5041 NPC | Alldatasheet

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SEIKO NPC CORPORATION—1 High-stability Crystal Oscillator IC with Frequency Adjustment Function OVERVIEW The 5041 series are high-stability clock oscillator ICs with built-in frequency adjustment functions. The frequency adjustment functions can be optimized, by the addition of a minimal adjustment process, to improve the frequency stability. The function is implemented using frequency adjustment data written to a built-in EEPROM over a 1-wire serial interface. The ICs are ideal for compact crystal oscillators for use in applications such as WiMAX (Worldwide Interoperability for Microwave Access) and PLC (Power Line Communication) that require high frequency stability in the order of 30 to 10ppm. They use a pad layout suitable for flip chip bonding mounting.

FEATURES

I Realizing frequency stability improvement with minimal additional process I Temperature compensation range/ operating tem- perature range: C to +85 C I Frequency adjustment functions built-in

  • Frequency-temperature characteristics compen- sation function AT-cut crystal, 3rd order harmonic frequency- temperature characteristics compensation, with independent low-temperature and high-temper- ature range compensation settings - Center frequency adjustment function - Temperature rotation compensation function - Low-temperature characteristics compensation - High-temperature characteristics compensation I Rewritable EEPROM built-in I 6 pads: same as general clock oscillator ICs I Operating supply voltage range
  • 5041A : 2.25V to 3.63V
  • 5041B A: 1.60V to 2.25V I Recommended oscillation frequency range: 20MHz to 55MHz (for fundamental oscillation) I Frequency divider built-in:
  • Selectable by version: f O , f O /2, f O /4, f O /8, f O /16, f O /32
  • Frequency divider output for 0.625MHz (min) low frequency output I Standby function High-impedance in standby mode, oscillator stops I CMOS output I 15pF output load I Pad layout for flip chip bonding I Wafer form (WF5041 ××× FREQUENCY CHARACTERISTICS COMPENSATION BEFORE and AFTER ADJUSTMENT

APPLICATIONS

I 3.2mm 2.5mm, 2.5mm 2.0mm, 2.0mm 1.6mm size miniature crystal oscillator modules I WiMAX, WiBro, PLC and applications requiring high-stability clock oscillators

ORDERING INFORMATION

×××−

4 Wafer form

Ta [°C] 40 60 80 100−20−40 −50 −40 −30 −20 −10 ∆f/f [ppm] ± 10ppm Before compensation After compensation

SEIKO NPC CORPORATION—2 SERIES CONFIGURATION TEMPERATURE ADJUSTMENT FUNCTION GAIN SETTING RATIO Temperature adjustment function gain setting ratio of 5041A A and 5041A B differs. In the case of tempera- ture adjustment function that rotates temperature characteristics on T origin, adjustment sensitivity of 5041A B is designed twice as higher than that of 5041A A based on non-compensation temperature deviation in same register value setting. VERSION NAME Pad layout Recommended oscillation frequency range [MHz] *1. The recommended oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscilla- tion frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. Operating supply voltage range [V] Temperature adjustment function gain setting ratio *2. Values in parentheses ( ) are provisional only. Output frequency and version name *3. Versions in parentheses ( ) are under development. f O f O /2 f O /4 f O /8 f O /16 f O /32 for flip chip bonding 20 to 55 2.25 to 3.63 1 5041A1A 5041A2A 5041A3A 5041A4A 5041A5A 5041A6A 2 5041A1B 5041A2B 5041A3B 5041A4B 5041A5B 5041A6B 1.60 to 2.25 (1) (5041B1A) (5041B2A) (5041B3A) (5041B4A) (5041B5A) (5041B6A) Device Package Version name WF5041 ×××− Ta [°C] Frequency [MHz] Temperature deviation at non-compensation <Gain setting ratio> 5041A×A : 5041A×B 1 : 2 5041A×A 5041A×B Form WF: Wafer form WF5041 −4 Frequency divider function (output frequency) Temperature adjustment function gain setting ratio Operating supply voltage

SEIKO NPC CORPORATION—3 PAD LAYOUT (Unit: µ PAD DIMENSIONS PIN DESCRIPTION BLOCK DIAGRAM Chip size: 0.84mm 0.69mm Chip thickness: 130 µ m µ m Pad size: 80 µ m µ m Chip base: V SS level Pad No. Pin I/O Name Description Pad dimensions [µm] XY 1 XT I Amplifier input Crystal connection pins. Crystal is connected between XT and XTN. –225.2 –253.5 2 XTN O Amplifier output 225.2 –253.5 3 VDD – (+) supply voltage – 328.5 –5.0

4 Q O Output

Output frequency determined by internal circuit to one of f O , f O /2, f O /4, f O /8, f O /16, f O /32. High impedance in standby mode 328.5 223.8 5 VSS – (–) ground – –328.5 223.8 6 INHN I Output state control input High impedance when LOW (oscillator stops). Power-saving pull-up resistor built-in. –328.5 –5.0 *1. N = 1, 2, 4, 8, 16, 32 (mask option) *2. 5041A version only VSS INHN XT Q (0,0) (420,345) X Y VDD XTN (−420,−345) RF N INHN VSS Temperature Compensation Oscillation Detection FO, TO, RTG, TLO, TLG, THO, THG Control Register Q Regulator RV RV XT XTN VDD

SEIKO NPC CORPORATION—4 ABSOLUTE MAXIMUM RATINGS V SS 0V unless otherwise noted. Note. Absolute maximum ratings are the values that must never exceed even for a moment. This product may suffer breakdown if any one of these parameter ratings is exceeded. Operation and characteristics are guaranteed only when the product is operated at recommended su pply voltage range. RECOMMENDED OPERATING CONDITIONS V SS 0V unless otherwise noted. Parameter Symbol Conditions Rating Unit Supply voltage range V DD Between VDD and VSS 0.3 to 4.0 V Program read/write supply voltage range V PP Between INHN and VSS 0.3 to 16.5 V Input voltage range *1. V DD is a V DD value of recommended operating conditions. V IN Input pins 0.3 to V DD 0.3 V Output voltage range V OUT Output pins 0.3 to V DD 0.3 V Output current I OUT Q pin 20 mA Storage temperature range T STG Wafer form 65 to 150 C EEPROM maximum writes N EW 100 times Parameter Symbol Conditions Rating *1. Values in parentheses ( ) are provisional only. Unit Min Typ Max Supply voltage V DD Between VDD and VSS 5041A 2.25 – 3.63 V 5041B A 1.60 – 2.25 V Input voltage V IN Input pins (XT, INHN) V SS DD V Operating temperature T OPR 40 – C Oscillation frequency *2. The recommended oscillation frequency is a yardstick value derived from the crystal used for NPC characteristics authentication. However, the oscilla- tion frequency range is not guaranteed. Specifically, the characteristics can vary greatly due to crystal characteristics and mounting conditions, so the oscillation characteristics of components must be carefully evaluated. fo 5041A 2 0–5 5 M H z 5041B A (20) – (55) MHz Output frequency f OUT Q pin 5041A 0.625 – 55 MHz 5041B Output load capacitance C LOUT Q pin – – 15 pF

SEIKO NPC CORPORATION—5

ELECTRICAL CHARACTERISTICS

DC Characteristics (5041A1 to A6 VDD = 2.25V to 3.63V , VSS = 0V , Ta = −40°C to +85°C, CLOUT = 15pF unless otherwise noted. Parameter Symbol Conditions Rating Unit MIN TYP MAX Operating-mode current consumption*1 *1. The consumption current IDD (CLOUT) with a load capacitance (CLOUT) connected to the Q pin is given by the following equation, where IDD is the no- load consumption current and fOUT is the output frequency. IDD (CLOUT) [mA] = IDD [mA] + CLOUT [pF] × VDD [V] × fOUT [MHz] × 10–3 IDD 5041A1× (fOUT = fo), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 1.4 2.8 mA VDD = 3.3V – 1.7 3.4 mA 5041A2× (fOUT = fo/2), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 1.1 2.2 mA VDD = 3.3V – 1.4 2.7 mA 5041A3× (fOUT = fo/4), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 1.0 1.9 mA VDD = 3.3V – 1.2 2.4 mA 5041A4× (fOUT = fo/8), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 0.9 1.7 mA VDD = 3.3V – 1.0 2.1 mA 5041A5× (fOUT = fo/16), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 0.8 1.7 mA VDD = 3.3V – 1.0 2.0 mA 5041A6× (fOUT = fo/32), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz VDD = 2.5V – 0.8 1.6 mA VDD = 3.3V – 1.0 2.0 mA Standby-mode current consumption IST Measurement circuit 1, INHN = LOW – – 10 µA HIGH-level output voltage V OH Q pin, Measurement circuit 3, IOH = −4mA V DD−0.4 – – V LOW-level output voltage V OL Q pin, Measurement circuit 3, IOL = 4mA – – 0.4 V Output leakage current I Z Measurement circuit 4, INHN = LOW Q = VDD –– 1 0 µA Q = VSS −10 – – µA HIGH-level input current V IH INHN pin, Measurement circuit 5 0.7VDD –– V LOW-level input current V IL – – 0.3V DD V INHN pull-up resistance RPU1 Measurement circuit 6 INHN = VSS 0.4 1.5 10 MΩ RPU2 INHN = 0.7VDD 50 100 200 kΩ

SEIKO NPC CORPORATION—6 DC Characteristics (5041B1A to B6A) VDD = 1.60V to 2.25V , VSS = 0V , Ta = −40°C to +85°C, CLOUT = 15pF unless otherwise noted. Parameter Symbol Conditions Rating Unit MIN TYP MAX Operating-mode current consumption*1 *1. The consumption current IDD (CLOUT) with a load capacitance (CLOUT) connected to the Q pin is given by the following equation, where IDD is the no- load consumption current and fOUT is the output frequency. IDD (CLOUT) [mA] = IDD [mA] + CLOUT [pF] × VDD [V] × fOUT [MHz] × 10–3 IDD 5041B1A (fOUT = fo), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.7 3.4 mA 5041B2A (fOUT = fo/2), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.5 3.3 mA 5041B3A (fOUT = fo/4), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.4 3.2 mA 5041B4A (fOUT = fo/8), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.4 3.1 mA 5041B5A (fOUT = fo/16), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.3 3.1 mA 5041B6A (fOUT = fo/32), Measurement circuit 1, no load, INHN = HIGH, fo = 48MHz, VDD = 1.8V – 1.3 3.0 mA Standby-mode current consumption IST Measurement circuit 1, INHN = LOW – – 10 µA HIGH-level output voltage V OH Q pin, Measurement circuit 3, IOH = −4mA V DD−0.4 – – V LOW-level output voltage V OL Q pin, Measurement circuit 3, IOL = 4mA – – 0.4 V Output leakage current I Z Measurement circuit 4, INHN = LOW Q = VDD –– 1 0 µA Q = VSS −10 – – µA HIGH-level input current V IH INHN pin, Measurement circuit 5 0.7VDD –– V LOW-level input current V IL – – 0.3V DD V INHN pull-up resistance RPU1 Measurement circuit 6 INHN = VSS 0.4 1.5 10 MΩ RPU2 INHN = 0.7VDD 50 100 200 kΩ

SEIKO NPC CORPORATION—8 MEASUREMENT CIRCUITS Measurement Circuit 1 Parameters: IDD, IST, Duty, tr, tf Measurement Circuit 2 Parameters: tOD XT input signal: 1Vp-p, sine wave Measurement Circuit 3 Parameters: VOH, VOL XT input signal: 1Vp-p, sine wave Measurement Circuit 4 Parameters: IZ Measurement Circuit 5 Parameters: VIH, VIL Measurement Circuit 6 Parameters: RPU1, RPU2 Note: The AC characteristics are observed using an oscilloscope on pin Q. VDD VSS XT QCrystal XTN INHN IDD ISTA (Including probe capacitance) CLOUT = 15pF IDD, DUTY, tr, tf: Open IST: Short IDD: Open DUTY, tr, tf: Short IST: Open or Short VDD VSS Q XT INHN Signal Generator 50Ω 0.001µF VDD or VSS RL2 =1kΩ RL1 =1kΩ VDD VSS Q XTSignal Generator 50Ω 0.001µF VOH VOL V 50Ω 0.1µF VS VOH VS VOL VS VS adjusted such that ∆V = 50 × IOH. VS adjusted such that ∆V = 50 × IOL. VDD VSS Q INHN IZ A VDD or VSS VDD VSSINHN VIH VIL VT1 VT2 V VDD VSSINHN VIN V A IPU VDD IPU (VIN = 0V) RPU2 = IPU VDD 0.7VDD RPU1 = (VIN = 0.7VDD)

SEIKO NPC CORPORATION—10 Power-saving Pull-up Resistor The INHN pin pull-up resistance RPU1 or RPU2 changes in response to the input level (open, HIGH, or LOW). When INHN is tied LOW level, the pull-up resistance is large (R PU1), reducing the current consumed by the resistance. When INHN is left open circuit (HIGH), the pull-up resistance is small (RPU2), which increases the input susceptibility to external noise. However, the pull-up resistance ties the INHN pin HIGH level to prevent external noise from unexpectedly stopping the output. Oscillation Detector Function The 5041 series also feature an oscillation detector circuit. This circuit functions to disable the outputs until the oscillator circuit starts and oscillation becomes stable. This alleviates the danger of abnormal oscillator output at oscillator start-up when power is applied or when INHN is switched.

SEIKO NPC CORPORATION—11 NC0904AE 2009.10 Please pay your attention to the following points at time of using the products shown in this document. 1. The products shown in this catalog (hereinafter “Products”) are not designed and manufactured to be used for the apparatus th at exerts harmful influence on the human lives due to the defects, failure or malfunction of the Products. If you wish to use the P roducts in that apparatus, please contact our sales section in advance. In the event that the Products are used in such apparatus without our prior approval, we assume no responsibility whatsoever for any damages resulting from the use of that apparatus. 2. NPC reserves the right to change the specifications of the Products in order to improve the characteristics or reliability thereof. 3. The information described in this catalog is presented only as a guide for using the Products. No responsibility is assumed b y us for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by impli cation or otherwise under any patents or other rights of the third parties. Then, we assume no responsibility whatsoever for any damages resulting from that infringements. 4. The constant of each circuit shown in this catalog is described as an example, and it is not guaranteed about its value of th e mass- production products. 5. In the case of that the Products in this catalog falls under the foreign exchange and foreign trade control law or other appl icable laws and regulations, approval of the export to be based on those laws and regulations are necessary. Customers are requested appropriately take steps to obtain required permissions or approvals form appropriate government agencies. SEIKO NPC CORPORATION 15-6, Nihombashi-kabutocho, Chuo-ku, Tokyo 103-0026, Japan Telephone: +81-3-6667-6601 Facsimile: +81-3-6667-6611 http://www.npc.co.jp/ Email: sales @npc.co.jp