MSPM0L1306-Q1_V02 TI | Alldatasheet

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MSPM0L130x-Q1 Automotive Mixed-Signal Microcontrollers

1 Features

  • AEC-Q100 qualified for automotive applications – Temperature grade 1: –40°C to +125°C, TA
  • Core – Arm® 32-bit Cortex®-M0+ CPU, frequency up to

32 MHz

  • Operating characteristics – Wide supply voltage range: 1.62 V to 3.6 V
  • Memories – Up to 64KB of flash – Up to 4KB of SRAM
  • High-performance analog peripherals – One 12-bit 1.68-Msps analog-to-digital converter (ADC) with up to 10 total external channels – Configurable 1.4-V or 2.5-V internal ADC voltage reference (VREF) – Two zero-drift, zero-crossover chopper operational amplifiers (OPA)
  • 0.5-µV/°C drift with chopping
  • Integrated programmable gain stage (1-32x) – One general-purpose amplifier (GPAMP) – One high-speed comparator (COMP) with 8-bit reference DAC
  • 32-ns propagation delay
  • Low power mode down to <1-µA – Programmable analog connections between ADC, OPAs, COMP, and DAC – Integrated temperature sensor
  • Optimized low-power modes – RUN: 71 µA/MHz (CoreMark) – STOP: 151 µA at 4 MHz and 44 µA at 32 kHz – STANDBY: 1.0 µA with 32-kHz 16-bit timer running, SRAM/registers fully retained, and 32MHz clock wakeup in 3.2µs – SHUTDOWN: 61 nA with IO wakeup capability
  • Intelligent digital peripherals – 3-channel DMA controller – 3-channel event fabric signaling system – Four 16-bit general-purpose timers, each with two capture/compare registers supporting low- power operation in STANDBY mode, supporting a total of 8 PWM channels – Windowed watchdog timer
  • Enhanced communication interfaces – Two UART interfaces; one supports LIN, IrDA, DALI, Smart Card, Manchester and both support low-power operation in STANDBY – Two I2C interfaces; one supports FM+ (1 Mbit/s) and both support SMBus, PMBus, and wakeup from STOP – One SPI supports up to 16 Mbit/s
  • Clock system – Internal 4- to 32-MHz oscillator with ±1.2% accuracy (SYSOSC) – Internal 32-kHz low-frequency oscillator with ±3% accuracy (LFOSC)
  • Data integrity – Cyclic redundancy checker (CRC-16 or CRC-32)
  • Flexible I/O features – Up to 28 GPIOs – Two 5-V-tolerant open-drain IOs with fail-safe protection
  • Development support – 2-pin serial wire debug (SWD)
  • Package options – 32-pin VQFN (RHB) – 32-pin VSSOP (DGS) – 28-pin VSSOP (DGS) – 24-pin VQFN (RGE) – 20-pin VSSOP (DGS) – 16-pin SOT(DYY)
  • Family members (also see Device Comparison) – MSPM0L1304: 16KB of flash, 2KB of RAM – MSPM0L1305: 32KB of flash, 4KB of RAM – MSPM0L1306: 64KB of flash, 4KB of RAM
  • Development kits and software (also see Tools and Software) – LP-MSPM0L1306 LaunchPad™ development kit – MSP Software Development Kit (SDK)

2 Applications

  • Automotive body electronics and Lighting
  • Automotive Gateway
  • Steering Wheel Systems
  • Automotive Motor Control
  • DC to AC Inverters
  • Automotive Interior Lighting
  • Door handle modules
  • Kick to open modules
  • Vehicle Occupancy Detection
  • Seat Comfort Module ADVANCE INFORMATION MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. ADVANCE INFORMATION for preproduction products; subject to change without notice.

3 Description

MSPM0L130x microcontrollers (MCUs) are part of the MSP highly-integrated, ultra-low-power 32-bit MSPM0 MCU family based on the enhanced Arm® Cortex®-M0+ core platform operating at up to 32-MHz frequency. These cost-optimized MCUs offer high-performance analog peripheral integration, support extended temperature ranges from -40°C to 125°C, and operate with supply voltages ranging from 1.62 V to 3.6 V. The MSPM0L130x devices provide up to 64KB embedded flash program memory with up to 4KB SRAM. These MCUs incorporate a high-speed on-chip oscillator with an accuracy up to ±1.2%, eliminating the need for an external crystal. Additional features include a 3-channel DMA, 16- and 32-bit CRC accelerator, and a variety of high-performance analog peripherals such as one 12-bit 1.68-MSPS ADC with configurable internal voltage reference, one high-speed comparator with built-in reference DAC, two zero-drift zero-crossover operational amplifiers with programmable gain, one general-purpose amplifier, and an on-chip temperature sensor. These devices also offer intelligent digital peripherals such as four 16-bit general purpose timers, one windowed watchdog timer, and a variety of communication peripherals including two UARTs, one SPI, and two I 2Cs. These communication peripherals offer protocol support for LIN, IrDA, DALI, Manchester, Smart Card, SMBus, and PMBus. The TI MSPM0 family of low-power MCUs consists of devices with varying degrees of analog and digital integration allowing for customers find the MCU that meets their project's needs. The architecture combined with extensive low-power modes are optimized to achieve extended battery life in portable measurement applications. MSPM0L130x MCUs are supported by an extensive hardware and software ecosystem with reference designs and code examples to get the design started quickly. Development kits include a LaunchPad™ development kit available for purchase and design files for a target-socket board. TI also provides a free MSP Software Development Kit (SDK), which is available as a component of Code Composer Studio™ IDE desktop and cloud version within the TI Resource Explorer . MSPM0 MCUs are also supported by extensive online collateral, training with MSP Academy, and online support through the TI E2E™ support forums. For complete module descriptions, see the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. CAUTION System-level ESD protection must be applied in compliance with the device-level ESD specification to prevent electrical overstress or disturbing of data or code memory. See MSP430™ System-Level ESD Considerations for more information; the principles in this application note are applicable to MSPM0 MCUs. MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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4 Functional Block Diagram

fmax = 32 MHz NVIC SWD IOPORT AHB BUS (MCLK) FLASH Up to 64KB SRAM Up to 4KB ROM BCR, BSL CPU-ONLY PD1 PERIPHERAL BUS (MCLK) SPI0 PD1 PERIPHERAL BUS (MCLK) CRC 16/32-bit GPIO Up to 28 tIOBUSt PD0 PERIPHERAL BUS (ULPCLK) ADC0 12-bit TIMG0 TIMG1 TIMG2 TIMG4 UART0 I2C0 I2C1 IOMUX PMCU (SYSCTL) GPAMP FLASHCTL ULPCLK ULPCLK PD1, CPU ACCESS ONLY PD1, CPU/DMA ACCESS PD1/PD0, CPU/DMA ACCESS PD0, CPU/DMA ACCESS LEGEND EVENT 3-ch WWDT0 VREF to ADC PD0 PERIPHERAL BUS (ULPCLK) OPA0 OPA1 COMP0 TEMP SENSOR SYSOSC LFOSC CKM LDO PMU BOR POR VBOOST DEBUG TX, RX, CTS, RTS SDA, SCL SDA, SCL 2-CH 2-CH 2-CH IN+, IN-, OUT IN+, IN-, OUT IN+, IN-, OUT IN+, IN-, OUT VREF+, VREF- 10-CH (EXT) A0_x POCI, PICO, SCK, CSx PAx ROSC, CLK_OUT, FCC_IN VDD, VSS VCORE, NRST COMP0 includes an 8b reference DAC with connection to OPA 2-CH UART1TX, RX, CTS, RTS SWCLK, SWDIO TI MSPM0L13xx Microcontrollers Figure 4-1. MSPM0L130x Functional Block Diagram www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 3

11 Mechanical, Packaging, and Orderable

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5 Device Comparison

Table 5-1. Device Comparison DEVICE NAME (1) (2) FLASH / SRAM (KB) QUAL(3) ADC CH. COMP OPA GPAMP UART/I2C/SPI TIMG GPIOs 5-V TOL. IO PACKAGE [PACKAGE SIZE] (4) M0L1306QRHBQ1 64 / 4 Q 10 1 2 1 2 / 2 / 1 4 28 2 32 VQFN [5 mm × 5 mm] (5)M0L1305QRHBQ1 32 / 4 M0L1304QRHBQ1 16 / 2 M0L1306QDGS32Q1 64 / 4 Q 10 1 2 1 2 / 2 / 1 4 28 2 32 VSSOP [8.1 mm × 4.9 mm]M0L1305QDGS32Q1 32 / 4 M0L1304QDGS32Q1 16 / 2 M0L1306QDGS28Q1 64 / 4 Q 10 1 2 1 2 / 2 / 1 4 24 2 28 VSSOP [7.1 mm × 4.9 mm]M0L1305QDGS28Q1 32 / 4 M0L1304QDGS28Q1 16 / 2 M0L1304QRGEQ1 32 / 4 Q 9 1 2 1 2 / 2 / 1 4 20 2 24 VQFN 4 mm × 4 mmM0L1305QRGEQ1 16 / 2 M0L1306QRGEQ1 8 / 2 M0L1306QDGS20Q1 64 / 4 Q 8 1 2 1 2 / 2 / 1 4 17 2 20 VSSOP [5.1 mm × 4.9 mm]M0L1305QDGS20Q1 32 / 4 M0L1304QDGS20Q1 16 / 2 M0L1306QDYYQ1 64 / 4 Q 6 1 2 1 2 / 2 / 1 4 13 2 16 SOT [4.2 mm × 2 mm]M0L1305QDYYQ1 32 / 4 M0L1304QDYYQ1 16 / 2 (1) For the most current part, package, and ordering information for all available devices, see the Package Option Addendum in Section 11, or see the TI website. (2) For more information about the device name, see Section 10.2. (3) Device qualifications:

  • Q = –40°C to 125°C (4) The package size (length × width) is a nominal value and includes pins, where applicable. For the package dimensions with tolerances, see the Mechanical Data in Section 11. (5) The 24 and 32-pin VQFN package is available with wettable flanks. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 5

6 Pin Configuration and Functions

6.1 Pin Diagrams

High-Speed I/O (HSIO) 5-V Tolerant Open-Drain I/O (ODIO) Figure 6-1. Pin Diagram Color Coding VQFN32 Thermal pad PA20 / SWCLK / A6 PA19 / SWDIO PA18 / A7 PA17 PA16 / A8 PA15 / A9 PA14 PA13 PA0 PA1 NRST VDD VSS PA2 / ROSC PA3 PA4 PA5 PA6 PA7 PA8 PA9 PA10 PA11 PA12 VCORE PA27 / A0 PA26 / A1 PA25 / A2 PA24 / A3 PA23 / VREF+ PA22 / A4 PA21 / A5 / VREF- Figure 6-2. 32-Pin RHB (VQFN) (Top View) - MSPM0L130x VSSOP28 PA25 / A2 PA24 / A3 PA23 / VREF+ PA22 / A4 PA21 / A5 / VREF- PA20 / A6 / SWCLK PA19 / SWDIO PA18 / A7 PA17 PA16 / A8 PA15 / A9 PA14 PA11 PA10 PA26 / A1 PA27 / A0 VCORE PA0 PA1 NRST VDD VSS PA2 / ROSC PA3 PA4 PA5 PA6 PA9 Figure 6-3. 28-Pin DGS28 (VSSOP) (Top View) - MSPM0L130x VQFN24 Thermal pad PA22 / A4 PA21 / A5 / VREF- PA20 / A6 / SWCLK PA19 / SWDIO PA18 / A7 PA17 PA1 NRST VDD VSS PA2 / ROSC PA3 PA4 PA9 PA10 PA11 PA15 / A9 PA16 / A8 PA0 VCORE PA26 / A1 PA25 / A2 PA24 / A3 PA23 / VREF+ Figure 6-4. 24-Pin (VQFN) (Top View) -MSPM0L130x VSSOP32 PA23 / VREF+ PA22 / A4 PA21 / A5 / VREF- PA20 / A6 / SWCLK PA19 / SWDIO PA18 / A7 PA17 PA16 / A8 PA15 / A9 PA14 PA13 PA12 PA11 PA10 PA26 / A1 PA27 / A0 VCORE PA0 PA1 NRST VDD VSS PA2 / ROSC PA3 PA4 PA5 PA6 PA7 PA8 PA9 PA24 / A3 PA25 / A2 Figure 6-5. 32-Pin DGS32 (VSSOP) (Top View) - MSPM0L130x MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Figure 6-6. 20-Pin DGS20 (VSSOP) (Top View) - MSPM0L130x SOT16 8 9

16 PA25 / A2

Figure 6-7. 16-Pin DYY (SOT) (Top View) - MSPM0L130x

6.2 Pin Attributes

The following table describes the functions available on every pin for each device package. Note Each digital I/O on a device is mapped to a specific Pin Control Management Register (PINCMx) which allows users to configure the desired Pin Function using the PINCM.PF control bits. Table 6-1. Pin Attributes PINCMx PIN NAME PIN FUNCTION PIN NUMBER I/O STRUCTUREANALOG DIGITAL (1)

32 VQFN

32 VSSOP

28 VSSOP

24 VQFN

20 VSSOP

16 SOT

N/A N/A VDD 4 7 7 3 6 5 Power N/A N/A VSS 5 8 8 4 7 6 Power N/A N/A VCORE 32 3 3 23 3 2 Power

1 PA0

UART1_TX [1] / I2C0_SDA [2] / TIMG1_C0 [3] / SPI0_CS1 [4] (Default BSL I2C_SDA) 1 4 4 24 4 3 5-V tolerant Open-Drain

2 PA1 UART1_RX [1] / I2C0_SCL [2] /

TIMG1_C1 [3] (Default BSL I2C_SCL) 2 5 5 1 5 4 5-V tolerant Open-Drain N/A N/A NRST 3 6 6 2 Reset(2)

3 PA2 ROSC TIMG1_C1 [1] / SPI0_CS0 [2] 6 9 9 5 8 7 Standard

4 PA3 TIMG2_C0 [1] / SPI0_CS1 [2] /

UART1_CTS [3] / COMP0_OUT [4] 7 10 10 6 – – Standard

5 PA4 TIMG2_C1 [1] / SPI0_POCI [2] /

UART1_RTS [3] 8 11 11 7 9 – Standard

6 PA5 TIMG0_C0 [1] / SPI0_PICO [2] 9 12 12 – – – High-Speed

7 PA6 TIMG0_C1 [1] / SPI0_SCK [2] 10 13 13 – 10 8 Standard

8 PA7 COMP0_OUT [1] / CLK_OUT [2] /

TIMG1_C0 [3] 11 14 – – – – Standard

9 PA8 UART0_TX [1] / SPI0_CS0 [2] /

UART1_RTS [3] / TIMG2_C0 [4] 12 15 – – – – Standard

10 PA9 UART0_RX [1] / SPI0_PICO [2] /

UART1_CTS [3] / TIMG2_C1 [4] 13 16 14 8 – – Standard

11 PA10 UART1_TX [1] / SPI0_POCI [2] /

I2C0_SDA [3] / TIMG4_C0 [4] 14 17 15 9 – – High-Speed

12 PA11

UART1_RX [1] / SPI0_SCK [2] / I2C0_SCL [3] / TIMG4_C1 [4] / COMP0_OUT [5] 15 18 16 10 11 – Standard

13 PA12 UART0_CTS [1] / TIMG0_C0 [2] 16 19 – – – – Standard

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Table 6-1. Pin Attributes (continued) PINCMx PIN NAME PIN FUNCTION PIN NUMBER I/O STRUCTUREANALOG DIGITAL (1)

14 PA13 UART0_RTS [1] / TIMG0_C1 [2] /

UART1_RX [3] 17 20 – – – – Standard

15 PA14 UART1_CTS [1] / CLK_OUT [2] /

UART1_TX [3] / TIMG1_C0 [4] 18 21 17 – – – Standard

16 PA15 A9 UART1_RTS [1] / I2C1_SCL [2] /

SPI0_CS2 [3] / TIMG4_C1 [4] 19 22 18 11 – – Standard

17 PA16 A8 /

OPA1_OUT COMP0_OUT [1] / I2C1_SDA [2] / SPI0_POCI [3] / TIMG0_C0 [4] 20 23 19 12 12 – Standard PA17 OPA1_IN1- UART0_TX [1] / I2C1_SCL [2] / SPI0_SCK [3] / TIMG4_C0 [4] / SPI0_CS1 [5] 21 20 13 13 9 Standard with wake N/A OPA1_IN0- N/A N/A OPA1_IN0- – – – – 13 – Analog

19 PA18

OPA1_IN0+ / GPAMP_IN- UART0_RX [1] / SPI0_PICO [2] / I2C1_SDA [3] / TIMG4_C1 [4] (BSL Invoke) 22 25 21 14 14 10 Standard with wake

20 PA19 SWDIO [1] / I2C1_SDA [2] / SPI0_POCI

[3] 23 26 22 15 15 11 High-Speed

21 PA20 A6 /

COMP0_IN1+ SWCLK [1] / I2C1_SCL [2] / TIMG4_C0 [3] 24 27 23 16 16 12 Standard

22 PA21 A5 / VREF- TIMG2_C0 [1] / UART0_CTS [2] /

UART0_TX [3] 25 28 24 17 – – Standard

23 PA22

GPAMP_OUT / OPA0_OUT UART0_RX [1] / TIMG2_C1 [2] / UART0_RTS [3] / CLK_OUT [4] / UART1_RX [5] (Default BSL UART_RX) 26 29 25 18 17 13 Standard

24 PA23 VREF+ /

COMP0_IN1- UART0_TX [1] / SPI0_CS3 [2] / TIMG0_C0 [3] / UART0_CTS [4] / UART1_TX [5] (Default BSL UART_TX) 27 30 26 19 18 14 Standard

25 PA24

OPA0_IN1- / OPA0_IN0- SPI0_CS2 [1] / TIMG0_C1 [2] / UART0_RTS [3] 28 31 27 20 19 15 Standard N/A N/A OPA0_IN0- – – – – 19 – Analog

26 PA25 A2 /

OPA0_IN0+ TIMG4_C1 [1] / UART0_TX [2] / SPI0_PICO [3] 29 32 28 21 20 16 Standard

27 PA26

GPAMP_IN+ / COMP0_IN0+ TIMG1_C0 [1] / UART0_RX [2] / SPI0_POCI [3] 30 1 1 22 1 1 Standard

28 PA27 A0 /

COMP0_IN0- TIMG1_C1 [1] / SPI0_CS3 [2] 31 2 2 – 2 – Standard (1) PINCM.PF and PINCM.PC in IOMUX must be set to 0 for analog functions (for example, OPA inputs or outputs or COMP inputs). Each digital I/O on a device is mapped to a specific Pin Control Management Register (PINCMx) which lets software configure the desired Pin Function using the PINCM.PF control bits. (2) Reset PIN is muxed with PA1 for 16-pin and 20-pin devices. Table 6-2. Digital IO Features by IO Type IO STRUCTURE INVERSION CONTROL DRIVE STRENGTH CONTROL HYSTERESIS CONTROL PULLUP RESISTOR PULLDOWN RESISTOR WAKEUP LOGIC Standard drive Y Y Y Standard drive with wake Y Y Y Y High speed Y Y Y Y MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Table 6-2. Digital IO Features by IO Type (continued) IO STRUCTURE INVERSION CONTROL DRIVE STRENGTH CONTROL HYSTERESIS CONTROL PULLUP RESISTOR PULLDOWN RESISTOR WAKEUP LOGIC 5-V tolerant open drain Y Y Y Y

6.3 Signal Descriptions

Table 6-3. Signal Descriptions FUNCTION SIGNAL NAME PIN NO.(1) PIN TYPE (2) DESCRIPTION A0 31 2 2 – 2 – I ADC0 analog input 0 A1 30 1 1 22 1 1 I ADC0 analog input 1 A2 29 32 28 21 20 16 I ADC0 analog input 2 A3 28 31 27 20 19 15 I ADC0 analog input 3 A4 26 29 25 18 17 13 I ADC0 analog input 4 A5 25 28 24 17 – – I ADC0 analog input 5 A6 24 27 23 16 16 12 I ADC0 analog input 6 A7 22 25 21 14 14 10 I ADC0 analog input 7 A8 20 23 19 12 12 – I ADC0 analog input 8 A9 19 22 18 11 – – I ADC0 analog input 9 BSL BSL_invoke 22 25 21 14 14 10 I Input pin used to invoke bootloader BSL (I2C) BSLSCL 2 5 5 1 5 4 I/O Default I2C BSL clock BSLSDA 1 4 4 24 4 3 I/O Default I2C BSL data BSL (UART) BSLRX 26 29 25 18 17 13 I Default UART BSL receive BSLTX 27 30 26 19 18 14 O Default UART BSL transmit Clock CLK_OUT 17 13 O Configurable clock output ROSC 6 9 9 5 8 7 I External resistor used for improving oscillator accuracy Comparator COMP0_IN0- 31 2 2 – 2 – I Comparator 0 inverting input 0 COMP0_IN0+ 30 1 1 22 1 1 I Comparator 0 non-inverting input 0 COMP0_IN1- 27 30 26 19 18 14 I Comparator 0 inverting input 1 COMP0_IN1+ 24 27 23 16 16 12 I Comparator 0 non-inverting input 1 COMP0_OUT 12 – O Comparator 0 output Debug SWCLK 24 27 23 16 16 12 I Serial wire debug input clock SWDIO 23 26 22 15 15 11 I/O Serial wire debug data input/output General- Purpose Amplifier GPAMP_IN+ 30 1 1 22 1 1 I GPAMP non-inverting terminal input GPAMP_OUT 26 29 25 14 17 13 O GPAMP output GPAMP_IN- 22 25 21 18 14 10 I GPAMP inverting terminal input www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 9

Table 6-3. Signal Descriptions (continued) FUNCTION SIGNAL NAME PIN NO.(1) PIN TYPE (2) DESCRIPTION PA0 1 4 4 24 4 3 I/O General-purpose digital I/O with wake up from SHUTDOWN PA1 2 5 5 1 5 4 I/O General-purpose digital I/O with wake up from SHUTDOWN PA2 6 9 9 5 8 7 I/O General-purpose digital I/O PA3 7 10 10 6 – – I/O General-purpose digital I/O PA4 8 11 11 7 9 – I/O General-purpose digital I/O PA5 9 12 12 – – – I/O General-purpose digital I/O PA6 10 13 13 – 10 8 I/O General-purpose digital I/O PA7 11 14 – – – – I/O General-purpose digital I/O PA8 12 15 – – – – I/O General-purpose digital I/O PA9 13 16 14 8 – – I/O General-purpose digital I/O PA10 14 17 15 9 – – I/O General-purpose digital I/O PA11 15 18 16 10 11 – I/O General-purpose digital I/O PA12 16 19 – – – – I/O General-purpose digital I/O PA13 17 20 – – – – I/O General-purpose digital I/O PA14 18 21 17 – – – I/O General-purpose digital I/O PA15 19 22 18 11 – – I/O General-purpose digital I/O PA16 20 23 19 12 12 – I/O General-purpose digital I/O PA17 21 24 20 13 13 9 I/O General-purpose digital I/O with wake up from SHUTDOWN PA18 22 25 21 14 14 10 I/O General-purpose digital I/O with wake up from SHUTDOWN PA19 23 26 22 15 15 11 I/O General-purpose digital I/O PA20 24 27 23 16 16 12 I/O General-purpose digital I/O PA21 25 28 24 17 – – I/O General-purpose digital I/O PA22 26 29 25 18 17 13 I/O General-purpose digital I/O PA23 27 30 26 19 18 14 I/O General-purpose digital I/O PA24 28 31 27 20 19 15 I/O General-purpose digital I/O PA25 29 32 28 21 20 16 I/O General-purpose digital I/O PA26 30 1 1 22 1 1 I/O General-purpose digital I/O PA27 31 2 2 – 2 – I/O General-purpose digital I/O I2C I2C0_SCL 2 11 4 I/O I2C0 serial clock I2C0_SDA 1 9 4 3 I/O I2C0 serial data I2C1_SCL

12 I/O I2C1 serial clock

I2C1_SDA

11 I/O I2C1 serial data

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Table 6-3. Signal Descriptions (continued) FUNCTION SIGNAL NAME PIN NO.(1) PIN TYPE (2) DESCRIPTION (Zero-Drift Op- Amp) OPA0_IN0+ 29 32 28 21 20 16 I OPA0 non-inverting terminal input 0 OPA0_IN0- 28 31 27 20 19 15 I OPA0 inverting terminal input 0 OPA0_IN1- 28 31 27 20 19 15 I OPA0 inverting terminal input 1 OPA0_OUT 26 29 25 18 17 13 O OPA0 output OPA1_IN0+ 22 25 21 14 14 10 I OPA1 non-inverting terminal input 0 OPA1_IN0- 21 24 20 13 13 9 I OPA1 inverting terminal input 0 OPA1_IN1- 21 24 20 13 13 9 I OPA1 inverting terminal input 1 OPA1_OUT 20 23 19 12 12 – O OPA1 output Power VSS 5 8 8 4 7 6 P Ground supply VDD 4 7 7 3 6 5 P Power supply VCORE 32 3 3 23 3 2 P Regulated core power supply output QFN Pad Pad – – Pad – – P QFN package exposed thermal pad. TI recommends connection to VSS. SPI SPI0_CS0 6 15 9 5 8 7 I/O SPI0 chip-select 0 SPI0_CS1

9 I/O SPI0 chip-select 1

SPI0_CS2 19 20 19 15 I/O SPI0 chip-select 2 SPI0_CS3 27 26 19 2 18 14 I/O SPI0 chip-select 3 SPI0_SCK

9 I/O SPI0 clock signal input – SPI peripheral mode

Clock signal output – SPI controller mode SPI0_POCI

11 I/O SPI0 controller in/peripheral out

SPI0_PICO

16 I/O SPI0 controller out/peripheral in

System NRST 3 6 6 2 5 4 I Reset input active low www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 11

Table 6-3. Signal Descriptions (continued) FUNCTION SIGNAL NAME PIN NO.(1) PIN TYPE (2) DESCRIPTION TIMG0_C0 18 14 I/O General purpose timer 0 CCR0 capture input/ compare output TIMG0_C1 27 20 10

15 I/O General purpose timer 0 CCR1 capture input/

TIMG1_C0

3 I/O General purpose timer 1 CCR0 capture input/

TIMG1_C1

7 I/O General purpose timer 1 CCR1 capture input/

TIMG2_C0 17 – – I/O General purpose timer 2 CCR0 capture input/ compare output TIMG2_C1 17 13 I/O General purpose timer 2 CCR1 capture input/ compare output TIMG4_C0

12 I/O General purpose timer 4 CCR0 capture input/

TIMG4_C1

16 I/O General purpose timer 4 CCR1 capture input/

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Table 6-3. Signal Descriptions (continued) FUNCTION SIGNAL NAME PIN NO.(1) PIN TYPE (2) DESCRIPTION UART0_TX O UART0 transmit data UART0_RX I UART0 receive data UART0_CTS 19 18 14 I UART0 "clear to send" flow control input UART0_RTS

15 O UART0 "request to send" flow control output

UART1_TX

14 O UART1 transmit data

UART1_RX

13 I UART1 receive data

UART1_CTS 8 – – I UART1 "clear to send" flow control input UART1_RTS 11 9 – O UART1 "request to send" flow control output Voltage Reference(3) VREF+ 27 30 26 19 18 14 I Voltage reference power supply - external reference input VREF- 25 28 24 17 – – I Voltage reference ground supply - external reference input (1) – = not available (2) I = input, O = output, I/O = input or output, P = power (3) When using VREF+ and VREF- to bring in an external voltage reference for analog peripherals such as the ADC, a decoupling capacitor must be placed on VREF+ to VREF-/GND with a capacitance based on the external reference source

6.4 Connections for Unused Pins

Table 6-4 lists the correct termination of unused pins. Table 6-4. Connection of Unused Pins PIN (1) POTENTIAL COMMENT PAx Open Set corresponding pin functions to GPIO (PINCMx.PF = 0x1) and configure unused pins to output low or input with internal pullup or pulldown resistor. NRST VCC NRST is an active-low reset signal; the pin must be pulled high to VCC or the device cannot start. For more information, see Section 9.1. (1) Any unused pin with a function that is shared with general-purpose I/O must follow the "PAx" unused pin connection guidelines. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 13

7 Specifications

7.1 ESD Ratings

V(ESD) Electrostatic discharge Human body model (HBM), per AEC-Q100-002(3) ±2000 V Charged device model (CDM), per AEC- Q100-011 , All pins ±500 V Charged device model (CDM), per AEC- Q100-011 , Corner pins ±750 V (1) AEC Q100-002 indicates that HBM stressing shall be in accordance with the ANSI/ESDA/JEDEC JS-001 specification.

7.2 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT VDD Supply voltage 1.62 3.6 V VCORE Voltage on VCORE pin (2) 1.35 V CVDD Capacitor placed between VDD and VSS (1) 10 uF CVCORE Capacitor placed between VCORE and VSS (1) (2) 470 nF TA Ambient temperature, Q version -40 125 °C TJ Max junction temperature, Q version 130 °C fMCLK MCLK, CPUCLK, ULPCLK frequency with 1 flash wait state (3) 32 MHz MCLK, CPUCLK, ULPCLK frequency with 0 flash wait states (3) 24 (1) Connect CVDD and CVCORE between VDD/VSS and VCORE/VSS, respectively, as close to the device pins as possible. A low-ESR capacitor with at least the specified value and tolerance of ±20% or better is required for CVDD and CVCORE. (2) The VCORE pin must only be connected to CVCORE. Do not supply any voltage or apply any external load to the VCORE pin. (3) Wait states are managed automatically by the system controller (SYSCTL) and do not need to be configured by application software.

7.3 Thermal Information

THERMAL METRIC(1) PACKAGE VALUE UNIT RθJA Junction-to-ambient thermal resistance VQFN-32 (RHB) 36.3 °C/W RθJC(top) Junction-to-case (top) thermal resistance 28.5 °C/W RθJB Junction-to-board thermal resistance 17.2 °C/W ΨJT Junction-to-top characterization parameter 0.8 °C/W ΨJB Junction-to-board characterization parameter 17.2 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 6.9 °C/W RθJA Junction-to-ambient thermal resistance VSSOP-32 (DGS32) TBD °C/W RθJC(top) Junction-to-case (top) thermal resistance TBD °C/W RθJB Junction-to-board thermal resistance TBD °C/W ΨJT Junction-to-top characterization parameter TBD °C/W ΨJB Junction-to-board characterization parameter TBD °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance TBD °C/W RθJA Junction-to-ambient thermal resistance VSSOP-28 (DGS28) 78.9 °C/W RθJC(top) Junction-to-case (top) thermal resistance 38.6 °C/W RθJB Junction-to-board thermal resistance 41.3 °C/W ΨJT Junction-to-top characterization parameter 3.4 °C/W ΨJB Junction-to-board characterization parameter 41.0 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.3 Thermal Information (continued)

THERMAL METRIC(1) PACKAGE VALUE UNIT RθJA Junction-to-ambient thermal resistance VQFN-24 (RGE) 44.7 °C/W RθJC(top) Junction-to-case (top) thermal resistance 38.1 °C/W RθJB Junction-to-board thermal resistance 21.9 °C/W ΨJT Junction-to-top characterization parameter 1.1 °C/W ΨJB Junction-to-board characterization parameter 21.9 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance 7.1 °C/W RθJA Junction-to-ambient thermal resistance VSSOP-20 (DGS20) 91.3 °C/W RθJC(top) Junction-to-case (top) thermal resistance 29.3 °C/W RθJB Junction-to-board thermal resistance 48.3 °C/W ΨJT Junction-to-top characterization parameter 0.7 °C/W ΨJB Junction-to-board characterization parameter 47.9 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W RθJA Junction-to-ambient thermal resistance SOT-16 (DYY) 86.6 °C/W RθJC(top) Junction-to-case (top) thermal resistance 39.3 °C/W RθJB Junction-to-board thermal resistance 27.8 °C/W ΨJT Junction-to-top characterization parameter 1.1 °C/W ΨJB Junction-to-board characterization parameter 27.8 °C/W RθJC(bot) Junction-to-case (bottom) thermal resistance N/A °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application report.

7.4 Supply Current Characteristics

7.4.1 RUN/SLEEP Modes

-40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX RUN Mode IDDRUN MCLK=SYSOSC, CoreMark, execute from flash mA IDDRUN, per MHz MCLK=SYSOSC, While(1), execute from flash 32MHz 40 48 40 50 41 50 42 51 43 56 uA/MhzMCLK=SYSOSC, CoreMark, execute from flash 32MHz 72 72 72 73 74 MCLK=SYSOSC, CoreMark, execute from flash 4MHz 130 130 135 140 150 SLEEP Mode IDDSLEEP MCLK=SYSOSC, CPU is halted 32MHz 967 1047 978 1066 1002 1192 1024 1301 1070 1416 uA 4MHz 356 416 363 441 389 577 411 689 458 809

7.4.2 STOP/STANDBY Modes

VDD=3.3V unless otherwise noted. All inputs tied to 0V or VDD. Outputs do not source or sink any current. All peripherals not noted are disabled. PARAMETER ULPCLK -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX STOP Mode www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 15

7.4.2 STOP/STANDBY Modes (continued)

VDD=3.3V unless otherwise noted. All inputs tied to 0V or VDD. Outputs do not source or sink any current. All peripherals not noted are disabled. PARAMETER ULPCLK -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX IDDSTOP0 SYSOSC=32MHz, USE4MHZSTOP=0, DISABLESTOP=0 4MHz 316 342 320 344 323 347 327 352 334 361 uAIDDSTOP1 SYSOSC=4MHz, USE4MHZSTOP=1, DISABLESTOP=0 4MHz 146 167 151 171 155 176 158 182 166 192 IDDSTOP2 SYSOSC off, DISABLESTOP=1, ULPCLK=LFCLK 32kHz 42 51 44 54 47 58 50 64 56 76 STANDBY Mode IDDSTBY0 STOPCLKSTBY=0, TIMG0 enabled 32kHz uA IDDSTBY1

7.4.3 SHUTDOWN Mode

All inputs tied to 0V or VDD. Outputs do not source or sink any current. Core regulator is powered down. PARAMETER VDD -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX IDDSHDN Supply current in SHUTDOWN mode 3.3V 47 61 352 793 2020 nA

7.5 Power Supply Sequencing

7.5.1 POR and BOR

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT dVDD/dt VDD (supply voltage) slew rate Rising 1 V/us Falling (2) 0.01 Falling, STANDBY 0.1 V/ms VPOR+ Power-on reset voltage level Rising (1) 0.95 1.30 1.51 V VPOR- Falling (1) 0.9 1.25 1.48 V VHYS, POR POR hysteresis (1) 30 45 60 mV VBOR0+, COLD Brown-out reset voltage level 0 (default level) Cold start, rising (1) 1.54 1.58 1.62 VVBOR0+ Rising (1) (2) 1.54 1.59 1.62 VBOR0- Falling (1) (2) 1.53 1.58 1.61 VBOR0, STBY STANDBY mode (1) 1.51 1.57 1.61 VBOR1+ Brown-out-reset voltage level 1 Rising (1) (2) 2.13 2.18 2.23 V VBOR1- Falling (1) (2) 2.10 2.15 2.19 VBOR2+ Brown-out-reset voltage level 2 Rising (1) (2) 2.72 2.77 2.82 V VBOR2- Falling (1) (2) 2.69 2.74 2.79 VBOR3+ Brown-out-reset voltage level 3 Rising (1) (2) 2.91 2.97 3.02 V VBOR3- Falling (1) (2) 2.88 2.94 2.99 VHYS,BOR Brown-out reset hysteresis Level 0 (1) 15 21 mV Levels 1-3 (1) 34 40 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.5.1 POR and BOR (continued)

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TPD, BOR BOR propagation delay RUN/SLEEP/STOP mode 10 us STANDBY mode 100 us (1) |dVDD/dt| ≤ 3V/s (2) Device operating in RUN, SLEEP, or STOP mode.

7.5.2 Power Supply Ramp

Figure 7-1 gives the relationship of POR- POR+, BOR0-, and BOR0+ during power-up and power-down. POR BOR Running Running BOR POR BOR Running Supply Voltage (VDD) POR- POR+ BOR0- BOR0+ No reset asserted BOR asserted POR asserted BOR releasedPOR released POR released BOR released Time (t)POR/BOR levels are met for specified |dVDD/dt| BOR released Figure 7-1. Power Cycle POR/BOR Conditions

7.6 Flash Memory Characteristics

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Supply VDDPGM/ERASE Program and erase supply voltage 1.62 3.6 V IDDERASE Supply current from VDD during erase operation Supply current delta 2 mA IDDPGM Supply current from VDD during program operation Supply current delta 2.5 mA Endurance NWEC(LOWER) Erase/program cycle endurance (lower 32kB flash) (1) 100 k cycles NWEC(UPPER) Erase/program cycle endurance (remaining flash) (1) 10 k cycles NE(MAX) Total erase operations before failure (2) 802 k erase operations NW(MAX) Write operations per word line before sector erase (3) 83 write operations Retention tRET_85 Flash memory data retention -40°C ≤Tj ≤ 85°C 60 years tRET_105 Flash memory data retention -40°C ≤Tj ≤ 105°C 11.4 years Program and Erase Timing tPROG (WORD, 64) Program time for flash word (4) (6) 50 275 µs tPROG (SEC, 64) Program time for 1kB sector (5) (6) 6.4 ms www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 17

7.6 Flash Memory Characteristics (continued)

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tERASE (SEC) Sector erase time ≤2k erase/program cycles, Tj≥25°C 4 20 ms tERASE (SEC) Sector erase time ≤10k erase/program cycles, Tj≥25°C 20 150 ms tERASE (SEC) Sector erase time ≤10k erase/program cycles 20 200 ms tERASE (BANK) Bank erase time ≤10k erase/program cycles 22 220 ms (1) The lower 32kB flash address space supports higher erase/program endurance to enable EEPROM emulation applications. On devices with <=32kB flash memory, the entire flash memory supports NWEC(LOWER) erase/program cycles. (2) Total number of cumulative erase operations supported by the flash before failure. A sector erase or bank erase operation is considered to be one erase operation. (3) Maximum number of write operations allowed per word line before the word line must be erased. If additional writes to the same word line are required, a sector erase is required once the maximum number of write operations per word line is reached. (4) Program time is defined as the time from when the program command is triggered until the command completion interrupt flag is set in the flash controller. (5) Sector program time is defined as the time from when the first word program command is triggered until the final word program command completes and the interrupt flag is set in the flash controller. This time includes the time needed for software to load each flash word (after the first flash word) into the flash controller during programming of the sector. (6) Flash word size is 64 data bits (8 bytes). On devices with ECC, the total flash word size is 72 bits (64 data bits plus 8 ECC bits).

7.7 Timing Characteristics

VDD=3.3V, Ta=25 ℃ (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Wakeup Timing tWAKE, SLEEP Wakeup time from SLEEP to RUN (1) 2 cycles tWAKE, STOP Wakeup time from STOP1 to RUN (SYSOSC enabled) (1) 14 us Wakeup time from STOP2 to RUN (SYSOSC disabled) (1) 13 us tWAKE, STBY Wakeup time from STANDBY to RUN (1) 15 us tWAKE, SHDN Wakeup time from SHUTDOWN to RUN Fast boot enabled 214 us tWAKE, SHDN Wakeup time from SHUTDOWN to RUN Fast boot disabled 230 us Asynchronous Fast Clock Request Timing tDELAY Delay time from edge of asynchronous request to first 32MHz MCLK edge Mode is SLEEP2 0.9 us Mode is STOP1 2.4 us Mode is STOP2 0.9 us Mode is STANDBY1 3.2 us Startup Timing tSTART, RESET Device cold start-up time from reset/ power-up (2) Fast boot enabled 241 us Fast boot disabled 284 us NRST Timing tRST, BOOTRST Minimum pulse length on NRST pin to generate BOOTRST ULPCLK≥4MHz 2 us ULPCLK=32kHz 100 us tRST, POR Minimum pulse length on NRST pin to generate POR 1 s (1) The wake-up time is measured from the edge of an external signal (GPIO wake-up event) to the time that the first CPU instruction is executed, with the GPIO glitch filter disabled (FILTEREN=0x0) and fast wake enabled (FASTWAKEONLY=1) MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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(2) The start-up time is measured from the time that VDD crosses VBOR0+ (cold start-up) to the time that the first instruction of the user program is executed.

7.8 Clock Specifications

7.8.1 System Oscillator (SYSOSC)

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fSYSOSC Factory trimmed SYSOSC frequency SYSOSCCFG.FREQ=00 (BASE) 32 MHz SYSOSCCFG.FREQ=01 4 User trimmed SYSOSC frequency SYSOSCCFG.FREQ=10, SYSOSCTRIMUSER.FREQ=10 24 SYSOSCCFG.FREQ=10, SYSOSCTRIMUSER.FREQ=01 16 SYSOSC frequency accuracy when frequency correction loop (FCL) is enabled and an ideal ROSC resistor is assumed (1) (2) SETUSEFCL=1, Ta = 25 ℃ -0.41 0.58 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 85 ℃ -0.80 0.93 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 105 ℃ -0.80 1.09 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 125 ℃ -0.80 1.30 SYSOSC accuracy when frequency correction loop (FCL) is enabled with ROSC resistor put at ROSC pin, for factory trimmed frequencies (1) SETUSEFCL=1, Ta = 25 ℃, ±0.1% ±25ppm ROSC –0.5 0.7 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 85 ℃, ±0.1% ±25ppm ROSC –1.1 1.2 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 105 ℃, ±0.1% ±25ppm ROSC –1.1 1.4 SETUSEFCL=1, -40 ℃ ≤ Ta ≤ 125 ℃, ±0.1% ±25ppm ROSC –1.1 1.7 SYSOSC accuracy when frequency correction loop (FCL) is disabled, 32MHz SETUSEFCL=0, SYSOSCCFG.FREQ=00, -40 ℃ ≤ Ta ≤ 125 ℃ –2.6 1.8 % fSYSOSC SYSOSC accuracy when frequency correction loop (FCL) is disabled, for factory trimmed frequencies, 4MHz SETUSEFCL=0, SYSOSCCFG.FREQ=01, -40 ℃ ≤ Ta ≤ 125 ℃ –2.7 2.3 % ROSC External resistor put between ROSC pin and VSS (1) SETUSEFCL=1 100 kΩ tsettle, SYSOSC Settling time to target accuracy (3) SETUSEFCL=1, ±0.1% 25ppm ROSC (1) 30 us fsettle, SYSOSC fSYSOSC additional undershoot accuracy during tsettle (3) SETUSEFCL=1, ±0.1% 25ppm ROSC (1) -11 % (1) The SYSOSC frequency correction loop (FCL) enables high SYSOSC accuracy via an external reference resistor (ROSC) which must be connected between the device ROSC pin and VSS when using the FCL. Accuracies are shown for a ±0.1% ±25ppm ROSC; relaxed tolerance resistors may also be used (with reduced SYSOSC accuracy). See the SYSOSC section of the technical reference manual for details on computing SYSOSC accuracy for various ROSC accuracies. ROSC does not need to be populated if the FCL is not enabled. (2) Represents the device accuracy only. The tolerance and temperature drift of the ROSC resistor used must be combined with this spec to determine final accuracy. Performance for a ±0.1% ±25ppm ROSC is given as a reference point. (3) When SYSOSC is waking up (for example, when exiting a low power mode) and FCL is enabled, the SYSOSC will initially undershoot the target frequency fSYSOSC by an additional error of up to fsettle,SYSOSC for the time tsettle,SYSOSC, after which the target accuracy is achieved. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 19

7.8.1.1 SYSOSC Typical Frequency Accuracy

Temperature (°C) SYSOSC Accuracy (%) -40 -20 0 20 40 60 80 100 120 -1.5 -0.5 0.5 1.5 Typical Max Min Figure 7-2. SYSOSC Accuracy with FCL On (32MHz) FCL-on accuracy is based on a 0.1% tolerance 25 ppm/°C ROSC resistor. Temperature (°C) SYSOSC Accuracy (%) -40 -20 0 20 40 60 80 100 120 -2.5 -1.5 -0.5 0.5 1.5 Typical Max Min Figure 7-3. SYSOSC Accuracy with FCL Off (32MHz)

7.8.2 Low Frequency Oscillator (LFOSC)

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fLFOSC LFOSC frequency 32768 Hz LFOSC accuracy tstart, LFOSC LFOSC start-up time 1.7 ms

7.9 Digital IO

7.9.1 Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VIH High level input voltage ODIO (1) VDD≥1.62V 0.7*VDD 5.5 V VDD≥2.7V 2 5.5 V All I/O except ODIO & Reset VDD≥1.62V 0.7*VDD VDD+0.3 V VIL Low level input voltage ODIO VDD≥1.62V -0.3 0.3*VDD V VDD≥2.7V -0.3 0.8 V All I/O except ODIO & Reset VDD≥1.62V -0.3 0.3*VDD V VHYS Hysteresis ODIO 0.05*VDD V All I/O except ODIO 0.1*VDD V Ilkg High-Z leakage current SDIO(2) (3) ±50 nA RPU Pull up resistance All I/O except ODIO 40 kΩ RPD Pull down resistance 40 kΩ CI Input capacitance 5 pF MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.9.1 Electrical Characteristics (continued)

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH High level output voltage SDIO VDD≥2.7V, |IIO|,max=6mA VDD≥1.71V, |IIO|,max=2mA VDD≥1.62V, |IIO|,max=1.5mA -40 °C ≤Tj≤25 °C VDD-0.4 V VDD≥2.7V, |IIO|,max=6mA VDD≥1.71V, |IIO|,max=2mA VDD≥1.62V, |IIO|,max=1.5mA -40 °C ≤Tj≤130 °C VDD-0.45 HSIO VDD≥2.7V, DRV=1, |IIO|,max=6mA VDD≥1.71V, DRV=1, |IIO|,max=3mA VDD≥1.62V, DRV=1, |IIO|,max=2mA -40 °C ≤Tj≤25 °C VDD-0.4 VDD≥2.7V, DRV=1, |IIO|,max=6mA VDD≥1.71V, DRV=1, |IIO|,max=3mA VDD≥1.62V, DRV=1, |IIO|,max=2mA -40 °C ≤Tj≤130 °C VDD-0.4 VDD≥2.7V, DRV=0, |IIO|,max=4mA VDD≥1.71V, DRV=0, |IIO|,max=2mA VDD≥1.62V, DRV=0, |IIO|,max=1.5mA -40 °C ≤Tj≤25 °C VDD-0.45 VDD≥2.7V, DRV=0, |IIO|,max=4mA VDD≥1.71V, DRV=0, |IIO|,max=2mA VDD≥1.62V, |IIO|,max=1.5mA -40 °C ≤Tj≤130 °C VDD-0.45 VOL Low level output voltage SDIO VDD≥2.7V, |IIO|,max=6mA VDD≥1.71V, |IIO|,max=2mA VDD≥1.62V, |IIO|,max=1.5mA -40 °C ≤Tj≤25 °C 0.4 V VDD≥2.7V, |IIO|,max=6mA VDD≥1.71V, |IIO|,max=2mA VDD≥1.62V, |IIO|,max=1.5mA -40 °C ≤Tj≤130 °C 0.45 HSIO VDD≥2.7V, DRV=1, |IIO|,max=6mA VDD≥1.71V, DRV=1, |IIO|,max=3mA VDD≥1.62V, DRV=1, |IIO|,max=2mA Tj≤85 °C 0.4 VDD≥2.7V, DRV=1, |IIO|,max=6mA VDD≥1.71V, DRV=1, |IIO|,max=3mA VDD≥1.62V, DRV=1, |IIO|,max=2mA -40 °C ≤Tj≤130 °C 0.45 VDD≥2.7V, DRV=0, |IIO|,max=4mA VDD≥1.71V, DRV=0, |IIO|,max=2mA VDD≥1.62V, DRV=0, |IIO|,max=1.5mA Tj≤85 °C 0.4 VDD≥2.7V, DRV=0, |IIO|,max=4mA VDD≥1.71V, DRV=0, |IIO|,max=2mA VDD≥1.62V, DRV=0, |IIO|,max=1.5mA -40 °C ≤Tj≤130 °C 0.45 ODIO VDD≥2.7V, IOL,max=8mA VDD≥1.71V, IOL,max=4mA -40 °C ≤Tj≤25 °C 0.4 VDD≥2.7V, IOL,max=8mA VDD≥1.71V, IOL,max=4mA -40 °C ≤Tj≤130 °C 0.45 (1) I/O Types: ODIO = 5V Tolerant Open-Drain , SDIO = Standard-Drive , HSIO = High-Speed (2) The leakage current is measured with VSS or VDD applied to the corresponding pin(s), unless otherwise noted. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 21

(3) The leakage of the digital port pins is measured individually. The port pin is selected for input and the pullup/pulldown resistor is disabled.

7.9.2 Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fmax Port output frequency SDIO (1) VDD ≥ 1.71V, CL= 20pF 16 MHz VDD ≥ 2.7V, CL= 20pF 32 HSIO VDD ≥ 1.71V, DRV = 0, CL= 20pF 16 VDD ≥ 1.71V, DRV = 1, CL= 20pF 24 VDD ≥ 2.7V, DRV = 0, CL= 20pF 32 ODIO VDD ≥ 1.71V, FM+, CL= 20pF - 100pF 1 tr,tf Output rise/fall time All output ports except ODIO VDD ≥ 1.71V 0.3*fmax s tf Output fall time ODIO VDD ≥ 1.71V, FM+, CL= 20pF-100pF 20*VDD/5.5 120 ns (1) I/O Types: ODIO = 5V Tolerant Open-Drain , SDIO = Standard-Drive , HSIO = High-Speed

7.10 Analog Mux VBOOST

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IVBST VBOOST current adder MCLK/ULPCLK is LFCLK 0.8 uAMCLK/ULPCLK is not LFCLK, SYSOSC frequency is 4MHz 8.5 tSTART,VBST VBOOST startup time 12 us

7.11 ADC

7.11.1 Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all accuracy parameters are measured using 12-bit resolution mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Vin(ADC) Analog input voltage range(1) Applies to all ADC analog input pins 0 VDD V VR+ Positive ADC reference voltage VR+ sourced from VDD VDD V VR+ sourced from external reference pin (VREF+) 1.4 VDD V VR+ sourced from internal reference (VREF) VREF V VR- Negative ADC reference voltage 0 V FS ADC sampling frequency RES = 0x0 (12-bit mode), External Reference 1.68 Msps I(ADC) (2) Operating supply current into VDD terminal FS = 1MSPS, Internal reference OFF, VR+ = VDD 454 600 μA FS = 200ksps, Internal reference ON, VR+ = VREF = 2.5V 300 435 CS/H ADC sample-and-hold capacitance 3.3 7 pF Rin ADC sampling switch resistance 0.5 1 kΩ ENOB Effective number of bits Internal reference, VR+ = VREF = 2.5V, Fin = 10KHz 10 10.2 bit External reference, Fin = 10KHz (4) 11 11.1 SNR Signal-to-noise ratio External reference (3) 68 71 dB Internal reference, VR+ = VREF = 2.5V 63 65 PSRRDC Power supply rejection ratio, DC External reference (3), VDD = VDD(min) to VDD(max) 63 68 dBVDD = VDD(min) to VDD(max) Internal reference, VR+ = VREF = 2.5V 49 55 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.11.1 Electrical Characteristics (continued)

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all accuracy parameters are measured using 12-bit resolution mode (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT PSRRAC Power supply rejection ratio, AC External reference (3), ΔVDD = 0.1 V at 1 kHz 61 dBΔVDD = 0.1 V at 1 kHz Internal reference, VR+ = VREF = 2.5V 49 Twakeup ADC Wakeup Time Assumes internal reference is active 1 us VSupplyMon Supply Monitor voltage divider (VDD/3) accuracy ADC input channel: Supply Monitor (4) -1.5 +1.5 % ISupplyMon Supply Monitor voltage divider current consumption ADC input channel: Supply Monitor 10 uA (1) The analog input voltage range must be within the selected ADC reference voltage range VR+ to VR– for valid conversion results. (2) The internal reference (VREF) supply current is not included in current consumption parameter I(ADC). (3) All external reference specifications are measured with VR+ = VREF+ = VDD = 3.3V and VR- = VREF- = VSS = 0V (4) Analog power supply monitor. Analog input on channel 15 is disconnected and is internally connected to the voltage divider which is VDD/3.

7.11.2 Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fADCCLK ADC clock frequency 4 32 MHz tADC trigger Software trigger minimum width 3 ADCCLK cycles tSample Sampling time without OPA 12-bit mode, RS = 50Ω, Cpext = 10pF 156 ns tSample_PGA Sampling time with OPA (1) 12-bit mode GBW = 0x1, PGA gain = x1 0.31 µs GBW = 0x1, PGA gain = x32 1.5 µs tSample_GPAMP Sampling time with GPAMP 12-bit mode 2.5 µs tSample_SupplyMon Sample time with Supply Monitor (VDD/3) 12-bit mode 3 µs (1) Only applies for devices with OPA

7.11.3 Linearity Parameters

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are measured at 25℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted) (1) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT EI Integral linearity error (INL) External reference (2) -2.0 +2.0 LSB ED Differential linearity error (DNL) Guaranteed no missing codes External reference (2) -1.0 +1.0 LSB EO Offset error External reference (2) -3 3 mV Internal reference, VR+ = VREF = 2.5V -3 3 mV EG Gain error External reference (2) -3 3 LSB (1) Total Unadjusted Error (TUE) can be calculated from EI , EO , and EG using the following formula: TUE = √( EI 2 + |EO|2 + EG 2 ) Note: You must convert all of the errors into the same unit, usually LSB, for the above equation to be accurate (2) All external reference specifications are measured with VR+ = VREF+ = VDD and VR- = VSS = 0V www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 23

7.11.4 Typical Connection Diagram

Figure 7-4. ADC Input Network 1. Refer to ADC Electrical Characteristics for the values of Rin and CS/H 2. Refer to Digital IO Electrical Characteristics for the value of CI 3. Cpar and Rpar represent the parasitic capacitance and resistance of the external ADC input circuitry Use the following equations to solve for the minimum sampling time (T) required for an ADC conversion: 1. Tau = (Rpar + Rin)* CS/H + Rpar*(Cpar + CI) 2. K= ln(2n/Settling error) – ln((Cpar + CI)/CS/H) 3. T (Min sampling time) = K*Tau

7.12 Temperature Sensor

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT TSTRIM Factory trim temperature (1) 27 30 33 ℃ TSc Temperature coefficient -1.84 -1.75 -1.66 mV/℃ tSET, TS Temperature sensor settling time (2) 2.5 10 us (1) Higher absolute accuracy may be achieved through user calibration. (2) This is the maximum time required for the temperature sensor to settle when measured by the ADC. It may be used to specify the minimum ADC sample time when measuring the temperature sensor.

7.13 VREF

7.13.1 Voltage Characterisitcs

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VDDmin Minimum supply voltage needed for VREF operation BUFCONFIG = 1 1.62 V BUFCONFIG = 0 2.7 VREF Voltage reference output voltage BUFCONFIG = 1 1.379 1.4 1.421 V BUFCONFIG = 0 2.462 2.5 2.538

7.13.2 Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IVREF VREF operating supply current BUFCONFIG = {0, 1}, No load 74 100 µA TCVREF Temperature coefficient of VREF (2) BUFCONFIG = {0, 1} 200 ppm/°C TCdrift Long term VREF drift Time = 1000 hours, BUFCONFIG = {0, 1}, T = 25℃ 300 ppm PSRRDC VREF Power supply rejection ratio, DC VDD = 1.7 V to VDDmax, BUFCONFIG = 1 59 64 dB VDD = 2.7 V to VDDmax, BUFCONFIG = 0 49 53 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.13.2 Electrical Characteristics (continued)

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Vnoise RMS noise at VREF output (0.1 Hz to 100 MHz) BUFFCONFIG = 1 500 µVrms BUFFCONFIG = 0 750 ADC FS Max supported ADC sampling frequency Using VREF as ADC reference 200 ksps Tstartup VREF startup time BUFCONFIG = {0, 1} , VDD = 2.8 V 15 us (1) The temperature coefficient of the VREF output is the sum of TCVRBUF and the temperature coefficient of the internal bandgap reference.

7.14 COMP

7.14.1 Comparator Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Comparator Electrical Characteristics Vcm Common mode input range 0 VDD V Voffset Input offset voltage ±25 mV Vhys DC input hysteresis HYST=00h 0.4 mV HYST=01h 11 HYST=02h 20 HYST=03h 30 tPD_ls Propagation delay, response time Output Filter off, Overdrive = 100 mV, High Speed Mode 32 50 ns Output Filter off, Overdrive = 100 mV, Low Power Mode 5 µs ten Comparator enable time Startup time to reach propagation delay specification, High Speed Mode 10 µs Startup time to reach propagation delay specification, Low Power Mode 10 µs Icomp Comparator current consumption. Vcm = VDD/2, 100mV overdrive, DAC output as a voltage reference, VDD is reference for DAC, High Speed Mode 120 200 µA Vcm = VDD/2, 100mV overdrive, DAC output as a voltage reference, VDD is reference for DAC, Low Power Mode 0.8 2.7 µA Vcm = VDD/2, 100mV overdrive, comparator only. High Speed Mode 100 180 µA Vcm = VDD/2, 100mV overdrive, comparator only, Low Power Mode 0.7 2.1 µA 8-bit DAC Electrical Characteristics Vdac DAC output range 0 VDD V Vdac-code 8-bit DAC output voltage for a given code VIN = reference voltage into 8-bit DAC, code n = 0 to 255 VIN × (n+1) / 256 V INL Integral nonlinearity of 8-bit DAC -1 1 LSB DNL Differential nonlinearity of 8-bit DAC -1 1 LSB Gain error Gain error of 8-bit DAC Reference voltage = VDD -2 2 % of FSR Offset error Offset error of 8-bit DAC -5 5 mV tdac_settle 8-bit DAC settling time in static mode DACCODE0 = 0 → 255, DAC output accurate to 1 LSB 1.5 µs www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 25

7.15 GPAMP

7.15.1 Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VCM Common mode voltage range RRI = 0x0 -0.1 VDD–1 VRRI = 0x1 1 VDD-0. RRI = 0x2 -0.1 VDD-0. Iq Quiescent current, per op-amp IO= 0 mA, RRI = 0x0 97 µA IO= 0 mA, RRI = 0x1 or 0x2 93 GBW Gain-bandwidth product CL = 200pF 0.32 MHz VOS Input offset voltage Noninverting, unity gain, TA = 25℃, VDD = 3.3V CHOP = 0x0 ±0.2 ±6.5 mV CHOP = 0x1 or 0x2 ±0.08 ±0.4 dVOS/dT Input offset voltage temperature drift Noninverting, unity gain CHOP = 0x0 7.7 µV/°C CHOP = 0x1 or 0x2 0.34 Ibias Input bias for muxed I/O pin at SoC 0.1V<Vin<VDD-0.3V, VDD=3.3V, CHOP=0x0 TA = 25°C ±40 pA TA = 125°C ±4000 0.1V<Vin<VDD-0.3V, VDD=3.3V, CHOP=0x1 TA = 25°C ±200 TA = 125°C ±4000 CMRRDC Common mode rejection ratio, DC Over common mode voltage range CHOP = 0x0 48 77 dB CHOP = 0x1 or 0x2 56 105 en Input voltage noise density Noninverting, unity gain f = 1 kHz 43 nV/√Hz f = 10 kHz 19 Rin Input resistance (1) 0.65 kΩ Cin Input capacitance Common mode 4 pF Differential 2 AOL Open-loop voltage gain, DC RL = 350 kΩ, 0.3 < Vo < VDD-0.3 82 90 107 dB PM phase margin CL = 200 pF, RL= 350 kΩ 69 70 72 degree SR Slew rate Noninverting, unity gain, CL = 40 pF 0.32 V/µs THDN Total Harmonic Distortion + Noise 0.012 % ILoad Output load current ±10 µA CLoad Output load capacitance 200 pF (1) The term 'Rin' refers to the input resistance of the multiplexer (mux) in the GPAMP.

7.15.2 Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tEN GPAMP enable time ENABLE = 0x0 to 0x1, Bandgap reference ON, 0.1% Noninverting, unity gain 12 20 µs tdisable GPAMP disable time 4 ULPCLK Cycles tSETTLE GPAMP settling time CL = 200 pF, Vstep = 0.3V to VDD - 0.3V, 0.1%, ENABLE = 0x1 Noninverting, unity gain 9 µs

7.16 OPA

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7.16.1 Electrical Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VCM Common mode voltage range RRI = 0x0 -0.1 VDD-1.1 V RRI = 0x1 -0.1 VDD-0.3 VO Voltage output swing from rail range RL = 10kΩ connected to VDD/2 20 68 mV Iq Quiescent current, per op-amp (2) IO= 0mA, RRI = 0x0 GBW = 0x0 100 µA GBW = 0x1 350 IO= 0mA, RRI = 0x1 GBW = 0x0 140 170 GBW = 0x1 450 600 IBCS Burn-out current source current 2 µA GBW Gain-bandwidth product CL = 40 pF GBW = 0x0 1.5 MHz GBW = 0x1 6 VOS Input offset voltage Noninverting, unity gain, VDD = 3.3V, TA = 25°C CHOP = 0x0 ±0.4 ±2 mV CHOP = 0x1 or 0x2 ±0.3 Noninverting, unity gain, VDD = 3.3V CHOP = 0x0 ±1.5 ±3.5 CHOP = 0x1 or 0x2 ±0.1 ±0.5 dVOS/dT Input offset voltage temperature drift Noninverting, unity gain, CHOP = 0x0 GBW = 0x0 ±6 µV/°CGBW = 0x1 ±5.2 Noninverting, unity gain, CHOP = 0x1 or 0x2 ±0.5 PSRRDC Power Supply Rejection Ratio, DC Noninverting, unity gain CHOP = 0x0 25 200 µV/V CHOP = 0x1 or 0x2 45 200 Ibias Input bias current for dedicated OPA input pin 0.1V<Vin<VDD-0.3V, VDD = 3.3V, CHOP=0x0 TA = 25°C ±6 pA TA = 125°C ±0.35 ±0.4 nA 0.1V<Vin<VDD-0.3V, VDD = 3.3V, CHOP=0x1 TA = 25°C ±0.4 nA CMRRDC Common mode rejection ratio, DC RRI = 0x0: 0V<VCM<VDD-1.1V RRI = 0x1: 0V<VCM<VDD-0.3V CHOP = 0x0 89 dB CHOP = 0x1 or 0x2 73 102 en Input voltage noise density GBW = 0x0, Noninverting, unity gain, CHOP = 0x0 f = 1kHz 240 nV/√Hz f = 10kHz 88 Rin Input resistance (1) 2.6 kΩ Cin Input capacitance Common mode 3 pF AOL Open-loop voltage gain, DC RL = 20kΩ to GND, 0.3<Vo<VDD-0.3 93 dB PM phase margin CL = 40pF GBW = 0x0 57 degree GBW = 0x1 78 SR Slew rate Noninverting, unity gain, CL = 40 pF GBW = 0x0 1.3 V/µs GBW = 0x1 4.9 THDN Total harmonic distortion + noise Noninverting, unity gain, GBW = 0x0, f = 1.5kHz, Integration BW = 100kHz 0.0034 Noninverting, unity gain, GBW = 0x1, f = 6kHz, Integration BW = 100kHz 0.004 ILoad Short circuit current GBW = 0x0, TA = 25°C ±9 mA GBW = 0x1, TA = 25°C ±30 CLoad Output load capacitance 40 pF (1) Rin here means the input resistance of mux in OPA. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 27

(2) Excluding VBOOST current. VBOOST must be enabled when OPA is enabled.

7.16.2 Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT tEN OPA enable time ENABLE = 0x0 to 0x1, Bandgap reference ON, 0.1%, Noninverting, unity gain GBW = 0x0 7.3 12 µs GBW = 0x1 4.4 6 tdisable OPA disable time 4 ULPCLK cycles fCHOP OPA Chopping Frequency CHOP = 0x1 or 0x2 GAIN = 0x0 125 kHz GAIN = 0x1 62.5 GAIN = 0x2 31.25 GAIN = 0x3 15.625 GAIN = 0x4 7.8 GAIN = 0x5 3.9 tSETTLE OPA settling time CL = 40 pF, Vstep = 0.3V to VDD-0.3V, 0.1%, ENABLE = 0x1, Noninverting, unity gain GBW = 0x0 2.5 9 µs GBW = 0x1 1.3 5

7.16.3 PGA Mode

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT G Non- inverting gain accuracy GAIN = 0x0 Gain of 1 –0.09 +0.09 GAIN = 0x1 Gain of 2 -0.33 +0.33 GAIN = 0x2 Gain of 4 –0.6 +0.6 GAIN = 0x3 Gain of 8 –1.1 +1 GAIN = 0x4 Gain of 16 –1.9 1.5 GAIN = 0x5 Gain of 32 –3.5 +1.7 Inverting gain accuracy GAIN = 0x1 Gain of -1 –0.4 +0.6 GAIN = 0x2 Gain of -3 –0.8 +0.8 GAIN = 0x3 Gain of -7 –1 1.3 GAIN = 0x4 Gain of -15 –1.1 1.7 GAIN = 0x5 Gain of -31 –2.2 2.6 RPGA Programmable gain stage resistance GAIN = 0x1 R1 64 kΩ R2 (feedback resistor) 64 GAIN = 0x2 R1 32 R2 (feedback resistor) 96 GAIN = 0x3 R1 16 R2 (feedback resistor) 112 GAIN = 0x4 R1 8 R2 (feedback resistor) 120 GAIN = 0x5 R1 4 R2 (feedback resistor) 124 G/dV Gain supply drift 0.026 0.84 %/V G/dT Gain temperature drift 0.0007 0.014 %/C THD Total harmonic distortion f = 3kHz, RL = 1.5kOhm to VDD/2, GBW = 0x1, GAIN = 0x1 88 dB f = 188Hz, RL = 1.5kOhm to VDD/2, GBW = 0x1, GAIN = 0x5 61 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.17 I2C

7.17.1 I2C Characteristics

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS Standard mode Fast mode Fast mode plus UNIT MIN MAX MIN MAX MIN MAX fI2C I2C input clock frequency I2C in Power Domain0 2 32 8 32 20 32 MHz fSCL SCL clock frequency 0.1 0.4 1 MHz tHD,STA Hold time (repeated) START 4 0.6 0.26 us tLOW Low period of the SCL clock 4.7 1.3 0.5 us tHIGH High period of the SCL clock 4 0.6 0.26 us tSU,STA Setup time for a repeated START 4.7 0.6 0.26 us tHD,DAT Data hold time 0 0 0 ns tSU,DAT Data setup time 250 100 50 ns tSU,STO Setup time for STOP 4 0.6 0.26 us tBUF Bus free time between a STOP and START condition 4.7 1.3 0.5 us tVD;DAT Data valid time 3.45 0.9 0.45 us tVD;ACK Data valid acknowledge time 3.45 0.9 0.45 us

7.17.2 I2C Filter

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT fSP Pulse duration of spikes suppressed by input filter AGFSELx = 0 6 ns AGFSELx = 1 14 35 ns AGFSELx = 2 22 60 ns AGFSELx = 3 35 90 ns

7.17.3 I2C Timing Diagram

tSU,DAT tHD,STAtHD,STA tVD,DAT tSU,STO tBUFtSU,STA tSPttHIGHtttLOWt tHD,DAT Figure 7-5. I2C Timing Diagram

7.18 SPI

7.18.1 SPI

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT SPI www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 29

7.18.1 SPI (continued)

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT fSPI SPI clock frequency Clock max speed = 32MHz 1.71 < VDD < 3.6V Controller mode

16 MHz

Clock max speed = 32MHz 1.71 < VDD < 3.6V Peripheral mode DCSCK SCK Duty Cycle 40 50 60 % Controller tSCLK_H/L SCLK High or Low time (tSPI/2) - 1 tSPI / 2 (tSPI/2) + 1 ns tSU.CI POCI input data setup time (1) 2.7 < VDD < 3.6V, delayed sampling enabled 1 ns 1.71 < VDD < 2.7V, delayed sampling enabled 1 tSU.CI POCI input data setup time (1) 2.7 < VDD < 3.6V, no delayed sampling 27 ns 1.71 < VDD < 2.7V, no delayed sampling 35 tHD.CI POCI input data hold time 9 ns tVALID.CO PICO output data valid time (2) 10 ns tHD.CO PICO output data hold time (3) 1 ns Peripheral tCS.LEAD CS lead-time, CS active to clock 8 ns tCS.LAG CS lag time, Last clock to CS inactive 1 ns tCS.ACC CS access time, CS active to POCI data out 23 ns tCS.DIS CS disable time, CS inactive to POCI high inpedance 19 ns tSU.PI PICO input data setup time 7 ns tHD.PI PICO input data hold time 31.25 ns tVALID.PO POCI output data valid time(2) 2.7 < VDD < 3.6V 24 ns tVALID.PO POCI output data valid time(2) 1.71 < VDD < 2.7V 31 ns tHD.PO POCI output data hold time(3) 5 ns (1) The POCI input data setup time can be fully compensated when delayed sampling feature is enabled. (2) Specifies the time to drive the next valid data to the output after the output changing SCLK clock edge (3) Specifies how long data on the output is valid after the output changing SCLK clock edge MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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7.18.2 SPI Timing Diagram

(SPO = 0) POCI SCLK (SPO = 1) CS (inverted) CS PICO tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,CI tHD,CI tVALID,CO tHD,CO 1 / fSPI tSCLK_H/L tSCLK_H/L Controller Mode, SPH = 0 CS (inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,CI tHD,CI tVALID,CO tHD,CO SCLK (SPO = 0) POCI SCLK (SPO = 1) PICO 1 / fSPI tSCLK_H/L tSCLK_H/L Controller Mode, SPH = 1 Figure 7-6. SPI timing diagram - Controller Mode CS (inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,PI tHD,PI tVALID,PO tHD,PO SCLK (SPO = 0) PICO SCLK (SPO = 1) POCI 1 / fSPI tSCLK_H/L tSCLK_H/L Peripheral Mode, SPH = 0 CS (inverted) CS tCS, LEAD tCS, ACC tCS, LAG tCS, DIS tSU,PI tHD,PI tVALID,PO tHD,PO SCLK (SPO = 0) PICO SCLK (SPO = 1) POCI 1 / fSPI tSCLK_H/L tSCLK_H/L Peripheral Mode, SPH = 1 Figure 7-7. SPI timing diagram - Peripheral Mode

7.19 UART

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT fUART UART input clock frequency 32 MHz fBITCLK BITCLK clock frequency(equals baud rate in MBaud) 4 MHz tSP Pulse duration of spikes suppressed by input filter AGFSELx = 0 6 ns AGFSELx = 1 14 35 ns AGFSELx = 2 22 60 ns AGFSELx = 3 35 90 ns www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 31

7.20 TIMx

over operating free-air temperature range (unless otherwise noted) PARAMETERS TEST CONDITIONS MIN TYP MAX UNIT tres Timer resolution time fTIMxCLK = 32MHz 31.25 ns 1 tTIMxCLK tres Timer resolution time TIMx with 16bit counter 16 bit tCOUNTER 16-bit counter clock period fTIMxCLK = 32MHz 0.03125 2048 us 1 65536 tTIMxCLK

7.21 Emulation and Debug

7.21.1 SWD Timing

over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT fSWD SWD frequency 10 MHz MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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8 Detailed Description

The following sections describe all of the components that make up the devices in this data sheet. The peripherals integrated into these devices are configured by software through Memory Mapped Registers (MMRs). For more details, see the corresponding chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.1 CPU

The CPU subsystem (MCPUSS) implements an Arm Cortex-M0+ CPU, an instruction prefetch and cache, a system timer, and interrupt management features. The Arm Cortex-M0+ is a cost-optimized 32-bit CPU that delivers high performance and low power to embedded applications. Key features of the CPU Sub System include:

  • Arm Cortex-M0+ CPU supports clock frequencies from 32 kHz to 32 MHz – ARMv6-M Thumb instruction set (little endian) with single-cycle 32×32 multiply instruction – Single-cycle access to GPIO registers through Arm single-cycle IO port
  • Prefetch logic to improve sequential code execution, and I-cache with 2 64-bit cache lines
  • System timer (SysTick) with 24-bit down counter and automatic reload
  • Nested vectored interrupt controller (NVIC) with 4 programmable priority levels and tail chaining
  • Interrupt groups for expanding the total interrupt sources, with jump index for low interrupt latency

8.2 Operating Modes

MSPM0L MCUs provide five main operating modes (power modes) to allow for optimization of the device power consumption based on application requirements. In order of decreasing power, the modes are: RUN, SLEEP, STOP, STANDBY, and SHUTDOWN. The CPU is active executing code in RUN mode. Peripheral interrupt events can wake the device from SLEEP, STOP, or STANDBY mode to the RUN mode. SHUTDOWN mode completely disables the internal core regulator to minimize power consumption, and wake is only possible via NRST, SWD, or a logic level match on certain IOs. RUN, SLEEP, STOP, and STANDBY modes also include several configurable policy options (for example, RUN.x) for balancing performance with power consumption. To further balance performance and power consumption, MSPM0L devices implement two power domains: PD1 (for the CPU, memories, and high performance peripherals), and PD0 (for low speed, low power peripherals). PD1 is always powered in RUN and SLEEP modes, but is disabled in all other modes. PD0 is always powered in RUN, SLEEP, STOP, and STANDBY modes. PD1 and PD0 are both disabled in SHUTDOWN mode.

8.2.1 Functionality by Operating Mode

Supported functionality in each operating mode is given in Table 8-1. Functional key:

  • EN: The function is enabled in the specified mode.
  • DIS: The function is disabled (either clock or power gated) in the specified mode, but the function's configuration is retained.
  • OPT: The function is optional in the specified mode, and remains enabled if configured to be enabled.
  • NS: The function is not automatically disabled in the specified mode, but its use is not supported.
  • OFF: The function is fully powered off in the specified mode, and no configuration information is retained. Table 8-1. Supported Functionality by Operating Mode Operating Mode RUN SLEEP STOP STANDBY SHUTDOWN RUN0 RUN1 RUN2 SLEEP0 SLEEP1 SLEEP2 STOP0 STOP1 STOP2 STANDBY0 STANDBY1 Oscillators SYSOSC EN EN DIS EN EN DIS OPT(1) EN DIS DIS DIS OFF LFOSC EN OFF www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 33

Table 8-1. Supported Functionality by Operating Mode (continued) Operating Mode RUN SLEEP STOP STANDBY SHUTDOWN RUN0 RUN1 RUN2 SLEEP0 SLEEP1 SLEEP2 STOP0 STOP1 STOP2 STANDBY0 STANDBY1 Clocks CPUCLK 32M 32k 32k DIS OFF MCLK to PD1 32M 32k 32k 32M 32k 32k DIS OFF ULPCLK to PD0 32M 32k 32k 32M 32k 32k 4M(1) 4M 32k DIS OFF ULPCLK to TIMG0/1 32M 32k 32k 32M 32k 32k 4M(1) 4M 32k OFF MFCLK OPT DIS OPT DIS OPT DIS OFF LFCLK 32k DIS OFF LFCLK to TIMG0/1 32k OFF MCLK Monitor OPT DIS OFF PMU POR Monitor EN BOR Monitor EN OFF Core Regulator FULL DRIVE REDUCED DRIVE LOW DRIVE OFF Core Functions CPU EN DIS OFF DMA OPT NS (triggers supported) OFF Flash EN DIS OFF SRAM EN DIS OFF PD1 Peripherals SPI0 OPT DIS OFF CRC OPT DIS OFF PD0 Peripherals TIMG0/1 OPT OFF TIMG2/4 OPT OPT(2) OFF UART0/1 OPT OPT(2) OFF I2C0/1 OPT OPT(2) OFF GPIOA OPT OPT(2) OFF WWDT0 OPT DIS OFF Analog ADC0 OPT NS (triggers supported) OFF OPA0/1 OPT NS OPT NS OPT NS OFF GPAMP OPT NS OFF COMP0 OPT OPT (ULP) OPT OPT (ULP) OPT OPT (ULP) OFF IOMUX and IO Wakeup EN DIS w/ WAKE Wake Sources N/A ANY IRQ PD0 IRQ IOMUX, NRST, SWD (1) If STOP0 is entered from RUN1 (SYSOSC enabled but MCLK sourced from LFCLK), SYSOSC remains enabled as in RUN1 and ULPCLK remains at 32 kHz as in RUN1. If STOP0 is entered from RUN2 (SYSOSC was disabled and MCLK was sourced from LFCLK), SYSOSC remains disabled as in RUN2 and ULPCLK remains at 32 kHz as in RUN2. (2) When using the STANDBY1 policy for STANDBY, only TIMG0 and TIMG1 are clocked. Other PD0 peripherals can generate an asynchronous fast clock request upon external activity but are not actively clocked.

8.3 Power Management Unit (PMU)

The power management unit (PMU) generates the internally regulated core supplies for the device and provides supervision of the external supply (VDD). The PMU also contains the bandgap voltage reference used by the PMU itself as well as analog peripherals. Key features of the PMU include: MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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  • Power-on reset (POR) supply monitor
  • Brown-out reset (BOR) supply monitor with early warning capability using three programmable thresholds
  • Core regulator with support for RUN, SLEEP, STOP, and STANDBY operating modes to dynamically balance performance with power consumption
  • Parity-protected trim to immediately generate a power-on reset (POR) in the event that a power management trim is corrupted For more details, see the PMU chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.4 Clock Module (CKM)

The clock module provides the following oscillators:

  • LFOSC: Internal low-frequency oscillator (32 kHz)
  • SYSOSC: Internal high-frequency oscillator (4 MHz or 32 MHz with factory trim, 16 MHz or 24 MHz with user trim) The following clocks are distributed by the clock module for use by the processor, bus, and peripherals:
  • MCLK: Main system clock for PD1 peripherals, derived from SYSOSC or LFCLK, active in RUN and SLEEP modes
  • CPUCLK: Clock for the processor (derived from MCLK), active in RUN mode
  • ULPCLK: Ultra-low power clock for PD0 peripherals, active in RUN, SLEEP, STOP, and STANDBY modes
  • MFCLK: 4-MHz fixed mid-frequency clock for peripherals, available in RUN, SLEEP, and STOP modes
  • LFCLK: 32-kHz fixed low-frequency clock for peripherals or MCLK, active in RUN, SLEEP, STOP, and STANDBY modes
  • ADCCLK: ADC clock, available in RUN, SLEEP and STOP modes
  • CLK_OUT: Used to output a clock externally, available in RUN, SLEEP, STOP, and STANDBY modes For more details, see the CKM chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.5 DMA

The direct memory access (DMA) controller allows movement of data from one memory address to another without CPU intervention. For example, the DMA can be used to move data from ADC conversion memory to SRAM. The DMA reduces system power consumption by allowing the CPU to remain in low power mode, without having to awaken to move data to or from a peripheral. The DMA in these devices support the following key features:

  • 3 independent DMA transfer channels – 1 full-feature channel (DMA0), supporting repeated transfer modes – 2 basic channels (DMA1, DMA2), supporting single transfer modes
  • Configurable DMA channel priorities
  • Byte (8-bit), short word (16-bit), word (32-bit) and long word (64-bit) or mixed byte and word transfer capability
  • Transfer counter block size supports up to 64k transfers of any data type
  • Configurable DMA transfer trigger selection
  • Active channel interruption to service other channels
  • Early interrupt generation for ping-pong buffer architecture
  • Cascading channels upon completion of activity on another channel
  • Stride mode to support data re-organization Table 8-2 lists the available triggers for the DMA which are configured using the DMATCTL.DMATSEL control bits in the DMA memory mapped registers. Table 8-2. DMA Trigger Mapping TRIGGER 0:6 SOURCE TRIGGER 7:13 SOURCE

0 Software 7 I2C1 Publisher 2

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Table 8-2. DMA Trigger Mapping (continued) TRIGGER 0:6 SOURCE TRIGGER 7:13 SOURCE

1 Generic Subscriber 0 (FSUB_0) 8 SPI0 Publisher 1

2 Generic Subscriber 1 (FSUB_1) 9 SPI0 Publisher 2

3 ADC0 Publisher 2 10 UART0 Publisher 1

4 I2C0 Publisher 1 11 UART0 Publisher 2

5 I2C0 Publisher 2 12 UART1 Publisher 1

6 I2C1 Publisher 1 13 UART1 Publisher 2

8.6 Events

The event manager transfers digital events from one entity (for example, a peripheral) to another (for example, a second peripheral, the DMA or the CPU). The event manager implements event transfer through a defined set of event publishers (generators) and subscribers (receivers) that are interconnected through an event fabric containing a combination of static and programmable routes. Events that are transferred by the event manager include:

  • Peripheral event transferred to the CPU as an interrupt request (IRQ) (Static Event) – Example: GPIO interrupt is sent to the CPU
  • Peripheral event transferred to the DMA as a DMA trigger (DMA Event) – Example: UART data receive trigger to DMA to request a DMA transfer
  • Peripheral event transferred to another peripheral to directly trigger an action in hardware (Generic Event) – Example: TIMx timer peripheral publishes a periodic event to the ADC subscriber port, and the ADC uses the event to trigger start-of-sampling For more details, see the Event chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. Table 8-3. Generic Event Channels A generic route is either a point-to-point (1:1) route or a point-to-two (1:2) splitter route in which the peripheral publishing the event is configured to use one of several available generic route channels to publish the event to another entity (or entities, in the case of a splitter route). An entity can be another peripheral, a generic DMA trigger event, or a generic CPU event. CHANID Generic Route Channel Selection Channel Type

0 No generic event channel selected N/A

1 Generic event channel 1 selected 1 : 1

2 Generic event channel 2 selected 1 : 1

3 Generic event channel 3 selected 1 : 2 (splitter)

8.7 Memory

8.7.1 Memory Organization

The following table summarizes the memory map of the devices. For more information about the memory region detail, see the Platform Memory Map chapter in the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. Table 8-4. Memory Organization Memory Region Subregion MSPM0L1304 MSPM0L1305 MSPM0L1306 Code (Flash) MAIN (3) 16KB - 8B 0x0000.0000 to 0x0000.3FF8 32KB - 8B(1) 0x0000.0000 to 0x0000.7FF8 64KB - 8B(1) 0x0000.0000 to 0x0000.FFF8 Aliased MAIN (2) (3) 0x0040.0000 to 0x0040.3FF8 0x0040.0000 to 0x0040.7FF8 0x0040.0000 to 0x0040.FFF8 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Table 8-4. Memory Organization (continued) Memory Region Subregion MSPM0L1304 MSPM0L1305 MSPM0L1306 SRAM (SRAM) SRAM 2KB 0x2000.0000 to 0x2000.0800 4KB 0x2000.0000 to 0x2000.1000 4KB 0x2000.0000 to 0x2000.1000 Aliased SRAM(2) 0x2000.0000 to 0x2000.0800 0x2000.0000 to 0x2000.1000 0x2000.0000 to 0x2000.1000 Peripheral Peripherals 0x4000.0000 to 0x40FF.FFFF 0x4000.0000 to 0x40FF.FFFF 0x4000.0000 to 0x40FF.FFFF MAIN (3) 0x0000.0000 to 0x0000.3FF8 0x0000.0000 to 0x0000.7FF8 0x0000.0000 to 0x0000.FFF8 Aliased MAIN(2) (3) 0x0040.0000 to 0x0040.3FF8 0x0040.0000 to 0x0040.7FF8 0x0040.0000 to 0x0040.FFF8 NONMAIN 512 bytes 0x41C0.0000 to 0x41C0.0200 512 bytes 0x41C0.0000 to 0x41C0.0200 512 bytes 0x41C0.0000 to 0x41C0.0200 Aliased NONMAIN (2) 0x41C1.0000 to 0x41C1.0200 0x41C1.0000 to 0x41C1.0200 0x41C1.0000 to 0x41C1.0200 FACTORY 0x41C4.0000 to 0x41C4.0080 0x41C4.0000 to 0x41C4.0080 0x41C4.0000 to 0x41C4.0080 Aliased FACTORY (2) 0x41C5.0000 to 0x41C5.0080 0x41C5.0000 to 0x41C5.0080 0x41C5.0000 to 0x41C5.0080 Subsystem 0x6000.0000 to 0x7FFF.FFFF 0x6000.0000 to 0x7FFF.FFFF 0x6000.0000 to 0x7FFF.FFFF System PPB 0xE000.0000 to 0xE00F.FFFF 0xE000.0000 to 0xE00F.FFFF 0xE000.0000 to 0xE00F.FFFF (1) First 32KB flash memory (address 0x0000.0000 to 0x0000.8000) has up to 100000 program and erase cycles. (2) Aliased memory reads the same as the corresponding memory region. Aliased memory is included to keep the compatibility with devices that have ECC. (3) CPU access to one of the last 8 bytes of a flash region will cause a hard fault. This occurs because the prefetch logic tries to read one flash word (64 bits) ahead, resulting in a read attempt to an invalid memory location.

8.7.2 Peripheral File Map

Table 8-5 lists the available peripherals and the register base address for each. Table 8-5. Peripherals Summary Peripheral Name Base Address Size ADC0 0x40004000 0x2000 COMP0 0x40008000 0x2000 OPA0 0x40020000 0x2000 OPA1 0x40022000 0x2000 VREF 0x40030000 0x2000 WWDT0 0x40080000 0x2000 TIMG0 0x40084000 0x2000 TIMG1 0x40086000 0x2000 TIMG2 0x40088000 0x2000 TIMG4 0x4008C000 0x2000 GPIO0 0x400A0000 0x2000 SYSCTL 0x400AF000 0x3000 DEBUGSS 0x400C7000 0x2000 EVENT 0x400C9000 0x3000 NVMNW 0x400CD000 0x2000 I2C0 0x400F0000 0x2000 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 37

Table 8-5. Peripherals Summary (continued) Peripheral Name Base Address Size I2C1 0x400F2000 0x2000 UART1 0x40100000 0x2000 UART0 0x40108000 0x2000 MCPUSS 0x40400000 0x2000 WUC 0x40424000 0x1000 IOMUX 0x40428000 0x2000 DMA 0x4042A000 0x2000 CRC 0x40440000 0x2000 SPI0 0x40468000 0x2000 ADC0 (1) 0x4055A000 0x1000 (1) Aliased region of ADC0 memory-mapped registers.

8.7.3 Peripheral Interrupt Vector

Table 8-6 shows the IRQ number and the interrupt group number for each peripherals in this device. Table 8-6. Interrupt Vector Number Peripheral Name NVIC IRQ Group IIDX WWDT0 0 0 DEBUGSS 0 2 NVMNW 0 3 EVENT SUB PORT0 0 4 EVENT SUB PORT1 0 5 SYSCTL 0 6 GPIO0 1 0 COMP0 1 2 TIMG1 2 – ADC 4 – SPI0 9 – UART1 13 – UART0 15 – TIMG0 16 – TIMG2 18 – TIMG4 20 – I2C0 24 – I2C1 25 – DMA 31 –

8.8 Flash Memory

A single bank of nonvolatile flash memory is provided for storing executable program code and application data. Key features of the flash include:

  • In-circuit program and erase operations supported across the entire recommended supply range
  • Small 1KB sector sizes (minimum erase resolution of 1KB)
  • Up to 100000 program and erase cycles on the lower 32KB of the flash memory, with up to 10000 program and erase cycles on the remaining flash memory (devices with 32KB or less support 100000 cycles on the entire flash memory) MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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For a complete description of the flash memory, see the NVM chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.9 SRAM

MSPM0Lxx MCUs include a low-power high-performance SRAM memory with zero wait state access across the supported CPU frequency range of the device. SRAM memory can be used for storing volatile information such as the call stack, heap, global data, and code. The SRAM memory content is fully retained in run, sleep, stop, and standby operating modes and is lost in shutdown mode. A write protection mechanism is provided to allow the application to prevent unintended modifications to a portion of the SRAM memory. SRAM write protection is useful when placing executable code into SRAM to provide a level of protection against unintentional overwrites of code by either the CPU or DMA. Placing code in SRAM can improve performance of critical loops by enabling zero wait state operation and lower power consumption.

8.10 GPIO

The general purpose input/output (GPIO) peripheral lets the application write data out and read data in through the device pins. Through the use of the Port A GPIO peripheral, these devices support up to 28 GPIO pins. The key features of the GPIO module include:

  • 0 wait state MMR access from CPU
  • Set, clear, or toggle multiple bits without the need of a read-modify-write construct in software
  • "FastWake" feature enables low-power wakeup from STOP and STANDBY modes for any GPIO port
  • User controlled input filtering

8.11 IOMUX

The IOMUX peripheral enables IO pad configuration and controls digital data flow to and from the device pins. The key features of the IOMUX include:

  • IO pad configuration registers allow for programmable drive strength, speed, pullup or pulldown, and more
  • Digital pin muxing allows for multiple peripheral signals to be routed to the same IO pad
  • Pin functions and capabilities are user-configured using the PINCM register For more details, see the IOMUX chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.12 ADC

The 12-bit analog-to-digital converter (ADC) module in these devices support fast 12-bit conversions with single- ended inputs. ADC features include:

  • 12-bit output resolution at up to 1.68 Msps with greater than 11-bit ENOB
  • HW averaging enables 14-bit conversion resolution at 105ksps
  • Up to 10 external input channels
  • Internal channels for temperature sensing, supply monitoring, and analog signal chain (interconnection with OPA, GPAMP, and others)
  • Software selectable reference: – Configurable internal dedicated ADC reference voltage of 1.4 V and 2.5 V (VREF) – MCU supply voltage (VDD) – External reference supplied to the ADC through the VREF+ and VREF- pins
  • Operates in RUN, SLEEP, and STOP modes and supports triggers from STANDBY mode Table 8-7. ADC0 Channel Mapping CHANNEL[0:7] SIGNAL NAME CHANNEL[8:15] SIGNAL NAME (1) (2)

0 A0 8 A8

1 A1 9 A9

2 A2 10 –

3 A3 11 Temperature Sensor

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Table 8-7. ADC0 Channel Mapping (continued) CHANNEL[0:7] SIGNAL NAME CHANNEL[8:15] SIGNAL NAME (1) (2)

4 A4 12 OPA0 output

5 A5 13 OPA1 output

6 A6 14 GPAMP output

7 A7 15 Supply/Battery Monitor

(1) Italicized signal names are internal to the SoC. These signals are used for internal peripheral interconnections. (2) For more information about device analog connections see Section 8.24. For more details, see the ADC chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.13 Temperature Sensor

The temperature sensor provides a voltage output that changes linearly with device temperature. The temperature sensor output is internally connected to one of ADC input channels to enable a temperature-to- digital conversion. A unit-specific single-point calibration value for the temperature sensor is provided in the factory constants memory region. This calibration value represents the ADC conversion result (in ADC code format) corresponding to the temperature sensor being measured in 12-bit mode with the 1.4-V internal VREF at the factory trim temperature (TSTRIM). This calibration value can be used with the temperature sensor temperature coefficient (TSc) to estimate the device temperature. See the temperature sensor section of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual for guidance on estimating the device temperature with the factory trim value.

8.14 VREF

The voltage reference module (VREF) in these devices contains a configurable voltage reference buffer dedicated for the on-board ADC. The devices also support connection of an external reference for applications in which higher accuracy is required. VREF features include:

  • 1.4-V and 2.5-V user-selectable internal reference for ADC
  • Internal reference supports ADC operation up to 200 ksps
  • Support for bringing in an external reference for the ADC as well as for other analog peripherals on the VREF+ and VREF- device pins (24, 28, and 32-pin packages only) For more details, see the VREF chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.15 COMP

The comparator peripheral in the device compares the voltage levels on two inputs terminals and provides a digital output based on this comparison. The COMP supports the following key features:

  • Programmable hysteresis
  • Programmable reference voltage: – Integrated 8-bit reference DAC, the output can also can connect to OPA input terminal internally as an output buffer.
  • Configurable operation modes: – High-speed mode (for the lowest propagation delay in timing-critical applications) – Low-power mode (for monitoring slow-moving signals at the lowest power consumption)
  • Programmable output glitch filter delay
  • Support output wake up device from all low-power modes
  • Output connected to advanced timer fault handling mechanism MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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  • The IPSEL and IMSEL bits in comparator registers can be used to select the comparator channel inputs from device pins or from internal analog modules. Table 8-8. COMP0 Input Channel Selection(1) IPSEL / IMSEL Bits Positive Terminal Input Negative Terminal Input 0x0 COMP0_IN0+ COMP0_IN0- 0x1 COMP0_IN1+ COMP0_IN1- 0x6 OPA1 output OPA0 output (1) For more information about device analog connections, see Section 8.24. For more details, see the COMP chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.16 CRC

The cyclical redundancy check (CRC) module provides a signature for an input data sequence. Key features of the CRC module include:

  • Support for 16-bit CRC based on CRC16-CCITT
  • Support for 32-bit CRC based on CRC32-ISO3309
  • Support for bit reversal For more details, see the CRC chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.17 GPAMP

The general-purpose amplifier (GPAMP) peripheral is a chopper-stabilized general-purpose operational amplifier with rail-to-rail input and output. The GPAMP supports the following features:

  • Software selectable chopper stabilization
  • Rail-to-rail input and output
  • Programmable internal unity gain feedback loop For more details, see the ADC chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.18 OPA

The zero-drift op amps (OPAs) in these devices, OPA0 and OPA1, are chopper stabilized operational amplifiers with rail-to-rail input/output and a programmable gain stage feedback loop. The OPA peripherals support the following key features:

  • Software-selectable zero-drift chopper stabilization for improved accuracy and drift performance
  • Factory trimming to remove offset error
  • Burnout current source (BCS) integrated to monitor sensor health
  • Programmable gain amplifier (PGA) up to 32x The OPA features configurable input muxes P-MUX, N-MUX, and M-MUX to support various analog signal chain amplifier configurations that include general purpose, inverting, noninverting, unity gain, cascade, noninverting cascade, difference, and more. The following tables list the input channel mapping for each OPA. For more information about device analog connections, see Section 8.24 For more details, see the OPA chapter of the MSPM0 G-Series 80-MHz Microcontrollers Technical Reference Manual. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 41

8.19 I2C

The inter-integrated circuit interface (I 2C) peripherals in these devices provide bidirectional data transfer with other I2C devices on the bus and support the following key features:

  • 7-bit and 10-bit addressing mode with multiple 7-bit target addresses
  • Multiple-controller transmitter or receiver mode
  • Target receiver or transmitter mode with configurable clock stretching
  • Support Standard-mode (Sm), with a bit rate up to 100 kbit/s
  • Support Fast-mode (Fm), with a bit rate up to 400 kbit/s
  • Support Fast-mode Plus (Fm+), with a bit rate up to 1 Mbit/s – Supported on open drain IOs only (ODIO)
  • Separated transmit and receive FIFOs support DMA data transfer
  • Support SMBus 3.0 with PEC, ARP, timeout detection and host support
  • Wakeup from low power mode on address match
  • Support analog and digital glitch filter for input signal glitch suppression
  • 8-entry transmit and receive FIFOs For more details, see the I2C chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.20 SPI

The serial peripheral interface (SPI) peripherals in these devices support the following key features:

  • Support ULPCLK/2 bit rate and up to 16Mbits/s in both controller and peripheral mode
  • Configurable as a controller or a peripheral
  • Configurable chip select for both controller and peripheral
  • Programmable clock prescaler and bit rate
  • Programmable data frame size from 4 bits to 16 bits (controller mode) and 7 bits to 16 bit (peripheral mode)
  • Supports PACKEN feature that allows the packing of 2 16 bit FIFO entries into a 32-bit value to improve CPU performance
  • Transmit and receive FIFOs (4 entries each with 16 bits per entry) supporting DMA data transfer
  • Supports TI mode, Motorola mode and National Microwire format For more details, see the SPI chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.21 UART

The UART peripherals provide the following key features:

  • Standard asynchronous communication bits for start, stop, and parity
  • Fully programmable serial interface – 5, 6, 7 or 8 data bits – Even, odd, stick, or no-parity bit generation and detection – 1 or 2 stop bit generation – Line-break detection – Glitch filter on the input signals – Programmable baud rate generation with oversampling by 16, 8 or 3 – Local Interconnect Network (LIN) mode support
  • Separated transmit and receive FIFOs support DAM data transfer
  • Support transmit and receive loopback mode operation
  • See Table 8-9 for detail information on supported protocols Table 8-9. UART Features UART Features UART0 (Extend) UART1 (Main) Active in Stop and Standby Mode Yes Yes Separate transmit and receive FIFOs Yes Yes Support hardware flow control Yes Yes MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Table 8-9. UART Features (continued) UART Features UART0 (Extend) UART1 (Main) Support 9-bit configuration Yes Yes Support LIN mode Yes - Support DALI Yes - Support IrDA Yes - Support ISO7816 Smart Card Yes - Support Manchester coding Yes - FIFO Depth 4 entries 4 entries For more details, see the UART chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.22 WWDT

The windowed watchdog timer (WWDT) can be used to supervise the operation of the device, specifically code execution. The WWDT can be used to generate a reset or an interrupt if the application software does not successfully reset the watchdog within a specified window of time. Key features of the WWDT include:

  • 25-bit counter
  • Programmable clock divider
  • Eight software selectable watchdog timer periods
  • Eight software selectable window sizes
  • Support for stopping the WWDT automatically when entering a sleep mode
  • Interval timer mode for applications which do not require watchdog functionality For more details, see the WWDT chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.23 Timers (TIMx)

The timer peripherals in these devices support the following key features. For specific configuration, see Table 8-10. Specific features for the general-purpose timer (TIMGx) include:

  • 16-bit down, up/down, or up counter with repeat-reload mode
  • 32-bit down, up/down, or up counter with repeat-reload mode
  • Selectable and configurable clock source
  • 8-bit programmable prescaler to divide the counter clock frequency
  • Two independent channels for – Output compare – Input capture – PWM output – One-shot mode
  • Support quadrature encoder interface (QEI) for positioning and movement sensing
  • Support synchronization and cross trigger among different TIMx instances in the same power domain
  • Support interrupt/DMA trigger generation and cross peripherals (such as ADC) trigger capability
  • Cross-trigger event logic for Hall sensor inputs Table 8-10. Different TIMG Configurations TIM Name Power Domain Resolution Prescaler Capture/ Compare Channels External PWM Channels Phase Load Shadow Load Shadow CC TIMG0 PD0 16-bit 8-bit 2 2 - - - TIMG1 PD0 16-bit 8-bit 2 2 - - - www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 43

Table 8-10. Different TIMG Configurations (continued) TIM Name Power Domain Resolution Prescaler Capture/ Compare Channels External PWM Channels Phase Load Shadow Load Shadow CC TIMG2 PD0 16-bit 8-bit 2 2 - - - TIMG4 PD0 16-bit 8-bit 2 2 - Yes Yes Table 8-11. TIMG Cross Trigger Map TSEL.ETSEL Selection TIMG0 TIMG1 TIMG2 TIMG4 0 TIMG0.TRIG0 TIMG0.TRIG0 TIMG0.TRIG0 TIMG0.TRIG0 1 TIMG1.TRIG0 TIMG1.TRIG0 TIMG1.TRIG0 TIMG1.TRIG0 2 TIMG2.TRIG0 TIMG2.TRIG0 TIMG2.TRIG0 TIMG2.TRIG0 3 TIMG4.TRIG0 TIMG4.TRIG0 TIMG4.TRIG0 TIMG4.TRIG0 4 to 31 Reserved For more details, see the timer chapters of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual.

8.24 Device Analog Connections

Figure 8-1 shows the internal analog connection of the device. MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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GPAMP_IN+ GPAMP_IN- 0 2 31 Internal signal to ADC0, OPA0, and OPA1 GPAMP_OUT COMP0 COMP0_OUT 0 1 0 1 66 OPA1_OUT Reference Generator 8-bit DAC8.0 OPA0+ and OPA1+ COMP0 Ref COMP0_IN0+COMP0_IN1+ OPA0_OUT COMP0_IN0-COMP0_IN1- Comparators Op-amps ADC GPAMP ADC0 11 12 130:9 14 15 A0:A9 Temp SenseOPA0 OutputOPA1 Output GPAMP Output Supply/Battery Monitor OPA0 OPA0_IN1- OPA0_OUT 4 5 6 OPA0_IN0+ OPA0_IN0- 0 12 RTOP RBOT RTAP 0 1 VDDA Burnout current source 0 2 3 41 5 Internal signal to ADC0 and COMP0 VREF+ DAC8.0_OUTOPA1_RTOPOPA1_RBOTGPAMP_OUT OPA1 OPA1_IN1- OPA1_OUT OPA1_IN0+ OPA1_IN0- RTOP RBOT RTAP VDDA Burnout currentsource Internal signal to ADC0 and COMP0 VREF+ DAC8.0_OUTOPA0_RTOPOPA0_RBOTGPAMP_OUT 4 5 60 1 7 0 2 3 41 5 0 1 2 4 OPA1_RTOP OPA0_RTOP Figure 8-1. Analog Connections

8.25 Input/Output Diagrams

The IOMUX manages the selection of which peripheral function is to be used on a digital IO and provides the controls for the output driver, input path, and the wake-up logic for wakeup from SHUTDOWN mode. For www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 45

more information, see the IOMUX section of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. The mixed-signal IO pin slice diagram for a full featured IO pin is shown in Figure 8-2 . Not all pins have analog functions, wake-up logic, drive strength control, and pullup or pulldown resistors available. See the device-specific data sheet for detailed information on what features are supported for a specific pin. RPULLUP VDDIO PC RPULLDOWN VSS HYSTEN INENA Unassigned Peripheral 01 Peripheral 15 Unassigned Peripheral 01 Peripheral 15 PF SHUTDOWN Wakeup WCOMP VSS VDDIO DRV Glitch Filter WUEN Wake to PMCU IO pin SHUTDOWN D Q EN D Q EN D Q EN S Q R WAKESTATE Input Logic Output Logic PIPU PIPD To analog peripheral function(s) D Q EN D Q EN D Q EN D Q EN D Q EN SHUTDOWN Latches Pullup enable Pulldown enable INV INV PMOS NMOS DIN DOUT Unassigned Peripheral 01 Peripheral 15 Hi-ZD Q EN Hi-Z Output Mux Output Mux Input Mux Driver Logic Drive strength NMOS Control PMOS Control S R RELEASE Q RSTN RSTN PF != 0 PC 5V tolerant open drain IO (ODIO) does not have PMOS control and pull-up resistor Figure 8-2. Superset Input/Output Diagram

8.26 Serial Wire Debug Interface

A serial wire debug (SWD) two-wire interface is provided via an Arm compatible serial wire debug port (SW- DP) to enable access to multiple debug functions within the device. For a complete description of the debug functionality offered on MSPM0 devices, see the debug chapter of the technical reference manual. MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Table 8-12. Serial Wire Debug Pin Requirements and Functions DEVICE SIGNAL DIRECTION SWD FUNCTION SWCLK Input Serial wire clock from debug probe SWDIO Input/Output Bi-directional (shared) serial wire data

8.27 Bootstrap Loader (BSL)

The bootstrap loader (BSL) enables configuration of the device as well as programming of the device memory through a UART or I2C serial interface. Access to the device memory and configuration through the BSL is protected by a 256-bit user-defined password, and it is possible to completely disable the BSL in the device configuration, if desired. The BSL is enabled by default from TI to support use of the BSL for production programming. A minimum of two pins are required to use the BSL: the BSLRX and BSLTX signals (for UART), or the BSLSCL and BSLSDA signals (for I 2C). Additionally, one or two additional pins (BSL_invoke and NRST) may be used for controlled invocation of the bootloader by an external host. If enabled, the BSL may be invoked (started) in the following ways:

  • The BSL is invoked during the boot process if the BSL_invoke pin state matches the defined BSL_invoke logic level. If the device fast boot mode is enabled, this invocation check is skipped. An external host can force the device into the BSL by asserting the invoke condition and applying a reset pulse to the NRST pin to trigger a BOOTRST, after which the device will verify the invoke condition during the reboot process and start the BSL if the invoke condition matches the expected logic level.
  • The BSL is automatically invoked during the boot process if the reset vector and stack pointer are left unprogrammed. As a result, a blank device from TI will invoke the BSL during the boot process without any need to provide a hardware invoke condition on the BSL_invoke pin. This enables production programming using just the serial interface signals.
  • The BSL may be invoked at runtime from application software by issuing a SYSRST with BSL entry command. Table 8-13. BSL Pin Requirements and Functions DEVICE SIGNAL CONNECTION BSL FUNCTION BSLRX Required for UART UART receive signal (RXD), an input BSLTX Required for UART UART transmit signal (TXD) an output BSLSCL Required for I2C I2C BSL clock signal (SCL) BSLSDA Required for I2C I2C BSL data signal (SDA) BSL_invoke Optional Active-high digital input used to start the BSL during boot NRST Optional Active-low reset pin used to trigger a reset and subsequent check of the invoke signal (BSL_invoke)

8.28 Device Factory Constants

All devices include a memory-mapped FACTORY region which provides read-only data describing the capabilities of a device as well as any factory-provided trim information for use by application software. Refer to the Factory Constants chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. Table 8-14. DEVICEID DEVICEID address is 0x41C4.0004, PARTNUM is bit 12 to 27, MANUFACTURER is bit 1 to 11. DEVICE DEVICEID.PARTNUM DEVICEID.MANUFACTURER MSPM0L1304 0xBB82 0x17 MSPM0L1305 0xBB82 0x17 MSPM0L1306 0xBB82 0x17 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 47

Table 8-15. USERID USERID address is 0x41C4.0008, PART is bit 0 to 15, VARIANT is bit 16 to 23 DEVICE PART VARIANT DEVICE PART VARIANT M0L1306QRHBRQ1 0xDDD3 0xC2 M0L1305QRGERQ1 0x4845 0x74 M0L1306QDGS32RQ1 0xDDD3 0xC2 M0L1305QDGS20RQ1 0x4845 0xB7 M0L1306QDGS28RQ1 0xBB70 0xC2 M0L1305QDYYRQ1 0x4845 0xEC M0L1306QRGERQ1 0xDDD3 0xC2 M0L1304QRHBRQ1 0xAA4D 0xA9 M0L1306QDGS20RQ1 0xDDD3 0x59 M0L1304QDGS32RQ1 0xAA4D 0x91 M0L1306QDYYRQ1 0xBB70 0x9F M0L1304QDGS28RQ1 0xAA4D 0xB6 M0L1305QRHBRQ1 0x4845 0x78 M0L1304QRGERQ1 0xAA4D 0x91 M0L1305QDGS32RQ1 0x4845 0x74 M0L1304QDGS20RQ1 0xAA4D 0x91 M0L1305QDGS28RQ1 0x4845 0x74 M0L1304QDYYRQ1 0xAA4D 0xA0

8.29 Identification

Revision and Device Identification The hardware revision and device identification values are stored in the memory-mapped FACTORY region (see the Device Factory Constants section) which provides read-only data describing the capabilities of a device as well as any factory-provided trim information for use by application software. For more information, see the Factory Constants chapter of the MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual. The device revision and identification information are also included as part of the top-side marking on the device package. The device-specific errata describes these markings (see Section 10.4). MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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9 Applications, Implementation, and Layout

9.1 Typical Application

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality.

9.1.1 Schematic

TI recommends connecting a combination of a 10-µF and a 0.1-µF low-ESR ceramic decoupling capacitor across the VDD and VSS pins, as well as placing these capacitors as close as possible to the supply pins that they decouple (within a few millimeters) to achieve a minimal loop area. The 10-µF bulk decoupling capacitor is a recommended value for most applications, but this capacitance may be adjusted if needed based upon the PCB design and application requirements. For example, larger bulk capacitors can be used, but this can affect the supply rail ramp-up time. The NRST reset pin must be pulled up to VDD (supply level) for the device to release from RESET state and start the boot process. TI recommends connecting an external 47-k Ω pullup resistor with a 10-nF pulldown capacitor for most applications, enabling the NRST pin to be controlled by another device or a debug probe. The SYSOSC frequency correction loop (FCL) circuit utilizes an external 100-k Ω with 0.1% tolerance resistor with a temperature coefficient (TCR) of 25ppm/C or better populated between the ROSC pin and VSS. This resistor establishes a reference current to stabilize the SYSOSC frequency through a correction loop. This resistor is required if the FCL feature is used for higher accuracy, and it is not required if the SYSOSC FCL is not enabled. When the FCL mode is not used, the PA2 pin may be used as a digital input/output pin. A 0.47-µF tank capacitor is required for the VCORE pin and must be placed close to the device with minimum distance to the device ground. Do not connect other circuits to the VCORE pin. For the 5-V-tolerant open drain (ODIO), a pullup resistor is required to output high for I2C and UART functions, as the open drain IO only implement a low-side NMOS driver and no high-side PMOS driver. The 5V-tolerant open drain IO are fail-safe and may have a voltage present even if VDD is not supplied. 0.1 F10 F 1.62 - 3.6 V ROSC 100 k ±0.1% ±25ppm 10nF NRST 0.47 F VDD VSS VCORE NRST MSPM0 MCU 47 k SWDIO SWCLK Debug interface 5V-tolerant open drain pins Pull-up resistors are required for output high PA0 PA1 Debug tool PU PU 1.62 - 5.5 V PA2/ROSC The NRST pullup resistor and capacitor are optional, but NRST must be pulled high to VDD for the device to start. Figure 9-1. Basic Application Schematic www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 49

10 Device and Documentation Support

TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device, generate code, and develop solutions are listed below.

10.1 Getting Started and Next Steps

10.2 Device Nomenclature

To designate the stages in the product development cycle, TI assigns prefixes to the part numbers of all MSP MCU devices and support tools. . Each MSP MCU commercial family member has one of two prefixes: MSP or X. These prefixes represent evolutionary stages of product development from engineering prototypes (X) through fully qualified production devices (MSP). X or XMS – Experimental device that is not necessarily representative of the final device's electrical specifications MSP – Fully qualified production device X and XMSdevices are shipped against the following disclaimer: "Developmental product is intended for internal evaluation purposes." MSP devices have been characterized fully, and the quality and reliability of the device have been demonstrated fully. TI's standard warranty applies. Predictions show that prototype devices (X) have a greater failure rate than the standard production devices. TI recommends that these devices not be used in any production system because their expected end-use failure rate still is undefined. Only qualified production devices are to be used. TI device nomenclature also includes a suffix with the device family name. This suffix indicates the temperature range, package type, and distribution format. Figure 10-1 provides a legend for reading the complete device name. M0 L 130 6 Q RHB R Q1 MCU Pla orm Product Family Device Subfamily Flash Memory Temperature range Package Type Distribuon Format Qualified for automove Figure 10-1. Device Nomenclature Table 10-1. Device Nomenclature Processor Family MSP = Mixed-signal processor X, XMS = Experimental silicon MCU Platform M0 = Arm-based 32-bit M0+ Product Family L = 32-MHz frequency Device Subfamily 130 = ADC, 2x OPA, COMP Internal Memory 4 = 16KB flash, 2KB SRAM 5 = 32KB flash, 4KB SRAM 6 = 64KB flash, 4KB SRAM Temperature Range Q = –40°C to 125°C , AEC-Q100 qualified Package Type See Section 5 and www.ti.com/packaging Distribution Format T = Small reel R = Large reel No marking = Tube or tray Qualification Q1 = Qualified for automotive applications MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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For orderable part numbers of MSP devices in different package types, see the Package Option Addendum of this document, ti.com, or contact your TI sales representative. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 51

10.3 Tools and Software

Design Kits and Evaluation Modules MSPM0 LaunchPad Development Kit: LP- MSPM0L1306 Empowers you to immediately start developing on the industry’s best integrated analog and most cost-optimized general purpose MSPM0 MCU family. Exposes all device pins and functionality; includes some built-in circuitry, out- of-box software demos, and on-board XDS110 debug probe for programming, debugging, and EnergyTrace™ technology. The LaunchPad ecosystem includes dozens of BoosterPack™ stackable plug- in modules to extend functionality. Embedded Software MSPM0 Software Development Kit (SDK) Contains software drivers, middleware libraries, documentation, tools, and code examples that create a familiar and easy user experience for all MSPM0 devices. Software Development Tools TI Cloud Tools Start your evaluation and development on a web browser without any installation. Cloud tools also have a downloadable, offline version. TI Resource Explorer Online portal to TI SDKs. Accessible in CCS IDE or in TI Cloud Tools. SysConfig Intuitive GUI to configure device and peripherals, resolve system conflicts, generate configuration code, and automate pin mux settings. Accessible in CCS IDE or in TI Cloud Tools. (offline version) MSP Academy Great starting point for all developers to learn about the MSPM0 MCU Platform with training modules that span a wide range of topics. Part of TIRex. GUI Composer GUIs that simplify evaluation of certain MSPM0 features, such as configuring and monitoring a fully integrated analog signal chain without any code needed. IDE and compiler tool chains Code Composer Studio™ (CCS) Includes TI Arm-Clang compiler. Supports all TI Arm Cortex MCUs and boasts competitive code size performance advantages, fast compile time, code coverage support, safety certification support, and completely free to use. IAR Embedded Workbench® IDE Keil® MDK IDE GNU Arm Embedded Tool Chain

10.4 Documentation Support

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Subscribe to updates to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document. The following documents describe the MSPM0 MCUs. Copies of these documents are available on the Internet at www.ti.com. Technical Reference Manual MSPM0 L-Series 32-MHz Microcontrollers Technical Reference Manual Detailed description of all modules and peripherals available in this device family. MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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Concise Description Description Application Reports Concise Description Description User's Guides Concise Description Description Selection and Solution Guides Concise Description Description White Papers Concise Description Description More Literature Concise Description Description

10.5 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

10.6 Trademarks

LaunchPad™, Code Composer Studio™, TI E2E™, EnergyTrace™, and BoosterPack™ are trademarks of Texas Instruments. Arm® and Cortex® are registered trademarks of Arm Limited. All trademarks are the property of their respective owners.

10.7 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

10.8 Glossary

TI Glossary This glossary lists and explains terms, acronyms, and definitions. www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 53

11 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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C18X 0.5 2X 4.5 20X 0.2750.165

5.14.7 TYP

0.150.050.25GAGE PLANE0-8 4X (0-15) 4X (7-15)

1.1 MAX

B3.12.9 A 5.25.0NOTE 3 0.70.4 (0.15) TYP VSSOP - 1.1 mm max heightDGS0020ASMALL OUTLINE PACKAGE 4226367/A 10/2020 10 11 0.1C A B PIN 1 INDEXAREA SEE DETAIL A 0.1 C SEATINGPLANE PowerPAD is a trademark of Texas Instruments.TYPICAL A 20 DETAIL A www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 55

0.05 MAXALL AROUND0.05 MINALL AROUND (4.4) (R0.05) TYP VSSOP - 1.1 mm max heightDGS0020ASMALL OUTLINE PACKAGE LAND PATTERN EXAMPLESCALE: 16X SYMM SYMM1 10 11 15.000 METALSOLDER MASKOPENINGMETAL UNDERSOLDER MASKSOLDER MASKOPENINGEXPOSED METALEXPOSED METALNON-SOLDER MASKSOLDER MASK DETAILSDEFINED(PREFERRED)SOLDER MASKDEFINED MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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(18X 0.5) (4.4) (R0.05) TYP VSSOP - 1.1 mm max heightDGS0020ASMALL OUTLINE PACKAGE SOLDER PASTE EXAMPLEBASED ON 0.125 mm THICK STENCILSCALE: 16X SYMM SYMM 10 11 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 57

C26X 0.5 2X 6.5 28X 0.2750.165 0.150.050.25GAGE PLANE0-8 1.1 MAX 4X (0-15) 4X (7-15)B3.12.9 A 7.27.0NOTE 3 0.70.4 (0.15) TYP VSSOP - 1.1 mm max heightDGS0028ASMALL OUTLINE PACKAGE 4226365/A 10/2020 14 15 0.1C A B PIN 1 INDEXAREA SEE DETAIL A 0.1 C SEATINGPLANE PowerPAD is a trademark of Texas Instruments.TYPICAL A 20 DETAIL A MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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0.05 MAXALL AROUND0.05 MINALL AROUND (4.4) (R0.05) TYP VSSOP - 1.1 mm max heightDGS0028ASMALL OUTLINE PACKAGE LAND PATTERN EXAMPLESCALE: 13X SYMM SYMM1 14 15 15.000 METALSOLDER MASKOPENINGMETAL UNDERSOLDER MASKSOLDER MASKOPENINGEXPOSED METALEXPOSED METALNON-SOLDER MASKSOLDER MASK DETAILSDEFINED(PREFERRED)SOLDER MASKDEFINED www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 59

(4.4) (R0.05) TYP VSSOP - 1.1 mm max heightDGS0028ASMALL OUTLINE PACKAGE SOLDER PASTE EXAMPLEBASED ON 0.125 mm THICK STENCILSCALE: 13X SYMM SYMM 14 15 MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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SOT-23-THIN - 1.1 mm max heightPLASTIC SMALL OUTLINEDYY0016A A 0.1C B PIN 1 INDEXAREA 4.34.1NOTE 3 2.11.9 3.363.1614X 0.5 2X3.5 16X 0.310.110.1CAB 1.1 MAX CSEATING PLANE

0.20.08 TYPSEE DETAIL A

www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 61

NOTES: (continued) 6. Publication IPC-7351 may have alternate designs. 7. Solder mask tolerances between and around signal pads can vary based on board fabrication site. EXAMPLE BOARD LAYOUT 4224642/B 07/2021 SOT-23-THIN - 1.1 mm max heightDYY0016APLASTIC SMALL OUTLINE SYMM SYMM LAND PATTERN EXAMPLEEXPOSED METAL SHOWNSCALE: 20X 8 9 METALSOLDER MASK OPENINGSOLDER MASKOPENINGMETAL UNDERSOLDER MASKNON- SOLDER MASKDEFINED(PREFERRED)SOLDER MASKDEFINEDSOLDER MASK DETAILS MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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SOT-23-THIN - 1.1 mm max heightDYY0016APLASTIC SMALL OUTLINE SOLDER PASTE EXAMPLEBASED ON 0.125 mm THICK STENCILSCALE: 20X SYMM SYMM16X (0.3)16X (1.05) 8 9 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 63

MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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C SEE TERMINALDETAIL 24X 0.30.2 2.450.1 24X 0.50.3

1 MAX

(0.2) TYP0.050.00 20X 0.5 2X2.5 2X 2.5 A 4.13.9B VQFN - 1 mm max heightRGE0024BPLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017 PIN 1 INDEX AREA

0.08 CSEATING PLANE

2419(OPTIONAL)PIN 1 ID0.1C A B0.05 EXPOSEDTHERMAL PAD25SYMM SCALE 3.000 DETAILOPTIONAL TERMINALTYPICAL www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 65

0.07 MINALL AROUND0.07 MAXALL AROUND (0.2) TYPVIA20X (0.5)(3.8) (3.8) (2.45) (R0.05)TYP (0.975) TYP VQFN - 1 mm max heightRGE0024BPLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017 SYMM1 67 1213 181924 SYMM LAND PATTERN EXAMPLEEXPOSED METAL SHOWNSCALE:15X SOLDER MASKOPENINGMETAL UNDERSOLDER MASKSOLDER MASKDEFINEDEXPOSEDMETALMETALSOLDER MASKOPENINGNON SOLDER MASKSOLDER MASK DETAILSDEFINED(PREFERRED)EXPOSEDMETAL MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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20X (0.5) (3.8) (3.8) 4X (1.08) (0.64)TYP (0.64) TYP (R0.05) TYP VQFN - 1 mm max heightRGE0024BPLASTIC QUAD FLATPACK - NO LEAD 4219013/A 05/2017NOTES: (continued) 6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. SYMMMETALTYP BASED ON 0.125 mm THICK STENCILSOLDER PASTE EXAMPLE EXPOSED PAD 2578% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGESCALE:20X SYMM 67 1213 181924 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 67

Images above are just a representation of the package family, actual package may vary.Refer to the product data sheet for package details. VQFN - 1 mm max heightRHB 32PLASTIC QUAD FLATPACK - NO LEAD5 x 5, 0.5 mm pitch 4224745/A MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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C 32X 0.30.2 3.450.1 32X 0.50.3 2X 3.5 A 5.14.9B 5.14.9(0.1) VQFN - 1 mm max heightRHB0032EPLASTIC QUAD FLATPACK - NO LEAD 4223442/B 08/2019 PIN 1 INDEX AREA 32 25(OPTIONAL)PIN 1 ID0.1C A B0.05C EXPOSEDTHERMAL PAD 33SYMM SCALE 3.000 SEE SIDE WALLDETAIL SIDE WALL DETAIL20.000 OPTIONAL METAL THICKNESS www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 69

(1.475)0.07 MINALL AROUND0.07 MAXALL AROUND (0.2) TYPVIA28X (0.5)(4.8) (4.8) (1.475) (3.45) (R0.05)TYP VQFN - 1 mm max heightRHB0032EPLASTIC QUAD FLATPACK - NO LEAD 4223442/B 08/2019 SYMM1 89 1617 242532 SYMM LAND PATTERN EXAMPLESCALE:18X SOLDER MASKOPENINGMETAL UNDERSOLDER MASKSOLDER MASKDEFINED METALSOLDER MASKOPENINGNON SOLDER MASKSOLDER MASK DETAILSDEFINED(PREFERRED) MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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(4.8) (4.8) 4X (1.49) (0.845) (0.845)(R0.05) TYP VQFN - 1 mm max heightRHB0032EPLASTIC QUAD FLATPACK - NO LEAD 4223442/B 08/2019NOTES: (continued) 6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. SYMMMETALTYP BASED ON 0.125 mm THICK STENCILSOLDER PASTE EXAMPLE EXPOSED PAD 33:75% PRINTED SOLDER COVERAGE BY AREA UNDER PACKAGESCALE:20X SYMM 9 16 242532 www.ti.com MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 ADVANCE INFORMATION Copyright © 2023 Texas Instruments Incorporated Submit Document Feedback 71

NOTE: Page numbers for previous revisions may differ from page numbers in the current version. DATE REVISION NOTES May 2023 * Initial Release MSPM0L1306-Q1, MSPM0L1305-Q1 SLASF59 – MAY 2023 www.ti.com ADVANCE INFORMATION

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www.ti.com 31-Aug-2023 PACKAGING INFORMATION Orderable Device Status (1) Package Type Package Drawing Pins Package Qty Eco Plan (2) Lead finish/ Ball material (6) MSL Peak Temp (3) Op Temp (°C) Device Marking (4/5) Samples XM0L1305QRHBRQ1 ACTIVE VQFN RHB 32 3000 TBD Call TI Call TI -40 to 125 Samples XM0L1306QDGS20RQ1 ACTIVE VSSOP DGS 20 2000 TBD Call TI Call TI -40 to 125 Samples XM0L1306QDGS28RQ1 ACTIVE VSSOP DGS 28 1 TBD Call TI Call TI -40 to 125 Samples XM0L1306QDYYRQ1 ACTIVE SOT-23-THIN DYY 16 3000 TBD Call TI Call TI -40 to 125 Samples XM0L1306QRGERQ1 ACTIVE VQFN RGE 24 3000 TBD Call TI Call TI -40 to 125 Samples XM0L1306QRHBRQ1 ACTIVE VQFN RHB 32 3000 TBD Call TI Call TI -40 to 125 Samples (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may reference these types of products as "Pb-Free". RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption. Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based flame retardants must also meet the <=1000ppm threshold requirement. (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum column width. Addendum-Page 1

www.ti.com 31-Aug-2023 Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. OTHER QUALIFIED VERSIONS OF MSPM0L1305-Q1, MSPM0L1306-Q1 :

  • Catalog : MSPM0L1305 , MSPM0L1306 NOTE: Qualified Version Definitions:
  • Catalog - TI's standard catalog product Addendum-Page 2

IMPORTANT NOTICE AND DISCLAIMER TI PROVIDES TECHNICAL AND RELIABILITY DATA (INCLUDING DATA SHEETS), DESIGN RESOURCES (INCLUDING REFERENCE DESIGNS), APPLICATION OR OTHER DESIGN ADVICE, WEB TOOLS, SAFETY INFORMATION, AND OTHER RESOURCES “AS IS” AND WITH ALL FAULTS, AND DISCLAIMS ALL WARRANTIES, EXPRESS AND IMPLIED, INCLUDING WITHOUT LIMITATION ANY IMPLIED WARRANTIES OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE OR NON-INFRINGEMENT OF THIRD PARTY INTELLECTUAL PROPERTY RIGHTS. These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate TI products for your application, (2) designing, validating and testing your application, and (3) ensuring your application meets applicable standards, and any other safety, security, regulatory or other requirements. These resources are subject to change without notice. TI grants you permission to use these resources only for development of an application that uses the TI products described in the resource. Other reproduction and display of these resources is prohibited. No license is granted to any other TI intellectual property right or to any third party intellectual property right. TI disclaims responsibility for, and you will fully indemnify TI and its representatives against, any claims, damages, costs, losses, and liabilities arising out of your use of these resources. TI’s products are provided subject to TI’s Terms of Sale or other applicable terms available either on ti.com or provided in conjunction with such TI products. TI’s provision of these resources does not expand or otherwise alter TI’s applicable warranties or warranty disclaimers for TI products. TI objects to and rejects any additional or different terms you may have proposed. IMPORTANT NOTICE Mailing Address: Texas Instruments, Post Office Box 655303, Dallas, Texas 75265 Copyright © 2023, Texas Instruments Incorporated