AEDR-8400-140 AVAGO | Alldatasheet

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AEDR-8400-140 and AEDR-8400-142 Reflective Surface Mount Optical Encoder Reliability Data Sheet

Description

The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC Standard. Avago tests parts at the absolute maximum rated condi - tions recommended for the device. The actual perfor - mance you obtain from Avago parts depends on the electrical and environmental characteristics of your appli- cation but will probably be better than the performance outlined in Table 1. Failure Rate Prediction The failure rate of semiconductor devices is determined by the junction temperature of the device. The relation - ship between ambient given by the following: TJ(°C) = TA(°C) + qJAPAVG Where, TA = ambient temperature in °C qJA = thermal resistance of junction-to-ambient in °C/ Watt PAVG = average power dissipated in Watt The estimated MTTF and failure rate at temperatures lower than the actual stress temperature can be deter - mined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table below using an activation energy of 0.43eV (reference MIL-HDBK-217).Table 1. Life Tests Demonstrated Performance Test Name Stress Test Conditions Total Device Hours Units Tested Total Failed Point Typical Performance MTTF Failure Rate (% /1 K Hours) High Temperature Operating Life VCC=3.0V, TA=85°C, 1500hours 45,000 30 0 49,180 2.03 Table 2. Ambient Temperature (°C) Junction Temperature (°C) Point Typical Performance [1] in Time Performance in Time [2] (90% Confidence) MTTF [1] Failure Rate (% / 1K Hours) MTTF [2] Failure Rate (% /1K Hours) 85 89.7 49,180 2.03 19,520 5.12 75 79.7 72,640 1.38 28,840 3.47 65 69.7 109,800 0.91 43,580 2.29 55 59.7 170,000 0.59 67,500 1.48 45 49.7 270,700 0.37 107,400 0.93 35 39.7 443,800 0.23 176,200 0.57 25 29.7 751,900 0.13 298,500 0.34

  1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero

failures, one failure is assumed for this calculation.

  1. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence

commonly used in describing useful life failures.

  1. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures

are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors. Table 3. Environmental Tests Table 4. Electrical Tests Table 5. Mechanical and Vibration shock

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