DS3832C-311 DALLAS | Alldatasheet
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Technical content
FEATURES
/g167 3.0V to 3.6V operation /g167 Surface-mount nonvolatile (NV) RAM ball-grid array (BGA) module construction /g167 1024k x 32 NV SRAM memory space and separate 64 x 8 real-time clock (RTC) memory space /g167 RTC maintains hundredths of seconds, seconds, minutes, hours, day, date, month, and year with leap-year compensation valid up to 2100 /g167 Removable backup power source provides more than eight years of timekeeping and data retention /g167 Read and write access times as fast as 100ns for NV SRAM memory and 200ns for RTC /g167 Automatic data protection during power loss /g167 Unlimited write-cycle endurance /g167 Low-power CMOS operation /g167 Battery monitor checks remaining capacity daily /g167 Industrial temperature range of -40/g176C to +85/g176C PACKAGE OUTLINE
DESCRIPTION
The DS3832C-311 is a 1,048,576 x 32 advanced NV SR AM module with a 168-bump BGA pinout. The highly integrated DS3832C-311 contains a 64-byte RT C, four 8Mb SRAMs, a nd control circuitry that constantly monitors VCC for an out-of-tolerance condition. When such a condition occurs, the DS3832C- 311 makes use of an attached DS3802 battery cap to ma intain clock information and preserve stored data while protecting that data by disallowing all memory accesses. Additionally, the DS3832C-311 has dedicated circuitry for monitoring the status of VCC and the status of an attached DS3802 battery cap. www.maxim-ic.com DS3832C-311 3.3V, 32Mb Advanced NV SRAM with Clock Side View Top View Bottom View Side View
PIN ASSIGNMENT (With Overlaid Package Outline) Figure 1 Because the DS3832C-311 has a total of 168 balls and only 76 active signals, balls are wired together into numbered groups, thus providing redundant connections for every signal. PIN DESCRIPTION A19 to A0 - Address Inputs DQ31 to DQ0 - NV SRAM Data In/Data Out DQC7 to DQC0 - Clock Data In/Data Out CE3 to CE0 - NV SRAM Chip-Enable Inputs CEC - Clock Chip-Enable Input WE3 to WE0 - NV SRAM Write-Enable Inputs WEC - Clock Write-Enable Input OE - NV SRAM Output-Enable Input OEC - Clock Output-Enable Input BW - Battery Warning Output INT - Interrupt Output VCC - Power (3.3V) GND - Ground RSV1 - No Connect VBAT - DS3802 Battery Cap Connection VBAT GND GND VBAT 8020 A15 A17 A13 A18 WE0 A16 A14 A12 DQ7 DQ6 DQ5 RSV2 DQ4 DQ0 DQ1 DQ2 CE2 DQ31 DQ30 DQ29 WE2 DQ28 DQ27 DQ24 DQ26 DQ16 DQ17 DQ23 RSV1 DQ22 DQ21 DQ20 DQ19 DQ25 DQ18 VCC A10 A11 VCC BW CEO CEC WEC WE1 CE1 OEC CE3 WE3 OE GND DQ3 DQC3 DQC4 DQC5 NC DQC6 DQC7 DQC0 DQC2 DQC1 DQ10 DQ9 DQ8 DQ15 DQ14 DQ13 DQ12 DQ11 GND INT RECEPTACLES FOR DS3801 BATTERY CAP PINS A19 RECEPTACLES FOR DS3802 BATTERY CAP PINS DS3832C-311
The DS3832C-311 executes an NV SRAM read cycle whenever WE0 to WE3 (write enables) are inactive (high), any or all of CE0 to CE3 (chip enables) are active (low) and OE (output enable) is active (low). The unique address specified by the 20 address inputs (A 0 to A19) defines which of the 1,048,576 words of data is accessed. The four chip-enable signals ( CE0 to CE3 ) determine which bytes in the addressed word are output on data lines DQ31 to DQ0. Valid data will be output within t ACC (NV SRAM access time) after the last addr ess input signal is stable, providing that CE and OE (output enable) access times are also satisfied. If CE and OE access times are not satisfied, then data access must be measured from the later occurring signal ( CE or OE ) and the limiting parameter is either t CO for CE or tOE for OE rather than tACC. NV SRAM WRITE MODE The DS3832C-311 executes an NV SRAM write cycle whenever any or all of the WE signals ( WE0 to WE3 ) are active (low) and any of the corresponding CE \\ signals ( CE0 to CE3 ) are active (low) after all address inputs are stable. The la ter occurring falling edge of CE or WE determines the start of the write cycle. The write cycle is terminated by the earlier rising edge of CE or WE . All address inputs must be kept valid throughout the write cycle. WE0 to WE3 must return to the high state for a minimum recovery time (t WR) before another cycle can be initiated. The OE control signal should be kept inactive (high) during write cycles to avoid bus contention. However, if output drivers are enabled ( CE and OE active) then WE disables the outputs in tODW from its falling edge. CLOCK READ MODE The DS3832C-311 executes a cloc k read cycle whenever WEC (clock write enable) is inactive (high), CEC (clock chip enable) is active (low), and OEC (output enable) is activ e (low). The unique clock address specified by address inputs A0 to A5 defines which of the 64 bytes of data is accessed. Valid data is output within t ACC (clock access time) after the last address input signal is stable, providing that CEC and OEC (output enable) access times are also satisfied. If CEC and OEC access times are not satisfied, then data access must be measured from the later occurring signal ( CEC or OEC ) and the limiting parameter is either tCO for CEC or tOE for OEC rather than tACC. Only addresses 0 to 3Fh are implemented in the clock address space. Accesses to clock addresses higher than 3Fh are undefined. CLOCK WRITE MODE The DS3832C-311 executes a cloc k write cycle whenever WEC is active (low) and CEC is active (low) after all address inputs are stable. The later occurring falling edge of CEC or WEC determines the start of the write cycle. The write cycle is terminated by the earlier rising edge of CEC or WEC . All address inputs must be kept valid throughout the write cycle. WEC must return to the high state for a minimum recovery time (tWR) before another cycle can be initiated. The OEC control signal should be kept inactive (high) during write cycles to avoid bus contention. However, if output drivers are enabled ( CEC and OEC active) then WEC disables the outputs in tODW from its falling edge.
The DS3832C-311 provides full functional capability for V CC greater than 3.0V and write protects by 2.8V. Data is maintained in the absence of V CC without any additional support circuitry. The DS3832C- 311 constantly monitors V CC. Should the supply voltage decay to V TP, the device automatically write protects itself, all inputs become “don’t care,” and all outputs become high impedance. As V CC falls below approximately 2.8V, a power-s witching circuit electrically c onnects an attached DS3802 battery cap to the SRAM to retain data. During power-up, when V CC rises above approximately 2.8V, the power- switching circuit connects external V CC to the SRAM and disconnects the DS3802 normal RAM operation can resume after VCC reaches the minimum power-supply voltage. BATTERY MONITORING The DS3832C-311 automatically monitors the battery in an attached DS3802 battery cap on a 24-hour time interval. Such monitoring begins within tREC after VCC rises above VTP and is suspended when power failure occurs. After each 24-hour period has elapsed, the ba ttery is connected to an internal 1M /g87 test resistor for one second. During this one second, if ba ttery voltage falls below the battery voltage trip point (2.6V), the battery warning output BW is asserted. Once asserted, BW remains active until the battery cap or DS3802 is replaced. The battery is still retested after each V CC power-up even if BW is active. If the battery voltage is found to be higher than 2.6V during such testing, BW is de-asserted and regular 24-hour testing resumes. BW has an open-drain output driver.
0 0.1 SECONDS 0.01 SECONDS 00 to 99 1 0 10 SECONDS SECONDS 00 to 59 2 0 10 MINUTES MINUTES 00 to 59
3 M 10 MIN ALARM MIN ALARM 00 to 59
HOURS 01 to 12 + A/P or 00 to
5 M 12/24 10 A/P 10
HR ALARM 01 to 12 + A/P or 00 to 6 0 0 0 0 0 DAYS 01 to 07
7 M 0 0 0 0 DAY ALARM 01 to 07
8 INP 0 10 DATE DATE 01 to 31
9 EOSC ESQW 0 10 MO MONTHS 01 to 12
W HI/LO PU/LVL WAM TDM WAF TDF C 0.1 SECONDS 0.01 SECONDS 00 to 99 D 10 SECONDS SECONDS 00 to 99 E COMMAND REGISTER WATCHDOG ALARM REGISTERS USER REGISTERS CLOCK, CALENDAR, TIME-OF-DAY ALARM REGISTERS
TIME-OF-DAY ALARM MASK BITS (Figure 4) REGISTER MINUTES HOURS DAYS ALARM 1 1 1 ALARM ONCE PER MINUTE 0 1 1 ALARM WHEN MINUTES MATCH 0 0 1 ALARM WHEN MINUTES AND HOURS MATCH 0 0 0 ALARM WHEN MINUTES, HOURS, AND DAYS MATCH NOTE: Any other bit combinations produce illogical operation. CLOCK REGISTERS The DS3832C-311 clock has 14 8-bit internal registers that contain all timekeeping, alarm, watchdog, and control information. The clock, calendar, alarm, and watchdog registers are memory locations that contain both external (user-accessible) and internal copies of the data. The external copies are independent of internal functions except that they are updated periodically by simultaneous transfer from the incremented internal copies. The command register bits are affected by both internal and external functions. In addition to the 14 registers, the clock also contains 50 bytes of user RAM. Clock registers 0, 1, 2, 4, 6, 8, 9, and A (hex) contain day, date, and time information stored in binary-code decimal (BCD) format. Registers 3, 5, and 7 contain time-of-day alarm information also stored in BCD format. Register B is the command register containing eight 1-bit binary fields. Registers C and D contain watchdog alarm information stored in BCD format. Addresses E through 3F are general-purpose user RAM. DAY, DATE AND TIME REGISTERS Registers 0, 1, 2, 4, 6, 8, 9, and A (hex) contain day, date, and time information in BCD format. Eleven bits within these eight registers are not used and will always read zero regardless of how they are written. Bits 6 and 7 in the month register (register 9) are binary control bits. When set to logic 0, EOSC (register 9, bit 7) enables the clock oscillator. This bit is normally turned on by the user during device initialization. The oscillator can be turned on and off as needed by enabling or disabling this bit. Register 8 bit 7, INP, controls the logic state of the INTP output pin of the clock device. Because this logic feature is not supported in the DS3832C-311, INP should be set to a logic zero. Register 9 bit 6, ESQW , enables and disables the output of a 1024H z square wave. Because this feature is not supported in the DS3832C-311, ESQW should be set to logic one. Bit 6 of the hour register (register 4) is defined as the 12- or 24-hour sel ect bit. When set to logic one, the 12-hour format is selected. In the 12-hour format, bit 5 is the AM/PM bit with logic 1 being PM. In the 24-hour mode, bit 5 is the upper-order 10-hour bit (set for hours 20 to 23). The external day, date, and time registers are updated from their inte rnal counterparts every 0.01 seconds except when the TE bit (bit 7 of register B) is set low or the clock oscillator is not running ( EOSC high). Setting TE low freezes the external day, date, and time registers at their present values allowing all the registers to be read or written w ithout any of them being updated from the internal registers. After the
registers have been read or writte n, setting TE high re-enables external register updates. While TE is set low and the external registers are frozen, the internal registers continue to be incremented. TIME-OF-DAY ALARM REGISTERS Registers 3, 5, and 7 contain the time-of-day alarm registers. Bits 3, 4, 5, and 6 of register 7 always read zero regardless of how they are written. Bit 7 of registers 3, 5, and 7 are mask bits (see Figure 4). When all of the mask bits are logic 0, a time-of-day alarm only occurs when registers 2, 4, and 6 match the values stored in registers 3, 5, and 7. An alarm is ge nerated every day when bit 7 of register 7 is set to logic 1. Similarly, an alarm is generated every hour wh en registers 7 and 5 both have bit 7 set to logic 1. When registers 7, 5, and 3 all have bit 7 set to logic 1, an alarm occurs every minute at the point where register 1 (seconds) rolls over from 59 to 00. Whenever an alarm occurs, the time-of-day alarm flag TDF (register B, bit 0) and the internal time-of-day interrupt signal goes to the active state. If the interrupt- switch bit IPSW (register B, bit 6) is set to a logic 0 and the time-of-day alarm mask bit TDM (register B, bit 3) is logic 0, the interrupt-output pin INT also activates. Time-of-day alarm registers are written and read in the same format as the day, date, and time registers. The time-of-day alarm flag, time-of-day interrupt, and INT output are always cleared when the time-of- day alarm registers are read or written. WATCHDOG ALARM REGISTERS Registers C and D contain the timeout period for the watchdog alarm. The two registers contain a count from 0.01 to 99.99 seconds in BCD format. The two watc hdog alarm registers can be written or read in any order. After a new value is en tered or either of the watchdog al arm registers is read, an internal watchdog timer starts counting down from the entered watchdog alarm re gister value toward zero. When zero is reached, the watchdog alarm flag (register B, bit 1) and the internal watchdog interrupt signal go to the active state. If the interrupt switch bit IPSW (register B bit 6) is set to logic 1 and the watchdog alarm mask bit WAM (register B, bit 3) is logic 0, the interrupt output INT also activates. The watchdog timer countdown is interrupted and the timer is re-initialized to the value in the watchdog alarm registers every time either watchdog alar m register is accessed. Controlled, pe riodic accesses to the watchdog alarm registers can prevent the activation of the watchdog al arm flag, the internal watchdog interrupt signal and the INT output. The watchdog alarm registers always read the value entered. The actual watchdog timer is internal and is not accessible. Writing 00h to registers C and D disables the watchdog alarm feature. COMMAND REGISTER Register B, the command register, contains control bits and flag bits. The operation of each bit is described below. TE—Transfer Enable (Bit 7). When set to logic 0, this bit disables the transfer of data between internal and external clock registers. The contents of the ex ternal registers are frozen and reads and writes of day, date, and time information are not affected by updates. This bit must be set to logic 1 to enable updates. IPSW—Interrupt Switch (Bit 6). This bit should be initialized to logic 1 to connect the internal watchdog interrupt signal to the INT output pin. Setting this bit to logic 0 connects the internal time-of- day interrupt signal to the INT output pin.
HI/LO— INT Sink or Source Current (Bit 5). When this bit is set to logic 1 and V CC is applied, the INT output pin will source current when activated (see I OH spec). When this bit is set to logic 0, INT sinks current (see IOL spec). PU/LVL— INT Pulse or Level (Bit 4). When this bit is set to logic 0, INT is in the level mode, going to the logic level defined by the HI/LO bit and staying there until the interrupt is cleared. When this bit is set to logic 1, INT is in pulse mode, sourcing or sinking curre nt as defined by the HI/LO bit for a minimum of 3ms and then releasing. WAM—Watchdog Alarm Mask (Bit 3). When this bit is set to logi c 0, the internal watchdog interrupt signal is enabled. If IPSW is also set to logic 1, any watchdog alarm activates the INT output. When this bit is set to logic 1, watchdog alar ms have no effect on the internal watchdog interrupt signal or on the INT pin. TDM—Time-of-Day Alarm Mask (Bit 2). When this bit is set to logic 0, the internal time-of-day interrupt signal is enabled. If IPSW is set to logic 0, any time-of-day alarm activates the INT output. When this bit is set to logic 1, time-of-day alarms have no effect on the internal time-of-day interrupt signal or on the INT pin. WAF—Watchdog Alarm Flag (Bit 1). This bit is set to logic 1 when a watchdog alarm occurs (regardless of the state of the watchdog alarm mask b it WAM). WAF is read-only. This bit is reset when either of the watchdog alarm registers is accessed. When the PU/LVL bit is in the pulse mode, this flag is only set to logic 1 for the 3ms duration of the INT output pulse. TDF—Time-of-Day Alarm Flag (Bit 0). This bit is set to logic 1 when a time-of-day alarm occurs (regardless of the state of the time-of-day alarm mask bit TDM). TDF is read-only. The time the alarm occurred can be determined by reading the time-of-day alarm registers. This bit is reset to logic 0 when any of the time-of-day alarm registers is accessed. When the PU/LVL bit is in the pulse mode, this flag is only set to logic 1 for the 3ms duration of the INT output pulse.
ABSOLUTE MAXIMUM RATINGS* Voltage on Any Pin Relative to Ground -0.3 to +4.6 V Operating Temperature Range -40 /g176C to +85/g176C Storage Temperature Range -40 /g176C to +85/g176C Soldering Temperature See IPC/JEDEC J-STD-020A Specification * This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operation sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods of time may affect reliability. RECOMMENDED DC OPERATING CONDITIONS (TA = -40/g176C to +85/g176C) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Power Supply Voltage V CC 3.0 3.3 3.6 V 1 Logic 1 Input Voltage V IH 2.2 V CC V1 Logic 0 Input Voltage V IL 0 0.6 V 1 DC ELECTRICAL CHARACTERISTICS (TA = -40/g176C to +85/g176C; VCC= 3.3V /g177 0.3V) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Input Leakage Current I IL -5 5 /g109A I/O Leakage Current I IO -1 1 /g109A Output Current at 2.4V I OH -1 mA Output Current at 0.4V I OL 2m A Standby Current (All CE = VIH) ICCS1 57 m A Standby Current (All CE = VCC - 0.3V) ICCS2 25 m A Operating Current (One CE = VIL) ICCO1 50 mA 4 Operating Current (All CE = VIL) ICCO2 200 mA 4 Write Protection Voltage VTP 2.8 2.9 3.0 V CAPACITANCE (TA = +25/g176C) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Input Capacitance: A19 to A0, OE CIN 25 50 pF Input Capacitance: CE3 – CE0 , WE3 – WE0 , CEC , WEC , OEC CIN 51 0p F I/O Capacitance: DQ31–DQ0, DQC7–DQC0 C I/O 51 0p F Output Capacitance: BW , INT COUT 51 0p F
AC ELECTRICAL CHARACTERISTICS (TA = -40/g176C to +85/g176C; VCC= 3.3V /g177 0.3V) NV SRAM CLOCK PARAMETER SYMBOL MIN MAX MIN MAX UNITS NOTES Read Cycle Time t RC 100 200 ns Access Time t ACC 100 200 ns OE to Output Valid tOE 50 70 ns CE to Output Valid tCO 100 200 ns OE or CE to Output Active tCOE 5 5 ns 6 Output High-Z from Deselection tOD 35 50 ns 6 Output Hold from Address Change tOH 55n s Write Cycle Time t WC 100 200 ns CE Pulse Width tCW 100 200 Write Pulse Width t WP 75 150 ns Address Setup Time t AW 00n s Write Recovery Time t WR1 tWR2 ns ns Output High-Z from WE tODW 35 50 ns 6 Output Active from WE tOEW 5 5 ns 6 Data Setup Time t DS 40 100 ns 5 Data Hold Time t DH1 tDH2 ns ns TIMING DIAGRAM: READ CYCLE See Note 2. tRC ADDRESS tACC CEX OEX DOUT tOH tCO tOE tCOE tCOE tOD tOD OUTPUT DATA VALID
TIMING DIAGRAM: WRITE CYCLE 1 (WE) See Notes 3, 5, 7, 8, 9, and 12. TIMING DIAGRAM: WRITE CYCLE 2 (CE) See Notes 3, 5, 7, 8, 9, and 13. tWC tWR2tAW tDS tDH2 tCOE tODW tCW ADDRESS CEX WEX DIN DOUT tWC tWR1 tAW tOEW tDS INPUT DATA STABLE INPUT DATA STABLE tDH1 tODW tWP ADDRESS CEX WEX DIN DOUT tCW tWP
POWER-DOWN/POWER-UP CONDITION See Note 11. TIMING DIAGRAM: BATTERY WARNING DETECTION See Note 14. VCC VTP 2.7V tF tR tREC tPD tPU tDR CEX, WEX BACKUP CURRENT SUPPLIED FROM LITHIUM BATTERY SLEWS WITH VCC tBPU BW\\ SLEWS WITH VCC BATTERY TEST ACTIVE BW VCC VBAT tBPU 2.6V tBTC tBTPW tBW
POWER-DOWN/POWER-UP TIMING (TA = -40/g176C to +85/g176C) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES VCC Fail Detect to CE and WE\\ Inactive tPD 0 /g109s 11 VCC Slew from VTP to 0V t F 300 /g109s VCC Slew from 0V to VTP tR 300 /g109s VCC Valid to CE and WE Inactive tPU 2m s VCC Valid to End of Write Protection tREC 125 ms VCC Valid to BW Valid t BPU 1s 1 4 INT Pulse Width (PU/LVL Bit High) tIPW 3m s 1 5 BATTERY WARNING TIMING (TA = -40/g176C to +85/g176C; VCC = 3.3V /g177 0.3V) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Battery Test Cycle t BTC 24 hr Battery Test Pulse Width t BTPW 1s Battery Test to BW Active tBW 1s (TA = +25/g176C) PARAMETER SYMBOL MIN TYP MAX UNITS NOTES Expected Data Retention Time tDR 8 years 10 WARNING: Under no circumstances are negative undershoots, of any amplitude, allowed when this device is in battery backup mode.
NOTES: 1) All voltages referenced to ground. 2) WE is high throughout read cycle. 3) OE = VIH or VIL. If OE = VIH during write cycle, the output buffers remain in a high-impedance state. 4) All outputs open-circuited. 5) tDS is measured from the earlier of CE or WE going high. 6) These parameters are sampled with a 5pF load and are not 100% tested. 7) If the CE low transition occurs simultaneously with, or later than, the WE low transition, the output buffers remain in a high-impedance state during this period. 8) If the CE high transition occurs prior to, or simultaneously with, the WE high transition, the output buffers remain in a high-impedance state during this period. 9) If WE is low or the WE low transition occurs prior to, or simultaneously with, the CE low transition, the output buffers remain in a high-impedance state during this period. 10) Expected data retention time can be extended indefinitely if the DS3802 battery cap is periodically replaced. 11) In a power-down condition, the voltage on any pin may not exceed the voltage on VCC. 12) tWR1, tDH1 are measured from WE going high. 13) tWR2, tDH2 are measured from CE going high. 14) BW is an open-drain output and cannot source current. An external pullup resistor should be connected to this pin for proper operation. This pin sinks 10mA. 15) INT activates within 100ns after the alarm condition arises. DC TEST CONDITIONS AC TEST CONDITIONS Outputs Open Output load: 100pF + 1 TTL gate All voltages are referenced to ground Input pulse levels: 0V to 2.7V Timing measurement reference levels Input: 1.5V Output: 1.5V Input pulse rise and fall times: 5ns
DS3832C-311 PACKAGE DIMENSIONS DIM MIN MAX Ai n mm 1.720 43.69 1.730 43.94 Bi n mm 1.720 43.69 1.730 43.94 Ci n mm 0.108 2.74 0.118 3.00 Di n mm 1.497 38.02 1.503 38.18 Ei n mm 0.047 1.19 0.053 1.35 Fi n mm 0.108 2.74 0.118 3.00 Gi n mm 0.047 1.19 0.053 1.35 Hi n mm 0.305 7.74 0.320 8.13 Ii n mm 0.125 3.10 0.135 3.43 Ji n mm .135 3.43 Ki n mm 0.025 0.64 0.032 0.76
DS3832C-311 PACKAGE DIMENSIONS (With Attached DS3802 Battery Cap) DIM MIN MAX Ai n mm 1.830 45.046 Bi n mm 1.830 45.046 Ci n mm 0.435 10.708 Di n mm 0.0390 0.9600 A B C D
DS3832C-311 RECOMMENDED LAND PATTERN (With Overlaid Package Outline) The DS3832C-311 ball grid array is a subset of the industry-standard 40mm BGA format, with all balls on a 50mil grid. Corner balls have been removed to provide space for the electrical and mechanical interface features that facilitate attachment of the DS3802 battery cap 75 74 73 72 71 70 69 6867 66 65 64 63 62 61 60777679 7880 20 22 23 24 25 26 27 28 29 3031 32 33 34 3738 39 4021 3635 0.113 0.050 TYP 0.150 V-BAT TEST PADS
0.027 DIA
1.725 sq. I/O PADS
0.27 DIA
0.050 TYP 0.413 0.150 0.113 1.500