TA79L005P_06 TOSHIBA | Alldatasheet

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Technical content

Features

z Best suited to a power supply for TTL and C2MOS. z Built-in overcurrent protective circuit. z Built-in thermal protective circuit. z Maximum output current of 150 mA (Tj = 25°C). z Packaged in TO-92MOD. Pin Assignment GND 2 3 IN OUT Marking side Marking Weight: 0.36 g (Typ.) TA79L ***P Lot No. (weekly code) A line indicates lead (Pb)-free package or lead (Pb)-free finish. Part No. (or abbreviation code)

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 2 Equivalent Circuit Absolute Maximum Ratings (Ta = 25°C) Characteristics Symbol Rating Unit TA79L005P TA79L006P TA79L008P TA79L009P TA79L010P TA79L012P TA79L015P −35 TA79L018P TA79L020P Input voltage TA79L024P VIN −40 V Power dissipation (Ta = 25°C) P D 800 mW Operating temperature Topr −30~85 °C Storage temperature Tstg −55~150 °C Junction temperature Tj 150 °C Thermal resistance Rth (j-a) 156 °C/W Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 3 TA79L005P

Electrical Characteristics

(Unless otherwise specified, VIN = −10 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −5.2 −5.0 −4.8 V −20 V ≤ VIN ≤ −7.0 V ― 55 150 Line regulation Reg·line 1 T j = 25°C −20 V ≤ VIN ≤ −8.0 V ― 45 100 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 11 60 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 5.0 30 mV 1.0 mA ≤ IOUT ≤ 40 mA −5.25 ― −4.75 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −5.25 ― −4.75 V Quiescent current IB 1 Tj = 125°C ― ― 5.5 mA ΔIBI 1 −20 V ≤ VIN ≤ −8.0 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 40 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 12 ― mV/kh Ripple rejection ratio R.R. 3 −18 V ≤ VIN ≤ −8.0 V, Tj = 25°C, f = 120 Hz 41 49 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 0.6 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 4 TA79L006P (Unless otherwise specified, VIN = −11 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −6.24 −6.0 −5.76 V −21 V ≤ VIN ≤ −8.1 V ― 50 150 Line regulation Reg·line 1 T j = 25°C −21 V ≤ VIN ≤ −9.0 V ― 45 110 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 12 70 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 5.5 35 mV 1.0 mA ≤ IOUT ≤ 40 mA −6.3 ― −5.7 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −6.3 ― −5.7 V Quiescent current IB 1 Tj = 125°C ― ― 5.5 mA ΔIBI 1 −21 V ≤ VIN ≤ −9.0 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 40 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 14 ― mV/kh Ripple rejection ratio R.R. 3 −19 V ≤ VIN ≤ −9.0 V, Tj = 25°C, f = 120 Hz 39 47 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 0.7 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 5 TA79L008P (Unless otherwise specified, VIN = −14 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −8.3 −8.0 −7.7 V −23 V ≤ VIN ≤ −10.5 V ― 20 175 Line regulation Reg·line 1 T j = 25°C −23 V ≤ VIN ≤ −11 V ― 12 125 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 15 80 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 7.0 40 mV 1.0 mA ≤ IOUT ≤ 40 mA −8.4 ― −7.6 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −8.4 ― −7.6 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −23 V ≤ VIN ≤ −11 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 60 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 20 ― mV/kh Ripple rejection ratio R.R. 3 −23 V ≤ VIN ≤ −12 V, Tj = 25°C, f = 120 Hz 37 45 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 0.8 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 6 TA79L009P (Unless otherwise specified, VIN = −15 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −9.36 −9.0 −8.64 V −24 V ≤ VIN ≤ −11.4 V ― 80 200 Line regulation Reg·line 1 T j = 25°C −24 V ≤ VIN ≤ −12 V ― 20 160 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 17 90 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 8.0 45 mV 1.0 mA ≤ IOUT ≤ 40 mA −9.45 ― −8.55 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −9.45 ― −8.55 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −24 V ≤ VIN ≤ −12 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 65 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 21 ― mV/kh Ripple rejection ratio R.R. 3 −24 V ≤ VIN ≤ −12 V, Tj = 25°C, f = 120 Hz 36 44 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 0.85 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 7 TA79L010P (Unless otherwise specified, VIN = −16 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −10.4 −10.0 −9.6 V −25 V ≤ VIN ≤ −12.5 V ― 80 230 Line regulation Reg·line 1 T j = 25°C −25 V ≤ VIN ≤ −13 V ― 30 170 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 18 90 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 8.5 45 mV 1.0 mA ≤ IOUT ≤ 40 mA −10.5 ― −9.5 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −10.5 ― −9.5 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −25 V ≤ VIN ≤ −13 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 70 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 22 ― mV/kh Ripple rejection ratio R.R. 3 −24 V ≤ VIN ≤ −13 V, Tj = 25°C, f = 120 Hz 36 43 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 0.9 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 8 TA79L012P (Unless otherwise specified, VIN = −19 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −12.5 −12.0 −11.5 V −27 V ≤ VIN ≤ −14.5 V ― 120 250 Line regulation Reg·line 1 T j = 25°C −27 V ≤ VIN ≤ −16 V ― 100 200 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 20 100 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 10 50 mV 1.0 mA ≤ IOUT ≤ 40 mA −12.6 ― −11.4 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −12.6 ― −11.4 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −27 V ≤ VIN ≤ −16 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 80 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 24 ― mV/kh Ripple rejection ratio R.R. 3 −25 V ≤ VIN ≤ −15 V, Tj = 25°C, f = 120 Hz 37 42 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 1.0 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 9 TA79L015P (Unless otherwise specified, VIN = −23 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −15.6 −15.0 −14.4 V −30 V ≤ VIN ≤ −17.5 V ― 130 300 Line regulation Reg·line 1 T j = 25°C −30 V ≤ VIN ≤ −20 V ― 110 250 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 25 150 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 12 75 mV 1.0 mA ≤ IOUT ≤ 40 mA −15.75 ― −14.25 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −15.75 ― −14.25 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −30 V ≤ VIN ≤ −20 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 90 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 30 ― mV/kh Ripple rejection ratio R.R. 3 −28.5 V ≤ VIN ≤ −18.5 V, Tj = 25°C, f = 120 Hz 34 39 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 1.3 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 10 TA79L018P (Unless otherwise specified, VIN = −27 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −18.7 −18.0 −17.3 V −33 V ≤ VIN ≤ 20.7 V ― 32 325 Line regulation Reg·line 1 T j = 25°C −33 V ≤ VIN ≤ −21 V ― 27 275 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 30 170 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 15 75 mV 1.0 mA ≤ IOUT ≤ 40 mA −18.9 ― −17.1 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −18.9 ― −17.1 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −33 V ≤ VIN ≤ −21 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 150 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 45 ― mV/kh Ripple rejection ratio R.R. 3 −33 V ≤ VIN ≤ −23 V, Tj = 25°C, f = 120 Hz 33 48 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 1.5 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 11 TA79L020P (Unless otherwise specified, VIN = −29 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −20.8 −20.0 −19.2 V −35 V ≤ VIN ≤ −23.5 V ― 33 330 Line regulation Reg·line 1 T j = 25°C −35 V ≤ VIN ≤ −24 V ― 28 285 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 33 180 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 17 90 mV 1.0 mA ≤ IOUT ≤ 40 mA −21.0 ― −19.0 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −21.0 ― −19.0 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −35 V ≤ VIN ≤ −24 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 170 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 49 ― mV/kh Ripple rejection ratio R.R. 3 −35 V ≤ VIN ≤ −27 V, Tj = 25°C, f = 120 Hz 31 37 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 1.7 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 12 TA79L024P (Unless otherwise specified, VIN = −33 V, IOUT = 40 mA, CIN = 0.33 μF, COUT = 0.1 μF, 0°C ≤ Tj ≤ 125°C) Characteristics Symbol Test Circuit Test Condition Min Typ. Max Unit Output voltage VOUT 1 T j = 25°C −25.0 −24.0 −23.0 V −38 V ≤ VIN ≤ −27 V ― 35 350 Line regulation Reg·line 1 T j = 25°C −38 V ≤ VIN ≤ −28 V ― 30 300 mV 1.0 mA ≤ IOUT ≤ 100 mA ― 40 200 Load regulation Reg·load 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― 20 100 mV −38 V ≤ VIN ≤ −27 V, 1.0 mA ≤ IOUT ≤ 40 mA −25.2 ― −22.8 Output voltage VOUT 1 T j = 25°C 1.0 mA ≤ IOUT ≤ 70 mA −25.2 ― −22.8 V Quiescent current IB 1 Tj = 125°C ― ― 6.0 mA ΔIBI 1 −38 V ≤ VIN ≤ −28 V ― ― 1.5 Quiescent current change ΔIBO 1 Tj = 25°C 1.0 mA ≤ IOUT ≤ 40 mA ― ― 0.1 mA Output noise voltage VNO 2 Ta = 25°C, 10 Hz ≤ f ≤ 100 kHz ― 200 ― μVrms Long term stability ΔVOUT/Δt 1 ― ― 56 ― mV/kh Ripple rejection ratio R.R. 3 −35 V ≤ VIN ≤ −29 V, Tj = 25°C, f = 120 Hz 31 47 ― dB Dropout voltage VD 1 T j = 25°C ― 1.7 ― V Average temperature coefficient of output voltage TCVO 1 I OUT = 5 mA ― 2.0 ― mV/°C

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 13 Test Circuit 1 V OUT, Reg·line, Reg·load, IB, ΔIB, ΔVOUT/Δt, VD, TCVO Test Circuit 2 V NO Test Circuit 3 R.R.

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 14

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 15 Package Dimensions

TA79L005,006,008,009,010,012,015,018,020,024P 2006-11-02 16 RESTRICTIONS ON PRODUCT USE 20070701-EN

  • The information contained herein is subject to change without notice.
  • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity an d vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA produc ts, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIB A products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconduct or Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc.
  • The TOSHIBA products listed in this document are in tended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage incl ude atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, et c.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk.
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