TFP50N06

TFP50N06 TAK_CHEONG | Alldatasheet

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Number: DB-228 August 2011, Revision A Page 1 TAK CHEONG SEMICONDUCTOR N-Channel Power MOSFET 50A, 60V, 0.023Ω GENERAL DESCRIPTION This N-Channel MOSFET is used an advanced termination scheme to provide enhanced voltage-blocking capability without degrading performance over time. This advanced technology has been especially tailored to minimize on-state resistance, provide superior switching performance. This device is well suited for high efficiency switched mode power suppliers, active power factor correction, electronic lamp ballasts based half bridge topology.

FEATURES

• Avalanche energy specified
• Gate Charge (Typical 36nC)
• High Ruggedness 1 = Gate 2 = Drain 3 = Source DEVICE MARKING DIAGRAM ABSOLUTE MAXIMUM RATINGS (TC =25°C, unless otherwise noted ) Symbol Parameter Value Units VDSS Drain- Source Voltage 60 V VGSS Gate-Source Voltage ±25 V ID Drain Current 50 A IDM Drain Current Pulsed 200 A Power Dissipation (Note 2) 120 W PD Derating Factor above 25℃ 0.8 W/℃ EAS Single Pulsed Avalanche Energy (Note 1) 642 mJ EAR Repetitive Avalanche Energy (Note 2) 12 mJ dv/dt Peak Diode Recovery dv/dt (Note 3) 7.0 V/ns TJ Operating Junction Temperature 150 ℃ Tstg Storage Temperature Range - 55 to +150 ℃ Notes: 1. L=300uH, IAS=50A, VDD=25V, RG=50Ω, Starting TJ=25℃. 2. Repetitive Rating: Pulse width limited by maximum junction temperature. 3. ISD ≤ 50A, di/dt ≤ 300A/us, VDD ≤ BVDSS, Starting TJ=25℃. THERMAL CHARACTERISTICS Symbol Parameter Value Unit RθJC Thermal Resistance, Junction-to-Case 1.25 ℃/W RθJA Thermal Resistance, Junction-to-Ambient 62.5 ℃/W TFP50N06 1 2 TO-220AB G D S L xxyy TFP XXXX L = Tak Cheong Logo xxyy = Monthly Date Code TFPXXXX = Device Type

Number: DB-228 August 2011, Revision A Page 2 TAK CHEONG SEMICONDUCTOR

ELECTRICAL CHARACTERISTICS

Off Characteristics (TA = 25°C unless otherwise noted) Symbol Parameter Test Conditions Min. Typ. Max. Unit BVDSS Drain-Sounce Breakdown Voltage V GS = 0V, ID = 250uA 60 -- -- V IDSS Zero Gate Voltage Drain Current V DS = 60V, VGS = 0V -- -- 1 uA IGSSF Gate-Body Leakage Current, Forward V GS = 25V, VDS = 0V -- -- 100 nA IGSSR Gate-Body Leakage Current, Reverse V GS = -25V, VDS = 0V -- -- -100 nA On Characteristics (TA = 25°C unless otherwise noted) Symbol Parameter Test Conditions Min. Typ. Max. Unit VGS (th) Gate Threshold Voltage V DS = VGS , ID = 250uA 2.0 -- 4.0 V RDS(ON) On-Resistance V GS = 10V, ID = 25A -- 0.017 0.023 Ω Dynamic Characteristics Symbol Parameter Test Conditions Min. Typ. Max. Unit Ciss Input Capacitance -- --- 1460 pF Coss Output Capacitance -- --- 580 pF Crss Reverse Transfer Capacitance VDS = 25V, VGS = 0V, f = 1.0MHz -- --- 90 pF Switching Characteristics Symbol Parameter Test Conditions Min. Typ. Max. Unit td(on) Turn-On Delay Time -- 50 -- nS tr Turn-On Rise Time -- 165 -- nS td(off) Turn-Off Delay Time -- 78 -- nS tr Turn-Off Fall Time VDD = 30V, I D = 25A, RG = 25Ω (Note 4 & 5) -- 60 -- nS Qg Total Gate Charge -- 36 45 nC Qgs Gate-Source Charge -- 8.5 -- nC Qgd Gate-Drain Charge VDS = 160V, ID = 8.0A, VGS = 10V (Note 4 & 5) -- 12 -- nC Drain-Source Diode Characteristics and Maximum Ratings Symbol Parameter Test Conditions Min. Typ, Max. Unit IS Continuous Drain-Source Current -- -- 50 A ISM Pulsed Drain-Source Current Integral Reverse p-n Junction Diode in the MOSFET -- -- 200 A VSD Drain-Source Diode Forward Voltage V GS = 0V, IS = 50A -- -- 1.5 V Trr Reverse Recovery Time -- 95 -- nS Qrr Reverse Recovery Charge VGS = 0V, IS = 50A, dIF / dt = 100A/uS (Note 4) -- 250 -- uC Notes: 4. Pulse Test: Pulse width < 300us, Duty cycle ≤ 2%. 5. Basically not affected by working temperature.

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Number: DB-228 August 2011, Revision A Page 7 TAK CHEONG SEMICONDUCTOR TO220AB PACKAGE OUTLINE MILLIMETERS INCHES DIM MIN MAX MIN MAX A 3.60 4.80 0.142 0.189 A1 1.20 1.40 0.047 0.055 A2 2.03 2.90 0.080 0.114 b 0.40 1.00 0.016 0.039 b2 1.20 1.78 0.047 0.070 c 0.36 0.60 0.014 0.024 D 14.22 16.50 0.560 0.650 e 2.34 2.74 0.092 0.108 E 9.70 10.60 0.382 0.417 H1 5.84 6.85 0.230 0.270 L 12.70 14.70 0.500 0.579 L1 2.70 3.30 0.106 0.130 ØP 3.50 4.00 0.138 0.157 Q 2.54 3.40 0.100 0.134 NOTE: Above package outline conforms to JEDEC TO-220AB

Number: DB-100 April 14, 2008 / A DISCLAIMER NOTICE TAK CHEONG NOTICE The information presented in this document is for reference only. Tak Cheong reserves the right to make changes without notice for the specification of the products displayed herein. The product listed herein is designed to be used with ordinary electronic equipment or devices, and not designed to be used with equipment or devices which require high level of reliability and the malfunction of with would directly endanger human life (such as medical instruments, transportation equipment, aerospace machinery, nuclear-reactor controllers, fuel controlle rs and other safety devices), Tak Cheong Semiconductor Co., Ltd., or anyone on its behalf, assumes no responsi bility or liability for any damagers resulting from such improper use of sale. This publication supersedes & replaces all information reviously supplied. For additional information, please visit our website http://www.takcheong.com , or consult your nearest Tak Cheong’s sales office for further assistance.