74LS259

DM74LS259 FAIRCHILD | Alldatasheet

Document overview

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Technical content

Features

■ 8-Bit parallel-out storage register performs serial-to-par- allel conversion with storage ■ Asynchronous parallel clear ■ Active high decoder ■ Enable/disable input simplifies expansion ■ Direct replacement for Fairchild DM9334 ■ Expandable for N-bit applications ■ Four distinct functional modes ■ Typical propagation delay times: Enable-to-output 18 ns Data-to-output 16 ns Address-to-output 21 ns Clear-to-output 17 ns ■ Fan-out IOL (sink current) 8 mA IOH (source current) −0.4 mA ■ Typical ICC 22 mA Ordering Code: Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Order Number Package Number Package Description DM74LS259M M16A 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow DM74LS259WM M16B 16-Lead Small Outline Intergrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide DM74LS259N N16E 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide

www.fairchildsemi.com 2 DM74LS259 Connection Diagram Function Table Latch Selection Table H = HIGH Level L = LOW Level D = the Level of the Data Input Q i0 = the Level of Qi (i = 0, 1,…7, as Appropriate) before the Indicated Steady-State Input Conditions Were Established. Inputs Output of Each Addressed Other Function Clear E Latch Output HL D Q i0 Addressable Latch HH Q i0 Q i0 Memory L L D L 8-Line Demultiplexer L H L L Clear Select Inputs Latch C B A Addressed LLL 0 LLH 1 LHL 2 LHH 3 HLL 4 HLH 5 HHL 6 HHH 7

3 www.fairchildsemi.com DM74LS259 Absolute Maximum Ratings(Note 1) Note 1: The “Absolute Maximum Ratings” are those values beyond which the safety of the device cannot be guaranteed. The device should not be operated at these limits. The parametric values defined in the “Electrical Characteristics” table are not guaranteed at the absolute maximum ratings. The “Recommended Operating Conditions” table will define the conditions for actual device operation. Recommended Operating Conditions Note 2: The symbols (↓, ↑) indicate the edge of the clock pulse used for reference: ↑ for rising edge, ↓ for falling edge. Note 3: Setup and hold times are with reference to the enable input. Note 4: The select-to-enable setup time is the time before the HIGH-to-LOW enable transition that the select must be stable so that the correct latch is selected and the others not affected. Note 5: TA = 25°C and VCC = 5V.

Electrical Characteristics

over recommended operating free air temperature range (unless otherwise noted) Note 6: All typicals are at VCC = 5V, TA = 25°C. Note 7: Not more than one output should be shorted at a time, and the duration should not exceed one second. Note 8: ICC is measured with all inputs at 4.5V, and all outputs OPEN. Supply Voltage 7V Input Voltage 7V Operating Free Air Temperature Range 0°C to +70°C Storage Temperature Range −65°C to +150°C Symbol Parameter Min Nom Max Units V CC Supply Voltage 4.75 5 5.25 V VIH HIGH Level Input Voltage 2 V VIL LOW Level Input Voltage 0.8 V IOH HIGH Level Output Current −0.4 mA IOL LOW Level Output Current 8 mA tW Pulse Width Enable 15 ns(Note 5) Clear 15 tSU Setup Time Data 15 ↑ ns(Note 2)(Note 3)(Note 4)(Note 5) Select 15 ↓ tH Hold Time Data 2.5 ↑ ns(Note 2)(Note 3)(Note 5) Select 2.5 ↑ TA Free Air Operating Temperature 0 70 °C Symbol Parameter Conditions Min Typ Max Units (Note 6) VI Input Clamp Voltage V CC = Min, II = −18 mA −1.5 V VOH HIGH Level V CC = Min, IOH = Max 2.7 3.4 V Output Voltage V IL = Max, VIH = Min VOL LOW Level V CC = Min, IOL = Max 0.35 0.5 Output Voltage V IL = Max, VIH = Min V IOL = 4 mA, VCC = Min 0.25 0.4 II Input Current @ Max V CC = Max, VI = 7V 0.1 mA Input Voltage V I = 10V IIH HIGH Level Input Current V CC = Max, VI = 2.7V 20 µA IIL LOW Level Input Current V CC = Max, VI = 0.4V −0.4 mA Enable V CC = Max, VI = 0.4V −0.8 IOS Short Circuit Output Current V CC = Max (Note 7) −20 −100 mA ICC Supply Current V CC = Max (Note 8) 22 36 mA

www.fairchildsemi.com 4 DM74LS259 Switching Characteristics at VCC = 5V and TA = 25°C Symbol Parameter From (Input) C L = 50 pF UnitsTo (Output) R L = 2 kΩ Min Max tPLH Propagation Delay Time Enable to Output 38 ns LOW-to-HIGH Level Output tPHL Propagation Delay Time Enable to Output 32 ns HIGH-to-LOW Level Output tPLH Propagation Delay Time Data to Output 35 ns LOW-to-HIGH Level Output tPHL Propagation Delay Time Data to Output 30 ns HIGH-to-LOW Level Output tPLH Propagation Delay Time Select to Output 41 ns LOW-to-HIGH Level Output tPHL Propagation Delay Time Select to Output 38 ns HIGH-to-LOW Level Output tPHL Propagation Delay Time Clear to Output 36 ns HIGH-to-LOW Level Output

5 www.fairchildsemi.com DM74LS259 Physical Dimensions inches (millimeters) unless otherwise noted 16-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150 Narrow Package Number M16A 16-Lead Small Outline Intergrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M16B

www.fairchildsemi.com 6 DM74LS259 8-Bit Addressable Latches Physical Dimensions inches (millimeters) unless otherwise noted (Continued) 16-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N16E Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be rea- sonably expected to result in a significant injury to the user. 2. A critical component in any component of a life support device or system whose failure to perform can be rea- sonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com