DS5001FP DALLAS | Alldatasheet
Document overview
- Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
- PDF pages: 26
Technical content
Note: Some revisions of this device may incorporate deviations from published specifications known as errata. Multiple revisions of any device may be simultaneously available through various sales channels. For information about device errata, click here: http://www.maxim-ic.com/errata.
FEATURES
/g167 8051-compatible microprocessor adapts to its task – Accesses up to 128kB of nonvolatile SRAM – In-system programming through on-chip serial port – Can modify its own program or data memory – Accesses memory on a separate byte-wide bus – Performs CRC-16 check of NV RAM memory – Decodes memory and peripheral chip enables /g167 High-reliability operation – Maintains all nonvolatile resources for over 10 years – Power-fail reset – Early warning power-fail interrupt – Watchdog timer – Lithium backs user SRAM for program/data storage – Precision bandgap reference for power monitor /g167 Fully 8051-compatible – 128kB scratchpad RAM – Two timer/counters – On-chip serial port – 32 parallel I/O port pins /g167 Software security available with DS5002FP secure microprocessor PIN ASSIGNMENT (Top View) P0.4AD4 CE2 PE2 BA9 P0.3/AD3 BA8 P0.2/AD2 BA13 P0.1/AD1 R/W P0.0/AD0 VCC0 VCC MSEL P1.0 BA14 P1.1 BA12 P1.2 BA7 P1.3 PE3 PE4 BA6 P2.6/A14 CE3 CE4 BD3 P2.5/A13 BD2 P2.4/A12 BD1 P2.3/A11 BD0 VLI BA15 GND P2.2/A10 P2.1/A9 P2.0/A8 XTAL1 XTAL2 P3.7/RD P3.6/WR P3.5/TI PF VRST P3.4/T0 DS5001FP P1.4 BA5 P1.5 BA4 P1.6 BA3 P1.7 PROG BA2 RST BA1 P3.0/RXD BA0 P3.1/TXD P3.2/INT0 P3.3/INT1 BA11 P0.5/AD5 PE1 P0.6/AD6 BA10 P0.7/AD7 CE1 NC CE1N BD7 ALE BD6 PSEN BD5 P2.7/A15 BD4 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 80 79 78 77 76 75 74 73 72 71 70 69 68 67 66 65 DS5001FP 128k Soft Microprocessor Chip www.maxim-ic.com 80-Pin MQFP 44-Pin MQFP
DESCRIPTION
The DS5001FP 128k soft microprocessor chip is an 8051-compatible microprocessor based on NV RAM technology and designed for systems that need la rge quantities of nonvolatile memory. It provides full compatibility with the 8051 instructi on set, timers, serial port, and pa rallel I/O ports. By using NV RAM instead of ROM, the user can program and then reprogram the microprocessor while in-system. The application software can even change its own op eration, which allows frequent software upgrades, adaptive programs, customized systems, etc. In a ddition, by using NV SRAM, the DS5001FP is ideal for data logging applications. It also connects easily to a Dallas real-time clock. The DS5001FP provides the benefits of NV RAM without using I/O resources. It uses a nonmultiplexed byte-wide address and data bus for memory access. This bus performs all me mory access and provides decoded chip enables for SRAM, which leaves th e 32 I/O port pins free for application use. The DS5001FP uses ordinary SRAM and battery-backs the memory contents for over 10 years at room temperature with a small external battery. A DS5001F P also provides high-reliability operation in harsh environments. These features include the ability to sa ve the operating state, power-fail reset, power-fail interrupt, and watchdog timer. A user programs the DS5001FP through its on-chip serial bootstrap loader. The bootstrap loader supervises the loading of software into NV RAM, validates it, and then becomes transparent to the user. Software can be stored in multip le 32kB or one 128kB CMOS SRAM(s). Using its internal partitioning, the DS5001FP can divide a common RAM into user-selectable program and data segments. This partition can be selected at program loading time, but can then be modified later at any time. The microprocessor decodes memory access to the SRAM and addresses memory through its byte-wide bus. Memory portions designated code or ROM are automatically write-protected by the microprocessor. Combining program and data storage in one device saves board space and cost. The DS5001FP offers several bank switc hes for access to even more memory. In addition to the primary data area of 64kB, a peripheral selector creates a second 64kB data space with four accompanying chip enables. This area can be used for memory-mapped peripherals or more data storage. The DS5001FP can also use its expanded bus on ports 0 and 2 (like an 8051) to access an additional 64kB of data space. Lastly, the DS5001FP provides one additional bank switch that ch anges up to 60kB of the NV RAM program space into data memory. Thus, with a sm all amount of logic, the DS5001 accesses up to 252kB of data memory. The DS2251T is available (Refer to the data sheet at www.maxim-ic.com/microcontrollers.) for users who want a preconstructed module using the DS5001FP, RAM, lithium cell, and a real-time clock. For more details, refer to the Secure Microcontroller User’s Guide. For users desiring software security, the DS5002FP is functionally identical to the DS5001FP but provides superior firmware security. The 44-pin version of the device is functionally identical to the 80-pin version but sports a reduced pin count and footprint. Refer to the Secure Microcontroller User’s Guide for operating details. This data sheet provides ordering information, pinout, and electrical specifications.
ORDERING INFORMATION
PART PIN-PACKAGE MAX. CLOCK SPEED (MHz) TEMP. RANGE (°C) DS5001FP-16 80-MQFP 16 0 to +70 DS5001FP-16N 80-MQFP 16 -40 to +85 DS5001FP-12-44 44-MQFP 12 0 to +70
Figure 1. BLOCK DIAGRAM
11, 9, 7, 5, 1, 79, 77, 75 (P0.5) P0.0–P0.7 General-Purpose I/O Port 0. This port is open-drain and cannot drive a logic 1. It requires external pullups. Port 0 is also the multiplexed expanded address/data bus. When used in this mode, it does not require pullups. 15, 17, 19, 21, 25, 27, 29, 31 (P1.3) P1.0–P1.7 General-Purpose I/O Port 1 49, 50, 51, 56, 58, 60, 64, 66 N/A P2.0–P2.7 General-Purpose I/O Port 2. Also serves as the MSB of the address in expanded memory accesses, and as pins of the RPC mode when used. 36 8 P3.0 RXD General-Purpose I/O Port Pin 3.0. Also serves as the receive signal for the on board UART. This pin should not be connected directly to a PC COM port. 38 10 P3.1 TXD General-Purpose I/O Port Pin 3.1. Also serves as the transmit signal for the on board UART. This pin should not be connected directly to a PC COM port. 39 N/A P3.2 INT0 General-Purpose I/O Port Pin 3.2. Also serves as the active-low external interrupt 0. 40 11 P3.3 INT1 General-Purpose I/O Port Pin 3.3. Also serves as the active-low external interrupt 1. 41 N/A P3.4 T0 General-Purpose I/O Port Pin 3.4. Also serves as the timer 0 input. 44 12 P3.5 T1 General-Purpose I/O Port Pin 3.5. Also serves as the timer 1 input. 45 13 P3.6 WR General-Purpose I/O Port Pin. Also serves as the write strobe for expanded bus operation. 46 N/A P3.7 RD General-Purpose I/O Port Pin. Also serves as the read strobe for expanded bus operation. 68 25 PSEN Program Store Enable. This active-low signal is used to enable an external program memory when using the expanded bus. It is normally an output and should be unconnected if not used. PSEN also is used to invoke the bootstrap loader. At this time, PSEN is pulled down externally. This should only be done once the DS5001FP is already in a reset state. The device that pulls down should be open drain since it must not interfere with PSEN under normal operation. 34 6 RST Active-High Reset Input. A logic 1 applied to this pin will activate a reset state. This pin is pulled down internally so this pin can be left unconnected if not used. An RC power-on reset circuit is not needed and is not recommended. 70 27 ALE Address Latch Enable. Used to demultiplex the multiplexed expanded address/data bus on port 0. This pin is normally connected to the clock input on a ’373 type transparent latch. 47, 48 14, 15 XTAL2, XTAL1 XTAL2, XTAL1. Used to connect an external crystal to the internal oscillator. XTAL1 is the input to an inverting amplifier and XTAL2 is the output. 52 16 GND Logic Ground 13 39 VCC V CC - +5V 12 38 VCCO VCCO - VCC Output. This is switched between VCC and VLI by internal circuits based on the level of VCC. When power is above the lithium input, power will be drawn from VCC. The lithium cell remains isolated from a load. When VCC is below VLI, the VCCO switches to the VLI source. VCCO should be connected to the VCC pin of an SRAM. 54 17 VLI Lithium Voltage Input. Connect to a lithium cell greater than VLIMIN and no greater than VLImax as shown in the electrical specifications. Nominal value is +3V. 53, 16, 8, 18, 80, 76, 4, 6, 20, 24, 26, 28, 30, 41, 36, 42, 32, 30, 34, 35, 43, 1, 2, 3, 4, 5, 7, BA14–0 Byte-Wide Address-Bus Bits 14–0. This bus is combined with the nonmultiplexed data bus (BD7–0) to access NV SRAM. Decoding is performed using CE1 through CE4 . Therefore, BA15 is not actually needed. Read/write access is controlled by R/ W . BA14–0 connect directly to an 8k, 32k, or 128k SRAM. If an 8k RAM is used, BA13 and BA14 are unconnected. If a 128k SRAM is used, the micro converts CE2 and CE3 to serve as A16
33, 35, 9 and A15 respectively. 71, 69, 67, 65, 61, 59, 57, 55 28, 26, 24, 23, 21, 20, 19, 18 BD7–0 Byte-Wide Data-Bus Bits 7–0. This 8-bit, bidirectional bus is combined with the nonmultiplexed address bus (BA14–0) to access NV SRAM. Decoding is performed on CE1 and CE2 . Read/write access is controlled by R/ W . BD7–0 connect directly to an SRAM, and optionally to a real-time clock or other peripheral. 10 37 R/ W Read/Write. This signal provides the write enable to the SRAMs on the byte-wide bus. It is controlled by the memory map and partition. The blocks selected as program (ROM) are write-protected. 74 29 CE1 Chip Enable 1. This is the primary decoded chip enable for memory access on the byte- wide bus. It connects to the chip enable input of one SRAM. CE1 is lithium-backed. It remains in a logic high inactive state when VCC falls below VLI. 72 N/A CE1N Non-battery-backed version of chip enable 1. This can be used with a 32kB EPROM. It should not be used with a battery-backed chip. 23 3 CE2 Chip Enable 2. This chip enable is provided to access a second 32k block of memory. It connects to the chip enable input of one SRAM. When MSEL = 0, the micro converts CE2 into A16 for a 128k x 8 SRAM. CE2 is lithium-backed and remains at a logic high when VCC falls below VLI. 63 22 CE3 Chip Enable 3. This chip enable is provided to access a third 32k block of memory. It connects to the chip enable input of one SRAM. When MSEL = 0, the micro converts CE3 into A15 for a 128k x 8 SRAM. CE3 is lithium-backed and remains at a logic high when VCC falls below VLI.
62 N/A CE4
Chip Enable 4. This chip enable is provided to access a fourth 32k block of memory. It connects to the chip-enable input of one SRAM. When MSEL = 0, this signal is unused. CE4 is lithium-backed and remains at a logic high when VCC < VLI.
78 N/A PE1
Peripheral Enable 1. Accesses data memory between addresses 0000h and 3FFFh when the PES bit is set to a logic 1. Commonly used to chip enable a byte-wide real-time clock such as the DS1283. PE1 is lithium-backed and remains at a logic high when VCC falls below VLI. Connect PE1 to battery-backed functions only. 3N / A PE2 Peripheral Enable 2. Accesses data memory between addresses 4000h and 7FFFh when the PES bit is set to a logic 1. PE2 is lithium-backed and remains at a logic high when VCC falls below VLI. Connect PE2 to battery-backed functions only.
22 N/A PE3
Peripheral Enable 3. Accesses data memory between addresses 8000h and BFFFh when the PES bit is set to a logic 1. PE3 is not lithium-backed and can be connected to any type of peripheral function. If connected to a battery-backed chip, it needs additional circuitry to maintain the chip enable in an inactive state when VCC < VLI.
23 N/A PE4
Peripheral Enable 4. Accesses data memory between addresses C000h and FFFFh when the PES bit is set to a logic 1. PE4 is not lithium-backed and can be connected to any type of peripheral function. If connected to a battery-backed chip, it needs additional circuitry to maintain the chip enable in an inactive state when V CC < VLI.
32 N/A PROG
Invokes the bootstrap loader on a falling edge. This signal should be debounced so that only one edge is detected. If connected to ground, the micro enters bootstrap loading on power-up. This signal is pulled up internally.
42 N/A VRST
This I/O pin (open drain with internal pullup) indicates that the power supply (V CC) has fallen below the VCCmin level and the micro is in a reset state. When this occurs, the DS5001FP drives this pin to a logic 0. Because the micro is lithium-backed, this signal is guaranteed even when V CC = 0V. Because it is an I/O pin, it also forces a reset if pulled low externally. This allows multiple parts to synchronize their power-down resets.
43 N/A PF
This output goes to a logic 0 to indicate that VCC < VLI and the micro has switched to lithium backup. Because the micro is lithium-backed, this signal is guaranteed even when VCC = 0V. The normal application of this signal is to control lithium powered current to isolate battery-backed functions from non-battery-backed functions. 14 40 MSEL Memory Select. This signal controls the memory size selection. When MSEL = +5V, the DS5001FP expects to use 32k x 8 SRAMs. When MSEL = 0V, the DS5001FP expects to use a 128k x 8 SRAM. MSEL must be connected regardless of partition, mode, etc. 73 NC No Connect.
Figure 3. MEMORY MAP IN PARTITIONABLE MODE (PM = 0) Note: Partitionable mode is not supported when MSEL pin = 0 (128kB mode).
Figure 4. MEMORY MAP WITH PES = 1
Figure 6. DS5001FP CONNECTION TO 64k x 8 SRAM more information on this topic. The trip points VCCMIN and VPFW are listed in Electrical Specifications.
ABSOLUTE MAXIMUM RATINGS* Voltage Range on Any Pin Relative to Ground -0.3V to (V CC + 0.5V) Voltage Range on VCC Related to Ground -0.3 /g32/g176C to 6.0/g176C Operating Temperature Range -40 /g176C to +85/g176C Storage Temperature Range1 -55/g176C to +125/g176C Soldering Temperature See IPC/JEDEC J-STD-020A *This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability. 1Storage temperature is defined as the temperature of the device when VCC = 0V and VLI = 0V. In this state, the contents of SRAM are not battery-backed and are undefined. DC CHARACTERISTICS (TA = 0°C to +70°C; VCC = 5V ±10%) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Input Low Voltage V IL -0.3 +0.8 V 1 Input High Voltage V IH1 2.0 V CC + 0.3 V 1 Input High Voltage (RST, XTAL1, PROG ) VIH2 3.5 V CC + 0.3 V 1 Output Low Voltage at IOL = 1.6mA (Ports 1, 2, 3, PF ) VOL1 0.15 0.45 V 1, 11 Output Low Voltage at IOL = 3.2mA (Ports 0, ALE, PSEN , BA15–0, BD7–0, R/ W , CE1N , CE 1–4, PE 1–4, VRST) VOL2 0.15 0.45 V 1 Output High Voltage at IOH = -80µA (Ports 1, 2, 3) VOH1 2.4 4.8 V 1 Output High Voltage at IOH = -400µA (Ports 0, ALE, PSEN , PF , BA15–0, BD7–0, R/ W , CE1N , CE 1–4, PE 1–4, VRST) VOH2 2.4 4.8 V 1 Input Low Current VIN = 0.45V (Ports 1, 2, 3) IIL -50 µA Transition Current; 1 to 0 VIN = 2.0V (Ports 1, 2, 3) (0°C to +70°C) ITL -500 µA Transition Current; 1 to 0 VIN = 2.0V (Ports 1, 2, 3) (-40°C to +85°C) ITL -600 µA 10
DC CHARACTERISTICS (continued) (TA = 0°C to +70°C; VCC = 5V ±10%) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Input Leakage Current 0.45 < VIN < VCC (Port 0, MSEL) IIL +10 µA RST Pulldown Resistor (0°C to +70°C) RRE 40 150 k/g87 RST Pulldown Resistor (-40°C to +85°C) RRE 30 180 k/g87 10 VRST Pullup Resistor RVR 4.7 k/g87 PROG Pullup Resistor RPR 40 k/g87 Power-Fail Warning Voltage (0°C to +70°C) VPFW 4.25 4.37 4.50 V 1 Power-Fail Warning Voltage (-40°C to +85°C) VPFW 4.1 4.37 4.6 V 1, 10 Minimum Operating Voltage (0°C to +70°C) VCCMIN 4.00 4.12 4.25 V 1 Minimum Operating Voltage (-40°C to +85°C) VCCMIN 3.85 4.09 4.25 V 1, 10 Lithium Supply Voltage V LI 2.5 4.0 V 1 Operating Current at 16MHz I CC 36 mA 2 Idle Mode Current at 12MHz (0°C to +70°C) IIDLE 7.0 mA 3 Idle Mode Current at 12MHz (-40°C to +85°C) IIDLE 8.0 mA 3, 10 Stop Mode Current I STOP 80 µA 4 Pin Capacitance C IN 10 pF 5 Output Supply Voltage (VCCO) VCCO1 VCC -0.45 V 1, 2 Output Supply Battery-Backed Mode (VCCO, CE 1-4, PE 1-2) (0°C to +70°C) VCCO2 VLI -0.65 V 1, 8 Output Supply Battery-Backed Mode (VCCO, CE 1-4, PE 1-2) (-40°C to +85°C) VCCO2 VLI -0.9 V 1, 8, 10 Output Supply Current at VCCO = VCC - 0.45V ICCO1 75 mA 6 Lithium-Backed Quiescent Current (0°C to +70°C) ILI 57 5 n A 7 Lithium-Backed Quiescent Current (-40°C to +85°C) ILI 75 500 nA 7 Reset Trip Point in Stop Mode With BAT = 3.0V (0°C to +70°C) With BAT = 3.0V (-40°C to +85°C) With BAT = 3.0V (0°C to +70°C) 4.0 3.85 4.4 4.25 4.25 4.65 1, 10
EXPANDED BUS MODE TIMING SPECIFICATIONS (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS 1 Oscillator Frequency 1/ t CLK 1.0 16 MHz
2 ALE Pulse Width t ALPW 2tCLK - 40 ns
3 Address Valid to ALE Low t AVALL tCLK - 40 ns
4 Address Hold After ALE Low t AVAAV tCLK - 35 ns
ALE Low to Valid Instruction In at 12MHz at 16MHz tALLVI 4tCLK - 150 4tCLK - 90 ns ns
6 ALE Low to PSEN Low tALLPSL tCLK - 25 ns
7 PSEN Pulse Width tPSPW 3tCLK - 35 ns
PSEN Low to Valid Instruction In at 12MHz at 16MHz tPSLVI 3tCLK - 150 3tCLK - 90 ns ns
9 Input Instruction Hold After PSEN Going
10 Input Instruction Float After PSEN Going
11 Address Hold After PSEN Going High tPSAV tCLK - 8 ns
Address Valid to Valid Instruction In at 12MHz at 16MHz tAVVI 5tCLK - 150 5tCLK - 90 ns ns
13 PSEN Low to Address Float tPSLAZ 0n s
14 RD Pulse Width tRDPW 6tCLK - 100 ns
15 WR Pulse Width tWRPW 6tCLK - 100 ns
16 RD Low to Valid Data In at 12MHz
17 Data Hold After RD High tRDHDV 0n s
18 Data Float After RD High tRDHDZ 2tCLK - 70 ns
19 ALE Low to Valid Data In at 12MHz
20 Valid Address to Valid Data In at 12MHz
21 ALE Low to RD or WR Low tALLRDL 3tCLK - 50 3t CLK + 50 ns
22 Address Valid to RD or WR Low tAVRDL 4tCLK - 130 ns
23 Data Valid to WR Going Low tDVWRL tCLK - 60 ns
24 Data Valid to WR High at 12MHz
25 Data Valid After WR High tWRHDV tCLK - 50 ns
26 RD Low to Address Float tRDLAZ 0n s
27 RD or WR High to ALE High tRDHALH tCLK - 40 t CLK + 50 ns
EXPANDED PROGRAM-MEMORY READ CYCLE EXPANDED DATA-MEMORY READ CYCLE
EXPANDED DATA-MEMORY WRITE CYCLE
AC CHARACTERISTICS (continued) EXTERNAL CLOCK DRIVE (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS External Clock-High Time at 12MHz at 16MHz t CLKHPW 20 ns External Clock-Low Time at 12MHz at 16MHz t CLKLPW 20 ns External Clock-Rise Time at 12MHz at 16MHz t CLKR 20 ns External Clock-Fall Time at 12MHz at 16MHz t CLKF 20 ns EXTERNAL CLOCK TIMING
AC CHARACTERISTICS (continued) POWER CYCLE TIME (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
32 Slew Rate from V CCMIN to VLI tF 130 µs
33 Crystal Startup Time t CSU (Note 9)
34 Power-On Reset Delay t POR 21,504 t CLK
AC CHARACTERISTICS (continued) SERIAL PORT TIMING, MODE 0 (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
35 Serial-Port Clock-Cycle Time t SPCLK 12tCLK µs
36 Output-Data Setup to Rising-Clock Edge t DOCH 10tCLK - 133 ns
37 Output-Data Hold After Rising-Clock Edge t CHDO 2tCLK - 117 ns
38 Clock-Rising Edge to Input-Data Valid t CHDV 10tCLK - 133 ns
39 Input-Data Hold After Rising-Clock Edge t CHDIV 0n s
SERIAL PORT TIMING, MODE 0
AC CHARACTERISTICS (continued) BYTE-WIDE ADDRESS/DATA BUS TIMING (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS Delay to Byte-Wide Address Valid from CE1 , CE2 , or CE1N Low During Op Code Fetch tCE1LPA 30 ns
41 Pulse Width of CE 1-4, PE 1-4 or CE1N tCEPW 4tCLK - 35 ns
42 Byte-Wide Address Hold After CE1 , CE2 , or
CE1N High During Op Code Fetch tCE1HPA 2tCLK - 20 ns
43 Byte-Wide Data Setup to CE1 , CE2 , or CE1N
High During Op Code Fetch tOVCE1H 1tCLK + 40 ns
44 Byte-Wide Data Hold After CE1 , CE2 or
CE1N High During Op Code Fetch tCE1HOV 0n s
45 Byte-Wide Address Hold After CE 1-4,
PE 1-4, or CE1N High During MOVX tCEHDA 4tCLK - 30 ns
46 Delay from Byte-Wide Address Valid
CE 1-4, PE 1-4, or CE1N Low During MOVX tCELDA 4tCLK - 35 ns
47 Byte-Wide Data Setup to CE 1-4, PE 1-4, or
CE1N High During MOVX (read) tDACEH 1tCLK + 40 ns
48 Byte-Wide Data Hold After CE 1-4,
PE 1-4, or CE1N High During MOVX (read) tCEHDV 0n s
49 Byte-Wide Address Valid to R/ W Active
During MOVX (write) tAVRWL 3tCLK - 35 ns
50 Delay from R/ W Low to Valid Data Out
During MOVX (write) tRWLDV 20 ns
51 Valid Data-Out Hold Time from CE 1-4,
PE 1-4, or CE1N High tCEHDV 1tCLK - 15 ns
52 Valid Data-Out Hold Time from R/ W High tRWHDV 0n s
53 Write Pulse Width (R/ W Low Time) tRWLPW 6tCLK - 20 ns
RPC AC CHARACTERISTICS, DBB READ (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
54 CS , A0 Setup to RD tAR 0n s
55 CS , A0 Hold After RD tRA 0n s
56 RD Pulse Width tRR 160 ns
57 CS , A0 to Data-Out Delay tAD 130 ns
58 RD to Data-Out Delay tRD 0 130 ns
59 RD to Data-Float Delay tRDZ 85 ns
RPC AC CHARACTERISTICS, DBB WRITE (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
60 CS , A0 Setup to WR tAW 0n s
61A CS , Hold After WR tWA 0n s 61B A0, Hold After WR tWA 20 ns
62 WR Pulse Width tWW 160 ns
63 Data Setup to WR tDW 130 ns
64 Data Hold After WR tWD 20 ns
AC CHARACTERISTICS, DMA (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
65 DACK to WR or RD tACC 0n s
66 RD or WR to DACK tCAC 0n s
67 DACK to Data Valid tACD 0 130 ns
68 RD or WR to DRQ Cleared tCRQ 110 ns
AC CHARACTERISTICS, PROG (TA = 0°C to +70°C; VCC = 5V ±10%) # PARAMETER SYMBOL MIN MAX UNITS
69 PROG Low to Active tPRA 48 CLKS
70 PROG High to Inactive tPRI 48 CLKS
NOTES: All parameters apply to both commercial and industrial temperature operation unless otherwise noted. 1) All voltages are referenced to ground. 2) Maximum operating I CC is measured with all output pins disconnected; XTAL1 driven with t CLKR, tCLKF = 10ns, VIL = 0.5V; XTAL2 disconnected; RST = PORT0 = VCC, MSEL = VSS. 3) Idle mode, I IDLE, is measured with all output pins disconnected; XTAL1 driven with t CLKR, tCLKF = 10ns, VIL = 0.5V; XTAL2 disconnected; PORT0 = VCC, RST = MSEL = VSS. 4) Stop mode, I STOP, is measured with all output pins disconnected; PORT0 = V CC; XTAL2 not connected; RST = MSEL = XTAL1 = VSS. 5) Pin capacitance is measured with a test frequency: 1MHz, TA = +25°C. 6) ICCO1 is the maximum average operating current that can be drawn from VCCO in normal operation. 7) ILI is the current drawn from VLI input when VCC = 0V and VCCO is disconnected. 8) VCCO2 is measured with VCC < VLI, and a maximum load of 10µA on VCCO. 9) Crystal startup time is the time required to get the mass of the crystal into vibrational motion from the time that power is first applied to the circuit un til the first clock pulse is produced by the on-chip oscillator. The user should check with the crystal vendor for a worst-case specification on this time. 10) This parameter applies to industrial temperature operation. 11) PF pin operation is specified with VBAT /g179 3.0V.
A -3 . 4 0 A1 0.25 - A2 2.55 2.87 B 0.30 0.50 C 0.13 0.23 D 23.70 24.10 D1 19.90 20.10 E 17.70 18.10 E1 13.90 14.10 e 0.80 BSC L 0.65 0.95 56-G4005-001
REVISION HISTORY
The following represent the key differences between 112795 and 073096 version of the DS5001FP data sheet. Please review this summary carefully. 1) Change VCC02 specification from VLI - 0.5 to VLI - 0.65 (PCN F62501). 2) Update mechanical specifications. The following represent the key differences between 073096 and 111996 version of the DS5001FP data sheet. Please review this summary carefully. 1) Change VCC01 from VCC - 0.3 to VCC - 0.35. The following represent the key differences between 111996 and 061297 version of the DS5001FP data sheet. Please review this summary carefully. 1) PF signal moved from VOL2 test specification to VOL1. PCN No. (D72502) 2) AC characteristics for battery-backed SDI pulse specification added. The following represent the key differences between 061297 and 051099 version of the DS5001FP data sheet. Please review this summary carefully. 1) Reduced absolute maximum voltage to VCC + 0.5V. 2) Added note clarifying storage temperature specification is for non-battery-backed state. 3) Changed RRE min (industrial temp range) from 40k/g87 to 30k/g87. 4) Changed VPFW max (industrial temp range) from 4.5V to 4.6V. 5) Added industrial specification for ILI. 6) Reduced tCE1HOV and tCEHDV from 10ns to 0ns. The following represent the key differences between 051099 and 052499 version of the DS5001FP data sheet. Please review this summary carefully. 1) Minor markups and ready for approval.