ES62UL256 NANOAMP | Alldatasheet
Document overview
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- PDF pages: 6
Technical content
Features
- Operating Voltage 1.5 to 3.6 Volts
- Extended Temperature Range -20o to +80oC
- Fast Cycle Time TACC < 25 nS @ 3V
- Very Low Operating Current ICC < 0.8 mA typical at 2V, 1 Mhz
- Very Low Standby Current ISB = 50 nA typical FIGURE 1: Operating Envelope Typical ICC (mA)
40 Mhz
5 Mhz
1 Mhz
VCC (V)
20 Mhz
3Stock No. 23003-03 4/99 ES62UL256 Family NanoAmp Solutions TABLE 3: Absolute Maximum Ratings* *Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operating section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. TABLE 4: Operating Characteristics (Over the Specified Temperature Range) *Notes Note 1. Operating current is a linear function of operating frequency and voltage. You may calculate operating current using the formula shown with operating frequency (f) expressed in Mhz and operating voltage (V) in volts. Example: The L device operating at 2 Mhz at 2.0 volts will draw a typical current of 0.4*2*2 = 1.6 mA. Note 2. This device assumes a standby mode if CE is disabled (high). It will also automatically go into a standby mode whenever all input signals are quiescent (not toggling) regardless of the state of CE. In order to achieve low standby current in the enabled mode (CE low), all inputs must be within 0.2 volts of either V CC or VSS. Item Symbol Rating Unit Voltage on any pin relative to V SS VIN,OUT –0.3 to VCC+0.3 V Voltage on VCC Supply Relative to VSS VCC –0.3 to 4.0 V Power Dissipation PD 500 mW Storage Temperature TSTG –40 to 125 oC Operating Temperature TA -20 to +80 oC Soldering Temperature and Time TSOLDER 260 oC, 10sec (Lead only) oC Item Symbol Test Conditions Min/Max L Unit Supply Voltage VCC Min 1.5 VMax 3.6 Data Retention Voltage VDR CE = VCC Min 1.2 V Input High Voltage VIH Min 0.7VCC V Max VCC+0.3 Input Low Voltage VIL Min –0.3 VMax 0.3VCC Output High Voltage VOH IOH = 200 µA Min VCC–0.2 V Output Low Voltage VOL IOL = –200 µA Max 0.2 V Input Leakage Current ILI VIN = 0 to VCC Max 0.5 µA Output Leakage Current ILO OE = VCC or CE = VCC Max 0.5 µA Operating Supply Current (Note 1) ICC2 VIN = VCC or 0V CE = VSS Typ 0.4 * f * V mAMax 0.5 * f * V Max Standby Current (Note 2) ISB VIN = VCC or 0V tA = 55oC Max 1.0 µA Typical Standby Current (Note 2) ISB VIN = VCC or 0V tA = 25 oC Typ 0.05 µA
4Stock No. 23003-03 4/99 ES62UL256 Family NanoAmp Solutions TABLE 5: Capacitance TABLE 6: Timing Test Conditions (Over the Specified Temperature Range) TABLE 7: Read Cycle Timing TABLE 8: Write Cycle Timing Item Symbol Test Condition Min Max Unit Input Capacitance CIN VIN = 0V 5 pF I/O Capacitance CI/O VIN = 0V 5 pF Item Input Pulse Level 0.1VCC to 0.9VCC Input Rise and Fall Time 5nS Input and Output Timing Reference Levels 0.5VCC Output Load CL = 50pF Item Symbol Min/Max 1.5V 3.0-3.6V Units -45 -25 Read Cycle Time tRC Min 200 45 25 ns Address Access Time tAA Max 200 45 25 ns Chip Enable Access Time tCE Max 200 45 25 ns Output Enable to Valid Output tOE Max 60 15 10 ns Chip Enable to Low-Z output tLZ Min 20 5 5 ns Output Enable to Low-Z Output tOLZ Min 20 5 5 ns Chip Enable to High-Z Output tHZ Min 0 0 0 ns Max 50 15 10 Output Disable to High-Z Output tOHZ Min 0 0 0 ns Max 50 15 10 Output Hold from Address Change tOH Min 20 5 5 ns Item Symbol Min/Max 1.5V 3.0-3.6V Unit -45 -25 Write Cycle Time tWC Min 200 45 25 ns Chip Enable to End of Write tCW Min 100 35 20 ns Address Valid to End of Write tAW Min 100 35 20 ns Address Set-Up Time tAS Min 0 0 0 ns Write Pulse Width tWP Min 75 25 15 ns Write Recovery Time tWR Min 0 0 0 ns Write to High-Z Output tWHZ Min 0 0 0 ns Max 60 20 15 Data to Write Time Overlap tDW Min 60 25 15 ns Data Hold from Write Time tDH Min 0 0 0 ns End Write to Low-Z Output tOW Min 20 5 5 ns
6Stock No. 23003-03 4/99 ES62UL256 Family NanoAmp Solutions FIGURE 6: Write Cycle (2) Timing (OE fixed) TABLE 9: Ordering Information TABLE 10: Revision History A0-A14 CE WE Data In Data Out tWP tDW tDH Data Valid High-Z tWHZ tOW tWC tAW tCW tWR tAS tOH Part Number Package Temperature Range Voltage Range Speed (@ 3V+) ES62UL256-45TC 28 pin TSOP -20 to +80 oC 1.5 to 3.6 V 45 ns ES62UL256-45SC 28 pin SOP -20 to +80 oC 1.5 to 3.6 V 45 ns ES62UL256-25TC 28 pin TSOP -20 to +80 oC 1.5 to 3.6 V 25 ns ES62UL256-25SC 28 pin SOP -20 to +80 oC 1.5 to 3.6 V 25 ns Revision # Date Change Description 01 Nov. 1, 1997 Initial Formal Release 02 Feb. 1, 1998 Corrected Temperature Range for Dynamic Testing 03 Apr. 23, 1999 Eliminated ULL family, Changed UL voltage range to 1.5 to 3.6