HSN3000 MAXWELL | Alldatasheet
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All data sheets are subject to change without notice (858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com Nuclear Event Detector HSN-3000 ©2005 Maxwell Technologies All rights reserved.
01.07.05 Rev 3
FEATURES:
- Detects ionizing radiation pulses 100% tested/certified detection threshold level Adjustable circumvention period Flag remembers event occurred 100% testable with built-in test Detection threshold adjustability Single +5V operation Radiation hardness guaranteed Compliant to MIL-PRF-38534 Class H 1 Flat pack (F) or DIP (L) packages RADIATION HARDNESS CHARACTERISTICS: Dose Rate (operate-through): 1 x 10 12 rad(Si)/sec Total Dose: 1 x 10 6 rad(Si) Neutron Fluence: 5 x 10 13 n/cm2 Approximate Detection Range: 2 x 10 5 - 2 x 107 rad(Si)/sec Maxwell Technologies Specified, Controlled, Tested and Guaranteed DESCRIPTION: Maxwell Technologies’ HSN-3000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its outputs from the normal high state to a low state with a propagation delay time of less than 20ns. The active low Nuclear Event Detection signal (NED ) is used to initiate a wide variety of circumvention functions, thus preventing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recov- ery. The Nuclear Evet Flag signal (NEF ) remembers the event occurred and is used to distinguish between an actual event and power up. The signal input of either Flag Reset or Flag Reset can be used to reset the NEF output. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose cir- cumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. The HSN-3000 is guaranteed to operate through three critical environments: ionizing dose rate [10 12 rad(Si)/s], gamma total dose [106 rad(Si)], and neutron fluence [5 x 10 13 n/cm2]. In addi- tion, the device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. Each HSN-3000’s detection level and functionality are tested in an ionizing dose rate environment. A certificate is pro- vided with each serialized hybrid, reporting the radiation test results and guaranteeing its performance. The device is also lot qualified in the total dose and neutron environments to ensure performance. The detection threshold of the HSN-3000 is adjustable within the range of 2 x 10 5 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. Manufactured for Maxwell Technologies by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, No RHA Detector (Pin Diode) Amplifier Pulse Timer LED Logic Latch 12457 8 9 14 1 VH VLThreshold Adjust VB BIT GND CR C Flag Reset Flag Reset NEF NED 10 kΩ 10 kΩ Logic Diagram
TABLE 1. PIN DESCRIPTION
1 Load Voltage, V L
2 Nuclear Event Detector, NED
3 No Connection
4 External Capacitor
5 External Capacitor
6 Built In Test, BIT
7 Package Ground and Case
8 PIN Diode Bias, V
9 Threshold Adjust
10 No Connection
11 Flag Reset
12 Flag Reset
13 Nuclear Event Flag, NEF
14 Hardened Supply Voltage, V H
TABLE 2. ELECTRICAL CHARACTERISTICS
- Standby mode is the normal state of the device, defined as having both the NED and NEF outputs (pins 2 and 13) in the “high”
- Flag Set mode occurs after an event has been detected or BIT has been initiated and the NED output has timed out (i.e., has
transitioned to the “high” state), leaving the NEF output as the only remaining output in the low state.
- Operational mode is in effect during the timeout period of the NED signal, characterized by having both the NED and NEF out-
puts in the “low” state, causing the greatest current draw of the device.
- BIT electrical characteristics are not guaranteed over the radiation range.
- BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it i s
advised that a series resistor/capacitor combination is used.
- Guaranteed but not tested over temperature. Time delay, t
pulse to the falling edge of the NED output at approximately 10 times the detection level. TABLE 2. ELECTRICAL CHARACTERISTICS
4All data sheets are subject to change without notice ©2005 Maxwell Technologies All rights reserved. Nuclear Event Detector HSN-3000 Note: All dimensions in inches. Important Notice: The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information. Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies. Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech- nologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts. 0.600 0.015 ± 0.0030.100 TYP 0.500 MIN 0.495 0.795
0.145 MAX
0.070 ± 0.002 0.010 ± 0.002 14 13 12 11 10 9 8 1234567 14 13 12 11 10 9 8 1234567 0.795 0.600
0.100 TYP
0.495 0.300 0.200 0.016 0.020DIA TOP VIEW Flatpack Hybrid Package HSN-3000F DIP Hybrid Package HSN-3000L All tolerances are ± 0.005 unless specified
5All data sheets are subject to change without notice ©2005 Maxwell Technologies All rights reserved. Nuclear Event Detector HSN-3000 Feature Option DetailsHSN-3000 X Package Base Product Nomenclature L = Dual In-line Package (DIP) F = Flat Pack Nuclear Event Detector