HSN-2000 MAXWELL | Alldatasheet

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All data sheets are subject to change without notice (858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com Nuclear Event Detector HSN-2000 ©2005 Maxwell Technologies All rights reserved.

01.07.05 Rev 3

FEATURES:

  • Detects ionizing radiation pulses  Tested/certified detection threshold level  Adjustable circumvention period  100% testable with built-in test  Detection threshold adjustability  Single +5V operation  Designed-in radiation hardness  Compliant to MIL-PRF-38534 Class H 1  Flat pack (F) or DIP (L) packages RADIATION HARDNESS CHARACTERISTICS  Dose Rate (operate-through): 1 x 10 12 rad(Si)/sec  Total Dose: 1 x 10 6 rad(Si)  Neutron Fluence: 5 x 10 13 n/cm2  Approximate Detection Range: 2 x 10 5 - 2 x 107 rad(Si)/sec  Maxwell Technologies Specified, Controlled, and Tested DESCRIPTION: Maxwell Technologies’ HSN-2000 radiation-hardened Hybrid Nuclear Event Detector (NED) senses ionizing radiation pulses generated by a nuclear event, such as the detonation of a nuclear weapon, and rapidly switches its output from the normal high state to a low state with a propagation delay time of less than 20 ns. The active low Nuclear Event Detection signal (NED ) is used to initiate a wide variety of circumvention functions, thus prevent- ing upset and burnout of electronic components. The NED output is also used to initiate both hardware and software recovery. This high-speed, 14-pin hybrid detector is used in electronic systems as a general-purpose circumvention device to protect memory, stop data processing, and drive power supply switches as well as signal clamps. The HSN-2000 is designed to operate through three critical envi- ronments: ionizing dose rate [10 12 rad(Si)/s], gamma total dose [106 rad(Si)], and neutron fluence [5 x 1013 n/cm2]. In addition, the device is designed to function throughout the transient neutron pulse. The hybrid’s discrete design ensures a controlled response in these radiation environments as well as immunity to latchup. The detection level and functionality of a sample of each HSN- 2000 production lot are tested in an ionizing dose rate environ- ment. A certificate is provided reporting the test results for the production lot. The detection threshold of the HSN-2000 is adjustable within the range of 2 x 10 5 rad(Si)/s to 2 x 107 rad(Si)/s. This detection level can be preset by Maxwell or adjusted by the user. Less than a 30% variation in detection threshold can be expected over the entire operating temperature range. 1. Manufactured for Maxwell Technologies by Teledyne Microelectronic Technologies to MIL-PRF-38534, Class H, no RHA Logic Diagram Detector (Pin Diode) Amplifier Pulse Timer LED Logic Latch 12457 8 9 14 1 VH VLThreshold Adjust VB BIT GND CR C Flag Reset Flag Reset NEF NED 10 kΩ 10 kΩ

TABLE 1. PIN DESCRIPTION

1 Load Voltage, V L

2 Nuclear Event Detector, NED

3 No Connection

4 External Capacitor

5 External Capacitor

6 Built In Test, BIT

7 Package Ground and Case

8 PIN Diode Bias, V

9 Threshold Adjust

10 No Connection

11 No Connection

12 No Connection

13 No Connection

14 Hardened Supply Voltage, V H

TABLE 2. ELECTRICAL CHARACTERISTICS

Note: All dimensions in inches.

  1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the “high” state.
  2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the “low ”

state, causing the greatest current draw of the device.

  1. BIT electrical characteristics are not guaranteed over the radiation range.
  2. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it i s

advised that a series resistor/capacitor combination is used.

  1. Guaranteed but not tested over temperature. Time delay, t

pulse to the falling edge of the NED output at approximately 10 times the detection level.

0.145 MAX

0.100 TYP

Table 2. Notes

4All data sheets are subject to change without notice ©2005 Maxwell Technologies All rights reserved. Nuclear Event Detector HSN-2000 Important Notice: The specifications presented within these data sheets represent the latest and most accurate information available to date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no responsibility for the use of this information. Maxwell Technologies’ products are not authorized for use as critical components in life support devices or systems without express written approval from Maxwell Technologies. Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech- nologies. Maxwell Technologies’ liability shall be limited to replacement of defective parts. Product Ordering Options Model Number Feature Option DetailsHSN-2000 X Package Base Product Nomenclature L = Dual In-line Package (DIP) F = Flat Pack Nuclear Event Detector