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UltraThin Ceramic Capacitors UT Series The Ultrathin (UT) series of ceramic capacitors is a new product offering from AVX. The UT series was designed to meet the stringent thickness requirements of our customers. AVX developed a new termination process (FCT - Fine Copper Termination) that provides unbeatable flatness and repeatability. The series includes products < 0.35mm in height and is targeted for applications such as Smart cards, Memory modules, High Density SIM cards, Mobile phones, MP3 players, and embedded solutions. HOW TO ORDER UT Style Ultra Thin Case Size 0402 D Temperature Characteristic X5R M Cap Tolerance ± 20% A Termination Style Commercial T Termination T = 100% Sn C = Cu Packaging 2 = 7" Reel 15,000 pcs 4 = 13" Reel 50,000 pcs D Thickness D = 0.30mm max E = 0.25mm max F = 0.15mm max (only availabe in Cu Termination) Thickness L W T BL PART DIMENSIONS inches (mm) RECOMMENDED SOLDER PAD DIMENSIONS (Sn Termination) mm (inches) 0.50 (0.020) 0.50 (0.020) 0.60 (0.024) 1.70 (0.067) Cap Code 6.3V 10V 16V 25V

103 F E E D

223 D D

CAP RANGE (THICKNESS CODE) TT µM 10.0 ± 4.00 mil 0.40 ± 0.16 TYPICAL Cu THICKNESS Top View BL L End View Side View WL BL T Rated Voltage 6 = 6.3V Z = 10V Y = 16V 3 = 25V 103 Coded Cap (in pF)

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UltraThin Ceramic Capacitors UT Series Specifications and Test Methods – Cu Termination Parameter/Test Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 kHz ± 10% Dissipation Factor ≤ 3.0% for ≥ 25V DC rating Voltage: 1.0Vrms ± .2V ≤ 12.5% for ≤ 16V DC rating Insulation Resistance 100 MΩ - μF Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Charge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, with charge and discharge current limited to 50 mA (max) Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds Resistance to Variation ≤ ±12% Flexure Dissipation Meets Initial Values (As Above)Stresses Factor Insulation ≥ Initial Value x 0.3Resistance Appearance No visual defects Capacitance Variation ≤ ±20% Dissipation ≤ Initial Value x 2.0 (As Above)Load Life Factor Insulation ≥ Initial Value x 0.3 (As Above)Resistance Dielectric Meets Initial Values (As Above)Strength Charge device with 1.5X rated voltage in test chamber set at 85ºC ± 2ºC for 1000 hours (+48, -0) Remove from test chamber and stabilize at room temperature for 24 ± 2 hours before measuring. 1mm/sec 90 mm

UltraThin Ceramic Capacitors UT Series Specifications and Test Methods – Sn Termination Parameter/Test Specification Limits Measuring Conditions Operating Temperature Range -55ºC to +85ºC Temperature Cycle Chamber Capacitance Within specified tolerance Freq.: 1.0 kHz ± 10% Dissipation Factor ≤ 3.0% for ≥ 25V DC rating Voltage: 1.0Vrms ± 0.2V≤ 12.5% for ≤ 16V DC rating Insulation Resistance 100 MΩ - μF Charge device with rated voltage for 120 ± 5 secs @ room temp/humidity Charge device with 300% of rated voltage for Dielectric Strength No breakdown or visual defects 1-5 seconds, with charge and discharge current limited to 50 mA (max) Appearance No defects Deflection: 2mm Capacitance Test Time: 30 seconds Resistance to Variation ≤ ±12% Flexure Dissipation Meets Initial Values (As Above)Stresses Factor Insulation ≥ Initial Value x 0.3Resistance Solderability ≥ 95% of each terminal should be covered Dip device in eutectic solder at 245 ± 5ºC with fresh solder for 5.0 ± 0.5 seconds Appearance No defects, <25% leaching of either end terminal Capacitance Variation ≤ ±7.5% Dip device in eutectic solder at 260ºC for 60Dissipation Meets Initial Values (As Above) seconds. Store at room temperature for 24 ± 2Resistance to Factor hours before measuring electrical properties.Solder Heat Insulation Meets Initial Values (As Above)Resistance Dielectric Meets Initial Values (As Above)Strength Appearance No visual defects Capacitance Variation ≤ ±12% Dissipation ≤ Initial Value x 2.0 (As Above)Load Life Factor Insulation ≥ Initial Value x 0.3 (As Above)Resistance Dielectric Meets Initial Values (As Above)Strength Appearance No visual defects Capacitance Variation ≤ ±12% Load Dissipation ≤ Initial Value x 2.0 (As Above)Humidity Factor Insulation ≥ Initial Value x 0.3 (As Above)Resistance Dielectric Meets Initial Values (As Above)Strength Charge device with 1.5X rated voltage in test chamber set at 85ºC ± 2ºC for 1000 hours (+48, -0) Remove from test chamber and stabilize at room temperature for 24 ± 2 hours before measuring. Store in a test chamber set at 85ºC ± 2ºC/ 85% ± 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature and humidity for 24 ± 2 hours before measuring. 1mm/sec 90 mm