DATASHEET SEARCH SITE | WWW.ALLDATASHEET.COM

Document overview

  • Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
  • PDF pages: 3

Technical content

SPECIFICATION (Reference sheet)

  • Supplier : Samsung electro-mechanics · Samsung P/N: CL21A226MAQNNNE
  • Product : Multi-layer Ceramic Capacitor · Description : CAP, 22uF, 25V, ±20%, X5R, 0805 CL 21 A 226 M A Q N N N E ① ②③ ④ ⑤ ⑥ ⑦⑧⑨⑩⑪ ① Series Samsung Multi-layer Ceramic Capacitor ② Size 0805 (inch code) L: 2.00 ± 0.15 ㎜ W: 1.25 ± 0.15 ㎜ ③ Dielectric X5R ⑧ Inner electrode ④ Capacitance 22 Termination ⑤ Capacitance ±20 % Plating (Pb Free) tolerance ⑨ Product Normal ⑥ Rated Voltage 25 V ⑩ Special Reserved for future use ⑦ Thickness 1.25 ± 0.15 ㎜ ⑪ Packaging Embossed Type, 7" reel B. Structure & Dimension A. Samsung Part Number Ni uF Sn 100% Samsung P/N Dimension(㎜) WLT B W Cu

C. Samsung Reliablility Test and Judgement Condition Capacitance Within specified tolerance Tan δ (DF) 0.1 max. Insulation 10,000Mohm or 100Mohm×㎌ Rated Voltage 60~120 sec. Resistance Whichever is smaller Appearance No abnormal exterior appearance Microscope (×10) Withstanding No dielectric breakdown or of the rated voltage Voltage mechanical breakdown Temperature X5R Characteristics (From-55℃ to 85℃, Capacitance change should be within ±15%) Adhesive Strength No peeling shall be occur on the 500g·f, for 10±1 sec. of Termination terminal electrode Bending Strength Capacitance change : within ±12.5% Bending to the limit (1㎜) with 1.0mm/sec. Solderability More than 75% of terminal surface SnAg3.0Cu0.5 solder is to be soldered newly 245±5℃, 3±0.3sec. (preheating : 80~120℃ for 10~30sec.) Resistance to Capacitance change : within ±7.5% Solder pot : 270±5℃, 10±1sec. Soldering Heat Tan δ, IR : initial spec. Vibration Test Capacitance change : within ± 5% Amplitude : 1.5mm Tan δ, IR : initial spec. From 10㎐ to 55㎐ (return : 1min.) 2hours × 3 direction (x, y, z) Moisture Capacitance change : within ±12.5% With rated voltage Resistance Tan δ : 0.2 max 40±2℃, 90~95%RH, 500+12/-0hrs IR : 500Mohm or 12.5Mohm × ㎌ Whichever is smaller High Temperature Capacitance change : within ±12.5% With of the rated voltage Resistance Tan δ : 0.2 max Max. operating temperature IR : 1,000Mohm or 25Mohm × ㎌ 1000+48/-0hrs Whichever is smaller Temperature Capacitance change : within ±7.5% 1 cycle condition Cycling Tan δ, IR : initial spec. Min. operating temperature → 25℃ → Max. operating temperature → 25℃ 5 cycle test ※ The reliability test condition can be replaced by the corresponding accelerated test condition. D. Recommended Soldering method : Reflow ( Reflow Peak Temperature : 260+0/-5℃, 10sec. Max ) Product specifications included in the specifications are effective as of March 1, 2013. Please be advised that they are standard product specifications for reference only. We may change, modify or discontinue the product specifications without notice at any time. So, you need to approve the product specifications before placing an order. Should you have any question regarding the product specifications, please contact our sales personnel or application engineers. 250% 100% Judgement Test condition *A capacitor prior to measuring the capacitance is heat treated at 150℃+0/-10℃ for 1 hour and maintained in ambient air for 24±2 hours.

  • Disclaimer & Limitation of Use and Application - The products listed in this Specification sheet are NOT designed and manufactured for any use and applications set forth below. Please note that any misuse of the products deviating from products specifications or information provided in this Spec sheet may cause serious property damages or personal injury. We will NOT be liable for any damages resulting from any misuse of the p roducts, specifically including using the products for high reliability applications as listed below. If you have any questions regarding this 'Limitation of Use and Application', you should first contact our sales personnel or application engineers. ① Aerospace/Aviation equipment ② Automotive or Transportation equipment (vehicles, trains, ships, etc) ③ Medical equipment ④ Military equipment ⑤ Disaster prevention/crime prevention equipment ⑥ Any other applications with the same as or similar complexity or reliability to the applications set forth above.
  • Derating
  • Disclaimer & Limitation of Use and Application The products listed in this Specification sheet are NOT designed and manufactured for any use and applications set forth below. Please note that any misuse of the products deviating from products specifications or information provided in this Spec sheet may cause serious property damages or personal injury. We will NOT be liable for any damages resulting from any misuse of the products, specifically including using the products for high reliability applications as listed below. If you have any questions regarding this 'Limitation of Use and Application', you should first contact our sales personnel or application engineers. ① Aerospace/Aviation equipment ② Automotive or Transportation equipment (vehicles, trains, ships, etc) ③ Medical equipment ④ Military equipment ⑤ Disaster prevention/crime prevention equipment ⑥ Any other applications with the same as or similar complexity or reliability to the applications set forth above. 20% 40% 60% 80% 100% 0 10 20 30 40 50 60 70 80 90 100 Voltage Derating Ratio Temperature of MLCC (℃) [ Derated Voltage ] ※ 𝑉𝑜𝑙𝑡𝑎𝑔𝑒 𝐷𝑒𝑟𝑎𝑡𝑖𝑛𝑔 𝑅𝑎𝑡𝑖𝑜 = 𝑂𝑝𝑒𝑟𝑎𝑡𝑖𝑛𝑔 𝑀𝑎𝑥. 𝑉𝑜𝑙𝑡𝑎𝑔𝑒 𝑅𝑎𝑡𝑒𝑑 𝑉𝑜𝑙𝑡𝑎𝑔𝑒 X5R This product ,which guarantees High Temperature Reliability Test with 100% of rated voltage at the maximum temperature, is recommended to be used in the circuit with derated voltage compared to the rated voltage of the capacitor for long lifetime. Max. voltage(VMax) and DC voltage(VDC) applied to this product shown in the table below are recommended to be used under the following conditions for long lifetime, respectively. [Recommendations for long lifetime]
  • VMax ≤ (Derated Voltage on the left graph)
  • VDC ≤ 70% × (Derated Voltage on the left graph) [Types of voltage applied to the capacitor] * Temperature of MLCC : Surface temperature of MLCC in the circuit.