UPC2539 NEC | Alldatasheet

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Technical content

Bi-CMOS INTEGRATED CIRCUIT µPC2539 The µPC2539 is data demodulator IC for FM receiver applying to Radio Data System in European countries and Radio Broadcasting Data System in USA. This IC carries out to extract 57kHz RDS signal from FM multiplex signal, demodulate data-stream, recover bit-rate-clock, and discriminate SK signal in ARI system.

FEATURES

  • Adjustment-free
  • Built-in 57kHz band-pass-filter consist of switched capactiors.
  • High sensitivity.
  • Employing digital PLL.
  • Small outline plastic package

ORDERING INFORMATION

µPC2539GS 24-pin plastic SOP (300 mil) BLOCK DIAGRAM Document No. S11570EJ1V0DS00 (1st edition) Date Published May 1996 P Printed in Japan The information in this document is subject to change without notice. RDS DATA DEMODULATOR IC © 1996 PRELIMINARY DATA SHEET 24 23 22 21 20 19 18 17 16 15 14 13 123456789 1 0 1 1 1 2 57kHz BPF COSTAS BIPHASE DECODER DIFFERENTIAL DECODER CLOCK RECOVERY SK DET OSC

µPC2539 PIN CONFIGURATION (Top View) VDD TEST1 TEST2 CLK OUT DATA OUT RDS IND SK IND TEST3 TEST4 DGND OSC IN OSC OUT V CC TEST9 TEST8 TEST7 BPF IN REF BPF OUT DSB IN AGND OP. CTL TEST6 TEST5

µPC2539 PIN FUNCTIONS Pin no. Pin name Function 1V DD Power Supply for Digital Circuit 2 TEST1 Pin for Test : Normally connect to GND. 3 TEST2 Pin for Test : Normally be open.

4 CLK OUT Bit-Rate-Clock Output Pin

5 DATA OUT RDS Data Output Pin

6 RDS IND RDS Idenrification Indicator : When RDS signal is detected, the output voltage becomes

to Low level.

7 SK IND SK Identification Indicator : When SK signal is detected, the output voltage becomes to

Low level. 8 TEST3 Pin for Test : Normally connect to GND. 9 TEST4 Pin for Test : Normally connect to GND.

10 DGND GND for Digital Circuit

11 OSC IN Oscillator Input Pin

12 OSC OUT Oscillator Output Pin

13 TEST5 Pin for Test : Normally be open. 14 TEST6 Pin for Test : Normally connect to GND. 15 OP.CTL Operation/Stop control Pin : High:Operation mode, Low:Stop mode

16 AGND GND for Analog Circuit

17 DSB IN DSB Demodulator Input Pin

18 BPF OUT Band-Pass-Filter Output Pin

19 REF Reference Voltage for BPF

20 BPF IN Band-Pass-Filter Input Pin

21 TEST7 Pin for Test : Normally connect to GND. 22 TEST8 Pin for Test : Normally connect to GND. 23 TEST9 Pin for Test : Normally connect to GND. 24 V CC Power Supply for Analog Circuit

µPC2539 ELECTRICAL SPECIFICATIONS (PRELIMINARY) ABSOLUTE MAXIMUM RATINGS (Unless otherwise specified, T A =25°C) Parameter Symbol Conditions Ratings Unit Supply voltage V CC V CC pin, VDD pin 7.0 V Power dissipation Pd T A =85 °C 280 mW Operating ambient temperature Topt –30 to +85 °C Storage temperature Tstg –40 to +125 °C Caution Exposure to Absolute Macimum Rating for extended periods may affect device reliability; exceeding the ratings could cause permanent damage. The parameters apply independently. RECOMMENDED OPERATING CONDITIONS Parameter Symbol Conditions MIN. TYP. MAX. Unit Sypply voltage V CC V CC pin, VDD pin 4.5 5.0 5.5 V FM Demoulation Signal Vin MONO, Δ f=75kHz 280 mVrms Input Voltage ELECTRICAL CHARACTERISTICS (Unliss otherwise specified, TA =25°C, VCC =V DD =5.0V) Parameter Symbol Conditions MIN. TYP. MAX. Unit Circuit current I CC No Signal 10 15 20 mA SK Detection Sensitivity(ON) Ssk1 SK ONLY 2.5 3.5 4.5 mVrms SK Detection Sensitivity(OFF) Ssk2 SK ONLY 1.0 2.0 3.0 mVrms SK Lock Up Time Tsk SK ONLY, Vsk=10mVrms 12 16 20 bit RDS Lock Up Time 1 Trds1 RDS ONLY 10 40 80 bit RDS Lock Up Time 2 Trds2 RDS+SK, Vsk=10mVrms 20 50 100 bit Output Voltage(H Level) VOH Io= ±100µ A, Pin 4, 5, 6 4.90 4.95 – V Io=±5µA, Pin 7 4.90 4.95 – V Output Voltage(L Level) VOL Io= ±100µ A, Pin 4, 5, 6 – 0.05 0.10 V Io=±5µA, Pin 7 – 0.05 0.10 V Band-Pass-Filter Characteristics Peak Gain Av fin=57kHz, Vin=10mVrms 22 25 28 dB Pass Band Width BW Av-3dB 2.8 3.3 3.8 kHz Attenuation 1 ATT1 fin=53kHz, Vin=10mVrms 23 27 31 dB Attenuation 2 ATT2 fin=38kHz, Vin=10mVrms 75 85 – dB Maximum Input Level Vinmax fin=57kHz 120 150 – mVp-p Signal to Noise Ratio S/N fin=57kHz, Vin=3mVrms 25 30 – dB Input Impedance Zin 26 35 44 k Ω Output Impedance Zout – 300 660 Ω

µPC2539 TIMING CHART OF DATA OUTPUT AND CLOCK OUTPUT DATA OUTPUT (From pin5) CLOCK OUTPUT (From pin4) µ s 210.5 ±10 sµ µ s 421.5 ±10 sµ µ s 210.5 ±10 sµ

µPC2539 APPLICATION CIRCUIT ESAMPLE Notes 1. Pin 7 does not have ability enough to drive LED directly because of internal serial resistor (10kΩ ) shown in following figure. In application for system with no ARI signal such as RBDS in USA, pin 7 is recommended to be connected with V DD . 2. Crystal oscillation frequency tolerance : ±100ppm The equivalent circuit in pin 7 10k Ω S K detector block PLL block µ0.1 F VCC =+5V µ100 F+ µ0.1 F INPUT 4700pF 4700pF +5V OPERATE STOP 24 23 22 21 20 19 18 17 16 15 14 13 123456789 1 0 1 1 1 2 µ0.1 F COSTAS BIPHASE DECODER DIFFERENTIAL DECODER 57kHz BPF SK DET CLOCK RECOVERY OSC 4.332MHz +5V RBDS 22pF 22pF RDS SK IND RDS IND DATA OUT CLK OUT µ0.1 F

µPC2539 PACKAGE DRAWING ITEM MILLIMETERS INCHES A B C E F G H I J 15.54 MAX. 1.27 (T.P.) 1.8 MAX. 1.55 7.7±0.3 0.78 MAX. 0.12 1.1 5.6 M 0.1±0.1 N 0.612 MAX. 0.031 MAX. 0.004±0.004 0.071 MAX. 0.061 0.303±0.012 0.220 0.043 0.005 0.050 (T.P.) P24GM-50-300B-4 P3 ° 3°+7° NOTE Each lead centerline is located within 0.12 mm (0.005 inch) of its true position (T.P.) at maximum material condition. D 0.40 0.016+0.10 –0.05 K 0.20 0.008+0.10 –0.05 L 0.6±0.2 0.024 0.10 –3° +7° –3° 0.004 +0.008 –0.009 +0.004 –0.002 +0.004 –0.003 A C D G P detail of lead end F E B H I L K M J N M 11 2 1324

24 PIN PLASTIC SOP (300 mil)

µPC2539 No part of this document may be copied or reproduced in any form or by any means without the prior written consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in this document. NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from use of a device described herein or any other liability arising from use of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC Corporation or others. While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices, the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or property arising from a defect in an NEC semiconductor device, customer must incorporate sufficient safety measures in its design, such as redundancy, fire-containment, and anti-failure features. NEC devices are classified into the following three quality grades: “Standard“, “Special“, and “Specific“. The Specific quality grade applies only to devices developed based on a customer designated “quality assurance program“ for a specific application. The recommended applications of a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device before using it in a particular application. Standard: Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life support systems or medical equipment for life support, etc. The quality grade of NEC devices in “Standard“ unless otherwise specified in NEC's Data Sheets or Data Books. If customers intend to use NEC devices for applications other than those specified for Standard quality grade, they should contact NEC Sales Representative in advance. Anti-radioactive design is not implemented in this product. M4 94.11 The application circuits and their parameters are for references only and are not intended for use in actual design-in's.