TL461

TL461 TI | Alldatasheet

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PRECISION SERIES REFERENCE SLVS263 – NOVEMBER 1999 1POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 /C0068Low Drift. . . 30 ppm/°C (max) /C0068/C00340.5% Output-Voltage Tolerance /C0068Low Quiescent Current. . . 180 mA (max) /C0068Shutdown Feature /C0068Standby Current. . . –50 mA (max) /C0068Packaged In Plastic SOT-23 Package

description

The TL461 is a precision series voltage reference with a very low temperature drift of 30 ppm/°C, and an output voltage tolerance of 0.5%. The TL461 offers a power-saving advantage over three-terminal precision shunt regulators and voltage references that must conduct the full-load current when operated in the reverse-breakdown region. In addition, the shutdown feature of the device provides low standby current. This device is ideal for use with handheld and battery-operated equipment, switching power supplies, dc-dc converters, A/D and D/A converters, and in low-power precision regulator applications. The TL461 device is characterized for operation from –40°C to 85°C. Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. PRODUCT PREVIEW PRODUCT PREVIEW information concerns products in the formative or design phase of development. Characteristic data and other specifications are design goals. Texas Instruments reserves the right to change or discontinue these products without notice. Copyright  1999, Texas Instruments Incorporated DBV PACKAGE (TOP VIEW) NC GND ENABLE OUTPUT INPUT

PRECISION SERIES REFERENCE SLVS263 – NOVEMBER 1999

2 POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

absolute maximum ratings over operating free-air temperature range (unless otherwise noted)† † Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: Package thermal impedance is calculated in accordance with JESD 51. recommended operating conditions MIN MAX UNIT Input voltage VI TL461-33 4.7 VIn ut voltage, VI TL461-05 6.4 V Output current, IO 20 mA Operating free-air temperature range, TA –40 85 °C Operating virtual-junction temperature range, TJ 0 125 °C PRODUCT PREVIEW

PRECISION SERIES REFERENCE SLVS263 – NOVEMBER 1999 3POST OFFICE BOX 655303 • DALLAS, TEXAS 75265 electrical characteristics at 25°C free-air temperature, Vin = Vout + 2.5 V, Iout = 0 (unless otherwise noted) PARAMETER TEST CONDITIONS TA MIN TYP MAX UNIT VO Output voltage TL461-33 25°C 3.284 3.3 3.317 VVO O utput voltage TL461-05 25°C 4.975 5 5.025 V a Vout Output voltage temperature coefficient (see Note 2) Tmin < Tj < Tmax –40°C to 85°C 10 30 ppm/°C Line regulation 75V<V i <2 0V 25°C 3.1 6.3 mV/C0110VO Line regulation 7.5 V < Vin < 20 V –40°C to 85°C 8.1 m V I t= 100mA 25°C 2.2 3 Iout = 100 mA –40°C to 85°C 4 /C0110VO Load regulation sourcing I t=1 0m A 25°C 14 27 mV/C0110VO Load regulation sourcing Iout = 10 mA –40°C to 85°C 35 mV I t=2 0m A 25°C 22 40 Iout = 20 mA –40°C to 85°C 50 Dropout voltage Iout = 10 mA –40°C to 85°C 1.4 V IO Output current Vout = GND 25°C 40 mA Reverse leakage Vin = –15 V –40°C to 85°C 0.5 10 mA Quiescent current 25°C 125 180 mAQ uiescent current –40°C to 85°C 225 mA Standby current –40°C to 85°C 50 mA ENABLE bias c rrent ENABLE = 0.8 V 40°Ct o8 5°C mAENABLE bias current ENABLE = 2 V –40°C to 85°C 0.05 mA Output noise voltage (see Note 3)

0.1 Hz < f < 10 Hz

25°C 20 mVppO utput noise voltage (see Note 3)

10 Hz < f < 1 kHz

25°C 20 mVrms Long-term stability of output voltage (see Note 4) 25°C 70 ppm/√k Hz NOTES: 2. Temperature coefficient is measured by dividing the change in output voltage by the specified temperature range. Maximum V out Minimum V out DTA DVout /C0356/C0097Vout /C0356/C0466ppm °C /C0467/C0043 /C0466 /C0068V out V outat 25°C /C0467/C0032106 /C0068TA Where: DTA is the recommended operating free-air temperature range of the device. can be positive or negative, depending on whether minimum Vout or maximum Vout, respectively, occurs at the lower temperature. /C0097Vout 3. Peak-to-peak noise is measured with a single high-pass filter at 0.1 Hz and two-pole low-pass filter at 10 Hz. The unit is enclosed in a still-air environment to eliminate thermocouple effects on the leads. The test time is 10 seconds. RMS noise is measured with a single high-pass filter at 10 Hz and a two-pole low-pass filter at 1 kHz. The resulting output is full-wave rectified, then integrated for a fixed period, making the final reading an average rather than RMS. A correction factor of 1.1 converts from average to RMS. A second correction of 0.88 corrects for the nonideal bandpass of the filters. 4. Long-term stability typically has a logarithmic characteristic. Therefore, stability changes after 1000 hours tend to be much smaller than before that time. Total drift in the second thousand hours is normally less than one third of that of the first thousand hours, with a continuing trend toward reduced drift with time. Significant improvement in long-term drift can be realized by preconditioning the device with a 100-hour to 200-hour, 125°C burn-in. Long-term stability also is affected by differential stresses between the device and the board material that are created during board assembly. PRODUCT PREVIEW

Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE (“CRITICAL APPLICATIONS”). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER’S RISK. In order to minimize risks associated with the customer’s applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI’s publication of information regarding any third party’s products or services does not constitute TI’s approval, warranty or endorsement thereof. Copyright  1999, Texas Instruments Incorporated