2510-2510AT

2510-2510AT KEITHLEY | Alldatasheet

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A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) Precision temperature control for TECs with autotuning PID for optimal performance T he Models 2510 and 2510-AT TEC SourceMeter SMU instruments enhance Keithley’s CW (Continuous Wave) test solution for high speed LIV (light-current-voltage) testing of laser diode modules These 50W bipolar instruments were developed in close cooperation with leading manufacturers of laser diode modules for fiber- optic telecommunications networks Designed to ensure tight temperature control for the device under test, the Model 2510 was the first in a line of highly specialized instruments created for telecommunications laser diode testing It brings together Keithley’s expertise in high speed DC sourcing and measurement with the ability to control the operation of a laser diode module’s Thermo-Electric Cooler or TEC (sometimes called a Peltier device) accurately T he Model 2510-A T expands the capability of the Model 2510 by offering autotuning capability . I, and D (proportional, integral, and derivative) values for closed loop temperature control are deter - mined by the instrument using a modified Zeigler-Nichols algorithm . This eliminates the need for users to determine the optimal values for these coefficients experimentally . In all other respects, the Model 2510 and Model 2510-A T provide exactly the same set of features and capabilities . T he so urceMeter Concept The Model 2510 and Model 2510-AT draw upon Keithley’s unique Source M eter concept, which combines precision voltage/current sourcing and measurement functions into a single instrument S ourceMeter SMU instruments provide numerous advantages over the use of separate instruments, including lower acquisition and maintenance costs, the need for less rack space, easier system integra- tion and programming, and a broad dynamic range . Pa rt of a Comprehensive lI V Test sy stem In a laser diode CW test stand, the Model 2510 or Model 2510-AT can control the temperature of actively cooled optical components and assemblies (such as laser diode modules) to within ±0 05°C of the user-defined setpoint During testing, the instrument measures the internal temperature of the laser diode module from any of a variety of temperature sensors, then drives power through the TEC within the laser diode module in order to maintain its temperature at the desired setpoint fi gure 1. The capabilities of the Models 2510 and 2510- aT are intended to complement those of other Keithley instruments often used in laser diode module lI V testing, including the Model 2400 and 2420 so urceMeter sMu i nstruments, the Model 2502 Dual Photo d iode Meter, and the Model 2500INT Integrating s phere. Thermistor Peltier 2510 or 2510-AT 2400/ 2420 2502 Fiber 2500INT Computer GPIB Trigger Link or dering Information

2510 T EC so urceMeter

I nstrument a ccessories s upplied us er’s Manual, Input/ou tput Connector aCCEssorI E s aVaIl ablE 2510-RH R esistive Heater Adapter for Model 2510 2510-CAB -Wire Unshielded Cable, Phoenix Connector to Unterminated End 7007-1 S hielded IEEE-488 Cable, 1m (3 .3 f 7007-2 S hielded IEEE-488 Cable, 2m (6 .6 f KPCI-488LPA I EEE-488 Interface/Controller for the PCI Bus KUSB-488B I EEE-488 USB-to-GPIB Adapter for USB Port sEr VICEs aVaIl ablE 2510-3Y-EW 1 -year factory warranty extended to 3 years from date of shipment 2510-AT-3Y-EW -year factory warranty extended to 3 years from date of shipment C/2510-3Y-DATA 3 ( Z540-1 compliant) calibrations within 3 years of purchase for Models 2510, 2510-AT* *Not available in all countries 2510 2510- aT TEC SourceMeter ® SMU Instrument Autotuning TEC SourceMeter SMU Instrument

www.keithley.com 1.888.KEITHLEY (U.S. only) A Greater Measure of Confidence Active temperature control is very important due to the sensitivity of laser diodes to temperature changes If the temperature var- ies, the laser diode’s dominant output wavelength may change, leading to signal overlap and crosstalk problems a utotuning fu nction The Model 2510-A T Autotuning TEC SourceMeter SMU instru- ment offers manu f acturers the ability to automatically tune the temperature control loop required for CW test- ing of optoelectronic components such as laser diode modules and thermo-optic switches This capability eliminates the need for time-consum - ing experimentation to determine the optimal P-I-D coefficient values T he Model 2510-A T’s P-I-D Auto-Tune software employs a modified Ziegler-Nichols algorithm to determine the coefficients used to control the P-I-D loop This algorithm ensures that the final settling perturbations are damped by 25% each cycle of the oscillation The autotuning process begins with applying a voltage step input to the system being tuned (in open loop mode) and measuring several parameters of the system’s response to this voltage step function The system’s response to the step function is illus- trated in Figure 2 . The lag time of the system response, the maximum initial slope, and the TAU [63% (1/e)] response time are measured, then used to generate the Kp (proportional gain constant), Ki (integral gain constant), and Kd (derivative gain constant) coefficients T he autotuning function offers users a choice of a minimum settling time mode or a minimum overshoot mode, which provides the Model 2510 T with the flexibility to be used with a variety of load types and devices . For example, when controlling a large area TEC in a test fix - ture optimized for P, I, and D values, minimum overshoot protects the devices in the fixture from damage (Figure 3) For temperature setpoints that do not approach the maximum specified temperature for the device under test, the minimum settling time mode can be used to speed up the autotuning function (Figure 4) out put As the complexity of today’s laser diode modules increases, higher power levels are needed in t emperature controllers to address the module’s cooling needs during production test The 50W

• 5 0W TEC Controller combined with DC measurement functions
• fu lly digital P-I-D control
• au totuning capability for the thermal control loop (2510-aT
• D esigned to control temperature during laser diode module testing
• W ide temperature setpoint range (–50°C to +225°C) and high setpoint resolution (±0.001°C) and stability (±0.005°C) C ompatible with a variety of temperature sensor inputs— thermistors, rT Ds, and IC sensors
• M aintains constant temperature, current, voltage, and sensor resistance aC oh ms measurement function verifies integrity of TEC
• M easures and displays TEC parameters during the control cycle -wire open/short lead detection for thermal feedback element
• I EEE-488 and rs- 232 interfaces
• C ompact, half-rack design Temp TMAX Max. Initial Slope 63% Time T START TSL tL te fi gure 2. fi gure 4. fi gure 3. Laser Diode TEC Minimum Overshoot Time (s) Temp (°C) 05 10 15 20 25 Laser Diode TEC Minimum Settling Time Time (s) Temp (°C) 05 10 15 20 25 aPPlI C aT I oNs C ontrol and production testing of thermoelectric coolers (Peltier devices) in:
• lase r diode modules
• Ir charge-coupled device (CCD) arrays and charge- in jection devices (CID)
• C ooled photodetectors
• T hermal-optic switches
• T emperature controlled fixtures 2510 2510-aT TEC SourceMeter ® SMU Instrument Autotuning TEC SourceMeter SMU Instrument Precision temperature control for TECs with autotuning PID for optimal performance

A Greater Measure of Confidence www.keithley.com 1.888.KEITHLEY (U.S. only) Precision temperature control for TECs with autotuning PID for optimal performance (5A @ 10V) output allows for higher testing speeds and a wider tempera- ture setpoint range than other, lower-power s olutions . H igh st ability P-I-D Control When compared with other TEC controllers, which use less sophisticated P-I (proportional-integral) loops and hardware control mechanisms, this instrument’s software-based, fully digital P-I-D control provides greater temperature stability and can be easily upgraded with a simple firm w are change . The resulting temperature stability (±0 .0 05°C short term, ±0 .0 1°C long term) allows for very fine control over the output wavelength and optical power of the laser diode module during production testing of DC characteristics This improved stability gives users higher confi - dence in measured values, especially for components or sub-assemblies in wavelength multiplexed networks The derivative component of the instrument’s P-I-D control also reduces the required waiting time between making measurements at various temperature setpoints The temperature setpoint range of –50°C to +225°C covers most of the test requirements for production testing of cooled optical components and sub-assemblies, with a resolution of ±0 01°C . Before the introduction of the Model 2510-A T, configuring test systems for new module designs and fixtures required the user to determine the best combination of P, I, and D coefficients through trial-and-error experimenta - tion . The Model 2510-AT’s autotuning function uses the modified Zeigler- Nichols algorithm to determine the optimal P, I, and D v alues automatically . ad aptable to Evolving D uT r equirements The Model 2510 and Model 2510-AT are well suited for testing a wide range of laser diode modules because they are compatible with the types of temperature sensors most commonly used in these modules In addition to 100W, 1kW, 10kW, and 100kW thermistors, they can handle inputs from 100W or 1kW RTDs, and a variety of solid-state temperature sensors . T his input flexibility ensures their adaptability as the modules being tested evolve over time . P rogrammable se tpoints and li mits Users can assign temperature, current, voltage, and thermistor resistance setpoints The thermistor resistance setpoint feature allows higher cor - relation of test results with actual performance in the field for laser diode modules because reference resistors are used to control the temperature of the module Programmable power, current, and temperature limits offer maximum protection against damage to the device under test ac curate rea l-Time Measurements Both models can perform real-time measurements on the TEC, including TEC current, voltage drop, power dissipation, and resistance, providing valuable information on the operation of the thermal control system Pe ltier (TEC) oh ms Measurement TEC devices are easily affected by mechanical damage, such as sheer stress during assembly The most effective method to test a device for damage after it has been incorporated into a laser diode module is to perform a low-level AC (or reversing DC) ohms measurement If there is a change in the TEC’s resistance value when compared with the manufacturer’s speci- fication, mechanical damage is indicated Unlike a standard DC resistance measurement, where the current passing through the device can produce device heating and affect the measured resistance, the reversing DC ohms method does not and allows more accurate measurements op en/s hort le ad Detection Both models of the instrument use a four-wire measurement method to detect open/short leads on the temperature sensor before testing Four- wire measure men ts eliminate lead resistance errors on the measured value, reducing the possibility of false failures or device damage . I nterface op tions Like all newer Keithley instruments, both models of the instrument include standard IEEE-488 and RS-232 interfaces to speed and simplify system inte- gration and control op tional r esistive Heater ad apter The Model 2510-RH Resistive Heater Adapter enables either model of the instrument to provide closed loop temperature control for resistive heater elements, rather than for TECs When the adapter is installed at the instrument’s output terminal, current flows through the resistive heater when the P-I-D loop indicates heating However, no cur- rent will flow to the resistive heater when the temperature loop calls for cooling The resistive element is cooled through radiation, conduc- tion, or convection . fi gure 5. This graph compares the Model 2510/2510- aT ’s a/ D con- verter resolution and temperature stability with that of a leading com - petitive instrument. While the competitive instrument uses an analog proportional-integral (P-I) control loop, it displays information in digital format through a low-resolution analog-to-digital converter. In contrast, the Model 2510/2510- aT u ses a high-precision digital P-I-D control loop, which provides greater temperature stability, both over the short term (±0.005°C) and the long term (±0.01°C). Comparison Data -0.015 -0.01 -0.005 0.005 0.01 One Hour Interval

2510 Measured

® SMU Instrument Autotuning TEC SourceMeter SMU Instrument fi gure 6. op tional heater adapter

www.keithley.com 1.888.KEITHLEY (U.S. only) A Greater Measure of Confidence Model 2510, 2510-AT specifications THErMa l f EED baC K ElE MENT sPE CIfI CaT IoNs3 se nsor Type rT D Thermistor soli d st ate

100 W 1 kW 100 W 1 kW 10 kW 100 kW

out put (I ss) Voltage out put (V ss) Excitation13 2 .5 mA 4 V max 833 µA 2 .5 m A

8 V max

833 µA 100 µA 33 µA 6 .6 V m ax +13 .5 V 833 µA 2 .5 mA 15 .7 5V max Nominal Resistance Range 0–250 W 0–2 .5 0 kW 0–1 kW 0–10 kW 0–80 k W 0–200 k W Nominal Sensor Temperature Range –50° to +250°C –50° to +250°C –50° to +250°C –50° to +250°C –50° to +250°C –50° to +250°C –40° to +100°C –40° to +100°C C alibration α, β, δ settable α, β, δ settable A, B, C settable A, B, C settable A, B, C settable A, B, C settable Slope & offset Slope & offset Measurement Accuracy 1,3 THErMIsTo r MEa surE MENT aCCu raC Y19 Nominal Thermistor re sistance acc uracy vs. Temperature 0°C 25°C 50°C 100°C 100 W 0 .0 21°C 0 .0 35°C 0 .0 70°C 0 .27 °C kW 0 .0 15°C 0 .0 23°C 0 .0 45°C 0 .1 8°C kW 0 .0 06°C 0 .01 2°C 0 .0 26°C 0 .15 kW 0 .0 09°C 0 .0 14°C 0 .0 26°C 0 .13 o PEN/s H orT ED ElE MENT DETECTI o N SOFTWARE LINEARI zA TION FOR THERMISTOR AND RTD Common Mode Voltage: 30VDC . C ommon Mode Isolation: >10 9W, <1000pF . M ax. Voltage Drop Between Input/Output Sense Terminals: 1V M ax. Sense Lead Resistance: 100 W for rated accuracy . S ense Input Impedance: >10 8W . GENEral NOISE REjE CTION: sP EED N PlC NMr r16 CMrr17 Normal 1 .0 0 6 0 dB 1 20 dB1 SOURCE OUTPUT MODES: Fixed DC level . P ROGRAMMABILIT y: I EEE-488 (SCPI-1995 .0 ), RS-232, 3 user- d efinable power-up states plus factory default and *RST P OWER SUPPLy: 9 0V to 260V rms, 50–60Hz, 75W . E MC: Complies with European Union Directive 98/336/EEC (CE marking require m ents), FCC part 15 class B, CTSPR 11, IEC 801-2, IEC 801-3, IEC 801-4 . V IBRATION: MIL-PRF-28800F Class 3 Random Vibration . W ARM-UP: 1 hour to rated accuracies . D IMENSIONS, WEIGHT: 89mm high × 213 mm high × 370mm deep (3½ in × 8 3⁄8 in × 149 ⁄16 in) . Bench configu - ration (with handle and feet): 104mm high × 238mm wide × 370mm deep (4 1 ⁄8 in × 93⁄8 in × 149 ⁄16 in) . Net Weight: 3 .2 1kg (7 .0 8 lbs) . EN VIRONMENT: Operating: 0°–50°C, 70% R .H . up to 35°C . Derate 3% R .H ./ °C, 35°–50°C . Storage: –25° to 65°C . TEC ouTPuT sP ECIfI CaTIoNs OUTPUT RANGE: ±10VDC at up to ±5ADC .15 OUTPUT RIPPLE: <5mV rms 9 . A C RESISTANCE EXCITATION: ±(9 .6 mA ± 90µA) .14 TEC MEa sur E MENT sP ECI fI CaT IoN s3 function 1 Y ear, 23°C ±5°C Operating Resistance 2, 10, 11, 12 ±(2 .0 % of rdg + 0 .1W) O perating Voltage 2,10 ±(0 .1 % of rdg + 4mV) Operating Current 10 ±(0 .4 % of rdg + 8mA) AC Resistance 2, 18 ±(0 .1 0% of rdg + 0 .0 2W) OPEN SHORTED THERMOELECTRIC DETECTION LOAD IMPEDANCE: Stable into 1µF typical . CO MMON MODE VOLTAGE: 30VDC maximum . CO MMON MODE ISOLATION: >109W, <1500pF . M AX. VOLTAGE DROP BETWEEN INPUT/OUTPUT SENSE TERMINALS: 1V M AX. SENSE LEAD RESISTANCE: 1 W for rated accuracy . M AX. F ORCE LEAD RESISTANCE: 0 .1W . S ENSE INPUT IMPEDANCE: >400k W . sPE CI f ICaT IoNs The Models 2510 and 2510-AT TEC SourceMeter SMU instruments are designed to: Control the power to the TEC to maintain a constant temperature, current, voltage, or thermistor resistance M easure the resistance of the TEC . P rovide greater control and flexibility through a software P-I-D loop . CoN T r ol sYs TEM sPE CIfI CaT IoNs SET: Constant Peltier Temperature, Constant Peltier Voltage, Constant Peltier Current . C onstant Thermistor Resistance . CO NTROL METHOD: Programmable software PID loop . Proportional, Integral, and Derivative gains independently program m able . S ETPOINT SHORT TERM STABILIT y: ±0 .0 05°C rms1,6,7 . S ETPOINT LONG TERM STABILIT y: ±0 .01 °C1,6,8 . S ETPOINT RANGE: –50°C to 225°C . U PPER TEMPERATURE LIMIT: 250°C max . L OWER TEMPERATURE LIMIT: –50°C max . S ETPOINT RESOLUTION: ±0 .0 o f nominal (25°C) thermistor resistance . HA RDWARE CU RRENT LI MIT: 1 .0 A to 5 .2 5% . SO FTWARE VO LTAGE LI MIT:± 0 .5 t o 10 .5 V ±5% . NoT E s 1 . M odel 2510 and device under test in a regulated ambient temperature of 25°C . 2 . W ith remote voltage sense . 3 . 1 y ear, 23°C ±5°C . 4 . W ith ILoad = 5A and V Load = 0V . 5 . W ith ILoad = 5A and V Load = 10V . 6 . W ith 10kW thermistor as sensor . 7 . S hort term stability is defined as 24 hours with Peltier and Model 2510 at 25°C ±0 .5° C . 8 . L ong term stability is defined as 30 days with Peltier and Model 2510 at 25°C ±0 .5° C . 9 . 1 0Hz to 10MHz measured at 5A output into a 2 W load . 0 . C ommon mode voltage = 0V (meter connect enabled, connects Peltier low output to thermistor measure circuit ground) . ±(0 .1 % of rdg . 0 . 1W) with meter connect disabled . 1 . R esistance range 0 W to 20W for rated accuracy . 2 . C urrent through Peltier > 0 .2 A . 3 . D efault values shown, selectable values of 3µA, 10µA, 33µA, 100µA, 833µA, 2 .5 mA . Note that temperature control performance will degrade at lower c urrents . 4 . A C o hms is a dual pulsed meas u rement using current reversals avail - able over bus only . 5 . S ettable to <400µV and <200µA in constant V and constant I m ode respectively . 6 . F or line frequency ±0 .1 % . 7 . F or 1kW unbalance in LO l ead . 8 . R esistance range 0 W to 100 W for rated accuracy . . Accuracy figures represent the uncertainty that the Model 2510 may add to the temperature measurement, not including thermistor uncertainty . These accuracy figures are for thermistors with typical A,B,C constants . 2510 2510-aT TEC SourceMeter ® SMU Instrument Autotuning TEC SourceMeter SMU Instrument