SFH420 SIEMENS | Alldatasheet
Document overview
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Technical content
Features
- Very highly efficient GaAs-LED
- Good Linearity (Ie =f [IF]) at high currents
- DC (with modulation) or pulsed operations are possible
- High reliability
- High pulse handling capability
- Suitable for surface mounting (SMT)
- Available on tape and reel
- SFH 420 same package as SFH 320/421 SFH 425 same package as SFH 325/426
- SFH 425: Suitable only for IR-reflow soldering. In case of dip soldering, please contact us first. GaAs-IR-Lumineszenzdiode in SMT-Gehäuse GaAs Infrared Emitter in SMT Package SFH 420 SFH 425 Ma βe in mm, wenn nicht anders angegeben/Dimensions in mm, unless otherwise specified. GPL06880 1.1 0.92.54 spacing (2.4) 2.8 2.4 4.2 3.8 (2.85) 0.7 4.2 3.8 (2.9) 3.8 3.4(R1) Collector/Cathode marking Cathode/ Collector Anode/ Emitter fpl06724fpl06867 GPL06724 (typ) 0.7 0.9 1.7 2.1 0.12 0.18 0.5 1.1 3.3 3.7 0.4 0.6 2.6 3.0 2.1 2.3 Cathode/Collector marking 3.0 3.4 2.4 Approx. weight 0.03 g 0.8 0.6 0.1 Cathode/Collector SFH 420 TOPLED SFH 425 SIDELED
Semiconductor Group 2 1997-11-01 Anwendungen
- Miniaturlichtschranken für Gleich- und Wechsellichtbetrieb, Lochstreifenlaser
- Industrieelektronik
- “Messen/Steuern/Regeln” Grenzwerte (TA = 25°C) Maximum Ratings Typ Type Bestellnummer Ordering Code Gehäuse Package SFH 420 SFH 425 Q62702-P1690 Q62702-P0330 Kathodenkennzeichnung: abgesetzte Ecke cathode marking: bevelled edge TOPLED SIDELED Bezeichnung
Description
Betriebs- und Lagertemperatur Operating and storage temperature range Top;Tstg – 55 ... + 100°C Sperrschichttemperatur Junction temperature Tj 100 °C Sperrspannung Reverse voltage VR 5V Durchlaßstrom Forward current IF 100 mA Stoßstrom,τ = 10µs,D = 0 Surge current IFSM 3A Verlustleistung Power dissipation Ptot 160 mW Wärmewiderstand Sperrschicht - Umgebung bei Montage auf FR4 Platine, Padgröße je 16 mm2 Thermal resistance junction - ambient mounted on PC-board (FR4), padsize 16 mm 2 each Wärmewiderstand Sperrschicht - Lötstelle bei Montage auf Metall-Block Thermal resistance junction - soldering point, mounted on metal block RthJA RthJS 450 200 K/W K/W
Applications
- Miniature photointerrupters
- Industrial electronics
- For drive and control circuits
Semiconductor Group 3 1997-11-01 SFH 420 SFH 425 Kennwerte (TA = 25°C) Characteristics Bezeichnung Wellenlänge der Strahlung Wavelength at peak emission IF = 100 mA,tp = 20 ms λpeak 950 nm Spektrale Bandbreite bei 50% vonImax Spectral bandwidth at 50% of Imax IF = 100 mA Δλ 55 nm Abstrahlwinkel Half angle ϕ± 60 Grad deg. Aktive Chipfläche Active chip area A 0.09 mm 2 Abmessungen der aktiven Chipfläche Dimension of the active chip area L × B L × W 0.3× 0.3 mm Schaltzeiten,Ie von 10 % auf 90 % und von 90 % auf 10 %, beiIF = 100 mA,RL = 50Ω Switching times,Ie from 10 % to 90 % and from 90 % to 10 %,IF = 100 mA,RL = 50Ω tr,tf 0.5 µs Kapazität Capacitance VR = 0 V,f = 1 MHz C o 25 pF Durchlaβspannung Forward voltage IF = 100 mA,tp = 20 ms IF = 1 A,tp = 100µs VF VF 1.3(≤ 1.5) 2.3(≤ 2.8) V V Sperrstrom Reverse current VR = 5 V IR 0.01 (≤1)µ A Gesamtstrahlungsfluβ Total radiant flux IF = 100 mA,tp = 20 ms Φ e 14 mW Temperaturkoeffizient vonIe bzw.Φ e, IF = 100 mA Temperature coefficient ofIe orΦ e, IF = 100 mA TC I – 0.5 %/K Temperaturkoeffizient vonVF, IF = 100 mA Temperature coefficient of VF, IF = 100 mA TC V – 2 mV/K Temperaturkoeffizient vonλ,IF = 100 mA Temperature coefficient ofλ,IF = 100 mA TC λ + 0.3 nm/K
Semiconductor Group 4 1997-11-01 Gruppierung der StrahlstärkeIe in Achsrichtung gemessen bei einem RaumwinkelΩ = 0.01 sr Grouping at radiant intensityIe in axial direction at a solid angle ofΩ = 0.01 sr Bezeichnung Strahlstärke Radiant intensity IF = 100 mA,tp = 20 ms Ie > 2.5 mW/sr Strahlstärke Radiant intensity IF = 1 A,tp = 100µs Ie typ. 38 mW/sr Relative spectral emission Irel= f(λ) Forward current IF = f(VF), single pulse,tp = 20µs OHR01938 λ relΙ 880 920 960 1000 nm 1060 100 OHR01554 V F -310 10 -2 10 -1 10 0 10 1 FΙ A 1 2 3 4 V 5 Radiant intensity Single pulse,tp = 20µs Ie Ie 100 mA =f(IF) OHR01551 10 -3 ΙF -210 10 -1 10 0 10 1 10 2 Ιe 100 mA eΙ -210 -110 010 110A A Max. permissible forward current IF = f(TA) OHR00883 FΙ 100 120 20 40 60 80 100 120 mA TA = 450 K/WthjAR Radiation characteristicsSrel= f(ϕ) 0.2 0.4 1.0 0.8 0.6 ϕ 1.0 0.8 0.6 0.4 50˚ 60˚ 70˚ 80˚ 90˚ 100˚
Semiconductor Group 5 1997-11-01 SFH 420 SFH 425 Löthinweise Soldering conditions Zusätzliche Informationen über allgemeine Lötbedingungen finden Sie im Datenbuch S. 103ff. For additional information on generel soldering conditions please refer to our Data Book on page 169ff. Bauform Types Tauch-, Schwall- und Schlepplötung Dip, wave and drag soldering Reflowlötung Reflow soldering Lötbad- temperatur Temperature of the soldering bath Maximal zulässige Lötzeit Max. perm. soldering time Abstand Lötstelle – Gehäuse Distance between solder joint and case Lötzonen- temperatur Temperature of soldering zone Maximale Durchlaufzeit Max. transit time TOPLED SIDELED 260 °C 10 s 245 °C ≥ 225°C 10 s 10 s Permissible pulse handling capability IF = f(tp) duty cycleD = parameter,TA = 20°C t OHR00860 p -510 10 2 ΙF 10 3 10 4 DC 0.2 0.5 0.1 0.005 0.01 0.02 0.05 tp T ΙF tp TD = mA -410 -310 -210 -110 010 110 210s D =