CX4HGSM STATEK | Alldatasheet

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STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com SYSTEM CERTIFICATION ISO 9001

DESCRIPTION

Intended for applications requiring shock survivability up to 100,000 g, Statek’s surface-mount CX4HGSM crystals are high-shock versions of the CX4SM crystals.

FEATURES

High shock and vibration resistance Designed for surface mount applications using infrared, vapor phase, or epoxy mount techniques. Low profile (less than 1.2 mm) hermetically sealed ceramic package Available with glass or ceramic lid Custom designs available Full military testing available Designed and manufactured in the USA

APPLICATIONS

Industrial & Communications Down-hole Data Recorder Process Control Environmental Control Engine Control Telemetry Ruggedized Instrumentation Automotive Control Military & Aerospace Smart Munitions Timing Devices (Fuzes) Surveillance Devices Missile Telemetry Ruggedized Communications Aviation Equipment CX4HGSM AT CRYSTAL

14 MHz to 50 MHz

High Shock, Ultra-Miniature, Low Profile Surface Mount AT Quartz Crystal TYPICAL MAXIMUM DIM inches mm inches mm A 0.197 5.00 0.210 5.33 B 0.072 1.83 0.085 2.16 C— — see below D 0.036 0.91 0.046 1.16 E 0.020 0.51 — — F 0.025 0.64 — — THICKNESS (DIM C) MAXIMUM GLASS LID CERAMIC LID inches mm inches mm SM1 0.045 1.14 0.050 1.27 SM2/SM4 0.046 1.17 0.051 1.30 SM3/SM5 0.048 1.22 0.053 1.35

10165 Rev B

A B F D D TOP BOTTOM C E PACKAGE DIMENSIONS SXXXX actual size side view Pb glass lid ceramic lid

HOW TO ORDER CX4HGSM AT CRYSTALS STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256 www.statek.com SYSTEM CERTIFICATION ISO 9001 CX4 S HG1 C SM1 – 32.0M , 100 / 100 / — / I C1 R1 21 L1 EQUIVALENT CIRCUIT R1 Motional Resistance L1 Motional Inductance C1 Motional Capacitance C0 Shunt Capacitance TERMINATIONS Designation Termination SM1 Gold Plated (Lead Free) SM2 Solder Plated SM3 Solder Dipped SM4 Solder Plated (Lead Free) SM5 Solder Dipped (Lead Free) Max Process Temperature 260 OC for 20 sec “S” if special or custom design. Blank if standard Shock Level HG1 = 10,000 g HG2 = 20,000 g HG3 = 30,000 g HG4 = 50,000 g HG5 = 75,000 g HG6 = 100,000 g C = Ceramic Lid Blank = Glass Lid Termination SM1 = Gold Plated SM2 = Solder Plated SM3 = Solder Dipped SM4 = Solder Plated (Lead Free) SM5 = Solder Dipped (Lead Free) Frequency M = MHz Calibration Tolerance @25OC (in ppm) Frequency Stability over Temp. Range Operating Temp. Range: C= -10OC to +70OC I = -40OC to +85OC M= -55OC to +125OC S= Customer Specified Total Frequency Tolerance (in ppm) Operating Temp. Range: C= -10OC to +70OC I = -40OC to +85OC M= -55OC to +125OC S= Customer Specified OR PACKAGING OPTIONS

  • Tray Pack
  • Tape and Reel Per EIA 481 (see Tape and Reel data sheet 10109) Pb 0.092 (2.3) inches (mm) 0.059 (1.5) 0.160 (4.0) SUGGESTED LAND PATTERN SPECIFICATIONS Specifications are typical at 25OC unless otherwise noted. Specifications are subject to change without notice. Fundamental Frequency 14.7456 MHz 16MHz 20 MHz 32 MHz 40 MHz Motional Resistance R1 (Ω )6 0 7 5 5 0 3 0 3 0 Quality Factor Q (k) 120 90 110 70 90 Shunt Capacitance C Frequency Range1 14 MHz to 50 MHz Calibration Tolerance2 100 ppm, or tighter as required Load Capacitance 10 pF (unless specified otherwise) Drive Level 200 µW MAX Frequency-Temperature 50 ppm to 10 ppm (Commercial) Stability2,3 100 ppm to 20 ppm (Industrial) 100 ppm to 30 ppm (Military) Aging, first year4 10 ppm MAX Shock, survival Up to 100,000 g, 0.5 ms, 1/2 sine Vibration, survival5 20 g, 10-2,000 Hz swept sine Operating Temp. Range -10 OC to +70OC (Commercial) -40OC to +85OC (Industrial) -55OC to +125OC (Military) Storage Temp. Range -55 OC to +125OC Max Process Temperature 260 OC for 20 sec 1. Other frequencies available. Contact factory. 2. Other tolerances available. Contact factory. 3. Does not include calibration tolerance. The characteristics of the frequency stability over temperature follow that of the AT thickness-shear mode. 4. Lower aging available at low shock levels. 5. Per MIL-STD-202G, Method 204D, Condition D. Random vibration testing also available. +_+_ +_+_ +_+_ —/ — / 200 / I