TLP117

TLP117_14 TOSHIBA | Alldatasheet

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Technical content

TOSHIBA PHOTOCOUPLER GaA ℓAs LED & PHOTO-IC TLP117 PDP (Plasma Display Panel) FA (Factory Automation) High-Speed Interface The Toshiba TLP117 consists of a GaAℓAs light-emitting diode and an integrated high-gain, high-speed photodetector.  Inverter logic (totempole output)  Package type : MFSOP6  Guaranteed performance over temperature : -40 to 105°C  Power supply voltage : 4.5 to 5.5 V  Input thresholds current : I FHL=5 mA (max)  Propagation delay time (tpHL/tpLH) : 30 ns (max) at VL=0 V  20 ns (Max) at VL=1.1 V  Switching speed : 50 MBd (typ.)  Common mode transient immunity : 10 kV/ μs (min)  Isolation voltage : 3750 Vrms  UL Recognized : UL1577, File No.E67349  c-UL Recognized: CSA Component Acceptance Service No. 5A, File No.E67349 Truth Table Pin Configuration (Top View) Input LED M1 M2 Output H ON OFF ON L L OFF ON OFF H Schematic TOSHIBA 11-4C2 Weight: 0.09 g (typ.) 1:ANODE 3:CATHODE 4:GND 5: VO 6: VCC 0.1μF bypass capacitor must be connected between pins 6 and 4

6 VCC

4 SHIELD

Unit: mm Start of commercial production

Absolute Maximum Ratings (Ta=25°C) Characteristic Symbol Rating Unit LED Forward current I F 25 mA Forward current derating (Ta ≥85°C) ∆IF/∆Ta -0.7 mA/ °C Peak transient forward current (Note 1) I FPT 1 A Reverse voltage V R 6 V DETECTOR Output current I O 10 mA Output voltage V O 6 V Supply voltage V CC 6 V Output power dissipation P O 40 mW Operating temperature range T opr -40 to 105 °C Storage temperature range T stg -55 to 125 °C Lead solder temperature(10s) T sol 260 °C Isolation voltage (AC,1 minute, R.H. ≤ 60%, Ta=25°C) (Note 2) BVs 3750 Vrms Note: Using continuously under heavy loads (e.g. the ap plication of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 1: Pulse width PW≤1μs, 300 pps. Note 2: This device is regarded as a two-terminal device: pins 1 and 3 are shorted together, and pins 4,5 and 6 are shorted together. Recommended Operating Conditions Characteristic Symbol Min Typ. Max Unit Input current , ON I F(ON) 10 — 16 mA Input voltage , OFF V F(OFF) 0 — 1.0 V Supply voltage(*) (Note 3) VCC 4.5 5.0 5.5 V * This item denotes operating ranges, not meaning of recommended operating conditions. Note: Recommended operating conditions are given as a design guideline to obtain expected performance of the device. Additionally, each item is an independent guide line respectively. In developing designs using this product, please confirm specified characteristics shown in this document. Note 3: The detector of this produc t requires a power supply voltage ( VCC) of 4.5 V or higher for stable operation. If VCC is lower than this value, ICC may increase or the output may be unstable. Be sure to use the product after checking the supply current, and the operation of a power-on/-off.

Electrical Characteristics

(Unless otherwise specified, Ta=-40 to 105°C, VCC =4.5 to 5.5V) Characteristic Symbol Test Circuit Conditions Min Typ. Max Unit Input forward voltage V F — IF=10 mA, Ta=25°C 1.45 1.6 1.85 V Temperature coefficient of forward voltage ∆VF/∆Ta — IF=10 mA — -2.0 — mV/ °C Input reverse current I R — VR=5 V, Ta=25°C — — 10 μA Input capacitance C T — V=0, f=1 MHz, Ta=25°C — 60 — pF Output voltage “L” Level V OL 1 I OL=4 mA, IF=10 mA — — 0.6 V “H” Level V OH 2 IOH=-4mA, VF=1.05V VCC=4.5V 3.9 — — V VCC=5.5V 4.9 — — Supply current “L” Level I CCL 3 I F=10 mA — — 5.0 mA “H” Level I CCH 4 V F=0 V — — 5.0 mA Input current H → L I FHL — IO=20 μA, VO<0.3 V — — 5 mA Input voltage L → H V FLH — IO=-20 μA, VO>4.0 V 0.8 — — V * All typical values are at Ta=25°C unless otherwise specified. Isolation Characteristics (Ta = 25°C) Characteristic Symbol Test Conditions Min Typ. Max Unit Capacitance input to output C S V = 0, f = 1 MHz (Note 2) ― 0.8 ― pF Isolation resistance R S R.H. ≤ 60%, VS = 500 V (Note 2) 1×10 12 1014 ― Ω Isolation voltage BV S AC, 1 minute 3750 ― ― Vrms AC, 1 second, in oil ― 10000 ― DC, 1 minute, in oil ― 10000 ― Vdc Note 4: A ceramic capacitor (0.1 μF) should be connected from pin 6 to pin 4 to stabilize the operation of the high gain linear amplifier. Failure to provide the bypass may impair the switching property. The total lead length between capacitor and coupler should not exceed 1 cm.

(Unless otherwise specified, Ta=-40 to 105°C, VCC=4.5 to 5.5V) Characteristic Symbol Test Circuit Conditions Min Typ. Max Unit Propagation delay time to logic high output tpHL VIN = 0 → 5V RIN=360Ω CIN =22pF VL=0V (Note 5) — — 30 ns Propagation delay time to logic low output tpLH VIN = 5 → 0V — — 30 ns Switching time dispersion between ON and OFF |tpHL−tpLH| VIN = 5V — — 10 ns Output fall time (90-10%) t f VIN = 0 → 5V — 3 — ns Output rise time (10-90%) t r VIN = 5 → 0V — 2 — ns Propagation delay time to logic high output tpHL VIN = 1.1 → 5V RIN=360Ω CIN=22pF VL=1.1V (Note 5) — — 20 ns Propagation delay time to logic low output tpLH VIN = 5 → 1.1V — — 20 ns Propagation delay skew T psk — — — 16 ns Switching time dispersion between ON and OFF Output fall time (90-10%) T f VIN = 1.1 → 5V — 3 — ns Output rise time (10-90%) t r VIN = 5 → 1.1V — 3 — ns Data rate T — — 50 — MBd Common mode transient immunity at high Level output CMH VCM=1000Vp-p, Ta=25°C IF=0mA, VCC =5V, VO(Min)=4V, 10000 — — V/μs Common mode transient immunity at low level output CML VCM=1000Vp-p, ,Ta=25°C IF=10mA, VCC=5V, VO(Max)=0.4V -10000 — — V/μs *All typical values are at Ta=25 °C, VCC =5V. Note 5: C L is approximately 15pF which includes probe and Jig/stray wiring capacitance. Note 6: This product has an automatic threshold control (ATC) circuit in order to reduce input current dependence of its switching time. The ATC circuit may not be able to respond accordingly when an input signal is driven after a prolonged absence of signals to the product. As a result, switching operation, pertaining to the first pulse of an input signal, could be unstable. Theoretically howeve r, stable switching operation should be achievable from the second pulse onwards. As such, please che ck the switching operation and take the appropriate measures when designing applications in which this product shall be used.

TEST CIRCUIT 1: VOL TEST CIRCUIT 2: VOH TEST CIRCUIT 3: ICCL TEST CIRCUIT 4: ICCH TEST CIRCUIT 5: tpHL , tpLH VCC IF VCC GND SHIELD 0.1μF VOL V IOL VCC VCC GND SHIELD 0.1μF VOH V IOH 1 6 VCC GND SHIELD ICCL A IF ↑ VCC VCC GND SHIELD VCC ICCH A VCC*CL=15pF 0.1μF RIN=360Ω *CL=15pF VCC GND SHIELD INPUT MONITORING NODE VIN=0↔5V(P.G) (f=25MHz , duty=50%) CL is capacitance of the probe and JIG. (P.G): Pulse Generator Vo MONITORING NODE C IN =22pF 10% 90% tpHL tpLH 50% VOL VOH tf tr 10% 90% 50% VL=0V GND tr=4.5ns tf=4.5ns VIN VO 0.1μF 0.1μF

TEST CIRCUIT 6: tpHL , tpLH (example for LED drive circuit) TEST CIRCUIT 7: Common-Mode Transient Immunity Test Circuit CML CMH VCM 1 0 % 90% 1000V ・SW B : IF=0mA 0.4V tr tf ・SW A : IF=10mA )(800 str V HCM μ= )(800 st f V LCM μ−= 0.1μF VO VCC SW IF 1 VCM B → VCC GND SHIELD A 10% 90% tpHL tpLH VIN VO 50% VOL VOH tf tr 10% 90% 50% GND tf=4.5ns VL=1.1V tr=4.5ns VCC*CL=15pF 0.1μF RIN =360Ω *CL=15pF VCC GND SHIELD INPUT MONITORING NODE VIN=1.1↔5V(P.G) (f=25MHz , duty=50%) CL is capacitance of the probe and JIG. (P.G) : Pulse Generator Vo MONITORING NODE C IN =22pF CIN=22pF CIN 22 F 0.1μF *CL=15pF VCC GND VCC GND P.G f=25MHz SHIELD RIN1=300Ω RIN2=180Ω RIN3=1.6kΩ TC7SZ08F/FU CIN=47pF INPUT MONITORING NODE Vo MONITORING NODE VCC CL is capacitance of the probe and JIG. (P.G) : Pulse Generator

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