration WSDF CC 50 ns x fFSI PFlash wait state configuration WSPF CC 26 ns x fFSI 1) In case of wordline oriented defects (see robust EEPROM emulation in the User's Manual) this erase time can increase by up to 100%. 2) In case the Program Verify featur e detects weak bits, these bits will be programmed up to twice more. Each reprogramming takes additional 5 ms. Table 38 FLASH32 Parameters (cont’d) Parameter Symbol Values Unit Note / Test ConditionMin. Typ. Max.

Electrical ParametersPackage and Reliability Data Sheet 114 V 1.1.1, 2014-05

5.4.4 Quality Declarations

3) In case the Program Verify feature detects weak bits, these bits will be programmed once more. The reprogramming takes additional 5 ms. 4) Only valid when a robust EEPROM emulation algorith m is used. For more details see the User´s Manual. 5) Storage and inactive time included. 6) At average weighted junction temperature Tj = 100°C, or the retention time at average weighted temperature of Tj = 110°C is minimum 10 years, or the retention time at average weighted temperature of Tj = 150°C is minimum 0.7 years. Table 39 Quality Parameters Parameter Symbol Values Unit Note / Test Condition Min. Typ. Max. Operation Lifetime1) 1) This lifetime refers only to the time when the device is powered on. tOP – – 24000 hours – 2) 2) For worst-case temperature profile equivalent to: 1200 hours at Tj = 125...150oC 3600 hours at Tj = 110...125oC 7200 hours at Tj = 100...110oC 11000 hours at Tj = 25...100oC 1000 hours at Tj = -40...25oC ESD susceptibility according to Human Body Model (HBM) VHBM – – 2000 V Conforming to JESD22-A114-B ESD susceptibility of the LVDS pins VHBM1 –– 5 0 0V – ESD susceptibility according to Charged Device Model (CDM) VCDM – – 500 V Conforming to JESD22-C101-C Moisture Sensitivity Level MSL – – 3 – Conforming to Jedec J-STD-020C for 240°C

Data Sheet 115 V 1.1.1, 2014-05 6H i s t o r y The Version 0.7 is the first version of this document: The following changes where done between Version 0.7 and 0.71 of this document:

  • update and coorect figure 3-2
  • update and correct table 3-1 The following changes where done between Version 0.71 and 1.0 of this document:
  • adapt Absolute Maximum Rating
  • clarify pad supply levels in Pin Reliability in Overload section
  • add note at the end of Pin Reliability in Overload section
  • clarify wording for valid operating conditions
  • split FADC DNL parameter into two conditions and change value for gain 4 and 8
  • add footnote 5 to IDDP
  • add footnote for D-Flash currents in power section
  • rework first sentence for chapter 5.3
  • reduce min value for tL for both PLLs
  • add for MLI and SSC timing parameter: valid strong driver medium edge only
  • change MLI parameter t17 min value
  • update parameter description for SSC parameters t52, t53, t56, t57, t58, and t59
  • change SSC parameters from CC to SR Symbol for t56, t57, t58 and t59
  • add footnote to Flash parameter tERD The following changes where done between Version 1.0 and 1.1 of this document:
  • remove the following product options: – SAK-TC1784N-320F180EL
  • add the following product options: – SAK-TC1784F-320F180EP
  • change t48 from 100ns to 200ns in table 42
  • change t49 from 100ns to 200ns in table 42
  • extend KOVAN conditon from IOV≤ 0m A ; IOV≥ -1 mA to IOV≤ 0m A ; IOV≥ -2 mA
  • change parameter EFOFF from +-90mV to +-120 for condition Calibration = No
  • change package version from PG-LFBGA-292-3 to PG-LFBGA-292-6 The following changes where done between Version 1.1 and 1.1.1 of this document:
  • change parameter EFOFF from +-120mV to +-90 for condition Calibration = No

www.infineon.com Published by Infineon Technologies AG