ATBTLC1000 ATMEL | Alldatasheet
Document overview
- Manufacturer or author: Provided By ALLDATASHEET.COM(FREE DATASHEET DOWNLOAD SITE)
- PDF pages: 52
Technical content
Features
Complies with Bluetooth V4.1, ETSI EN 300 328 and EN 300 440 Class 2, FCC CFR47 Part 15 and ARIB STD-T66 2.4GHz transceiver and modem – -95dBm/-93dBm programmable receiver sensitivity – -20 to +3.5dBm programmable TX output power – Integrated T/R switch – Single wire antenna connection ARM® Cortex®-M0 32-bit processor – Single wire Debug (SWD) interface – Four-channel DMA controller – Brownout detector and Power On Reset – Watch Dog Timer Memory – 128kB embedded RAM (96kB available for application) – 128kB embedded ROM Hardware Security Accelerators – AES-128 – SHA-256 Peripherals – 10 digital and one wakeup GPIOs with 96kΩ internal pull-up resistors, one Mixed Signal GPIO – 2x SPI Master/Slave – 2x I2C Master/Slave and 1x I2C Slave – 2x UART – 1x SPI Flash – Three-Axis quadrature decoder – 4x Pulse Width Modulation (PWM), three General Purpose Timers, and one Wakeup Timer Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 – 1-channel 11-bit ADC Clock – Integrated 26MHz RC oscillator – 26MHz crystal oscillator – Integrated 2MHz sleep RC oscillator – 32.768kHz RTC crystal oscillator Ultra-low power – 1.1µA sleep current (8KB RAM retention and RTC running) – 3.0mA peak TX current (0dBm, 3.6V) – 4.0mA peak RX current (3.6V, -93dBm sensitivity) – 9.7µA average advertisement current (three channels, 1s interval) Integrated Power management – 1.8 to 4.3V battery voltage range – Fully integrated Buck DC/DC converter Bluetooth SIG Certification – QD ID Controller (see declaration D028678) – QD ID Host (see declaration D028679)
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Table of Contents
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
1 Ordering Information
Ordering code Package Description ATBTLC1000A-UU-T 31L WLCSP ATBTLC1000 Tape and Reel
2 Package Information
Table 2-1. ATBTLC1000 31L WLCSP Package Information Parameter Value Tolerance Units Package size 2.262 × 2.142 ±0.03 mm Total thickness 0.502 ±0.039 I/O pitch 0.35 Ball diameter 0.2 ±0.03 Ball count 31
3 Block Diagram
Figure 3-1. ATBTLC1000 Block Diagram
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
4 Pinout Information
The ATBTLC1000 is offered in a 0.35mm-pitch staggered SAC405 balls 31L WLCSP package. The WLCSP package pin assignment is shown in Figure 4-1. The color shading is used to indicate the pin type as follows: Red – analog Green – digital I/O (switchable power domain) Blue – digital I/O (always-on power domain) Yellow – digital power, purple – PMU Green/red – configurable mixed-signal GPIO (digital/analog) The ATBTLC1000 pins are described in Table 4-1. Figure 4-1. ATBTLC1000 WLCSP Pin Assignment
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Table 4-1. ATBTLC1000 WLCSP Pin Description Pin # Pin Name Pin Type Description / Default Function A2 VDDIO Digital Power I/O Supply, can be less than or equal to VBATT_BUCK A4 XO_P Analog/RF XO Crystal + A6 VDD_VCO & VDD_SXDIG Analog/RF Synthesizer VCO and Digital Supplies 1.2V B1 AO_GPIO_0 Digital I/O Always-on External Wakeup B3 VDDIO_SWITCH Digital Power I/O supply switch for external flash B5 XO_N Analog/RF XO Crystal - B7 RFIO Analog/RF RX input and TX output C2 RTC_CLK_P PMU RTC terminal + / 32.768kHz XTAL + C4 TPP Analog/RF Test MUX + output C6 VDD_RF Analog/RF RF Supply 1.2V D1 RTC_CLK_N PMU RTC terminal – / 32.768kHz XTAL - D3 LP_GPIO_13 Digital I/O SPI MISO/SPI FLASH RXD D5 LP_GPIO_0 Digital I/O SWD Clock D7 RFGND Analog/RF RF Ground E2 CHIP_EN PMU Master Enable for chip E4 VSS Digital Power Digital I/O and Core Ground E6 VDD_AMS Analog/RF AMS Supply 1.2V F1 LP_LDO_OUT_1P2 PMU Low Power LDO output (connect to 1µF decoupling cap) F3 GPIO_MS1 Mixed Signal I/O Configurable to be a GPIO Mixed Signal only (ADC inter- face) F5 LP_GPIO_11 Digital I/O SPI MOSI/SPI FLASH TXD F7 LP_GPIO_1 Digital I/O SWD I/O G2 VBATT_BUCK PMU DC/DC Converter Supply and General Battery Connection G4 LP_GPIO_12 Digital I/O SPI SSN/SPI FLASH SSN G6 LP_GPIO_2 Digital I/O UART RXD H1 VDDC_PD4 PMU DC/DC Converter 1.2V output and feedback node H3 GND_BUCK PMU DC/DC Converter Ground H5 LP_GPIO_9 Digital I/O I2C SCL (high-drive pad, see Table 13-3) H7 LP_GPIO_3 Digital I/O UART TXD J2 VSW PMU DC/DC Converter Switching Node J4 LP_GPIO_10 Digital I/O SPI SCK/SPI FLASH SCK J6 LP_GPIO_8 Digital I/O I2C SDA (high-drive pad, see Table 13-3)
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
5 Package Drawing
The ATBTLC1000 WLCSP package is RoHS/green compliant. Figure 5-1. ATBTLC1000 31L WLCSP Package Outline Drawing
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
6 Power Management
6.1 Power Architecture
ATBTLC1000 uses an innovative power architecture to eliminate the need for external re gulators and reduce the number of off-chip components. The integrated power management block includes a DC/DC buck converter and separate Low Drop out (LDO) regulators for different power domains. The DC/DC buck converter converts battery voltage to a lower internal voltage for the different circuit blocks and does this with high efficiency. The DC /DC requires three external components for proper operation (two inductors L 4.7µH and 9.1nH, and one capacitor C 4.7µF). Figure 6-1. ATBTLC1000 Power Architecture VBATT_BUCK Off-Chip LC RF/AMS Core Sleep Osc RF/AMS Core Voltage VSW VDDC_PD4 VDD_AMS, VDD_RF, VDD_SXDIG VDD_VCO LDO2 1.0V CHIP_EN SX Digital Core DC/DC Converter eFuse PMU RF/AMS Digital Dig Core LDO 2.5V Pads VDDIO LP LDO Digital Core Voltage dcdc_ena ena Vin Vout enaena EFuse LDO
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
6.2 DC/DC Converter
The DC/DC Converter is intended to supply current to the BLE digital core and the RF transceiver core. The DC/DC consists of a power switch, 26MHz RC oscillator, controller, external inductor, and external capacitor. The DC/DC is utilizing pulse skipping discontinuous mode as its control scheme . The DC/DC specifications are shown in the following tables and figures. Table 6-1. DC/DC Converter Specifications (Performance is Guaranteed for (L) 4.7µH and (C) 4.7µF Parameter Symbol Min. Typ. Max. Unit Note Output current capability IREG 0 10 30 mA Dependent on external component values and DC/DC settings with acceptable effi- ciency External capacitor range CEXT 4.7 -10% 4.7 20 µF External capacitance range External inductor range LEXT 2.2 -10% 4.7 4.7 +10% µH External inductance range Battery voltage VBAT 2.35 3 4.3 V Functionality and stability given Output voltage range VREG 1.05 1.2 1.47 25mV step size Current consumption IDD 125 µA DC/DC quiescent current Startup time tstartup 50 600 µs Dependent on external component values and DC/DC settings Voltage ripple ΔVREG 5 10 30 mV Dependent on external component values and DC/DC settings Efficiency η 85 % Measured at 3V VBAT, at load of 10mA Overshoot at startup VOS 0 mV No overshoot, no output pre-charge Line Regulation ΔVREG 10 From 1.8 to 4.3V Load regulation ΔVREG 5 From 0 to 10mA Table 6-2. DC/DC Converter Allowable Onboard Inductor and Capacitor Values (VBAT = 3V) Inductor [µH] Efficiency [%] Vripple [mV] RX Sensitivity (1) [dBm] C=2.2µF C=4.7µF C=10µF 2.2 83 N/A <5 <5 ~1.5 dB degrade 4.7 85 9 5 <5 ~0.7 dB degrade Note: 1. Degradation relative to design powered by external LDO and DC/DC disabled.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 6-2. DC/DC Converter Efficiency
6.3 Power Consumption
6.3.1 Description of Device States
ATBTLC1000 has multiple device states, depending on the state of the ARM processor and BLE subsystem. Note: The ARM is required to be powered on if the BLE subsystem is active. BLE_On_Transmit – Device is actively transmitting a BLE signal (Application may or may not be active) BLE_On_Receive – Device is actively receiving a BLE signal (Application may or may not be active) MCU_Only – Device has ARM processor powered on and BLE subsystem powered down Ultra_Low_Power – BLE is powered down and Application is powered down (with or without RAM retention) Power_Down – Device core supply off 70.0 75.0 80.0 85.0 90.0 95.0 Efficeincy (%) Battery Voltage (V) Efficiency vs. Battery Voltage 77.0 78.0 79.0 80.0 81.0 82.0 83.0 84.0 85.0 86.0 3 4 5 6 7 8 9 10 11 12 13 14 15 Efficeincy (%) Load Current (mA) Efficiency vs. Load Current
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
6.3.2 Controlling the Device States
The following pins are used to switch between the main device states: CHIP_EN – used to enable PMU VDDIO – I/O supply voltage from external supply In Power_Down state, VDDIO is on and CHIP_EN is low (at GND level). To switch between Pow er_Down state and MCU_Only state CHIP_EN has to change between low and high (VDDIO voltage level). Once the device is MCU_Only state, all other state transitions are controlled entirely by software. When VDDIO is off and CHIP_EN is low, the chip is powered off with no leakage. When no power is supplied to the device (the DC/DC Converter output and VDDIO are both off and at ground potential), a voltage cannot be applied to the ATBTLC1000 pins because each pin contains an ESD diode from the pin to supply. This diode will turn on when voltage higher than one diode-drop is supplied to the pin. If a voltage must be applied to the signal pads while the chip is in a low power state, the VDDIO supply must be on, so the Power_Down state must be used. Similarly, to prevent the pin-to-ground diode from turning on, do not apply a voltage that is more than one diode-drop below ground to any pin.
6.3.3 Current Consumption in Various Device States
Table 6-3. ATBTLC1000 Device Current Consumption at VBAT = 3.6V Device state CHIP_EN VDDIO IVBAT (typical) (note 3) IVDDIO (typical) (note 3) Remark Power_Down Off On <50nA <50nA Ultra_Low_Power Standby On On 900nA 50nA Ultra_Low_Power with 8KB retention, BLE timer, no RTC (1) On On 1.1µA 0.2µA Ultra_Low_Power with 8KB retention, BLE timer, with RTC (2) On On 1.25µA 0.1uA MCU_Only, idle (waiting for interrupt) On On .85mA 0.2µA BLE_On_Receive@-95dBm On On 4.2mA 0.2µA BLE_On_Transmit, 0dBm output power On On 3.0mA 0.2µA BLE_On_Transmit, 3.5dBm output power On On 4.0mA 0.2µA Notes: 1. Sleep clock derived from internal 32kHz RC oscillator. 2. Sleep clock derived from external 32.768kHz crystal specified for CL = 7pF, using the default on-chip capacitance only, without using external capacitance. 3. Expected values for production silicon.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 6-3. ATBTLC1000 Average Advertising Current Notes: 1. The Average advertising current is measured at VBAT = 3.6V, TX POUT=0dBm.
6.4 Power Sequences
The power sequences for ATBTLC1000 is shown in Figure 6-4. The timing parameters are provided in Table 6-4. Figure 6-4. ATBTLC1000 Power Sequences VBATT VDDIO CHIP_EN tA t B XO Clock tB' tA' t C
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Table 6-4. ATBTLC1000 Sequence Timings Parameter Min. Max. Units Description Notes tA 0 ms VBATT rise to VDDIO rise VBATT and VDDIO can rise simultaneously or can be tied together tB 0 VDDIO rise to CHIP_EN rise CHIP_EN must not rise before VDDIO. CHIP_EN must be driven high or low, not left floating. tC 10 µs CHIP_EN rise to 31.25kHz (2MHz/64) oscillator stabilizing tA1 0 ms CHIP_EN fall to VDDIO fall CHIP_EN must fall before VDDIO. CHIP_EN must be driven high or low, not left floating. tB1 0 VDDIO fall to VBATT fall VBATT and VDDIO can fall simultaneously or be tied together
6.5 Power on Reset and Brown out Detector
The ATBTLC1000 has a Power on Reset (POR) circuit for proper system power bring up and a brown out detector to reset the system’s operation when a drop in battery voltage is detected. POR is a power on reset circuit that outputs a HI logic value when the VBATT_BUCK is below a voltage threshold. The POR output becomes a LO logic value when the VBATT_BUCK is above a voltage threshold. Brown out Detector (BOD) is a brown out detector that outputs a HI logic value when the bandgap reference (BGR) voltage falls below a programmable voltage threshold. When the band gap voltage reference voltage level is restored above a voltage threshold, the BOD output becomes a LO logic value. The counter creates a pulse that holds the chip in reset for 256*(64*T_2MHz) ~ 8.2ms Figure 6-5 and Figure 6-6 illustrate the system block diagram and timing. Figure 6-5. ATBTLC1000 POR and BOD Block Diagram
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 6-6. ATBTLC1000 POR and BOD Timing Sequence Table 6-5. ATBTLC1000 BOD Thresholds Parameter Min. Typ. Max. Comment BOD threshold 1.73V 1.80V 1.92V BOD threshold temperature coefficient -1.09mV/C BOD current consumption 300nA tPOR 8.2ms
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
7 Clocking
7.1 Overview
Figure 7-1. ATBTLC1000 Clock Architecture
26 MHz
32.768 kHz RTC XO
2 MHz
26 MHz 52 MHz
÷64 31.25 kHz 32.768 kHz Figure 7-1 provides an overview of the clock tree and clock management blocks. The BLE Clock is used to drive the BLE subsystem. The ARM clock is used to drive the Cortex-M0 MCU and its interfaces (UART, SPI, and I2C), the nominal MCU clock speed is 26MHz. The Low Power Clock is used to drive all the low power applications like BLE sleep timer, always-on power sequencer, always-on timer, and others. The 26MHz Crystal Oscillator (XO) must be used for the BLE operations or in the event a very accurate clock is required for the ARM subsystem operations. The 26MHz integrated RC Oscillator is used for most general purpose operations on the MCU and its peripherals. In cases when the BLE subsystem is not used, the RC oscillator can be used for lower power consumption. The frequency variation of this RC oscillator is up to ±50% over process, voltage, and temperature. The 2MHz integrated RC Oscillator can be used as the Low Power Clock for applications that require fast wakeup of the ARM or for generating a ~31.25kHz clock for slower wakeup but lowest power in sleep mode. This 2MHz oscillator can also be used as the ARM Clock for low-power applications where the MCU needs to remain on but run at a reduced clock speed. The frequency variation of this RC oscillator is up to ±50% over process, voltage, and temperature. The 32.768kHz RTC Crystal Oscillator (RTC XO) is recommended to be used for BLE operations (although optional) as it will reduce power consumption by providing the best timing for wakeup precision, allowing circuits to be in low power sleep mode for as long as possible until they need to wake up and connect during the BLE connection event. The ~31.25kHz clock derived from the 2MHz integrated RC Oscillator can be used instead of RTC XO but it has low accuracy over process, voltage and temperature variations (up to ±50%) and thus needs to be frequently calibrated to within ±500ppm if the RC oscillator is used for BLE timing during a connection event. Because this clock is less accurate than RTC XO, it will require waking up earlier to prepare for a connection event
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 and this will increase the average power consumption. Calibration of the RC Oscillator is described in the application note. 7.2 26MHz Crystal Oscillator (XO) Table 7-1. ATBTLC1000 26MHz Crystal Oscillator Parameters Parameter Min. Typ. Max. Units Crystal Resonant Frequency N/A 26 N/A MHz Crystal Equivalent Series Resistance 50 150 Ω Stability - Initial Offset (1) -50 50 ppm Stability - Temperature and Aging -40 40 Note: 1. Initial offset must be calibrated to maintain ±25ppm in all operating conditions. This calibration is performed during final production testing and calibration offset values are stored in eFuse. More details are provided in the calibration application note. The block diagram in Figure 7-2 (a) shows how the internal Crystal Oscillator (XO) is connected to the external crystal. The XO has up to 10pF internal capacitance on each terminal XO_P and XO_N (programmable in steps of 1.25pF). To bypass the crystal oscillator, an external Signal capable of driving 10pF can be applied to the XO_P terminal as shown in Figure 7-2 (b). The needed external bypass capacitors depend on the chosen crystal characteristics. Refer to the datasheet of the preferred crystal and take into account the on chip capacitance. When bypassing XO_P from an external clock, XO_N is required to be floating. It is recommended that only crystals specified for CL=8pF be used in customer designs since this affects the sleep/wake up timing of the device. CL other than 8pF may require upgraded firmware and device re- characterization. Figure 7-2. ATBTLC1000 Connections to XO (a) Crystal oscillator is used (b) Crystal oscillator is bypassed
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Table 7-2. ATBTLC1000 26MHz XTAL C_onchip Programming Register Cl_onchip [pF] rx_xo_regs[7,6,15] = 000 1.00 rx_xo_regs[7,6,15] = 001 2.25 rx_xo_regs[7,6,15] = 010 3.50 rx_xo_regs[7,6,15] = 011 4.75 rx_xo_regs[7,6,15] = 100 6.00 rx_xo_regs[7,6,15] = 101 7.25 rx_xo_regs[7,6,15] = 110 8.50 rx_xo_regs[7,6,15] = 111 9.75 If rx_reg7[1] = 1 add 5pF to above value Table 7-3 specifies the electrical and performance requirements for the external clock. Table 7-3. ATBTLC1000 XO Bypass Clock Specification Parameter Min. Max. Unit Comments Oscillation frequency 26 26 MHz Must be able to drive 5pF load @ desired frequency Voltage swing 0.75 1.2 Vpp Stability – Temperature and Aging -25 +25 ppm Phase Noise -130 dBc/Hz At 10kHz offset Jitter (RMS) <1psec Based on integrated phase noise spectrum from 1kHz to 1MHz 7.3 32.768kHz RTC Crystal Oscillator (RTC XO)
7.3.1 General Information
ATBTLC1000 has a 32.768kHz RTC oscillator that is preferably used for BLE activities involving connection events. To be compliant with the BLE specifications for connection events, the frequency accuracy of this clock has to be within ±500ppm. Because of the high accuracy of the 32.768kHz crystal oscillator clock, the power consumption can be minimized by leaving radio circuits in low-power sleep mode for as long as possible until they need to wake up for the next connection timed event. The block diagram in Figure 7-3(a) shows how the internal low frequency Crystal Oscillator (XO) is connected to the external crystal. The RTC XO has a programmable internal capacitance with a maximum of 15pF on each terminal, RTC_CLK_P and RTC_CLK_N. When bypassing the crystal oscillator with an external signal, one can program down the internal capacitance to its minimum value (~1pF) for easier driving capability. The driving signal can be applied to the RTC_CLK_P terminal as shown in Figure 7-3 (b). The need for external bypass capacitors depends on the chosen crystal characteristics. Refer to the datasheet of the preferred crystal and take into account the on-chip capacitance. When bypassing RTC_CLK_P from an external clock, RTC_CLK_N is required to be floating.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 7-3. ATBTLC1000 Connections to RTC XO (a) Crystal oscillator is used (b) Crystal oscillator is bypassed Table 7-4. 32.768kHz XTAL C_onchip Programming Register: pierce_cap_ctrl[3:0] Cl_onchip [pF] 0000 0.0 0001 1.0 0010 2.0 0011 3.0 0100 4.0 0101 5.0 0110 6.0 0111 7.0 1000 8.0 1001 9.0 1010 10.0 1011 11.0 1100 12.0 1101 13.0 1110 14.0 1111 15.0
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
7.3.2 RTC XO Design and Interface Specification
The RTC consists of two main blocks: The Programmable Gm stage and tuning capacitors. The programmable Gm stage is used to maintain a phase shift of 360°C with the motional arm and keep total negative resistance to sustain oscillation. Tuning capacitors are used to adjust the XO center frequency and control the XO precision for different crystal models. The output of the XO is driven to the digital domain via a digital buffer stage with supply voltage of 1.2V. Table 7-5. RTC XO Interface Pin name Function Register default Digital Control Pins Pierce_res_ctrl Control feedback resistance value: 0 = 20MΩ Feedback resistance 1 = 30MΩ Feedback resistance 0X4000F404<15>=’1’ Pierce_cap_ctrl<3:0> Control the internal tuning capacitors with step of 700fF: 0000=700fF 1111=11.2pF Refer to crystal datasheet to check for optimum tuning cap value 0X4000F404<23:20>=”1000” Pierce_gm_ctrl<3:0> Controls the Gm stage gain for different crystal mode: 0011= for crystal with shunt cap of 1.2pF 1000= for crystal with shunt cap >3pF 0X4000F404<19:16>=”1000” Supply Pins VDD_XO 1.2V 7.3.3 RTC Characterization with Gm Code Variation at Supply 1.2V and Temp. = 25°C This section shows the RTC total drawn current and the XO accuracy versus different tuning capacitors and different GM codes, at supply voltage of 1.2V and temp. = 25°C. Figure 7-4. RTC Drawn Current vs. Tuning Caps at 25°C 100 200 300 400 500 600 0 5 10 15 20 Current in nA Tuning Caps in pF gm code=1 gm code=2 gm code=4 gm code=8 gm code=12 gm code=16
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 7-9. 32kHz RC Oscillator Frequency Variation over Temperature The 26MHz integrated RC Oscillator circuit has a frequency variation of 50% over process, temperature, and voltage variation.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
8 CPU and Memory Subsystem
8.1 ARM Subsystem
ATBTLC1000 has an ARM Cortex-M0 32-bit processor. It is responsible for controlling the BLE Subsystem and handling all application features. The Cortex-M0 Microcontroller consists of a full 32-bit processor capable of addressing 4GB of memory. It has a RISC-like load/store instruction set and internal 3-stage Pipeline Von Neumann architecture. The Cortex-M0 processor provides a single system-level interface using AMBA technology to provide high speed, low latency memory accesses. The Cortex-M0 processor implements a complete hardware debug solution, with four hardware br eakpoint and two watch point options. This provides high system visibility of the processor, memory, and peripherals through a 2-pin Serial Wire Debug (SWD) port that is ideal for microcontrollers and other small package devices. Figure 8-1. ATBTLC1000 ARM Cortex-M0 Subsystem Nested Vector IRQ Ctrl LP CORTEX IDRAM1Timer Watch Dog Timer x2 GPIO Ctrl x3 SPI Flash Ctrl AHB Master ARM APB SPI x2 I2C x2 UART x2 Control Registers IDRAM2 PD1 System Level AHB Master Ahb_to_sram Ahb_to_sram AHB Slave DMA Controller System Level AHB Slave System Regs DualTimer EFUSE Registers LP Clock Calibration AON Sleep Timer AON Power Sequencer Ahb_to_rom ROM Ahb_to_sram BLE Retention Security Cores
8.1.1 Features
The processor features and benefits are: Tight integration with the system peripherals to reduce area and development costs Thumb instruction set combines high code density with 32-bit performance Integrated sleep modes using a Wakeup Interrupt Controller for low power consumption Deterministic, high-performance interrupt handling via Nested Vector Interrupt Controller for time -critical
applications
Serial Wire Debug reduces the number of pins required for debugging DMA engine for Peripheral-to-Memory, Memory-to-Memory, and Memory-to-Peripheral operation
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
8.1.2 Module Descriptions
8.1.2.1 Timer
The 32-bit timer block allows the CPU to generate a time tick at a programmed interval. This feature can be used for a wide variety of functions such as counting, interrupt generation, and time tracking.
8.1.2.2 Dual Timer
The APB dual-input timer module is an APB slave module consisting of two programmable 32 -bit down-counters that can generate interrupts when they expire. The timer can be used in a Free-running, Periodic, or One-shot mode.
8.1.2.3 Watchdog
The two watchdog blocks allow the CPU to be interrupted if it has not interacted with the watc hdog timer before it expires. In addition, this interrupt will be an output of the core so that it can be used to reset the CPU in the event that a direct interrupt to the CPU is not useful. This will allow the CPU to get back to a known state in the event a program is no longer executing as expected. The watchdog module applies a reset to a system in the eve nt of a software failure, providing a way to recover from software crashes.
8.1.2.4 Wake-up Timer
This timer is a 32-bit count-down timer that operates on the 32kHz sleep clock. It can be used as a general purpose timer for the ARM or as a wakeup source for the chip. It has the ability to be a onetime programmable timer, as it will generate an interrupt/wakeup on expiration and stop operation. It also has the ability to be programmed in an auto reload fashion where it will generate an interrupt/wakeup and then proc eed to start another count down sequence.
8.1.2.5 SPI Controller
See Section 10.3.
8.1.2.6 I2C Controller
See Section 10.2.
8.1.2.7 SPI-Flash Controller
The AHB SPI-Flash Controller is used to access an external SPI Flash device to access various instruction/data code needed for storing application code, code patches, and OTA images. Supports several SPI modes including 0, 1, 2, and 3. See Section 10.4.
8.1.2.8 UART
See Section 10.5.
8.1.2.9 DMA Controller
Direct Memory Access (DMA) allows certain hardware subsystems to access main system memory independently of the Cortex-M0 Processor. The DMA features and benefits are: Supports any address alignment Supports any buffer size alignment Peripheral flow control, including peripheral block transfer The following modes are supported: – Peripheral to peripheral transfer – Memory to memory – Memory to peripheral – Peripheral to memory
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 – Register to memory Interrupts for both TX done and RX done in memory and peripheral mode Scheduled transfers Endianness byte swapping Watchdog timer 4-channel operation 32-bit data width AHB MUX (on read and write buses) Command lists support Usage of tokens
8.1.2.10 Nested Vector Interrupt Controller (NVIC)
External interrupt signals connect to the NVIC, and the NVIC prioritizes the interrupts. Software can set the priority of each interrupt. The NVIC and the Cortex-M0 processor core are closely coupled, providing low latency interrupt processing and efficient processing of late arriving interrupts. All NVIC registers are accessible via word transfers and are little-endian. Any attempt to read or write a half-word or byte individually is unpredictable. The NVIC allows for the CPU to be able to individually enable, disable each i nterrupt source, and hold each interrupt until it has been serviced and cleared by the CPU. Table 8-1. NVIC Register Summary Name Description ISER Interrupt Set-Enable Register ICER Interrupt Clear-Enable Register ISPR Interrupt Set-Pending Register ICPR Interrupt Clear-Pending Register IPR0-IPR7 Interrupt Priority Registers For a description of each register, see the Cortex-M0 documentation from ARM.
8.1.2.11 GPIO Controller
The AHB GPIO is a general-purpose I/O interface unit allowing the CPU to independently control all input or output signals on ATBTLC1000. These can be used for a wide variety of functions pertaining to the application. The AHB GPIO provides a 16-bit I/O interface with the following features: Programmable interrupt generation capability Programmable masking support Thread safe operation by providing separate set and clear addresses for control registers Inputs are sampled using a double flip-flop to avoid meta-stability issues
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
8.2 Memory Subsystem
The M0 core uses a 128kB instruction/boot ROM along with a 128kB shared instruction and data RAM.
8.2.1 BLE Retention Memory
The BLE functionality requires 8KB (or more depending on the application) state, instruction , and data to be retained in memory when the processor either goes into Sleep Mode or Power Off Mode. The RAM is separated into specific power domains to allow tradeoff in power consumption with retention memory size.
8.3 Non-volatile Memory
ATBTLC1000 has 768 bits of non-volatile eFuse memory that can be read by the CPU after device reset. This non - volatile one-time-programmable memory can be used to store customer-specific parameters, such as BLE address, XO calibration information, TX power, crystal frequency offset, as well as other software -specific configuration parameters. The eFuse is partitioned into six 128-bit banks. The bit map of the first bank is shown in Figure 8-2. The purpose of the first 80 bits in bank 0 is fixed, and the remaining bits are general -purpose software dependent bits, or reserved for future use. Since each bank and each bit can be programmed independently, this allows for several updates of the device parameters following the initial programming, e.g. updating BLE address (this can be done by invalidating the last programmed bank and programming a new bank). Refer to the ATBTLC1000 Programming Guide for the eFuse programming instructions. Figure 8-2. ATBTLC1000 eFuse Bit Map Bank 0 Bank 1 Bank 2 Bank 3 Bank 4 Bank 5
128 Bits
F BT ADDR Used Reserved BT ADDR 488 1 1 3 3 Reserved XO Calibration HW Config HW Config Application Specific Configuration Tx Power Calibration
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
9 Bluetooth Low Energy (BLE) Subsystem
The BLE subsystem implements all the critical real-time functions required for full compliance with Specification of the Bluetooth System, v4.1, Bluetooth SIG. It consists of a Bluetooth 4.1 baseband controller (core), radio transceiver and the Atmel Bluetooth Smart Stack, the BLE Software Platform.
9.1 BLE Core
The baseband controller consists of modem and Medium Access Controller (MAC) and it encodes and decodes HCI packets, constructs baseband data packages, schedules frames , and manages and monitors connection status, slot usage, data flow, routing, segmentation, and buffer control. The core performs Link Control Layer management supporting the main BLE states, including advertising and connection.
9.1.1 Features
Broadcaster, Central, Observer, Peripheral Simultaneous Master and Slave operation, connect up to eight slaves Frequency Hopping Advertising/Data/Control packet types Encryption (AES-128, SHA-256) Bit stream processing (CRC, whitening) Operating clock 52MHz
9.2 BLE Radio
The radio consists of a fully integrated transceiver, including Low Noise Ampli fier, Receive (RX) down converter, and analog baseband processing as well as Phase Locked Loop (PLL), Transmit (TX) Power Amplifier , and Transmit/Receive switch. At the RF front end, no external RF components on the PCB are required other than the antenna and a matching component. The RX sensitivity and TX output power of the radio together with the 4.1 PHY core provide a 100dB RF link budget for superior range and link reliability.
9.2.1 Receiver Performance
Table 9-1. ATBTLC1000 BLE Receiver Performance Parameter Min. Typ. Max. Unit Frequency 2,402 2,480 MHz Sensitivity with external 1.2V -96 dBm Sensitivity with on-chip DC/DC -95 Maximum receive signal level +5 CCI 12.5 dB ACI (N±1) 0 N+2 Blocker (Image) -22 N-2 Blocker -38 N+3 Blocker (Adj. Image) -35 N-3 Blocker -43
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Parameter Min. Typ. Max. Unit N±4 or greater -45 dB Intermod (N+3, N+6) -32 dBm OOB (2GHz<f<2.399GHz) -15 OOB (f<2GHz) or (f>2.4GHz) -10 RX peak current draw 4.0 (1) mA All measurements performed at 3.6V VBATT and 25°C, with tests following Bluetooth V4.1 standard tests. There are two gain settings for Sensitivity; high gain (-95dBm) and low gain (-93dBm). Low gain has lower current consumption.
9.2.2 Transmitter Performance
The transmitter has fine step power control with Pout variable in <3dB steps below 0dBm and in <0.5dB steps above 0dBm. Table 9-2. ATBTLC1000 BLE Transmitter Performance Parameter Min. Typ. Max. Unit Frequency 2,402 2,480 MHz Output power range -20 0 3.5 dBm Maximum output power 3.5 In-band Spurious (N±2) -45 In-band Spurious (N±3) -55 2nd harmonic Pout -41 3rd harmonic Pout -41 4th harmonic Pout -41 5th harmonic Pout -41 Frequency deviation ±250 kHz TX peak current draw 3.0 (1) mA Note: 1. At 0dBm TX output power. All measurements performed at 3.6V VBATT and 25°C, with tests following Bluetooth V4.1 standard tests.
9.3 Atmel Bluetooth SmartConnect Stack
The ATBTLC1000 has a completely integrated Bluetooth Low Energy stack on chip, fully qualified, mature , and Bluetooth V4.1 compliant. Customer applications interface with the BLE protocol stack through the Atmel BLE API which supports direct access to the GAP, SMP, ATT, GATT client / server, and L2CAP service layer protocols in the embedded firmware. The stack includes numerous BLE profiles for applications like: Smart Energy Consumer Wellness
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Home Automation Security Proximity Detection Entertainment Sports and Fitness Automotive Together with the Atmel Studio Software Development environment, additional customer profiles can be easily developed. The Atmel Bluetooth SmartConnect software development kit is based on Keil and IAR ™ compiler tools and contains numerous application code examples for embedded and hosted modes. In addition to the protocol stack, drivers for each peripheral hardware block are provided.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10 External Interfaces
10.1 Overview
ATBTLC1000 external interfaces include: 2xSPI Master/Slave (SPI0 and SPI1), 2xI 2C Master/Slave (I2C0 and I2C1), 1xI2C Slave-only (I2C2), 2xUART (UART1 and UART2), 1xSPI Flash, 1xSWD, and General Purpose Input/Output (GPIO) pins. For specific programming instructions, refer to the ATBTLC1000 Programming Guide. Table 10-1 illustrates the different peripheral functions that are software selectable for each pin. This allows for maximum flexibility of mapping desired interfaces on GPIO pins. MUX1 option allows for any MEGAMUX option from Table 10-2 to be assigned to a GPIO. Table 10-1. ATBTLC1000 Pin-MUX Matrix of External Interfaces Pin Name Pin# Pull MUX0 MUX1 MUX2 MUX3 MUX4 MUX5 MUX6 MUX7 LP_GPIO_0 D5 Up GPIO 0 MEGAMUX 0 SWD CLK TEST OUT 0 LP_GPIO_1 F7 Up GPIO 1 MEGAMUX 1 SWD I/O TEST OUT 1 LP_GPIO_2 G6 Up GPIO 2 MEGAMUX 2 UART1 RXD SPI1 SCK SPI0 SCK SPI FLASH SCK TEST OUT 2 LP_GPIO_3 H7 Up GPIO 3 MEGAMUX 3 UART1 TXD SPI1 MOSI SPI0 MOSI SPI FLASH TXD TEST OUT 3 LP_GPIO_8 J6 Up GPIO 8 MEGAMUX 8 I2C0 SDA I2C2 SDA SPI0 SSN SPI FLASH SSN TEST OUT 8 LP_GPIO_9 H5 Up GPIO 9 MEGAMUX 9 I2C0 SCL I2C2 SCL SPI0 MISO SPI FLASH RXD TEST OUT 9 LP_GPIO_10 J4 Up GPIO 10 MEGAMUX 10 SPI0 SCK SPI FLASH SCK TEST OUT 10 LP_GPIO_11 F5 Up GPIO 11 MEGAMUX 11 SPI0 MOSI SPI FLASH TXD TEST OUT 11 LP_GPIO_12 G4 Up GPIO 12 MEGAMUX 12 SPI0 SSN SPI FLASH SSN TEST OUT 12 LP_GPIO_13 D3 Up GPIO 13 MEGAMUX 13 SPI0 MISO SPI FLASH RXD TEST OUT 13 AO_GPIO_0 B1 Up GPIO 31 WAKEUP RTC CLK IN 32KHZ CLK OUT GPIO_MS1 F3 Up GPIO 47 Table 10-2 shows the various software selectable MEGAMUX options that correspond to specific peripheral functionality. Several MEGAMUX options provide an interface to manage Wi-Fi® - BLE coexistence. Table 10-2. ATBTLC1000 Software Selectable MEGAMUX Options MUX_Sel Function Notes
0 UART1 RXD
1 UART1 TXD
2 UART1 CTS
3 UART1 RTS
4 UART2 RXD
5 UART2 TXD
6 UART2 CTS
7 UART2 RTS
8 I2C0 SDA
9 I2C0 SCL
10 I2C1 SDA
11 I2C1 SCL
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 MUX_Sel Function Notes
12 PWM 1
13 PWM 2
14 PWM 3
15 PWM 4
16 LP CLOCK OUT 32kHz clock output (RC Osc. or RTC XO)
17 WLAN TX ACTIVE Coexistence: Wi-Fi is currently transmitting
18 WLAN RX ACTIVE Coexistence: Wi-Fi is currently receiving
19 BLE TX ACTIVE Coexistence: BLE is currently transmitting
20 BLE RX ACTIVE Coexistence: BLE is currently receiving
21 BLE IN PROCESS Coexistence Signal
22 BLE MBSY Coexistence Signal
23 BLE SYNC Coexistence Signal
24 BLE RXNTX Coexistence Signal
25 BLE PTI 0 Coexistence: BLE Priority
26 BLE PTI 1 Coexistence: BLE Priority
27 BLE PTI 2 Coexistence: BLE Priority
28 BLE PTI 3 Coexistence: BLE Priority
29 QUAD DEC X IN A
30 QUAD DEC X IN B
31 QUAD DEC Y IN A
32 QUAD DEC Y IN B
33 QUAD DEC Z IN A
34 QUAD DEC Z IN B
An example of peripheral assignment using these MEGAMUX options is as follows: I2C0 pin-muxed on LP_GPIO_10 and LP_GPIO_11 via MUX1 and MEGAMUX=8 and 9 I2C1 pin-muxed on LP_GPIO_0 and LP_GPIO_1 via MUX1 and MEGAMUX=10 and 11 PWM pin-muxed on LP_GPIO_12 via MUX1 and MEGAMUX=12 Another example is to illustrate the available options for pin LP_GPIO_3, depending on the pin-MUX option selected: MUX0: the pin will function as bit 3 of the GPIO bus and is controlled by the GPIO controller in the ARM subsystem MUX1: any option from the MEGAMUX table can be selected, for example it can be a quad_dec, pwm, or any of the other functions listed in the MEGAMUX table MUX2: the pin will function as UART1 TXD; this can be also achieved with the MUX1 option via MEGAMUX, but the MUX2 option allows a shortcut for the recommended pinout MUX3: this option is not used and thus defaults to the GPIO option (same as MUX0) MUX4: the pin will function as SPI1 MOSI (this option is not available through MEGAMUX)
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 MUX5: the pin will function as SPI0 MOSI (this option is not available through MEGAMUX) MUX6: the pin will function as SPI FLASH SCK (this option is not available through MEGAMUX) MUX7: the pin will function as bit 3 of the test output bus, giving access to various debug signals
10.2 I2C Master/Slave Interface
10.2.1 Description
ATBTLC1000 provides I2C Interface that can be configured as Slave or Master. I2C Interface is a two-wire serial interface consisting of a serial data line (SDA) and a serial clock line (SCL). ATBTLC1000 I2C supports I2C bus Version 2.1 - 2000 and can operate in the following speed modes: Standard mode (100kb/s) Fast mode (400kb/s) High-speed mode (3.4Mb/s) The I2C is a synchronous serial interface. The SDA line is a bidirectional signal and changes only while the SCL line is low, except for STOP, START, and RESTART conditions. The output drivers are open -drain to perform wire- AND functions on the bus. The maximum number of devices on the bus is limited by only the maximum capacitance specification of 400pF. Data is transmitted in byte packages. For specific information, refer to the Philips Specification entitled “The I2C -Bus Specification, Ver2.1”.
10.2.2 I2C Interface Timing
The I2C Interface timing (common to Slave and Master) is provided in Figure 10-1. The timing parameters for Slave and Master modes are specified in Table 10-3 and Table 10-4 respectively. Figure 10-1. ATBTLC1000 I2C Slave Timing Diagram tHL SDA SCL tHDSTA tWL tWH tSUDAT tPR tHDDAT tPR tPR tLH tHL tLH tSUSTO tBUF tSUSTAfSCL Table 10-3. ATBTLC1000 I2C Slave Timing Parameters Parameter Symbol Min. Max. Units Remarks SCL Clock Frequency fSCL 0 400 kHz SCL Low Pulse Width tWL 1.3 µs SCL High Pulse Width tWH 0.6 SCL, SDA Fall Time tHL 300 ns
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Parameter Symbol Min. Max. Units Remarks SCL, SDA Rise Time tLH 300 This is dictated by external compo- nents START Setup Time tSUSTA 0.6 µs START Hold Time tHDSTA 0.6 SDA Setup Time tSUDAT 100 ns SDA Hold Time tHDDAT Slave and Master Default
40 Master Programming Option
STOP Setup time tSUSTO 0.6 µs Bus Free Time Between STOP and START tBUF 1.3 Glitch Pulse Reject tPR 0 50 ns Table 10-4. ATBTLC1000 I2C Master Timing Parameters Parameter Symbol Standard Mode Fast Mode High-speed Mode Units SCL Clock Frequency fSCL 0 100 0 400 0 3400 kHz SCL Low Pulse Width tWL 4.7 1.3 0.16 µs SCL High Pulse Width tWH 4 0.6 0.06 SCL Fall Time tHLSCL 300 300 10 40 ns SDA Fall Time tHLSDA 300 300 10 80 SCL Rise Time tLHSCL 1000 300 10 40 SDA Rise Time tLHSDA 1000 300 10 80 START Setup Time tSUSTA 4.7 0.6 0.16 µs START Hold Time tHDSTA 4 0.6 0.16 SDA Setup Time tSUDAT 250 100 10 ns SDA Hold Time tHDDAT 5 40 0 70 STOP Setup time tSUSTO 4 0.6 0.16 µs Bus Free Time Between STOP and START tBUF 4.7 1.3 Glitch Pulse Reject tPR 0 50 ns
10.3 SPI Master/Slave Interface
10.3.1 Description
ATBTLC1000 provides a Serial Peripheral Interface (SPI) that can be configured as Master or Slave. The SPI Interface pins are mapped as shown in Table 10-5. The SPI Interface is a full-duplex slave-synchronous serial interface. When the SPI is not selected, i.e., when SSN is high, the SPI interface will not interfere with data transfers between the serial-master and other serial-slave devices. When the serial slave is not selected, its transmitted data output is buffered, resulting in a high impedance drive onto the serial master receive line. The SPI
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Slave interface responds to a protocol that allows an external host to read or write any register in the chip as well as initiate DMA transfers. For the details of the SPI protocol and more specific instructions, refer to the ATBTLC1000 Programming Guide. Table 10-5. ATBTLC1000 SPI Interface Pin Mapping Pin Name SPI Function SSN Active Low Slave Select SCK Serial Clock MOSI Master Out Slave In (Data) MISO Master In Slave Out (Data)
10.3.2 SPI Interface Modes
The SPI Interface supports four standard modes as determined by the Clock Polarity (CPOL) and Clock Phase (CPHA) settings. These modes are illustrated in Table 10-6 and Figure 10-2. The red lines in Figure 10-2 correspond to Clock Phase = 0 and the blue lines correspond to Clock Phase = 1. Table 10-6. ATBTLC1000 SPI Modes Mode CPOL CPHA 0 0 0 1 0 1 2 1 0 3 1 1 Figure 10-2. ATBTLC1000 SPI Clock Polarity and Clock Phase Timing z z z z SCK CPOL = 0 CPOL = 1 SSN RXD/TXD (MOSI/MISO) CPHA = 0 CPHA = 1 2 3 4 5 6 7 8 1 2 3 4 5 6 7
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10.3.3 SPI Slave Timing
The SPI Slave timing is provided in Figure 10-3 and Table 10-7. Figure 10-3. ATBTLC1000 SPI Slave Timing Diagram Table 10-7. ATBTLC1000 SPI Slave Timing Parameters Parameter Symbol Min. Max. Units Clock Input Frequency fSCK 2 MHz Clock Low Pulse Width tWL 240 ns Clock High Pulse Width tWH 240 Clock Rise Time tLH 10 Clock Fall Time tHL 10 ns Input Setup Time tISU 5 Input Hold Time tIHD 5 Output Delay tODLY 0 20 Slave Select Setup Time tSUSSN 5 Slave Select Hold Time tHDSSN 5
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10.3.4 SPI Master Timing
The SPI Master Timing is provided in Figure 10-4 and Table 10-8. Figure 10-4. ATBTLC1000 SPI Master Timing Diagram fSCK tWH tLH tHL tWL tODLY tISU tIHD SCK SSN, TXD RXD Table 10-8. ATBTLC1000 SPI Master Timing Parameters Parameter Symbol Min. Max. Units Clock Output Frequency fSCK 4 MHz Clock Low Pulse Width tWL 120 ns Clock High Pulse Width tWH 120 Clock Rise Time tLH 5 Clock Fall Time tHL 5 Input Setup Time tISU 5 Input Hold Time tIHD 5 Output Delay tODLY 0 5
10.4 SPI Flash Master Interface
10.4.1 Description
ATBTLC1000 provides an SPI Master interface for accessing external Flash memory. The TXD pin is the same as the Master Output, Slave Input (MOSI), and the RXD pin is the same as the Master Input, Slave Output (MISO). The SPI Master interface supports all four standard modes of clock polarity and clock phase shown in Table 10-6. External SPI Flash memory is accessed by a processor programming commands to the SPI Master interface, which in turn initiates an SPI master access to the Flash. For more specific instructions. Refer to ATBTLC1000 Programming Guide.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10.4.2 SPI Master Timing
The SPI Master Timing is provided in Figure 10-5 and Table 10-9. Figure 10-5. ATBTLC1000 SPI Master Timing Diagram fSCK tWH tLH tHL tWL tODLY tISU tIHD SCK SSN, TXD RXD Table 10-9. ATBTLC1000 SPI Master Timing Parameters Parameter Symbol Min. Max. Units Clock Output Frequency fSCK 13 MHz Clock Low Pulse Width tWL 33 ns Clock High Pulse Width tWH 33 Clock Rise Time tLH 5 Clock Fall Time tHL 5 Input Setup Time tISU 5 Input Hold Time tIHD 5 Output Delay tODLY 0 5
10.5 UART Interface
ATBTLC1000 provides Universal Asynchronous Receiver/Transmitter (UART) interfaces for serial communication. The Bluetooth subsystem has two UART interfaces: a 4-pin interface for control and data transfer. The UART interfaces are compatible with the RS-232 standard, where ATBTLC1000 operates as Data Terminal Equipment (DTE). The 4-pin UART has two pins for data (TX and RX) and two pins for flow control/handshaking: Request To Send (RTS) and Clear To Send (CTS). The RTS and CTS are used for hardware flow control; they MUST be connected to the host MCU UART and enabled for the UART interface to be functional. The pins associated with each the UART interfaces can be enabled on several alternative pins by programming their corresponding pin- MUX control registers (see Table 10-1 and Table 10-2 for available options). The UART features programmable baud rate generation with fractional clock division, which allows transmission and reception at a wide variety of standard and non-standard baud rates. The Bluetooth UART input clock is selectable between 26MHz, 13MHz, 6.5MHz, and 3.25MHz. The clock divider value is progr ammable as 13 integer bits and three fractional bits (with 8.0 being the smallest recommended value for normal operation). This results in the maximum supported baud rate of 26MHz/8.0 = 3.25MBd.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 The UART can be configured for seven or eight bit operation, with or without parity , with four different parity types (odd, even, mark, or space), and with one or two stop bits. It also has RX and TX FIFOs, which ensure reliable high speed reception and low software overhead transmission. FIFO size is 4x8 for both RX and TX direction. The UART also has status registers showing the number of received characters available in the FIFO and various error conditions, as well the ability to generate interrupts based on these status bits. An example of UART receiving or transmitting a single packet is shown in Figure 10-6. This example shows 7-bit data (0x45), odd parity, and two stop bits. Refer to the ATBTLC1000 Programming Guide for more specific instructions. Figure 10-6. Example of UART RX or TX Packet
10.6 GPIOs
12 General Purpose Input/Output (GPIO) pins total, labeled LP_GPIO, GPIO_MS, and AO_GPIO, are available to allow for application specific functions. Each GPIO pin can be programmed as an input (the value of the pin can be read by the host or internal processor) or as an output (the output values can be programmed by the host or internal processor). LP_GPIO are digital interface pins, GPIO_MS is a mixed signal/analog interface pin and AO_GPIO is an always-on digital interface pin that can detect interrupt signals while in deep sleep mode for wake up purposes. The LP_GPIO have interrupt capability but only when in active/standby mode. In sleep mode, they are turned off to save power consumption.
10.7 Analog to Digital Converter (ADC)
10.7.1 Overview
The ATBTLC1000 has an integrated Successive Approximation Register (SAR) ADC with 11-bit resolution and variable conversion speed up 1MS/s. The key building blocks are the capacitive DAC, comparator , and synchronous SAR engine as shown in Figure 10-7.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 10-7. BTLC1000 SAR ADC Block Diagram The ADC reference voltage can be either generated internally or set externally via one of the two available Mixed Signal GPIO pins on the ATBTLC1000. There are two modes of operation: A. High resolution (11-bit): Set the reference voltage to half the supply voltage or below. In this condition the input signal dynamic range is equal to twice the reference voltage (ENOB=10bit) . B. Medium Resolution (10-bit): Set the reference voltage to any value below supply voltage (up to supply voltage - 300mV) and in this condition the input dynamic range is from zero to reference voltage (ENOB = 9 bit). There are four input channels that are time multiplexed to the input of the SAR ADC. However on the ATBTLC1000, only one channel input is accessible from the outside, through the Mixed Signal GPIO pin. In power saving mode, the internal reference voltage is completely off and the reference voltage is set externally. The ADC characteristics are summarized in Table 10-10. Table 10-10. SAR ADC Characteristics Conversion rate 1ks → 1MS Selectable Resolution 10 → 11bit Power consumption 13.5µA (at 100KS/s) (1) Note: 1. With external reference.
10.7.2 Timing
The ADC timing is shown in Figure 10-8. The input signal is sampled twice, in the first sampling cycle the input range is defined either to be above reference voltage or below it and in the 2 nd sampling instant the ADC start its normal operation. The ADC takes two sampling instants and N-1 conversion cycle (N=ADC resolution) and one cycle to sample the data out. So for 11-bit resolution it takes 13 clock cycles to do one Sample conversion. The Input clock equals N+2 the sampling clock frequency (N is the ADC resolution) . CONV signal : Gives indication about end of conversion. SAMPL : The input signal is sampled when this signal is high. RST ENG : When High SAR Engine is in reset mode (SAR engine output is set to mid-scale).
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Figure 10-8. SAR ADC Timing
10.7.3 Performance
Table 10-11. Static Performance of SAR ADC Parameter Condition Min. Typ. Max. Unit Input voltage range 0 VBAT V Resolution 11 bits Sample rate 100 1000 KSPS Input offset Internal VREF -10 +10 mV Gain error Internal VREF -4 +4 % DNL 100KSPS. Internal VREF=1.6V. Same result for external VREF. -0.75 +1.75 LSB INL 100KSPS. Internal VREF=1.6V. Same result for external VREF. -2 +2.5 THD 1kHz sine input at 100KSPS 73 dB SINAD 1kHz sine input at 100KSPS 62.5 SFDR 1kHz sine input at 100KSPS 73.7 Conversion time 13 cycles Current consumption Using external VREF, at 100KSPS 13.5 µA Using internal VREF, at 100KSPS 25.0 Using external VREF, at 1MSPS 94 Using internal VREF, at 1MSPS 150 Using internal VREF, during VBAT monitoring 100 Using internal VREF, during temperature monitoring 50 Internal reference voltage Mean value using VBAT = 2.5V 1.026* V Standard deviation across parts 10.5 mV VBAT Sensor Accuracy Without calibration -55 +55 With offset and gain calibration -17 +17 Temperature Sensor Accuracy Without calibration -9 +9 ºC With offset calibration -4 +4 Note: 1. Effective VREF is 2xInternal Reference Voltage.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10.8 Software Programmable Timer and Pulse Width Modulator
ATBTLC1000 contains four individually configurable pulse width modulator (PWM) blocks to provide external control voltages. The base frequency of the PWM block (fPWM_base) is derived from the XO clock (26MHz) or the RC oscillator followed by a programmable divider. The frequency of each PWM pulse (fPWM) is programmable in steps according to the following relationship: 𝑓𝑃𝑊𝑀 = 𝑓𝑃𝑊𝑀_𝑏𝑎𝑠𝑒 The duty cycle of each PWM signal is configurable with 10-bit resolution (minimum duty cycle is 1/1024 and maximum is 1023/1024). 𝑓𝑃𝑊𝑀𝑏𝑎𝑠𝑒 can be selected to have different values according to Table 10-12. Minimum and maximum frequencies supported for each clock selection is listed in the table as well. Table 10-12. fPWM Range for Different fPWM Base Frequencies 𝒇𝑷𝑾𝑴𝒃𝒂𝒔𝒆 fPWM max. fPWM min. 26MHz 406.25kHz 6.347kHz 13MHz 203.125kHz 3.173kHz 6.5MHz 101.562kHz 1.586kHz 3.25MHz 50.781kHz 793.25Hz
10.9 Clock Output
ATBTLC1000 has an ability to output a clock. The clock can be output to any GPIO pin via the test MUX. Note that this feature requires that the ARM and BLE power domains stay on. If BLE is not used, the clocks to the BLE core are gated off, resulting in small leakage. The following two methods can be used to output a clock.
10.9.1 Variable Frequency Clock Output Using Fractional Divider
ATBTLC1000 can output the variable frequency ADC clock using a fractional divider off the 26MHz oscillator. This clock needs to be enabled using bit 10 of the lpmcu_clock_enables_1 register. The clock frequency can be controlled by the divider ratio using the sens_adc_clk_ctrl register (12-bits integer part, 8-bit fractional part). The division ratio can vary from 2 to 4096 delivering output frequency between 6.35kHz to 13MHz. This is a digital divider with pulse swallowing implementation so the clock edges may not be at exact intervals for the fractional ratios. However, it is exact for integer division ratios.
10.9.2 Fixed Frequency Clock Output
ATBTLC1000 can output the following fixed-frequency clocks: 52MHz derived from XO 26MHz derived from XO 2MHz derived from the 2MHz RC Osc. 31.25kHz derived from the 2MHz RC Osc. 32.768kHz derived from the RTC XO 26MHz derived from 26MHz RC Osc. 6.5MHz derived from XO 3.25MHz derived from 26MHz RC Osc. For clocks 26MHz and above ensure that external pad load on the board is minimized to get a clean waveform.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
10.10 Three-axis Quadrature Decoder
ATBTLC1000 has a three-axis Quadrature decoder (X, Y, and Z) that can determine the direction and speed of movement on three axes, requiring in total six GPIO pins to interface with the sensors. The sensors are expected to provide pulse trains as inputs to the quadrature decoder. Each axis channel input will have two pulses with ±90 degrees phase shift depending on the direction of movement. The decoder counts the edges of the two waveforms to determine the speed and uses the phase relationship between the two inputs to determine the direction of motion. The decoder is configured to interrupt ARM based on independent thresholds for each direction. Each quadrature clock counter (X, Y, and Z) is an unsigned 16-bit counter and the system clock uses a programmable sampling clock ranging from 26MHz, 13, 6.5, to 3.25MHz. If wakeup is desired from threshold detection on an axis input, the alwa ys-on GPIO needs to be used (only one GPIO on ATBTLC1000).
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
11 Reference Design
UART_CTS UART_RTS L4 3.6nH 1.2pF C6 8.2pF R4 0 DNI DNI L6 4.7uH VBAT DNI C10 1.0uF Place C10 as close as possible to pin E6. Place C9 as close as possible to pin C6. Place C15 as close as possible to pin A6. 32.768KHz C9 0.1uF C11 0.1uF ANTENNA Wake VDDIO Antenna Matching Network. Place right next to antenna SWDIO SWCLK An external 32.768KHz clock may be used instead of a cry stal. Signal must be 1.2V max. UART_RxD UART_TxD Chip_En Test Point Test Points or header f or access to debug pins. Test Point C14 4.7uF C13 1.0uF R1 0 C12 2.2uF 6.3V C20 0.01uF C7 5.6pF C8 5.6pF 26MHz BTLC1000 CSP TPP VDDRF RFIO VDD_AMS VDDC_PD4 LP_GPIO_8 LP_GPIO_3 LP_GPIO_2 LP_GPIO_1 VBat_buck VSW CHIP_EN GPIO_MS1 LP_GPIO_9 XO_P XO_N VSS E4 RFGND LP_GPIO_0 LP_LDO_OUT RTCP RTCN AO_GPIO_0 B1 VDDIO_SW GNDBUCK H3 VDDIO VDD_VCO/SX LP_GPIO_10 J4LP_GPIO_11 F5LP_GPIO_12 G4LP_GPIO_13 10uF FB2 BLM03AG121SN1 1 2 FB1 BLM03AG121SN1 1 2 If Wake f unction is not used, connect AO_GPIO_0 to ground C15 0.1uF Cry stal Load Capactince should be specif ied f or 8pF. L5 9.1nH
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
12 Bill of Material (BOM)
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
13.1 Absolute Maximum Ratings
Table 13-1. ATBTLC1000 Absolute Maximum Ratings Symbol Characteristics Min. Max. Unit VDDIO I/O supply voltage -0.3 5.0 V VBATT Battery supply voltage -0.3 5.0 VIN (1) Digital input voltage -0.3 VDDIO VAIN (2) Analog input voltage -0.3 1.5 VESDHBM (3) ESD human body model -1000, -2000 (see notes below) +1000, +2000 (see notes below) TA Storage temperature -65 150 °C Notes: 1. VIN corresponds to all the digital pins. 2. VAIN corresponds to all the analog pins. 3. For VESDHBM, each pin is classified as Class 1, or Class 2, or both: The Class 1 pins include all the pins (both analog and digital) The Class 2 pins include all digital pins only VESDHBM is ±1kV for Class1 pins. VESDHBM is ±2kV for Class2 pins
13.2 Recommended Operating Conditions
Table 13-2. ATBTLC1000 Recommended Operating Conditions Symbol Characteristic Min. Typ. Max. Unit VDDIOL I/O supply voltage low range 1.62 1.80 2.00 V VDDIOM I/O supply voltage mid-range 2.00 2.50 3.00 VDDIOH I/O supply voltage high range 3.00 3.30 4.30 VBATT Battery supply voltage (1) 1.8 3.6 4.3 Operating temperature -40 85 °C Note: 1. VBATT must not be less than VDDIO. 2. When powering up the device, VBATT must be greater or equal to 1.9V to ensure BOD does not trigger. BOD threshold is typically 1.8V and the device will be held in reset if VBATT is near this threshold on startup. After startup, BOD can be disabled and the device can operated down to 1.8V.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
13.3 DC Characteristics
Table 13-3 provides the DC characteristics for the ATBTLC1000 digital pads. Table 13-3. ATBTLC1000 DC Electrical Characteristics VDDIO condition Characteristic Min. Typ. Max. Unit VDDIOL Input low voltage VIL -0.30 0.60 V Input high voltage VIH VDDIO-0.60 VDDIO+0.30 Output low voltage VOL 0.45 Output high voltage VOH VDDIO-0.50 VDDIOM Input low voltage VIL -0.30 0.63 Input high voltage VIH VDDIO-0.60 VDDIO+0.30 Output low voltage VOL 0.45 Output high voltage VOH VDDIO-0.50 VDDIOH Input low voltage VIL -0.30 0.65 Input high voltage VIH VDDIO-0.60 VDDIO+0.30 (up to 3.60) Output low voltage VOL 0.45 Output high voltage VOH VDDIO-0.50 All Output loading 20 pF Digital input load 6 VDDIOL Pad drive strength (regular pads (1)) 1.7 2.5 mA VDDIOM Pad drive strength (regular pads) 3.4 6.6 VDDIOH Pad drive strength (regular pads) 10.5 14 VDDIOL Pad drive strength (high-drive pads (1)) 3.4 5.0 VDDIOM Pad drive strength (high-drive pads) 6.8 13.2 VDDIOH Pad drive strength (high-drive pads) 21 28 Note: 1. The following are high-drive pads: GPIO_8, GPIO_9; all other pads are regular.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
14 Errata
Issue: The measured current for the cases listed Table 6-3 will be higher than what is reported in the figure. This is because the Power number values in the SDK4.0 release have not been fully o ptimized to their final values. A small sample measurement has been performed on 10 samples and they show the following results: Measurement condition: - 1-sec adverting interval - 37 byte advertising payload - Connectable beacon - Advertising on three channels (37, 38, 39) - Vbatt and VDDIO are set to 3.3V SAM L21 has a measurement floor of 80nA, which was compensated in the reported numbers (this number varies from board to board and needs to be compensated). The Average advertising current: 11.3µA The Average sleep current between beacons: 1.17µA The average current for the 10 boards was (including 80nA floor): Sample # 1 2 3 4 5 6 7 8 9 10 Work around: Will be resolved in a SDK update.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016
15 Document Revision History
Doc Rev. Date Comments 42493D 02/2016 Some minor corrections in text and template. 42493C 01/2016 1. Updated power values and added Bluetooth Certification ID’s in feature list. 2. Added UART flow control to LP_GPIO Pins in Table 4-1. 3. Revised values in Ex Inductor Rng in Table 6-1. 4. Removed 1µH Row and updated cap and ripple values in Table 6-2. 5. Updated BLE on Transmit/BLE on Receive values in Table 6-3. 6. Updated text in describing BOD handling in Section 6.5. 7. Removed BGR block from diagram in Figure 6-5 and reference in Figure 6-6. 8. Added Table 6-5 for Brownout Thresholds and POR time. 9. Updated oscillator variations to 50% in Sections, 7.1, and 7.4. 10. Updated Table 9-2 TX peak current values. 11. Updated Reference Design info. In Sections 11 & 12. 12. Added note 2, in Table 13-2. 13. Revised Sensitivity values in the Features, and Section 9.2.1. 14. Updated Figure 7-2 and Figure 7-3. 15. Revised Power sequence Figure 6-4 and Table 6-4. 16. Updated Reference Schematic and BOM in Sections 11 and 12. 17. Added Errata area in Section 14. 42493B 09/16/2015 1. Updated current numbers in the feature list. 2. Updated current numbers and added comments in Table 6-3. 3. Updated advertising current chart in Figure 6-3. 4. Updated capacitance value in Section 7.2. 5. Updated voltage value in Table 7-3. 6. Updated capacitance value and text in Section 7.3.1. 7. Added 32kHz RC Oscillator performance charts in Section 7.4. 8. Updated Receiver performance numbers and comments in Table 9-1. 9. Updated Transmitter performance numbers and comments in Table 9-2. 10. Updated ADC power consumption and added comment in Table 10-10. 11. Replaced the whole ADC performance Table 10-11. 12. Replaced ADC performance charts: Figure 10-9 and Figure 10-10. 13. Added new ADC performance charts: Figure 10-11 and Figure 10-12. 14. BTLC1000 corrected to ATBTLC1000. 42493A 08/2015 Initial document release. Based on 42409B, changed package type to WLCSP.
ATBTLC1000 WLCSP SoC [DATASHEET] Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016 Atmel Corporation 1600 Technology Drive, San Jose, CA 95110 USA T: (+1)(408) 441.0311 F: (+1)(408) 436.4200 │ www.atmel.com © 2016 Atmel Corporation. / Rev.: Atmel-42493D-ATBTLC1000_WLCSP_SoC-Datasheet_02/2016. Atmel®, Atmel logo and combinations thereof, Enabling Unlimited Possibilities ®, and others are registered trademarks or trademarks of Atmel Corporation in U.S. and other countries. ARM®, ARM Connected® logo, and others are the registered trademarks or trademark s of ARM Ltd. Other terms and product names may be trademarks of others. DISCLAIMER: The information in this document is provided in connection with Atmel products. No license, express or implied, b y estoppel or otherwise, to any intellectual property rig ht is granted by this document or in connection with the sale of Atmel products. EXCEPT AS SET FORTH IN THE ATMEL TERMS AND COND ITIONS OF SALES LOCATED ON THE ATMEL WEBSITE, ATMEL ASSUMES NO LIABILITY WHATSOEVER AND DISCLAIMS ANY EXPRESS, IMPLIED OR STATUT ORY WARRANTY RELATING TO ITS PRODUCTS INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTY OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, OR NON -INFRINGEMENT. IN NO EVENT SHALL ATMEL BE LIABLE FOR ANY DIRECT, INDIRECT, CONSEQUENTIAL, PUNITIVE, SPECIA L OR INCIDENTAL DAMAGES (INCLUDING, WITHOUT LIMITATION, DAMAGES FOR LOSS AND PROFITS, BUSINESS INTERRUPTION, OR LOSS OF INFORMATION) ARISING OUT OF THE USE OR INABILITY TO USE THIS DOCUMENT , EVEN IF ATMEL HAS BEEN ADVISED OF THE POSSIBILITY OF SUCH DAMAGES . Atmel makes no representations or warranties with respect to the accuracy or completeness of the contents of this document and reserves the right to make changes to specifications and products descriptions at any time without notice. Atmel does not make any commitment to update the information contained herein. Unless specifically provided otherwise, Atmel products are not suitable for, and shall not be used in, auto motive applications. Atmel products are not intended, authorized, or warranted for use as components in applications intended to support or sustain life. SAFETY-CRITICAL, MILITARY, AND AUTOMOTIVE APPLICATIONS DISCLAIMER: Atmel products are not designed for and will not be used in conne ction with any applications where the failure of such produ cts would reasonably be expected to result in significant personal injury or death (“Safety -Critical Applications”) without an Atmel officer's specific written consent. Safety-Critical Applications include, without limitation, life support devices and syst ems, equipment or systems for the operation of nuclear facilities and weapons systems. Atmel products are not designed nor intended for use in military or aerospace applications or environments unless specifically desi gnated by Atmel as military -grade. Atm el products are not designed nor intended for use in automotive applications unless specifically designated by Atmel as automotive -grade.