54LS74 NSC | Alldatasheet

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Y Alternate military/aerospace device (54LS74) is avail- able. Contact a National Semiconductor Sales Office/ Distributor for specifications. Connection Diagram Dual-In-Line Package TL/F/6373–1 Order Number 54LS74DMQB, 54LS74FMQB, 54LS74LMQB, DM54LS74AJ, DM54LS74AW, DM74LS74AM or DM74LS74AN See NS Package Number E20A, J14A, M14A, N14A or W14B Function Table Inputs Outputs PR CLR CLK D Q Q LH X X HL HL X X LH LL X X H * H* HH u HH L HH u LL H HH L X Q 0 Q0 H e High Logic Level X e Either Low or High Logic Level L e Low Logic Level u e Positive-going Transition * e This configuration is nonstable; that is, it will not persist when either the preset and/or clear inputs return to their inactive (high) level. Q0 e The output logic level of Q before the indicated input conditions were established. C1995 National Semiconductor Corporation RRD-B30M105/Printed in U. S. A.

Absolute Maximum Ratings (Note) If Military/Aerospace specified devices are required, please contact the National Semiconductor Sales Office/Distributors for availability and specifications. Supply Voltage 7V Input Voltage 7V Operating Free Air Temperature Range DM54LS and 54LS b55§Ct o a125§C DM74LS 0 §Ct o a70§C Storage Temperature Range b65§Ct o a150§C Note: The ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaran- teed. The device should not be operated at these limits. The parametric values defined in the ‘‘Electrical Characteristics’’ table are not guaranteed at the absolute maximum ratings. The ‘‘Recommended Operating Conditions’’ table will define the conditions for actual device operation. Recommended Operating Conditions Symbol Parameter DM54LS74A DM74LS74A Units Min Nom Max Min Nom Max VCC Supply Voltage 4.5 5 5.5 4.75 5 5.25 V VIH High Level Input Voltage 2 2 V VIL Low Level Input Voltage 0.7 0.8 V IOH High Level Output Current b0.4 b0.4 mA IOL Low Level Output Current 4 8 mA fCLK Clock Frequency (Note 2) 0 25 0 25 MHz fCLK Clock Frequency (Note 3) 0 20 0 20 MHz tW Pulse Width Clock High 18 18 (Note 2) Preset Low 15 15 ns Clear Low 15 15 tW Pulse Width Clock High 25 25 (Note 3) Preset Low 20 20 ns Clear Low 20 20 tSU Setup Time (Notes 1 and 2) 20 u 20u ns tSU Setup Time (Notes 1 and 3) 25 u 25u ns tH Hold Time (Note 1 and 4) 0 u 0u ns TA Free Air Operating Temperature b55 125 0 70 §C Note 1: The symbol ( u) indicates the rising edge of the clock pulse is used for reference. Note 2: CL e 15 pF, R L e 2k X,T A e 25§C, and V CC e 5V. Note 3: CL e 50 pF, R L e 2k X,T A e 25§C, and V CC e 5V. Note 4: TA e 25§C and V CC e 5V.

Electrical Characteristics over recommended operating free air temperature range (unless otherwise noted) Symbol Parameter Conditions Min Typ Max Units(Note 1) VI Input Clamp Voltage V CC e Min, I I eb 18 mA b1.5 V VOH High Level Output V CC e Min, I OH e Max DM54 2.5 3.4 VVoltage V IL e Max, V IH e Min DM74 2.7 3.4 VOL Low Level Output V CC e Min, I OL e Max DM54 0.25 0.4 Voltage V IL e Max, V IH e Min DM74 0.35 0.5 V IOL e 4 mA, V CC e Min DM74 0.25 0.4 II Input Current @Max V CC e Max Data 0.1 Input Voltage V I e 7V Clock 0.1 mA Preset 0.2 Clear 0.2 IIH High Level Input V CC e Max Data 20 Current V I e 2.7V Clock 20 mA Clear 40 Preset 40 IIL Low Level Input V CC e Max Data b0.4 Current V I e 0.4V Clock b0.4 mA Preset b0.8 Clear b0.8 IOS Short Circuit V CC e Max DM54 b20 b100 mAOutput Current (Note 2) DM74 b20 b100 ICC Supply Current V CC e Max (Note 3) 4 8 mA Note 1: All typicals are at V CC e 5V, T A e 25§C. Note 2: Not more than one output should be shorted at a time, and the duration should not exceed one second. For devices, with feedback from the outputs, where shorting the outputs to ground may cause the outputs to change logic state an equivalent test may be performed where V O e 2.25V and 2.125V for DM54 and DM74 series, respectively, with the minimum and maximum limits reduced by one half from their stated values. This is very useful when using automatic test equipment. Note 3: With all outputs open, I CC is measured with CLOCK grounded after setting the Q and Q outputs high in turn. Switching Characteristics at V CC e 5V and T A e 25§C (See Section 1 for Test Waveforms and Output Load) From (Input) RL e 2k X Symbol Parameter To (Output) CL e 15 pF C L e 50 pF Units Min Max Min Max fMAX Maximum Clock Frequency 25 20 MHz tPLH Propagation Delay Time Clock to 25 35 nsLow to High Level Output Q or Q tPHL Propagation Delay Time Clock to 30 35 nsHigh to Low Level Output Q or Q tPLH Propagation Delay Time Preset 25 35 nsLow to High Level Output to Q tPHL Propagation Delay Time Preset 30 35 nsHigh to Low Level Output to Q tPLH Propagation Delay Time Clear 25 35 nsLow to High Level Output to Q tPHL Propagation Delay Time Clear 30 35 nsHigh to Low Level Output to Q

Physical Dimensions inches (millimeters) Ceramic Leadless Chip Carrier Package (E) Order Number 54LS74LMQB 14-Lead Ceramic Dual-In-Line Package (J) Order Number 54LS74DMQB or DM54LS74AJ

Physical Dimensions inches (millimeters) (Continued) 14-Lead Small Outline Molded Package (M) Order Number DM74LS74AM 14-Lead Molded Dual-In-Line Package (N) Order Number DM74LS74AN

54LS74/DM54LS74A/DM74LS74A Dual Positive-Edge-Triggered D Flip-Flops with Preset, Clear and Complementary Outputs Physical Dimensions inches (millimeters) (Continued) 14-Lead Ceramic Flat Package (W) Order Number 54LS74FMQB or DM54LS74AW LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant support device or system whose failure to perform can into the body, or (b) support or sustain life, and whose be reasonably expected to cause the failure of the life failure to perform, when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can effectiveness. be reasonably expected to result in a significant injury to the user. National Semiconductor National Semiconductor National Semiconductor National Semiconductor Corporation Europe Hong Kong Ltd. Japan Ltd.

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