BSP296 SIEMENS | Alldatasheet

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Semiconductor Group 1 Sep-12-1996 BSP 296 SIPMOS ® Small-Signal Transistor

  • N channel
  • Enhancement mode
  • Logic Level Pin 1 Pin 2 Pin 3 Pin 4 G D S D Type VDS ID R DS(on) Package Marking BSP 296 100 V 1 A 0.8 Ω SOT-223 BSP 296 Type Ordering Code Tape and Reel Information BSP 296 Q67000-S067 E6327 Maximum Ratings Parameter Symbol Values Unit Drain source voltage VDS 100 V Drain-gate voltage R GS = 20 kΩ VDGR 100 Gate source voltage VGS ± 14 Gate-source peak voltage,aperiodic Vgs ± 20 Continuous drain current TA = 42 °C ID A DC drain current, pulsed TA = 25 °C IDpuls Power dissipation TA = 25 °C Ptot 1.8 W

Semiconductor Group 2 Sep-12-1996 BSP 296 Maximum Ratings Parameter Symbol Values Unit Chip or operating temperature Tj -55 ... + 150°C Storage temperature Tstg -55 ... + 150 Thermal resistance, chip to ambient air R thJA ≤ 70 K/W Therminal resistance, junction-soldering point 1) R thJS ≤ 10 DIN humidity category, DIN 40 040 E IEC climatic category, DIN IEC 68-1 55 / 150 / 56 1) Transistor on epoxy pcb 40 mm x 40 mm x 1,5 mm with 6 cm2 copper area for drain connection Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol Values Unit min. typ. max. Static Characteristics Drain- source breakdown voltage VGS = 0 V, ID = 0.25 mA, Tj = 25 °C V(BR)DSS 100 - - V Gate threshold voltage VGS =VDS, ID = 1 mA VGS(th) 0.8 1.4 2 Zero gate voltage drain current VDS = 100 V, VGS = 0 V, Tj = 25 °C VDS = 100 V, VGS = 0 V, Tj = 125 °C VDS = 60 V, VGS = 0 V, Tj = 25 °C IDSS 0.1 100 1 µA nA Gate-source leakage current VGS = 20 V, VDS = 0 V IGSS - 10 100 nA Drain-Source on-state resistance VGS = 10 V, ID = 1 A VGS = 4.5 V, ID = 1 A R DS(on) 0.95 0.55 1.4 0.8 Ω

Semiconductor Group 3 Sep-12-1996 BSP 296 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol Values Unit min. typ. max. Dynamic Characteristics Transconductance VDS ≥ 2 * ID * RDS(on)max, ID = 1 A gfs 0.5 1.3 - S Input capacitance VGS = 0 V, VDS = 25 V, f = 1 MHz C iss - 300 400 pF Output capacitance VGS = 0 V, VDS = 25 V, f = 1 MHz C oss - 60 90 Reverse transfer capacitance VGS = 0 V, VDS = 25 V, f = 1 MHz C rss - 30 45 Turn-on delay time VDD = 30 V, VGS = 10 V, ID = 0.29 A R GS = 50 Ω td(on) - 8 1 2 ns Rise time VDD = 30 V, VGS = 10 V, ID = 0.29 A R GS = 50 Ω tr - 15 25 Turn-off delay time VDD = 30 V, VGS = 10 V, ID = 0.29 A R GS = 50 Ω td(off) - 120 160 Fall time VDD = 30 V, VGS = 10 V, ID = 0.29 A R GS = 50 Ω tf - 65 85

Semiconductor Group 4 Sep-12-1996 BSP 296 Electrical Characteristics, at Tj = 25°C, unless otherwise specified Parameter Symbol Values Unit min. typ. max. Reverse Diode Inverse diode continuous forward current TA = 25 °C IS - - 1 A Inverse diode direct current,pulsed TA = 25 °C ISM - - 4 Inverse diode forward voltage VGS = 0 V, IF = 2 A, Tj = 25 °C VSD - 0.95 1.3 V

Semiconductor Group 5 Sep-12-1996 BSP 296 Power dissipation Ptot = ƒ(TA) 0 20 40 60 80 100 120 °C 160 TA 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 W 2.0 Ptot Drain current ID = ƒ(TA) parameter: VGS ≥ 10 V 0 20 40 60 80 100 120 °C 160 TA 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 A 1.1 ID Safe operating area ID =f(VDS ) parameter : D = 0, TC =25°C Transient thermal impedance Zth JA = ƒ(tp) parameter: D = tp / T -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 10 K/W ZthJC 10 -8 10 -7 10 -6 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 s tp single pulse 0.01 0.02 0.05 0.10 0.20 D = 0.50

Semiconductor Group 6 Sep-12-1996 BSP 296 Typ. output characteristics ID = ƒ(VDS ) parameter: tp = 80 µs , Tj = 25 °C VDS 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 A 2.4 ID VGS [V] a a 2.0 b b 2.5 c c 3.0 d d 3.5 e e 4.0 f f 4.5 g g 5.0 h h 6.0 i i 7.0 j j 8.0 k k 9.0 l P tot = 2W l 10.0 Typ. drain-source on-resistance R DS (on) = ƒ(ID ) parameter: tp = 80 µs, Tj = 25 °C ID 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2 Ω 2.6 R DS (on) VGS [V] = a 2.0 VGS [V] = a a 2.5 b b 3.0 c c 3.5 d d 4.0 e e 4.5 f f 5.0 g g 6.0 h h 7.0 i i 8.0 j j 9.0 k k 10.0 Typ. transfer characteristics ID = f(VGS ) parameter: tp = 80 µs 0 1 2 3 4 5 6 7 8 V 10 V GS 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 A 4.5 ID Typ. forward transconductance gfs = f (ID ) parameter: tp = 80 µs, ID 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 S 2.0 gfs

7 Sep-12-1996Semiconductor Group

Drain-source on-resistance R DS (on) = ƒ(Tj) parameter: ID = 1 A, VGS = 10 V -60 -20 20 60 100 °C 160 Tj 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 Ω 2.0 R DS (on) typ 98% Gate threshold voltage VGS (th) = ƒ(Tj) parameter: VGS = VDS , ID = 1 mA 0.0 0.4 0.8 1.2 1.6 2.0 2.4 2.8 3.2 3.6 4.0 V 4.6 V GS(th) -60 -20 20 60 100 °C 160 Tj typ 98% Typ. capacitances C = f (VDS ) parameter:VGS =0V, f = 1 MHz 0 5 10 15 20 25 30 V 40 V DS 0 10 1 10 2 10 3 10 pF C C rss C oss C iss Forward characteristics of reverse diode IF = ƒ(VSD ) parameter: Tj, tp = 80 µs -2 10 -1 10 0 10 1 10 A IF VSD Tj = 25 °C typ Tj = 25 °C (98%) Tj = 150 °C typ Tj = 150 °C (98%)

Semiconductor Group 8 Sep-12-1996 BSP 296 Drain-source breakdown voltage V(BR)DSS = ƒ(Tj) -60 -20 20 60 100 °C 160 Tj 100 102 104 106 108 110 112 114 116 V 120 V(BR)DSS Safe operating area ID =f(VDS ) parameter : D = 0.01, TC =25°C

Semiconductor Group 9 Sep-12-1996 BSP 296 Package outlines SOT-223 Dimensions in mm