MSD2310TXV SIEMENS | Alldatasheet

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SIEMENS AKTIENGESELLSCHAF 4?E D Ml 8235605 0027009 2 MMSIEG SIEMENS rep MSD2310TXV/TXVBT-41-37 yve.cow MSD2311TXV/TXVB HIGH EFF, RED MSD2312TXV/TXVB ’ HIGH EFF. GREEN MSD2313TXV/TXVB . -200” 4-Character 5x7 Dot Matrix va Serial Input Alphanumeric Military Display Package Dimensions in Inches (mm) 790 (20.01 42.11 6 8 i7 ae) * . sas f a a 192 14 abas9 = - Fy] 3°45 6 een . tw Tobe me 3 a a5 2 Column 2 i ie 3 Coumn3 a ala H é 5 Camas : , | 6 NoConnection 50 7 Dalaou . 2p : 2 vy ~ aun NonAccum SOP. 1g Chey pnt rarity 11 Ground FEATURES Sh 12° Dalain * Four .200” Dot Matrix Characters ineepctaoe eo * Four Colors: Red, Yellow, High Efficiency Work Whee i XLEZOSING spe Laos, Red, High Efficiency Green tances To oo alo * Wide Viewing Angle Part umber Siemens © Built-In CMOS Shift Registers with TOLERANCE 4.015 (exteptons notes) Constant Current LED Row Drivers * Shift Registers Allow Custom Fonts DESCRIPTION + Easily Cascaded for Multiple Displays The MSD2310 through MSD2343TXV/TXVB are four digit 5x7 dot © TTL Compatible matrix serial input alphanumeric displays The displays are available in © End Stackable red, yellow, high efficiency red, or high efficiency green. The package 1s a standard twelve-pin hermetic DIP package with glass lens The * Military Operating Temperature Range: display can be stacked honzontally or vertically to form messages of -55° to + 100°C any length The MSD231X has two fourteen-bit CMOS shift registers * Categorized for Luminous intensity with built-in row drivers, These shift registers dnve twenty-eight rows * Ceramic Package, Hermetical Solder- and enable the design of customized fonts. Cascading multiple Glass Flat Glass Window displays is possible because of the Data In and Data Out pins. Data Co In and Out are easily input with the clock signal and displayed in ° TXVB Process Conforms to MIL-D-87157 parallel on the row drivers. Data Out represents the output of the 7th Quality Level A Test and Tables |, II, Illa bit of digit number four shift register. The shift register 1s level trig- dV 3 and IVa $s gered The like columns of each character in a display cluster are * TXV Process Conforms to a Modified tied to a single pin. (See Block Diagram) High true data in the shift MIL-D-87157 Quality Level A Test and register enables the output current murror driver stage associated with Table | each row of LEDs in the 5x7 diode array The TTL compatible Vg input may either be tied to Veg for maximum display intensity or pulse width modulated to achieve intensity contro! * and reduce power consumption —Continved See Appnote 44 for application information, and Appnotes 18, 19, 22, and 23 for additional information 2-124

then approach 203° [ Symbol | Description | min. [ Typ!” [Max [Units | Fig.

1 Operation above + 100°C ambient 1s possible provided the following Tet, | Propagation 50 | 125 1

should not exceed T,= 100°C.

2 Maximum dissipation 1s derived from Veg =5 25 V Vg=24V, Notes:

2 Ve Pulse Width Modulation Frequency — 50 KHz (max)

FIGURE 1. TIMING CHARACTERISTICS refer to Siemens Appnote 19.

SIEMENS AKTIENGESELLSCHAF 47E D MM 8235605 0027011 O MBSIEG T-41-37 RECOMMENDED OPERATING CONDITIONS (Guaranteed over operating temperature range) rs Data Out Current, High State {ton [|| 08 | ma | Column input Voltage, Column Oni” | veo [es | [ss |v | [seutme are P20 | a a Clock Frequency [tou [OTs ne | Clock Transition Time [tw [ff 200 Ts | Free Aur Operating Temperature Range [tome [ -85 | [+100 | "o | Note:

1 See Figure 3 - Peak Column Current vs Column Voltage

[ Description | Symbot | win. [Tym] wax [uns | Test Gonaiona Peak Luminous Intensity per LED 9 \\ypEaK 220 | 370 wed | Vec=50V, Veo. =35V (Character Average) Ti =25°C, Vgp=24V Peak Wavelength [deen [fess [Pim [OT Dominant Wavelength? DO Yellow MSD2311 . [ Description | Symbol | win. [Typ] Wax. [Unt | Test Gonaions Peak Luminous Intensity per LED: WpEAK 650 ucd | Voc=50V, Voq.=35V (Character Average) Ty =25°C, Vg=24V Peak Wavelength ee High Efficiency Red MSD2312 Description [ symbot | win. [Typ.0| Max. [Units | Test Conditions Peak Luminous Intensity per LED" 9 \\yPEAK 1430 wed | Voc=50V, Veo. =35V (Character Average) T= 25°C, Vg=2.4V Peak Wavelength [ives [eas [om Dominant Wavelengih™ [oto Pf ses Tm PO High Efficiency Green MSD2313 . Peak Luminous Intensity per LED!" 9 Weak | 1280 | 2410 ued | Voc=50V, Veo. =3.5V (Character Average) Ty) =25°C, Vg=24V Peak Wavelength [ieee [| 968 [am PO Notes: 7 1 The displays are categorized for luminous intenstly with the intensity 4 All typical values specttied at Voc=§ 0 V and Tam = 25°C unless category designated by a letter code on the bottom of the package otherwise noted 2 Dominant wavelength 4p 1s denved from the CIE chromaticity diagram, and 5 The luminous intensity 1s measured at Tamy=Ts=25°C No time is represents the single wavelength which defines the color of the device allowed for the device to warm up pnor to measurement

3 The luminous sterance of the LED may be calculated using the following

relationships Ly (cd/m?) = ly (Candelaa (Meter)? Ly (Foollamberts) = rly (Candelay/A (Foot)? A=5 3x10 #M?=5 8x 10 7 (Foot)? 'MS02310 thru MSD2313TXVTXVB 2-126

1 Ali typical values specified at Voc =5 0 V and Temp =25°C unless

2 See Figure 3 - Peak Column Current vs Column Voltage

FIGURE 3. PEAK COLUMN CURRENT

FIGURE 4. BLOCK DIAGRAM T-41-37

SIEMENS AKTIENGESELLSCHAF 4?7E D @™@ 8235605 0027014 & MBSIEG T-41-37 GENERAL QUALITY ASSURANCE LEVELS The parts are tested in conformance with Quality Level A of MIL-D-87157 for hermetically sealed LED displays with 100% screening. The product ts tested to Tables |, Il, Illa and Va. . Table |. Quality Level A of MIL-D-87157 A [Test Screen | Method [Conditions BE 1, Precap Visual 2072 Br MIL-STD-750 SS a 2. High Temperature Storage 1032 Tamb = 125°C, Time=24 hours MIL-STD-750 3. Temperature Cycling 1051 Condition B, 10 Cycles, 15 min. Dwell MIL-STD-750 | Tamp=-65°C to +125°C 4. Constant Acceleration 2006 10,000 G's at Y; Orientation MIL-STD-750 5. Fine Leak 1071 Condition H, Leak Rate <5 x 10" cc/s MIL-STD-750 6. Gross Leak 1071 Condition C MIL-STD-750 7. Intenm Electrical/Optical Tests® loc (at Vg =0.4 V and 24 V), Ico, (at Va=0.4 V and 2.4 V), liq (Vg, Clock and Data In), Ii, (Vg, Clock and Data tn), lon. lot, Visual Function and ly Peak. Vij and Vi_ inputs are guaranteed by the electronic shift register test Tamp= 25°C. MIL-STD-883 LED On-Time Duty Factor = 5%, t= 160 hours 9. Final Electncal Test ® [| SameasStep7 10. Delta Determinants Aloc= +/-1 mA, Alyy= + /-10 mA (Clock and Data In), Alou = + /-10% of initial value, Aly = -20% 11. External Visual 2009 MIL-STD-883 Table ll. Group A Electrical Tests - MIL-D-87157 Subgroup 1 DC Electncal Tests at 25°C loc (at Vg=0.4 V and 24 V), Ico (at Vp=0.4 V and 24 VW), 5 ia (Vg, Clock and Data In), I, (Vg. Clock and Data In), fox, low, Visual Function and ly Peak. Vijy and Vj, inputs are guaranteed by the electronic shift register test. Subgroup 2 Selected DC Electrical Tests at High Same as Subgroup 1, except delete ly and Visual Function, 7 Temperatures Tam = 100°C: Subgroup 3 Selected DC Electncal Tests at Low Same as Subgroup 1, except delete ly and Visual Function, 7 Temperatures® Tamb = -55°C ‘Subgroup 7 Optical and Functional Tests at 25°C Satisfied by Subgroup 1 ‘Subgroup 8 External Visual MIL-STD-883, Method 2009 7 Notes:

1 MIL-STD-883 test method apples

2 Limits and conditions are per the ElectricaliOptical Charactensstics The

lon and lox tests are the inverse of Vor and Vou, specified in the

Electrical Characteristics

MSD2310 theu MSO231STXVITXVB 2-129

SIEMENS AKTIENGESELLSCHAF 4?E D MM 8235605 0027015 & MMSIEG Table Illa. Group 8, Classes A and B of MIL-D-87157 T-41-37 MIL-STD-750 Sample Subgroup/Test Method _| Conditions Size Subgroup 1 Resistance to Solvents 1022 4 Devices/0 Failures Internal Visual and Mechanical 2075 Inspection may be performed through | 1 Device/O Failures : glass cover, includes front and back cavities Subgroup 2" 2 . Solderabilty 2026 Tamb = 245°C for 5 seconds LTPD=15 Subgroup 3 Thermal Shock (Temp Cycle) 1051 Condition B1, 15 min Dwell LTPD=15 Moisture Resistance” 4021 Within 24 hours after completion of Visual Inspection Endpoints mossture resistance test Fine Leak 1071 Condition G or H Electrical/Optical Endpoints log (at Vg=0 4 V and 2.4 V), Ico (at Vp=0.4 V and 24 V), lin (Wp, Clock and Data tn), li, (Va. Clock and Data in), lot, lot, Visual Function and ly Peak. Vin and Vi, inputs are guaranteed by the electronic shift register test Tam = 25°C. Subgroup 4 Tamb= + 100°C at Voo=Va=5 25 V, Operating Life Test (840 Hours) 1027 Veo. =3.5 V, LED on time DF=5% | LTPD=10 ElectrcaliOptical Endpoints” | | Same as Subgroup 3 Subgroup 5 Non-Operating (Storage) Tamp = + 125°C LTPD=10 Life Test (840 hours) ElectricalOptical Endponts® | | Same as Subgroup 3 Notes: 1 Whenever electricai/optical tests are not required as endpomis, electrical 3 Inttial conditioning shall be a 15 degree inward bend and back to orginal rejects may be used position, one cycle 2 The LTPD applies to the number of leads inspected except in NO 4 Limits and conditions are per the Electrical/Optical Charactenstics The case shall less than 3 displays be used to provide the number of lon: and Io. tests are the inverse of Vor and Vo. specified in the leads required Electncal Characteristics 14502910 tw MSDEBIOTAVITXVE 2-130

SIEMENS AKTIENGESELLSCHAF 4?7E D MM 8235605 0027016 T MMSIEG T-41- Table !Va. Group C, Classes A and B of MIL-D-87157 41-37 MIL-STD-750 Sample Subgroup/Test Method Conditions Size Subgroup 1 Physical Dimensions 2 Devices/0 Failures Subgroup 2(' 2) Lead Integrity 2004 Condition B2 LTPD=15 i Hermete Sea a id Fine Leak 1071 Condition G or H z = Gre ek Subgroup 3 Shock 2016 1500G's, Time=0 5 ms, 5 Blows in Each Orientation X1, Y1, Y2 LTPD=15 Constant Acceleration | 2006 | _10,000G’s at Yi Onentation Electnical/Optical Endpoints loc (at Vp=0.4 V and 2.4 V), Icoy (at Vp=0.4 V and 2.4 V), liu (Vp, Clock and Data In), lou (Ve. Clock and Data In), 'ou, lot, Visual Function and ly Peak. Vin and Vi, inputs are guaranteed by the electronic shift register test. Tam = 25°C. ‘Subgroup 4.9 Salt Atmosphere 1041 LTPD=15 Subgroup 5 Bond Strength” 2037 Condition A LTPD =20 (C=0) Subgroup 6 Tamb= +100°C at Voc=Vg=5.25 V, Operating Life Test® 1026 Voor. =3.5 V, LED on time DF =5% A=10 Electncal/Optical Endpomts® | | Same as Subgroup 3 Notes: 1 The LTPD applies to the number of leads inspected except in no case 6. Solderabiity samples shall not be used shall fess than three displays be used to provide the number of 7 Displays may be selected prior to seal leads required 8 If any given inspection lot undergoing Group 8 inspection has been 2 MIL-STD-883 test method applies selected to satisty Group C inspection requirements, the 340-hour life 3 Visual requirements shall be as specitied in MIL-STD-883, tests may be continued on test to 1000 hours in order to satisly the Methods 1010 or 1011 Group C Life Test requirements in such cases, either the 340-hour end- 4 Limits and conditions are per the electncaVoptical characteristics The point measurement shall be made a basis for Group B lot acceptance or low and Io. tests are the inverse of Vox and Vo. specified in the the 1000-hour endpoint measurement shall be used as the basis for both Electrical Charactenstics Group B and Group C acceptance

5 Whenever electncal/optical tests are not required as endpoints, electncal

SIEMENS AKTIENGESELLSCHAF 47E D Ml 8235605 0027018 3 MBSIEG _——1 Tay THERMAL MODELING (Cont.) ~37 For ease of calculations the maximum allowable electrical ‘operating condition is dependent upon the aggregate thermal resistance of the LED matrixes and the two driver {Cs All of the thermal management calculations are based upon the parallel combination of these two networks which Is 15°C/W. Maximum allowable power dissipation is given in Equation 3. i Equation 3. i Tywang-Ty = Poispray = ——2MAN A 6 Rec + Raca Poisptay=5 Veo Icox (1/35) DF + Vec lec. For further reference see Figures 2, 7, 8, 9, 10 and 11. KEY TO EQUATION SYMBOLS DF Duty factor lec Quiescent IC current loot Column current n Number of LEDs on in a 5x7 array Pcase Package power dissipation excluding LED under consideration Poor Power dissipation of a column Poispray Power dissipation of the display Pie Power dissipation of an LED Reca Thermal resistance case to ambient Rec Thermal resistance junction to case Ta Ambient temperature Tuc) Junction temperature of an IC Tyeo) Junction temperature of a LED Tyan Maximum junction temperature Voc IC voltage Voor Column voltage Ve(LeD) Forward voltage of LED Zasc Thermal impedance junction to case 1802310 thru MSO2913TXVITXVB 2-133

0 ES] 3

2 SS cocoate 3

26 Et LEDs per Character

FIGURE 7. MAX. LED JUNCTION TEMPERATURE : rr w= FIGURE 8. MAX. PACKAGE POWER DISSIPATION : LE Zz