SSM6K405TU_14 TOSHIBA | Alldatasheet
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TOSHIBA Field-Effect Transistor Silicon N-Ch annel MOS Type SSM6K405TU ○ High-Speed Switching Applications ○ Power Management Switch Applications
- 1.5V drive
- Low ON-resistance: R on = 307 mΩ (max) (@VGS = 1.5V) R on = 214 mΩ (max) (@VGS = 1.8V) R on = 164 mΩ (max) (@VGS = 2.5V) R on = 126 mΩ (max) (@VGS = 4.0V) Absolute Maximum Ratings (Ta = 25˚C) Characteristic Symbol Rating Unit Drain–source voltage VDSS 20 V Gate–source voltage VGSS ± 10 V DC I D 2.0 Drain current Pulse I DP 4.0 A Drain power dissipation PD (Note 1) 500 mW Channel temperature Tch 150 °C Storage temperature Tstg −55 to 150 °C Note: Using continuously under heavy l oads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/ voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Mounted on an FR4 board (25.4 mm × 25.4 mm × 1.6 t, Cu Pad: 645 mm2) Electrical Characteristics (Ta = 25°C) Characteristic Symbol Test Condition Min Typ. Max Unit V (BR) DSS I D = 1 mA, VGS = 0 V 20 ⎯ ⎯ V Drain–source breakdown voltage V (BR) DSX I D = 1 mA, VGS = – 10 V 12 ⎯ ⎯ V Drain cutoff current IDSS V DS = 20 V, VGS = 0 V ⎯ ⎯ 1 μA Gate leakage current IGSS V GS = ± 10 V, VDS = 0 V ⎯ ⎯ ±1 μA Gate threshold voltage Vth V DS = 3 V, ID = 1 mA 0.35 ⎯ 1.0 V Forward transfer admittance ⏐Yfs⏐ V DS = 3 V, ID = 1.0 A (Note2) 2.6 5.2 ⎯ S ID = 1.0 A, VGS = 4.0 V (Note2) ⎯ 90 126 ID = 1.0 A, VGS = 2.5 V (Note2) ⎯ 115 164 ID = 0.5 A, VGS = 1.8 V (Note2) ⎯ 150 214 Drain–source ON-resistance RDS (ON) ID = 0.3 A, VGS = 1.5 V (Note2) ⎯ 185 307 mΩ Input capacitance Ciss ⎯ 195 ⎯ Output capacitance Coss ⎯ 35 ⎯ Reverse transfer capacitance Crss VDS = 10 V, VGS = 0 V, f = 1 MHz ⎯ 29 ⎯ pF Total Gate Charge Qg ⎯ 3.4 ⎯ Gate−Source Charge Qgs ⎯ 2.3 ⎯ Gate−Drain Charge Q gd VDS = 10 V, ID= 2.0 A, VGS = 4 V ⎯ 1.1 ⎯ nC Turn-on time t on ⎯ 8.0 ⎯ Switching time Turn-off time t off VDD = 10 V, ID = 0.5 A, VGS = 0 to 2.5 V, RG = 4.7 Ω ⎯ 9.0 ⎯ ns Drain–source forward voltage VDSF I D = − 2.0 A, VGS = 0 V (Note2) ⎯ – 0.85 – 1.2 V Note 2: Pulse test Unit: mm 0.3-0.05 1.7±0.1 2.1±0.1 1.3±0.1 0.650.65 2.0±0.1 0.16-0.05 0.7±0.05 +0.1 +0.06 JEDEC ― JEITA ― TOSHIBA 2-2T1D Weight: 7.0 mg (typ.) UF6 1, 2, 5, 6 : Drain 3 : G a t e 4 : S o u r c e Start of commercial production 2007-10
Switching Time Test Circuit (a) Test Circuit (b) VIN Marking Equivalent Circuit (top view) Notice on Usage Vth can be expressed as the voltage between gate and source when the low operating current value is ID = 1 mA for this product. For normal switching operation, VGS (on) requires a higher voltage than Vth and VGS (off) requires a lower voltage than Vth. (The relationship can be established as follows: VGS (off) < Vth < VGS (on).) Take this into consideration when using the device. Handling Precaution When handling individual devices that are not yet mounted on a circuit board, make sure that the environment is protected against electrostatic discharge. Operators should wear antistatic clothing, and containers and other objects that come into direct contact with devices should be made of antistatic materials. (c) VOUT VDD = 10 V RG = 4.7 Ω Duty ≤ 1% VIN: tr, tf < 5 ns Common Source Ta = 25°C VDD OUT IN 2.5 V 10 μs RG tf ton 90% 10% 2.5 V 0 V 10% 90% toff tr VDD VDS (ON) 123 6 56 KKC 1 2 3
Ambient temperature Ta (°C) Ambient temperature Ta (°C) RDS (ON) – ID Drain–source voltage V DS (V) ID – VDS Drain current I D (A) 0 0.2 0.4 0.6 1 VGS = 1.2 V 10 V Common Source Ta = 25 °C 1.8 V 2.5 V 0.8 4.0 V 1.5 V Gate–source voltage V GS ( V ) ID – VGS Drain current I D (A) 0.1 0.001 0.01 0.0001 2.0 − 25 °C Ta = 100 °C 25 °C 1.0 Vth – Ta Gate threshold voltage V th (V) 1.0 −50 0 150 0.5 50 100 Common Source VDS = 3V ID = 1 mA RDS (ON) – Ta Drain–source ON-resistance RDS (ON) ( m Ω) Common Source −50 ID = 1.0 A / VGS = 4.0 V 0 50 150 100 300 400 100 1.0 A / 2.5 V 200 0.5 A / 1.8 V 0.3 A / 1.5 V Drain–source ON-resistance RDS (ON) ( m Ω) 0 2 6 8 Gate–source voltage V GS ( V ) 200 400 RDS (ON) – VGS 300 100 − 25 °C Ta = 100 °C25 °C 500 ID =1.0A Common Source Ta = 25°C VGS = 4.0 V Drain current I D (A) Drain–source ON-resistance RDS (ON) ( m Ω) 0 1 3 42 200 400 300 100 2.5 V 1.8 V Common Source Ta = 25°C 500 1.5 V Common Source VDS = 3 V
Drain current I D (A) Forward transfer admittance ⎪Yfs⎪ (S) |Yfs| – ID 0.1 0.1 1 0.3 0.01 Common Source VDS = 3 V Ta = 25°C Drain reverse current I DR (A) Drain–source voltage V DS (V) IDR – VDS 0.1 0.001 0.01 −25 °C Ta =100 °C 25 °C –1.2 Drain–source voltage V DS (V) C – VDS Capacitance C (pF) 0.1 1 10 100 100 1000 300 500 Ciss Coss Crss Common Source Ta = 25°C f = 1 MHz VGS = 0 V Drain current I D (A) Switching time t (ns) t – ID 0.01 100 0.1 1000 1 10 toff tf ton tr Common Source VDD = 10 V VGS = 0 to 2.5 V Ta = 25 °C RG = 4.7Ω Total Gate Charge Qg (nC) Dynamic Input Characteristic Gate–Source voltage V GS (V) VDD=10V 4 8 Common Source ID = 2.0 A Ta = 25°C VDD=16V 6 2 Common Source VGS = 0 V G D S IDR
Ambient temperature Ta (°C) PD – Ta Drain power dissipation PD (mW) 800 200 120 100 140 400 600 160 1000 80 60 40 20 0 -20 -40 Mounted on FR4 board Cu Pad : 645 mm2) Pulse width t w (s) rth – tw Transient thermal impedance rth (°C/W) 0.001 10000.01 0.1 1 100 100 100 Single Pulse Mounted on FR4 board (25.4mm × 25.4mm × 1.6t , Cu Pad : 645 mm2) t = 10 s DC
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