TLP651 TOSHIBA | Alldatasheet
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TOSHIBA PHOTOCOUPLER GaAfAs IRED & PHOTO-IC DIGITAL LOGIC GROUND ISOLATION Unit in mm LINE RECEIVER MICROPROCESSOR SYSTEM INTERFACES e726 SWITCHING POWER SUPPLY FEEDBACK CONTROL F5 B ANALOG SIGNAL ISOLATION E 123 4 The TOSHIBA TLP651 consists of a GaAfAs high-output light 9962025 433| 7624025, emitting diode and a high speed detector of one chip photo diode- # transistor . 8 = o This unit is 8-lead DIP. 2206 3] o2s:tin TLP651 has internal base connection. This base pin should be used 98204 z for analog application or enable operation. If base pin is open, output psizo2s | + 85-880 signal will be noisy by environmental condition. For this case, TLP650 is suitable. sstoce TOSHIBA 11-10C4 e i : . Isolation Voltage 5000Vrms (MIN.) Weight : 0.54g @ Switching Speed : tpHL=0.8 ys (TYP.) tpLH=0.5ys (TYP.) (RL =1.9kQ) PIN CONFIGURATION (TOP VIEW) e@ TTL Compatible d L 1:N.C. © UL Recognized : UL1577, File No. E67349 1 ; | 8 2: ANODE : L., 3:CATHODE e BSI Approved : BS EN60065 : 1994 2 E 7 4:NC. Certiticate No. 7613 30 he > : EMITTER BS ENG60950 : 1992 | Be RECTOR Certiticate No. 7614 40 H5 3 :Voo SCHEMATIC al voc Ip =I 2 4 Bove VE 7 Io” 3 = Vo GND 1 2001-06-01
MAXIMUM RATINGS (Ta = 25°C) CHARACTERISTIC SYMBOL UNIT Forward Current (Note 1) Pulse Forward Current (Note 2) Peak Transient Forward f=) 8 | Current (Note 3) Reverse Voltage Diode Power Dissipation [Output Current | to | sma vz | Peak Output Current | top | 16 | ma _| S | Output Voltage moB=15 8 Supply Voltage —0.5~15 [Base Current | eT | ma ° | imitter-Base Reverse Voltage Output Power Dissipation (Note 5) too | mw Operating Temperature Range —55~100 Storage Temperature Range —55~125 Lead Solder Temperature (10s) T. °C (Note 6) | “50! Isolation Voltage (AC, 1Imin., R.H=60%) (Note 7) 5000 (Note 1) _ Derate 0.8mA above 70°C. (Note 2) 50% duty cycle, Ims pulse width. Derate 1.6mA/°C above 70°C. (Note 3) Pulse width 1s, 300pps. (Note 4) Derate 0.9mW/°C above 70°C. (Note 5) = Derate 2mW/°C above 70°C. (Note 6) Soldering portion of lead : up to 2mm from the body of the device. (Note 7) Device considered a two terminal device : Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together. 2 2001-06-01
ELECTRICAL CHARACTERISTICS (Ta = 25°C) CHARACTERISTIC —_| SYMBOL TEST CONDITION —_| MIN. | Typ. [MAx.] UNIT] Forward Voltage Ip=16mA | — | 165[ 185] v_| Forward Voltage _ ° " VR=5V [= |=] io] pa | Capacitance Between yn pe Ton) |Ir=0mA, Voo=Vo=55v | — | 3{ 500] na | S| High Level Output Tong) [Ir=0mA, Voo=Vo=15v_——s| — | — [| 5] 2a | Current = =Von= o Ip=0mA, Voc=Vo=15V A E TOH | pa=70°C 250) A | High Level Supply _ _ Voltage IccH |Ip=0mA, Voc=15V 0.01 1] pA evere— Current Transfer Ratio Io/Ip |Voc=4.5V Ran 10119 | so] — | | Low Level Output Ip=16mA, Voc=4.5V, &| voltage VoL |Io=1.1mA 04] Vv 8 (Rank 0 : _I9=2.4mA) Isolation Resistance | xs | (Note 7) x10'4 10 fe) Capacitance Between an pe SWITCHING CHARACTERISTICS (Ta = 25°C, Vcc = 5V) TEST CHARACTERISTIC |SYMBOL & TEST CONDITION jac. | rye. ax. or ‘Propagation Delay Time Ip=0-16mA, Voc=5V, [ — | 02] 08 | $ (A-L) ‘pHL , Bu=4iko [RankO: Ry=19K9[ — | oal os | “ Propagation Delay Time Ip=16—0mA, Voc=5V, | — | 10] 20 | : u (>) ‘LH Rp=4.1k0 [RankO:Rp=19k0| — | 05] 12 | * Common Mode Transient} Ip=OmA, VomM=200Vp-p Immunity at Logic High | Cy RL =4.1k0 IV/ us| Output (Note8) 2 (Rank O : RL =1.9kQ) Common Mode Transient} Ip=16mA, VcoM=200Vp-p Immunity at Logic Low | CML RL =4.1k0, —1000 IV / ps} Output (Note8) (Rank O : RL=1.9k0) 3 2001-06-01
(Note 8) CMy, is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (VQ<0.8V). CMy is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state (VQ >2.0V). (Note 9) Maximum electrostatic discharge voltage for any pins : 100V(C=200pF, R=0). TEST CIRCUIT 1 : Switching Time Test Circuit PULSE o—IF Voc=5V Ip — INPUT | EI ° 0 | | PW=100ps RL DUTY RATIO=1/10' E ° is] oV, Vo bv Ip MONITOR 4 oO S OUTPUT oq 1.5V 1.5V 1» MONITOR Vou tpHL tpLH TEST CIRCUIT 2 : Common Mode Noise Immunity Test Circuit Voo=5v 90% 200V 1 13] ° Vom F aE Ru = ov ° [3 KE ° VO a OUTPUT - ET monrror Yo 5V (p=0mA) 2v (n) 0.8V Vo Vi PULSE GENERATOR OL %Q=500 (lp=16mA) = 160(V) = 160(V) CMH ty (us) » CML te (ys) 4 2001-06-01
100, Ip — VE 26 AVF/ATa — IF Ss 3 So rr ee BE og ee ee ee ge TTT TT TT oe 3&9 | Ue af Se as i ee 0.03{ {J} +} 38 onl 17 TT tT] eral LI FORWARD VOLTAGE VF (V) FORWARD CURRENT Ip (mA) JoH (1) - Ta Io - Ir a ew LL Sa et || Vi | | | | | Youn, ap maawe ea EHH 2 100 eee 2 Vo=0.4V LZR a a = Ty S100 Ht gag [oP 7 : I-A ~25° [III a oe | ctl || = ttt I7ET TT If 6 See lO Fa FREE HH EE SSS 38 AAA e Fe eee Ey, || § FAP ee 2 WAL | LT § CIA CELEE ey Nee eee eee! a sa Pop TY
8 CoOL = SSS cosAHE a a
“ oO 40 80 120 160 03 0.5 1 3.65 10 30 «(50 100 AMBIENT TEMPERATURE Ta (°C) FORWARD CURRENT Ip (mA) Io/Ip - Ir I9/Ip - Ta 40) TTT veo=sv See se LU _ II] vocoav BCC 2 | LTA | tes2eref]} “Om SSSR S==sen i = me 1.0] i
2 COI eto TTT & EE eer Ee
32 ae LN > 8. PCT oc ISX TT S tte yyy Be EN e “eee eo Keo 8 2CCCCeee eee eee rey EL aN a e | Win Na 2 [Pritt x 24 7 7 8 ol ‘oO 2 “Wow NT] a a Y 2 oo AU TT COPE EE EEE veo=asv 20) 7 0.2] a a “TET vo=oev we LOT oL-L EEE TE 0.2 05 1 3.5 10 30 50 -60 -40 -20 0 20 40 60 80 100 FORWARD CURRENT Ip (mA) AMBIENT TEMPERATURE Ta (°C) 5 2001-06-01
10; 6 [TTT TT TTT TY vecesv [TT TTT Ty PCEELELE Ta25C Li ttt TT | 1 Yoorsv z 8 Sank & NTC & Larkracrt-Frest tT | = © RL pee Sa \\ Ne Toma} FART vo . ‘Coe ee 2 ‘ e RRR 3 HN aca: g OCR 2 Nesey om ce 4S eee - ONAN 5 | eo eT 5 LI {tT TTT tty Ty Be ema E NG
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a ES SS oL_LREREE EINE TT TET] OUTPUT VOLTAGE Vo (V) ° ° ‘ . . ° " “ « FORWARD CURRENT Ip (mA) tpHL, tpLH - RL 5 do 1 tte g| Ire 16ma ic eemanll 5 * Wa 8 q Ta=25°C al 2. aoe ey ge Eee 2S os Ze gz oo 2 apc |
2 CUTE
oy 3 5 10 30 «50 100 LOAD RESISTANCE Ry (kQ) 6 2001-06-01
RESTRICTIONS ON PRODUCT USE ooov07e8¢ @ TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.. @ The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. @ Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with domestic garbage. @ The products described in this document are subject to the foreign exchange and foreign trade laws. @ The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. @ The information contained herein is subject to change without notice. 7 2001-06-01