AN79M15F

AN79M00 PANASONIC | Alldatasheet

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The AN79M00 and the AN79M00F series are 3-pin fixed negative output voltage regulators. Stabilized fixed output voltage is obtained from unstable DC input volt- age without using any external components. 12 types of output voltage are available ; –5V , –5.2V , –6V , –7V , –8V, –9V , –10V , –12V , –15V , –18V , –20V and –24V . They can be used widely in power circuits with current capacitance up to 500mA. n Features

• No external components
• Output voltage : –5V , –5.2V, –6V , –7V , –8V , –9V , –10V,
• Short-circuit current limiting built-in
• Thermal overload protection built-in
• Output transistor safe area compensation AN79M00/AN79M00F Series 3-pin Negative Output V oltage Regulators (500mA Type) n Block Diagram Unit:mmAN79M00 Series 10.4–0.5 1.4–0.1 2.9–0.1 ø3.7 10.5–0.5 2.54 0.45 1 : Common 2 : Input 3 : Output 2.5–0.25 + 0.1 – 0.05 123 4.5–0.3 JEDEC:TO-220AB. (HSIP003-P-0000) 0.8–0.2 Unit:mmAN79M00F Series (4.3) 10.5–0.3 2.77–0.3 (1.73)ø5.3 16.7–0.3 17.0–0.25 4.2–0.25 3.8–0.25 8.7–0.3 13.6–0.25 4.5–0.25 (0.4) 0.4 + 0.1 – 0.05 0.8–0.2 2.5–0.252.0–0.25 4.5–0.32.54 12 3 1.4–0.2 3.1–0.1 TO-220 Full Pack Package (HSIP003-P-0000A) 1 : Common 2 : Input 3 : Output Common Output Input Starter Voltage Reference Error Amp. R 1 Q 1 Pass Tr. R SC Current Limiter Thermal Protection R

V V W Parameter Symbol Rating Unit n Absolute Maximum Ratings (Ta=25˚C) –35 *1 –40 *2 15 *3 10.25 *3 –20 to +80 –55 to +150 Input voltage Power dissipation Operating ambient temperature Storage temperature AN79M00 Series AN79M00F Series *1 AN79M05/F, AN79M52/F, AN79M06/F, AN79M07/F, AN79M08/F, AN79M09/F, AN79M10/F, AN79M12/F, AN79M15/F, AN79M18/F *2 AN79M20/F, AN79M24/F *3 Follow the derating curve. When Tj exceeds 150˚C, the internal circuit cuts off the output. V O –5.2 V–5 V O VV I=–7 to –25V, IO =5 to 350mA, PD * REG IN 50 mV3V I=–7 to –25V, Tj=25˚C mV REG L mV20IO =5 to 500mA, Tj=25˚C mVIO =5 to 350mA, Tj=25˚C V I=–8 to –18V, Tj=25˚C mA2Tj=25˚C IBias mAV I=–8 to –25V, Tj=25˚C mA 125 IO =5 to 350mA, Tj=25˚C V no dB f=10Hz to 100kHz, Ta=25˚C 0.8 0.4 –5.25 100 –4.8 –4.75 RR V I=–8 to –18V, IO =100mA, f=120Hz, Ta=25˚C V1.1Tj=25˚C mA50IO (Short) IO (peak) mA1000 V I=–35V, Tj=25˚C Tj=25˚C – 0.4ΔV O /Ta IO =5mA, T j=0 to 125˚C Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–10V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M05 : 15W, AN79M05F : 10.25W n Electrical Characteristics (Ta=25˚C) µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M05/AN79M05F (–5V Type)

V O –6.25 V–6 V O V REG IN 60 mV mV REG L mV mV mA2IBias mA mA 150V no dB 0.8 0.4 –6.3 120 –5.75 –5.7 RR V1.1 mA50 mA1000 1.5 –0.4 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–8 to –25V, IO =3 to 350mA, PD * V I=–8 to –25V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–9 to –19V, Tj=25˚C Tj=25˚C V I=–9 to –25V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–9 to –19V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C DV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–11V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M06 : 15W, AN79M06F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M06/AN79M06F (–6V Type) V O –5.4 V–5.2 V O V REG IN 50 mV mV REG L mV mV mA2IBias mA mA 130V no dB 0.8 0.4 –5.46 100 –5.0 –4.94 RR V I=–8 to –18V, f=120Hz, IO =100mA V1.1 mA50 mA1000 – 0.4 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit n Electrical Characteristics (Ta=25˚C) V I=–7 to –25V, IO =5 to 350mA, PD * V I=–7 to –25V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–8 to –18V, Tj=25˚C Tj=25˚C V I=–8 to –25V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–10V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M52 : 15W, AN79M52F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C
• AN79M52/AN79M52F (–5.2V Type)

V O –7.3 V–7 V O V REG IN 70 mV6 mV REG L mV20 mV mA2 IBias mA mA 175V no dB 0.8 0.4 –7.35 140 –6.7 –6.65 RR V1.1 mA50 mA1000 – 0.5 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–9 to –25V, IO =5 to 350mA, PD * V I=–9 to –25V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–10 to –20V, Tj=25˚C Tj=25˚C V I=–10 to –25V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–10 to –20V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–12V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M07 : 15W, AN79M07F : 10.25W n Electrical Characteristics (Ta=25˚C) µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M07/AN79M07F (–7V Type) V O –8.3 V–8 V O V REG IN 80 mV mV REG L mV mV mA2IBias mA mA 200V no dB 0.8 0.4 –8.4 160 –7.7 –7.6 RR V1.1 mA50 mA1000 – 0.6 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–10.5 to –25V, IO =5 to 350mA, PD * V I=–10.5 to –25V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–11 to –21V, Tj=25˚C Tj=25˚C V I=–10.5 to –25V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–11.5 to –21.5V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–14V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M08 : 15W, AN79M08F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C
• AN79M08/AN79M08F (–8V Type)

V O –9.35 V–9 V O V REG IN 80 mV7 mV REG L mV25 mV mA2 IBias mA mA 225V no dB 0.8 0.4 –9.45 180 –8.65 –8.55 RR V1.1 mA50 mA1000 –0.6 n Electrical Characteristics (Ta=25˚C) Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–11.5 to –26V, IO =5 to 350mA, PD * V I=–11.5 to –26V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–12 to –22V, Tj=25˚C Tj=25˚C V I=–11.5 to –26V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–12 to –22V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–15V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M09 : 15W, AN79M09F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M09/AN79M09F (–9V Type) V O –10.4 V–10 V O V REG IN 80 mV mV REG L mV mV mA2IBias mA mA 250V no dB 0.8 0.4 –10.5 200 100 –9.6 –9.5 RR V1.1 mA50 mA1000 –0.7 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–12.5 to –27V, IO =5 to 350mA, PD * V I=–12.5 to –27V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–13 to –23V, Tj=25˚C Tj=25˚C V I=–12.5 to –27V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–13to –23V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–16V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M10 : 15W, AN79M10F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C
• AN79M10/AN79M10F (–10V Type)

V O –12.5 V–12 V O V REG IN 80 mV8 mV REG L mV25 mV mA2 IBias mA mA 300V no dB 0.8 0.4 –12.6 240 120 –11.5 –11.4 RR V1.1 mA50 mA1000 – 0.8 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit n Electrical Characteristics (Ta=25˚C) V I=–14.5 to –30V, IO =5 to 350mA, PD * V I=–14.5 to –30V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–15 to –25V, Tj=25˚C Tj=25˚C V I=–14.5 to –30V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–15 to –25V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–19V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M12 : 15W, AN79M12F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M12/AN79M12F (–12V Type) V O –15.6 V–15 V O V REG IN 80 mV mV REG L mV mV mA2IBias mA mA 375V no dB 0.8 0.4 –15.75 240 120 –14.4 –14.25 RR V1.1 mA50 mA1000 – 0.9 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–17.5 to –30V, IO =5 to 350mA, PD * V I=–17.5 to –30V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–18 to –28V, Tj=25˚C Tj=25˚C V I=–17.5 to –30V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–18 to –28V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–23V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M15 : 15W, AN79M15F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C
• AN79M15/AN79M15F (–15V Type)

V O –18.7 V–18 V O V REG IN 80 mV10 mV REG L mV30 mV mA2 IBias mA mA 450V no dB 0.8 0.4 –18.9 300 150 –17.3 –17.1 RR V1.1 mA50 mA1000 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit n Electrical Characteristics (Ta=25˚C) V I=–21 to –33V, IO =5 to 350mA, PD * V I=–21 to –33V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–22 to –32V, Tj=25˚C Tj=25˚C V I=–21 to –33V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–22 to –32V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–27V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M18 : 15W, AN79M18F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M18/AN79M18F (–18V Type) V O –20.8 V–20 V O V REG IN 80 mV mV REG L mV mV mA2IBias mA mA 500V no dB 0.8 0.4 –21 300 150 –19.2 –19 RR V1.1 mA50 mA1000 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit V I=–23 to –35V, IO =5 to 350mA, PD * V I=–23 to –35V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–24 to –34V, Tj=25˚C Tj=25˚C V I=–23 to –35V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–24 to –34V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–29V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M20 : 15W, AN79M20F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C
• AN79M20/AN79M20F (–20V Type)

V O –25 V–24 V O V REG IN 80 mV10 mV REG L mV30 mV mA2 IBias mA mA 600V no dB 0.8 0.4 –25.2 300 150 –23 –22.8 RR V1.1 mA50 mA1000 Parameter Symbol Condition min typ max Output voltage Output voltage tolerance Line regulation Load regulation Bias current Input bias current fluctuation Load bias current fluctuation Output noise voltage Ripple rejection ratio Minimum input/output voltage difference Output short circuit current Peak output current Output voltage temperature coefficient Unit n Electrical Characteristics (Ta=25˚C) V I=–27 to –38V, IO =5 to 350mA, PD * V I=–27 to –38V, Tj=25˚C IO =5 to 500mA, Tj=25˚C IO =5 to 350mA, Tj=25˚C V I=–27 to –37V, Tj=25˚C Tj=25˚C V I=–27to –38V, Tj=25˚C IO =5 to 350mA, Tj=25˚C f=10Hz to 100kHz, Ta=25˚C V I=–28 to –38V, IO =100mA, f=120Hz, Ta=25˚C Tj=25˚C IO (Short) IO (peak) V I=–35V, Tj=25˚C Tj=25˚C ΔV O /Ta IO =5mA, T j=0 to 125˚C Note 1) The specified condition Tj=25˚C means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. Note 2) When not specified, VI=–33V, IO =350mA, C I=2µF, CO =1µF and Tj=0 to 125˚C * AN79M24 : 15W, AN79M24F : 10.25W µV Tj=25˚C ΔIbias (IN) ΔIbias (L) V DIF (min.) mV/˚C

• AN79M24/AN79M24F (–24V Type)

I O =100mA 1k 10k 100k Frequency f (Hz) Ripple Rejection Ratio RR (dB) RR– f 02468 1 0 Time t (µs) –10 –20 Output Voltage Fluctuation (mV) Input Voltage VI (V) Input Transient Response AN79M05/F 0 1 02 03 04 05 0 Time t (µs) 1.0 0.5 Output Voltage Fluctuation (V) Load Current IO (A) Load Transient Response AN79M05/F 1.4 1.2 1.0 0.8 0.6 0.4 –50 0 50 100 150 Junction Temperature Tj (˚C) Minimum Input/Output Voltage Difference VDIF (min.) (V) V DIF (min.) –Tj IO =500mA IO =200mA IO =100mA IO =10mA AN79M05/F 0 40 80 120 160 Ambient Temperature Ta (˚C) Power Dissipation PD (W) PD –Ta (AN79M00F Series) (1) Infinite Heat Sink (2) 5˚C/W Heat Sink (3) 15˚C/W Heat Sink (4) No Heat Sink (1) (3) (4) (2) 0 40 80 120 160 Ambient Temperature Ta (˚C) Power Dissipation PD (W) PD –Ta (AN79M00 Series) (1) Infinite Heat Sink (2) 5˚C/W Heat Sink (3) 15˚C/W Heat Sink (4) No Heat Sink (2) (3) (4) (1) n Basic Regulator Circuit n Application Circuit C I is connected when the input line is long. 2µF C O improves the transient Response. 1µF C O –V O C I –V I Input Output AN79M00/F Common AN78M00/F AN79M00/F –V O +V O 1µF 0.1µF 0.3µF 2µF Common Common CommonCT Input Output Input Output