ADC32RF72 TI | Alldatasheet

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Technical content

ADC32RF72 Dual Channel 1.5GSPS 16-bit RF Sampling ADC

1 Features

  • 16-bit, dual channel 1.5GSPS ADC
  • Noise spectral density: -163.7dBFS/Hz
  • Thermal Noise: 75.6dBFS
  • Noise figure: 14.4dB
  • Single core (non-interleaved) ADC architecture
  • Aperture jitter: 40fs
  • Buffered analog inputs
  • Input fullscale: 1.44Vpp (4.1dBm)
  • Full power input bandwidth (-3dB): 1.8GHz
  • Ultra-low close-in residual phase noise: – −140dBc/Hz at 10kHz offset at 1GHz
  • Spectral performance (fIN = 1GHz, -1dBFS): – SNRflat: 72.1dBFS – HD2,3: 68dBc – Non HD2,3: 93dBFS
  • 192-tap/ch programmable FIR equalizer filter
  • 12-bit Fractional delay filter
  • Digital down-converters (DDCs) – Up to 8 DDC – Complex output: /2, /3, /4, /5 to /32768 decimation – 48-bit NCO phase coherent frequency hopping – Fast frequency hopping: < 1μs
  • JESD204B/C serial data interface – Maximum lane rate: 24.75Gbps
  • Code error rate (CER): 1E-15 errors/sample
  • Power consumption: 1.5W/channel (1.5GSPS)

2 Applications

  • Phased array radar
  • Wafer Inspection
  • Spectrum analyzer
  • Software defined radio (SDR)
  • Electronic warfare
  • High-speed digitizer
  • Cable infrastructure
  • Communications infrastructure

3 Description

The ADC32RF72 is a 16-bit, 1.5GSPS (non- interleaved), dual channel analog to digital converter (ADC). The device is designed for the highest signal- to-noise ratio (SNR) and delivers a noise spectral density of −163.7dBFS/Hz. Using internal averaging modes, the NSD can be improved to as low as -166.2dBFS/Hz. The buffered analog inputs support a programmable internal termination impedance of 50, 100, 200 Ω with a full power input bandwidth of 1.8GHz ( −3dB). The device lets the user select one input from IN1/2/3 in addition to IN0. The device includes several digital processing features such as a 192-tap/ch programmable FIR filter for equalization, a 12-bit fractional delay filter as well as multiple digital down converters (DDCs). There are eight DDCs supporting decimation factors of /2, /3 and /5 up to /32768. The 48-bit NCOs support phase coherent frequency hopping. The ADC32RF72 supports the JESD204B/C serial data interface with interface rates up to 24.75Gbps. The power efficient ADC architecture consumes 1.5W/ch at 1.5GSPS and provides power scaling with lower sampling rates.

Package Information

PART NUMBER PACKAGE(1) PACKAGE SIZE(2) ADC32RF72 FCCSP 13.8mm x 13.8mm (1) For more information, see Section 11. (2) The package size (length × width) is a nominal value and includes pins, where applicable. Device Comparison PART NUMBER # OF CHANNELS ADC32RF72 2 ADC34RF72 4 SPI GPIO1...23RESET IN0P/N SYSREFP/N CLKP/N SPI Registers and Device Control SYSREF MONITOR STX0..7P/N JESDCLKP/N JESD204B/C LR/ (8·k) DIGITAL SIGNAL PROCESSING - 96-tap/ch FIREQ - Fractional Delay Filter IN1P/N IN2P/N IN3P/N ADC ADC 1x/2x AVG Block Diagram ADC32RF72 SBASAL2 – NOVEMBER 2025 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA.

11 Mechanical, Packaging, and Orderable

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4 Pin Configuration and Functions

Figure 4-1. 289-Ball Flip Chip BGA (Top View) Table 4-1. Pin Functions PIN TYPE (1) DESCRIPTION NAME NO. AVDD12 B3,B4,B5,B6,B7,B8,B9, B10,B11,B12,B13,B14,B15,F9, M3,M4,M8,M11,M14, M15,N3,N4,N8,N11,N14, N15,P3,P4,P8,P11,P14, P15,R3,R4,R14,R15 P Analog 1.2V supply. Low noise LDO recommended. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 3 Product Folder Links: ADC32RF72

Table 4-1. Pin Functions (continued) PIN TYPE (1) DESCRIPTION NAME NO. AVDDCLK12 T9, T10, U12 P Clock power supply, 1.2V. Low noise LDO recommended AVDD18 E9,H5,H13,J13,M6,M13, N1,N6,N13,N17,P6,P13, R6,R13,T1,T3,T4,T14,T15, T17 P Analog 1.8V supply. Low noise LDO recommended AVDDCLK18 T8, T11 P Clock power supply, 1.8V. Low noise LDO recommended AVDDGPIO18 L5 P 1.8V power supply for GPIO pins. CLKN, CLKP U9, U10 I Differential clock input. Internal differential 100Ω termination and self bias to common mode voltage of 0.7V. Must be AC coupled externally. DVDD09 C8, D8, E8, F8,G8, H8, J8, K8, K13, L6,L7, L8, L9, L10, L11, L12, L13 P Digital power supply, 0.9V. Switching DC/DC regulator is recommended. GND A1,A6,A9,A12,A17,B2,B16, C10,D1,D10,D17,E10,F10,G5, G9,G10,G13,H9,H10, J6,J7,J9,J10,J11,J12,K6, K7,K9,K10,K11,K12,M1, M2,M5,M7,M9, M10,M12, M16,M17,N2,N5,N9,N10, N12,N16,P2,P5,P9,P10, P12,P16,R2,R5,R7,R8, R9,R10,R11,R12,R16,T2, T5,T6,T13,T16,U1,U2, U5,U8,U11,U13,U16,U17 G Ground, 0V GPIO1, GPIO2, GPIO3 K4, L14, J15 I/O The GPIO pins can be assigned different functions using SPI writes. See Section 7.5.1. GPIO8, GPIO9, GPIO10 L4, J3, K3, I/O GPIO12 to GPIO23 J2, K2, L2, C2, D2, K16,L16, J17, K17, L17, C16, D16 I/O IN0N, IN0P R17, P17 I Differential analog input, ch 0. Internal programmable 50, 100 and 200Ω termination. IN1N, INIP U14, U15 I Differential analog input, ch 1. Internal programmable 50, 100 and 200Ω termination. IN2N, IN2P P1, R1 I Differential analog input, ch 2. Internal programmable 50, 100 and 200Ω termination. IN3N, IN3P U3, U4 I Differential analog input, ch 3. Internal programmable 50, 100 and 200Ω termination. JESDCLKN, JESDCLKP C9, D9 O Differential JESD output clock. LVDS logic levels. Can be configured to serdes lane rate divided by (8x k). By default this feature is powered down and pins can be left floating. This output clock is derived directly from the internal SerDes PLL and does not provide deterministic latency. LVDSDCLK0N, LVDSDCLK0P F17, E17 O Differential LVDS bit clock output. Not yet supported in software. Leave as 'No Connect'LVDSDCLK1N, LVDSDCLK1P F1, E1 O LVDSFCLK0N, LVDSFCLK0P H17, G17 O Differential LVDS frame clock output. Not yet supported in software. Leave as 'No Connect'LVDSFCLK1N, LVDSFCLK1P H1, G1 O ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 4-1. Pin Functions (continued) PIN TYPE (1) DESCRIPTION NAME NO. LVDSD0N, LVDSD0P G11, H11 O LVDS output interface Not yet supported in software. Leave as 'No Connect' LVDSD1N, LVDSD1P E11, F11 O LVDSD2N, LVDSD2P C11, D11 O LVDSD3N, LVDSD3P G12, H12 O LVDSD4N, LVDSD4P E12, F12 O LVDSD5N, LVDSD5P C12, D12 O LVDSD6N, LVDSD6P E13, F13 O LVDSD7N, LVDSD7P C13, D13 O LVDSD8N, LVDSD8P G14, H14 O LVDSD9N, LVDSD9P E14, F14 O LVDSD10N, LVDSD10P C14, D14 O LVDSD11N, LVDSD11P G15, H15 O LVDSD12N, LVDSD12P E15, F15 O LVDSD13N, LVDSD13P C15, D15 O LVDSD14N, LVDSD14P G16, H16 O LVDSD15N, LVDSD15P E16, F16 O LVDSD16N, LVDSD16P G7, H7 O LVDSD17N, LVDSD17P E7, F7 O LVDSD18N, LVDSD18P C7, D7 O LVDSD19N, LVDSD19P G6, H6 O LVDSD20N, LVDSD20P E6, F6 O LVDSD21N, LVDSD21P C6, D6 O LVDSD22N, LVDSD22P E5, F5 O LVDSD23N, LVDSD23P C5, D5 O LVDSD24N, LVDSD24P G4, H4 O LVDSD25N, LVDSD25P E4, F4 O LVDSD26N, LVDSD26P C4, D4 O LVDSD27N, LVDSD27P G3, H3 O LVDSD28N, LVDSD28P E3, F3 O www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 5 Product Folder Links: ADC32RF72

Table 4-1. Pin Functions (continued) PIN TYPE (1) DESCRIPTION NAME NO. LVDSD29N, LVDSD29P C3, D3 O LVDS output interface Not yet supported in software. Leave as 'No Connect' LVDSD30N, LVDSD30P G2, H2 O LVDSD31N, LVDSD31P E2, F2 O NC J5,J14,K1,K5,K14,L1 - Do not connect RESET J1 I Hardware reset. Active low. This pin has an internal 10kΩ pullup resistor to AVDD18. SCLK K15 I Serial interface clock input. This pin has an internal 10kΩ pulldown resistor. SDIO L15 I/O Serial interface data input/output. This pin has an internal 10kΩ pulldown resistor. SDOUT L3 O Serial interface data output. SEN J16 I Serial interface enable. Active low. This pin has an internal 10kΩ pullup resistor to AVDD18. STX0N, STX0P C17, B17 O Differential, high-speed serial JESD204B/C output data interface, lane 0 STX1N, STX1P A16, A15 O Differential, high-speed serial JESD204B/C output data interface, lane 1 STX2N, STX2P A14, A13 O Differential, high-speed serial JESD204B/C output data interface, lane 2 STX3N, STX3P A11, A10 O Differential, high-speed serial JESD204B/C output data interface, lane 3 STX4N, STX4P C1, B1 O Differential, high-speed serial JESD204B/C output data interface, lane 4 STX5N, STX5P A2, A3 O Differential, high-speed serial JESD204B/C output data interface, lane 5 STX6N, STX6P A4, A5 O Differential, high-speed serial JESD204B/C output data interface, lane 6 STX7N, STX7P A7, A8 O Differential, high-speed serial JESD204B/C output data interface, lane 7 SYNC J4 I JESD active low SYNC input. When SYNC is low and the device is configured, the device sends K characters on the JESD lanes. SYSREFN, SYSREFP U6, U7 I Differential SYSREF input (100Ω differential termination, self biased to 1.2V). AC and DC coupling is supported. TIMESTAMPN, TIMESTAMPP P7, N7 I Not yet supported in software. Can be connected to GND. VCM T7, T12 O Common mode voltage reference output. The two pins are internally shorted together. (1) I = Input, O = Output, I/O = Input or Output, G = Ground, P = Power. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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5 Specifications

5.1 Absolute Maximum Ratings

over operating free-air temperature range (unless otherwise noted)(1) PARAMETER TEST CONDITIONS MIN MAX UNIT Supply voltage range, AVDD18 –0.5 2.1 V Supply voltage range, AVDD12 –0.3 1.4 Supply voltage range, AVDDCLK18 –0.5 2.1 Supply voltage range, AVDDCLK12 –0.3 1.4 Supply voltage range, DVDD09 –0.3 1.2 Supply voltage range, AVDDGPIO18 –0.5 2.1 Voltage applied to input pins IN0P/N, IN1P/N, IN2P/N, IN3P/N –0.5 2.1 CLKP/N –0.3 1.4 SYSREFP/N, TIMESTAMPP/N –0.3 2.1 GPIO1..23, RESET, SCLK, SEN, SDIO, SYNC –0.5 2.1 Junction temperature, TJ 125 Storage temperature, Tstg –65 150 (1) Operation outside the Absolute Maximum Ratings may cause permanent device damage. Absolute Maximum Ratings do not imply functional operation of the device at these or any other conditions beyond those listed under Recommended Operating Conditions. If used outside the Recommended Operating Conditions but within the Absolute Maximum Ratings, the device may not be fully functional, and this may affect device reliability, functionality, performance, and shorten the device lifetime.

5.2 ESD Ratings

V(ESD) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001(1) 1000 V Charged device model (CDM), per ANSI/ESDA/JEDEC JS-002(2) 150 (1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. (2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.

5.3 Recommended Operating Conditions

over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT AVDD18 1.8 V analog supply 1.75 1.8 1.85 V AVDD12 1.2 V analog supply 1.175 1.2 1.225 AVDDCLK18 1.8 V clock supply 1.75 1.8 1.85 AVDDCLK12 1.2 V clock supply 1.175 1.2 1.225 DVDD09 0.9 V digital supply 0.875 0.9 0.925 AVDDGPIO18 1.8 V GPIO Power Supply 1.75 1.8 1.85 TA Operating free-air temperature –40 105 TJ Operating junction temperature 110(1) (1) Prolonged use above this junction temperature can increase the device failure-in-time (FIT) rate. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: ADC32RF72

5.4 Thermal Information

THERMAL METRIC(1) ADC32RF72 UNITANH (BGA)

289 Balls

RΘJA Junction-to-ambient thermal resistance 15.4 ℃/W RΘJC(top) Junction-to-case (top) thermal resistance 0.5 °C/W RΘJB Junction-to-board thermal resistance 4.2 °C/W ΨJT Junction-to-top characterization parameter 0.1 °C/W ΨJB Junction-to-board characterization parameter 4.1 °C/W (1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application note.

5.5 Electrical Characteristics - Power Consumption

Maximum and minimum values are specified over the operating free-air temperature range and nominal supply voltages. Typical values are specified at TA = 25°C, ADC sampling rate = 1.5 GSPS, DDC Bypass mode, 50% clock duty cycle, nominal supply voltages and –1-dBFS differential input, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT IAVDD18 Supply current, 1.8V analog supply Bypass mode LMFS = 4-2-1-1 315 350 mA IAVDD12 Supply current, 1.2V analog supply 915 1100 IAVDDCLK18 Supply current, 1.8V clock supply 50 75 IAVDDCLK12 Supply current, 1.2V clock supply 50 75 IDVDD09 Supply current, 0.9V digital supply 1450 1800 IAVDDGPIO18 Supply current, 1.8V GPIO supply 5 PDIS Power dissipation 3.1 W POWER DOWN MODES PDIS Fast power down mode power consumption Fast wake up time 2.0 W PDIS Global power down mode power consumption 0.4 ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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5.6 Electrical Characteristics - DC Specifications

Maximum and minimum values are specified over the operating free-air temperature range and nominal supply voltages. Typical values are specified at TA = 25°C, ADC sampling rate = 1.5 GSPS, DDC Bypass mode, 50% clock duty cycle, nominal supply voltages and –1-dBFS differential input, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT DC ACCURACY No missing codes 16 bits DNL Differential nonlinearity FIN = 10 MHz 0.3 LSB INL Integral nonlinearity FIN = 10 MHz 2.5 LSB VOS_ERR Offset error 0.9 %FSR GAINERR Gain error 1.0 %FSR GAINMatching Gain matching across channels 0.1 dB ADC ANALOG INPUTS (IN0P/N, IN1P/N, IN2P/N, IN3P/N) FS Input full scale Differential 1.4375 Vpp VICM Input common model voltage 1.25 1.35 1.45 V ZIN Differential input impedance Differential at 100 MHz 100 Ω VOCM Output common mode voltage 1.35 V BW Analog Input Bandwidth (-3dB) 1.8 GHz CMRR Common mode rejection ratio FIN = 100 MHz 30 dB CLOCK INPUT (CLKP/N) Input clock frequency 500 1500 MHz VID Differential input voltage 0.6 2.0 2.8 Vpp VICM Input common mode voltage 0.7 V ZIN Differential input impedance Differential at 1.5 GHz 100 Ω Clock duty cycle 30 50 70 % SYSREF INPUT (SYSREFP/N) VID Differential input voltage 350 450 800 mVpp VICM Input common mode voltage 1.05 1.2 1.325 V Digital Inputs (GPIO1..23, RESET, SCLK, SEN, SDIO, SYNC) VIH High level input voltage 1.15 V VIL Low level input voltage 0.65 V IIH High level input current -250 250 μA IIL Low level input current -250 250 μA CI Input capacitance 2 pF DIGITAL OUTPUT (SDIO, SDOUT) VOH High level output voltage ILOAD = -400 μA AVDDG PIO18– 0.1 AVDDG PIO18 V VOL Low level output voltage ILOAD = 400 μA 0.1 V CML SERDES OUTPUTS: STX[0..7]P/N VOD SerDes transmitter output amplitude differential peak-peak 950 mVpp VOCM SerDes transmitter output common mode 450 mV ZTX SerDes transmitter single ended termination impedance 50 Ω Transmitter short-circuit current Transmitter pins shorted to any voltage between –0.25 V and 1.45 V –100 100 mA www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 9 Product Folder Links: ADC32RF72

5.7 Electrical Characteristics - AC Specifications

Maximum and minimum values are specified over the operating free-air temperature range and nominal supply voltages. Typical values are specified at TA = 25°C, ADC sampling rate = 1.5 GSPS, 100Ω termination, DDC Bypass mode, 50% clock duty cycle, nominal supply voltages and –1-dBFS differential input, unless otherwise noted. PARAMETER TEST CONDITIONS MIN(2) TYP MAX UNIT AC ACCURACY NSDflat Noise Spectral Density fIN = 600MHz, AIN = -20dBFS –163.7 dBFS/Hz NF Noise Figure (100Ω termination) fIN = 600MHz, AIN = -20dBFS 14.4 dB SNR Signal to noise ratio fIN = 100MHz 73.0 dBFS SNRflat (1) Signal to noise ratio measured from 100MHz to FS/2 within the Nyquist zone fIN = 100MHz 72.0 75.3 dBFS fIN = 600MHz 73.4 fIN = 600MHz, AIN = -20dBFS 75.5 fIN = 900MHz 72.1 fIN = 1.4GHz 69.0 SINADflat (1) Signal to noise and distortion ratio fIN = 100MHz 74.3 dBFS ENOB Effective number of bits fIN = 100MHz 11.8 Bits THD Total Harmonic Distortion (First five harmonics) fIN = 100MHz 82 dBc fIN = 600MHz 74 fIN = 900MHz 68 fIN = 1.4GHz 57 HD2 Second Harmonic Distortion fIN = 100MHz 74 88 dBc fIN = 600MHz 77 fIN = 900MHz 74 fIN = 1.4GHz 64 HD3 Third Harmonic Distortion fIN = 100MHz 74 83 dBc fIN = 600MHz 77 fIN = 900MHz 68 fIN = 1.4GHz 58 Non HD2,3 Spur free dynamic range (excluding HD2 and HD3) fIN = 100MHz 80 95 dBFS fIN = 600MHz 90 fIN = 900MHz 93 fIN = 1.4GHz 79 IMD3 Two tone inter-modulation distortion f1 = 100MHz, f2 = 200MHz, AIN = -7dBFS/tone 89 dBFS f1 = 0.9GHz, f2 = 1.0GHz, AIN = -7dBFS/tone 76 (1) For detailed description of SNRflat and NSDflat see Section 6. (2) SNRflat, HD3 and Non HD23 minimum values are specified by final test; HD2 is specified by bench characterization. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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5.8 Timing Requirements

Maximum and minimum values are specified over the operating free-air temperature range and nominal supply voltages. Typical values are specified at TA = 25°C, ADC sampling rate = 1.5 GSPS, DDC Bypass mode, 50% clock duty cycle, nominal supply voltages and –1-dBFS differential input, unless otherwise noted. PARAMETER TEST CONDITIONS MIN NOM MAX UNIT ADC Timing Specifications TAD Aperture Delay 0.15 ns Aperture Delay variation 0.05 ns TA Aperture Jitter 40 fs CER Code error rate 1e-15 errors/ sample Wake up time time to valid data (SNR within 2dB of data sheet values) after coming out of fast power down (JESD stays active) 5 μs LATENCY: tPD + tADC tPD Propagation delay 1 ns tADC ADC latency from sampling instant to JESD output DDC bypass, LMFS = 8411 524 ADC clock cycles SERIAL PROGRAMMING INTERFACE (SCLK, SEN, SDIO) - Input fCLK(SCLK) Serial clock frequency 1 50 MHz tS(SEN) SEN to rising edge of SCLK 10 ns tH(SEN) SEN from rising edge of SCLK 10 ns tSU(SDIO) SDIO to rising edge of SCLK 10 ns tH(SDIO) SDIO from rising edge of SCLK 10 ns SERIAL PROGRAMMING INTERFACE (SDIO, SDOUT) - Output t(OZD) SDIO tri-state to driven 10 ns t(ODZ) SDIO data to tri-state 14 ns t(OD) SDIO valid from falling edge of SCLK 10 ns Timing: SYSREFP/N ts(SYSREF) Setup time, SYSREFP/N valid to rising edge of CLKP/N 50 ps th(SYSREF) Hold time, SYSREFP/N valid to rising edge of CLKP/N 50 ps CML SerDes Outputs: STX[0..7]P/N fSerdes SerDes bit rate 4.0 24.75 Gbps RJ Random jitter 0.45 ps DJ Deterministic jitter 12.5 ps TJ Total jitter, peak-peak 19.7 ps www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 11 Product Folder Links: ADC32RF72

5.9 Typical Characteristics

Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 SNRflat = 74.6dBFS Figure 5-1. Single Tone FFT at FIN = 100MHz Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 SNRflat = 73.7dBFS Figure 5-2. Single Tone FFT at FIN = 300MHz Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 SNRflat = 71.5dBFS Figure 5-3. Single Tone FFT at FIN = 900MHz Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 SNRflat = 74.6dBFS, AIN = -20dBFS Figure 5-4. Single Tone FFT at FIN = 900MHz Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 SNRflat = 67.8dBFS Figure 5-5. Single Tone FFT at FIN = 1400MHz Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 AIN = -7dBFS/tone Figure 5-6. Two Tone FFT at FIN = 100/200MHz ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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5.9 Typical Characteristics (continued)

Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 AIN = -20dBFS/tone Figure 5-7. Two Tone FFT at FIN = 100/200MHz Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 AIN = -7dBFS/tone Figure 5-8. Two Tone FFT at FIN = 900/1000MHz Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 AIN = -20dBFS/tone Figure 5-9. Two Tone FFT at FIN = 900/1000MHz Input Frequency (MHz) SNRflat (dBFS) HD23 (dBc), Non HD23 (dBFS) 0 250 500 750 1000 1250 1500 68 50 69 55 70 60 71 65 72 70 73 75 74 80 75 85 76 90 77 95 78 100 SNRflat HD23 Non HD23 Figure 5-10. AC Performance vs FIN Input Frequency (MHz) NSD (dBFS/Hz) 0 250 500 750 1000 1250 1500 -165 -164 -163 -162 -161 -160 -159 -158 -157 -156 -155 AIN = -1dBFS AIN = -20dBFS Termination = 50ohm Figure 5-11. NSD Performance vs FIN Input Amplitude (dBFS) SNRflat (dBFS) HD23, Non HD23 (dBFS) -80 -70 -60 -50 -40 -30 -20 -10 0 73 70 74 80 75 90 76 100 77 110 78 120 79 130 SNRflat HD23 Non HD23 FIN = 100MHz Figure 5-12. AC Performance vs AIN www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 13 Product Folder Links: ADC32RF72

Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted Input Amplitude (dBFS) SNRflat (dBFS) HD23, Non HD23 (dBFS) -80 -70 -60 -50 -40 -30 -20 -10 0 71 60 72 75 73 90 74 105 75 120 76 135 77 150 SNRflat HD23 Non HD23 FIN = 900MHz Figure 5-13. AC Performance vs AIN Input Amplitude/Tone (dBFS) IMD3 (dBFS) -80 -70 -60 -50 -40 -30 -20 -10 0 100 110 120 130 FIN = 100/200MHz FIN = 900/1000MHz Figure 5-14. IMD3 Performance vs AIN Sampling Rate (GSPS) SNR, SNRflat (dBFS) HD23 (dBc), Non HD23 (dBFS) 0.5 0.75 1 1.25 1.5 72 70 73 75 74 80 75 85 76 90 77 95 78 100 79 105 80 110 SNR SNRflat HD23 Non HD23 FIN = 100MHz Figure 5-15. AC Performance vs FS Clock Amplitude (Vpp) SNRflat (dBFS) SFDR (dBFS) 0 0.5 1 1.5 2 2.5 3 69 60 70 65 71 70 72 75 73 80 74 85 75 90 76 95 77 100 SNR (Fin = 100MHz) SFDR (Fin = 100MHz) SNR (Fin = 900MHz) SFDR (Fin = 900MHz) Figure 5-16. AC Performance vs Clock Amplitude Clock Duty Cycle (%) SNRflat (dBFS) HD23 (dBc) 20 25 30 35 40 45 50 55 60 65 70 75 80 67 65 68 70 69 75 70 80 71 85 72 90 73 95 74 100 75 105 76 110 77 115 SNRflat (Fin = 100MHz) HD23 (Fin = 100MHz) SNRflat (Fin = 900MHz) HD23 (Fin = 900MHz) Figure 5-17. AC Performance vs Clock Duty Cycle AVDD12 (V) SNRflat (dBFS) HD23 (dBc), Non HD23 (dBFS) 1.15 1.2 1.25 73 70 74 80 75 90 76 100 77 110 SNRflat HD23 Non HD23 Figure 5-18. AC Performance vs AVDD12 Supply ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted AVDD18 (V) SNRflat (dBFS) HD23 (dBc), Non HD23 (dBFS) 1.75 1.8 1.85 73 70 74 80 75 90 76 100 77 110 SNRflat HD23 Non HD23 Figure 5-19. AC Performance vs AVDD18 Supply Ambient Temperature (degC) SNRflat (dBFS) HD23 (dBc), Non HD23 (dBFS) -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 74 70 75 80 76 90 77 100 78 110 SNRflat (-20dBFS) SNRflat (-1dBFS) HD23 (-1dBFS) Non HD23 (-1dBFS) Figure 5-20. AC Performance vs Temperature Code Integral Nonlinearity (LSB) 0 8192 16384 24576 32768 40960 49152 57344 65536 FIN = 100MHz Figure 5-21. INL vs Code Code Differential Nonlinearity (LSB) 0 8192 16384 24576 32768 40960 49152 57344 65536 -0.75 -0.5 -0.25 0.25 0.5 0.75 FIN = 100MHz Figure 5-22. DNL vs Code Output Code Count (%) 32757 32762 32767 32771 32776 32781 Figure 5-23. Idle Channel Histogram Frequency (Hz) CMRR (dB) 10000 100000 1000000 1E+7 1E+8 5E+8 FIN = 100 MHz FIN = 900 MHz Figure 5-24. CMRR www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 15 Product Folder Links: ADC32RF72

Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted Input Frequency (MHz) Isolation (dB) 0 250 500 750 1000 1250 1500 1750 2000 100 110 120 130 140 150 Ch0 vs Ch3 Ch0 vs Ch1 Ch0 vs Ch2 Ch1 vs Ch3 Figure 5-25. Channel Isolation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.25 0.5 0.75 1.25 1.5 AVDD18 AVDD12 CLKVDD18 CLKVDD12 DVDD09 LMFS = 4-2-1-1 Figure 5-26. Currents vs Sampling Rate Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.5 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 /16 /32 /64 /128 Dual band, LMFS = 8-4-1-1 Figure 5-27. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.5 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 /16 /32 /64 /128 Dual band, LMFS = 4-4-2-1 Figure 5-28. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.5 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Quad band, LMFS = 8-8-2-1 Figure 5-29. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Quad band, LMFS = 4-8-4-1 Figure 5-30. DVDD09 current vs Decimation ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Typical values are at TA = 25°C, ADC sampling rate = 1.5GSPS, 50% clock duty cycle, nominal supplies and –1dBFS differential input, 100Ω termination, unless otherwise noted Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Quad band, LMFS = 2-8-8-1 Figure 5-31. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Quad band, LMFS = 1-8-16-1 Figure 5-32. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Octal band, LMFS = 8-16-4-1 Figure 5-33. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Octal band, LMFS = 4-16-8-1 Figure 5-34. DVDD09 current vs Decimation Sampling Rate (MSPS) Current (A) 500 600 700 800 900 1000 1100 1200 1300 1400 1500 0.5 0.6 0.7 0.8 0.9 1.1 1.2 1.3 1.4 1.5 1.6 1.7 1.8 1.9 /16 /32 /64 /128 Octal band, LMFS = 2-16-16-1 Figure 5-35. DVDD09 current vs Decimation www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 17 Product Folder Links: ADC32RF72

6 Parameter Measurement Information

The ADC32RF72 has 1/f noise with a corner frequency of approximately 100MHz. To better illustrate the true noise floor for high performance and RF sampling applications, the ADC noise performance is specified in the following two ways. SNR: Measured across the full Nyquist zone including 1/f noise SNRflat, NSDflat: Measured in the flat noise region from 100MHz to FS/2 (750MHz) Reducing the measurement bandwidth by 100MHz (starting at 100MHz instead of 0Hz) improves the SNR by approximately 0.6dB (10log(750MHz/650MHz) = 10log(0.06) = 0.62dB) assuming flat, uniform noise across the Nyquist zone. FS/2100M SNRFlat, NSDFlat SNR Figure 6-1. SNR (DC to FS/2) vs SNRflat (100MHz to FS/2) Assuming NSDflat = -163.7dBFS/Hz SNRflat calculates to: -(-163.7dBFS/Hz + 10log(650MHz)) = -(-163.7 + 88.1)dBFS = 75.6dBFS (1) The 1/f noise is approximately 76.4dBFS. The 1/f noise measurement is shown in Figure 6-2 with a resolution bandwidth of approximately 6MHz. The SNR for full Nyquist zone including 1/f noise calculates to: SNR1/f + SNRflat = SN R 1 / f + SNR f l at = 10 lo g 10 − SN R 1 / f + 10 − S NR f l at = 10 l o g 10 − 76.4 + 10 − 75.6 = 73 dBF S (2) Frequency (MHz) Amplitude (dBFS) 1 10 100 1000 -164 -163 -162 -161 -160 -159 -158 -157 -156 50ohm 100ohm 200ohm Figure 6-2. 1/f Noise Measurement ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7 Detailed Description

7.1 Overview

The ADC32RF72 is a 16-bit, 1.5GSPS (non-interleaved), dual channel analog to digital converter (ADC). The design maximizes signal-to-noise ratio (SNR) and delivers a noise spectral density of -163.7dBFS/Hz. When providing the input signal to 2 ADC inputs, the NSD can be improved to as low as -166.2dBFS/Hz using internal digital averaging. The device lets the user select ADC0 and any of the 3 remaining ADC channels - two ADC channels (ADC0/1) on the same side of the package for 2x averaging or on the opposite side (ADC0/2) of the package for best isolation. The analog signal input is buffered and supports a programmable internal termination impedance of 50Ω, 100Ω and 200Ω. The full power input bandwidth is 1.8GHz (-3dB) and the device supports direct RF sampling with input frequencies in from DC through L-band. The ADC32RF72 is designed for low residual phase noise to support high performance radar applications. The device includes several digital processing features such as a 192-tap/ch programmable FIR filter for equalization, a 12-bit fractional delay filter as well as multiple digital down converters (DDCs). There are eight digital down converters supporting decimation factors of /2, /3 and /5. The 48-bit NCOs support phase coherent frequency hopping. Using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1µs. The digital down converters provide support for a wide range of instantaneous bandwidth (IBW) requirements, from wide band mode with /2 complex decimation to narrow bandwidth channels with complex decimation of /32768. The final /2 decimation stage features programmable filter coefficients. The device supports the JESD204B/C serial data interface using 64b/66b and 8b/10b encoding with subclass 1 deterministic latency using data rates up to 24.75Gbps. Using both interface options, the ADC32RF7xcan output both full spectrum (DDC bypass) and decimated data. Furthermore, the SerDes PLL (lane rate /(8x k)) can be output to the FPGA to simplify system clocking. The device requires 3 different power rails: 1.8V, 1.2V and 0.9V.

7.2 Functional Block Diagram

SPI GPIO1...23RESET IN0P/N SYSREFP/N CLKP/N SPI Registers and Device Control SYSREF MONITOR STX0..7P/N JESDCLKP/N JESD204B/C LR/ (8·k) DIGITAL SIGNAL PROCESSING - 96-tap/ch FIREQ - Fractional Delay Filter IN1P/N IN2P/N IN3P/N ADC ADC 1x/2x AVG Block Diagram www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 19 Product Folder Links: ADC32RF72

7.3 Feature Description

7.3.1 Analog Inputs

The analog inputs of the ADC32RF72 have internal buffers which isolate the sampling capacitor from the external input circuitry. The analog inputs have a programmable, differential split termination with internal biasing as shown in Figure 7-1. The differential termination can be selected to differential 50Ω, 100Ω or 200 Ω via SPI register write. Both AC-coupling and DC-coupling of the analog inputs is supported. INxP/N ADCVCM 25/50/100 Ω 25/50/100 Ω Figure 7-1. Analog input (internal) circuitry The following parameters can be programmed: Table 7-1. Input Termination Programming (x = 0,1,2,3) System Parameter Name Size (bits) Default Reset Description ADC{x}_INPUT_TERM_SEL 2 0 R/W Select ADC{x} input termination setting 0: 50Ω differential 1: 100Ω differential 2: 200Ω differential

7.3.1.1 Input Bandwidth

The input bandwidth (-3dB) with internal 50Ω, 100Ω and 200 Ω differential termination is shown in Figure 7-2 along with the S11 responses ( Figure 7-2). With 100Ω termination the input bandwidth is approximately 1.8GHz (-3dB). Figure 7-4 shows the frequency response with 100 Ω termination using the external matching network shown in Figure 7-5. Input Frequency (MHz) Normalized Gain Response (dB) 100 1000 40004000 -10 50ohm 100ohm 200ohm Figure 7-2. Input Bandwidth Plot (6dB pad) Frequency (GHz) S11 (dB) -35 -30 -25 -20 -15 -10 50ohm 100ohm 200ohm Figure 7-3. S11 vs Frequency (each normalized to input termination) ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Input Frequency (GHz) Normalized Gain Response (dB) 0.1 1 4 -10 Figure 7-4. Input Bandwidth Plot ADC Balun 0.1u 0.1u 0.1u 125 Figure 7-5. External Matching Network

7.3.1.2 Background Calibration

The ADC32RF72 uses internal background calibration to maintain a high AC performance over temperature. The calibration is performed periodically and does not require any user control or input signal, and so on. During calibration, small changes to the signal offset are observed (approximately 30LSB). This calibration can be frozen to avoid any disturbance during measurements using SPI writes or GPIO control. Ambient Temperature (degC) SNRflat (dBFS) -40 -30 -20 -10 0 10 20 30 40 50 60 70 80 90 SNRflat w/o Cal SNRflat with Cal FIN = 100MHz, AIN = -1dBFS, Calibration at 25°C Figure 7-6. SNRflat vs Temperature vs Calibration www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 21 Product Folder Links: ADC32RF72

7.3.2 ADC Channel Selection and Power Down Modes

There are 4 different ADC channels (Ch0...3) available however channel 0 always has to be enabled. The user can select any of the remaining 3 via the channel enable control shown below in the system parameters. This is a static configuration that needs to be set at power up. The device supports three different power down modes that can be controlled via GPIO pins or SPI register writes:

  • Fast Power Down: individual channel power down with shorter wake up time but higher power consumption. JESD interface stays active.
  • Power Down: individual channel power down. JESD interface can be adjusted and power down unused lanes.
  • Global Power Down: power down of entire chip for lowest power consumption (enabled via function call). Table 7-2. Power Down Modes Comparison Power Down Mode Wake Up Time Power Consumption (typ) Comment Fast Power Down ~ 5 us ~ 2.0W JESD interface stays active Global Power Down depends on JESD interface ~ 0.4W JESD interface powered down The power down modes can be can be programmed using the following parameters: Table 7-3. Power Down Modes Programming System Parameter Name Size Default Access Description ADC_EN_BITMAP 4 3 R/W Select two out of the 4 ADCs. 3: Channel 0 and 1 are active. 5: Channel 0 and 2 are active. 9: Channel 0 and 3 are active. ADC_CH_PDN_VAL 4 0 R/W Individual ADC channel power down setting. Each ADC gets one bit. If the bit is set, the corresponding channel is powered down. ADC_CH_PDN_SRC_SEL needs to be set to 1 for this setting to take effect. Bit 0: ADC0 power down control. Bit 1: ADC1 power down control. Bit 2: ADC2 power down control. Bit 3: ADC3 power down control. ADC_CH_PDN_SRC_SEL 1 0 R/W Select if channel power down signal is coming from a GPIO or SPI. 0: Channel power down is from GPIO. 1: Channel power down is coming from ADC_CH_PDN_VAL. ADC_CH_PDN_MODE 1 0 R/W Select the channel power down mode. 0: Normal PDN (least power consumption for each channel). 1: Fast PDN (faster power up time but higher power consumption). ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.3 Sampling Clock Input

The clock input has internal 100 Ω differential termination with self biasing to VCM = 0.7V, enabling external AC coupling (see Figure 7-7). CLKP/N VCM (0.7V) AC Coupling 100 Figure 7-7. Internal Sampling Clock Circuitry The internal sampling clock path is designed for ultra-low residual phase noise contribution. The sampling clock circuitry requires a dedicated low noise power supply for best performance. The internal aperture clock phase noise is also sensitive to clock amplitude. For best performance, the clock amplitude must be larger than 1Vpp. Table 7-4. Internal Aperture Clock Noise at 1GHz Frequency Offset (MHz) Phase Noise (dBc/Hz) Amplitude Noise (dBc/Hz) 0.001 −130 −139 0.01 −140 −149 0.1 −150 −155 1 −155 −159 The following parameters can be programmed: Table 7-5. Clock Register Programming System Parameter Name Size Default Reset Description ADC_CLK_FREQ_HZ 33 0 R/W 33-bit unsigned number that represent the sampling clock frequency in Hz. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 23 Product Folder Links: ADC32RF72

7.3.4 SYSREF

The SYSREF input signal is used for multi-chip synchronization and resets the internal LMFC counter. The device must be armed in anticipation of a SYSREF signal; the device is sensitive to the first SYSREF edge after the device is armed. The internal SYSREF capture includes a programmable analog delay t d, a SYSREF monitor as well as a programmable digital integer clock cycle delay z-n as shown in Figure 7-8. SYSREFP/N z-n SYSREF_IN_TYPE_SEL td SYSREF Monitor CLK SYSREF_INT D Q SYSREF_IN_TYPE_SEL SPI SYSREF Figure 7-8. SYSREF Input Internal Path The SYSREF input signal can be AC or DC coupled (selected via SPI register option) as shown in Figure 7-9. The SYSREF input has internal 100Ω termination for DC coupling and internal biasing when using AC coupling. SYSREFP/N 100 Buffer SYSREFP/N VCM (0.7V) AC Coupling 100 Figure 7-9. SYSREF Input Circuitry and Edge Alignment (Left Side: DC Coupling, Right Side: AC Coupling) The following parameters can be programmed: Table 7-6. SYSREF Configuration Programming System Parameter Name Size Default Reset Description SYSREF_IN_TYPE_SEL 2 0 R/W Select input SYSREF type: 0: DC coupled LVDS SYSREF input. 1: AC coupled SYSREF input. 2: not used. 3: Internally generated SYSREF using SPI write. SYSREF_DIG_DEL 8 0 R/W Digital SYSREF internal delay (z-n) in clock cycles of CLK. 0...255: Number of device clock cycles delay that is applied to digital SYSREF before use. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.4.1 SYSREF Monitor

The SYSREF monitor compares the incoming SYSREF signal to the ADC sampling clock by latching the incoming SYSREF signal with copies of the sampling clock that have an analog delay. The latched outputs are processed internally through the SYSREF processing block and the final output is provided to the user. The latched flop outputs are used to check if there exists enough margin between the CLK and SYSREF rising edges (set up and hold times). If a set up and hold violation is detected, a programmable delay t d can be used to adjust the SYSREF delay such that there is adequate margin between CLK and SYSREF for SYSREF to be latched properly. CLK t0 SYSREF D Q t1 tn-1 D Q D Q D Q Dn-1D2D1D0 tn D Q Dn SYSREF monitor register td tfixed SYSREF processing Figure 7-10. SYSREF Detection Circuitry The following parameters can be programmed: Table 7-7. SYSREF Configuration Programming System Parameter Name Size Default Access Description SYSREF_MONITOR_NUM_POLLS 8 1 R/W Sets the number of SYSREF rising edges to be detected before SYSREF_MONITOR_OUT is updated. Higher values of SYSREF_MONITOR_NUM_POLLS can be used to gauge the SYSREF edge spread since each flop output is ORed with all of the previous outputs until SYSREF_MONITOR_NUM_POLLS SYSREF rising edges are seen. 1...255: Number of SYSREF rising edges to be seen before SYSREF_MONITOR_OUT is updated. SYSREF_MONITOR_TD_COARSE 4 0 R/W Sets the number of coarse delays (45ps) in the td block. SYSREF_MONITOR_TD_FINE 4 0 R/W Sets the fine delay in the td block. td_fine = (floor(SYSREF_MONITOR_TD_FINE/2)*15ps) + ((SYSREF_MONITOR_TD_FINE%2)*4ps) SYSREF_MONITOR_OUT 8 0 R SYSREF monitor output. Bit 0 corresponds to the earliest CLK edge and bit 7 corresponds to the latest CLK edge. The SYSREF_MONITOR_OUT can only be in one of the following states and can be interpreted as follows: State 0: One or more zeros followed by one or more ones. A rising of SYSREF transition is in the SYSREF monitor window and set up and hold violation is detected. SYSREF_LAT must be delayed until all zeros or all ones are observed. State 1: all zeros. CLK is leading SYSREF_LAT and SYSREF_LAT is latched properly by the next CLK rising edge. State 2: all ones CLK is lagging SYSREF_LAT and SYSREF_LAT is latched properly by the current CLK rising edge. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 25 Product Folder Links: ADC32RF72

7.3.5 Digital Signal Processor (DSP) Features

The device includes several different digital features in the digital signal processing block:

  • 12-bit fractional delay with one sampling clock cycle range and a delay step size equal to 1/(212* tCLK)
  • Programmable FIR filter for equalization with up to 96-taps per channel
  • Multiple digital down converters (DDCs) supporting decimation factors of /2, /3 and /5 up to /32768
  • Additional programmable FIR filter for equalization post decimation DDC0 FRACT. DELAY MUX AVG (2x) EQ FIR MUX AVG (2x) DDC /2K DDC /2,/3,/5 EQFIRGAIN NCO1 NCO0 MUX JESD

8 Lanes

Figure 7-11. Digital signal processing chain ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.5.1 DSP Input Mux

There are 4 digital multiplexers at the input of the DSP blocks as shown in Figure 7-12 . The bus is referred to adc_out[3:0] where each index refers to the unique output stream of a particular ADC, meaning, the ADC0 output is adc_out[0] and so on. The output of each DSP_IN mux corresponds to a single DSP input data stream for the DSP blocks. The aggregate set of DSP input data streams is referred to as dsp_in[3:0]. dsp_in[0] corresponds to the 0th DSP input data stream. Each DSP input data stream can be sourced from one of the following:

  • One of two adc_out streams (adc_out[0] and any one of the others). This is denoted by C(2,1).
  • The average of two adc_out streams. Note The nomenclature C( n,k) represents the possible combinations of choosing k items from a set containing n distinct items. For example, assuming we have a set adc_out={adc0,adc1,adc2,adc3}, there are 6 distinct ways to select two items from the set which can be seen here: C(adc_out,2)={{ADC0,ADC1},{ADC0,ADC2}, {ADC0,ADC3},{ADC1,ADC2},{ADC1,ADC3},{ADC2,ADC3}} DSP MUX1DSP MUX1DSP MUX1adc_out[3:0] 2x AVG C(2,1) DSP IN MUX0 dsp_in[3:0] dsp_in_src_sel[1] dsp_in_src_sel[0] dsp_in_src_sel[2] dsp_in_src_sel[3] Figure 7-12. DSP Input Mux Overview The following parameters can be programmed: Table 7-8. DSP Input Mux Configuration Programming (x = 0,1,2,3) System Parameter Name Size Default Access Description DSP_IN_SRC_SEL{x} 4 0,1,2,3 R/W Select the input data source for the dsp_in[0..3] input stream to the DSP blocks. 0: ADC0 data. 1: ADC1 data. 2: ADC2 data. 3: ADC3 data. 4: 2x average of ADC0 and ADC1. 5: 2x average of ADC0 and ADC2. 6: 2x average of ADC0 and ADC3. 7: 2x average of ADC1 and ADC2. 8: 2x average of ADC1 and ADC3. 9: 2x average of ADC2 and ADC3. Others: not used www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 27 Product Folder Links: ADC32RF72

7.3.5.2 Fractional Delay

The device includes an optional programmable 12-bit fractional digital delay after the DSP input mux (see Figure 7-13). There are two independent digital fractional delay blocks - FDF0 and FDF1. Each FDF block is connected to two input streams (dsp_in[1:0] or dsp_in[3:2]) where each input stream has a programmable fractional delay value, td00 and t d01 for dsp_in[1:0] and t d10 and t d11 for dsp_in[3:2]. The FDF blocks output a total of four data streams (fdf_out[3:0]) where each output stream corresponds to a distinct fractionally delayed input stream. The fractional delay is a true time delay implementation with a linear phase across frequencies. The fractional delay calculates to: Fractional Delay [sampling clock period] = Delay / 4096x TS (sampling period). dsp_in[0] td00 dsp_in[1] td01 dsp_in[2] td10 dsp_in[3] td11 FDF0 FDF1 fdf_out[1:0] DSP IN MUX fdf_out[3:2] Figure 7-13. Fractional Delay Feature As an example, a setting of 2048 equals ½ a clock cycle delay as shown in Figure 7-14. The magnitude error is less than −80dB (vs desired delay). Sample 0 2 4 6 8 10 12 14 16 18 20 -0.5 0.5 1.5 Input Signal Actual output Figure 7-14. Fractional delay = ½ clock cycle (delay setting = 2048) Sample Index Error Magnitude 0 5 10 15 20 -0.001 -0.0008 -0.0006 -0.0004 -0.0002 0.0002 0.0004 0.0006 0.0008 0.001 Figure 7-15. Error magnitude (desired vs actual waveform) ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.5.3 Programmable FIR Filter for Equalization

The ADC32RF7x includes an integrated programmable FIR filter block referred to as an equalizer (EQ). As illustrated in Figure 7-18 , there are two EQ blocks (EQ0 and EQ1) which are located at the output of the fractional delay filters (FDF0/1). Each EQ block can source the input data stream from either dsp_in directly or from the preceding FDF block. There are a total of four output data streams (eq_out[3:0]) where each output stream corresponds to a distinct filtered input stream. Each of the two equalizers (EQ0/EQ1) include up to 192-taps (16-bit) shared across two input streams. eq_out[1:0]EQ0 EQ IN MUX0 dsp_in[3:2] EQ IN MUX1 fdf_out[3:2] eq_in_src_sel[0] eq_in_src_sel[1] fdf_out[1:0] dsp_in[1:0] eq_in[1:0] EQ1eq_in[3:2] FDF0 FDF1 eq_out[3:2] Figure 7-18. FIR Equalizer Configurations Each EQ supports several different configurations with up to 192-taps per EQFIR as shown in Figure 7-19. Full Complex DELAY DELAY onlyHalf Complex 192-tap DELAY Single channel eq_in[2x] eq_in[2x+1] 96-tap 96-tap Dual channel eq_in[2x] eq_in[2x+1] eq_out[2x] eq_out[2x+1] eq_out[2x] eq_out[2x+1] eq_in[2x] eq_in[2x+1] eq_out[2x] eq_out[2x+1] eq_in[2x] eq_in[2x+1] eq_out[2x] eq_out[2x+1] eq_in[2x] eq_in[2x+1] eq_out[2x] eq_out[2x+1] 96-tap 96-tap DELAY 48-tap 48-tap 48-tap 48-tap Figure 7-19. FIR Equalizer Configurations for EQ0 (x=0) and EQ1 (x=1) ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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The power consumption scales linearly with sampling rate and with # of taps used. Unused taps can be set to 0. The digital equalizer can be can be programmed using the following parameters: Table 7-10. EQ{x} Configuration Programming (x= 0,1) System Parameter Name Size Default Access Description EQ{x}_IN_SRC_SEL 1 0 R/W Select EQ{x} input data source. 0: EQ{x} input from DSP_IN[2x+1, 2x]. 1: EQ{x} input from FDF_OUT[2x+1, 2x]. EQ{x}_MODE_SEL 3 0 R/W Select EQ{x} mode. 0: Single channel mode. 1: Dual channel mode. 2: Half complex mode. 3: Full complex mode. 4: Delay only mode. EQ{x}_DEL_VAL 8 0 R/W EQ{x} delay value. The effect of this setting is dependent on the EQ{x} mode. 0...255: Number of device clock cycles delay that is applied when EQ{x} is in a mode with a programmable delay. EQ{x}_NUM_TAPS 8 0 R/W Number of taps to be used by EQ{x} in a given mode. Can be any value when in single channel mode. Has to be even in dual channel mode and half complex mode. Has to be divisible by four in full complex mode. 1...192: Number of taps to be used by EQ{x}. EQ{x}_TAPS 3072 0 R/W Set the 192 taps of the EQ{x} block. Single channel mode: Up to 192 taps are applied to eq_input[2x]. Dual channel mode: Up to 96 taps per eq_input. First 96 taps apply to eq_input[2x]. Second 96 taps apply to eq_input[2x+1]. Half complex mode: Up to 96 taps per eq_input. First 96 taps apply to eq_input[2x]. Second 96 taps apply to eq_input[2x+1]. Full complex mode: Up to 96 taps per eq_input. First 96 taps apply to eq_input[2x]; the first 48 of those taps apply to eq_output[2x]. Second 96 taps apply to eq_input[2x+1]; the first 48 of those taps apply to eq_output[2x]. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 31 Product Folder Links: ADC32RF72

7.3.5.4 DSP Output Mux

There are several different multiplexers available at the output of the DSP prior to the DDCs. DSP OUT MUX0 DSP OUT MUX1 dsp_out_src_sel[1] dsp_out_src_sel[0] dsp_in[1:0] fdf_out[1:0] eq_out[1:0] dsp_in[3:2] fdf_out[3:2] eq_out[3:2] dsp_out[3:2] dsp_out[1:0] dsp_out[3:0] Figure 7-20. DSP Output Mux The following parameters can be programmed: Table 7-11. Input Selection to the DDC Programming (x = 0 or 1) System Parameter Name Size Default Access Description DSP_OUT_SRC_SEL{x} 2 0 R/W Select the output data source for DSP_OUT_MUX{x} from the DSP blocks. 0: dsp_in[2x+1,2x] as output of DSP_OUT_MUX{x}. 1: fdf_out[2x+1,2x] as output of DSP_OUT_MUX{x}. 2: eq_out[2x+1,2x] as output of DSP_OUT_MUX{x}. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.5.5 Digital Down Converter (DDC)

The ADC32RF7x includes 8 digital down converters (DDCs) with independent NCOs. Each DDC supports base decimation setting allowed is dependent on sampling rate, number of DDCs, sample repeat factor (only with factors of 2) and the JESD output resolution 'N' due to the 4Gbps minimum SERDES lane rate required by the device. Additionally, the final /2 stage supports programmable coefficients. A crossbar mux is used to connect any DDC input to any ADC or the output of the 2x averaging block. The ADC32RF7x DDCs can be configured to have independent decimation factors (binary factors only). DDC0 FRACT. DELAY MUX AVG (2x) EQ FIR MUX AVG (2x) DDC /2K DDC /2,/3,/5 EQFIRGAIN NCO1 NCO0 MUX JESD Figure 7-21. Multi-Band Decimation Filter Real and complex decimation is supported and the passband is approximately 80% of the decimated bandwidth. Table 7-12. Complex Decimation Setting vs Output Bandwidth Decimation Factor Complex Output Bandwidth per DDC Real Output Bandwidth per DDC N 0.8x FS / N 0.8x FS / (2N) www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 33 Product Folder Links: ADC32RF72

7.3.5.5.1 Decimation Filter Input

There are several different multiplexers available at the input of each of the 8x DDC as shown in Figure 7-22. Each DDC has a DDC_REAL_DATA_MUX and DDC_INPUT_DATA_TYPE_MUX. The DDC input data type is based on the ddc_mode setting. DSP OUT MUX0 DSP OUT MUX1 dsp_in[1:0] fdf_out[1:0] eq_out[1:0] dsp_in[3:2] fdf_out[3:2] eq_out[3:2] dsp_out[3:2] dsp_out[1:0] C(2,1) ddc_in_src_sel[3:0] DDC REAL DATA MUX[3:0] ddc_in_real[3:0] ddc_in[3:0] ddc_avg_sel[0] C(2,1) ddc_in_src_sel[7:4] ddc_in_real[7:4] DDC INPUT DATA TYPE MUX[7:4] ddc_mode_sel ddc_in[7:4] ddc_avg_sel[2] DDC INPUT DATA TYPE MUX[3:0] ddc_mode_sel 2x AVG DDC REAL DATA MUX[7:4]2x AVG Figure 7-22. DDC Input Data Muxing The following parameters can be programmed: Table 7-13. Input Selection to the DDC Programming System Parameter Name Size Default Access Description DDC_AVG__SEL{0,2} 3 .. R/W Select the two data streams to be averaged in the 2x AVG as a shared input for the multiplexers DDC_REAL_DATA_MUX[3:0]/[7:4]. 0: Average of dsp_out[0] and dsp_out[1]. 1: Average of dsp_out[0] and dsp_out[2]. 2: Average of dsp_out[0] and dsp_out[3]. 3: Average of dsp_out[1] and dsp_out[2]. 4: Average of dsp_out[1] and dsp_out[3]. 5: Average of dsp_out[2] and dsp_out[3]. multiplexers. 0: dsp_out[0] as real input to the DDC. 1: dsp_out[1] as real input to the DDC. 2: dsp_out[2] as real input to the DDC. 3: dsp_out[3] as real input to the DDC. 4: Output of the first 2x AVG block (DDC_AVG_SEL_0/2) block as real input to the DDC. 5: Output of the second 2x AVG block (DDC_AVG_SEL_1/3) block as real input to the DDC. 6: Average of dsp_out[0], dsp_out[1], dsp_out[2], and dsp_out[3] as real input to the DDC. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 7-13. Input Selection to the DDC Programming (continued) System Parameter Name Size Default Access Description DDC_EN_CTRL 8 0 R/W Individual DDC enable control. Each bit corresponds to one DDC where the LSB corresponds to DDC0. If the enable bit is set then the corresponding DDC is enabled. Bit 0: DDC0 power down control. Bit 1: DDC1 power down control. Bit 2: DDC2 power down control. Bit 3: DDC3 power down control. Bit 4: DDC4 power down control. Bit 5: DDC5 power down control. Bit 6: DDC6 power down control. Bit 7: DDC7 power down control. DDC_MODE_SEL 3 0 R/W Select the DDC mode which is shared across all DDCs. 0: Pass-through mode; The particular DDC is unused 1: Real input (from the DDC_REAL_DATA_MUX) given to the DDCs is low pass filtered and down sampled by the decimation factor. 2: Real input (from the DDC_REAL_DATA_MUX) given to the DDCs is mixed with an NCO to produce a complex output. The complex output is low pass filtered and down sampled by the decimation factor. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 35 Product Folder Links: ADC32RF72

7.3.5.5.2 Decimation Modes

There are 2 different decimation modes supported and all 8x DDCs must be configured to the same mode:

  • Real decimation: The real input is low pass filtered and the filter output is down sampled by the decimation factor (M). The output of the DDC block in this mode is a real signal and detailed DDC chain is shown in Figure 7-23.
  • Complex decimation with real input: The DDC is given a real input that is mixed with an NCO to produce a complex output. The complex output is low pass filtered and down sampled by the decimation factor (M). The output of the DDC block in this mode is a complex signal and detailed DDC chain is shown in Figure 7-25. Each DDC has an enable control signal. If the DDC is disabled, the output is zero. The following blocks are part of the DDC signal chain:
  • Decimation: The possible decimation factors are B x 2N where the base factor B can be 1, 3 or 5 and N can be a maximum of 15 for B = 1, 5 for B = 3 and 4 for B = 5. When the base factor is 3 or 5, all the DDCs must share the same decimation factor setting. However, when the base factor is 1 (decimations factors that are powers of 2), having an independent decimation factors per DDC is possible since each DDC has a samples repeater block. When each DDC is configured to a different decimation factor, the samples repeater for each DDC is adjusted so that all the DDC outputs are rate matched to highest data rate DDC. For example, if two DDCs are active and one is configured in decimation by 4 and the other in decimation by 16, the DDC configured for decimation by 16 automatically gets rate matched to the decimation by 4 rate by repeating the samples by a factor of 4. Upon successful configuration, the repeat factor can be readback for each DDC. Note Independent decimation factors are not supported when any DDC is configured for decimation by 2. When decimation by 2 is used all other DDCs must be also be set to by 2. Repeat Factor: The repeat factor is adjusted automatically for each DDC in cases where the effective JESD line rate is below the lower threshold of 4Gbps. The repeat factor block is not available with base factors of 3 and 5.
  • DDC_PFIR: The ADC32RF72 has an integrated programmable FIR filter block in the decimation chain where the last stage filter is completely programmable. This feature is only available with decimation factors that are powers of 2 (B = 1). The block is referred to as the DDC_PFIR. Each DDC_PFIR has up to 96 total taps (across both inputs in complex decimation) with 17-bit resolution.
  • DDC coarse gain (G): The fixed digital gain can be applied to each DDC path where the gain G is an element of {0dB, 3dB, 6dB} and controllable for each DDC through the ddc_coarse_gain[7:0] signal.
  • DDC_EQ: The DDC_EQ supports all the same modes the as the Digital DSP EQ. Note This EQ is not available for decimation factors of 2 and 3.
  • DDC_COMPLEX_GAIN: Each DDC has a programmable complex gain. In real decimation mode, only the real part of the gain is applied. The gain is in steps of 0.1dB from 0dB to 6dB; an independent gain setting is available for the real and imaginary parts. ddc_pfir_en[7:0] ddc_in_real[7:0] DDC_PFIR[7:0] LAST STAGE MUX[7:0] decimation_factor[7:0] DDC_EQ[7:0] DDC EQ MUX[7:0] ddc_eq_en[7:0] G ∈ {0dB, 3dB, 6dB} ddc_coarse_gain[7:0] ddc_out[7:0]DDC_COMPLEX_GAIN ddc_real_gain[7:0] B*2N-1 Figure 7-23. Real Decimation Signal Chain (decimation factors that are powers of 2 (B = 1)) ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 7-14. Input Selection to the DDC Programming (continued) Function Name Size Default Access Description DDC{0..7}_PFIR_TAPS 3072 0 R/W Set the 96 taps of the DDC_PFIR block. Only 17 bits are written. Single channel mode: Up to 96 taps are applied to ddc_pfir_input[0]. Dual channel mode: Up to 48 taps per ddc_pfir_input. First 48 taps apply to ddc_pfir_input[0]. Second 48 taps apply to ddc_pfir_input[1]. DDC{0..7}_EQ_EN 1 0 R/W Control the DDC_EQ enable. 0: DDC_EQ is disabled and bypassed. 1: DDC_EQ is enabled and the DDC_EQ filter is applied to the DDC output. DDC{0..7}_EQ_MODE_SEL 3 0 R/W Select the DDC_EQ mode. 0: Single channel mode. 1: Dual channel mode. 2: Half complex mode. 3: Full complex mode. 4: Delay only mode. DDC{0..7}_EQ_DEL_VAL 7 0 R/W DDC_EQ delay value. The effect of this setting is dependent on the DDC_EQ mode. 0...127: Number of device clock cycles delay that is applied when DDC_EQ is in a mode with a programmable delay. DDC{0..7}_EQ_NUM_TAPS 7 0 R/W Number of taps to be used by DDC_EQ in a given mode. Can be any value when in single channel mode. Has to be even in dual channel mode and half complex mode. Has to be divisible by four in full complex mode. 1...96: Number of taps to be used by DDC_EQ. DDC{0..7}_EQ_TAPS 1536 0 R/W Set the 96 taps of the DDC_EQ block. Single channel mode: Up to 96 taps are applied to ddc_eq_input[0]. Dual channel mode: Up to 48 taps per ddc_eq_input. First 48 taps apply to ddc_eq_input[0]. Second 48 taps apply to ddc_eq_input[1]. Half complex mode: Up to 48 taps per ddc_eq_input. First 48 taps apply to ddc_eq_input[0]. Second 48 taps apply to ddc_eq_input[1]. Full complex mode: Up to 48 taps per ddc_eq_input. First 48 taps apply to ddc_eq_input[0]; the first 24 of those taps apply to ddc_eq_output[0]. Second 48 taps apply to ddc_eq_input[1]; the first 24 of those taps apply to ddc_eq_output[0]. DDC{0..7}_COARSE_GAIN 3 0 R/W Set a fixed digital gain in the DDC data path before the DDC_EQ. 0: 0dB digital gain. 3: 3dB digital gain. 6: 6dB digital gain (useful when using complex decimation). DDC{0..7}_REAL_GAIN 6 0 R/W Real part of the complex gain applied to the DDC output. The gain is in 0.1dB steps starting from to 0dB to 6dB. 0..60: Effective gain is DDC_REAL_GAIN*0.1dB DDC{0..7}_IMAG_GAIN 6 0 R/W Imaginary part of the complex gain applied to the DDC output (used in complex decimation modes). The gain is in 0.1dB steps starting from to 0dB to 6dB. 0..60: Effective imaginary gain is DDC_IMAG_GAIN*0.1dB ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.5.5.3 Decimation Filter Response

This section provides the different decimation filter responses with a normalized ADC sampling rate. The complex filter pass band is approximately 80% ( −0.1dB) of the decimated bandwidth with a minimum of 85dB stop band rejection. The decimation filter responses are normalized to the ADC sampling clock frequency F S. One example (decimation by 4) is illustrated in Figure 7-28 and Figure 7-29 . The filter responses for all other decimation filter plots are available in the product folder. The decimation filter plots are interpreted as follows: Each figure contains the filter pass-band, transition bands and alias or stop-bands as shown in Figure 7-27 . The x-axis shows the offset frequency (after the NCO frequency shift) normalized to the ADC sampling rate FS. For example, in the divide-by-4 complex setup, the output data rate is F S / 4 complex with a Nyquist zone of F S / 8 or 0.125 × FS. The transition band (colored in blue) is centered around 0.125 × FS and the alias transition band is centered at 0.375 × F S. The stop-bands (colored in red), which alias on top of the pass-band, are centered at 0.25 × FS and 0.5 × FS. The stop-band attenuation is greater than 85dB. Figure 7-27. Interpretation of the Decimation Filter Plots Figure 7-28. Decimation by 4 Filter Response Figure 7-29. Decimation by 4 Passband Ripple Response www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 39 Product Folder Links: ADC32RF72

7.3.5.5.4 Numerically Controlled Oscillator (NCO)

FS = ADC sampling rate (MSPS) Each digital down-converter (DDC) uses a 48-bit numerically controlled oscillator (NCO) to fine tune the frequency placement prior to the digital filtering as shown in Figure 7-30. The NCO frequency range is -F S/2 to FS/2 and is dictated by a frequency control word (FCW) and phase offset. There are two different NCO frequencies for each DDC. The desired NCO frequency is programmed via SPI and can be selected using SPI or the GPIO pins. When using the GPIO pins for NCO frequency control, frequency hopping can be achieved in less than 1µs. NCO1[7:0] nco1_fcw[7:0] nco1_phase[7:0] nco_hop_mode[7:0] NCO0[7:0] nco_update[7:0] nco0_fcw[7:0] nco0_phase[7:0] MIXER_NCO SEL_MUX[7:0] e±j n gpio_nco_sel[7:0] sw_nco_sel[7:0] mixer_nco_sel[7:0] nco_hop_src_sel[7:0] NCO_SEL SRC_MUX[7:0] nco_reset[7:0] Figure 7-30. NCO block diagram with all control signals Infinite Phase Coherent NCO: With a phase coherent NCO, all frequencies are synchronized to a single event using SYSREF. This enables an infinite amount of frequency hops without the need to reset the NCO as phase coherency is maintained between frequency hops. This is illustrated in Figure 7-31 (right). When returning to the original frequency f1, the NCO phase appears as if the NCO had never changed frequencies. f1 f2 f1 Figure 7-31. Infinite Phase Coherent NCO Frequency Switching ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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The oscillator generates a complex exponential sequence of: ejωn (default) or e–jωn where: frequency (ω) is specified as a signed number by the 48-bit FCW The complex exponential sequence is multiplied with the real input from the ADC to mix the desired carrier to a frequency equal to f IN + f NCO. The NCO frequency can be tuned from –F S/2 to +F S/2 and is processed as a signed, 2s complement number. The FCW setting is set by the 48-bit register value given and calculated as: NCO frequency (0 to + FS/2): NCO = fNCO × 248 / FS (3) NCO frequency (-FS/2 to 0): NCO = (fNCO + FS) × 248 / FS (4) where:

  • NCO = FCW (decimal value)
  • fNCO = Desired NCO frequency (MHz)
  • FS = ADC sampling rate (MSPS) The NCO FCW and phase can be updated dynamically. Additionally, the NCO update signal can be masked for each DDC (nco_update_mask[7:0]). The NCO update signal can be sourced from software (sw_nco_sync), or by leaking the internal SYSREF (SYSREF_INT) to update the NCOs. Updating the NCO FCW and phase is a two step process: 1. The new FCW and phase must be written 2. An nco_update signal must be issued to apply the new NCO settings sw_nco_sync SYSREF_DIG SYSREF leak module nco_update_mask[7:0] nco_update[7:0] NCO_UPDATE SRC_MUX nco_update_src_sel Figure 7-32. NCO Update With All Control Signals The nco_update_mask[7:0] is used to mask the nco_update signal from specific DDCs, thereby; allowing the update of the NCO for only a subset of the DDCs. When the NCO update signal is sourced from software (sw_nco_sync), the nco_update_mask for DDC [x] and DDC[x+1], where x∈{0,2,4,6}, must be configured identically as the sw_nco_sync signal is shared for DDC [x] and DDC[x+1]. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 41 Product Folder Links: ADC32RF72

The NCO phase accumulator can be reset for each NCO through an nco_reset signal. The NCO reset can be masked for each DDC (nco_reset_mask[7:0]). The NCO reset signal can be sourced from software (sw_nco_sync) or the NCOs can be armed through a GPIO to be reset on the next SYSREF edge. gpio_nco_arm SYSREF_DIG NCO_RESET SRC_MUX sw_nco_sync nco_reset_src_sel nco_reset_mask[7:0] nco_reset[7:0] D QSYSREF_DIG gpio_nco_arm Rnco_clk Figure 7-33. NCO RESET With All Control Signals The gpio_nco_arm NCO reset path is used to synchronize multiple NCOs across devices from a host device. The host device can launch the gpio_nco_arm on the falling edge of the SYSREF to give the maximum time for the gpio_nco_arm signal to reach all devices prior to the next SYSREF edge. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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The following registers can be programmed: Table 7-15. Mixer and NCO Programming System Parameter Name Size Default Access Description DDC_NCO_UPDATE_SRC_SEL 1 0 R/W Select the source of the NCO update signal. 0: The NCO update signal is sourced from software. 1: Leaking the internal SYSREF (SYSREF_DIG) to update the NCOs. DDC_NCO_RESET_SRC_SEL 1 0 R/W Select the source of the NCO reset signal. 0: The NCO reset signal is sourced from software. 1: The GPIO arm signal (gpio_nco_arm) arms the NCO module so that an NCO update signal is issued on the next rising edge of SYSREF. DDC_NCO_UPDATE_MASK 8 0 R/W Per DDC NCO update signal masking control. If the NCO update source is from software, DDC[x] and DDC[x+1], where x ∈ {0,2,4,6}, must be configured identically. Setting the mask bit to 1 makes sure the respective DDC NCOs are masked from the NCO update signal. Bit 0: DDC0 NCO update mask control. Bit 1: DDC1 NCO update mask control. Bit 2: DDC2 NCO update mask control. Bit 3: DDC3 NCO update mask control. Bit 4: DDC4 NCO update mask control. Bit 5: DDC5 NCO update mask control. Bit 6: DDC6 NCO update mask control. Bit 7: DDC7 NCO update mask control. DDC_NCO_RESET_MASK 8 0 R/W Per DDC NCO reset signal masking control. If the NCO reset source is from software, DDC[x] and DDC[x+1], where x ∈ {0,2,4,6}, must be configured identically. Setting the mask bit to 1 makes sure the respective DDC NCOs are masked from the NCO reset signal. Bit 0: DDC0 NCO update reset control. Bit 1: DDC1 NCO update reset control. Bit 2: DDC2 NCO update reset control. Bit 3: DDC3 NCO update reset control. Bit 4: DDC4 NCO update reset control. Bit 5: DDC5 NCO update reset control. Bit 6: DDC6 NCO update reset control. Bit 7: DDC7 NCO update reset control. DDC{0..7}_NCO_HOP_SRC_SEL 1 0 R/W Select the source of the NCO hoping signal for the DDC. 0: NCO selection (frequency hopping) through GPIO (one GPIO function per DDC). 1: NCO selection (frequency hopping) through software. DDC{0..7}_NCO_HOP_MODE 1 0 R/W Select the NCO mode when hopping. 0: Not used 1: Phase coherent hopping mode where the original phase of the NCOs is always maintained across hops. DDC{0..7}_NCO{0,1}_FCW 48 0 R/W 48-bit FCW word for NCO{0,1} DDC{0..7}_NCO{0,1}_PHASE 19 0 R/W 19-bit phase offset for NCO{0,1} www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 43 Product Folder Links: ADC32RF72

7.3.6 Digital Output Interface

The ADC32RF7x supports two different digital output data interfaces: 1. JESD204B/C: This interface uses up to 8 serial output lanes supporting data rates of up to 16Gbps/lane (JESD204B), and up to 24.75Gbps/lane (JESD204C). 2. LVDS: Not yet supported in software

7.3.6.1 JESD204B/C Interface

The ADC32RF7x uses the JESD204B/C high-speed serial interface to transfer data from the ADC to the receiving logic device. ADC32RF7x serialized lanes are capable of operating up to 24.75Gbps using JESD204C and up to 15Gbps using JESD204B. The device supports up to 2 JESD links (operated at the same lane rate) and lane options of 1,2,4 or 8 lanes. Figure 7-34 shows an internal block diagram of the JESD204 interface as well as the configuration parameters for each of the two links. JESD Converter Selectionddc_out_i[7:0] dsp_out[3:0] ddc_out_q[7:0] link0_conv_sel[7:0] link1_conv_sel[7:0] link0_data[7:0] link1_data[7:0] LINK1 LINK0 link1_jesd_data_mode L-M-F-S Scrambling Encoding link0_jesd_data_mode L-M-F-S Scrambling Encoding Physical Lane Mapper Lane Polarity Figure 7-34. JESD204 Block Diagram The following parameters and constraints need to be considered when configuring the JESD204B/C interface. Range of L, M, F, S, N and N'

  • L: Number of lanes: L ∈ {1,2,4,8}
  • M: Number of converters: M ∈ {1,2,4,8}; for M=16 (octal band decimation), the JESD interface needs to configured to 2 links with M=8 per link
  • F: Number of octets per frame: F ∈ {1,2,...,Fmax}
  • S: Number of samples per converter: S ∈ {1,2,4}
  • N': Sample resolution with padding: N' = 8⋅L⋅F/(M⋅S), and N' ∈ {16,24,32}
  • N: Sample resolution without padding: N' ∈ {16,24} and N <= N' Constraints on F and N'
  • N= 32 => F must be a multiple of 4. Constraints on Number of Lanes (L) and Lane Rate (LR)
  • JESD TX lane rate LR: 4.0Gbps to 24.75Gbps
  • L = 8 is only allowed for JESD TX Link 0 and not for JESD TX link 1 ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Constraints on Decimation Factor (D) and Repeat Factor (R)

  • Sample repeat factor R = 2p, p ∈ ℕ+
  • D <= 4: R = 1
  • D%3 = 0: R = 1
  • D%5 = 0: R = 1
  • D > 4: D/R >= 4 Constraints on JESD TX Converter Selection
  • Selected converter C ∈ {0,1,...,19}, see Table 7-16
  • Converters can be presented in any order within the set above
  • In addition the constraints in Table 7-17 apply. Table 7-16. Converter Selection CONVERTER SELECTION NUMBER DDC0_I 0 DDC0_Q 1 DDC7_Q 15 ADC0 16 ADC1 17 Table 7-17. Valid JESD Configurations JESD DATA MODE DECIMATION FACTOR D NUMBER OF CONVERTERS M PER LINK CONVERTERS AVAILABLE FOR SELECTION CONVERTERS NUMBERS AVAILABLE FOR SELECTION JESD_DATA_MODE_DSP_OUT 1 (DDC BYPASS) 1,2 ADC0, ADC1 16,17 JESD_DATA_MODE_DDC_OUT 2,3 1,2,4 DDC0_IQ, DDC1_IQ, DDC4_IQ, DDC5_IQ 0,1,2,3,8,9,10,11 4,5 6,10,12,20,... The following parameters can be programmed: Table 7-18. JESD TX Link Registers (x: 0 = LINK0, 1 = LINK1) System Parameter Name Size Default Reset Description LINK{x}_SCR_EN 1 0 RW Control the JESD scrambler enable. 0: JESD scrambler is disabled. 1: JESD scrambler is enabled. LINK{x}_JESD_TYPE 1 0 RW Select the JESD type and must be set identically to the ENCODING setting. 0: 8b10b 1: 64b66b LINK{x}_ENCODING 1 0 RW Select the JESD encoding. Must be set identically to the JESD_TYPE setting. 0: 8b10b encoding. 1: 64b66b encoding. LINK{x}_JESD_DATA_MODE 2 0 RW Select the JESD data source. 0: DDC_OUT provided to JESD. 1: DSP_OUT provided to JESD. 2: not used 3: not used www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 45 Product Folder Links: ADC32RF72

Table 7-18. JESD TX Link Registers (x: 0 = LINK0, 1 = LINK1) (continued) System Parameter Name Size Default Reset Description LINK{x}_JESD_LANES 4 4 RW Set the JESD lanes (L) parameter for the link. 0: LINK is disabled. 1: JESD L parameter set to 1. 2: JESD L parameter set to 2. 4: JESD L parameter set to 4. 8: JESD L parameter set to 8. LINK{x}_JESD_CONVERTERS 4 2 RW Set the JESD converters (M) parameter for the link. 0: LINK is disabled. 1: JESD M parameter set to 1. 2: JESD M parameter set to 2. 4: JESD M parameter set to 4. 8: JESD M parameter set to 8. LINK{x}_JESD_OCTETS_PER_FRAME 7 1 RW Set the JESD octets per frame (F) parameter for the link. The max value is for F is 64. If N' is 32 then F must be a multiple of 4. 1...64: JESD F parameter value. LINK{x}_JESD_SAMPLES_PER_CONVER TER 3 1 RW Set the JESD samples per converter (S) parameter for the link. 1: JESD S parameter set to 1. 2: JESD S parameter set to 2. 4: JESD S parameter set to 4. Set either the JESD frames per multi-frame (K) or the multi-blocks per extended multi-block (E). This field is the K parameter when 8b10b encoding is used or E when 64b66b encoding is used. Select the data source of the {y} converter in the link. (y=0..7) 0: DDC0 in-phase component data. 1: DDC0 quadrature component data. 2: DDC1 in-phase component data. 3: DDC1 quadrature component data. 4: DDC2 in-phase component data. 5: DDC2 quadrature component data. 6: DDC3 in-phase component data. 7: DDC3 quadrature component data. 8: DDC4 in-phase component data. 9: DDC4 quadrature component data. 10: DDC5 in-phase component data. 11: DDC5 quadrature component data. 12: DDC6 in-phase component data. 13: DDC6 quadrature component data. 14: DDC7 in-phase component data. 15: DDC7 quadrature component data. 16: ADC0 data from DSP_OUT. 17: ADC1 data from DSP_OUT. 18: ADC2 data from DSP_OUT. 19: ADC3 data from DSP_OUT. JESD_SYNC_N_SRC_SEL 2 0 RW Set the SYNC_N signal source for 8b10b. 0: GPIO0 used as SYNC_N input. 2: SYNC_N is internally generated through software. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 7-18. JESD TX Link Registers (x: 0 = LINK0, 1 = LINK1) (continued) System Parameter Name Size Default Reset Description JESD_PHY_LANE{y}_DATA_SEL 3 0,1 RW Set the physical lane data source for the lane{y}. (y = 0..7). 0: JESD logical lane 0 used as the lane data. 1: JESD logical lane 1 used as the lane data. 2: JESD logical lane 2 used as the lane data. 3: JESD logical lane 3 used as the lane data. 4: JESD logical lane 4 used as the lane data. 5: JESD logical lane 5 used as the lane data. 6: JESD logical lane 6 used as the lane data. 7: JESD logical lane 7 used as the lane data. JESD_PHY_LANE_POLARITY_CTRL 8 0 RW Set the individual physical lane polarity. If the bit is set, the corresponding physical lane polarity is inverted. Bit 0: JESD physical lane 0 polarity control. Bit 1: JESD physical lane 1 polarity control. Bit 2: JESD physical lane 2 polarity control. Bit 3: JESD physical lane 3 polarity control. Bit 4: JESD physical lane 4 polarity control. Bit 5: JESD physical lane 5 polarity control. Bit 6: JESD physical lane 6 polarity control. Bit 7: JESD physical lane 7 polarity control.

7.3.6.1.1 JESD204B Initial Lane Alignment (ILA)

The receiving device starts the initial lane alignment process by deasserting the SYNC signal. When a logic low state is detected on the SYNC input, the ADC starts transmitting comma characters (K28.5) to establish the code group synchronization, as shown in Figure 7-35 . When synchronization is completed, the receiving device reasserts the SYNC signal and the ADC starts the initial lane alignment sequence with the next local multi-frame clock (LMFC) boundary. The ADC transmits four multi-frames, each containing K frame (K is SPI programmable). Each of the multi-frames contains the frame start and frame end symbols. The second multi- frame also contains the JESD204B link configuration data. SYNC SYSREF LMFC Clock LMFC Boundary xxxTransmit Data K28.5 K28.5 ILA ILA DATA DATA Multi-Frame Code Group Synchronization Initial Lane Alignment Data Transmission Figure 7-35. JESD204B Internal Timing Diagram www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 47 Product Folder Links: ADC32RF72

7.3.6.1.2 SYNC Signal

The SYNC signal is issued using one of two different methods: 1. Use the SYNC input pin to issue a SYNC request 2. The synchronization command is issued via SPI

7.3.6.1.3 JESD204B/C Frame Assembly

The JESD204B/C standard defines the following parameters:

  • L: number of lanes per link
  • M: number of converters per device
  • F: number of octets per frame clock period
  • S: number of samples per frame

7.3.6.1.4 JESD204B/C Frame Assembly in Bypass Mode

Table 7-19 lists the available JESD204B/C formats and corresponding valid sampling rate ranges for the ADC32RF7x. The sampling rates are limited by the minimum and maximum SERDES line rate as well as ADC sampling clock frequencies. The JESD204B/C frame assembly for the different lanes is shown in Table 7-20. Table 7-19. JESD Mode Options: Bypass Mode OUTPUT RESOLUTION (Bits) L M F S JESD204B: Lane Rate (Gbps) JESD204B RATIO [fSERDES/FS] JESD204C: Lane Rate (Gbps) JESD204C RATIO [fSERDES/FS] 8 2 1 2 FS x 16 x 10 / 8 x M / L FS x 16 x 66 / 64 x M / L 4.125 4 2 1 1 10 8.25 2 2 2 1 20 16.5 4 1 1 2 5 4.125 2 1 1 1 10 8.25 1 1 2 1 20 16.5 Table 7-20. Example JESD Sample Frame Assembly: Bypass Mode OUTPUT LANE LMFS = 8-2-1-2 LMFS = 4-2-1-1 LMFS = 2-2-2-1 LMFS = 4-1-1-2 LMFS = 2-1-1-1 LMFS = 1-1-2-1 STX4 B0[15:8] STX5 B0[7:0] STX6 B1[15:8] STX7 B1[7:0] ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.3.6.1.5 JESD204B/C Frame Assembly With Real Decimation

Table 7-21 lists the available JESD204B/C interface configurations and corresponding SerDes lane rates. The boundary conditions are:

  • JESD204B: lane rates from 4 (min) to 15Gbps (max)
  • JESD204C: lane rates from 4 (min) to 24.75Gbps (max) Examples of JESD204B/C frame assemblies are illustrated in Table 7-21 to Table 7-23. Table 7-21. JESD Mode Options: Real Decimation Output Resolution (bit) L M F S JESD204B: Lane Rate (Gbps) JESD204B: RATIO [fSERDES/(FS/N)] JESD204C: Lane Rate (Gbps) JESD204C: RATIO [fSERDES/(FS/N)] 4 2 1 1 FS x 20 x M / D / L FS x 16 x 66 / 64 x M / D / L 8.25 2 2 2 1 20 16.5 1 2 4 1 40 33 2 1 1 1 10 8.25 1 1 2 1 20 16.5 2 2 3 1 FS x 30 x M / D / L FS x 24 x 66 / 64 x M / D / L 24.75 1 2 6 1 60 49.5 1 1 3 1 30 24.75 D: Decimation setting Table 7-22. Example JESD Frame Assembly: Real Decimation 16-bit output - Dual and Single Band OUTPUT LANE LMFS = 4-2-1-1 LMFS = 2-2-2-1 LMFS = 1-2-4-1 LMFS = 2-1-1-1 LMFS = 1-1-2-1 STX2 B0 [15:8] STX3 B0 [7:0] STX4..7 Table 7-23. Example JESD Sample Frame Assembly: Real Decimation 24-bit output - Dual and Single Band OUTPUT LANE LMFS = 2-2-3-1 LMFS = 1-2-6-1 LMFS = 1-1-3-1 STX1 B0 [23:0] STX2..7 www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 49 Product Folder Links: ADC32RF72

7.3.6.1.6 JESD204B,C Frame Assembly With Complex Decimation

Table 7-24 lists the available JESD204B,C interface configurations and corresponding SerDes lane rates. The boundary conditions are:

  • JESD204B: lane rates from 4 (min) to 15Gpbs (max)
  • JESD204C: lane rates from 4 (min) to 24.75Gbps (max) The JESD204B/C frame assemblies are shown in Table 7-25 (16-bit) and Table 7-29 (24-bit). When using octal band DDC, two separate JESD links need to be configured because the M (# of converters per link) cannot exceed 8 as shown in Table 7-25. For example for octal band DDC using 8 JESD lanes each of the two links can be configured as LMFS = 4-8-4-1. The internal JESD output mux can be used to assign specific SerDes lanes to each link. Table 7-24. JESD Mode Options: Complex Decimation Output Resolution (bit) L M F S JESD204B: Lane Rate (Gbps) JESD204B: RATIO [fSERDES/(FS/N)] JESD204C: Lane Rate (Gbps) JESD204C: RATIO [fSERDES/(FS/N)] 8 8 2 1 FS × 16 × 10 / 8 × M / D / L FS × 16 × 66 / 64 × M / D / L 16.5 4 8 4 1 40 33 2 8 8 1 80 66 1 8 16 1 160 132 8 4 1 1 10 8.25 4 4 2 1 20 16.5 2 4 4 1 40 33 1 4 8 1 80 66 8 2 1 2 5 4.125 4 2 1 1 10 8.25 2 2 2 1 20 16.5 1 2 4 1 40 33 8 8 3 1 FS × 24 × 10 / 8 × M / D / L FS × 24 × 66 / 64 × M / D / L 24.75 4 8 6 1 60 49.5 2 8 12 1 120 99 1 8 24 1 240 198 8 4 3 2 15 12.375 4 4 3 1 30 24.75 2 4 6 1 60 49.5 1 4 12 1 120 99 8 2 3 4 7.5 6.1875 4 2 3 2 15 12.375 2 2 3 2 30 24.75 1 2 6 1 60 49.5 D: complex decimation setting ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 7-25. Example JESD Frame Assembly: Complex Decimation, Octal Band, 16-bit Output Note: the LMFS configuration is Per JESD Link JESD LINK OUTPUT LANE LMFS = 4-8-4-1 LMFS = 2-8-8-1 LMFS = 1-8-16-1 LINK0 STX0 AI0 [15:0], AQ0 [15:0] AI0 [15:0], AQ0 [15:0] BI0 [15:0], BQ0 [15:0] AI0 [15:0], AQ0 [15:0] BI0 [15:0], BQ0 [15:0] CI0 [15:0], CQ0 [15:0] DI0 [15:0], DQ0 [15:0] STX1 BI0 [15:0], BQ0 [15:0] CI0 [15:0], CQ0 [15:0] DI0 [15:0], DQ0 [15:0] STX2 CI0 [15:0], CQ0 [15:0] STX3 DI0 [15:0], DQ0 [15:0] LINK1 STX4 EI0 [15:0], EQ0 [15:0] EI0 [15:0], EQ0 [15:0] FI0 [15:0], FQ0 [15:0] EI0 [15:0], EQ0 [15:0] FI0 [15:0], FQ0 [15:0] GI0 [15:0], GQ0 [15:0] HI0 [15:0], HQ0 [15:0] STX5 FI0 [15:0], FQ0 [15:0] GI0 [15:0], GQ0 [15:0] HI0 [15:0], HQ0 [15:0] STX6 GI0 [15:0], GQ0 [15:0] STX7 HI0 [15:0], HQ0 [15:0] Table 7-26. Example JESD Frame Assembly: Complex Decimation, Quad Band, 16-bit Output OUTPUT LANE LMFS = 8-8-2-1 LMFS = 4-8-4-1 LMFS = 2-8-8-1 LMFS = 1-8-16-1 STX0 AI0 [15:0] AI0 [15:0], AQ0 [15:0] AI0 [15:0], AQ0 [15:0] BI0 [15:0], BQ0 [15:0] AI0 [15:0], AQ0 [15:0] BI0 [15:0], BQ0 [15:0] CI0 [15:0], CQ0 [15:0] DI0 [15:0], DQ0 [15:0] STX1 AQ0 [15:0] BI0 [15:0], BQ0 [15:0] CI0 [15:0], CQ0 [15:0] DI0 [15:0], DQ0 [15:0] STX2 BI0 [15:0] CI0 [15:0], CQ0 [15:0] STX3 BQ0 [15:0] DI0 [15:0], DQ0 [15:0] STX4 CI0 [15:0] STX5 CQ0 [15:0] STX6 DI0 [15:0] STX7 DQ0 [15:0] Table 7-27. Example JESD Frame Assembly: Complex Decimation, Dual Band, 16-bit Output OUTPUT LANE LMFS = 8-4-1-1 LMFS = 4-4-2-1 LMFS = 2-4-4-1 LMFS = 1-4-8-1 STX2 AQ0 [15:8] BI0 [15:0] STX3 AQ0 [7:0] BQ0 [15:0] STX4 BI0 [15:8] STX5 BI0 [7:0] STX6 BQ0 [15:8] STX7 BQ0 [7:0] www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 51 Product Folder Links: ADC32RF72

Table 7-28. Example JESD Frame Assembly: Complex Decimation, Single Band, 16-bit Output OUTPUT LANE LMFS = 8-2-1-2 LMFS = 4-2-1-1 LMFS = 2-2-2-1 LMFS = 1-2-4-1 STX2 AQ0 [15:8] AQ0 [15:8] STX3 AQ0 [7:0] AQ0 [7:0] STX4 AI1 [15:8] STX5 AI1 [7:0] STX6 AQ1 [15:8] STX7 AQ1 [7:0] Table 7-29. Example JESD Frame Assembly: Complex Decimation, Octal Band, 24-bit Output Note: the LMFS configuration is Per JESD Link JESD LINK OUTPUT LANE LMFS = 4-8-6-1 LMFS = 2-8-12-1 LMFS = 1-8-24-1 LINK0 STX0 AI0 [23:0], AQ0 [23:0] AI0 [23:0], AQ0 [23:0] BI0 [23:0], BQ0 [23:0] AI0 [23:0], AQ0 [23:0] BI0 [23:0], BQ0 [23:0] CI0 [23:0], CQ0 [23:0] DI0 [23:0], DQ0 [23:0] STX1 BI0 [23:0], BQ0 [23:0] CI0 [23:0], CQ0 [23:0] DI0 [23:0], DQ0 [23:0] STX2 CI0 [23:0], CQ0 [23:0] STX3 DI0 [23:0], DQ0 [23:0] LINK1 STX4 EI0 [23:0], EQ0 [23:0] EI0 [23:0], EQ0 [23:0] FI0 [23:0], FQ0 [23:0] EI0 [23:0], EQ0 [23:0] FI0 [23:0], FQ0 [23:0] GI0 [23:0], GQ0 [23:0] HI0 [23:0], HQ0 [23:0] STX5 FI0 [23:0], FQ0 [23:0] GI0 [23:0], GQ0 [23:0] HI0 [23:0], HQ0 [23:0] STX6 GI0 [23:0], GQ0 [23:0] STX7 HI0 [23:0], HQ0 [23:0] Table 7-30. Example JESD Frame Assembly: Complex Decimation, Quad Band, 24-bit Output OUTPUT LANE LMFS = 8-8-3-1 LMFS = 4-8-6-1 LMFS = 2-8-12-1 LMFS = 1-8-24-1 STX0 AI0 [23:0] AI0 [23:0], AQ0 [23:0] AI0 [23:0], AQ0 [23:0] BI0 [23:0], BQ0 [23:0] AI0 [23:0], AQ0 [23:0] BI0 [23:0], BQ0 [23:0] CI0 [23:0], CQ0 [23:0] DI0 [23:0], DQ0 [23:0] STX1 AQ0 [23:0] BI0 [23:0], BQ0 [23:0] CI0 [23:0], CQ0 [23:0] DI0 [23:0], DQ0 [23:0] STX2 BI0 [23:0] CI0 [23:0], CQ0 [23:0] STX3 BQ0 [23:0] DI0 [23:0], DQ0 [23:0] STX4 CI0 [23:0] STX5 CQ0 [23:0] STX6 DI0 [23:0] STX7 DQ0 [23:0] ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Table 7-31. Example JESD Frame Assembly: Complex Decimation, Dual Band, 24-bit Output OUTPUT LANE LMFS = 8-4-3-2 LMFS = 4-4-3-1 LMFS = 2-4-6-1 LMFS = 1-4-12-1 STX1 AQ0 [23:0] AQ0 [23:0] BI0 [23:0] BQ0 [23:0] STX2 AI1 [23:0] BI0 [23:0] STX3 AQ1 [23:0] BQ0 [23:0] STX4 BI0 [23:0] STX5 BQ0 [23:0] STX6 BI1 [23:0] STX7 BQ1 [23:0] Table 7-32. Example JESD Frame Assembly: Complex Decimation, Single Band, 24-bit Output OUTPUT LANE LMFS = 8-2-3-4 LMFS = 4-2-3-2 LMFS = 2-2-3-1 LMFS = 1-2-6-1 STX1 AQ0 [23:0] AQ0 [23:0] AQ0 [23:0] STX2 AI1 [23:0] AI1 [23:0] STX3 AQ1 [23:0] AQ1 [23:0] STX4 AI2 [23:0] STX5 AQ2 [23:0] STX6 AI3 [23:0] STX7 AQ3 [23:0] www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 53 Product Folder Links: ADC32RF72

7.3.6.2 JESD Output Reference Clock

The ADC provides an option to output the SERDES reference clock to the FPGA (see Figure 7-36). This JESD reference clock is configured to be SerDes lane rate / (8x k) where k can be any integer between 4 and 255. This provides a high flexibility of supported reference clock frequencies. The output clock can be configured to be single ended LVCMOS or differential LVDS. This circuit is powered down by default. If not used, the JESDCLKP/N pins is left floating. The JESD output clock is derived directly from the internal SERDES PLL and does not provide deterministic latency. FS Lane Rate 8 x k REFCLK ADC JESDCLK JESD TX FPGA STX0..7JESD PLL JESD_OUT_CTRL_EN Figure 7-36. JESD reference clock output for the FPGA SERDES PLL The JESD clock output can be can be programmed using the following parameters: Table 7-33. JESD clock output Configuration Programming System Parameter Name Size Default Access Description JESD_OUT_EN_CTRL 1 0 R/W Enable control for JESD output. 0: JESD output is disabled. 1: JESD output is enabled. JESD_OUT_DIV0 8 0 R/W Bits [7:0] of JESD clock output divider factor. JESD_OUT_DIV1 8 0 R/W Bits [12:8] of JESD clock output divider factor. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.4 Device Functional Modes

The device has 2 different operating modes (see also Figure 7-37). Any two out of the four input channels can be selected for either operating mode. 1. Normal operation: one ADC core per input channel. This is the lowest power consumption per channel mode. 2. 2x averaging: The input signal is externally connected to 2 ADC channels. Internally the output of two ADCs is averaged for SNR improvement (best improvement = 3dB). IN0P/N IN1P/N IN2P/N IN3P/N IN0P/N IN1P/N 2x AVG InternalExternal InternalExternal ADC ADC ADC ADC Figure 7-37. Operating modes: normal operation (left) and 2x averaging (right) Table 7-34. Mode Comparison (typical) Operating Mode # of Output Channels SNRflat at FIN = 125MHz, AIN = −1dBFS SNRflat at FIN = 125MHz, AIN = −20dBFS NSDflat at FIN = 125MHz, AIN = −20dBFS Normal 2 74.8dBFS 75.5dBFS −163.6dBFS/Hz 2x Averaging 1 77.5dBFS 78.3dBFS −166.4dBFS/Hz www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 55 Product Folder Links: ADC32RF72

7.4.1 Device Operating Mode Comparison

Following are comparison measurements of the different operating modes for the same input signal configuration. Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 FIN = 125MHz, AIN = -1dBFS, SNRflat = 74.8dBFS Figure 7-38. Single tone FFT, Normal Mode Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 FIN = 125MHz, AIN = -20dBFS, SNRflat = 75.5dBFS Figure 7-39. Single tone FFT, Normal Mode Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 FIN = 125MHz, AIN = -1dBFS, SNRflat = 77.5dBFS Figure 7-40. Single tone FFT, 2x Average Mode Input Frequency (MHz) Amplitude (dBFS) 0 250 500 750 -120 -100 -80 -60 -40 -20 FIN = 200MHz, AIN = -20dBFS, SNRflat = 78.2dBFS Figure 7-41. Single tone FFT, 2x Average Mode ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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7.5 Programming

The device is primarily configured and controlled using the serial programming interface (SPI). However, there are digital features and functions available that can be configured via SPI and controlled/used via GPIO pins.

7.5.1 GPIO Control

The device has 24 GPIO pins. Four are fixed function and the remaining 20 can be configured independently for different functions using the SPI. Table 7-35. GPIO: FIxed Functions PIN NAME FUNCTION PIN # RESET Hardware RESET J1 SCLK SPI SCLK K15 SDIO SPI DIN/DOUT L15 SDOUT SPI DOUT L3 SEN SPI EN J16 SYNC SYNC for JESD 8b/10b J4 Table 7-36. GPIO: Configurable Functions FUNCTION PIN No. No. of PINS

DESCRIPTION

1..8 The pin selects between 2 NCO frequencies for each DDC. There are 8 DDCs and each NCO/DDC can be mapped to a specific GPIO pins. Using one GPIO pin for multiple/all DDCs is possible. Functional only when using NCOs. Low: nco_0 of each active DDC is selected. High: nco_1 of each active DDC is selected. OVR 1 OR-ed outputs of each ADC OVR signal. Low: no ADC is in saturation. High: an ADC is in saturation. NCO SYSREF ARM 1 The GPIO pin is used to enable resetting the NCO phase to 0 with the next SYSREF rising edge. CALIBRATION FREEZE 1 Low: device background calibration is active. High: device background calibration is inactive. GLOBAL POWER DOWN 1 Device global power down. Low: device is powered up. High: device is powered down. FAST POWER DOWN 1 Device global power down. Low: device is powered up. High: device is powered down. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 57 Product Folder Links: ADC32RF72

7.5.2 SPI Register Write

The internal registers can be programmed following these steps: 1. Drive the SEN pin low (all SPI rising and falling clock edges need to occur while SEN driven low). 2. Set the R/W bit to 0 (bit A15 of the 16-bit address). 3. Initiate a serial interface cycle by specifying the address of the register (A[14:0]) whose content is written and 4. Write the 8-bit data that are latched in on the SCLK rising edges Figure 7-42 shows the timing requirements for the serial register write operation. A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 Register Address <14:0> Register Data <7:0> SDIO SCLK tSCLK tS,SDIO tH,SDIO SEN tS,SEN tH,SEN RESET A11 A10 A9 A8 A7 A60 R/W A14 A13 A12 Figure 7-42. Serial Register Write Timing Diagram

7.5.3 SPI Register Read

The device includes a mode where the contents of the internal registers can be read back using the SDIO pin. This readback mode can be useful as a diagnostic check to verify the serial interface communication between the external controller and the ADC. The procedure to read the contents of the serial registers is as follows: 1. Drive the SEN pin low (all SPI rising and falling clock edges need to occur while SEN driven low). 2. Set the R/W bit (A15) to 1. This setting disables any further writes to the registers. 3. Initiate a serial interface cycle specifying the address of the register (A[14:0]) whose content must be read 4. The device launches the contents (D[7:0]) of the selected register on the SDIO pin on SCLK falling edge 5. The external controller can capture the contents on the SCLK rising edge A5 A4 A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0 Register Address <14:0> Register Data <7:0> SDIO SCLK SEN A11 A10 A9 A8 A7 A61 R/W tOZD tOD tODZ A14 A13 A12 Figure 7-43. Serial Register Read Timing Diagram ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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8 Application and Implementation

Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes, as well as validating and testing their design implementation to confirm system functionality.

8.1 Application Information

The ADC32RF72 can be used in a wide range of applications including radar, frequency and/or time domain digitizer and spectrum analyzer, test and communications equipment and software-defined radios (SDRs). The Typical Applications section describe two configurations that meet the needs of a number of these applications.

8.2 Typical Application: Spectrum Analyzer

This section demonstrates the use of ADC32RF72 as a wideband RF sampling receiver. The device is flexible and can be used as either a 2-channel receiver or as a single channel receiver with better noise floor using internal digital averaging. The ADC is driven by single-ended RF amplifiers and the conversion to differential signaling is achieved by a transformer (balun). The device includes digital down-converters (DDCs) in both dual-channel and single-channel modes to mix the desired frequency band to baseband and down-sample the data to reduce the interface rate. The block diagram for the wideband RF sampling receiver is shown in Figure 8-1 where the device is configured in single-channel mode for best noise density. SPI Registers and Device Control Up to 8 lanes JESD204B SPI GPIO LMK04832 Device Clock SYSREF SYSREF MONITOR JESD204B/C DIGITAL SIGNAL PROCESSING - 96-tap/ch FIREQ - Fractional Delay Filter ADC 2x AVG Split/ Match RF Input BPF Device Clock SYSREF FPGA Figure 8-1. Wideband RF Sampling Receiver

8.2.1 Design Requirements

8.2.1.1 Input Signal Path: Wideband Receiver

Appropriate band limiting filters are used to reject unwanted frequencies in the receive signal path. A 1:2 (for 100Ω effective termination impedance) or a 1:1 (for 50 Ω effective termination impedance) balun transformer is needed to convert the single ended RF input to differential for input to the ADC. The balun must have good amplitude (< 0.5dB) and phase balance (less than 2deg) within the frequency range of interest. A back-to-back balun configuration often times gives better SFDR performance. Table 8-1 lists several recommended baluns for different impedance ratios and frequency ranges. The S-parameters of the ADC input can be used to design the front end matching network. www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 59 Product Folder Links: ADC32RF72

Table 8-1. Recommended Baluns PART NUMBER MANURACTURER(1) IMPEDANCE RATIO AMPLITUDE BALANCE (dB) PHASE BALANCE (°) FREQUENCY RANGE BAL-0003SMG Marki Microwave 1:2 0.1 3 0.5MHz to 3GHz TCM2-43X+ Minicircuits 1:2 0.5 7 10MHz to 4GHz TCM2-33WX+ Minicircuits 1:2 0.7 4 10MHz to 3GHz TC1-1-13M+ Minicircuits 1:1 0.5 2-3 10MHz to 3GHz (1) See the Third-Party Products Disclaimer .

8.2.1.2 Clocking

The device clock inputs must be AC-coupled to the device to provide the rated performance. The clock source must have low jitter (integrated phase noise) for the ADC to meet the stated SNR performance, especially when operating at higher input frequencies. The clock signal can be filtered with a band pass filter to remove some of the broad band clock noise. The JESD204B/C data converter system (ADC and FPGA) requires additional SYSREF and device clocks. The LMK04828 or LMK04832 devices are designed to generate these clocks. Depending on the ADC clock frequency and jitter requirements. The device can also be used as a system clock synthesizer or as a device clock and SYSREF distribution device when using multiple ADC32RF72 devices in a system.

8.2.2 Detailed Design Procedure

8.2.2.1 Sampling Clock Requirements

To maximize the SNR performance of the ADC, a very low jitter (< 50fs) sampling clock is required. Figure 8-2 shows the estimated SNR performance versus input frequency versus external clock jitter. The internal ADC aperture jitter also has some dependency to the clock amplitude (gets more sensitive with higher input frequency) as shown in Figure 8-3. When using averaging or decimation, the SNR for a single ADC core must be estimated first before adding the SNR improvement from internal averaging or decimation. Input Frequency (MHz) SNR (dBFS) 100 1000 1500 TJ = 10 fs TJ = 30 fs TJ = 50 fs TJ = 100 fs Figure 8-2. SNR vs TJitter Clock Amplitude (Vpp) SNRflat (dBFS) SFDR (dBFS) 0 0.5 1 1.5 2 2.5 3 69 60 70 65 71 70 72 75 73 80 74 85 75 90 76 95 77 100 SNR (Fin = 100MHz) SFDR (Fin = 100MHz) SNR (Fin = 900MHz) SFDR (Fin = 900MHz) Figure 8-3. AC Performance vs Clock Amplitude ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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8.2.3 Application Performance Plots

The following application curves demonstrate performance with 2x internal averaging configuration. The input frequency is 900MHz and input amplitudes of -1 and -20dBFS are shown in DDC bypass mode as well as 8x complex decimation. Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 Figure 8-4. FIN = 900MHz, AIN = -1dBFS, 2x Averaging, DDC Bypass Input Frequency (MHz) Amplitude (dBFS) 0 150 300 450 600 750 -120 -100 -80 -60 -40 -20 Figure 8-5. FIN = 900MHz, AIN = -20dBFS, 2x Averaging, DDC Bypass Input Frequency (MHz) Amplitude (dBFS) -100 -50 0 50 100 -140 -120 -100 -80 -60 -40 -20 Figure 8-6. FIN = 900MHz, AIN = -1dBFS, 2x Averaging, 8x complex decimation Input Frequency (MHz) Amplitude (dBFS) -100 -50 0 50 100 -140 -120 -100 -80 -60 -40 -20 Figure 8-7. FIN = 900MHz, AIN = -20dBFS, 2x Averaging, 8x complex decimation www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 61 Product Folder Links: ADC32RF72

8.3 Typical Application: Time Domain Digitizer

The ADC32RF72 offers several features such as low code error rate (CER), very low noise floor and high SNR and programmable, fractional digital delay that makes the device a great fit for time domain digitizer and oscilloscope applications. The block diagram for a typical time domain sampling signal chain in Figure 8-8 with the ADC32RF72 configured in dual-channel mode with 2x internal digital averaging for best noise density. SPI Registers and Device Control Up to 8 lanes JESD204B SPI GPIO LMK04832 Device Clock SYSREF SYSREF MONITOR JESD204B/C DIGITAL SIGNAL PROCESSING - 96-tap/ch FIREQ - Fractional Delay Filter ADC 2x AVG Split/ MatchRF Input Device Clock SYSREF FPGA LPF Figure 8-8. Time Domain Digitizer

8.3.1 Design Requirements

8.3.1.1 Input Signal Path: Time Domain Digitizer

Most time-domain digitizers are required to be DC-coupled to monitor DC or low-frequency signals. This requirement forces the design to use DC-coupled, fully differential amplifiers to convert from single-ended signaling at the front panel to differential signaling at the ADC. This design uses a differential amplifier. The LMH5401 amplifier has an 8GHz, gain-bandwidth product that is sufficient to support a 1GHz bandwidth digitizer. The LMH5401 has a gain of 8dB and a noise figure of 11dB. An antialiasing, low-pass filter is positioned at the input of the ADC to limit the bandwidth of the input signal into the ADC. This amplifier also band-limits the front-end noise to prevent aliased noise from degrading the signal-to-noise ratio of the overall system. Design this filter for the maximum input signal bandwidth specified by the oscilloscope. The input bandwidth can then be reconfigured through the use of digital filters in the FPGA or ASIC to limit the oscilloscope input bandwidth to a bandwidth less than the maximum. Table 8-2 lists a number of recommended amplifiers frequency ranges. Table 8-2. Recommended single ended to differential amplifiers PART NUMBER BANDWIDTH POWER CONSUMPTION THS4509 1.9GHz 125mW LMH5401 8GHz 185mW TRF1305 7GHz 495mW ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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8.3.2 Application Performance Plots

The following shows a captured pulse response. Unwrapped Samples Output Code 0 65536 131072 196608 262144 8192 16384 24576 32768 40960 49152 57344 65536 Figure 8-9. 100MHz Pulse response www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 63 Product Folder Links: ADC32RF72

8.4 Initialization Set Up

After power-up, the internal registers must be initialized to the default values through a hardware reset by applying a low pulse on the RESET pin, as shown in Figure 8-10. Any given power rail needs to reach 90% of the value before starting the next power rail. 1. Apply 0.9V DVDD09 digital power supply 2. Apply 1.2V AVDD12 and CLKVDD12 power supplies 3. Apply 1.8V power supplies (AVDD18, GPIOVDD18, DVDD18), in no specific order 4. Apply sampling clock 5. Apply hardware reset. After hardware reset is released, the default registers are loaded from internal fuses. 6. Start programming the internal registers using the SPI register writes. The internal calibration starts automatically and a register can be read back to check the status of the calibration. For power down, the inverse sequence can be followed. AVDD18 CLKVDD18 GPIOVDD18RESET SEN AVDD12 CLKVDD12 DVDD09 CLK Figure 8-10. Initialization of Serial Registers After Power-Up Table 8-3. Power Up Timing MIN TYP MAX UNIT t1 Power-on delay: delay from power up to active low RESET pulse 1 us t2 Reset pulse width: active low RESET pulse width 100 ns ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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8.5 Power Supply Recommendations

The device requires 3 different power supply voltages: the internal analog circuitry operate off 1.8V and 1.2V rails while the digital logic uses a 0.9V rail. Figure 8-11 shows a typical power supply example using a switching regulator for the digital 0.9V supply and low noise LDOs for the analog supplies. The voltage regulators must be sequenced for both power up and power down as shown in Section 8.4. High Current DC/DC (TPSM82916) DVDD090.9V @ 3A (typical use case) Low Noise LDO (TPS7A9601) AVDD121.2V @ 2A (typical use case) Low Noise LDO (TPS7A94) AVDDCLK121.2V @ 1A (typical use case) Low Noise LDO (TPS7A9601) AVDD181.8V @ 2A (typical use case) AVDDGPIO18 Low Noise LDO (TPS7A9601) AVDDCLK181.8V @ 2A (typical use case) Figure 8-11. Power supply rails and regulator examples Frequency of Signal (MHz) PSRR (dB) 0.02 0.1 1 -90 -80 -70 -60 -50 AVDDCLK18 AVDDCLK12 AVDD18 AVDD12 Figure 8-12. PSRR www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 65 Product Folder Links: ADC32RF72

8.6 Layout

8.6.1 Layout Guidelines

There are several critical signals which require specific care during board design: 1. Analog input and clock signals

  • Traces must be as short as possible and vias must be avoided where possible to minimize impedance discontinuities.
  • Traces must be routed using loosely coupled 100Ω differential traces.
  • Differential trace lengths must be matched as close as possible to minimize phase imbalance and HD2 degradation. 2. Digital JESD204B/C output interface
  • Traces must be routed using tightly coupled 100Ω differential traces. 3. Power and ground connections
  • Provide low resistance connection paths to all power and ground pins.
  • Use power and ground planes instead of traces.
  • Avoid narrow, isolated paths which increase the connection resistance.
  • Use a signal/ground/power circuit board stackup to maximize coupling between the ground and power plane.

8.6.2 Layout Example

The following screen shots show the top and bottom layer of the ADC32RF7x EVM.

  • The input signal traces are routed as differential, tightly coupled traces on the top layer of the EVM. Care is taken to maintain symmetry between positive and negative input with matched trace length to minimize phase imbalance. Similar for the sampling clock input.
  • JESD204B/C output interface lanes are routed differential and length matched on the top layer.
  • Bypass caps are close to the power pins on the bottom layer. 4 analog inputs on top layer Tightly coupled traces Figure 8-13. Top Layer ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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Figure 8-14. Bottom Layer www.ti.com ADC32RF72 SBASAL2 – NOVEMBER 2025 Copyright © 2025 Texas Instruments Incorporated Submit Document Feedback 67 Product Folder Links: ADC32RF72

9 Device and Documentation Support

TI offers an extensive line of development tools. Tools and software to evaluate the performance of the device, generate code, and develop solutions are listed below.

9.1 Documentation Support

9.1.1 Related Documentation

  • Texas Instruments, Evaluating High-Speed, RF ADC Converter Front-end Architectures application note

9.1.2 Third-Party Products Disclaimer

TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.

9.2 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. Click on Notifications to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

9.3 Support Resources

TI E2E™ support forums are an engineer's go-to source for fast, verified answers and design help — straight from the experts. Search existing answers or ask your own question to get the quick design help you need. Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

9.4 Trademarks

TI E2E™ is a trademark of Texas Instruments. All trademarks are the property of their respective owners.

9.5 Electrostatic Discharge Caution

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

9.6 Glossary

TI Glossary This glossary lists and explains terms, acronyms, and definitions. NOTE: Page numbers for previous revisions may differ from page numbers in the current version. DATE REVISION NOTES November 2025 * Initial Release

11 Mechanical, Packaging, and Orderable Information

The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. ADC32RF72 SBASAL2 – NOVEMBER 2025 www.ti.com

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www.ti.com 22-Nov-2025 PACKAGING INFORMATION Orderable part number Status (1) Material type (2) Package | Pins Package qty | Carrier RoHS (3) Lead finish/ Ball material (4) MSL rating/ Peak reflow (5) Op temp (°C) Part marking (6) ADC32RF72IANH Active Production FCCSP (ANH) | 289 119 | JEDEC TRAY (5+1) Yes Call TI | Other Level-3-260C-168 HR - ADC32RF72 (1) Status: For more details on status, see our product life cycle. (2) Material type: When designated, preproduction parts are prototypes/experimental devices, and are not yet approved or released for full production. Testing and final process, including without limitation quality assurance, reliability performance testing, and/or process qualification, may not yet be complete, and this item is subject to further changes or possible discontinuation. If available for ordering, purchases will be subject to an additional waiver at checkout, and are intended for early internal evaluation purposes only. These items are sold without warranties of any kind. (3) RoHS values: Yes, No, RoHS Exempt. See the TI RoHS Statement for additional information and value definition. (4) Lead finish/Ball material: Parts may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two lines if the finish value exceeds the maximum column width. (5) MSL rating/Peak reflow: The moisture sensitivity level ratings and peak solder (reflow) temperatures. In the event that a part has multiple moisture sensitivity ratings, only the lowest level per JEDEC standards is shown. Refer to the shipping label for the actual reflow temperature that will be used to mount the part to the printed circuit board. (6) Part marking: There may be an additional marking, which relates to the logo, the lot trace code information, or the environmental category of the part. Multiple part markings will be inside parentheses. Only one part marking contained in parentheses and separated by a "~" will appear on a part. If a line is indented then it is a continuation of the previous line and the two combined represent the entire part marking for that device. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1

PACKAGE MATERIALS INFORMATION www.ti.com 1-Dec-2025 TRAY L - Outer tray length without tabs KO - Outer tray height W - Outer tray width P1 - Tray unit pocket pitch CW - Measurement for tray edge (Y direction) to corner pocket center CL - Measurement for tray edge (X direction) to corner pocket center Text Chamfer on Tray corner indicates Pin 1 orientation of packed units. *All dimensions are nominal Device Package Name Package Type Pins SPQ Unit array matrix Max temperature (°C) L (mm) W (mm) (µm) (mm) CL (mm) CW (mm) ADC32RF72IANH ANH FCCSP 289 119 7 x 17 150 315 135.9 7620 18.1 12.7 12.9 ADC32RF72IANH ANH FCCSP 289 119 7 x 17 150 315 135.9 7620 18.1 12.7 12.9 Pack Materials-Page 1

www.ti.com PACKAGE OUTLINE C

1.968 MAX

0.520 0.288 12.8 TYP 12.8 TYP 0.8 TYP 0.8 TYP 289X 0.58

0.48 NOTE 3

(0.45) MOLD CAP B 13.9 13.7 A 13.9 13.7 ( 11.8) (0.5) (0.5) TYP (0.5) TYP 4230247/C 03/2024 FCCSP - 1.968 mm max heightANH0289A BALL GRID ARRAY NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. Dimension is measured at the maximum solder ball diameter, post reflow, parallel to primary datum C. 4. Primary datum C and seating plane are defined by the spherical crowns of the solder balls. BALL A1 CORNER 0.1 C SEATING PLANE NOTE 4 0.2 C 0.2 C A 1 2 3

0.15 C A B

0.08 C 4 5 6 7 8 9 10 11 12 13 SYMM SYMM B C D E F G H J K L M N 14 15 16 17 P R T U SCALE 1.200

www.ti.com EXAMPLE BOARD LAYOUT 0.05 MIN0.05 MAX (0.8) TYP ( 0.45) SOLDER MASK OPENING ( 0.45) METAL FCCSP - 1.968 mm max heightANH0289A BALL GRID ARRAY 4230247/C 03/2024 NOTES: (continued) 5. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints. See Texas Instruments Literature No. SPRU811 (www.ti.com/lit/spru811). SOLDER MASK DETAILS NOT TO SCALE SYMM SYMM C 1 2 3 4 5 6 7 8 9 10 11 12 13 A B D E F G H J K L M N LAND PATTERN EXAMPLE EXPOSED METAL SHOWN SCALE: 6X 14 15 16 17 P R T U NON-SOLDER MASK DEFINED (PREFERRED) EXPOSED METAL SOLDER MASK OPENING SOLDER MASK DEFINED METAL UNDER SOLDER MASK EXPOSED METAL

www.ti.com EXAMPLE STENCIL DESIGN (0.8) TYP 4230247/C 03/2024 FCCSP - 1.968 mm max heightANH0289A BALL GRID ARRAY NOTES: (continued) 6. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. SYMM SYMM SOLDER PASTE EXAMPLE BASED ON 0.15 mm THICK STENCIL SCALE: 6X C 1 2 3 4 5 6 7 8 9 10 11 12 13 A B D E F G H J K L M N 14 15 16 17 P R T U

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